SECOS SMG2339P

SMG2339P
-3.6 A, -30 V, RDS(ON) 0.057 
P-Channel Enhancement MOSFET
Elektronische Bauelemente
RoHS Compliant Product
A suffix of “-C” specifies halogen & lead-free
SC-59
DESCRIPTION
The miniature surface mount MOSFETs utilize a high cell density process
Low RDS(on) assures minimal power loss and conserves energy, making this
device ideal for use in power management circuitry.
Typical applications are lower voltage application, power management in
portable and battery-powered products such as computers, printers, PCMCIA
cards, cellular and cordless telephones.
A
L
3
3
C B
Top View
1
1
K
FEATURES
Low RDS(on) provides higher efficiency and extends battery life.
Fast Switch.
Low Gate Charge.
Miniature SC-59 surface mount package saves board space.




2
E
D
F
G
REF.
PRODUCT SUMMARY
PRODUCT SUMMARY
VDS(V)
-30
RDS(on) (
0.057@VGS= -4.5V
0.089@VGS= -2.5V
ID(A)
-3.6
-2.8
2

A
B
C
D
E
F
Millimeter
Min.
Max.
2.70
3.10
2.25
3.00
1.30
1.70
1.00
1.40
1.70
2.30
0.35
0.50
H
REF.
G
H
J
K
L
J
Millimeter
Min.
Max.
0.10 REF.
0.40 REF.
0.10
0.20
0.45
0.55
0.85
1.15
Drain

Gate

Source
ABSOLUTE MAXIMUM RATINGS AND THERMAL DATA(TA = 25°C unless otherwise specified)
PARAMETER
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current A
TA=25°C
TA=70°C
Pulsed Drain Current B
Continuous Source Current (Diode Conduction) A
SYMBOL
RATING
UNIT
VDS
VGS
-30
±12
±3.6
±2.9
±10
0.4
1.25
0.8
-55 ~ 150
V
V
ID
IDM
IS
TA=25°C
PD
TA=70°C
Operating Junction and Storage Temperature Range
TJ, TSTG
THERMAL RESISTANCE DATA
t≦5 sec
Maximum Junction to Ambient A
RθJA
Steady-State
Power Dissipation A
100
150
A
A
A
W
°C
°C/W
Notes
a.
Surface Mounted on 1” x 1” FR4 Board.
b.
Pulse width limited by maximum junction temperature.
http://www.SeCoSGmbH.com/
07-Jul-2010 Rev. A
Any changes of specification will not be informed individually.
Page 1 of 2
SMG2339P
-3.6 A, -30 V, RDS(ON) 0.057 
P-Channel Enhancement MOSFET
Elektronische Bauelemente
ELECTRICAL CHARACTERISTICS (TA=25°C unless otherwise specified)
PARAMETER
SYMBO MIN TYP MAX UNIT
TEST CONDITIONS
Static
Gate-Threshold Voltage
VGS(th)
-0.80
-
-
V
VDS = VGS, ID = -250μA
Gate-Body Leakage
IGSS
-
-
±100
nA
VDS = 0V, VGS= ±12V
Zero Gate Voltage Drain Current
IDSS
-
-
-1
-
-
-10
On-State Drain Current A
ID(ON)
-2
-
-
-
-
57
-
-
89
Drain-Source On-Resistance A
RDS(ON)
μA
A
mΩ
VDS = -24V, VGS= 0V
VDS = -24V, VGS= 0V, TJ=55°C
VDS = -5V, VGS= -4.5V
VGS= -4.5V, ID = -3.6A
VGS= -2.5V, ID = -2.8A
Forward Transconductance A
gFS
-
2
-
S
VDS= -5V,,ID = -3.6A
Diode Forward Voltage
VSD
-
-0.70
-
V
IS= -0.4A, VGS= 0V
Dynamic b
Total Gate Charge
Qg
-
25
-
Gate-Source Charge
Qgs
-
2.4
-
Gate-Drain Charge
Qgd
-
3.9
-
VGS= -5V
Turn-On Delay Time
Td(ON)
-
7.6
-
VDS= -15V
Tr
-
6.8
-
Td(OFF)
-
33.6
-
Tf
-
23.2
-
Rise Time
Turn-Off Delay Time
Fall Time
ID= -3.6A
nC
nS
VDS= -10V
ID= -1A
VGEN= -10V
RG= 50Ω
Notes
a.
Pulse test:PW ≦ 300 us duty cycle ≦ 2%.
b.
Guaranteed by design, not subject to production testing.
http://www.SeCoSGmbH.com/
07-Jul-2010 Rev. A
Any changes of specification will not be informed individually.
Page 2 of 2