SECOS SSG4942N

SSG4942N
Dual N-Channel Mode Power MOSFET
4.4 A, 40 V, RDS(ON) 75 m
Elektronische Bauelemente
RoHS Compliant Product
A suffix of “-C” specifies halogen & lead-free
DESCRIPTION
SOP-8
These miniature surface mount MOSFETs
utilize a high cell density trench process to
provide low RDS(on) and to ensure minimal
power loss and heat dissipation. Typical
applications are DC-DC converters and power
management in portable and battery-powered
products such as computers, printers, PCMCIA
cards, cellular and cordless telephones.
B
L
D
M
A
C
N
J
FEATURES




H
Low RDS(on) provides higher efficiency and extends
battery life.
Low thermal impedance copper leadframe SOP-8
saves board space.
Fast switching speed.
High performance trench technology.
REF.
A
B
C
D
E
F
G
K
G
Millimeter
Min.
Max.
5.80
6.20
4.80
5.00
3.80
4.00
0°
8°
0.40
0.90
0.19
0.25
1.27 TYP.
E
F
REF.
H
J
K
L
M
N
Millimeter
Min.
Max.
0.35
0.49
0.375 REF.
45°
1.35
1.75
0.10
0.25
0.25 REF.
PACKAGE INFORMATION
Package
MPQ
LeaderSize
SOP-8
2.5K
13’ inch
S
D
G
D
S
D
G
D
MAXIMUM RATINGS (TA = 25°C unless otherwise specified)
Parameter
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current 1
TA = 25°C
TA = 70°C
Pulsed Drain Current 2
Continuous Source Current (Diode Conduction)
Total Power Dissipation 1
1
TA = 25°C
TA = 70°C
Operating Junction & Storage Temperature Range
Symbol
Ratings
Unit
VDS
40
V
VGS
±20
V
4.4
A
ID
3.6
A
IDM
±50
A
IS
2.3
A
2.1
W
PD @
TJ, TSTG
1.3
W
-55 ~ 150
°C
Thermal Resistance Ratings
Thermal Resistance Junction-Ambient (Max.) 1
t ≦ 10 sec
Steady State
RθJA
62.5
°C / W
110
°C / W
Notes:
1.
Surface Mounted on 1” x 1” FR4 Board.
2.
Pulse width limited by maximum junction temperature.
http://www.SeCoSGmbH.com/
14-Jan-2011 Rev. B
Any changes of specification will not be informed individually.
Page 1 of 2
SSG4942N
Dual N-Channel Mode Power MOSFET
4.4 A, 40 V, RDS(ON) 75 m
Elektronische Bauelemente
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise specified)
Parameter
Symbol
Min.
Typ.
Max.
Unit
Teat Conditions
Static
Drain-Source Breakdown Voltage
Gate Threshold Voltage
Gate-Body Leakage Current
VBR(DSS)
30
-
-
VGS(th)
1
-
-
IGSS
Zero Gate Voltage Drain Current
IDSS
On-State Drain Current 1
ID(on)
Drain-Source On-Resistance 1
RDS(ON)
V
VGS= 0V, ID= 250μA
VDS= VGS, ID= 250μA
-
-
±100
nA
VDS= 0V, VGS= 20V
-
-
1
μA
VDS= 24V, VGS= 0V
-
-
25
μA
VDS= 24V, VGS= 0V, TJ= 55°C
20
-
-
A
VDS= 5V, VGS= 10V
-
-
80
-
-
100
mΩ
VGS= 10V, ID= 4.4A
VGS= 4.5V, ID= 3.9A
Forward Transconductance 1
gfs
-
40
-
S
VDS= 15V, ID= 4.4A
Diode Forward Voltage
VSD
-
0.7
-
V
IS= 2.3A, VGS= 0V
Dynamic 2
Total Gate Charge
Qg
-
20
-
Gate-Source Charge
Qgs
-
7.0
-
Gate-Drain Charge
Qgd
-
7.0
-
nC
ID= 4.4A
VDS= 15V
VGS= 5V
nS
VDD= 25V
ID= 1A
VGEN= 10V
RL= 25Ω
Switching
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Td(on)
-
20
-
Tr
-
9
-
Td(off)
-
70
-
Tf
-
20
-
Notes:
1.
Pulse test:PW ≦ 300μs duty cycle ≦ 2%.
2.
Guaranteed by design, not subject to production testing.
http://www.SeCoSGmbH.com/
14-Jan-2011 Rev. B
Any changes of specification will not be informed individually.
Page 2 of 2