EUDYNA FLC097WF

FLC097WF
C-Band Power GaAs FET
FEATURES
•
•
•
•
•
High Output Power: P1dB = 28.8dBm (Typ.)
High Gain: G1dB = 8.5dB(Typ.)
High PAE: ηadd = 35%(Typ.)
Proven Reliability
Hermetic Metal/Ceramic Package
DESCRIPTION
The FLC097WF is a power GaAs FET that is designed for general
purpose applications in the C-Band frequency range as it provides
superior power, gain, and efficiency.
Fujitsu’s stringent Quality Assurance Program assures the highest
reliability and consistent performance.
ABSOLUTE MAXIMUM RATING (Ambient Temperature Ta=25°C)
Item
Condition
Symbol
Rating
Unit
Drain-Source Voltage
VDS
+15
V
Gate-Source Voltage
VGS
-5
V
4.16
W
Total Power Dissipation
Tc = 25°C
PT
Storage Temperature
Tstg
-65 to +175
°C
Channel Temperature
Tch
175
°C
Fujitsu recommends the following conditions for the reliable operation of GaAs FETs:
1. The drain-source operating voltage (VDS) should not exceed +10 volts.
2. The forward and reverse gate currents should not exceed 4.8 and -0.5 mA respectively with
gate resistance of 400Ω.
3. The operating channel temperature (Tch) should not exceed 145°C.
ELECTRICAL CHARACTERISTICS (Ambient Temperature Ta=25°C)
Item
Saturated Drain Current
Symbol
IDSS
Test Conditions
300
450
mA
-
150
-
mS
-1.0
-2.0
-3.5
V
-5
-
-
V
27.5
28.8
-
dBm
7.5
8.5
-
dB
-
35
-
%
-
25
36
°C/W
VDS = 5V, IDS = 200mA
Pinch-off Voltage
Vp
VDS = 5V, IDS =15mA
Output Power at 1dB G.C.P.
P1dB
Power Gain at 1dB G.C.P.
G1dB
Power-added Efficiency
ηadd
Thermal Resistance
Rth
IGS = -15µA
VDS = 10V,
IDS = 0.6 IDSS (Typ.),
f = 6 GHz
Channel to Case
CASE STYLE: WF
Edition 1.1
July 1999
Unit
-
gm
VGSO
Limit
Typ. Max.
VDS = 5V, VGS = 0V
Transconductance
Gate Source Breakdown Voltage
Min.
G.C.P.: Gain Compression Point
1
FLC097WF
C-Band Power GaAs FET
DRAIN CURRENT
vs. DRAIN-SOURCE VOLTAGE
POWER DERATING CURVE
Drain Current (mA)
Total Power Dissipation (W)
5
4
3
2
1
VGS =0V
300
-0.5V
200
-1.0V
100
-1.5V
-2.0V
0
0
50 100 150 200
2
4
6
8
10
Drain-Source Voltage (V)
Case Temperature (°C)
VDS=10V
f1 = 6.0 GHz
f2 = 6.01GHz
2-tone Test
24
22
20
-10
-20
Pout
18
-30
IM3
16
-40
14
IM3 (dBc)
Output Power (S.C.L.) (dBm)
OUTPUT POWER
& IM3 vs. INPUT POWER
-50
6
8
10 12 14
Input Power (S.C.L.) (dBm)
S.C.L.: Single Carrier Level
P1dB & ηadd vs. VDS
OUTPUT POWER vs. INPUT POWER
4 GHz
f=6GHz
IDS ≈ 0.6 IDSS
29
6 GHz
24
22
20
50
40
4 GHz
ηadd
6 GHz
30
18
20
16
10
28
40
ηadd
30
27
8
10 12 14 16 18 20
50
P1dB
9
10
Drain-Source Voltage (V)
Input Power (dBm)
2
ηadd (%)
Pout
P1dB (dBm)
26
ηadd (%)
Output Power (dBm)
VDS=10V
28 IDS ≈ 0.6 IDSS
FLC097WF
C-Band Power GaAs FET
S11
S22
+j50
8
7
+j100
9
10
6
11
12
5
+j10
0
+j250
12
11
4
SCALE FOR |S12|
+j25
10
10
3
2GHz
.08
.06
3
.04
4
.02
5
9
25
50Ω
8
100
180°
250
4
3
2
1
SCALE FOR |S21|
7
6
-j10
S21
S12
+90°
6
12
11 10 9 8
5 4
3
2GHz
0°
5
7
7
-j250
2GHz
2GHz
3
9
10
11
-j25
12
-j100
-j50
-90°
FREQUENCY
(MHZ)
MAG
ANG
S-PARAMETERS
VDS = 10V, IDS = 180mA
S21
S12
MAG
ANG
MAG
ANG
500
.950
-61.4
10.087
140.8
.022
55.5
.399
-31.1
2000
.857
-151.4
4.537
76.8
.038
7.0
.344
-83.9
3000
.841
-176.1
3.114
52.9
.039
-6.0
.392
-102.2
4000
.832
166.3
2.398
33.0
.039
-13.1
.445
-115.6
5000
.825
148.7
1.978
13.6
.040
-19.6
.480
-127.7
6000
.820
129.8
1.681
-6.3
.042
-26.4
.506
-142.2
7000
.817
112.1
1.418
-25.9
.043
-34.9
.534
-158.6
8000
.807
97.6
1.212
-43.2
.045
-36.2
.571
-172.0
9000
.804
83.6
1.080
-59.4
.050
-40.8
.603
176.6
10000
.799
67.2
1.011
-76.6
.059
-45.9
.620
165.2
11000
.794
47.0
.954
-96.5
.071
-55.4
.629
149.3
12000
.784
26.9
.864
-117.0
.082
-66.9
.649
130.8
S11
S22
MAG
ANG
Download S-Parameters, click here
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FLC097WF
C-Band Power GaAs FET
Ø1.6±0.01
(0.063)
1.0 Min.
(0.039)
Case Style "WF"
Metal-Ceramic Hermetic Package
2.5
(0.098)
2
2.5±0.15
(0.098)
1
3
0.1±0.05
(0.004)
1.0 Min.
(0.039)
0.6
(0.024)
0.8±0.1
(0.031)
2.5 Max.
(0.098)
8.5±0.2
(0.335)
6.1±0.1
(0.240)
1.
2.
3.
4.
Gate
Source (Flange)
Drain
Source (Flange)
Unit: mm(inches)
For further information please contact:
FUJITSU COMPOUND SEMICONDUCTOR, INC.
2355 Zanker Rd.
San Jose, CA 95131-1138, U.S.A.
Phone: (408) 232-9500
FAX: (408) 428-9111
www.fcsi.fujitsu.com
FUJITSU MICROELECTRONICS, LTD.
Compound Semiconductor Division
Network House
Norreys Drive
Maidenhead, Berkshire SL6 4FJ
Phone:+44 (0)1628 504800
FAX:+44 (0)1628 504888
CAUTION
Fujitsu Compound Semiconductor Products contain gallium arsenide
(GaAs) which can be hazardous to the human body and the environment.
For safety, observe the following procedures:
• Do not put these products into the mouth.
• Do not alter the form of this product into a gas, powder, or liquid
through burning, crushing, or chemical processing as these by-products
are dangerous to the human body if inhaled, ingested, or swallowed.
• Observe government laws and company regulations when discarding this
product. This product must be discarded in accordance with methods
specified by applicable hazardous waste procedures.
Fujitsu Limited reserves the right to change products and specifications without notice.
The information does not convey any license under rights of Fujitsu Limited or others.
© 1998 FUJITSU COMPOUND SEMICONDUCTOR, INC.
Printed in U.S.A. FCSI0598M200
4