SEME-LAB IRFM

IRFM
MECHANICAL DATA
Dimensions in mm (inches)
N–CHANNEL
POWER MOSFET
1 3 .8 4 (.5 4 5 )
1 .2 7 (.0 5 0 )
1 .0 2 (.0 4 0 )
1 3 .5 9 (.5 3 5 )
6 .6 0 (.2 6 0 )
6 .3 2 (.2 4 9 )
6 .9 1 (.2 7 2 )
6 .8 1 (.2 6 8 )
3 .7 8 (.1 4 9 )
3 .5 3 (.1 3 9 )
2 0 .3 2 (.8 0 0 )
2 0 .0 6 (.7 9 0 )
VDSS
ID(cont)
RDS(on)
D IA
1 7 .4 0 (.6 8 5 )
1 6 .8 9 (.6 6 5 )
1 3 .8 4 (.5 4 5 )
1 3 .5 9 (.5 3 5 )
G a te
S o u rc e
4 .9 5 (.1 9 5 )
4 .1 9 (.1 6 5 )
D r a in
1 .1 4 (.0 4 5 )
0 .8 9 (0 .3 5 )
9 .5 2 (.3 7 5 )
8 .7 6 (.3 4 5 )
FEATURES
• N–CHANNEL MOSFET
R 1 .0 1 (.0 4 0 ) M IN
3 .8 1 (.1 5 0 ) B S C
200V
27.4A
0.100W
D ia T y p
3 L e a d s
• HIGH VOLTAGE
• INTEGRAL PROTECTION DIODE
• HERMETIC ISOLATED TO-254 PAC
3 .8 1 (.1 5 0 ) B S C
• CERAMIC SURFACE MOUNT PACK
OPTION
TO–254 Metal Package
Pin 1 – Drain
Pin 2 – Source
Pin 3 – Gate
ABSOLUTE MAXIMUM RATINGS (TC = 25°C unless otherwise stated)
VGS
Gate – Source Voltage
ID
Continuous Drain Current
@ VGS = 10V , TC = 25°C
@ VGS = 10V , TC = 100°C
IDM
Pulsed Drain Current
PD
Max. Power Dissipation
@ TC = 25°C
Linear Derating Factor
IL
Avalanche Current , Clamped 1
dv / dt
Peak Diode Recovery 2
RqJC
RqJA
Thermal Resistance Junction – Case
RqCS
TJ , TSTG
Thermal Resistance Case – Sink
TL
Lead Temperature (1.6mm from case for 10s)
Thermal Resistance Junction – Ambient
Operating Junction and Storage Temperature Range
±20V
27.4A
17A
110A
150W
1.2W / °C
27.4A
5.5V / ns
0.83°C / W
48°C / W
0.21°C / W typ.
–55 to 150°C
300°C
IRFM
ELECTRICAL CHARACTERISTICS (TJ = 25°C unless otherwise stated)
Parameter
BVDSS
Test Conditions
STATIC ELECTRICAL RATINGS
Drain – Source Breakdown Voltage
DBVDSS Temperature Coefficient of
DTJ Breakdown Voltage
RDS(on)
ID = 1mA
VGS(th) Gate Threshold Voltage
2
Max
0.28
ID = 1mA
2
Typ.
200
Reference to 25°C
Static Drain – Source On–State
Resistance
VGS = 0
Min.
VGS = 10V
ID = 17A
0.100
VGS = 10V
ID = 27.4A
0.105
VDS = VGS
ID = 250mA
2
VDS ³ 15V
IDS = 27.4A
9
VGS = 0
VDS = 0.8BVDSS
25
TJ = 125°C
250
4
gfs
Forward Transconductance
IDSS
Zero Gate Voltage Drain Current
IGSS
Forward Gate – Source Leakage
VGS = 20V
100
IGSS
Reverse Gate – Source Leakage
VGS = –20V
–100
Ciss
DYNAMIC CHARACTERISTICS
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
CDC
Drain – Case Capacitance
Qg
Total Gate Charge
VGS = 10V
55
115
Qgs
Gate – Source Charge
ID = 27.4A
8
22
Qgd
Gate – Drain (“Miller”) Charge
VDS = 0.5BVDSS
30
60
td(on)
Turn– On Delay Time
tr
Rise Time
td(off)
Turn–Off Delay Time
tf
Fall Time
IS
SOURCE – DRAIN DIODE CHARACTERISTICS
Continuous Source Current
3500
VGS = 0
700
VDS = 25V
110
f = 1MHz
12
35
VDD = 100V
190
ID = 27.4A
170
RG = 2.35W
130
27.4
1
ISM
Pulse Source Current
VSD
Diode Forward Voltage 2
trr
Reverse Recovery Time 2
110
IS = 27.4A
TJ = 25°C
1.9
VGS = 0
IF = 27.4A
2
TJ = 25°C
950
di / dt £ 100A/ms VDD £ 50V
9.0
Qrr
Reverse Recovery Charge
ton
Forward Turn–On Time
LD
PACKAGE CHARACTERISTICS
Internal Drain Inductance Measured from 6mm down drain lead to centre of die
8.7
LS
Internal Source Inductance
8.7
Negligible
Measured from 6mm down source lead to source bond pad