SILICON EPITAXIAL PLANAR DIODE 1N6640D2A / 1N6640D2B • • • • • • Low Leakage Fast Switching Low Forward Voltage Hermetic Ceramic Package Designed as a Drop-In Replacement for “D-5A”/”A-MELF” Package. Suitable for general purpose, switching applications. Space Level and High-Reliability Screening Options Available ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated) VBR VRWM IO IFSM PD Breakdown Voltage Working Peak Reverse Voltage Average Rectified Output Current, TA = 75°C Surge Current (half sine wave, tp = 8.3ms) TA = 75°C Total Power Dissipation at (1) (1) PD Total Power Dissipation at Derate Above 75°C TSP = 75°C Derate Above 75°C TJ Tstg Junction Temperature Range Storage Temperature Range 75V 50V 300mA 2.5A TBD TBD TBD TBD -65 to +175°C -65 to +175°C THERMAL PROPERTIES Symbols RθJA(PCB) RθJSP (1) Parameters (1) Max. Units Thermal Resistance, Junction To Ambient, On PCB TBD °C/W Thermal Resistance, Junction To Solder Pads TBD °C/W Thermal PCB rating to be determined Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8953 Issue 1 Page 1 of 4 SILICON EPITAXIAL PLANAR DIODE 1N6640D2A / 1N6640D2B ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) Symbols Parameters Test Conditions VBR Breakdown Voltage IR = 10µA 75 IF = 1.0mA 0.540 0.620 IF = 50mA 0.760 0.860 IF = 100mA 0.820 0.920 IF = 200mA 0.870 1.0 VF (2) Forward Voltage Min. Typ TA = -55°C IR Reverse Current Max. Units V 1.1 IF = 500mA 1.2 VR = 50V 100 nA 90 µA 2.5 pF 4 ns 5 V(pk) 10 ns TA = +150°C DYNAMIC CHARACTERISTICS C Capacitance VR = 0V f = 1.0MHz Vsig = 50mV (p-p) trr Reverse Recovery Time Vfr Forward Recovery Voltage IF = IRM = 10mA IF = 200mA tfr Notes (2) Forward Recovery Time Pulse Width ≤ 300us, δ ≤ 2% Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8953 Issue 1 Page 2 of 4 SILICON EPITAXIAL PLANAR DIODE 1N6640D2A / 1N6640D2B MECHANICAL DATA DLCC2 Variant A (D2A) PAD 1 PAD 2 ANODE CATHODE DIMENSION A B C D mm 5.00 ±0.10 2.61 ±0.10 1.08 ±0.10 1.76 ±0.10 Inches 0.197 ±0.004 0.103 ±0.004 0.043 ±0.004 0.069 ±0.004 DLCC2 Variant B (D2B) PAD 1 PAD 2 PAD 3 ANODE CATHODE LID CONTACT TO ANODE* DIMENSION A B C D mm 5.00 ±0.10 2.61 ±0.10 1.08 ±0.10 1.76 ±0.10 Inches 0.197 ±0.004 0.103 ±0.004 0.043 ±0.004 0.069 ±0.004 SOLDER PAD LAYOUT D-5A DLCC2/ D-5A MELF OVERLAY DIMENSION A B C mm 6.25 1.70 2.67 Inches 0.246 0.067 0.105 C A B * The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep dielectric discharge in space applications; see the Space Weather link www.semelab.co.uk/dlcc2.html on the Semelab web site. Package variant to be specified at order. Other Package Outlines may be available – Contact Semelab Sales to Enquire Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8953 Issue 1 Page 3 of 4 SILICON EPITAXIAL PLANAR DIODE 1N6640D2A / 1N6640D2B SCREENING OPTIONS ORDERING INFORMATION Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. Part numbers are built up from Type, Package Variant, and screening level. The part numbers are extended to include the additional options as shown below. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Type – See Electrical Stability Characteristics Table Package Variant – See Mechanical Data Screening Level – See Screening Options (ESA / JQRS) Additional Options: Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. MARKING DETAILS Parts can be laser marked with approximately 7 characters on two lines and always includes cathode identification. Typical marking would include part or specification number, week of seal or serial number subject to available space and legibility. Customer specific marking requirements can be arranged at the time of order. Example Marking: 1N6640-A 001 Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test .CVP .CVB .DA .SS .SEM .XRAY .RAD MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All ‘Additional Options’ are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. Example ordering information: The following example is for the 1N6640 part with package variant A, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 1N6640D2A-JQRS (Include quantity for flight parts) 1N6640D2A-JQRS.GRPC (chargeable conformance option) 1N6640D2A-JQRS.GCDE (charge for destructive parts) 1N6640D2A-JQRS.GCDM (charge for destructive parts) 1N6640D2A-JQRS.DA (charge for Data pack) Customers with any specific requirements (e.g. marking or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with enquiries High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8953 Issue 1 Page 4 of 4