BB ADS8481IRGZTG4

 ADS8481
SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
18-BIT, 1-MSPS, PSEUDO-DIFFERENTIAL UNIPOLAR INPUT, MICROPOWER SAMPLING
ANALOG-TO-DIGITAL CONVERTER WITH PARALLEL INTERFACE AND REFERENCE
FEATURES
APPLICATIONS
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
0 to 1 MSPS Sampling Rate
18-Bit NMC Ensured Over Temperature
Low ±0.1 mV Offset Error
Low 0.2 ppm/°C Offset Error Temperature
Drift
Low 0.6 ppm/°C Gain Error Temperature Drift
Zero Latency
Low Power: 220 mW at 1 MSPS
Unipolar Single-Ended Input Range: 0 V to
Vref
Onboard Reference
Onboard Reference Buffer
High-Speed Parallel Interface
Wide Digital Supply 2.7 V ~ 5.25 V
8-/16-/18-Bit Bus Transfer
7x7 QFN Package
Medical Instruments
Optical Networking
Transducer Interface
High Accuracy Data Acquisition Systems
Magnetometers
DESCRIPTION
The ADS8481 is an 18-bit, 1-MSPS A/D converter
with an internal 4.096-V reference and a
pseudo-differential unipolar single-ended input. The
device includes a 18-bit capacitor-based SAR A/D
converter with inherent sample and hold. The
ADS8481 offers a full 18-bit interface, a 16-bit option
where data is read using two read cycles, or an 8-bit
bus option using three read cycles.
The ADS8481 is available in a 7x7 QFN package
and is characterized over the industrial –40°C to
85°C temperature range.
HIGH SPEED SAR CONVERTER FAMILY
TYPE/SPEED
18-Bit Pseudo-Diff
500 kHz
580 kHz
ADS8383
ADS8381
750 kHz
1 MHz
1.25 MHz
2 MHz
ADS8401
ADS8411
3 MHz
4MHz
ADS8481
ADS8380(S)
18-Bit Pseudo-Bipolar, Fully Diff
ADS8382(S)
ADS8482
ADS8371
16-Bit Pseudo-Diff
ADS8471
ADS8405
ADS8472
16-Bit Pseudo-Bipolar, Fully Diff
ADS8402
ADS8412
ADS8406
14-Bit Pseudo-Diff
ADS7890 (s)
12-Bit Pseudo-Diff
ADS7886
SAR
+IN
−IN
+
_
CDAC
ADS7891
ADS7883
Output
Latches
and
3-State
Drivers
ADS7881
BYTE
16-/8-Bit
Parallel DATA
Output Bus
BUS 18/16
Comparator
REFIN
REFOUT
4.096-V
Internal
Reference
Clock
Conversion
and
Control Logic
CONVST
BUSY
CS
RD
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2006, Texas Instruments Incorporated
ADS8481
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
ORDERING INFORMATION (1)
MODEL
MAXIMUM
INTEGRAL
LINEARITY
(LSB)
ADS8481I
ADS8481IB
(1)
±5
±3.5
MAXIMUM
DIFFERENTIAL
LINEARITY (LSB)
NO MISSING
CODES
RESOLUTION
(BIT)
PACKAGE
TYPE
18
7x7 48 Pin
QFN
18
7x7 48 Pin
QFN
–1 to +2.5
–1 to +1.5
PACKAGE
DESIGNATOR
TEMPERATURE
RANGE
RGZ
–40°C to
85°C
RGZ
–40°C to
85°C
ORDERING
INFORMATION
TRANSPORT
MEDIA
QTY.
ADS8482IRGZT
Tape and
reel 250
ADS8481IRGZR
Tape and
reel 1000
ADS8481IBRGZT
Tape and
reel 250
ADS8481IBRGZR
Tape and
reel 1000
For the most current specifications and package information, refer to our website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS (1)
over operating free-air temperature range (unless otherwise noted)
Voltage
VALUE
UNIT
+IN to AGND
–0.4 to +VA + 0.1
V
–IN to AGND
–0.4 to 0.5
V
+VA to AGND
–0.3 to 7
V
+VBD to BDGND
–0.3 to 7
V
–0.3 to 2.55
V
Digital input voltage to BDGND
–0.3 to +VBD + 0.3
V
Digital output voltage to BDGND
+VA to +VBD
–0.3 to +VBD + 0.3
V
TA
Operating free-air temperature range
–40 to 85
°C
Tstg
Storage temperature range
–65 to 150
°C
150
°C
Junction temperature (TJ max)
QFN package
Lead temperature, soldering
(1)
2
Power dissipation
(TJMax – TA)/θJA
θJA thermal impedance
22
°C/W
Vapor phase (60 sec)
215
°C
Infrared (15 sec)
220
°C
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
SPECIFICATIONS
TA = –40°C to 85°C, +VA = 5 V, +VBD = 3 V or 5 V, Vref = 4.096 V, fSAMPLE = 1 MSPS (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
ANALOG INPUT
Full-scale input voltage (1)
+IN – (–IN)
Absolute input voltage
0
Vref
+IN
–0.2
Vref +0.2
–IN
–0.2
0.2
Input capacitance
Input leakage current
V
V
65
pF
1
nA
SYSTEM PERFORMANCE
Resolution
No missing codes
Integral linearity (2) (3)
Differential linearity
Offset error (4)
18
ADS8481I
18
ADS8481IB
18
ADS8481I
Bits
–5 –1.5/+1.9
5
3.5
ADS8481I
–1 –0.5/+0.7
2.5
ADS8481IB
–1 –0.5/+0.7
1.5
ADS8481I
–0.5
±0.1
0.5
ADS8481IB
–0.5
±0.1
0.5
±0.2
Vref = 4.096 V
–0.075
±0.05
0.075
ADS8481IB
Vref = 4.096 V
–0.075
±0.05
0.075
Noise
At 3FFFFh output code
LSB
(18 bit)
LSB
(18 bit)
mV
ppm/°C
ADS8481I
Gain error temperature drift
Power supply rejection ratio
18
–3.5 –1.5/+1.9
ADS8481IB
Offset error temperature drift
Gain error (4) (5)
Bits
%FS
%FS
±0.6
ppm/°C
30
µV RMS
60
dB
SAMPLING DYNAMICS
Conversion time
650
Acquisition time
710
250
ns
ns
Throughput rate
1
MHz
Aperture delay
4
ns
Aperture jitter
5
ps
Step response
150
ns
Over voltage recovery
150
ns
(1)
(2)
(3)
(4)
(5)
Ideal input span, does not include gain or offset error.
LSB means least significant bit
This is endpoint INL, not best fit.
Measured relative to an ideal full-scale input [+IN – (–IN)] of 4.096 V
This specification does not include the internal reference voltage error and drift.
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
SPECIFICATIONS (Continued)
TA = –40°C to 85°C, +VA = 5 V, +VBD = 3 V or 5 V, Vref = 4.096 V, fSAMPLE = 1 MSPS (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DYNAMIC CHARACTERISTICS
ADS8481I
ADS8481IB
Total harmonic distortion (THD) (1)
ADS8481I
ADS8481IB
ADS8481I
ADS8481IB
ADS8481I
ADS8481IB
Signal to noise ratio (SNR) (1)
ADS8481I
ADS8481IB
ADS8481I
ADS8481IB
ADS8481I
ADS8481IB
Signal to noise + distortion (SINAD) (1)
ADS8481I
ADS8481IB
ADS8481I
ADS8481IB
ADS8481I
ADS8481IB
Spurious free dynamic range (SFDR) (1)
ADS8481I
ADS8481IB
ADS8481I
ADS8481IB
–110
VIN = 4 Vpp at 1 kHz
–112
–106
VIN = 4 Vpp at 10 kHz
dB
–108
–98
VIN = 4 Vpp at 100 kHz
–99
92
VIN = 4 Vpp at 1 kHz
94
91
VIN = 4 Vpp at 10 kHz
dB
93
90
VIN = 4 Vpp at 100 kHz
92
91
VIN = 4 Vpp at 1 kHz
93
90
VIN = 4 Vpp at 10 kHz
dB
92
89
VIN = 4 Vpp at 100 kHz
91
110
VIN = 4 Vpp at 1 kHz
112
108
VIN = 4 Vpp at 10 kHz
dB
107
98
VIN = 4 Vpp at 100 kHz
98
–3dB Small signal bandwidth
15
MHz
VOLTAGE REFERENCE INPUT
Reference voltage at REFIN, Vref
Reference
Reference current drain
(1)
(2)
4
3.0
resistance (2)
4.096
4.2
500
fs = 1 MHz
Calculated on the first nine harmonics of the input frequency.
Can vary ±20%
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V
kΩ
1
mA
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
SPECIFICATIONS (Continued)
TA = –40°C to 85°C, +VA = 5 V, +VBD = 3 V or 5 V, Vref = 4.096 V, fSAMPLE = 1 MSPS (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
120
ms
INTERNAL REFERENCE OUTPUT
Internal reference start-up time
From 95% (+VA), with 1-µF storage capacitor
Reference voltage range, Vref
IO = 0 A
Source current
Static load
Line regulation
+VA = 4.75 V to 5.25 V
60
µV
Drift
IO = 0 A
±6
PPM/C
4.081
4.096
4.111
V
10
µA
DIGITAL INPUT/OUTPUT
Logic family – CMOS
Logic level
VIH
IIH = 5 µA
+VBD–1
+VBD +0.3
VIL
IIL = 5 µA
–0.3
0.8
VOH
IOH = 2 TTL loads
VOL
IOL = 2 TTL loads
+VBD– 0.6
V
0.4
Data format – Straight Binary
POWER SUPPLY REQUIREMENTS
Power supply
voltage
+VBD
2.7
+VA
3.3
5.25
4.75
V
5
5.25
Supply current (1)
fs = 1 MHz
44
48
mA
V
Power dissipation (1)
fs = 1 MHz
220
240
mW
85
°C
TEMPERATURE RANGE
Operating free-air
(1)
–40
This includes only +VA current. +VBD current is typical 1 mA with 5 pF load capacitance on all output pins.
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
TIMING CHARACTERISTICS
All specifications typical at –40°C to 85°C, +VA =+VBD = 5 V
(1) (2) (3)
PARAMETER
MIN
TYP
UNIT
710
ns
Conversion time
t(ACQ)
Acquisition time
t(HOLD)
Sample capacitor hold time
25
ns
tpd1
CONVST low to BUSY high
40
ns
tpd2
Propagation delay time, end of conversion to BUSY low
15
ns
tpd3
Propagation delay time, start of convert state to rising edge of BUSY
15
ns
tw1
Pulse duration, CONVST low
40
ns
tsu1
Setup time, CS low to CONVST low
20
ns
tw2
Pulse duration, CONVST high
20
250
CONVST falling edge jitter
ns
ns
10
t(ACQ)min
ps
tw3
Pulse duration, BUSY signal low
tw4
Pulse duration, BUSY signal high
th1
Hold time, first data bus transition (RD low, or CS low for read cycle, or BYTE or
BUS18/16 input changes) after CONVST low
td1
Delay time, CS low to RD low
tsu2
Setup time, RD high to CS high
tw5
Pulse duration, RD low
ten
Enable time, RD low (or CS low for read cycle) to data valid
td2
Delay time, data hold from RD high
td3
Delay time, BUS18/16 or BYTE rising edge or falling edge to data valid
10
tw6
Pulse duration, RD high
20
ns
tw7
Pulse duration, CS high
20
ns
th2
Hold time, last RD (or CS for read cycle ) rising edge to CONVST falling edge
50
ns
tpd4
Propagation delay time, BUSY falling edge to next RD (or CS for read cycle) falling
edge
0
ns
td4
Delay time, BYTE edge to BUS18/16 edge skew
0
ns
tsu3
Setup time, BYTE or BUS18/16 transition to RD falling edge
10
ns
th3
Hold time, BYTE or BUS18/16 transition to RD falling edge
10
tdis
Disable time, RD high (CS high for read cycle) to 3-stated data bus
td5
Delay time, BUSY low to MSB data valid delay
td6
Delay time, CS rising edge to BUSY falling edge
50
ns
td7
Delay time, BUSY falling edge to CS rising edge
50
ns
tsu5
BYTE transition setup time, from BYTE transition to next BYTE transition, or BUS18/16
transition setup time, from BUS18/16 to next BUS18/16.
50
ns
(1)
(2)
(3)
ns
710
ns
0
ns
0
ns
ns
20
5
60
All input signals are specified with tr = tf = 5 ns (10% to 90% of +VBD) and timed from a voltage level of (VIL + VIH)/2.
See timing diagrams.
All timing are measured with 20-pF equivalent loads on all data bits and BUSY pins.
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ns
40
50
tsu(ABORT) Setup time from the falling edge of CONVST (used to start the valid conversion) to the
next falling edge of CONVST (when CS = 0 and CONVST are used to abort) or to the
next falling edge of CS (when CS is used to abort).
6
MAX
t(CONV)
ns
ns
20
ns
ns
20
ns
0
ns
610
ns
ADS8481
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
TIMING CHARACTERISTICS
All specifications typical at –40°C to 85°C, +VA = 5 V +VBD = 3 V
(1) (2) (3)
PARAMETER
MIN
TYP
MAX
UNIT
710
ns
t(CONV)
Conversion time
t(ACQ)
Acquisition time
t(HOLD)
Sample capacitor hold time
25
ns
tpd1
CONVST low to BUSY high
40
ns
tpd2
Propagation delay time, end of conversion to BUSY low
25
ns
tpd3
Propagation delay time, start of convert state to rising edge of BUSY
25
ns
tw1
Pulse duration, CONVST low
40
ns
tsu1
Setup time, CS low to CONVST low
20
ns
tw2
Pulse duration, CONVST high
20
250
CONVST falling edge jitter
ns
ns
10
t(ACQ)min
ps
tw3
Pulse duration, BUSY signal low
tw4
Pulse duration, BUSY signal high
th1
Hold time, first data bus transition (RD low, or CS low for read cycle, or BYTE or
BUS18/16 input changes) after CONVST low
td1
Delay time, CS low to RD low
tsu2
Setup time, RD high to CS high
tw5
Pulse duration, RD low
ten
Enable time, RD low (or CS low for read cycle) to data valid
td2
Delay time, data hold from RD high
td3
Delay time, BUS18/16 or BYTE rising edge or falling edge to data valid
10
tw6
Pulse duration, RD high
20
ns
tw7
Pulse duration, CS high
20
ns
th2
Hold time, last RD (or CS for read cycle ) rising edge to CONVST falling edge
50
ns
tpd4
Propagation delay time, BUSY falling edge to next RD (or CS for read cycle) falling
edge
0
ns
td4
Delay time, BYTE edge to BUS18/16 edge skew
0
ns
tsu3
Setup time, BYTE or BUS18/16 transition to RD falling edge
10
ns
th3
Hold time, BYTE or BUS18/16 transition to RD falling edge
10
tdis
Disable time, RD high (CS high for read cycle) to 3-stated data bus
td5
Delay time, BUSY low to MSB data valid delay
td6
Delay time, CS rising edge to BUSY falling edge
50
ns
td7
Delay time, BUSY falling edge to CS rising edge
50
ns
tsu5
BYTE transition setup time, from BYTE transition to next BYTE transition, or BUS18/16
transition setup time, from BUS18/16 to next BUS18/16.
50
ns
ns
40
ns
0
ns
0
ns
50
ns
30
5
tsu(ABORT) Setup time from the falling edge of CONVST (used to start the valid conversion) to the
next falling edge of CONVST (when CS = 0 and CONVST are used to abort) or to the
next falling edge of CS (when CS is used to abort).
(1)
(2)
(3)
ns
710
70
ns
ns
30
ns
ns
30
ns
0
ns
620
ns
All input signals are specified with tr = tf = 5 ns (10% to 90% of +VBD) and timed from a voltage level of (VIL + VIH)/2.
See timing diagrams.
All timing are measured with 20-pF equivalent loads on all data bits and BUSY pins.
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
PIN ASSIGNMENTS
BUSY
DB0
DB1
DB2
DB3
DB4
DB5
DB6
DB7
DB8
DB9
BDGND
RGZ PACKAGE
(TOP VIEW)
48 47 46 45 44 43 42 41 40 39 38 37
1
36
2
35
3
34
4
33
5
32
6
31
7
30
8
29
9
28
10
27
+VBD
DB10
DB11
DB12
DB13
DB14
DB15
DB16
DB17
AGND
AGND
+VA
AGND
AGND
−IN
AGND
+VA
+VA
+IN
AGND
NC
+VA
REFIN
11
26
12
25
13 14 15 16 17 18 19 20 21 22 23 24
REFOUT
+VBD
BUS18/16
BYTE
CONVST
RD
CS
+VA
AGND
AGND
+VA
REFM
REFM
NC − No internal connection
NOTE: The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.
8
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
PIN ASSIGNMENTS (continued)
TERMINAL FUNCTIONS
NAME
NO RGZ
I/O
AGND
8, 9, 17, 20,
23, 24, 26,
27
DESCRIPTION
–
Analog ground
BDGND
37
–
Digital ground for bus interface digital supply
BUSY
48
O
Status output. High when a conversion is in progress.
BUS18/16
2
I
Bus size select input. Used for selecting 18-bit or 16-bit wide bus transfer.
0: Data bits output on the 18-bit data bus pins DB[17:0].
1: Last two data bits D[1:0] from 18-bit wide bus output on:
a) the low byte pins DB[9:2] if BYTE = 0
b) the high byte pins DB[17:10] if BYTE = 1
BYTE
3
I
Byte select input. Used for 8-bit bus reading.
0: No fold back
1: Low byte D[9:2] of the 16 most significant bits is folded back to high byte of the 16 most significant pins DB[17:10].
CONVST
4
I
Convert start. The falling edge of this input ends the acquisition period and starts the hold period.
CS
6
I
Chip select. The falling edge of this input starts the acquisition period.
8-BIT BUS
Data Bus
16-BIT BUS
18-BIT BUS
BYTE = 0
BYTE = 1
BYTE = 1
BYTE = 0
BYTE = 0
BYTE = 0
BUS18/16 = 0
BUS18/16 = 0
BUS18/16 = 1
BUS18/16 = 0
BUS18/16 = 1
BUS18/16 = 0
DB17
28
O
D17 (MSB)
D9
All ones
D17 (MSB)
All ones
D17 (MSB)
DB16
29
O
D16
D8
All ones
D16
All ones
D16
DB15
30
O
D15
D7
All ones
D15
All ones
D15
DB14
31
O
D14
D6
All ones
D14
All ones
D14
DB13
32
O
D13
D5
All ones
D13
All ones
D13
DB12
33
O
D12
D4
All ones
D12
All ones
D12
DB11
34
O
D11
D3
D1
D11
All ones
D11
DB10
35
O
D10
D2
D0 (LSB)
D10
All ones
D10
DB9
38
O
D9
All ones
All ones
D9
All ones
D9
DB8
39
O
D8
All ones
All ones
D8
All ones
D8
DB7
40
O
D7
All ones
All ones
D7
All ones
D7
DB6
41
O
D6
All ones
All ones
D6
All ones
D6
DB5
42
O
D5
All ones
All ones
D5
All ones
D5
DB4
43
O
D4
All ones
All ones
D4
All ones
D4
DB3
44
O
D3
All ones
All ones
D3
D1
D3
DB2
45
O
D2
All ones
All ones
D2
D0 (LSB)
D2
DB1
46
O
D1
All ones
All ones
D1
All ones
D1
DB0
47
O
D0 (LSB)
All ones
All ones
D0 (LSB)
All ones
D0 (LSB)
–IN
19
I
Inverting input channel
+IN
18
I
Noninverting input channel
NC
15
REFIN
13
I
Reference input
REFOUT
14
O
Reference output. Add 1-µF capacitor between the REFOUT pin and REFM pin when internal reference is used.
11, 12
I
Reference ground
RD
5
I
Synchronization pulse for the parallel output. When CS is low, this serves as output enable and puts the previous
conversion results on the bus.
+VA
7, 10, 16,
21, 22, 25
–
Analog power supplies, 5-V DC
1, 36
–
Digital power supply for bus
REFM
+VBD
No connection
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
TYPICAL CHARACTERISTICS
INTERNAL REFERENCE VOLTAGE
vs
FREE-AIR TEMPERATURE
DC HISTOGRAM
(8192 Conversion Outputs)
Frequency
2000
4.098
4.0975
1683
1626
1003
785
4.0965
4.096
0
4
4.095
-40
131079
32
30
131065
131066
131067
131068
131069
131070
131071
131072
131073
131074
131075
131076
131077
131078
6
4.09717
4.09716
4.09715
4.09714
4.0955
0
4.09718
111
132
0
4.097
488
446
500
TA = 25°C
4.09719
1846
1500
1000
4.0972
+VA = 5 V,
+VBD = 5 V
Reference Voltage - V
+VA = 5 V,
+VBD = 5 V,
TA = 25°C,
fi = 1 MSPS,
Vref = 4.096 V,
Input = Midscale
Reference Voltage - V
2500
INTERNAL REFERENCE VOLTAGE
vs
SUPPLY VOLTAGE
-25 -10
5
20
35
50
65
4.09713
4.75
80
4.85
4.95
5.05
5.15
Supply Voltage - V
5.25
TA - Free-Air Temperature - °C
Output Code
Figure 1.
Figure 2.
Figure 3.
SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
SUPPLY CURRENT
vs
SUPPLY VOLTAGE
SUPPLY CURRENT
vs
SAMPLE RATE
44.2
43.6
43.4
44
TA = 25°C,
fi = 1 MSPS,
Vref = 4.096 V
43
43.8
43.6
43.4
43.2
42.5
42
41.5
41
40.5
40
43
43.2
39.5
42.8
43
-40 -25 -10
5
20 35 50 65
TA - Free-Air Temperature - °C
80
42.6
4.75
4.85
4.95
5.05
5.15
Supply Voltage - V
5.25
500
750
Sample Rate - KSPS
1000
Figure 5.
Figure 6.
DIFFERENTIAL NONLINEARITY
vs
FREE-AIR TEMPERATURE
INTEGRAL NONLINEARITY
vs
FREE-AIR TEMPERATURE
DIFFERENTIAL NONLINEARITY
vs
SUPPLY VOLTAGE
4
1.5
3
Max
1
2
Max
0.5
0
Min
1
0
-1
Max
+VA = 5 V,
+VBD = 5 V,
fi = 1 MSPS,
Vref = 4.096 V
DNL - LSBs
+VA = 5 V,
+VBD = 5 V,
fi = 1 MSPS,
Vref = 4.096 V
INL - LSBs
1
39
38.5
250
Figure 4.
1.5
DNL - LSBs
+VA = 5 V,
+VBD = 5 V,
TA = 25°C,
Vref = 4.096 V
43.5
Supply Current - mA
+VA = 5 V,
+VBD = 5 V,
fi = 1 MSPS,
Vref = 4.096 V
Supply Current - mA
Supply Current - mA
43.8
44
44.4
44
Min
0.5
0
+VA = 5 V,
+VBD = 5 V,
TA = 25°C
fi = 1 MSPS,
Vref = 4.096 V
Min
-2
-0.5
-0.5
-3
-1
-40 -25
-10 5
20 35 50 65
TA - Free-Air Temperature - °C
Figure 7.
10
80
-4
-40 -25 -10
5 20 35 50 65
TA - Free-Air Temperature - °C
Figure 8.
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-1
4.75
4.85
4.95
5.05
5.15
Supply Voltage - V
Figure 9.
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TYPICAL CHARACTERISTICS (continued)
INTEGRAL NONLINEARITY
vs
SUPPLY VOLTAGE
DIFFERENTIAL NONLINEARITY
vs
REFERENCE VOLTAGE
4
4
1.5
VDD = 5 V,
TA = 25°C
fi = 1 MSPS
3
1
Max
DNL - LSBs
0
-1
0.5
0
Min
-2
-1
-4
4.75
4.85
4.95
5.05
5.15
Min
-4
3.2
3
5.25
Supply Voltage - V
3.2
3.4
3.6
3.8
Reference Voltage - V
4
4.2
OFFSET ERROR
vs
FREE-AIR TEMPERATURE
OFFSET ERROR
vs
SUPPLY VOLTAGE
OFFSET ERROR
vs
REFERENCE VOLTAGE
-0.02
-0.02
-0.03
-0.03
-0.04
-0.05
-0.06
-0.07
+VA = 5 V,
+VBD = 5 V,
fi = 1 MSPS,
Vref = 4.096 V
-0.08
-0.09
-25 -10 5
20 35 50 65
TA - Free-Air Temperature - °C
-0.04
-0.05
-0.06
-0.03
-0.04
-0.05
-0.06
-0.07
-0.07
-0.08
-0.08
-0.09
-0.09
-0.1
4.75
80
0
VDD = 5 V,
-0.01 T = 25°C,
A
-0.02 fi = 1 MSPS
TA = 25°C,
fi = 1 MSPS,
Vref = 4.096 V
Offset Error - mV
0
-0.01
-0.1
4.85
4.95
5.05
5.15
3
5.25
3.2
Supply Voltage - V
3.4
3.6
3.8
Reference Voltage - V
4
Figure 13.
Figure 14.
Figure 15.
GAIN ERROR
vs
SUPPLY VOLTAGE
GAIN ERROR
vs
FREE-AIR TEMPERATURE
GAIN ERROR
vs
REFERENCE VOLTAGE
-0.01
-0.03
Gain Error - %FS
-0.04
-0.05
-0.06
-0.07
4.85
4.95
5.05
Supply Voltage - V
Figure 16.
5.15
5.25
-0.035
+VA = 5 V,
+VBD = 5 V,
fi = 1 MSPS,
Vref = 4.096 V
0.06
-0.04
-0.045
-0.05
0.04
0.02
0
-0.02
-0.055
-0.04
-0.06
-0.06
-0.065
-0.08
-0.07
-40
VDD = 5 V,
TA = 25°C,
fi = 1 MSPS
0.08
Gain Error - %FS
-0.025
4.2
0.1
-0.02
TA = 25°C,
fi = 1 MSPS,
Vref = 4.096
-0.03
-0.08
4.75
3
4.2
Figure 12.
0
-0.02
4
Figure 11.
-0.01
-0.1
-40
3.6
3.8
3.4
Reference Voltage - V
Figure 10.
Offset Error - mV
Offset Error - mV
0
-1
-3
-3
Gain Error - %FS
1
-2
Min
-0.5
Max
2
Max
+VA = 5 V,
+VBD = 5 V,
TA = 25°C
fi = 1 MSPS,
Vref = 4.096 V
1
VDD = 5 V,
TA = 25°C
fi = 1 MSPS
3
INL - LSBs
2
INL - LSBs
INTEGRAL NONLINEARITY
vs
REFERENCE VOLTAGE
-0.1
-25
-10 5
20 35 50 65
TA - Free-Air Temperature - °C
Figure 17.
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3
3.2
3.4
3.6
3.8
4
4.2
Reference Voltage - V
Figure 18.
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TYPICAL CHARACTERISTICS (continued)
OFFSET ERROR TEMPERATURE
DRIFT DISTRIBUTION (25 Samples)
12
+VA = 5 V,
+VBD = 5 V,
fi = 1 MSPS
Vref = 4.096 V
8
8
-110
+VA = 5 V,
+VBD = 5 V,
fi = 1 MSPS,
Vref = 4.096 V
10
THD - Total Harmonic Distortion - dB
10
10
Frequency
Frequency
8
6
5
4
4
4
3
7
6
4
3
2
2
2
1
0.02
0.06
0.10 0.14 0.18
Offset Drift - ppm/C
-112
+VA = 5 V,
+VBD = 5 V,
fs = 1 MSPS,
TA = 25°C,
fi = 2 kHz
-113
-114
-115
-116
2.5 2.7
1.30
2.9 3.1 3.3 3.5 3.7 3.9 4.1
Vref - Reference Voltage - V
Figure 20.
Figure 21.
SIGNAL-TO-NOISE RATIO
vs
REFERENCE VOLTAGE
SIGNAL-TO-NOISE + DISTORTION
vs
REFERENCE VOLTAGE
TOTAL HARMONIC DISTORTION
vs
FREE-AIR TEMPERATURE
90
89
88
2.7
93
92
+VA = 5 V,
+VBD = 5 V,
fs = 1 MSPS,
TA = 25°C,
fi = 2 kHz
91
90
89
88
87
2.5
2.9 3.1 3.3 3.5 3.7 3.9 4.1
Vref - Reference Voltage - V
-112
94
THD - Total Harmonic Distortion - dB
SINAD - Signal-to-Noise + Distortion - dB
91
2.7
-112.50
-113
-113.50
+VA = 5 V,
+VBD = 5 V,
fs = 1 MSPS,
Vref = 4.096 V,
fi = 2 kHz
-114
-114.50
-115
-115.50
-116
-40 -25
2.9 3.1 3.3 3.5 3.7 3.9 4.1
Vref - Reference Voltage - V
-10
5
20 35 50 65
TA - Free-Air Temperature - °C
80
Figure 22.
Figure 23.
Figure 24.
SPURIOUS FREE DYNAMIC RANGE
vs
FREE-AIR TEMPERATURE
SIGNAL-TO-NOISE RATIO
vs
FREE-AIR TEMPERATURE
SIGNAL-TO-NOISE + DISTORTION
vs
FREE-AIR TEMPERATURE
94.5
116
115.5
115
114.5
114
113.5
-40
+VA = 5 V,
+VBD = 5 V,
fs = 1 MSPS,
Vref = 4.096 V,
fi = 2 kHz
-25 -10 5
20 35 50 65
TA - Free-Air Temperature - °C
Figure 25.
94
93.5
SINAD - Signal-to-Noise + Distortion - dB
95
116.5
SNR - Signal-to-Noise Ratio - dB
SNR - Signal-to-Noise Ratio - dB
SFDR - Spurious Free Dynamic Range - dB
-0.16 0.21
0.59
0.97
Gain Error Drift - ppm/C
-111
Figure 19.
+VA = 5 V,
+VBD = 5 V,
fs = 1 MSPS,
TA = 25°C,
fi = 2 kHz
87
2.5
12
1
-0.54
0.22
94
92
2
0
0
93
TOTAL HARMONIC DISTORTION
vs
REFERENCE VOLTAGE
GAIN ERROR TEMPERATURE
DRIFT DISTRIBUTION (25 Samples)
+VA = 5 V,
+VBD = 5 V,
fs = 1 MSPS,
Vref = 4.096 V,
fi = 2 kHz
93
92.5
92
91.5
91
90.5
80
90
-40 -25
-10
5
20 35 50 65
TA - Free-Air Temperature - °C
Figure 26.
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95
94.5
94
93.5
+VA = 5 V,
+VBD = 5 V,
fs = 1 MSPS,
Vref = 4.096 V,
fi = 2 kHz
93
92.5
92
91.5
91
90.5
90
-40 -25
-10
5
20 35 50 65
TA - Free-Air Temperature - °C
Figure 27.
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TYPICAL CHARACTERISTICS (continued)
DNL
1.5
+VA = 5 V, +VBD = 5 V, TA = 25°C, fi = 1 MSPS, Vref = 4.096 V
DNL - LSBs
1
0.5
0
-0.5
-1
-1.5
0
65536
131072
Output Code
Figure 28.
196608
262144
196608
262144
INL
3.5
+VA = 5 V, +VBD = 5 V, TA = 25°C, fi = 1 MSPS, Vref = 4.096 V
INL - LSBs
2.5
1.5
0.5
0
-0.5
-1.5
-2.5
-3.5
0
65536
131072
Output Code
Figure 29.
FFT
0
+VA = 5 V, +VBD = 5 V,
TA = 25°C, fs = 1 MSPS,
Vref = 4.096 V, fi = 100 kHz,
32768 Points
-25
Amplitude - dB
-50
-75
-100
-125
-150
-175
-200
-225
0
100
200
300
f - Frequency - kHz
Figure 30.
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500
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TYPICAL CHARACTERISTICS (continued)
TIMING DIAGRAMS
tw2
tw1
CONVST
tpd1
tpd2
tw4
tw3
BUSY
tsu1
CS
tpd3
tw7
td7
td6
CONVERT†
t(CONV)
t(CONV)
t(HOLD)
SAMPLING†
(When CS Toggle)
t(ACQ)
tsu(ABORT)
tsu(ABORT)
BYTE
tsu5
th1
BUS 18/16
tsu5
tsu2
tpd4
th2
td1
RD
tdis
ten
DB[17:12]
Hi−Z
D[17:12]
Hi−Z
D[9:4]
MSB
DB[11:10]
DB[9:0]
†Signal
Hi−Z
Hi−Z
D[11:10]
D[3:2]
D[1:0]
D[9:0]
internal to device
Figure 31. Timing for Conversion and Acquisition Cycles With CS and RD Toggling
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TYPICAL CHARACTERISTICS (continued)
tw1
tw2
CONVST
tpd1
tpd2
tw4
tw3
BUSY
tsu1
tw7
td7
CS
tpd3
td6
CONVERT†
t(CONV)
t(CONV)
t(HOLD)
SAMPLING†
(When CS Toggle)
t(ACQ)
tsu(ABORT)
tsu(ABORT)
BYTE
tsu5
th1
BUS 18/16
tpd4
th2
RD = 0
ten
DB[17:12]
DB[11:10]
DB[9:0]
†Signal
ten
tdis
Previous
Hi−Z D[17:12]
Hi−Z
Hi−Z
Previous
D[11:10]
Previous
D [9:0]
Hi−Z
Hi−Z
Hi−Z
tdis
ten
MSB
D[17:12]
D[11:10]
D[9:0]
Hi−Z
D[9:4]
D[3:2]
D[1:0]
Hi−Z
Hi−Z
Repeated
D[17:12]
Repeated
D[11:10]
Repeated
D [9:0]
internal to device
Figure 32. Timing for Conversion and Acquisition Cycles With CS Toggling, RD Tied to BDGND
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TYPICAL CHARACTERISTICS (continued)
tw1
tw2
CONVST
tpd1
tpd2
tw4
tw3
BUSY
CS = 0
CONVERT†
t(CONV)
t(CONV)
t(HOLD)
t(ACQ)
SAMPLING†
(When CS = 0)
tsu(ABORT)
tsu(ABORT)
BYTE
tsu5
th1
BUS 18/16
tsu5
tpd4
th2
RD
tdis
ten
MSB
DB[17:12]
DB[11:10]
DB[9:0]
†Signal
Hi−Z
Hi−Z
Hi−Z
D[17:12]
D[9:4]
D[11:10]
D[3:2]
D[9:0]
Hi−Z
D[1:0]
Hi−Z
Hi−Z
internal to device
Figure 33. Timing for Conversion and Acquisition Cycles With CS Tied to BDGND, RD Toggling
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TYPICAL CHARACTERISTICS (continued)
tw2
tw1
CONVST
tpd1
tw4
tpd2
tw3
BUSY
CS = 0
CONVERT†
t(CONV)
t(CONV)
tpd3
tpd3
t(HOLD)
t(HOLD)
t(ACQ)
SAMPLING†
(When CS = 0)
tsu(ABORT)
tsu(ABORT)
BYTE
tsu5
tsu5
BUS 18/16
tsu5
tsu5
th1
th1
RD = 0
td5
DB[17:12]
DB[11:10]
DB[9:0]
†Signal
D[17:12]
Previous LSB
D[11:10]
D[9:4]
D[3:2]
D[9:0]
Next D[17:12]
D[1:0]
Next D[11:10]
Next D[9:0]
internal to device
Figure 34. Timing for Conversion and Acquisition Cycles With CS and RD Tied to BDGND - Auto Read
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TYPICAL CHARACTERISTICS (continued)
CS
RD
BYTE
tsu5
BUS 18/16
ten
ten
DB[17:0]
Hi−Z
tdis
Valid
Hi−Z
td3
tdis
td3
Valid
Valid
Figure 35. Detailed Timing for Read Cycles
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APPLICATION INFORMATION
MICROCONTROLLER INTERFACING
ADS8481 to 8-Bit Microcontroller Interface
Figure 36 shows a parallel interface between the ADS8481 and a typical microcontroller using the 8-bit data bus.
The BUSY signal is used as a falling-edge interrupt to the microcontroller.
Analog 5 V
0.1 µF
AGND
10 µF
Ext Ref Input
0.1 µF
Micro
Controller
−IN
Digital 3 V
Data Bus D[17:0]
CS
AD8481
BYTE
BUS18/16
CONVST
RD
DB[17:10]
0.1 µF
BDGND
BDGND
+VBD
Figure 36. ADS8481 Application Circuitry
Analog 5 V
0.1 µF
AGND
10 µF
0.1 µF
AGND
AGND
REFM
REFIN
REFOUT
1 µF
+VA
GPIO
GPIO
GPIO
GPIO
RD
AD[7:0]
+IN
+VA
REFIN
REFM
AGND
Analog Input
ADS8481
Figure 37. ADS8481 Using Internal Reference
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PRINCIPLES OF OPERATION
The ADS8481 is a high-speed successive approximation register (SAR) analog-to-digital converter (ADC). The
architecture is based on charge redistribution which inherently includes a sample/hold function. See Figure 36
for the application circuit for the ADS8481.
The conversion clock is generated internally. The conversion time of 710 ns is capable of sustaining a 1 MHz
throughput.
The analog input is provided to two input pins: +IN and –IN. When a conversion is initiated, the differential input
on these pins is sampled on the internal capacitor array. While a conversion is in progress, both inputs are
disconnected from any internal function.
REFERENCE
The ADS8481 can operate with an external reference with a range from 3.0 V to 4.2 V. The reference voltage on
the input pin #1 (REFIN) of the converter is internally buffered. A clean, low noise, well-decoupled reference
voltage on this pin is required to ensure good performance of the converter. A low noise band-gap reference like
the REF3240 can be used to drive this pin. A 0.1-µF decoupling capacitor is required between REFIN and
REFM pins (pin #13 and pin #12) of the converter. This capacitor should be placed as close as possible to the
pins of the device. Designers should strive to minimize the routing length of the traces that connect the terminals
of the capacitor to the pins of the converter. An RC network can also be used to filter the reference voltage. A
100-Ω series resistor and a 0.1-µF capacitor, which can also serve as the decoupling capacitor can be used to
filter the reference voltage.
REFM
0.1 mF
100 W
ADS8481
REFIN
REF3240
Figure 38. Reference Circuit
The ADS8481 also has limited low pass filtering capability built into the converter. The equivalent circuitry on the
REFIN input is as shown in Figure 39.
10 kW
REFIN
+
_
300 pF
REFM
To CDAC
830 pF
To CDAC
Figure 39. Reference Circuit
The REFM input of the ADS8481 should always be shorted to AGND.
A 4.096-V internal reference is included. When internal reference is used, pin 14 (REFOUT) is connected to pin
13 (REFIN) with a 0.1-µF decoupling capacitor and 1-nF storage capacitor between pin 14 (REFOUT) and pins
11 and 12 (REFM) (see Figure Figure 37). The internal reference of the converter is double buffered. If an
external reference is used, the second buffer provides isolation between the external reference and the CDAC.
This buffer is also used to recharge all of the capacitors of the CDAC during conversion. Pin 14 (REFOUT) can
be left unconnected (floating) if an external reference is used.
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PRINCIPLES OF OPERATION (continued)
ANALOG INPUT
When the converter enters the hold mode, the voltage difference between the +IN and –IN inputs is captured on
the internal capacitor array. The voltage on the -IN input is limited between –0.2 V and 0.2 V, allowing the input
to reject small signals which are common to both the +IN and –IN inputs. The +IN input has a range of –0.2 V to
Vref + 0.2 V. The input span [+IN – (–IN)] is limited to 0 V to Vref.
The input current on the analog inputs depends upon a number of factors: sample rate, input voltage, and
source impedance. Essentially, the current into the ADS8481 charges the internal capacitor array during the
sample period. After this capacitance has been fully charged, there is no further input current. The source of the
analog input voltage must be able to charge the input capacitance (65 pF) to an 18-bit settling level within the
acquisition time (250 ns) of the device. When the converter goes into the hold mode, the input impedance is
greater than 1 GΩ.
Care must be taken regarding the absolute analog input voltage. To maintain the linearity of the converter, the
+IN and –IN inputs and the span [+IN – (–IN)] must be within the limits specified. Outside of these ranges, the
converter's linearity may not meet specifications. To minimize noise, low bandwidth input signals with low-pass
filters are used.
Care must be taken to ensure that the output impedance of the sources driving the +IN and –IN inputs are
matched. If this is not observed, the two inputs could have different settling times. This may result in offset error,
gain error, and linearity error which varies with temperature and input voltage.
The analog input to the converter needs to be driven with a low noise, high-speed op-amp like the THS4031. An
RC filter is recommended at the input pins to low-pass filter the noise from the source. A series resistor of 20 Ω
and a decoupling capacitor of 680 pF is recommended. The input to the converter is a uni-polar input voltage in
the range 0 to Vref. The THS4031 can be used in the source follower configuration to drive the converter.
Low-Pass Filter
VIN
+
20 W
INP
THS4031
_
50 W
ADS8481
680 pF
INM
Figure 40. Input Circuit
In systems, where the input is bi-polar, the THS4031 can be used in the inverting configuration with an
additional DC bias applied to its + input so as to keep the input to the ADS8481 within its rated operating voltage
range. This configuration is also recommended when the ADS8481 is used in signal processing applications
where good SNR and THD performance is required. The DC bias can be derived from the REF3220 or the
REF3240 reference voltage ICs. The input configuration shown below is capable of delivering better than 92dB
SNR and -100db THD at an input frequency of 100 kHz. In case band-pass filters are used to filter the input,
care should be taken to ensure that the signal swing at the input of the band-pass filter is small so as to keep
the distortion introduced by the filter minimal. In such cases, the gain of the circuit shown below can be
increased to keep the input to the ADS8481 large to keep the SNR of the system high. Note that the gain of the
system from the + input to the output of the THS4031 in such a configuration is a function of the gain of the AC
signal. A resistor divider can be used to scale the output of the REF3220 or REF3240 to reduce the voltage at
the DC input to THS4031 to keep the voltage at the input of the converter within its rated operating range.
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PRINCIPLES OF OPERATION (continued)
Bipolar to Unipolar Conversion
Low-Pass Filter
380 W
VIN
Vdc
_
380 W
20 W
INP
THS4031
+
ADS8481
680 pF
INM
Figure 41. Input Circuit
DIGITAL INTERFACE
Timing and Control
See the timing diagrams in the specifications section for detailed information on timing signals and their
requirements.
The ADS8481 uses an internal oscillator generated clock which controls the conversion rate and in turn the
throughput of the converter. No external clock input is required.
Conversions are initiated by bringing the CONVST pin low for a minimum of 20 ns (after the 20 ns minimum
requirement has been met, the CONVST pin can be brought high), while CS is low. The ADS8481 switches from
the sample to the hold mode on the falling edge of the CONVST command. A clean and low jitter falling edge of
this signal is important to the performance of the converter. The BUSY output is brought high immediately
following CONVST going low. BUSY stays high throughout the conversion process and returns low when the
conversion has ended.
Sampling starts with the falling edge of the BUSY signal when CS is tied low or starts with the falling edge of CS
when BUSY is low.
Both RD and CS can be high during and before a conversion with one exception (CS must be low when
CONVST goes low to initiate a conversion). Both the RD and CS pins are brought low in order to enable the
parallel output bus with the conversion.
Reading Data
The ADS8481 outputs full parallel data in straight binary format as shown in Table 1. The parallel output is
active when CS and RD are both low. There is a minimal quiet zone requirement around the falling edge of
CONVST. This is 50 ns prior to the falling edge of CONVST and 40 ns after the falling edge. No data read
should attempted within this zone. Any other combination of CS and RD sets the parallel output to 3-state. BYTE
and BUS18/16 are used for multiword read operations. BYTE is used whenever lower bits on the bus are output
on the higher byte of the bus. BUS18/16 is used whenever the last two bits on the 18-bit bus is output on either
bytes of the higher 16-bit bus. Refer to Table 1 for ideal output codes.
22
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ADS8481
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
Table 1. Ideal Input Voltages and Output Codes
DESCRIPTION
ANALOG VALUE
Full scale range
+Vref
DIGITAL OUTPUT STRAIGHT BINARY
Least significant bit (LSB)
(+Vref)/262144
BINARY CODE
HEX CODE
+Full scale
(+Vref) – 1 LSB
11 1111 1111 1111 1111
3FFFF
(+Vref)/2
10 0000 0000 0000 0000
20000
(+Vref)/2 – 1 LSB
01 1111 1111 1111 1111
1FFFF
0V
00 0000 0000 0000 0000
00000
Midscale
Midscale – 1 LSB
Zero
The output data is a full 18-bit word (D17–D0) on DB17–DB0 pins (MSB–LSB) if both BUS18/16 and BYTE are
low.
The result may also be read on an 16-bit bus by using only pins DB17–DB2. In this case two reads are
necessary: the first as before, leaving both BUS18/16 and BYTE low and reading the 16 most significant bits
(D17–D2) on pins DB17–DB2, then bringing BUS18/16 high while holding BYTE low. When BUS18/16 is high,
the lower two bits (D1–D0) appear on pins DB3–DB2.
The result may also be read on an 8-bit bus for convenience. This is done by using only pins DB17–DB10. In
this case three reads are necessary: the first as before, leaving both BUS18/16 and BYTE low and reading the 8
most significant bits on pins DB17–DB10, then bringing BYTE high while holding BUS18/16 low. When BYTE is
high, the medium bits (D9–D2) appear on pins DB17–DB10. The last read is done by bringing BUS18/16 high
while holding BYTE high. When BUS18/16 is high, the lower two bits (D1–D0) appear on pins DB11–DB10. The
last read cycle is not necessary if only the first 16 most significant bits are of interest.
All of these multiword read operations can be performed with multiple active RD (toggling) or with RD held low
for simplicity. This is referred to as the AUTO READ operation.
Table 2. Conversion Data Read Out
DATA READ OUT
BYTE
BUS18/16
PINS
DB17–DB12
High
High
Low
High
High
Low
Low
Low
PINS
DB11–DB10
PINS
DB9–DB4
PINS
DB3–DB2
PINS
DB1–DB0
All One's
D1–D0
All One's
All One's
All One's
All One's
All One's
All One's
D1–D0
All One's
D9–D4
D3–D2
All One's
All One's
All One's
D17–D12
D11–D10
D9–D4
D3–D2
D1–D0
RESET
On power-up, internal POWER-ON RESET circuitry generates the reset required for the device. The first three
conversions after power-up are used to load factory trimming data for a specific device to assure high accuracy
of the converter. The results of the first three conversions are invalid and should be discarded.
The device can also be reset through the use of the combination fo CS and CONVST. Since the BUSY signal is
held at high during the conversion, either one of these conditions triggers an internal self-clear reset to the
converter.
• Issue a CONVST when CS is low and the internal convert state is high. The falling edge of CONVST starts
a reset.
• Issue a CS (select the device) while the internal convert state is high. The falling edge of CS causes a reset.
Once the device is reset, all output latches are cleared (set to zeroes) and the BUSY signal is brought low. A
new sampling period is started at the falling edge of the BUSY signal immediately after the instant of the internal
reset.
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23
ADS8481
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SLAS385A – FEBRUARY 2006 – REVISED MARCH 2006
LAYOUT
For optimum performance, care must be taken with the physical layout of the ADS8481 circuitry.
As the ADS8481 offers single-supply operation, it is often used in close proximity with digital logic,
microcontrollers, microprocessors, and digital signal processors. The more digital logic present in the design and
the higher the switching speed, the more difficult it is to achieve good performance from the converter.
The basic SAR architecture is sensitive to glitches or sudden changes on the power supply, reference, ground
connections and digital inputs that occur just prior to latching the output of the analog comparator. Thus, driving
any single conversion for an n-bit SAR converter, there are at least n windows in which large external transient
voltages can affect the conversion result. Such glitches might originate from switching power supplies, nearby
digital logic, or high power devices.
The degree of error in the digital output depends on the reference voltage, layout, and the exact timing of the
external event.
On average, the ADS8481 draws very little current from an external reference as the reference voltage is
internally buffered. If the reference voltage is external and originates from an op amp, make sure that it can drive
the bypass capacitor or capacitors without oscillation. A 0.1-µF capacitor is recommended from pin 13 (REFIN)
directly to pin 12 (REFM). REFM and AGND must be shorted on the same ground plane under the device.
The AGND and BDGND pins should be connected to a clean ground point. In all cases, this should be the
analog ground. Avoid connections which are too close to the grounding point of a microcontroller or digital signal
processor. If required, run a ground trace directly from the converter to the power supply entry point. The ideal
layout consists of an analog ground plane dedicated to the converter and associated analog circuitry.
As with the AGND connections, +VA should be connected to a 5-V power supply plane or trace that is separate
from the connection for digital logic until they are connected at the power entry point. Power to the ADS8481
should be clean and well bypassed. A 0.1-µF ceramic bypass capacitor should be placed as close to the device
as possible. See Table 3 for the placement of the capacitor. In addition, a 1-µF to 10-µF capacitor is
recommended. In some situations, additional bypassing may be required, such as a 100-µF electrolytic capacitor
or even a Pi filter made up of inductors and capacitors—all designed to essentially low-pass filter the 5-V supply,
removing the high frequency noise.
Table 3. Power Supply Decoupling Capacitor Placement
POWER SUPPLY PLANE
CONVERTER
DIGITAL SIDE
CONVERTER ANALOG SIDE
SUPPLY PINS
Pin pairs that require shortest path to decoupling capacitors
(7,8), (9,10), (16,17), (20,21), (22,23), (25,26)
36, 37
Pins that require no decoupling
24, 26
1
24
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PACKAGE OPTION ADDENDUM
www.ti.com
18-Jul-2006
PACKAGING INFORMATION
Orderable Device
Status (1)
Package
Type
Package
Drawing
Pins Package Eco Plan (2)
Qty
ADS8481IBPFBR
PREVIEW
TQFP
PFB
48
1000
TBD
Call TI
Call TI
ADS8481IBPFBT
PREVIEW
TQFP
PFB
48
250
TBD
Call TI
Call TI
ADS8481IBRGZR
ACTIVE
QFN
RGZ
48
1000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
ADS8481IBRGZRG4
ACTIVE
QFN
RGZ
48
1000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
ADS8481IBRGZT
ACTIVE
QFN
RGZ
48
250
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
ADS8481IBRGZTG4
ACTIVE
QFN
RGZ
48
250
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
ADS8481IPFBR
PREVIEW
TQFP
PFB
48
1000
TBD
Call TI
Call TI
ADS8481IPFBT
PREVIEW
TQFP
PFB
48
250
TBD
Call TI
Call TI
ADS8481IRGZR
ACTIVE
QFN
RGZ
48
1000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
ADS8481IRGZRG4
ACTIVE
QFN
RGZ
48
1000 Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
ADS8481IRGZT
ACTIVE
QFN
RGZ
48
250
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
ADS8481IRGZTG4
ACTIVE
QFN
RGZ
48
250
Green (RoHS &
no Sb/Br)
CU NIPDAU
Level-2-260C-1 YEAR
ADS8481PFBR
PREVIEW
TQFP
PFB
48
250
TBD
Call TI
Call TI
ADS8481RGZR
PREVIEW
QFN
RGZ
48
250
TBD
Call TI
Call TI
Lead/Ball Finish
MSL Peak Temp (3)
(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
18-Jul-2006
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
Addendum-Page 2
MECHANICAL DATA
MTQF019A – JANUARY 1995 – REVISED JANUARY 1998
PFB (S-PQFP-G48)
PLASTIC QUAD FLATPACK
0,27
0,17
0,50
36
0,08 M
25
37
24
48
13
0,13 NOM
1
12
5,50 TYP
7,20
SQ
6,80
9,20
SQ
8,80
Gage Plane
0,25
0,05 MIN
0°– 7°
1,05
0,95
Seating Plane
0,75
0,45
0,08
1,20 MAX
4073176 / B 10/96
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-026
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