ZETEX TRAC020LH

TOTALLY RE-CONFIGURABLE ANALOG
CIRCUIT - TRAC®
TRAC020LH
Issue 2 - MARCH 1999
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DEVICE DESCRIPTION
The TRAC020LH is a Micro-Power version of
the existing TRAC products. It also offers
significant improvements in bandwidth and
function accuracy.
The TRAC020LH is the latest addition to the
TRAC family of Field Programmable Analog
Devices (FPAD) which offers an integrated path
from signal processing problems to working
silicon solutions - in minutes! The Totally
Reconfigurable Analog Circuit is a highly
flexible single chip solution to the signal
processing problems found in many markets.
Instrumentation
Transducer Characteristic Correction
Vector Analysis
FEATURES AND BENEFITS
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Introducing a Top-Down, Structured design
discipline,
TRAC
enables
rapid
implementation, prototyping and product
release. Rather than working at the component
level, TRAC champions the Computational
Approach, providing designers with benefits
formerly associated with programmable
digital devices. TRAC brings a truly integrated
Signal Processing problem solving process
and offers a path to Custom Silicon for high
volume applications.
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APPLICATIONS
Many analog signal processing applications
including:-
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Log, Linear and Modern Filter Design
Analog Computation
Analog Signal Processing (ASP)
Faster design and verification of signal
processing solutions
Instant working silicon
Flexibility to react to changing requirements
Stay thinking about analog problems
mathematically - minimal circuit design
Just as versatile as FPGA - and just as easy
Complete more projects on time
High level of integration and design secrecy
Integration with other CAE systems
Transparent design migration to
semi-custom and future devices
Less than 8 bytes to program
Full industrial temperature range
Standby mode for improved battery life
Devices easily cascaded for more complex
designs
Classical & Modern Control Systems
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Audio Applications
ORDERING INFORMATION
Sonar and Ultrasonic Systems
Combines silicon, software and support
PART NUMBER
PACKAGE
PART
MARK
TRAC020LHQ36
QSOP36
TRAC020LH
Analog Correlation
Echo Cancellation
For more information on Fast Analog Solutions and all our products see www.fas.co.uk
1
TRAC020LH
ABSOLUTE MAXIMUM RATINGS
Voltage on any pin = 7.0V (relative to VSS)
Operating Temperature = -40 to 85°C
Storage Temperature = -55 to 125°C
GENERAL ELECTRICAL CHARACTERISTICS
Test Conditions: Temperature = 25 °C, VDD = 3.0V±0.15V, VSS = -2.0V±0.10V
PARAMETER
CONDITIONS
MIN
TYPICAL
MAX
General Characteristics
Dynamic Range
80dB
15nV/√

Hz
Noise Voltage
10Hz-100kHz
Total Harmonic Distortion
100mV peak-peak
1.0V peak-peak
0.02%
0.08%
Intermodulation Distortion
< 0.1%
Supply Rejection
60dB
Cell to cell crosstalk
-60dB
Input Range (all IO pins)
VDD -2.0V,
VSS +1.0V
Slew Rate
4V/µS
Supply Current
Operating Current IDD
Cells to NIP function PD=VDD
Operating Current ISS
Shutdown Current IDD
2.5mA
5.0mA
6.0mA
-2.5mA
-5.0mA
-6.0mA
PD=VSS
10µA
Cell Output Capability
Sink Current
150µA
Source Current
150µA
2
TRAC020LH
ELECTRICAL CHARACTERISTICS OF THE CELL
Test Conditions: Temperature = 25 °C, VDD = 3.0V±0.15V, VSS = - 2.0V±0.10V
FUNCTION
Non
Inverting
Pass
PARAMETER
Gain
CONDITIONS
Vin = ±800mV
MIN
0.996
Input Resistance
Offset
Vin=0mV
-1.2mV
100nA
260nA
12MHz
Bandwidth (large signal)
500mV peak-peak
3MHz
Gain
Vin = ±800mV
-1.010
-1.000
-0.990
30kΩ
40kΩ
50kΩ
-2.4mV
0mV
2.4mV
Offset
Vin=0mV
Bandwidth(small signal)
20mV peak-peak
7MHz
Bandwidth(large signal)
500mV peak-peak
3MHz
Gain
VA=VB =±400mV
-1.012
-1.000
-0.988
30kΩ
40kΩ
50kΩ
0mV
3.4mV
Offset
Vin=0mV
Bandwidth (small signal)
20mV peak-peak
-3.4mV
6MHz
Bandwidth (large signal)
500mV peak-peak
3MHz
Output Voltage
Vin =±1.000V
±625 mV
Input Resistance
±685 mV
30kΩ
40kΩ
Gain
RF = RS =20kΩ,
-0.993
Input Current
RF = RS =20kΩ,
Vin = 0 mV
100nA
RF = RS =20kΩ,
Vin = 0mV
2.0mV
Offset
Output Saturation Voltage Vin =±50mV
<VSS+0.2V
Open Loop
300
3
±745 mV
±60mV
Transfer Characteristic
Vin =±10mV,
(Change in output for a 10x ±100mV,±1000mV
change in input voltage)
Auxiliary
1.2mV
20mV peak-peak
Input Resistance
Log
1.004
0mV
Bandwidth (small signal)
Input Resistance
Add
1.000
MAX
60MΩ
Input Current
Negate
TYPICAL
50kΩ
>VDD-1.7V
700
TRAC020LH
ELECTRICAL CHARACTERISTICS OF THE CELL (Continued)
Test Conditions: Temperature = 25 °C, VDD = 3.0V±0.15V, VSS = - 2.0V±0.10V
FUNCTION
PARAMETER
CONDITIONS
MIN
Output Voltage
Vin = ±685mV
Transfer Characteristic
(Multiplication of the
output voltage for fixed
steps in input voltage)
Vin =±565mV,
±625mV,
±685mV steps
Output Voltage
Vin = −685mV
Vin = 685mV
Transfer Characteristic
(Multiplication of the
output voltage for fixed
steps in input voltage)
Vin =−565mV,
−625mV,
−685mV steps
Off
Attenuation
Vin =±1.0V
LOG/ALOG
Gain
Vin= ±1.0V
1.00
Bandwidth (small signal)
20mV peak-peak
6MHz
Bandwidth (large signal)
500mV peak-peak
2MHz
Gain
Vin= ±1.0V
1.00
Bandwidth (small signal)
20mV peak-peak
6MHz
Bandwidth (large signal)
500mV peak-peak
2MHz
Alog
Rectify
LOG/REC
± 0.80V
TYPICAL
±1.00V
MAX
±1.2V
±10
+0.80V
-5.0mV
+1.00V
+1.2V
5.0mV
+10
-60dB
-80dB
ELECTRICAL CHARACTERISTICS OF THE LOGIC FUNCTIONS(VDD-VSS=5.0V±0.25V)
FUNCTION
CONDITIONS
MIN
TYPICAL
MAX
(VOH (for output pins
DOUT, CLCR )
IOH=-4mA
4.0V
(WRT VSS)
5.0V
(WRT VSS)
VOL (for outputs
DOUT, CLCR
IOH=4mA
0.0V
(WRT VSS)
0.4V
(WRT VSS)
IIH (for inputs DATA
CLOCK, RESET,PD )
VIH=5V (WRT VSS)
IIL (for inputs DATA
CLOCK, RESET,PD )
VIL=0V (WRT VSS)
1.0µA
-1.0µA
Max. CLOCK frequency
10MHz
4
TRAC020LH
DESCRIPTION OF PIN FUNCTIONS
DATA
Serial programming data is input to the TRAC via this pin. Each TRAC cell contains
a 3-bit shift register that allows each cell to be programmed to the required analog
function.
RESET
Active low - The pin resets all on-chip shift registers to the logic zero state, which sets
all TRAC cells to the OFF function. The pin should be held high while the device is
being programmed and when the analog functions are in use.
PD
Active low - The pin switches off the bias generators to the analog cells, which turns
off the supply current to all the TRAC cells. This does not influence the programming
of the cells so this feature can be used to reduce power consumption for applications
that have a standby mode. The pin should be held high while the device is being
programmed and when the analog functions are in use. This pin is permanently held
high (VDD) on the TRAC development board.
CLOCK
Used to clock in the serial data to program the TRAC device. The on-chip shift registers
are positive edge triggered.
DOUT
This pin is the serial data output from cell 20 on the TRAC device. This is used for
validation of programming of the TRAC device. This pin also allows two or more
TRAC devices to be connected in a serial architecture. This is done by connecting the
DOUT pin of the first TRAC device to the DATA pin of the second TRAC device, and
connecting the CLOCK pins.
CLCR
Clock Clear. When the TRAC device is used in stand alone applications CLCR is used
as a control pin. It allows the downloading circuitry to be switched off when the
programming serial data from the EEPROM is complete.
IO3..IO22
These are the analog inputs / outputs for cells 1 to 20.
IO1,IO2
These are the analog inputs for cells 1 and 2.
VDD
TRAC positive supply rail (+3V)
AGND
Analog Ground
VSS
TRAC negative supply rail (-2V) - this will also be the system ground
5
TRAC020LH
CELL FUNCTION DETAILS
ADD (code 011)
Can be represented as an operational
amplifier with three resistors of equal value R.
The virtual earth at the inverting input gives:Eo = -R(Ea/R + Eb/R) = - (Ea + Eb)
The output is the inverted sum of the input
voltages.
NEGATE (code 010)
The negate function is provided by an adder,
but with only one input, therefore Eo=-Eb
NON INVERTING PASS (code 100)
Used for topological reasons. It provides a
route through the cell with no modification. i.e.
a unity gain amplifier
LOG (code 110)
Can be represented as an operational
amplifier with a pair of back to back diodes in
the negative feedback loop and an input
resistor R. The virtual earth at the inverting
input gives:Eo = -kT/q log (Ea/RIo + 1)
where
k = Boltzmann’s constant
T = absolute temperature
q = electron charge
Io=saturation current
ANTI - LOG (code 101)
Similar to the log circuit except that the diodes
and resistors are reversed. The output voltage
is therfore given as :Eo = -RIo (exp qEa/KT - 1)
When the signal is processed through both log
and anti-log the magnitude of the saturation
current and absolute temperature cancel.
6
TRAC020LH
CELL FUNCTION DETAILS (Continued)
RECTIFIER (code 111)
Similar to the anti-log function except that one
of the diodes is removed so that a positive
input gives zero output.
AUX (code 001)
As for an operational amplifier external
components are used to provide the following
functions - external components are shown
dotted
Amplification
Attenuation
Differentiation
Integration
OFF (code 000)
In the off condition there is no signal path
through the cell.
7
TRAC020LH
TRAC020LH
SCHEMATIC DIAGRAM
TRAC020LH
TYPICAL ELECTRICAL CHARACTERISTICS
Cell Frequency Responses, Small Signal Amplitude 20mV Pk-Pk
3
12
0
6
-3
0
Gain (dB)
Gain (dB)
Test Conditions: Temperature = 25 °C, VDD = 3.0V±0.15V, VSS = - 2.0V±0.10V
-6
-9
-12
-6
-12
-18
-15
-24
10
100
1000
10000
100000
10
Frequency (kHz)
10000
100000
NEG Small Signal Bandwidth
12
12
6
Gain (dB)
6
Gain (dB)
1000
Frequency (kHz)
NIP Small Signal Bandwidth
0
-6
-12
0
-6
-12
-18
-18
-24
10
100
1000
10000
100000
10
Frequency (kHz)
100
1000
10000
100000
Frequency (kHz)
ADD Small Signal Bandwidth
AUX Small Signal Bandwidth
(RS=RF=20K, RS Shunts preceeding OFF cell)
(for both A and B inputs)
12
12
6
6
Gain (dB)
Gain (dB)
100
0
-6
-12
0
-6
-12
-18
-18
10
100
1000
10000
10
100000
Frequency (kHz)
100
1000
10000
100000
Frequency (kHz)
LOG/ALOG Small Signal Bandwidth
LOG/REC Small Signal Bandwidth
(26mV DC Biased)
(26mV DC Biased)
10
TRAC020LH
TYPICAL ELECTRICAL CHARACTERISTICS
Cell Phase Delay, Small Signal Amplitude 20mV Pk-Pk
45
225
0
180
Phase (Degrees)
Phase (Degrees)
Test Conditions: Temperature = 25 °C, VDD = 3.0V±0.15V, VSS = - 2.0V±0.10V
-45
-90
-135
-180
135
90
45
0
10
100
1000
10000
100000
10
Frequency (kHz)
10000
100000
NEG Phase Shift V Frequency
225
225
180
180
Phase (Degrees)
Phase (Degrees)
1000
Frequency (kHz)
NIP Phase Shift V Frequency
135
90
45
0
135
90
45
0
10
100
1000
10000
100000
10
Frequency (kHz)
100
1000
10000
100000
Frequency (kHz)
AUX Phase Shift V Frequency
ADD Phase Shift V Frequency
(RS=RF=20K, RS Shunts preceeding OFF Cell)
(For both A and B inputs)
45
45
0
0
Phase (Degrees)
Phase (Degrees)
100
-45
-90
-135
-180
-225
-45
-90
-135
-180
-225
-270
-270
10
100
1000
10
10000
Frequency (kHz)
100
1000
10000
Frequency (kHz)
LOG/REC Phase Shift V Frequency
LOG/ALOG Phase Shift V Frequency
(26mV DC Biased)
(26mV DC Biased)
11
TRAC020LH
TYPICAL ELECTRICAL CHARACTERISTICS
Cell Offset Voltage against Temperature CharacteristicsTest Conditions:
Temperature = 25 °C, VDD = 3.0V±0.15V, VSS = - 2.0V±0.10V
0.4
Offset Voltage (mV)
Offset Voltage (mV)
0.2
0
-0.2
-0.4
-40
-20
0
20
40
60
80
0.2
0
-0.2
-0.4
-0.6
-0.8
-40
100
-20
Temperature (°C)
NIP Offset Voltage V Temp.
Offset Voltage (mV)
Offset Voltage (mV)
60
80
100
-0.2
-0.4
-20
0
20
40
60
80
80
100
80
100
0
-0.1
-0.2
-0.3
-40
100
-20
Temperature (°C)
0
20
40
60
Temperature (°C)
ADD Offset Voltage Vs Temp.
AUX Offset Voltage V Temp.
0.4
Offset Voltage (mV)
0.2
Offset Voltage (mV)
40
0.1
0
0.1
0
-0.1
-0.2
-40
20
NEG Offset Voltage V Temp.
0.2
-0.6
-40
0
Temperature (°C)
-20
0
20
40
60
80
0.2
0
-0.2
-0.4
-40
100
Temperature (°C)
-20
0
20
40
60
Temperature (°C)
LOG/ALOG Offset Voltage V Temp.
LOG/REC Offset Voltage V Temp.
12
TRAC020LH
TYPICAL ELECTRICAL CHARACTERISTICS
Cell Voltage Gain against Temperature Characteristics
Test Conditions: Temperature = 25 °C, VDD = 3.0V±0.15V, VSS = - 2.0V±0.10V
0.1
-0.1
Gain Error (%)
Gain Error (%)
0.09
0.08
0.07
0.06
0.05
-40
-20
0
20
40
60
80
0
20
40
60
80
NIP Gain Error V Temp.
NEG Gain Error V Temp.
100
1000
Differential Gain
Gain Error (%)
-20
Temperature (° C)
0
-0.05
-0.1
-20
0
20
40
60
80
900
800
700
600
-40
100
-20
0
20
40
60
80
Temperature (°C)
Temperature (°C)
ADD Gain Error V Temp.
AUX Open Loop Gain V Temp.
3
100
2
2.5
1.6
Gain Error (%)
Gain Error (%)
-0.25
Temperature (°C)
0.05
2
1.5
1
1.2
0.8
0.4
0.5
0
-40
-0.2
-0.3
-40
100
0.1
-0.15
-40
-0.15
-20
0
20
40
60
80
0
-40
100
-20
0
20
40
60
80
Temperature (°C)
Temperature (°C)
LOG/ALOG Gain Error V Temp.
LOG/REC Gain Error V Temp.
13
100
TRAC020LH
TYPICAL ELECTRICAL CHARACTERISTICS
Cell DC Transfer Characteristics
1000
1000
750
750
500
500
Vout (mV)
Vout (mV)
Test Conditions: Temperature = 25 °C, VDD = 3.0V±0.15V, VSS = - 2.0V±0.10V
250
0
-250
-500
250
0
-250
-500
-750
-750
-1000
-1000
0
-500
500
-1000
-1000
1000
0
-500
Vin (mV)
800
800
600
600
400
400
200
0
-200
-400
200
0
-200
-400
-600
-600
-800
-400
-800
-1000
0
-200
200
400
-100
500
Vout (mV)
750
250
0
-250
250
0
-250
-500
-500
-750
-750
500
560
620
-1000
-680
680
Vin (mV)
≈
≈
-500
1000
≈
≈
1000
500
-560
100
LOG DC Transfer Characteristics
750
-620
10
Log Vin (mV)
ADD DC Transfer Characteristics
1000
0
-10
Va = Vb (mV)
Vout (mV)
1000
NEG DC Transfer Characteristics
Vout (mV)
Vout (mV)
NIP DC Transfer Characteristics
-1000
-680
500
Vin (mV)
-620
-560
-500
500
560
620
Vin (mV)
ALOG DC Transfer Characteristics
REC DC Transfer Characteristics
14
680
TRAC020LH
TYPICAL ELECTRICAL CHARACTERISTICS
Settling Performance for Power Down and Data Clocking
Test Conditions: Temperature = 25 °C, VDD = 3.0V±0.15V, VSS = - 2.0V±0.10V
1.4
0.4
0.2
Input =
+800mV
Output Voltage (v)
Output Voltage (v)
1.2
1.0
0.8
0.6
0.4
PD = VDD
0.2
PD = VDD
PD = VSS
0.0
-0.2
Input = -800mV
-0.4
-0.6
-0.8
PD = VSS
-1.0
0.0
0
200
100
300
400
500
600
0
50
100
NIP Power Down Response
Output Voltage (v)
Output Voltage (v)
0.4
Vin = 800mV
Switched to NIP
@ t = 0uS
0.0
-0.4
-0.8
0
0.5
1.0
0
-0.4
-0.8
-1.2
-1.6
-0.5
1.5
Vin = -800mV
Switched to NIP
@ t = 0 µS
0
0.5
1.0
1.2
1.2
Output Voltage (v)
OFF Cell to NIP Cell Response
0.8
Input = 800mV
Switched to NEG
@ t = 0uS
0.4
0.0
-0.4
-0.8
0
0.5
1.5
Time (µS)
OFF Cell to NIP Cell Response
-1.2
-0.5
250
0.4
0.8
Time (µS)
Output Voltage (v)
200
NIP Power Down Response
1.2
-1.2
-0.5
150
Time (µS)
Time (µS)
1.0
0.8
0.4
-0.4
-0.8
-1.2
-0.5
1.5
Time (µS)
Input = -800mV
Switched to NEG
@ t = 0uS
0.0
0
0.5
1.0
Time (µS)
NIP Cell to NEG Cell Response
NIP Cell to NEG Cell Response
15
1.5
TRAC020LH
CONNECTION DIAGRAM
QSOP 36 Lead
Note:
For clarity the IO pin
definition has been
changed
from
previous issue
TOP VIEW
(NOT TO SCALE)
PACKAGING INFORMATION
A
C
E
B
D
H
P IN N o. 1
0
J
.1 3(.005)
F
I
K
Fast Analog Solutions Ltd.
Fields New Road, Chadderton, Oldham, OL9 8NP, United Kingdom.
Tel: (+44) (0) 161 622 4567 Fax: (+44) (0) 161 622 4568
e-mail: [email protected]
Internet: http://www.fas.co.uk
TRAC products are supported by agents and distributors in many
countries of the world. Details can be found on our web site.
A ZETEX GROUP COMPANY
This publication is issued to provide outline information only which (unless agreed by the Company in writing) may not be used,
applied or reproduced for any purpose or form part of any order or contract or be regarded as a representation relating to the products
or services concerned. The Company reserves the right to alter without notice the specification, design, price or conditions of supply of
any product or service.
16