ETC P1402CDG

P1402CDG
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
NIKO-SEM
TO-252 (DPAK)
Lead-Free
D
PRODUCT SUMMARY
V(BR)DSS
RDS(ON)
ID
20
14mΩ
45A
1. GATE
2. DRAIN
3. SOURCE
G
S
ABSOLUTE MAXIMUM RATINGS (TC = 25 °C Unless Otherwise Noted)
PARAMETERS/TEST CONDITIONS
Gate-Source Voltage
TC = 25 °C
Continuous Drain Current
LIMITS
UNITS
VGS
±12
V
45
ID
TC = 100 °C
Pulsed Drain Current
SYMBOL
1
30
IDM
TC = 25 °C
Power Dissipation
48
PD
TC = 100 °C
Operating Junction & Storage Temperature Range
1
Lead Temperature ( /16” from case for 10 sec.)
A
140
W
20
Tj, Tstg
-55 to 150
TL
275
°C
THERMAL RESISTANCE RATINGS
THERMAL RESISTANCE
SYMBOL
TYPICAL
MAXIMUM
Junction-to-Case
RθJC
2.6
Junction-to-Ambient
RθJA
110
UNITS
°C / W
1
Pulse width limited by maximum junction temperature.
Duty cycle ≤ 1%
2
ELECTRICAL CHARACTERISTICS (TC = 25 °C, Unless Otherwise Noted)
PARAMETER
SYMBOL
TEST CONDITIONS
LIMITS
UNIT
MIN TYP MAX
STATIC
Drain-Source Breakdown Voltage
V(BR)DSS
VGS = 0V, ID = 250µA
VGS(th)
VDS = VGS, ID = 250µA
Gate-Body Leakage
IGSS
VDS = 0V, VGS = ±12V
±100
Zero Gate Voltage Drain Current
IDSS
VDS = 16V, VGS = 0V
1
VDS = 13.2V, VGS = 0V, TJ = 125 °C
10
On-State Drain Current1
ID(ON)
Drain-Source On-State
Resistance1
RDS(ON)
Gate Threshold Voltage
Forward Transconductance1
gfs
VDS = 5V, VGS = 4.5V
20
V
0.45 0.75
1.25
45
µA
A
VGS = 2.5V, ID = 9A
18
26
VGS = 5V, ID = 18A
11
14
VDS = 10V, ID = 18A
26
1
nA
mΩ
S
NOV-05-2004
P1402CDG
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
NIKO-SEM
TO-252 (DPAK)
Lead-Free
DYNAMIC
Input Capacitance
Ciss
Output Capacitance
Coss
Reverse Transfer Capacitance
Crss
125
Qg
17
Total Gate Charge
2
Gate-Source Charge
Gate-Drain Charge
2
2
Turn-On Delay Time
2
Rise Time2
Turn-Off Delay Time
2
Fall Time2
500
VGS = 0V, VDS = 15V, f = 1MHz
pF
310
Qgs
VDS = 0.5V(BR)DSS, VGS = 5V,
1.5
Qgd
ID = 18A
10.5
td(on)
nC
7.5
tr
VDS = 10V,
83
td(off)
ID ≅ 18A, VGS = 5V, RGS = 3.3Ω
18
tf
nS
23
SOURCE-DRAIN DIODE RATINGS AND CHARACTERISTICS (TC = 25 °C)
Continuous Current
IS
45
Pulsed Current
ISM
140
Forward Voltage1
VSD
3
Reverse Recovery Time
Peak Reverse Recovery Current
Reverse Recovery Charge
IF = IS, VGS = 0V
1.3
trr
IRM(REC)
V
37
nS
200
A
0.043
µC
IF = IS, dlF/dt = 100A / µS
Qrr
A
Pulse test : Pulse Width ≤ 300 µsec, Duty Cycle ≤ 2%.
Independent of operating temperature.
3
Pulse width limited by maximum junction temperature.
1
2
REMARK: THE PRODUCT MARKED WITH “P1402CDG”, DATE CODE or LOT #
Orders for parts with Lead-Free plating can be placed using the PXXXXXXG parts name.
2
NOV-05-2004
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
P1402CDG
TO-252 (DPAK)
Lead-Free
Body Diode Forward Voltage Variation with Source Current and Temperature
60
VGS= 0V
10
Is - Reverse Drain Current(A)
NIKO-SEM
T = 125° C
1
25° C
0.1
-55° C
0.01
0.001
0.0001
0
3
0.2
0.4
0.6
0.8
1.0
VSD - Body Diode Forward Voltage(V)
1.2
1.4
NOV-05-2004
NIKO-SEM
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
4
P1402CDG
TO-252 (DPAK)
Lead-Free
NOV-05-2004
P1402CDG
N-Channel Logic Level Enhancement
Mode Field Effect Transistor
NIKO-SEM
TO-252 (DPAK)
Lead-Free
TO-252 (DPAK) MECHANICAL DATA
mm
mm
Dimension
Dimension
Min.
Typ.
Max.
Min.
Typ.
Max.
A
9.35
10.4
H
0.89
2.03
B
2.2
2.4
I
6.35
6.80
C
0.45
0.6
J
5.2
5.5
D
0.89
1.5
K
0.6
1
E
0.45
0.69
L
0.5
0.9
F
0.03
0.23
M
3.96
G
5.2
6.2
N
4.57
5.18
G
M
2
1
J
I
3
L
H
D
C
E
F
B
A
K
5
NOV-05-2004