SILICON PLANAR EPITAXIAL PNP TRANSISTOR 2N2907AC3 • Low Power, High Speed Saturated Switching • Hermetic Surface Mounted Package. • Ideally suited for High Speed Switching and General Purpose Applications • Screening Options Available ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise stated) VCBO VCEO VEBO IC PD TJ Tstg Collector – Base Voltage Collector – Emitter Voltage Emitter – Base Voltage Continuous Collector Current TA = 25°C Total Power Dissipation at Derate Above 37.5°C Junction Temperature Range Storage Temperature Range -60V -60V -5V -600mA 500mW 3.08mW/°C -65 to +200°C -65 to +200°C THERMAL PROPERTIES (Each Device) Symbols Parameters RθJA Thermal Resistance, Junction To Ambient Min. Typ. Max. Units 325 °C/W Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice. Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to verify that datasheets are current before placing orders. Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8357 Issue 1 Page 1 of 4 SILICON PLANAR EPITAXIAL PNP TRANSISTOR 2N2907AC3 ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise stated) Symbols (1) V(BR)CEO ICBO Parameters Test Conditions Collector-Emitter Breakdown Voltage IC = -10mA IB = 0 VCB = -60V IE = 0 -10 µA VCB = -50V IE = 0 -10 nA TA = 150°C -10 µA VEB = -5V IC = 0 -10 µA VEB = -4V IC = 0 -50 nA -50 nA Collector Cut-Off Current IEBO Emitter Cut-Off Current ICES Collector Cut-Off Current (1) VCE(sat) VBE(sat) hFE (1) (1) Collector-Emitter Saturation Voltage Base-Emitter Saturation Voltage Forward-current transfer ratio Min. Typ Max. -60 VCE = -50V V IC = -150mA IB = -15mA -0.4 IC = -500mA IB = -50mA -1.6 IC = -150mA IB = -15mA IC = -500mA IB = -50mA IC = -0.1mA VCE = -10V 75 IC = -1.0mA VCE = -10V 100 IC = -10mA VCE = -10V 100 TA = -55°C 50 IC = -150mA VCE = -10V 100 IC = -500mA VCE = -10V 50 IC = -20mA VCE = -20V -0.6 Units V -1.3 -2.6 450 300 DYNAMIC CHARACTERISTICS | hfe | Small signal forward-current transfer ratio hfe Small Signal Current Gain Cobo Output Capacitance Cibo Input Capacitance ton Turn-On Time toff Turn-Off Time 2 f = 100MHz IC = -1.0mA VCE = -10V f = 1.0KHz VCB = -10V 100 IE = 0 8 f = 1.0MHz VEB = -2V pF IC = 0 30 f = 1.0MHz IC = -150mA VCC = -30V IB1 = -15mA IC = -150mA VCC = -30V IB1 = - IB2 = -15mA 45 ns 300 Notes (1) Pulse Width ≤ 300us, δ ≤ 2% Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8357 Issue 1 Page 2 of 4 SILICON PLANAR EPITAXIAL PNP TRANSISTOR 2N2907AC3 MECHANICAL DATA Dimensions in mm (inches) 1.40 ± 0.15 (0.055 ± 0.006) 5.59 ± 0.13 (0.22 ± 0.005) 3 4 1.02 ± 0.20 (0.04 ± 0.008) 2 1 1.27 ± 0.05 (0.05 ± 0.002) 0.23 rad. (0.009) 0.64 ± 0.08 (0.025 ± 0.003) 3.81 ± 0.13 (0.15 ± 0.005) 0.25 ± 0.03 (0.01 ± 0.001) 0.23 min. (0.009) 2.03 ± 0.20 (0.08 ± 0.008) C3 (MO-041BA) Underside View PACKAGE VARIANT TABLE Variant A B C Pad 1 Collector Collector Collector Pad 2 N/C N/C Emitter Pad 3 Emitter Base N/C Pad 4 Base Emitter Base N/C = No Connection Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8357 Issue 1 Page 3 of 4 SILICON PLANAR EPITAXIAL PNP TRANSISTOR 2N2907AC3 SCREENING OPTIONS ORDERING INFORMATION Space Level (JQRS/ESA) and High Reliability options are available in accordance with the High Reliability and Screening Options Handbook available for download from the from the TT electronics Semelab web site. Part number is built from part, package variant and screening level. The part number can be extended to include the additional options as shown below. ESA Quality Level Products are based on the testing procedures specified in the generic ESCC 5000 and in the corresponding part detail specifications. Type – See Electrical Stability Characteristics Table Package Variant – See Mechanical Data Screening Level – See Screening Options (ESA / JQRS) Additional Options: Semelabs QR216 and QR217 processing specifications (JQRS), in conjunction with the companies ISO 9001:2000 approval present a viable alternative to the American MILPRF-19500 space level processing. QR217 (Space Level Quality Conformance) is based on the quality conformance inspection requirements of MIL-PRF19500 groups A (table V), B (table VIa), C (table VII) and also ESA / ESCC 5000 (chart F4) lot validation tests. QR216 (Space Level Screening) is based on the screening requirements of MIL-PRF-19500 (table IV) and also ESA /ESCC 5000 (chart F3). JQRS parts are processed to the device data sheet and screened to QR216 with conformance testing to Q217 groups A and B in accordance with MIL-STD-750 methods and procedures. Additional conformance options are available, for example Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs. These are chargeable and must be specified at the order stage (See Ordering Information). Minimum order quantities may apply. Alternative or additional customer specific conformance or screening requirements would be considered. Contact Semelab sales with enquires. MARKING DETAILS Parts are typically marked with specification number, serial number (or week of seal) as shown in the example below. . Customer specific marking requirements can be arranged at time of order but is approximately limited to three lines of 7 Characters. This is to ensure text remains readable. Example Marking: Customer Pre-Cap Visual Inspection Customer Buy-Off visit Data Pack Solderability Samples Scanning Electron Microscopy Radiography (X-ray) Total Dose Radiation Test .CVP .CVB .DA .SS .SEM .XRAY .RAD MIL-PRF-19500 (QR217) Group B charge Group B destructive mechanical samples Group C charge Group C destructive electrical samples Group C destructive mechanical samples .GRPB .GBDM (12 pieces) .GRPC .GCDE (12 pieces) .GCDM (6 pieces) ESA/ESCC Lot Validation Testing (subgroup 1) charge LVT1 destructive samples (environmental) LVT1 destructive samples (mechanical) Lot Validation Testing (subgroup 2) charge LVT2 endurance samples (electrical) Lot Validation Testing (subgroup 3) charge LVT3 destructive samples (mechanical) .LVT1 .L1DE (15 pieces) .L1DM (15 pieces) .LVT2 .L2D (15 pieces) .LVT3 .L3D (5 pieces) Additional Option Notes: 1) All ‘Additional Options’ are chargeable and must be specified at order stage. 2) When Group B,C or LVT is required, additional electrical and mechanical destructive samples must be ordered 3) All destructive samples are marked the same as other production parts unless otherwise requested. Example ordering information: The following example is for the 2N2907AC3 part, package variant B, JQRS screening, additional Group C conformance testing and a Data pack. Part Numbers: 2N2907AC3B-JQRS (Include quantity for flight parts) 2N2907AC3B-JQRS.GRPC (chargeable conformance option) 2N2907AC3B-JQRS.GCDE (charge for destructive parts) 2N2907AC3B-JQRS.GCDM (charge for destructive parts) 2N2907AC3B-JQRS.DA (charge for Data pack) Customers with any specific requirements (e.g. marking, package or screening) may be supplied with a similar alternative part number (there is maximum 20 character limit to part numbers). Contact Semelab sales with all enquiries High Reliability and Screening Options Handbook link: http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf Semelab Limited Coventry Road, Lutterworth, Leicestershire, LE17 4JB Telephone +44 (0) 1455 556565 Fax +44 (0) 1455 552612 Email: [email protected] Website: http://www.semelab-tt.com Document Number 8357 Issue 1 Page 4 of 4