TI SN65HVD12IDREP

SN65HVD10-EP,, SN65HVD11-EP
SN65HVD12-EP
www.ti.com
SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
3.3 V RS-485 TRANSCEIVERS
FEATURES
APPLICATIONS
•
•
•
•
•
•
•
•
1
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
(1)
(2)
Controlled Baseline
– One Assembly/Test Site
– One Fabrication Site
Extended Temperature Performance of Up to
–40°C to 125°C and –55°C to 125°C
Enhanced Diminishing Manufacturing Sources
(DMS) Support
Enhanced Product-Change Notification
Qualification Pedigree (1)
Operates With a 3.3 V Supply
Bus-Pin ESD Protection Exceeds 16 kV HBM
1/8 Unit-Load Option Available (Up to 256
Nodes on the Bus)
Optional Driver Output Transition Times for
Signaling Rates of 1 Mbps, 10 Mbps, and
25 Mbps (2)
Meets or Exceeds the Requirements of ANSI
TIA/EIA-485-A
Bus-Pin Short Circuit Protection From –7 V to
12 V
Low-Current Standby Mode . . . 1 μA (Typ)
Open-Circuit, Idle-Bus, and Shorted-Bus
Failsafe Receiver
Thermal Shutdown Protection
Glitch-Free Power-Up and Power-Down
Protection for Hot-Plugging Applications
SN75176 Footprint
Component qualification in accordance with JEDEC and
industry standards to ensure reliable operation over an
extended temperature range. This includes, but is not limited
to, Highly Accelerated Stress Test (HAST) or biased 85/85,
temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound
life. Such qualification testing should not be viewed as
justifying use of this component beyond specified
performance and environmental limits.
The signaling rate of a line is the number of voltage
transitions that are made per second expressed in the units
bps (bits per second).
Digital Motor Control
Utility Meters
Chassis-to-Chassis Interconnects
Electronic Security Stations
Industrial Process Control
Building Automation
Point-of-Sale (POS) Terminals and Networks
D PACKAGE
(TOP VIEW)
R
RE
DE
D
1
8
2
7
3
6
4
5
VCC
B
A
GND
DESCRIPTION/ORDERING INFORMATION
The SN65HVD10, SN65HVD11, and SN65HVD12
combine a 3-state differential line driver and
differential input line receiver that operate with a
single 3.3 V power supply. They are designed for
balanced transmission lines and meet or exceed
ANSI standard TIA/EIA-485-A and ISO 8482:1993.
These differential bus transceivers are monolithic
integrated circuits designed for bidirectional data
communication on multipoint bus-transmission lines.
The drivers and receivers have active-high and
active-low enables respectively, that can be externally
connected together to function as direction control.
Low device standby supply current can be achieved
by disabling the driver and the receiver.
The driver differential outputs and receiver differential
inputs connect internally to form a differential
input/output (I/O) bus port that is designed to offer
minimum loading to the bus whenever the driver is
disabled or VCC = 0. These parts feature wide positive
and negative common-mode voltage ranges, making
them suitable for party-line applications.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
UNLESS OTHERWISE NOTED this document contains
PRODUCTION DATA information current as of publication date.
Products conform to specifications per the terms of Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2004–2007, Texas Instruments Incorporated
SN65HVD10-EP,, SN65HVD11-EP
SN65HVD12-EP
www.ti.com
SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
LOGIC DIAGRAM
(POSITIVE LOGIC)
R
RE
DE
1
2
3
6
D
4
7
A
B
ORDERING INFORMATION (1)
(1)
(2)
(3)
(4)
PACKAGE
SOIC (2) (3)
SIGNALING RATE
UNIT LOADS
TA
25 Mbps
1/2
10 Mbps
1/8
1 Mbps
1/8
–40°C to 85°C
SN65HVD12IDREP
V12IEP
25 Mbps
1/2
–55°C to 125°C
SN65HVD10MDREP
V10MEP
–40°C to 125°C
SOIC MARKING
SN65HVD10QDREP
V10QEP
SN65HVD11QDREP (4)
V11QEP
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
Web site at www.ti.com.
Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
The D package is taped and reeled as indicated by the R suffix to the part number (i.e., SN65HVD10QDREP).
Product Preview
ABSOLUTE MAXIMUM RATINGS (1) (2)
over operating free-air temperature range (unless otherwise noted)
SN65HVD10-EP
SN65HVD11-EP
SN65HVD12-EP
Supply voltage range, VCC
–0.3 V to 6 V
Voltage range at A or B
–9 V to 14 V
Input voltage range at D, DE, R, or RE
–0.5 V to VCC + 0.5 V
Voltage input range, transient pulse, A and B, through 100 Ω (see Figure 11)
Electrostatic discharge
Human body model (3)
Charged-device model
(4)
–50 V to 50 V
A, B, and GND
16 kV
All pins
4 kV
All pins Charge
Continuous total power dissipation
Storage temperature range, Tstg
–65°C to 150°C
Lead temperature 1,6 mm (1/16 in) from case for 10 s
(1)
(2)
(3)
(4)
2
1 kV
See Package Dissipation
Rating Table
260°C
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
All voltage values, except differential I/O bus voltages, are with respect to network ground terminal.
Tested in accordance with JEDEC Standard 22, Test Method A114-A.
Tested in accordance with JEDEC Standard 22, Test Method C101.
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SN65HVD12-EP
www.ti.com
SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
PACKAGE DISSIPATION RATINGS
(1)
(2)
(3)
PACKAGE
TA ≤ 25°C
POWER RATING
DERATING FACTOR (1)
ABOVE TA = 25°C
TA = 70°C
POWER RATING
TA = 85°C
POWER RATING
TA = 125°C
POWER RATING
D (2)
597 mW
4.97 mW/°C
373 mW
298 mW
100 mW
D (3)
990 mW
8.26 mW/°C
620 mW
496 mW
165 mW
This is the inverse of the junction-to-ambient thermal resistance when board-mounted and with no air flow.
Tested in accordance with the Low-K thermal metric definitions of EIA/JESD51-3.
Tested in accordance with the High-K thermal metric definitions of EIA/JESD51-7.
0.001
1505C (9.7 kHours, 1.1 Years)
1/tf in Hours
0.0001
1405C (27.8 kHours, 3.2 Years)
1305C (86 kHours, 9.8 Years)
0.00001
1205C (282 kHours, 32.1 Years)
0.000001
1/Tj in Deg K
Figure 1. Estimated Device Life Based Kirkendall Voiding Failure Mode
Copyright © 2004–2007, Texas Instruments Incorporated
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3
SN65HVD10-EP,, SN65HVD11-EP
SN65HVD12-EP
www.ti.com
SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
RECOMMENDED OPERATING CONDITIONS
MIN
Supply voltage, VCC
Voltage at any bus terminal (separately or common mode) VI or VIC
High-level input voltage, VIH
D, DE, RE
Low-level input voltage, VIL
D, DE, RE
Differential input voltage, VID (see Figure 8)
Driver
High-level output current, IOH
3.6
V
12
V
2
VCC
V
0
0.8
V
–12
12
V
–60
mA
–8
Driver
60
Receiver
8
54
Differential load capacitance, CL
mA
Ω
60
50
Signaling rate
UNIT
3
Differential load resistance, RL
4
MAX
–7 (1)
Receiver
Low-level output current, IOL
(1)
NOM
pF
HVD10
25
HVD11
10
HVD12
1
Mbps
The algebraic convention, in which the least positive (most negative) limit is designated as minimum is used in this data sheet.
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Product Folder Link(s): SN65HVD10-EP SN65HVD11-EP SN65HVD12-EP
SN65HVD10-EP,, SN65HVD11-EP
SN65HVD12-EP
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
DRIVER ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
VIK
TEST CONDITIONS
Input clamp voltage
MIN
II = –18 mA
Differential output voltage (2)
Δ|VOD|
Change in magnitude of differential output
voltage
VOC(PP)
Peak-to-peak common-mode output voltage
VOC(SS)
Steady-state common-mode output voltage
ΔVOC(SS)
Change in steady-state common-mode output
voltage
IOZ
High-impedance output current
RL = 54 Ω, See Figure 2
1.5
Vtest = –7 V to 12 V, See Figure 3
1.5
See Figure 2 and Figure 3
VCC
V
–0.2
0.2
400
V
mV
1.4
2.5
V
–0.05
0.05
V
–100
0
0
100
See Figure 4
See receiver input currents
D
Input current
IOS
Short-circuit output current
–7 V ≤ VO ≤ 12 V
C(OD)
Differential output capacitance
VOD = 0.4 sin (4E6πt) + 0.5 V, DE at 0 V
(1)
(2)
UNIT
V
2
II
ICC
MAX
–1.5
IO = 0
|VOD|
TYP (1)
DE
Supply current
–250
250
16
μA
mA
pF
RE at VCC,
D and DE at VCC,
No load
Receiver disabled
and driver enabled
9
15.5
mA
RE at VCC,
D at VCC,
DE at 0 V,
No load
Receiver disabled
and driver disabled
(standby)
1
5
μA
RE at 0 V,
D and DE at VCC,
No load
Receiver enabled
and driver enabled
9
15.5
mA
All typical values are at 25°C and with a 3.3 V supply.
For TA > 85°C, VCC is ±5%.
Copyright © 2004–2007, Texas Instruments Incorporated
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5
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SN65HVD12-EP
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
DRIVER SWITCHING CHARACTERISTICS
over recommended operating free-air temperature range (unless otherwise noted)
MIN
TYP (1)
MAX
HVD10
5
8.5
16
HVD11
18
25
40
HVD12
135
200
330
HVD10
5
8.5
16
HVD11
18
25
40
HVD12
135
200
330
HVD10
3
4.5
11.5
10
20
30
HVD12
100
170
330
HVD10
3
4.5
11.5
PARAMETER
tPLH
Propagation delay time, low-to-high level output
tPHL
Propagation delay time, high-to-low level output
tr
Differential output signal rise time
tf
Differential output signal fall time
tsk(p)
tsk(pp) (2)
tPZH
Pulse skew (|tPHL - tPLH|)
Part-to-part skew
Propagation delay time, high impedance-to-high
level output
TEST CONDITIONS
HVD11
HVD11
10
20
30
HVD12
100
170
330
HVD10
1.5
HVD11
2.5
HVD12
9
HVD10
6
HVD11
11
HVD12
100
HVD10
33
HVD11
55
HVD12
320
HVD10
tPHZ
tPZL
Propagation delay time, high
level-to-high-impedance output
Propagation delay time, high
impedance-to-low-level output
55
320
HVD10
26
HVD11
tPZH
tPZL
(1)
(2)
6
Propagation delay time, standby-to-high-level
output
Propagation delay time, standby-to-low-level
output
55
RL = 110 Ω, RE at 0 V,
See Figure 7
75
420
M-temp
I and
Q-temp
M-temp
RL = 110 Ω, RE at 3 V,
See Figure 7
ns
ns
ns
ns
ns
ns
ns
26
HVD12
RL = 110 Ω, RE at 3 V,
See Figure 6
ns
320
HVD11
I and
Q-temp
ns
26
HVD12
HVD10
tPLZ
RL = 110 Ω, RE at 0 V,
See Figure 6
HVD11
HVD12
Propagation delay time, low
level-to-high-impedance output
RL = 54 Ω, CL = 50 pF,
See Figure 5
UNIT
6
ns
μs
14
6
μs
14
All typical values are at 25°C and with a 3.3 V supply.
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
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SN65HVD12-EP
www.ti.com
SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
RECEIVER ELECTRICAL CHARACTERISTICS
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
VIT+
Positive-going input threshold
voltage
IO = –8 mA
VIT–
Negative-going input threshold
voltage
IO = 8 mA
Vhys
Hysteresis voltage (VIT+ – VIT–)
VIK
Enable-input clamp voltage
II = –18 mA
VOH
High-level output voltage
VID = 200 mV,
IOH = –8 mA,
See Figure 8
VOL
Low-level output voltage
VID = –200 mV,
IOL = 8 mA,
See Figure 8
IOZ
High-impedance-state output current VO = 0 or VCC
UNIT
–0.01
V
V
35
VA or VB = 12 V,
VA or VB = –7 V,
RE at VCC
VCC = 0 V
VA or VB = –7 V
VA or VB = –7 V,
V
–1
HVD11, HVD12,
Other input at 0 V
VCC = 0 V
VCC = 0 V
V
2.4
HVD10,
Other input at 0 V
VCC = 0 V
0.4
V
1
μA
0.05
0.11
0.06
0.13
–0.1
–0.05
–0.05
÷0.04
VA or VB = 12 V
VA or VB = 12 V,
mV
–1.5
VA or VB = –7 V
Bus input current
MAX
–0.2
VA or VB = 12 V
II
TYP (1)
0.2
0.5
0.25
0.5
–0.4
–0.2
–0.4
–0.15
mA
mA
IIH
High-level input current, RE
VIH = 2 V
–30
0
μA
IIL
Low-level input current, RE
VIL = 0.8 V
–30
0
μA
CID
Differential input capacitance
VID = 0.4 sin (4E6πt) + 0.5 V, DE at 0 V
ICC
(1)
Supply current
15
pF
RE at 0 V,
D and DE at 0 V,
No load
Receiver enabled and driver
disabled
4
8
mA
RE at VCC,
D at VCC,
DE at 0 V,
No load
Receiver disabled and driver
disabled (standby)
1
5
μA
RE at 0 V,
D and DE at VCC,
No load
Receiver enabled and driver
enabled
9
15.5
mA
All typical values are at 25°C and with a 3.3 V supply.
Copyright © 2004–2007, Texas Instruments Incorporated
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
RECEIVER SWITCHING CHARACTERISTICS
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP (1)
MAX
UNIT
tPLH
Propagation delay time, low-to-high level output
HVD10
12.5
20
25
ns
tPHL
Propagation delay time, high-to-low level output
HVD10
12.5
20
25
ns
tPLH
Propagation delay time, low-to-high level output
HVD11
HVD12
30
55
70
ns
30
55
70
ns
tPHL
Propagation delay time, high-to-low level output
tsk(p)
Pulse skew (|tPHL - tPLH|)
tsk(pp) (2)
Part-to-part skew
tr
Output signal rise time
tf
Output signal fall time
tPZH (1)
tPZL
(1)
tPLZ
Output disable time from low level
tPZL
(1)
(2)
1.5
HVD11
4
HVD12
4
HVD10
8
HVD11
15
HVD12
15
CL = 15 pF, See Figure 9
1
2
6
1
2
6
ns
ns
ns
16
Output enable time to low level
Output disable time from high level
(2)
HVD10
Output enable time to high level
tPHZ
tPZH (2)
HVD11
HVD12
VID = –1.5 V to 1.5 V,
CL = 15 pF, See Figure 9
16
CL = 15 pF, DE at 3 V,
See Figure 10
21
ns
16
Propagation delay time, standby-to-high-level
output
Propagation delay time, standby-to-low-level
output
I and
Q-temp
M-temp
I and
Q-temp
6
14
CL = 15 pF, DE at 0,
See Figure 11
μs
6
M-temp
14
All typical values are at 25°C and with a 3.3 V supply.
tsk(pp) is the magnitude of the difference in propagation delay times between any specified terminals of two devices when both devices
operate with the same supply voltages, at the same temperature, and have identical packages and test circuits.
THERMAL CHARACTERISTICS (1)
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
θJA
Junction-to-ambient thermal resistance (2)
High-K board (3), No airflow
D package
121
°C/W
θJB
Junction-to-board thermal resistance
High-K board
D package
67
°C/W
θJC
Junction-to-case thermal resistance
D package
41
°C/W
HVD10
(25 Mbps)
198
233
mW
HVD11
(10 Mbps)
141
176
mW
HVD12
(500 kbps)
133
161
mW
PD
Device power dissipation
TJSD
(1)
(2)
(3)
8
RL = 60 Ω, CL = 50 pF,
DE at VCC RE at 0 V,
Input to D a 50% duty cycle square
wave at indicated signaling rate
Thermal shutdown junction temperature
165
°C
See Application Information section for an explanation of these parameters.
The intent of θJA specification is solely for a thermal performance comparison of one package to another in a standardized environment.
This methodology is not meant to and will not predict the performance of a package in an application-specific environment.
JSD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages.
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
PARAMETER MEASUREMENT INFORMATION
VCC
DE
II
375 Ω ±1%
VCC
IOA
A
DE
B
D
54 Ω ±1%
VOD
0 or 3 V
A
60 Ω ±1%
VOD
0 or 3 V
IOB
+
_ −7 V < V(test) < 12 V
B
VI
VOB
375 Ω ±1%
VOA
Figure 2. Driver VOD Test Circuit and Voltage and
Current Definitions
VCC
DE
Input
D
Figure 3. Driver VOD With Common-Mode Loading Test
Circuit
27 Ω ± 1%
A
VA
B
VB
VOC(PP)
27 Ω ± 1%
B
A
CL = 50 pF ±20%
VOC
∆VOC(SS)
VOC
CL Includes Fixture and
Instrumentation Capacitance
Input: PRR = 500 kHz, 50% Duty Cycle, tr < 6 ns, tf < 6 ns, ZO = 50 Ω
Figure 4. Test Circuit and Definitions for the Driver Common-Mode Output Voltage
3V
VCC
DE
D
Input
Generator
VI
50 Ω
CL = 50 pF ±20%
A
VOD
tPLH
CL Includes Fixture
and Instrumentation
Capacitance
RL = 54 Ω
± 1%
B
1.5 V
VI
1.5 V
tPHL
90%
VOD
≈2V
90%
0V
10%
0V
10%
≈ −2 V
tr
tf
Generator: PRR = 500 kHz, 50% Duty Cycle, tr < 6 ns, tf < 6 ns, Zo = 50 Ω
Figure 5. Driver Switching Test Circuit and Voltage Waveforms
A
3V
D
3V
S1
VO
VI
1.5 V
1.5 V
B
DE
Input
Generator
VI
CL = 50 pF ±20%
50 Ω CL Includes Fixture
and Instrumentation
Capacitance
RL = 110 Ω
± 1%
0.5 V
0V
tPZH
VOH
VO
2.3 V
tPHZ
≈0V
Generator: PRR = 500 kHz, 50% Duty Cycle, tr < 6 ns, tf < 6 ns, Zo = 50 Ω
Figure 6. Driver High-Level Enable and Disable Time Test Circuit and Voltage Waveforms
Copyright © 2004–2007, Texas Instruments Incorporated
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
PARAMETER MEASUREMENT INFORMATION (continued)
3V
RL = 110 Ω
± 1%
A
3V
VI
1.5 V
VI
S1
D
1.5 V
VO
DE
Input
Generator
≈3V
50 Ω
0V
B
tPZL
tPLZ
≈3V
CL = 50 pF ±20%
0.5 V
CL Includes Fixture
and Instrumentation
Capacitance
VO
2.3 V
VOL
Generator: PRR = 500 kHz, 50% Duty Cycle, tr < 6 ns, tf < 6 ns, Zo = 50 Ω
Figure 7. Driver Low-Level Output Enable and Disable Time Test Circuit and Voltage Waveforms
IA
VA + VB
2
VID
VB
VIC
A
R
VA
IO
B
VO
IB
Figure 8. Receiver Voltage and Current Definitions
A
Input
Generator
R
VI
50 Ω
1.5 V
0V
B
VO
CL = 15 pF ±20%
RE
CL Includes Fixture
and Instrumentation
Capacitance
Generator: PRR = 500 kHz, 50% Duty Cycle, tr < 6 ns, tf < 6 ns, Zo = 50 Ω
3V
1.5 V
VI
1.5 V
0V
tPLH
VO
tPHL
90% 90%
1.5 V
10%
tr
VOH
1.5 V
10% V
OL
tf
Figure 9. Receiver Switching Test Circuit and Voltage Waveforms
10
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
PARAMETER MEASUREMENT INFORMATION (continued)
3V
3V
A
DE
0 V or 3 V
R
D
VO
B
RE
Input
Generator
VI
A
1 kΩ ± 1%
S1
CL = 15 pF ±20%
B
CL Includes Fixture
and Instrumentation
Capacitance
50 Ω
Generator: PRR = 500 kHz, 50% Duty Cycle, tr < 6 ns, tf < 6 ns, Zo = 50 Ω
3V
VI
1.5 V
1.5 V
0V
tPZH(1)
tPHZ
VOH −0.5 V
VOH
D at 3 V
S1 to B
1.5 V
VO
≈0V
tPZL(1)
tPLZ
≈3V
VO
1.5 V
VOL +0.5 V
D at 0 V
S1 to A
VOL
Figure 10. Receiver Enable and Disable Time Test Circuit and Voltage Waveforms With Drivers Enabled
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
PARAMETER MEASUREMENT INFORMATION (continued)
3V
A
0 V or 1.5 V
R
B
1.5 V or 0 V
RE
Input
Generator
VI
VO
A
1 kΩ ± 1%
S1
CL = 15 pF ±20%
B
CL Includes Fixture
and Instrumentation
Capacitance
50 Ω
Generator: PRR = 100 kHz, 50% Duty Cycle, tr < 6 ns, tf < 6 ns, Zo = 50 Ω
3V
1.5 V
VI
0V
tPZH(2)
VOH
A at 1.5 V
B at 0 V
S1 to B
1.5 V
VO
GND
tPZL(2)
3V
1.5 V
VO
A at 0 V
B at 1.5 V
S1 to A
VOL
Figure 11. Receiver Enable Time From Standby (Driver Disabled)
0 V or 3 V
A
RE
R
Pulse Generator,
15 µs Duration,
1% Duty Cycle
tr, tf ≤ 100 ns
100 Ω
± 1%
B
D
+
_
DE
3 V or 0 V
NOTE: This test is conducted to test survivability only. Data stability at the R output is not specified.
Figure 12. Test Circuit, Transient Over Voltage Test
12
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
Function Tables
abc
DRIVER
OUTPUTS
INPUT
D
ENABLE
DE
A
B
H
H
H
L
L
H
L
H
X
L
Z
Z
Open
H
H
L
RECEIVER
DIFFERENTIAL INPUTS
VID = VA – VB
ENABLE
RE
OUTPUT
R
VID ≤ –0.2 V
L
L
–0.2 V < VID < –0.01 V
L
?
–0.01 V ≤ VID
L
H
X
H
Z
Open Circuit
L
H
Short Circuit
L
H
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
EQUIVALENT INPUT AND OUTPUT SCHEMATIC DIAGRAMS
D and RE Inputs
DE Input
VCC
VCC
100 kΩ
1 kΩ
1 kΩ
Input
Input
100 kΩ
9V
9V
A Input
B Input
VCC
VCC
16 V
100 kΩ
16 V
R3
R1
R3
Input
Input
16 V
R2
R1
100 kΩ
16 V
A and B Outputs
R2
R Output
VCC
VCC
16 V
5Ω
Output
Output
9V
16 V
SN65HVD10
SN65HVD11
SN65HVD12
14
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R1/R2
9 kΩ
36 kΩ
36 kΩ
R3
45 kΩ
180 kΩ
180 kΩ
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
TYPICAL CHARACTERISTICS
HVD10 OR HVD12
HVD11
RMS SUPPLY CURRENT
vs
SIGNALING RATE
RMS SUPPLY CURRENT
vs
SIGNALING RATE
70
RL = 54 Ω
CL = 50 pF
TA = 25°C
RE at VCC
DE at VCC
I CC − RMS Supply Current − mA
I CC − RMS Supply Current − mA
70
VCC = 3.6 V
60
50
VCC = 3 V
VCC = 3.3 V
40
30
0
5
10
15
20
25
30
35
50
VCC = 3 V
VCC = 3.3 V
40
2.5
Signaling Rate − Mbps
Figure 13.
HVD12
300
RL = 54 Ω
CL = 50 pF
250
VCC = 3.6 V
60
VCC = 3.3 V
50
10
BUS INPUT CURRENT
vs
BUS INPUT VOLTAGE
I I − Bus Input Current − µ A
I CC − RMS Supply Current − mA
TA = 25°C
RE at VCC
DE at VCC
5
7.5
Signaling Rate − Mbps
Figure 14.
HVD10
RMS SUPPLY CURRENT
vs
SIGNALING RATE
70
VCC = 3.6 V
60
30
0
40
RL = 54 Ω
CL = 50 pF
TA = 25°C
RE at VCC
DE at VCC
VCC = 3 V
40
TA = 25°C
DE at 0 V
200
150
VCC = 0 V
100
50
VCC = 3.3 V
0
−50
−100
−150
30
100
400
700
Signaling Rate − kbps
Figure 15.
Copyright © 2004–2007, Texas Instruments Incorporated
1000
−200
−7 −6−5 −4−3 −2−1 0 1 2 3 4 5 6 7 8 9 10 11 12
VI − Bus Input Voltage − V
Figure 16.
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
TYPICAL CHARACTERISTICS (continued)
HVD11 OR HVD12
HIGH-LEVEL OUTPUT CURRENT
vs
DRIVER HIGH-LEVEL OUTPUT VOLTAGE
BUS INPUT CURRENT
vs
BUS INPUT VOLTAGE
150
80
I I − Bus Input Current − µ A
70
IOH − High-Level Output Current − mA
90
TA = 25°C
DE at 0 V
60
50
VCC = 0 V
40
30
20
10
0
VCC = 3.3 V
−10
−20
−30
TA = 25°C
DE at VCC
D at VCC
VCC = 3.3 V
100
50
0
−50
−100
−150
−40
−50
−200
−60
−7−6 −5 −4 −3 −2 −1 0 1 2 3 4 5 6 7 8 9 10 11 12
VI − Bus Input Voltage − V
−4
−2
0
2
4
VOH − Driver High-Level Output Voltage − V
Figure 17.
Figure 18.
LOW-LEVEL OUTPUT CURRENT
vs
DRIVER LOW-LEVEL OUTPUT VOLTAGE
DRIVER DIFFERENTIAL OUTPUT
vs
FREE-AIR TEMPERATURE
200
160
140
2.5
TA = 25°C
DE at VCC
D at 0 V
VCC = 3.3 V
2.4
VOD − Driver Differential Output − V
I OL − Low-Level Output Current − mA
180
120
100
80
60
40
20
−2
0
2
4
6
VOL − Driver Low-Level Output Voltage − V
Figure 19.
16
2.3
VCC = 3.3 V
DE at VCC
D at VCC
2.2
2.1
2.0
1.9
1.8
1.7
1.6
0
−20
−4
6
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8
1.5
−40
−15
10
35
60
TA − Free-Air Temperature − °C
85
Figure 20.
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SN65HVD12-EP
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
TYPICAL CHARACTERISTICS (continued)
DRIVER OUTPUT CURRENT
vs
SUPPLY VOLTAGE
−40
TA = 25°C
DE at VCC
D at VCC
RL = 54 Ω
I O − Driver Output Current − mA
−35
−30
−25
−20
−15
−10
−5
0
0
0.50
1
1.50
2
2.50
3
3.50
VCC − Supply Voltage − V
Figure 21.
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
APPLICATION INFORMATION
An example application for the HVD12 is illustrated in Figure 22. Two HVD12 transceivers are used to
communicate data through a 2000 foot (600 m) length of Commscope 5524 category 5e+ twisted pair cable. The
bus is terminated at each end by a 100 Ω resistor, matching the cable characteristic impedance. Figure 23
illustrates operation at a signaling rate of 250 kbps.
RT
Stub
Device
HVD10
HVD11
HVD12
RT
Number of Devices on Bus
64
256
256
NOTE: The line should be terminated at both ends with its characteristic impedance (RT = ZO). Stub lengths off the main line
should be kept as short as possible.
Figure 22. Typical Application Circuit
Driver Input
Driver Output
Receiver Input
Receiver Output
Figure 23. HVD12 Input and Output Through 2000 Feet of Cable
18
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SGLS278E – DECEMBER 2004 – REVISED SEPTEMBER 2007
THERMAL CHARACTERISTICS OF IC PACKAGES
Junction-to-Ambient Thermal Resistance (θJA) is defined as the difference in junction temperature to ambient
temperature divided by the operating power.
θJA is not a constant and is a strong function of:
• the PCB design (50% variation)
• altitude (20% variation)
• device power (5% variation)
θJA can be used to compare the thermal performance of packages if the specific test conditions are defined and
used. Standardized testing includes specification of PCB construction, test chamber volume, sensor locations,
and the thermal characteristics of holding fixtures. θJA is often misused when it is used to calculate junction
temperatures for other installations.
Texas Instruments uses two test PCBs as defined by JEDEC specifications. The low-k board gives average
in-use condition thermal performance and consists of a single copper trace layer 25 mm long and 2 oz thick. The
high-k board gives best case in-use condition and it consists of two 1 oz buried power planes with a single
copper trace layer 25 mm long and 2 oz thick. A 4% to 50% difference in θJA can be measured between these
two test cards
Junction-to-Case Thermal Resistance (θJC) is defined as difference in junction temperature to case divided by
the operating power. It is measured by putting the mounted package up against a copper block cold plate to
force heat to flow from die, through the mold compound into the copper block.
θJC is a useful thermal characteristic when a heatsink is applied to package. It is not a useful characteristic to
predict junction temperature because it provides pessimistic numbers if the case temperature is measured in a
nonstandard system and junction temperatures are backed out. It can be used with θJB in one-dimensional
thermal simulation of a package system.
Junction-to-Board Thermal Resistance (θJB) is defined as the difference in the junction temperature and the
PCB temperature at the center of the package (closest to the die) when the PCB is clamped in a cold-plate
structure. θJB is defined only for the high-k test card.
θJB provides an overall thermal resistance between the die and the PCB. It includes a bit of the PCB thermal
resistance (especially for BGAs with thermal balls) and can be used for simple one-dimensional network analysis
of the package system (see Figure 24).
Figure 24. Thermal Resistance
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PACKAGE OPTION ADDENDUM
www.ti.com
25-Sep-2007
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
SN65HVD10MDREP
ACTIVE
SOIC
D
8
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65HVD10QDREP
ACTIVE
SOIC
D
8
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
SN65HVD12IDREP
ACTIVE
SOIC
D
8
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
V62/05604-01XE
ACTIVE
SOIC
D
8
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
V62/05604-03XE
ACTIVE
SOIC
D
8
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
V62/05604-04XE
ACTIVE
SOIC
D
8
2500 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-1-260C-UNLIM
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
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Addendum-Page 1
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