HANBIT HSD128M72B9K-F10L

HANBit
HSD128M72B9K
Synchronous DRAM Module 1024Mbyte (128Mx72Bit), 8K Ref., 3.3V
ECC Unbuffered SO-DIMM,
Part No. HSD128M72B9K
GENERAL DESCRIPTION
The HSD128M72B9K is a 128M x 72 bit Synchronous Dynamic RAM high density memory module. The module
consists of nine CMOS 128M x 8 bit with 4banks Synchronous DRAMs in TSOP-II 400mil packages on a 144-pin glassepoxy substrate. One or two 0.1uF decoupling capacitors are mounted on the printed circuit board in parallel for each
SDRAM. The HSD128M72B9K is a SO-DIMM(Small Outline Dual in line Memory Module) and is intended for mounting
into 144-pin edge connector sockets. Synchronous design allows precise cycle control with the use of system clock. I/O
transactions are possible on every clock cycle. Range of operating frequencies, programmable latencies allows the same
device to be useful for a variety of high bandwidth, high performance memory system applications All module components
may be powered from a single 3.3V DC power supply and all inputs and outputs are LVTTL-compatible.
FEATURES
• JEDEC standard 3.3V power supply
• Burst mode operation
• Auto & self refresh capability (8192 Cycles/64ms)
• LVTTL compatible with multiplexed address
• Separate power and ground planes to improve immunity
• Height : 1.250 inches
• MRS cycle with address key programs
- CAS latency (2 & 3)
- Burst length (1, 2, 4, 8 & Full page)
- Data scramble (Sequential & Interleave)
• All inputs are sampled at the positive going edge of the system clock
• The used device is 16M x 8bit x 4Banks Synchronous DRAM
• Part Identification
HSD128M72B9K-F/10L : 100MHz (CL=3)
HSD128M72B9K-F/10 : 100MHz (CL=2)
HSD128M72B9K-F/12 : 125MHz (CL=3)
HSD128M72B9K-F/13 : 133MHz (CL=3)
** F means Auto & Self refresh with Low-Power (3.3V)
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REV.0.0(January. 2003)
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HANBit Electronics Co.,Ltd.
HANBit
HSD128M72B9K
PIN ASSIGNMENT
No.
Front
No.
Back
No.
Front
No.
Back
1
Vss
2
Vss
71
/CS1
72
NC
3
DQ0
4
DQ32
73
NC
74
CLK1
5
DQ1
6
DQ33
75
Vss
76
Vss
7
DQ2
8
DQ34
77
CB2
78
CB6
9
DQ3
10
DQ35
79
CB3
80
CB7
11
VCC
12
VCC
81
VCC
82
VCC
13
DQ4
14
DQ36
83
DQ16
84
DQ48
15
DQ5
16
DQ37
85
DQ17
86
DQ49
`17
DQ6
18
DQ38
87
DQ18
88
DQ50
19
DQ7
20
DQ39
89
DQ19
90
DQ51
21
Vss
22
Vss
91
Vss
92
Vss
23
DQM0
24
DQM4
93
DQ20
94
DQ52
25
DQM1
26
DQM5
95
DQ21
96
DQ53
27
VCC
28
VCC
97
DQ22
98
DQ54
29
A0
30
A3
99
DQ23
100
DQ55
31
A1
32
A4
101
VCC
102
VCC
33
A2
34
A5
103
A6
104
A7
35
Vss
36
Vss
105
A8
106
BA0
37
DQ8
38
DQ40
107
Vss
108
Vss
39
DQ9
40
DQ41
109
A9
110
BA1
41
DQ10
42
DQ42
111
A10_AP
112
A11
43
DQ11
44
DQ43
113
VCC
114
VCC
45
VCC
46
VCC
115
DQM2
116
DQM6
47
DQ12
48
DQ44
117
DQM3
118
DQM7
49
DQ13
50
DQ45
119
Vss
120
Vss
51
DQ14
52
DQ46
121
DQ24
122
DQ56
53
DQ15
54
DQ47
123
DQ25
124
DQ57
55
Vss
56
Vss
125
DQ26
126
DQ58
57
CB0
58
CB4
127
DQ27
128
DQ59
59
CB1
60
CB5
129
VCC
130
VCC
131
DQ28
132
DQ60
133
DQ29
134
DQ61
Voltage Key
61
CLK0
62
CKE0
135
DQ30
136
DQ62
63
VCC
64
VCC
137
DQ31
138
DQ63
65
/RAS
66
/CAS
139
Vss
140
Vss
67
/WE
68
CKE1
141
**SDA
142
**SCL
69
/CS0
70
A12
143
VCC
144
VCC
** These pins should be NC in the system which does not support SPD
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REV.0.0(January. 2003)
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HSD128M72B9K
Functional Block Diagram
/CS1
/CS0
DQM0
DQ(0:7)
Add(0:12)
DQM
DQ(0:7)
BA(0:1)
/RAS
BA(0:1)
/RAS
/CAS
/WE
CKE(0:1)
/CS
DQM
DQ(0:7)
DQM4
DQ(32:39)
Add(0:12)
U1L
DQM1
DQM
CLK1
/CS
/CS
DQ(0:7)
Add(0:12)
CLK
DQM5
DQ(40:47)
DQM
DQ(0:7)
U2L
CLK
/CS
/CS
DQM
DQ(0:7)
DQM6
DQ(48:55)
U7U
/CAS
/WE
CKE(0:1)
CLK
CLK
/CS
DQM7
/CS
DQ(56:63)
U4L
/RAS
/CAS
/CS
DQM
/CS
DQ(0:7)
Add(0:12)
Add(0:12)
BA(0:1)
BA(0:1)
/RAS
U4U
U8L
U8U
/CAS
/WE
/WE
CKE(0:1)
CKE(0:1)
CLK
CLK
/CS
/CS
Serial PD
Add(0:12)
BA(0:1)
/RAS
/CAS
/CS
U7L
/RAS
U3U
/WE
CKE(0:1)
DQM
DQ(0:7)
/CS
Add(0:12)
BA(0:1)
U3L
/RAS
/CAS
DQM1
CB(0:7)
U6U
/WE
CKE(0:1)
Add(0:12)
BA(0:1)
DQM
DQ(0:7)
/CS
U6L
/RAS
/CAS
U2U
CLK
DQM3
DQ(24:31)
/CS
Add(0:12)
BA(0:1)
/CAS
/WE
CKE(0:1)
DQM
DQ(0:7)
U5U
/WE
CKE(0:1)
BA(0:1)
/RAS
DQM2
DQ(16:23)
/CS
U5L
/RAS
/CAS
U1U
CKE(0:1)
CLK
/CS
Add(0:12)
BA(0:1)
/CAS
/WE
CLK0
DQ(8:15)
/CS
U9L
SDA
SCL
U9U
A0
/WE
CKE(0:1)
A1
A2
47K
CLK
SA0
VCC
WP
One or two 0.1uF
Capacitors
per each SDRAM
SA1
SA2
To all SDRAMs
VSS
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HSD128M72B9K
PIN FUNCTION DESCRIPTION
Pin
Name
CLK0~CLK1
System clock
/CS0~/CS1
Chip select
Input Function
Active on the positive going edge to sample all inputs.
Disables or enables device operation by masking or enabling all inputs except
CLK, CKE and DQM
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one cycle prior to new command.
Disable input buffers for power down in standby.
CKE should be enabled 1CLK+tSS prior to valid command.
CKE0, CKE1
Clock enable
A0 ~ A12
Address
BA0 ~ BA1
Bank select address
Selects bank to be activated during row address latch time.
Selects bank for read/write during column address latch time.
/RAS
Row address strobe
Latches row addresses on the positive going edge of the CLK with /RAS low.
Enables row access & precharge.
/CAS
Column address strobe
/WE
Write enable
DQM0 ~ 7
Data input / output mask
DQ0 ~ 63
Data input / output
CB0~7
Check bit
VCC / VSS
Power supply / ground
Row/column addresses are multiplexed on the same pins.
Row address : RA0 ~ RA12, Column address : CA0 ~ CA9, CA11
Latches column addresses on the positive going edge of the CLK with /CAS
low. Enables column access.
Enables write operation and row precharge.
Latches data in starting from /CAS, /WE active.
Makes data output Hi-Z, tSHZ after the clock and masks the output.
Blocks data input when DQM active. (Byte masking)
Data inputs/outputs are multiplexed on the same pins.
Check bits for ECC
Power and ground for the input buffers and the core logic.
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
RATING
Voltage on Any Pin Relative to Vss
VIN , VOUT
-1V to 4.6V
Voltage on Vcc Supply Relative to Vss
Vcc
-1V to 4.6V
Power Dissipation
PD
18W
Storage Temperature
TSTG
-55oC to 150oC
Short Circuit Output Current
IOS
50mA
Notes:
Permanent device damage may occur if " Absolute Maximum Ratings" are exceeded.
restricted to the conditions as detailed in the operational sections of this data sheet.
Functional operation should be
Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
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REV.0.0(January. 2003)
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HSD128M72B9K
DC OPERATING CONDITIONS
(Recommended operating conditions (Voltage referenced to VSS = 0V, TA = 0 to 70° C) )
PARAMETER
SYMBOL
MIN
TYP.
MAX
UNIT
NOTE
Supply Voltage
Vcc
3.0
3.3
3.6
V
Input High Voltage
VIH
2.0
3.0
Vcc+0.3
V
1
Input Low Voltage
VIL
-0.3
0
0.8
V
2
Output High Voltage
VOH
2.4
-
-
V
IOH = -2mA
Output Low Voltage
VOL
-
-
0.4
V
IOL = 2mA
Input leakage current
I LI
-10
-
10
uA
3
Notes :
1. VIH (max) = 5.6V AC. The overshoot voltage duration is £ 3ns.
2. VIL (min) = -2.0V AC. The undershoot voltage duration is £ 3ns.
3. Any input 0V £ VIN £ VDDQ.
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.
CAPACITANCE
(VCC = 3.3V, TA = 23° C, f = 1MHz, VREF =1.4V ± 200 mV)
PARAMETER
SYMBOL
MIN
MAX
UNITS
Input Capacitance (A0~A12, BA0~BA1)
CIN1
45
90
pF
Input Capacitance (/RAS, /CAS, /WE)
CIN2
45
90
pF
Input Capacitance (CKE0 ~ CKE1)
CIN3
35
60
pF
Input Capacitance (CLK0 ~ CLK1)
CIN4
25
45
pF
Input Capacitance (/CS0 ~ /CS1)
CIN5
35
60
pF
Input Capacitance (DQM0 ~ DQM1)
CIN6
10
25
pF
Data Input Capacitance (DQ0 ~ DQ63)
CIN7
15
30
pF
Data Input Capacitance (CB0 ~ CB7)
COUT
15
30
pF
DC CHARACTERISTICS
(Recommended operating condition unless otherwise noted, TA = 0 to 70° C)
PARAMETER
Operating current
(One bank active)
Precharge standby current in
power-down mode
SYMBOL
TEST CONDITION
VERSION
-13
-12
-10
-10L
1080
990
990
990
UNIT
NOTE
mA
1
Burst length = 1
ICC1
tRC ³ tRC(min)
IO = 0mA
ICC2P
ICC2PS
CKE £ VIL(max)
tCC=10ns
CKE & CLK £ VIL(max)
tCC=¥
36
mA
36
mA
360
mA
CKE ³ VIH(min)
Precharge standby current in
non power-down mode
ICC2N
CS* ³ VIH(min),
tCC=10ns
Input signals are changed one
time during 20ns
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REV.0.0(January. 2003)
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HSD128M72B9K
CKE ³ VIH(min)
ICC2NS
CLK £ VIL(max), tCC=¥
180
Input signals are stable
Active
standby
current
ICC3P
in
power-down mode
ICC3PS
CKE £ VIL(max), tCC=10ns
72
CKE&CLK £ VIL(max)
mA
72
tCC=¥
CKE³VIH(min),
ICC3N
Active standby current in
non power-down mode
CS*³VIH(min),
tCC=10ns
450
Input signals are changed one
time during 20ns
(One bank active)
mA
CKE³VIH(min)
ICC3NS
CLK £VIL(max), tCC=¥
315
Input signals are stable
IO = 0 mA
Operating current
ICC4
(Burst mode)
Page burst
4Banks Activated
1260
1260
1170
1170
mA
1
2160
1980
1890
1890
mA
2
54
mA
3
27
mA
4
tCCD = 2CLKs
Refresh current
ICC5
Self refresh current
ICC6
tRC ³ tRC(min)
CKE £ 0.2V
Notes :
1. Measured with outputs open.
2. Refresh period is 64ms.
3. Unless otherwise noticed, input swing level is CMOS(VIH/VIL=VDDQ/VSSQ).
AC OPERATING TEST CONDITIONS
(Vcc = 3.3V ± 0.3V, TA = 0 to 70° C)
PARAMETER
Value
UNIT
AC Input levels (Vih/Vil)
2.4/0.4
V
Input timing measurement reference level
1.4
V
Input rise and fall time
tr/tf = 1/1
ns
Output timing measurement reference level
1.4
V
Output load condition
See Fig. 2
+3.3V
Vtt=1.4V
1200W
50W
DOUT
870W
DOUT
50pF*
Z0=50W
50pF
VOH (DC) = 2.4V, IOH = -2mA
VOL (DC) = 0.4V, IOL = 2mA
(Fig. 1) DC output load
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REV.0.0(January. 2003)
(Fig. 2) AC output load circuit
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HANBit Electronics Co.,Ltd.
HANBit
HSD128M72B9K
OPERATING AC PARAMETER
(AC operating conditions unless otherwise noted)
PARAMETER
VERSION
SYMBOL
-13
-12
-10
-10L
UNIT
NOTE
Row active to row active delay
tRRD(min)
15
16
20
20
ns
1
RAS to CAS delay
tRP(min)
20
20
20
20
ns
1
Row precharge time
tRP(min)
20
20
20
20
ns
1
tRAS(min)
45
48
50
50
ns
1
Row active time
tRAS(max)
Row cycle time
100
tRC(min)
65
ns
68
70
70
ns
1
Last data in to row precharge
tRDL(min)
2
CLK
2.5
Last data in to Active delay
tDAL(min)
2 CLK + tRP
-
5
Last data in to new col. address delay
tCDL(min)
1
CLK
2
Last data in to burst stop
tBDL(min)
1
CLK
2
tCCD(min)
1
CLK
3
ea
4
Col. address to col. address delay
CAS latency=3
Number of valid output data
2
CAS latency=2
-
1
Notes :
1. The minimum number of clock cycles is determined by dividing the minimum time required with clock cycle time and
then rounding off to the next higher integer.
2. Minimum delay is required to complete write.
3. All parts allow every cycle column address change.
4. In case of row precharge interrupt, auto precharge and read burst stop.
5. For -8/H/L, tRDL=1CLK and tDAL=1CLK+20ns is also supported .
(Recommand : tRDL=2CLK and tDAL=2CLK & 20ns.)
AC CHARACTERISTICS
(AC operating conditions unless otherwise noted)
PARAMETER
SYMBOL
CAS
CLK cycle time
latency=3
CAS
-13
MIN
7.5
tCC
1000
CAS
latency=3
output delay
CAS
CAS
hold time
latency=3
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REV.0.0(January. 2003)
-10
MAX
MIN
-10L
MAX
10
1000
5.4
MIN
-
10
1000
tOH
2.7
3
7
ns
1
ns
1,2
ns
2
6
6
3
NOTE
12
6
-
UNIT
10
1000
6
MAX
tSAC
latency=2
Output data
MIN
8
-
latency=2
CLK to valid
-12
MAX
7
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HANBit Electronics Co.,Ltd.
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HSD128M72B9K
CAS
latency=2
-
-
3
3
CLK high pulse width
tCH
2.5
3
3
3
ns
3
CLK low pulse width
tCL
2.5
3
3
3
ns
3
Input setup time
tSS
1.5
2
2
2
ns
3
Input hold time
tSH
0.8
1
1
1
ns
3
CLK to output in Low-Z
tSLZ
1
1
1
1
ns
3
2
CAS
CLK to output
latency=3
in Hi-Z
CAS
5.4
6
6
6
ns
-
-
6
7
ns
tSHZ
latency=2
Notes :
1. Parameters depend on programmed CAS latency.
2. If clock rising time is longer than 1ns, (tr/2-0.5)ns should be added to the parameter.
3. Assumed input rise and fall time (tr & tf) = 1ns.
If tr & tf is longer than 1ns, transient time compensation should be considered, ie., [(tr + tf)/2-1]ns should be added to
the parameter.
SIMPLIFIED TRUTH TABLE
COMMAND
Register
Mode register set
Auto refresh
Refresh
Entry
Self
refresh
Exit
Bank active & row addr.
Read &
column
address
Write &
column
address
CKE
CKE
n-1
n
H
X
H
H
L
L
H
H
X
/CS
/RAS /CAS /WE DQM
BA0,1
L
L
L
L
X
OP code
L
L
L
H
X
X
X
X
L
H
H
H
H
X
X
X
L
L
H
H
X
V
Auto precharge disable
Auto precharge disable
A10/AP
X
L
H
L
H
X
V
A9~A0
NOTE
1,2
3
3
3
3
Row address
L
H
A11,A12,
Column
Address
H
(A0 ~ A9)
4
4,5
Column
Auto precharge disable
H
X
L
H
L
L
X
V
Auto precharge disable
Burst Stop
X
L
L
H
L
X
H
X
L
L
H
L
X
Entry
H
L
H
X
X
X
L
V
V
V
Exit
L
H
X
X
X
X
Entry
H
L
H
X
X
X
L
H
H
H
H
X
X
X
L
V
V
V
All banks
Clock suspend or
active power down
Precharge power
down mode
DQM
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REV.0.0(January. 2003)
Exit
Address
L
H
H
X
8
X
4
(A0 ~ A9)
H
H
Bank selection
Precharge
L
4,5
X
V
L
X
H
6
X
X
X
X
X
X
V
X
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HANBit
No operation command
HSD128M72B9K
H
X
H
X
X
X
L
H
H
H
X
X
(V=Valid, X=Don't care, H=Logic high, L=Logic low)
Notes :
1. OP Code : Operand code
A0 ~ A12 & BA0 ~ BA1 : Program keys. (@ MRS)
2. MRS can be issued only at all banks precharge state.
A new command can be issued after 2 CLK cycles of MRS.
3. Auto refresh functions are as same as CBR refresh of DRAM.
The automatical precharge without row precharge command is meant by "Auto".
Auto/self refresh can be issued only at all banks precharge state.
4. BA0 ~ BA1 : Bank select addresses.
If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected.
If both BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank B is selected.
If both BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank C is selected.
If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is selected.
If A10/AP is "High" at row precharge, BA0 and BA1 is ignored and all banks are selected.
5. During burst read or write with auto precharge, new read/write command can not be issued.
Another bank read/write command can be issued after the end of burst.
New row active of the associated bank can be issued at tRP after the end of burst.
6. Burst stop command is valid at every burst length.
7. DQM sampled at positive going edge of a CLK and masks the data-in at the very CLK (Write DQM latency is 0),
but makes Hi-Z state the data-out of 2 CLK cycles after. (Read DQM latency is 2)
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HSD128M72B9K
PACKAGING INFORMATION
Unit : mm
PCB Thickness: 1.0± 0.1mm
Tolerances : ± 0.15 unless otherwise specified
Immersion Gold PCB Pattern
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HSD128M72B9K
ORDERING INFORMATION
Part Number
Density
Org.
Package
Ref.
Vcc
Bank
HSD128M72B9K-13
1024MByte
128M x 72
144 Pin-SODIMM
8K
3.3V
4Bank
HSD128M72B9K-12
1024MByte
128M x 72
144 Pin-SODIMM
8K
3.3V
4Bank
HSD128M72B9K-10L
1024MByte
128M x 72
144 Pin-SODIMM
8K
3.3V
4Bank
HSD128M72B9K-10
1024MByte
128M x 72
144 Pin-SODIMM
8K
3.3V
4Bank
HSD128M72B9K-F13
1024MByte
128M x 72
144 Pin-SODIMM
8K
3.3V
4Bank
HSD128M72B9K-F12
1024MByte
128M x 72
144 Pin-SODIMM
8K
3.3V
4Bank
HSD128M72B9K-F10L
1024MByte
128M x 72
144 Pin-SODIMM
8K
3.3V
4Bank
HSD128M72B9K-F10
1024MByte
128M x 72
144 Pin-SODIMM
8K
3.3V
4Bank
MAX.frq
CL3
133MHz
CL3
125MHz
CL3
100MHz
CL2
100MHz
CL3
133MHz
CL3
125MHz
CL3
100MHz
CL2
100MHz
F means Auto & Self refresh with Low-Power (3.3V)
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