FAIRCHILD FGA50N100BNTD

FGA50N100BNTD
1000V, 50A NPT-Trench IGBT CO-PAK
General Description
Features
Trench insulated gate bipolar transistors (IGBTs) with NPT
technology show outstanding performance in conduction
and switching characteristics as well as enhanced
avalanche ruggedness. These devices are well suited for
Induction Heating ( I-H ) applications
•
•
•
•
High Speed Switching
Low Saturation Voltage: VCE(sat) = 2.5V @ IC = 60A
High Input Impedance
Built-in Fast Recovery Diode
Application
Micro- Wave Oven, I-H Cooker, I-H Jar, Induction Heater, Home Appliance
C
G
G C E
TO-3P
Absolute Maximum Ratings
Symbol
VCES
VGES
IC
ICM (1)
IF
PD
TJ
Tstg
TL
E
TC = 25°C unless otherwise noted
Description
Collector-Emitter Voltage
Gate-Emitter Voltage
Collector Current
Collector Current
Pulsed Collector Current
Diode Continuous Forward Current
Maximum Power Dissipation
Maximum Power Dissipation
Operating Junction Temperature
Storage Temperature Range
Maximum Lead Temp. for soldering
Purposes, 1/8” from case for 5 seconds
@ TC = 25°C
@ TC = 100°C
@ TC = 100°C
@ TC = 25°C
@ TC = 100°C
FGA50N100BNTD
1000
± 25
50
35
100
15
156
63
-55 to +150
-55 to +150
Units
V
V
A
A
A
A
W
W
°C
°C
300
°C
Notes :
(1) Repetitive rating : Pulse width limited by max. junction temperature
Thermal Characteristics
Symbol
RθJC(IGBT)
RθJC(DIODE)
RθJA
Parameter
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Case
Thermal Resistance, Junction-to-Ambient
©2006 Fairchild Semiconductor Corporation
FGA50N100BNTD Rev. A
Typ.
----
Max.
0.8
2.4
25
Units
°C/W
°C/W
°C/W
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FGA50N100BNTD 1000V, 50A NPT-Trench IGBT CO-PAK
January 2006
Device Marking
Device
Package
FGA50N100BNTD
FGA50N100BNTDTU
TO-3P
Electrical Characteristics of IGBT
Symbol
Packaging Type
Qty per Tube
Rail / Tube
30ea
Max Qty
per Box
-
TC = 25°C unless otherwise noted
Parameter
Test Conditions
Min.
Typ.
Max.
Units
1000
--
--
V
---
---
1.0
± 500
mA
nA
4.0
---
5.0
1.5
2.5
7.0
1.8
2.9
V
V
V
----
6000
260
200
----
pF
pF
pF
--------
140
320
630
130
275
45
95
---250
350
---
ns
ns
ns
ns
nC
nC
nC
Typ.
1.2
1.8
1.2
0.05
Max.
1.7
2.1
1.5
2
Units
V
V
us
uA
Off Characteristics
BVCES
ICES
IGES
Collector Emitter Breakdown Voltage
VGE = 0V, IC = 1mA
Collector Cut-Off Current
G-E Leakage Current
VCE = 1000V, VGE = 0V
VGE = ± 25, VCE = 0V
On Characteristics
VGE(th)
VCE(sat)
G-E Threshold Voltage
Collector to Emitter
Saturation Voltage
IC = 60mA, VCE = VGE
IC = 10A, VGE = 15V
IC = 60A, VGE = 15V
Dynamic Characteristics
Cies
Coes
Cres
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
VCE=10V, VGE = 0V,
f = 1MHz
Switching Characteristics
td(on)
tr
td(off)
tf
Qg
Qge
Qgc
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate-Emitter Charge
Gate-Collector Charge
VCC = 600 V, IC = 60A,
RG = 51Ω, VGE=15V,
Resistive Load, TC = 25°C
VCE = 600 V, IC = 60A,
VGE = 15V , , TC = 25°C
Electrical Characteristics of DIODE T
C
Symbol
Parameter
VFM
Diode Forward Voltage
trr
IR
Diode Reverse Recovery Time
Instantaneous Reverse Current
= 25°C unless otherwise noted
Test Conditions
IF = 15A
IF = 60A
IF = 60A di/dt = 20 A/us
VRRM = 1000V
Min.
----
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FGA50N100BNTD Rev. A
FGA50N100BNTD 1000V, 50A NPT-Trench IGBT CO-PAK
Package Marking and Ordering Information
80
90
20V
15V
10V
9V
8V
o
60
40
7V
20
1
2
3
4
Tc = 25 C
o
Tc = 125 C
70
60
50
40
30
20
10
VGE = 6V
0
0
Common Emitter
VGE = 15V
80
Collector Current, I C [A]
Collector Current, I C [A]
Common Emitter
o
TC = 25 C
0
5
0
Collector-Emitter Voltage, VCE [V]
1
2
3
4
Collector-Emitter Voltage, VCE [V]
Fig 1. Typical Output Characteristics
Fig 2. Typical Saturation Voltage Characteristics
Common Emitter
O
TC= - 40 C
3
Collector-Emitter Voltage, VCE[V]
Collector-Emitter Voltage, VCE [V]
10
Common Emitter
VGE=15V
80A
60A
2
30A
IC=10A
1
-50
0
50
100
8
6
30A
4
60A
80A
2
IC=10A
0
150
4
o
Case Temperature, TC [ C]
Fig 3. Saturation Voltage vs. Case
Temperature at Varient Current Level
8
6
30A
60A
80A
2
IC = 10A
0
4
8
12
16
Gate-Emitter Voltage, VGE [V]
Fig 5. Saturation Voltage vs. VGE
16
10
Common Emitter
o
TC = 25 C
4
12
20
Fig 4. Saturation Voltage vs. VGE
Collector-Emitter Voltage, VCE [V]
Collector-Emitter Voltage, VCE [V]
10
8
Gate-Emitter Voltage, VGE [V]
20
Common Emitter
o
TC = 125 C
8
30A
6
60A
80A
4
2
IC = 10A
0
4
8
12
16
20
Gate-Emitter Voltage, VGE [V]
Fig 6. Saturation Voltage vs. VGE
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FGA50N100BNTD Rev. A
FGA50N100BNTD 1000V, 50A NPT-Trench IGBT CO-PAK
100
FGA50N100BNTD 1000V, 50A NPT-Trench IGBT CO-PAK
10000
10000
Cies
V CC =600V, IC =60A
V GE = +/-15V
Coes
100
Cres
Common Emitter
VGE = 0V, f = 1MHz
Switching Time [ns]
Capacitance [pF]
o
T C =25 C
1000
Tdoff
1000
Tr
T don
Tf
100
o
TC = 25 C
0
5
10
15
20
25
10
30
0
50
100
Collector-Emitter Voltage, VCE [V]
Fig 7. Capacitance Characteristics
20
Common Emitter
VCC=600V, RL=10 Ω
V CC= 6 0 0 V , R g = 5 1 Ω
o
TC=25 C
o
Gate-Emitter Voltage,VGE [V]
V G E = + /-1 5 V , T C = 2 5 C
Switching Time [ns]
200
Fig 8. Switching Characteristics vs.
Gate Resistance
1000
T d o ff
Tf
Tr
100
150
Gate Resistance, R G [Ω ]
T don
15
10
5
0
10
20
30
40
50
0
60
50
100
150
200
250
300
Gate Charge, Qg [nC]
C o lle cto r C urre nt, IC [A ]
Fig 9. Switching Characteristics vs.
Collector Current
Fig 10. Gate Charge Characteristics
1
100
0.5
Ic MAX (Pulsed)
Ic MAX (Continuous)
0.2
Thermal Response [Zthjc]
Collector Current, Ic [A]
50 µ s
100 µ s
10
1ms
DC Operation
1
Single Nonrepetitive
o
Pulse Tc = 25 C
Curves must be derated
linearly with increase
in temperature
0.1
0.01
0.1
1
0.1
0.1
0.05
0.02
0.01
0.01
1E-3
1E-5
10
100
Collector - Emitter Voltage, V CE [V]
Fig 11. SOA Characteristics
1000
singlepulse
1E-4
1E-3
0.01
0.1
1
10
Rectangular PulseDuration[sec]
Fig 12. Transient Thermal Impedance of IGBT
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FGA50N100BNTD Rev. A
120
IF= 60 A
Forward Current, IF[A]
o
T C = 100 C
10
o
T C = 25 C
1
0.1
0.0
0.5
1.0
1.5
2.0
1.0
0.8
80
trr
0.6
60
0.4
40
0.2
0
40
Forward Voltage, V FM [V]
160
200
0
240
8
Irr
0.6
6
0.4
4
1000
100
Reverse Current, IR [uA]
Reverse Recovery Time, trr [us]
10
Reverse Recovery Current Irr [A]
12
trr
0.8
120
Fig 14. Reverse Recovery Characteristics
vs. di/dt
di/dt=-20A/us
o
TC=25 C
1.0
80
di/dt [A/us]
Fig 13. Forward Characteristics
1.2
20
Irr
0.0
2.5
100
Reverse Recovery Current Irr [A]
Reverse Recovery Time, trr [us]
o
TC= 25 C
o
T C = 150 C
10
1
0.1
o
T C= 25 C
0.01
1E-3
10
20
30
40
50
60
0
Forward Current, IF [A]
300
600
900
Reverse Voltage, V R [V]
Fig 15. Reverse Recovery Characteristics vs.
Forward Current
250
Fig 16. Reverse Current vs. Reverse Voltage
o
TC = 25 C
Capacitance, Cj [pF]
200
150
100
50
0
0.1
1
10
100
Reverse Voltage, VR [V]
Fig 17. Junction capacitance
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FGA50N100BNTD Rev. A
FGA50N100BNTD 1000V, 50A NPT-Trench IGBT CO-PAK
1.2
100
TO-3P
15.60 ±0.20
3.00 ±0.20
3.80 ±0.20
+0.15
1.00 ±0.20
18.70 ±0.20
23.40 ±0.20
19.90 ±0.20
1.50 –0.05
16.50 ±0.30
2.00 ±0.20
9.60 ±0.20
4.80 ±0.20
3.50 ±0.20
13.90 ±0.20
ø3.20 ±0.10
12.76 ±0.20
13.60 ±0.20
1.40 ±0.20
+0.15
5.45TYP
[5.45 ±0.30]
5.45TYP
[5.45 ±0.30]
0.60 –0.05
Dimensions in Millimeters
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FGA50N100BNTD Rev. A
FGA50N100BNTD 1000V, 50A NPT-Trench IGBT CO-PAK
Package Dimension
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PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
Rev. I17
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FGA50N100BNTD Rev. A
FGA50N100BNTD 1000V, 50A NPT-Trench IGBT CO-PAK
TRADEMARKS