SSC SSM4500GM

SSM4500GM
N AND P-CHANNEL ENHANCEMENT
MODE POWER MOSFET
PRODUCT SUMMARY
N-CH BVDSS
D2
RDS(ON)
D2
Simple Drive Requirement
Low On-resistance
Fast Switching
20V
D1
D1
30mΩ
ID
G2
S2
SO-8
S1
6A
P-CH BVDSS
G1
-20V
RDS(ON)
DESCRIPTION
50mΩ
ID
-5A
The advanced power MOSFETs from Silicon Standard Corp.
provide the designer with the best combination of fast switching,
ruggedized device design, low on-resistance and cost-effectiveness.
The SO-8 package is universally preferred for all commercialindustrial surface mount applications and suited for low voltage
applications such as DC/DC converters.
D2
D1
G2
G1
S2
S1
Pb-free; RoHS-compliant
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Rating
N-channel
VDS
Drain-Source Voltage
VGS
Gate-Source Voltage
ID@TA=25℃
ID@TA=70℃
Units
P-channel
20
-20
V
±12
±12
V
3
6
-5
A
3
4.8
-4
A
20
-20
A
Continuous Drain Current
Continuous Drain Current
1
IDM
Pulsed Drain Current
PD@TA=25℃
Total Power Dissipation
2.0
Linear Derating Factor
0.016
W
W/℃
TSTG
Storage Temperature Range
-55 to 150
℃
TJ
Operating Junction Temperature Range
-55 to 150
℃
THERMAL DATA
Symbol
Rthj-a
02/13/2008 Rev.1.00
Parameter
Thermal Resistance Junction-ambient
3
www.SiliconStandard.com
Max.
Value
Unit
62.5
℃/W
1
SSM4500GM
N-CH Electrical Characteristics@Tj=25oC(unless otherwise specified)
Symbol
Parameter
Test Conditions
BVDSS
Drain-Source Breakdown Voltage
ΔBVDSS/ΔTj
Breakdown Voltage Temperature Coefficient Reference to 25℃, ID=1mA
RDS(ON)
20
-
-
V
-
0.037
-
V/℃
VGS=4.5V, ID=6A
-
-
30
mΩ
VGS=2.5V, ID=5.2A
-
-
45
mΩ
VDS=VGS, ID=250uA
0.5
-
1.2
V
VDS=10V, ID=6A
-
18.5
-
S
Drain-Source Leakage Current (Tj=25 C)
VDS=20V, VGS=0V
-
-
1
uA
Drain-Source Leakage Current (Tj=70oC)
VDS=16V, VGS=0V
-
-
25
uA
Gate-Source Leakage
VGS=±12V
-
-
ID=6A
-
9
15
nC
Static Drain-Source On-Resistance
VGS(th)
Gate Threshold Voltage
gfs
Forward Transconductance
o
IDSS
IGSS
2
VGS=0V, ID=250uA
Min. Typ. Max. Units
2
±100 nA
Qg
Total Gate Charge
Qgs
Gate-Source Charge
VDS=10V
-
1.8
-
nC
Qgd
Gate-Drain ("Miller") Charge
VGS=4.5V
-
4.2
-
nC
VDS=10V
-
29
-
ns
2
td(on)
Turn-on Delay Time
tr
Rise Time
ID=1A
-
65
-
ns
td(off)
Turn-off Delay Time
RG=6Ω,VGS=4.5V
-
60
-
ns
tf
Fall Time
RD=10Ω
-
50
-
ns
Ciss
Input Capacitance
VGS=0V
-
300
480
pF
Coss
Output Capacitance
VDS=8V
-
255
-
pF
Crss
Reverse Transfer Capacitance
f=1.0MHz
-
115
-
pF
SOURCE-DRAIN DIODE
Symbol
Parameter
2
Test Conditions
Min. Typ. Max. Units
VSD
Forward On Voltage
IS=1.7A, VGS=0V
-
-
1.2
V
trr
Reverse Recovery Time
IS=6A, VGS=0V,
-
26
-
ns
Qrr
Reverse Recovery Charge
dI/dt=100A/µs
-
17
-
nC
02/13/2008 Rev.1.00
www.SiliconStandard.com
2
SSM4500GM
o
P-CH Electrical Characteristics@Tj=25 C(unless otherwise specified)
Symbol
Parameter
Test Conditions
BVDSS
Drain-Source Breakdown Voltage
ΔBVDSS/ΔTj
Breakdown Voltage Temperature Coefficient Reference to 25℃, ID=-1mA
RDS(ON)
2
Static Drain-Source On-Resistance
VGS(th)
Gate Threshold Voltage
gfs
Forward Transconductance
IDSS
IGSS
VGS=0V, ID=250uA
Min. Typ. Max. Units
-20
-
-
V
-
-0.037
-
V/℃
VGS=-4.5V, ID=-2.2A
-
-
50
mΩ
VGS=-2.5V, ID=-1.8A
-
-
90
mΩ
VDS=VGS, ID=-250uA
-0.5
-
-1
V
VDS=-10V, ID=-2.2A
-
2.5
-
S
o
VDS=-20V, VGS=0V
-
-
-1
uA
o
Drain-Source Leakage Current (Tj=70 C)
VDS=-16V, VGS=0V
-
-
-25
uA
Gate-Source Leakage
VGS= ± 12V
-
-
Drain-Source Leakage Current (Tj=25 C)
2
±100 nA
Qg
Total Gate Charge
ID=-5A
-
14
20
nC
Qgs
Gate-Source Charge
VDS=-16V
-
2
-
nC
Qgd
Gate-Drain ("Miller") Charge
VGS=-4.5V
-
5.6
-
nC
VDS=-10V
-
10
-
ns
2
td(on)
Turn-on Delay Time
tr
Rise Time
ID=-2.2A
-
11
-
ns
td(off)
Turn-off Delay Time
RG=6Ω,VGS=-10V
-
58
-
ns
tf
Fall Time
RD=4.5Ω
-
38
-
ns
Ciss
Input Capacitance
VGS=0V
-
940 1500 pF
Coss
Output Capacitance
VDS=-20V
-
400
-
pF
Crss
Reverse Transfer Capacitance
f=1.0MHz
-
160
-
pF
SOURCE-DRAIN DIODE
Symbol
Parameter
Test Conditions
2
Min. Typ. Max. Units
VSD
Forward On Voltage
IS=-1.8A, VGS=0V
-
-
-1.2
V
trr
Reverse Recovery Time
IS=-2.2A, VGS=0V,
-
25
-
ns
Qrr
Reverse Recovery Charge
dI/dt=100A/µs
-
21
-
nC
Notes:
1.Pulse width limited by Max. junction temperature.
2.Pulse width <300us , duty cycle <2%.
2
3.Surface mounted on 1 in copper pad of FR4 board ; 135℃/W when mounted on Min. copper pad.
02/13/2008 Rev.1.00
www.SiliconStandard.com
3
SSM4500GM
N-Channel
25
25
20
15
10
V GS =2.0V
15
10
V GS =2.0V
5
5
0
0
0
1
2
3
4
0
5
V DS , Drain-to-Source Voltage (V)
1
2
3
4
5
V DS , Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
1.8
45
I D =6A
40
I D =6A
V GS =4.5V
1.6
o
Normalized RDS(ON)
T A =25 C
RDS(ON) (mΩ )
4.5V
3.5V
3.0V
2.5V
T A =150 o C
4.5V
3.5V
3.0V
2.5V
ID , Drain Current (A)
ID , Drain Current (A)
T A =25 o C
20
35
30
1.4
1.2
1.0
25
0.8
20
0.6
2
3
4
5
-50
0
50
100
150
T j , Junction Temperature ( o C)
V GS (V)
Fig 3. On-Resistance v.s. Gate Voltage
Fig 4. Normalized On-Resistance
v.s. Junction Temperature
100.00
1.5
10.00
T j =150 o C
1.00
VGS(th) (V)
IS(A)
1
T j =25 o C
0.5
0.10
0
0.01
0.1
0.3
0.5
0.7
0.9
1.1
1.3
1.5
-50
Fig 5. Forward Characteristic of
Reverse Diode
02/13/2008 Rev.1.00
0
50
100
150
T j ,Junction Temperature ( o C)
V SD (V)
Fig 6. Gate Threshold Voltage v.s.
Junction Temperature
www.SiliconStandard.com
4
SSM4500GM
N-Channel
f=1.0MHz
6
1000
I D =6A
V DS =10V
Ciss
4
C (pF)
VGS , Gate to Source Voltage (V)
5
3
Coss
100
Crss
2
1
0
10
0
2
4
6
8
10
12
1
5
9
Q G , Total Gate Charge (nC)
Fig 7. Gate Charge Characteristics
17
21
25
29
Fig 8. Typical Capacitance Characteristics
100
Normalized Thermal Response (Rthja)
1
10
1ms
ID (A)
13
V DS (V)
10ms
1
100ms
1s
10s
DC
T A =25 o C
Single Pulse
0.1
Duty Factor = 0.5
0.2
0.1
0.1
0.05
0.02
0.01
PDM
0.01
t
T
Single Pulse
Duty factor = t/T
Peak T j = P DM x R thja + Ta
Rthja =135o C/W
0.001
0.01
0.1
1
10
100
0.0001
0.001
0.01
0.1
1
10
100
1000
t , Pulse Width (s)
V DS (V)
Fig9. Maximum Safe Operating Area
Fig 10. Effective Transient Thermal Impedance
VG
VDS
90%
QG
4.5V
QGS
QGD
10%
VGS
td(on) tr
td(off) tf
Charge
Fig 11. Switching Time Waveform
02/13/2008 Rev.1.00
Q
Fig 12. Gate Charge Waveform
www.SiliconStandard.com
5
SSM4500GM
P-Channel
25
25
4.5V
4.0V
3.5V
3.0V
-ID , Drain Current (A)
T A =150 o C
15
10
4.5V
4.0V
3.5V
3.0V
20
-ID , Drain Current (A)
T A =25 o C
20
V GS =2. 5 V
15
V GS =2. 5 V
10
5
5
0
0
0
1
2
3
4
0
5
1
2
3
4
5
-V DS , Drain-to-Source Voltage (V)
-V DS , Drain-to-Source Voltage (V)
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
100
1.8
I D =-2.2A
T A =25 ℃
90
I D =-2.2A
V GS = -4.5V
1.6
Normalized RDS(ON)
RDS(ON) (mΩ )
80
70
60
50
1.4
1.2
1
0.8
40
0.6
30
2
3
4
-50
5
-V GS (V)
0
50
100
150
T j , Junction Temperature ( o C)
Fig 3. On-Resistance v.s. Gate Voltage
Fig 4. Normalized On-Resistance
v.s. Junction Temperature
100.00
1
0.8
o
o
T j =150 C
1.00
-VGS(th) (V)
-IS(A)
10.00
T j =25 C
0.6
0.4
0.10
0.2
0
0.01
0.1
0.3
0.5
0.7
0.9
1.1
1.3
1.5
-50
Fig 5. Forward Characteristic of
Reverse Diode
02/13/2008 Rev.1.00
0
50
T j ,Junction Temperature (
-V SD (V)
100
o
150
C)
Fig 6. Gate Threshold Voltage v.s.
Junction Temperature
www.SiliconStandard.com
6
SSM4500GM
P-Channel
f=1.0MHz
10000
I D =-5A
V DS =-16V
5
1000
4
Ciss
C (pF)
-VGS , Gate to Source Voltage (V)
6
3
Coss
Crss
100
2
1
10
0
0
4
8
12
16
1
20
5
9
13
17
21
25
29
-V DS (V)
Q G , Total Gate Charge (nC)
Fig 7. Gate Charge Characteristics
Fig 8. Typical Capacitance Characteristics
1
100
10
Normalized Thermal Response (R thja)
Duty Factor = 0.5
1ms
-ID (A)
10ms
1
100ms
1s
0.1
T A =25 o C
Single Pulse
10s
DC
0.01
0.2
0.1
0.1
0.05
0.02
0.01
PDM
0.01
t
T
Single Pulse
Duty factor = t/T
Peak Tj = PDM x Rthja + T a
Rthja=135 oC/W
0.001
0.1
1
10
100
0.0001
0.001
-V DS (V)
0.01
0.1
1
10
100
1000
t , Pulse Width (s)
Fig9. Maximum Safe Operating Area
Fig 10. Effective Transient Thermal Impedance
VG
VDS
90%
QG
-4.5V
QGS
QGD
10%
VGS
td(on) tr
td(off) tf
Fig 11. Switching Time Waveform
02/13/2008 Rev.1.00
Charge
Q
Fig 12. Gate Charge Waveform
www.SiliconStandard.com
7
SSM4500GM
Information furnished by Silicon Standard Corporation is believed to be accurate and reliable. However, Silicon Standard Corporation makes no
guarantee or warranty, expressed or implied, as to the reliability, accuracy, timeliness or completeness of such information and assumes no
responsibility for its use, or for infringement of any patent or other intellectual property rights of third parties that may result from its
use. Silicon Standard reserves the right to make changes as it deems necessary to any products described herein for any reason, including
without limitation enhancement in reliability, functionality or design. No license is granted, whether expressly or by implication, in relation to
the use of any products described herein or to the use of any information provided herein, under any patent or other intellectual property rights of
Silicon Standard Corporation or any third parties.
02/13/2008 Rev.1.00
www.SiliconStandard.com
8