HYNIX HMP351S6AFR8C-Y5

200pin Unbuffered DDR2 SDRAM SO-DIMMs based on 2Gb version A
This Hynix unbuffered Small Outline Dual In-Line Memory Module (DIMM) series consists of 2Gb version A DDR2
SDRAMs in Fine Ball Grid Array (FBGA) packages on a 200pin glass-epoxy substrate. This Hynix 2Gb version A based
Unbuffered DDR2 SO-DIMM series provide a high performance 8 byte interface in 67.60mm width form factor of industry standard. It is suitable for easy interchange and addition.
FEATURES
•
JEDEC standard Double Data Rate 2 Synchronous
•
DRAMs (DDR2 SDRAMs) with 1.8V +/- 0.1V Power
sequential and interleave mode
Supply
•
All inputs and outputs are compatible with SSTL_1.8
interface
•
Posted CAS
•
Programmable CAS Latency 3,4,5, and 6
•
OCD (Off-Chip Driver Impedance Adjustment) and
ODT (On-Die Termination)
•
Programmable Burst Length 4 / 8 with both
•
Auto refresh and self refresh supported
•
8192 refresh cycles / 64ms
•
Serial presence detect with EEPROM
•
DDR2 SDRAM Package: 60 ball(x4/8)
•
67.60 x 30.00 mm form factor
•
RoHS compliant & Halogen-free
Fully differential clock operations (CK & CK)
* This product is in compliance with the directive pertaining of RoHS.
ORDERING INFORMATION
Part Name
HMP351S6AFR8C-Y5/S5/S6
Density
Organization
# of
DRAMs
# of
ranks
Materials
4GB
512Mx64
16
2
Halogen free
This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev. 1.0 / Dec. 2009
1
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
SPEED GRADE & KEY PARAMETERS
Y5
(DDR2-667)
S6
(DDR2-800)
S5
(DDR2-800)
Unit
[email protected]
400
-
400
Mbps
[email protected]
533
533
533
Mbps
[email protected]
667
667
800
Mbps
[email protected]
-
800
-
Mbps
CL-tRCD-tRP
5-5-5
6-6-6
5-5-5
tCK
ADDRESS TABLE
Density Organization Ranks
4GB
512M x 64
Rev. 1.0 / Dec. 2009
2
SDRAMs
# of
DRAMs
# of row/bank/column Address
Refresh
Method
512Mb x 4
16
14(A0~A13)/3(BA0~BA2)/10(A0~A9)
8K / 64ms
2
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
PIN DESCRIPTION
Symbol
Type
Polarity
Pin Description
The system clock inputs. All address an commands lines are sampled on the cross point
CK[1:0], CK[1:0]
Input
Cross
of the rising edge of CK and falling edge of CK. A Delay Locked Loop (DLL) circuit is
Point
driven from the clock inputs and output timing for read operations is synchronized to
the input clock.
CKE[1:0]
Input
Active
High
Activates the DDR2 SDRAM CK signal when high and deactivates the CK signal when
low. By deactivating the clocks, CKE low initiates the Power Down mode or the Self
Refresh mode.
Enables the associated DDR2 SDRAM command decoder when low and disables the
S[1:0]
Input
Active
command decoder when high. When the command decoder is disabled, new commands
Low
are ignored but previous operations continue. Rank 0 is selected by S0; Rank 1 is
selected by S1
RAS, CAS, WE
Input
BA[2:0]
Input
ODT[1:0]
Input
Active
When sampled at the cross point of the rising edge of CK and falling edge of CK, CAS,
Low
RAS and WE define the operation to be executed by the SDRAM.
Active
Asserts on-die termination for DQ, DM, DQS and DQS signals if enabled via the DDR2
High
SDRAM mode register.
Selects which DDR2 SDRAM internal bank of four or eight is activated.
During a Bank Activate command cycle, difines the row address when sampled at the
cross point of the rising edge of CK and falling edge of CK. During a Read or Write command cycle, defines the column address when sampled at the cross point of the rising
edge of CK and falling edge of CK. In addition to the column address, AP is used to
A[9:0], A10/AP,
A[15:11]
invoke autoprecharge operation at the end of the burst read or write cycle. If AP is
Input
high., autoprecharge is selected and BA0-BAn defines the bank to be precharged. If AP
is low, autoprecharge is disabled. During a Precharge command cycle., AP is used in
conjunction with BA0-BAn to control which bank(s) to precharge. If AP is high, all banks
will be precharged regardless of the state of BA0-BAn inputs. If AP is low, then BA0-BAn
are used to define which bank to precharge.
DQ[63:0]
In/Out
DM[7:0]
Input
Data Input/Output pins.
Active
High
The data write masks, associated with one data byte. In Write mode, DM operates as a
byte mask by allowing input data to be written if it is low but blocks the write operation
if it is high. In Read mode, DM lines have no effect.
The data strobe, associated with one data byte, sourced whit data transfers. In Write
mode, the data strobe is sourced by the controller and is centered in the data window.
DQS[7:0], DQS[7:0] In/Out
Cross
point
In Read mode, the data strobe is sourced by the DDR2 SDRAMs and is sent at leading
edge of the data window. DQS signals are complements, and timing is relative to the
crosspoint of respective DQS and DQS. If the module is to be operated in single ended
strobe mode, all DQS signals must be tied on the system board to VSS and DDR2
SDRAM mode registers programmed approriately.
VDD, VDDSPD,VSS
Supply
SDA
In/Out
SCL
Input
SA[1:0]
Input
TEST
In/Out
Rev. 1.0 / Dec. 2009
Power supplies for core, I/O, Serial Presense Detect, and ground for the module.
This is a bidirectional pin used to transfer data into or out of the SPD EEPROM. A
resister must be connected to VDD to act as a pull up.
This signals is used to clock data into and out of the SPD EEPROM. A resistor may be
connected from SCL to VDD to act as a pull up.
Address pins used to select the Serial Presence Detect base address.
The TEST pin is reserved for bus analysis tools and is not connected on normal memory
modules (SODIMMs).
3
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
PIN ASSIGNMENT
Pin
NO.
Front
Side
Pin
NO.
Back
Side
Pin
NO.
Front
Side
Pin
NO.
Back
Side
Pin
NO.
Front
Side
Pin
NO.
Back
Side
Pin
NO.
Front
Side
Pin
NO.
Back
Side
1
VREF
2
VSS
51
DQS2
52
DM2
101
A1
102
A0
151
DQ42
152
DQ46
3
VSS
4
DQ4
53
VSS
54
VSS
103
VDD
104
VDD
153
DQ43
154
DQ47
5
DQ0
6
DQ5
55
DQ18
56
DQ22
105
A10/AP
106
BA1
155
VSS
156
VSS
7
DQ1
8
VSS
57
DQ19
58
DQ23
107
BA0
108
RAS
157
DQ48
158
DQ52
9
VSS
10
DM0
59
VSS
60
VSS
109
WE
110
S0
159
DQ49
160
DQ53
11
DQS0
12
VSS
61
DQ24
62
DQ28
111
VDD
112
VDD
161
VSS
162
VSS
13
DQS0
14
DQ6
63
DQ25
64
DQ29
113
CAS
114
ODT0
163
15
VSS
16
DQ7
65
VSS
66
VSS
115
NC/S1
116
A13
165
VSS
166
CK1
17
DQ2
18
VSS
67
DM3
68
DQS3
117
VDD
118
VDD
167
DQS6
168
VSS
19
DQ3
20
DQ12
69
NC
70
DQS3
119 NC/ODT1
120
NC
169
DQS6
170
DM6
21
VSS
22
DQ13
71
VSS
72
VSS
121
VSS
122
VSS
171
VSS
172
VSS
23
DQ8
24
VSS
73
DQ26
74
DQ30
123
DQ32
124
DQ36
173
DQ50
174
DQ54
25
DQ9
26
DM1
75
DQ27
76
DQ31
125
DQ33
126
DQ37
175
DQ51
176
DQ55
27
VSS
28
VSS
77
VSS
78
VSS
127
VSS
128
VSS
177
VSS
178
VSS
NC,TEST 164
CK1
29
DQS1
30
CK0
79
CKE0
80
DQS4
130
DM4
179
DQ56
180
DQ60
31
DQS1
32
CK0
81
VDD
82
VDD
131
DQS4
132
VSS
181
DQ57
182
DQ61
33
VSS
34
VSS
83
NC
84
NC/A15
133
VSS
134
DQ38
183
VSS
184
VSS
35
DQ10
36
DQ14
85
BA2
86
NC/A14
135
DQ34
136
DQ39
185
DM7
186
DQS7
37
DQ11
38
DQ15
87
VDD
88
VDD
137
DQ35
138
VSS
187
VSS
188
DQS7
NC/CKE1 129
39
VSS
40
VSS
89
A12
90
A11
139
VSS
140
DQ44
189
DQ58
190
VSS
41
VSS
42
VSS
91
A9
92
A7
141
DQ40
142
DQ45
191
DQ59
192
DQ62
43
DQ16
44
DQ20
93
A8
94
A6
143
DQ41
144
VSS
193
VSS
194
DQ63
45
DQ17
46
DQ21
95
VDD
96
VDD
145
VSS
146
DQS5
195
SDA
196
VSS
47
VSS
48
VSS
97
A5
98
A4
147
DM5
148
DQS5
197
SCL
198
SA0
49
DQS2
50
NC
99
A3
100
A2
149
VSS
150
VSS
199
VDDSPD
200
SA1
Pin Location
Pin #40
Pin #2
Front Side
Pin #1
Pin #39
Rev. 1.0 / Dec. 2009
Pin #41
Pin #42
Pin #200
Back Side
Pin #99
4
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
FUNCTIONAL BLOCK DIAGRAM
4GB(512Mbx64): HMP351S6AFR8C
3Ω +/-5%
CKE1
ODT1
/S1
CKE0
ODT0
/S0
DQS0
/DQS0
DM0
DQ0
DQ1
DQ2
/CS0 ODT0 CKE0
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS1 ODT1 CKE1
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS0 ODT0 CKE0
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS1 ODT1 CKE1
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS0 ODT0 CKE0
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS1 ODT1 CKE1
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS0 ODT0 CKE0
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS1 ODT1 CKE1
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
D0
DQ3
DQ4
DQ5
DQ6
DQ7
DQS1
/DQS1
DM1
DQ8
DQ9
DQ10
D2
DQ11
DQ12
DQ13
DQ14
DQ15
DQS2
/DQS2
DM2
DQ16
DQ17
DQ18
D4
DQ19
DQ20
DQ21
DQ22
DQ23
DQS3
/DQS3
DM3
DQ24
DQ25
DQ26
D6
DQ27
DQ28
DQ29
DQ30
DQ31
A0-AN
SDRAMS D0-15
/RAS
SDRAMS D0-15
/CAS
SDRAMS D0-15
/WE
SDRAMS D0-15
8 loads
DQ35
DQ36
DQ37
DQ38
DQ39
DQS5
/DQS5
DM5
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
DQS6
/DQS6
DM6
DQ48
DQ49
DQ50
D12
SDRAMS D0-15
5.6pF
DQ32
DQ33
DQ34
D10
10Ω +/-5%
/CK0
DM4
D8
BA0-BA2
CK0
DQS4
/DQS4
DQ51
DQ52
DQ53
DQ54
DQ55
DQS7
/DQS7
DM7
DQ56
DQ57
DQ58
D14
DQ59
DQ60
DQ61
DQ62
DQ63
SCL
SA0
SA1
SCL
A0
A1
A2
VDDSPD
CK1
5.6pF
Rev. 1.0 / Dec. 2009
8 loads
/CS1 ODT1 CKE1
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS0 ODT0 CKE0
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS1 ODT1 CKE1
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS0 ODT0 CKE0
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS1 ODT1 CKE1
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS0 ODT0 CKE0
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
/CS1 ODT1 CKE1
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
D1
D9
D3
D11
D5
D13
D7
Serial PD
SDA
D15
SDA
WP
Serial PD
VREF
SDRAMS D0-D15
VDD
SDRAMS D0-D15, VDD and VDDQ
VSS
/CK1
/CS0 ODT0 CKE0
DQS
/DQS
DM
I/O 0
I/O 1
I/O 2
I/O 3
I/O 4
I/O 5
I/O 6
I/O 7
SDRAMS D0-D15, SPD
Note:
1.Resistor values are 22 ohm +/-5%
unless other wide stated.
5
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol
Value
Unit
Note
Voltage on VDD pin relative to Vss
VDD
- 1.0 V ~ 2.3 V
V
1
Voltage on VDDQ pin relative to Vss
VDDQ
- 0.5 V ~ 2.3 V
V
1
Voltage on VDDL pin relative to Vss
VDDL
VIN, VOUT
-0.5V ~ 2.3 V
V
1
- 0.5 V ~ 2.3 V
V
1
Voltage on any pin relative to Vss
Operating Conditions and Environmental Parameters
Parameter
DIMM Operating temperature (ambient)
Storage Temperature
Symbol
TOPR
Rating
0 ~ +65
Units
oC
Notes
TSTG
-50 ~ +100
oC
1
Storage Humidity (without condensation)
HSTG
5 to 95
%
1
DIMM Barometric Pressure (operating & storage)
PBAR
105 to 69
K Pascal
2
DRAM Component Case Temperature Range
TCASE
0 ~+95
oC
3
Notes:
1. Stress greater than those listed may cause permanent damage to the device. This is a stress rating only, and device
functional operation at or above the conditions indicated is not implied. Exposure to absolute maximum rating con
ditions for extended periods may affect reliability.
2. Up to 9850 ft.
3. If the DRAM case temperature is Above 85oC, the Auto-Refresh command interval has to be reduced to
tREFI=3.9us. For Measurement conditions of TCASE, please refer to the JEDEC document JESD51-2.
DC OPERATING CONDITIONS
Symbol
Parameter
(SSTL_1.8)
Rating
Min.
Typ.
Max.
Units
Notes
VDD
Supply Voltage
1.7
1.8
1.9
V
1
VDDL
Supply Voltage for DLL
1.7
1.8
1.9
V
1,2
VDDQ
Supply Voltage for Output
1.7
1.8
1.9
V
1,2
VREF
Input Reference Voltage
0.49*VDDQ
0.50*VDDQ
0.51*VDDQ
mV
3,4
VTT
Termination Voltage
VREF-0.04
VREF
VREF+0.04
V
5
1.8
-
3.3
V
VDDSPD
EEPROM Supply Voltage
Note:
1. Min. Typ. and Max. values increase by 100mV for C3(DDR2-533 3-3-3) speed option.
2. VDDQ tracks with VDD,VDDL tracks with VDD. AC parameters are measured with VDD,VDDQ and VDD.
3. The value of VREF may be selected by the user to provide optimum noise margin in the system. Typically the
value of VREF is expected to be about 0.5 x VDDQ of the transmitting device and VREF is expected to track variations in VDDQ.
4. Peak to peak ac noise on VREF may not exceed +/-2% VREF (dc).
5. VTT of transmitting device must track VREF of receiving device.
Rev. 1.0 / Dec. 2009
6
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
INPUT DC LOGIC LEVEL
Parameter
Symbol
Min
Max
Unit
dc Input logic HIGH
VIH(DC)
VREF + 0.125
VDDQ + 0.3
V
dc Input logic LOW
VIL(DC)
-0.30
VREF - 0.125
V
Note
INPUT AC LOGIC LEVEL
Parameter
DDR2 667/800
Symbol
Unit
Min
Max
AC Input logic HIGH
VIH(AC)
VREF + 0.200
-
V
AC Input logic LOW
VIL(AC)
-
VREF - 0.200
V
AC INPUT TEST CONDITIONS
Symbol
Condition
Value
Units
Notes
0.5 * VDDQ
V
1
Input signal maximum peak to peak swing
1.0
V
1
Input signal minimum slew rate
1.0
V/ns
2, 3
VREF
Input reference voltage
VSWING(MAX)
SLEW
Notes:
1.
2.
Input waveform timing is referenced to the input signal crossing through the VREF level applied to the device
under test.
The input signal minimum slew rate is to be maintained over the range from VREF to VIH(ac) min for rising edges
and the range from VREF to VIL(ac) max for falling edges as shown in the below figure.
3.
AC timings are referenced with input waveforms switching from VIL (ac) to VIH (ac) on the positive transitions
and VIH (ac) to VIL (ac) on the negative transitions.
VDDQ
VIH(ac) min
VIH(dc) min
VREF
VSWING(MAX)
VIL(dc) max
VIL(ac) max
VSS
delta TF
Falling Slew =
delta TR
VREF - VIL(ac) max
delta TF
Rising Slew =
VIH(ac)min - VREF
delta TR
< Figure: AC Input Test Signal Waveform>
Rev. 1.0 / Dec. 2009
7
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
Differential Input AC logic Level
Symbol
Parameter
VID (ac)
ac differential input voltage
VIX (ac)
ac differential cross point voltage
Min.
Max.
Units
Note
0.5
VDDQ + 0.6
V
1
0.5 * VDDQ - 0.175
0.5 * VDDQ + 0.175
V
2
1. VIN(DC) specifies the allowable DC execution of each input of differential pair such as CK, CK DQS, DQS, LDQS,
LDQS, UDQS and UDQS.
2. VID(DC) specifies the input differential voltage |VTR -VCP | required for switching, where VTR is the true input
(such as CK, DQS, LDQS or UDQS) level and VCP is the complementary input (such as CK, DQS, LDQS or UDQS) level.
The minimum value is equal to VIH(DC) - VIL(DC).
VTR
Crossing point
VID
VIX or VOX
VCP
VSSQ
< Differential signal levels >
Notes:
1. VID(AC) specifies the input differential voltage |VTR -VCP | required for switching, where VTR is the true input signal
(such as CK, DQS, LDQS or UDQS) and VCP is the complementary input signal (such as CK, DQS, LDQS or UDQS).
The minimum value is equal to V IH(AC) - VIL(AC).
2. The typical value of VIX(AC) is expected to be about 0.5 * VDDQ of the transmitting device and VIX(AC) is expected to
track variations in VDDQ. VIX(AC) indicates the voltage at which differential input signals must cross.
DIFFERENTIAL AC OUTPUT PARAMETERS
Symbol
Parameter
Min.
Max.
Units
Note
VOX (ac)
ac differential cross point voltage
0.5 * VDDQ - 0.125
0.5 * VDDQ + 0.125
V
1
Notes:
1. The typical value of VOX(AC) is expected to be about 0.5 * VDDQ of the transmitting device and VOX(AC) is expected to
track variations in VDDQ. VOX(AC) indicates the voltage at which differential output signals must cross.
Rev. 1.0 / Dec. 2009
8
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
OUTPUT BUFFER LEVELS
OUTPUT AC TEST CONDITIONS
Symbol
VOTR
Parameter
Output Timing Measurement Reference Level
SSTL_18
Units
Notes
0.5 * VDDQ
V
1
Notes:
1. The VDDQ of the device under test is referenced.
OUTPUT DC CURRENT DRIVE
Symbol
Parameter
IOH(dc)
Output Minimum Source DC Current
IOL(dc)
Output Minimum Sink DC Current
SSTl_18
Units
Notes
- 13.4
mA
1, 3, 4
13.4
mA
2, 3, 4
Notes:
1. VDDQ = 1.7 V; VOUT = 1420 mV. (VOUT - VDDQ)/IOH must be less than 21 ohm for values of VOUT between VDDQ and
VDDQ - 280 mV.
2. VDDQ = 1.7 V; VOUT = 280 mV. VOUT/IOL must be less than 21 ohm for values of VOUT between 0 V and 280 mV.
3. The dc value of VREF applied to the receiving device is set to VTT
4. The values of IOH(dc) and IOL(dc) are based on the conditions given in Notes 1 and 2. They are used to test device
drive current capability to ensure VIH min plus a noise margin and VIL max minus a noise margin are delivered to an
SSTL_18 receiver.
The actual current values are derived by shifting the desired driver operating point along a 21 ohm load line to define
a convenient driver current for measurement.
Rev. 1.0 / Dec. 2009
9
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
PIN Capacitance (VDD=1.8V,VDDQ=1.8V, TA=25°…)
4GB: HMP351S6AFR8C
Pin
Symbol
Min
Max
Unit
CK, CK
CCK
17
29
pF
CKE, ODT,CS
CI1
24
38
pF
Address, RAS, CAS, WE
CI2
31
56
pF
DQ, DM, DQS, DQS
CIO
7
12
pF
Notes:
1. Pins not under test are tied to GND.
2. These value are guaranteed by design and tested on a sample basis only.
Rev. 1.0 / Dec. 2009
10
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
IDD SPECIFICATIONS (TCASE: 0 to 95oC)
4GB, 512M x 64 SO-DIMM: HMP351S6AFR8C
Symbol
Y5
(DDR2 [email protected])
S5/S6
(DDR2 [email protected]&6)
Unit
IDD0
1120
1200
mA
IDD1
1200
1280
mA
IDD2P
192
192
mA
IDD2Q
720
800
mA
IDD2N
800
880
mA
IDD3P(F)
560
560
mA
IDD3P(S)
288
288
mA
IDD3N
1120
1280
mA
IDD4W
2000
2360
mA
IDD4R
1880
2200
mA
IDD5B
2160
2280
mA
IDD6
240
240
mA
1
IDD6(L)
128
128
mA
1
IDD7
2640
2880
mA
Rev. 1.0 / Dec. 2009
Note
11
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
IDD Measurement Conditions
Symbol
Conditions
Units
IDD0
Operating one bank active-precharge current; tCK = tCK(IDD), tRC = tRC(IDD), tRAS = tRASmin
(IDD);CKE is HIGH, CS is HIGH between valid commands; Address bus inputs are SWITCHING; Data bus inputs
are SWITCHING
mA
IDD1
Operating one bank active-read-precharge current; IOUT = 0mA;BL = 4, CL = CL(IDD), AL = 0;
tCK = tCK(IDD), tRC = tRC (IDD), tRAS = tRASmin (IDD), tRCD = tRCD(IDD); CKE is HIGH, CS is HIGH
between valid commands; Address bus inputs are SWITCHING; Data pattern is same as IDD4W
mA
IDD2P
Precharge power-down current; All banks idle; tCK = tCK(IDD); CKE is LOW; Other control and address bus
inputs are STABLE; Data bus inputs are FLOATING
mA
IDD2Q
Precharge quiet standby current; All banks idle; tCK = tCK(IDD);CKE is HIGH, CS is HIGH; Other control
and address bus inputs are STABLE; Data bus inputs are FLOATING
mA
IDD2N
Precharge standby current; All banks idle; tCK = tCK(IDD); CKE is HIGH, CS is HIGH; Other control and
address bus inputs are SWITCHING; Data bus inputs are SWITCHING
mA
IDD3P
Active power-down current; All banks open; tCK = tCK(IDD); CKE is LOW; Fast PDN Exit MRS(12) = 0
Other control and address bus inputs are STABLE; Data bus inputs are FLOATSlow PDN Exit MRS(12) = 1
ING
IDD3N
Active standby current; All banks open; tCK = tCK(IDD), tRAS = tRASmax (IDD), tRP =tRP(IDD); CKE is
HIGH, CS is HIGH between valid commands; Other control and address bus inputs are SWITCHING; Data bus
inputs are SWITCHING
mA
IDD4W
Operating burst write current; All banks open, Continuous burst writes; BL = 4, CL = CL(IDD), AL = 0; tCK
= tCK(IDD), tRAS = tRASmax (IDD), tRP = tRP(IDD); CKE is HIGH, CS is HIGH between valid commands;
Address bus inputs are SWITCHING; Data bus inputs are SWITCHING
mA
IDD4R
Operating burst read current; All banks open, Continuous burst reads, IOUT = 0mA; BL = 4, CL = CL(IDD),
AL = 0; tCK = tCK(IDD), tRAS = tRASmax (IDD), tRP = tRP(IDD); CKE is HIGH, CS is HIGH between valid commands; Address bus inputs are SWITCHING; Data pattern is same as IDD4W
mA
IDD5B
Burst refresh current; tCK = tCK(IDD); Refresh command at every tRFC(IDD) interval; CKE is HIGH, CS is
HIGH between valid commands; Other control and address bus inputs are SWITCHING; Data bus inputs are
SWITCHING
mA
IDD6
Self refresh current; CK and CK at 0V; CKE ≤ 0.2V; Other control and address bus inputs are FLOATING;
Data bus inputs are FLOATING. IDD6 current values are guaranted up to Tcase of 85 ℃ max.
mA
IDD7
Operating bank interleave read current; All bank interleaving reads, IOUT = 0mA; BL = 4, CL = CL(IDD),
AL = tRCD(IDD)-1*tCK(IDD); tCK = tCK(IDD), tRC = tRC(IDD), tRRD = tRRD(IDD), tRCD = 1*tCK(IDD); CKE is
HIGH, CS is HIGH between valid commands; Address bus inputs are STABLE during DESELECTs; Data pattern is
same as IDD4R; - Refer to the following page for detailed timing conditions
mA
mA
mA
Notes:
1. IDD specifications are tested after the device is properly initialized
2. Input slew rate is specified by AC Parametric Test Condition
3. IDD parameters are specified with ODT disabled.
4. Data bus consists of DQ, DM, DQS, DQS, RDQS, RDQS, LDQS, LDQS, UDQS, and UDQS. IDD values must be met with all combinations of EMRS bits 10 and 11.
5. Definitions for IDD
LOW is defined as Vin £ VILAC (max)
HIGH is defined as Vin Š VIHAC (min)
STABLE is defined as inputs stable at a HIGH or LOW level
FLOATING is defined as inputs at VREF = VDDQ/2
SWITCHING is defined as: inputs changing between HIGH and LOW every other clock cycle (once per two clocks) for address and
control signals, and inputs changing between HIGH and LOW every other data transfer (once per clock)
for DQ signals not including masks or strobes.
Rev. 1.0 / Dec. 2009
12
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
Electrical Characteristics & AC Timings
Speed Bins and CL, tRCD, tRP, tRC and tRAS for Corresponding Bin
Speed
DDR2-800 (S5)
DDR2-800 (S6)
DDR2-667 (Y5)
Bin (CL-tRCD-tRP)
5-5-5
6-6-6
5-5-5
Parameter
min
min
min
CAS Latency
5
6
5
tCK
tRCD
12.5
15
15
ns
tRP
12.5
15
15
ns
tRAS
45
45
45
ns
tRC
57.5
60
60
ns
Rev. 1.0 / Dec. 2009
Unit
13
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
AC Timing Parameters by Speed Grade
Parameter
DQ output access time from CK/CK
DDR2-667
Symbol
DDR2-800
Unit
min
max
min
max
Note
tAC
-450
+450
-400
+400
tDQSCK
-400
+400
-350
+350
ps
CK high-level width
tCH
0.45
0.55
0.48
0.52
tCK
CK low-level width
tCL
0.45
0.55
0.48
0.52
tCK
CK half period
tHP
min(tCL,
tCH)
-
min(tCL,
tCH)
-
ps
Clock cycle time, CL=x
tCK
3000
8000
2500
8000
ps
tDS
100
-
50
-
ps
1
tDH
175
-
125
-
ps
1
Control & Address input pulse width for each
input
tIPW
0.6
-
0.6
-
tCK
DQ and DM input pulse width for each input
tDIPW
0.35
-
0.35
Data-out high-impedance time from CK/CK
tHZ
-
tAC max
tLZ(DQS)
tAC min
tAC max
DQ low-impedance time from CK/CK
tLZ(DQ)
2*tAC min
DQS-DQ skew for DQS and associated DQ
signals
tDQSQ
DQS output access time from CK/CK
DQ and DM input setup time
(differential strobe)
DQ and DM input hold time
(differential strobe)
ps
-
tCK
tAC max
ps
tAC min
tAC max
ps
tAC max
2*tAC min
tAC max
ps
-
240
-
240
ps
tQHS
-
340
-
300
ps
tQH
tHP - tQHS
-
tHP - tQHS
-
ps
First DQS latching transition to associated
clock edge
tDQSS
-0.25
+0.25
-0.25
+0.25
tCK
DQS input high pulse width
tDQSH
0.35
-
0.35
-
tCK
DQS input low pulse width
DQS low-impedance time from CK/CK
DQ hold skew factor
DQ/DQS output hold time from DQS
tDQSL
0.35
-
0.35
-
tCK
DQS falling edge to CK setup time
tDSS
0.2
-
0.2
-
tCK
DQS falling edge hold time from CK
tDSH
0.2
-
0.2
-
tCK
Mode register set command cycle time
tMRD
2
-
2
-
tCK
Write preamble
tWPRE
0.35
-
0.35
-
tCK
Write postamble
tWPST
0.4
0.6
0.4
0.6
tCK
tIS
200
-
175
-
ps
Address and control input setup time
Address and control input hold time
tIH
275
-
250
-
ps
Read preamble
tRPRE
0.9
1.1
0.9
1.1
tCK
Read postamble
tRPST
0.4
0.6
0.4
0.6
tCK
Activate to precharge command
tRAS
45
70000
45
70000
ns
Row Active to Row Active Delay for 1KB
page size
tRRD
7.5
-
7.5
-
ns
Row Active to Row Active Delay for 2KB
page size
tRRD
10
-
10
-
ns
Four Active Window for 1KB page size
products
tFAW
37.5
-
35
-
ns
Four Active Window for 2KB page size
products
tFAW
50
-
45
-
ns
Rev. 1.0 / Dec. 2009
14
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
- continued Parameter
Symbol
DDR2-667
min
DDR2-800
max
Unit Note
min
max
2
-
tCK
CAS to CAS command delay
tCCD
2
Write recovery time
tWR
15
-
15
-
ns
Auto precharge write recovery + precharge
time
tDAL
WR+tRP
-
WR+tRP
-
tCK
Internal write to read command delay
tWTR
7.5
-
7.5
-
ns
Internal read to precharge command delay
tRTP
7.5
7.5
-
ns
Exit self refresh to a non-read command
tXSNR
tRFC + 10
-
tRFC + 10
-
ns
Exit self refresh to a read command
tXSRD
200
-
200
-
tCK
tXP
2
-
2
-
tCK
tXARD
2
-
2
-
tCK
tXARDS
7 - AL
-
8 - AL
-
tCK
tCKE
3
-
3
-
tCK
Exit precharge power down to any nonread command
Exit active power down to read command
Exit active power down to read command
(Slow exit, Lower power)
CKE minimum pulse width
(high and low pulse width)
ODT turn-on delay
tAOND
2
2
2
2
tCK
tAON
tAC (min)
tAC(max)+0.7
tAC (min)
tAC(max)+0.7
ns
tAONPD
tAC(min)+2
2tCK+
tAC(max)+1
tAC(min)+2
2tCK+
tAC(max)+1
ns
tAOFD
2.5
2.5
2.5
2.5
tCK
tAOF
tAC (min)
tAC (max)+
0.6
tAC (min)
tAC (max)+
0.6
ns
ODT turn-off (Power-Down mode)
tAOFPD
tAC(min)+2
2.5tCK+
tAC(max)+1
tAC(min)+2
2.5tCK+
tAC(max)+1
ns
ODT to power down entry latency
tANPD
3
-
3
-
tCK
ODT power down exit latency
tAXPD
8
OCD drive mode output delay
tOIT
0
12
0
12
ns
tDelay
tIS + tCK + tIH
-
tIS + tCK + tIH
-
ns
tREFI
-
7.8
-
7.8
us
2
tREFI
-
3.9
-
3.9
us
3
ODT turn-on
ODT turn-on (Power-Down mode)
ODT turn-off delay
ODT turn-off
Minimum time clocks remains ON after CKE
asynchronously drops LOW
Average periodic Refresh Interval
8
tCK
Notes:
1. For details and notes, please refer to the relevant Hynix component datasheet(HY5PS1G8(16)31CFP).
2. 0°C ≤ TCASE ≤ 85°C
3. 85°C < TCASE ≤ 95°C
Rev. 1.0 / Dec. 2009
15
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
PACKAGE OUTLINE
512Mx64 - HMP351S6AFR8C
Front
67.60
2.00 Min
Detail A
Detail B
PIN 41
PIN 39
PIN 1
20.00
30.00
4.00 ± 0.10
PIN 199
11.40
1.80 ± 0.10
47.40
4.20
11.40
2.45
Detail B
6.00
2.15
SIDE
Back
47.40
3.8MAX
1.50 ± 0.10
PIN 2
PIN 40
PIN 200
PIN42
1.00 ± 0.10
Detail of Contacts B (Front)
Detail of Contacts A
Detail of Contacts B (Back)
0.45 ± 0.03
0.60
4.20
4.0 ± 0.10
1.50
2.55
0.20 ± 0.15
2.70 ± 0.10
1.0 ± 0.05
2.40 ± 0.10 1.80
4.20
Note:
1. All dimensions are in millimeters.
2. All outline dimensions and tolerances follow the JEDEC standard.
3. ± 0.13 tolerance on all dimensions unless otherwise stated.
Rev. 1.0 / Dec. 2009
16
1200pin Unbuffered DDR2 SDRAM SO-DIMMs
REVISION HISTORY
Revision
History
Date
0.1
Initial data sheet released
Jan. 2009
0.2
Added pin capacitance
Jul. 2009
0.3
Updated AC Timing Parameters by Speed Grade
Dec. 2009
Rev. 1.0 / Dec. 2009
17