TAK_CHEONG TFP10N60

TAK CHEONG
®
N-Channel Power MOSFET
10A, 600V, 0.75Ω
GENERAL DESCRIPTION
The N-Channel MOSFET is used an advanced termination
scheme to provide enhanced voltage-blocking capability
without degrading performance over time. This advanced
technology has been especially tailored to minimize on-state
resistance, provide superior switching performance. This
device is well suited for high efficiency switched mode power
suppliers, active power factor correction, electronic lamp
ballasts based half bridge topology.
1
1 = Gate
2 = Drain
3 = Source
2
TO-220AB
3
DEVICE MARKING DIAGRAM
L xxyy
TFP
XXXX
L = Tak Cheong Logo
xxyy = Monthly Date Code
TFPXXXX = Device Type
D
FEATURES
● Robust high voltage termination
● Avalanche energy specified
● Diode is characterized for use in bridge circuits
● Source to Drain diode recovery time comparable to a
discrete fast recovery diode.
G
S
ABSOLUTE MAXIMUM RATINGS (T C =25°C, unless otherwise noted )
Symbol
Parameter
Value
Units
VDSS
Drain- Source Voltage
600
V
VGSS
Gate-Source Voltage
±20
V
Drain Current
10
A
Continuous Drain Current Tc=100℃
6.4
A
Drain Current Pulsed
40
A
125
W
1
W/℃
ID
IDM
PD
Power Dissipation
(Note 2)
Derating Factor above 25℃
EAS
Single Pulsed Avalanche Energy
(Note 1)
300
mJ
EAR
Repetitive Avalanche Energy
(Note 2)
30
mJ
150
℃
- 55 to +150
℃
Value
Unit
TJ
Tstg
Operating Junction Temperature
Storage Temperature Range
Notes:
1. L=10mH, I AS=8.0A, VDD=50V, RG=50Ω, Starting T J=25℃
2. Repetitive Rating: Pulse width limited by maximum junction temperature.
THERMAL CHARACTERISTICS
Symbol
Parameter
RθJC
Thermal Resistance, Junction-to-Case
1.0
℃/W
RθJA
Thermal Resistance, Junction-to-Ambient
62
℃/W
Number: DB-220
May 2010, Revision A
Page 1
TFP10N60
P rel i mi nary D atash e et
TAK CHEONG
®
P rel i mi nary D atash e et
ELECTRICAL CHARACTERISTICS
Off Characteristics (TA = 25°C unless otherwise noted)
Symbol
BVDSS
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Drain-Sounce Breakdown Voltage
VGS = 0V, ID = 250uA
600
--
--
V
IDSS
Zero Gate Voltage Drain Current
VDS = 600V, VGS = 0V
--
--
25
uA
IGSSF
Gate-Body Leakage Current, Forward
VGS = 20V, VDS = 0V
--
--
10
uA
IGSSR
Gate-Body Leakage Current, Reverse
VGS = -20V, VDS = 0V
--
--
-10
uA
Min.
Typ.
Max.
Unit
2.0
--
4.0
V
--
0.63
0.75
Ω
Min.
Typ.
Max.
Unit
--
1430
--
pF
--
160
---
pF
--
28
--
pF
Min.
Typ.
Max.
Unit
--
20
--
nS
--
20
--
nS
--
55
--
nS
On Characteristics (TA = 25°C unless otherwise noted)
Symbol
Parameter
Test Conditions
VGS (th)
Gate Threshold Voltage
VDS = VGS , ID = 250uA
RDS(ON)
On-Resistance
VGS = 10V, ID = 5A
Dynamic Characteristics
Symbol
Parameter
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Test Conditions
VDS = 25V, VGS = 0V,
f = 1.0MHz
Switching Characteristics
Symbol
td(on)
Parameter
Test Conditions
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
VDD = 300V, ID = 10A,
VGS = 10V, R G = 4.7Ω
(Note 3 & 4)
tr
Turn-Off Fall Time
--
30
--
nS
Qg
Total Gate Charge
VDS = 480V, ID = 10A,
--
60
70
nC
Qgs
Gate-Source Charge
VGS = 10V
--
12
--
nC
Qgd
Gate-Drain Charge
(Note 3 & 4)
--
28
--
nC
Min.
Typ,
Max.
Unit
Drain-Source Diode Characteristics and Maximum Ratings
Symbol
Parameter
Test Conditions
IS
Maximum Continuous Drain-Source Diode Forward Current
--
--
10
A
ISM
Maximum Pulsed Drain-Source Diode Forward Current
--
--
40
A
VSD
Drain-Source Diode Forward Voltage
--
--
1.5
V
Trr
Reverse Recovery Time
--
600
--
nS
Qrr
Reverse Recovery Charge
--
4.3
--
nC
IRRM
Reverse Recovery Current
--
13
--
A
VGS = 0V, IS = 10A
VGS = 0V, IS = 10A,
dIF / dt = 100A/uS
(Note 3)
Notes:
3. Pulse Test: Pulse width 380us, Duty cycle ≤ 2%.
4. Basically not affected by working temperature.
Number: DB-220
May 2010, Revision A
Page 2
TAK CHEONG
®
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TYPICAL CHARACTERISTICS
Number: DB-220
May 2010, Revision A
Page 3
TAK CHEONG
®
P rel i mi nary D atash e et
Number: DB-220
May 2010, Revision A
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TAK CHEONG
®
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Number: DB-220
May 2010, Revision A
Page 5
TAK CHEONG
®
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TEST CIRCUIT AND WAVEFORM
Number: DB-220
May 2010, Revision A
Page 6
TAK CHEONG
®
P rel i mi nary D atash e et
TO220AB PACKAGE OUTLINE
DIM
MILLIMETERS
INCHES
MIN
MAX
MIN
MAX
A
3.60
4.80
0.142
0.189
A1
1.20
1.40
0.047
0.055
A2
2.03
2.90
0.080
0.114
b
0.40
1.00
0.016
0.039
b2
1.20
1.78
0.047
0.070
c
0.36
0.60
0.014
0.024
D
14.22
16.50
0.560
0.650
e
2.34
2.74
0.092
0.108
E
9.70
10.60
0.382
0.417
H1
5.84
6.85
0.230
0.270
L
12.70
14.70
0.500
0.579
L1
2.70
3.30
0.106
0.130
ØP
3.50
4.00
0.138
0.157
Q
2.54
3.40
0.100
0.134
NOTE: Above package outline conforms to JEDEC TO-220AB
Number: DB-220
May 2010, Revision A
Page 7
TAK CHEONG
®
DISC LA I MER NOTIC E
NOTICE
The information presented in this document is for reference only. Tak Cheong reserves the right to make
changes without notice for the specification of the products displayed herein.
The product listed herein is designed to be used with ordinary electronic equipment or devices, and not
designed to be used with equipment or devices which require high level of reliability and the malfunction of with
would directly endanger human life (such as medical instruments, transportation equipment, aerospace
machinery, nuclear-reactor controllers, fuel controllers and other safety devices), Tak Cheong Semiconductor
Co., Ltd., or anyone on its behalf, assumes no responsibility or liability for any damagers resulting from such
improper use of sale.
This publication supersedes & replaces all information reviously supplied. For additional information, please visit
our website http://www.takcheong.com, or consult your nearest Tak Cheong’s sales office for further assistance.
Number: DB-100
April 14, 2008 / A