DATA SHEET IL3480-XX 100mA, Quasi Low-Dropout Voltage Regulator FEATURES: u 3.3, 5V versions available u 30V maximum input for operation u 1.2V guaranteed maximum dropout over full load and temperature ranges u 100 mA guaranteed minimum load current APPLICATION: u Tiny alternative to 78LXX series and similar devices u Low-Dropout Voltage Regulator u Post regulator for switching DC/DC converter u Bias supply for analog circuits 3 2 Chip size:1.1x 0.95 2 mm Y 1 TR TYPICAL APPLICATION CIRCUIT X PAD LOCATION Pad No. 1 2 3 Pad Name GND Output Input X Y 92 899 92 107 747 747 Note: •Co-ordinates (bottom left co-ordinates comer), µm 2 •Padsize: 96x96 µm PHISICAL CHARACTERISTICS ABSOLUTE MAXIMUM RATINGS Wafer Diameter...... 100 ± 0.5 mm; Wafer thickness .…. 280 ± 20µm; Scribe width ............80 µm; Metallization: Top... Al Bottom... without metallization Input Voltage Junction Temperature 35V +150°C ELECTRICAL CHARACTERISTICS IL3480-3.3, IL3480-5.0 Typicals and limits appearing in normal type apply for TA = TJ = 25°C. Limits appearing in boldface type apply over the entire junction temperature range for operation, -10 to +70°C. (Notes 1, 2) Nominal Output Voltage (VNOM) 3.3V 5.0V Units Parameter Output Voltage Line Regulation Load Regulation Symbol Conditions Min Typ Max Min Vout Vin=Vnom+1.5V; 1mА≤Iout≤100mА 3.17 3.14 3.3 3.43 3.46 4.8 4.75 ∆Vout Vnom+1.5V ≤Vin≤30V; Iout =1mA ∆Vout Ground Pin Current IGND Ground Pin Current Change ∆IGND Dropout Voltage VinVout Vin=Vnom+1.5V; 1mА≤Iout≤100mА Vin=30V No Load Vnom+1.5V ≤Vin≤20V, Iout =40mA; Vin=Vnom+5V, 1mА≤Iout≤40mА Iout =10mA; Iout =100mA 3 Typ 5.0 Max 5.2 5.25 25 25 50 50 4 3 4 V mV mV mA 1.4 1.4 mА 0.5 0.9 1.0 1.1 1.2 0.5 0.9 1.0 1.1 1.2 mА V Note 1: A typical is the center of characterization data taken with TA = TJ = 25°C. Typicals are not guaranteed. Note 2: All limits are guaranteed. All electrical characteristics having room-temperature limits are tested during production with TA = TJ = 25°C. All hot and cold limits are guaranteed by correlating the electrical characteristics to process and temperature variations and applying statistical process control.