SONY ILX523A

ILX523A
2700 pixel CCD Linear Sensor (B/W)
Description
The ILX523A is a reduction type CCD linear sensor
designed for facsimile, scanner and OCR use. This
sensor reads A3 size documents at a density of 200
DPI (Dot Per Inch).
In addition, this can be directly driven at 5V logic
and operate on single 12V power supply for easy
use.
D33
S1
S2
Pin Configuration (Top View)
φ1 9
14 φ2
NC 10
13 NC
2700
12 NC
φROG
9
φ1
14
φ2
VDD
20
φS/H
4
φROG 11
GND
15 NC
VOUT
16 NC
NC 8
2
NC 7
1
17 NC
• Output Amplifier
• Sample-and-Hold Circuit
• Feed Through Level
Clamp Circuit
18 φRS
NC 6
18
NC 5
φRS
19 T1
T1
20 VDD
φS/H 4
Timing
Generator
NC 3
21 NC
AA
AA
22 NC
1
19
VSS 2
D14
D15
VOUT 1
11
Timing
Generator
V
°C
°C
Read Out gate
CCD Analog Shift Register
S2699
S2700
D34
Absolute Maximum Ratings
15
• Supply voltage
VDD
• Operating temperature
–10 to +60
• Storage temperature
–30 to +80
Block Diagram
D39
Features
• Number of effective pixels: 2700 pixels
• Pixel size:
11µm × 11µm (11µm pitch)
• Ultra low lag/High Sensitivity
• Built-in Feed through suppression circuit
• Built-in Sample-and-hold circuit
• Maximum data rate: 5MHz
• Single 12V power supply
22 pin DIP (Cer-DIP)
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
–1–
E97442A78
ILX523A
Pin Description
Pin No.
Symbol
Description
Pin No.
Symbol
Description
1
VOUT
Signal output
12
NC
NC
2
GND
GND
13
NC
NC
3
NC
NC
14
φ2
Transfer pulse 2
4
φS/H
Sample-and-Hold pulse
15
NC
NC
5
NC
NC
16
NC
NC
6
NC
NC
17
NC
NC
7
NC
NC
18
φRS
Reset gate pulse
8
NC
NC
19
T1
Test pin (Open)
9
φ1
Transfer pulse 1
20
VDD
12V power supply
10
NC
NC
21
NC
NC
11
φROG
Read out gate pulse
22
NC
NC
Note) Connect Pin 4 to GND when not using internal sample-and-hold circuit.
Recommended Pin Voltage
Item
Min.
Typ.
Max.
Unit
VDD
11.4
12.0
12.6
V
Clock Characteristics
Item
Symbol
Min.
Typ.
Max.
Unit
Input capacitance of φ1
Cφ1
—
300
—
pF
Input capacitance of φ2
Cφ2
—
300
—
pF
Input capacitance of φROG
CφROG
—
10
—
pF
Input capacitance of φRS
CφRS
—
10
—
pF
Input capacitance of φS/H
CφS/H
—
10
—
pF
—
1.0
5.0
MHz
Data Rate
—
–2–
ILX523A
Electrooptical Characteristics
(Ta = 25°C, VDD = 12V, data rate = 1MHz, mode without S/H (Pin 4 = GND),
light source = 3200K, IR cut filter CM-500S (t = 1.0mm) used)
Item
Symbol
Min.
Typ.
Max.
Unit
Remarks
66.5
95
123.5
V/(lx · s)
Note 1
Sensitivity
R1
Sencitivity nonuniformity
PRNU
—
2.0
10.0
%
Note 2
Saturation output voltage
VSAT
2.0
2.5
—
V
—
Dark voltage average
VDRK
—
2.0
8.0
mV
Note 3
Dark signal nonuniformity
DSNU
—
7.0
14.0
mV
Note 3
Image Lag
IL
—
0.02
—
%
Note 4
Dynamic range
DR
—
1250
—
—
Note 5
Saturation exposure
SE
—
0.02
—
lx · s
Note 6
Supply current
IVDD
—
15.0
25.0
mA
—
Total transfer efficiency
TTE
92.0
98.0
—
%
—
Output impedance
ZO
—
300
—
Ω
—
Offset level
VOS
—
7.4
—
V
Note 7
Notes)
1. For the sensitivity test, light is applied with a uniform intensity of illumination.
2. PRNU is defined as indicated below. Ray incidence conditions are the same as for Note 1.
The output signal amplitude for test is 1V.
PRNU =
(VMAX – VMIN)/2
VAVE
× 100 [%]
The maximum output of all the valid pixels is set to VMAX, the minimum output to VMIN and the average
output to VAVE.
3. Optical signal accumulated time stands at 10ms.
4. Output signal amplitude VOUT = 500mV.
5. Dynamic range is defined as follows.
DR =
VSAT
VDRK
When the optical signal accumulated time is shorter, the dynamic range gets wider because the optical
signal accumulated time is in proportion to the dark voltage.
6. Saturation exposure is defined as follows.
SE =
VSAT
R1
7. VOS is defined as indicated below.
VOUT
D29
D30
D31
D32
VOS
GND
–3–
AA
AAA
AAAAA
D33
S1
–4–
VOUT
φRS
φ2
φ1
0
5
0
5
0
5
1
2 3
D3
4
5
6
D12
D13
D11
D31
D14
D15
Optical black
(18 pixels)
D38
D36
D37
D34
D35
S2700
S2698
S2699
S2697
S3
S4
S2
Effective picture elements signal
Dummy signal (6 pixels)
(2700 pixels)
S1
D32
D33
Note) 2750 or more clock pulses (φ1, φ2, φRS) are required.
1-line output period (2739 pixels)
Dummy signal (33 pixels)
D4
D2
D1
0
D6
φROG
D5
5
2739
D39
Clock Timing Diagram (without internal sample-and-hold circuit)
1
2
ILX523A
–5–
VOUT
φS/H
φRS
φ2
0
5
0
5
0
5
0
1
2
D2
φ1
3
4
D4
5
D3
0
5
6
D31
D15
Optical black
(18 pixels)
D14
D12
D13
D11
D38
D36
D37
D35
S2700
D34
S2698
S2699
S2697
S2
S3
S1
Effective picture elements signal
Dummy signal (6 pixels)
(2700 pixels)
S4
D32
D33
Note) 2750 or more clock pulses (φ1, φ2, φRS, φS/H) are required.
1-line output period (2739 pixels)
Dummy signal (33 pixels)
D6
φROG
D5
5
2739
D39
D1
Clock Timing Diagram (using internal sample-and-hold circuit)
1
2
ILX523A
ILX523A
Input Clock Waveform Conditions
φ1, φ2, φRS, φS/H pulses related
t1
5V
t2
90%
φ1
10%
0V
5V
90%
φ2
10%
0V
t5
t4
5V
t6
90%
φRS
50%
10%
0V
t10
t3
t8
t11
t9
5V
90%
φS/H
50%
10%
0V
t7
VOUT
(without internal
sample-and-hold circuit)
10%
t13
t12
t19
VOUT
(using internal
sample-and-hold circuit)
φROG, φ1 pulses related
t17
5V
t18
90%
φROG
50%
10%
0V
t14
t16
t15
5V
φ1
50%
0V
–6–
ILX523A
Cross point φ1 and φ2
φ1
5V
φ2
0V
2.0V (Min.)
2.0V (Min.)
Input Clock Waveform Conditions
Symbol
Item
Min.
Typ.
Max.
Unit
100
ns
200
ns
350
ns
φ1, φ2 rise/fall time
t1, t2
0
φRS pulse low level period
t3
20
50
80∗1
φ1, φ2 – φRS pulse timing
t4
25
200∗1
φRS rise/fall time
t5, t6
0
φS/H pulse low level period
t7
φ1, φ2 – φS/H pulse timing
40
ns
20
10
80∗1
200
ns
t8
70
200∗1
350
ns
φRS – φS/H pulse timing
t9
15
—
—
ns
φS/H rise/fall time
t10, t11
0
10
40
ns
t12
—
40
—
ns
t13
—
20
—
ns
t19
—
20
—
ns
φROG pulse high level period
t14
500
1000
—
ns
φ1 – φROG pulse timing
t15, t16
500
1000
—
ns
φROG rise/fall time
t17, t18
0
50
100
ns
High level
4.5
5
5.5
V
Low level
0
—
0.5
V
Signal output delay time
Inpuyt clock pulse voltage
∗1 Recommended conditions for data rate = 1MHz.
–7–
–8–
74HC04
Connect Pin 4 to GND or φROG
when not using internal
sample-and-hold circuit.
φ2
φROG
φ1
φS/H
φRS
0.01µ
10µ/16V
5V
Output signal
10kΩ
3
4
7
6
5
8
9
10
11
Application circuits shown are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for
any problems arising out of the use of these circuits or for any infringement of third party patent and other right due to same.
2SC2785
2
1
12
13
14
15
16
17
18
19
20
21
10µ/16V
22
0.01µ
12V
NC
VOUT
NC
GND
VDD
NC
T1
φS/H
φRS
NC
NC
NC
NC
NC
NC
NC
φ2
φ1
NC
NC
NC
φROG
Application Circuit
ILX523A
ILX523A
Example of Representative Characteristics (VDD = 12V, Ta = 25°C)
Spectral sensitivity characteristics (Standard characteristics)
10
9
8
Relative sensitivity
7
6
5
4
3
2
1
0
400
500
600
700
800
900
1000
Wavelength [nm]
Dark signal output temperature characteristics (standard characteristics)
100
50
Output voltage rate
10
5
1
0.5
0.1
0.05
0.01
–10
0
10
20
30
Ta – Ambient temperature [°C]
–9–
40
50
60
ILX523A
Offset level vs. VDD characteristics
(Standard characteristics)
12
12
10
10
VOS – Offset level [V]
VOS – Offset level [V]
Offset level vs. Temperature characteristics
(Standard characteristics)
8
∆Vos
∆Ta
6
–5mV/ °C
4
2
6
∆Vos
∆VDD
0.8
4
2
0
–10
0
10
20
30
40
50
0
11.4
60
11.6
11.8
12.0
12.2
12.4
Ta – Ambient temperature [°C]
VDD [V]
Supply current vs. VDD characteristics
(Standard characteristics)
Output voltage vs. Integration time
(Standard characteristics)
12.6
10
20
15
Output voltage rate
IvDD – Supply current [mA]
8
10
5
5
1
0
11.4
11.6
11.8
12.0
12.2
12.4
12.6
10
50
τ – Integration time [ms]
VDD [V]
– 10 –
100
ILX523A
Notes on Handling
1) Static charge prevention
CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following
protective measures.
a) Either handle bare handed or use non chargeable gloves, clothes or material.
Also use conductive shoes.
b) When handling directly use an earth band.
c) Install a conductive mat on the floor or working table to prevent the generation of static electricity.
d) Ionized air is recommended for discharge when handling CCD image sensor.
e) For the shipment of mounted substrates, use boxes treated for prevention of static charges.
2) Notes on Handling CCD Cer-DIP Packages
The following points should be observed when handling and installing Cer-DIP packages.
a) Remain within the following limits when applying static load to the ceramic portion of the package:
(1) Compressive strength: 39N/surface (Do not apply load more than 0.7mm inside the outer perimeter of
the glass portion.)
(2) Shearing strength: 29N/surface
(3) Tensile strength: 29N/surface
(4) Torsional strength: 0.9Nm
AAAA
AAAA
AAAA
AAAA
AAAA AAAA AAAA AAAA
Upper ceramic layer
39N
Lower ceramic layer
(1)
Low-melting glass
29N
29N
(2)
(3)
0.9Nm
(4)
b) In addition, if a load is applied to the entire surface by a hard component, bending stress may be
generated and the package may fracture, etc., depending on the flatness of the ceramic portion.
Therefore, for installation, either use an elastic load, such as a spring plate, or an adhesive.
c) Be aware that any of the following can cause the glass to crack: because the upper and lower ceramic
layers are shielded by low-melting glass,
(1) Applying repetitive bending stress to the external leads.
(2) Applying heat to the external leads for an extended period of time with soldering iron.
(3) Rapid cooling or heating.
(4) Rapid cooling or impact to a limited portion of the low-melting glass with a small-tipped tool such as
tweezers.
(5) Prying the upper or lower ceramic layers away at a support point of the low-melting glass.
Note that the preceding notes should also be observed when removing a component from a board after it
has already been soldered.
3) Soldering
a) Make sure the package temperature does not exceed 80°C.
b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a grounded 30W
soldering iron and solder each pin in less then 2 seconds. For repairs and remount, cool sufficiently.
c) To dismount an imaging device, do not use a solder suction equipment. When using an electric
desoldering tool, ground the controller. For the control system, use a zero cross type.
– 11 –
ILX523A
4) Dust and dirt protection
a) Operate in clean environments.
b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should
dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized
air is recommended.)
c) Clean with a cotton bud and ethyl alcohol if the glass surface is grease stained. Be careful not to scratch
the glass.
d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when
moving to a room with great temperature differences.
5) Exposure to high temperatures or humidity will affect the characteristics. Accordingly avoid storage or
usage in such conditions.
6) CCD image sensors are precise optical equipment that should not be subject to mechanical shocks.
7) Normal output signal is not obtained immediately after device switch on.
– 12 –
5.0 ± 0.5
– 13 –
V
H
6.73 ± 0.8
1
22
41.6 ± 0.5
Cer-DIP
TIN PLATING
42 ALLOY
5.2g
LEAD TREATMENT
LEAD MATERIAL
PACKAGE WEIGHT
2.54
No.1 Pixel
40.2
11
12
0.51
22pin DIP (400mil)
29.7 (11µm × 2700Pixels)
PACKAGE MATERIAL
PACKAGE STRUCTURE
4.0 ± 0.5
Unit: mm
10.0 ± 0.5
9.0
0.3
M
3.65
4.45 ± 0.5
Package Outline
0.25
0° to 9°
(AT STAND OFF)
10.16
2. The thickness of the cover glass is 0.8mm, and the refractive index is 1.5.
1. The height from the bottom to the sensor surface is 2.45 ± 0.3mm.
ILX523A