AGILENT HCPL0708

Agilent HCPL-0708
High Speed
CMOS Optocoupler
Data Sheet
Description
Available in SO-8 package, the
HCPL-0708 optocoupler utilizes the
latest CMOS IC technology to
achieve outstanding performance
with very low power consumption.
Basic building blocks of the HCPL-
0708 are a high speed LED and a
CMOS detector IC. The detector
incorporates an integrated
photodiode, a high-speed transimpedance amplifier, and a voltage
comparator with an output driver.
Functional Diagram
NC
1
8
VDD
ANODE
2
7
NC
CATHODE
3
6
VO
NC
4
5
GND
TRUTH TABLE
LED
VO, OUTPUT
OFF
ON
H
L
*A 0.1 µF bypass capacitor
must be connected between
pins 5 and 8.
Features
• +5 V CMOS compatibility
• 15 ns typical pulse width distortion
• 30 ns max. pulse width distortion
• 40 ns max. propagation delay
skew
• High speed: 15 MBd
• 60 ns max. propagation delay
• 10 kV/µs minimum common mode
rejection
• –40 to 100°C temperature range
• Safety and regulatory approvals
pending
– UL recognized
2500 V rms for 1 min. per
UL 1577 for HCPL-0708
– CSA component acceptance
Notice #5
– VDE 0884 (TUV) approved for
HCPL-0708 Option 060
Applications
• Scan drive in PDP
• Digital field bus isolation:
DeviceNet, SDS, Profibus
• Multiplexed data transmission
• Computer peripheral interface
• Microprocessor system interface
• DC/DC converter
CAUTION: It is advised that normal static precautions be taken in handling and assembly of this
component to prevent damage and/or degradation which may be induced by ESD.
Ordering Information
Specify Part Number followed by Option Number (if desired)
Example
HCPL-0708#XXX
060 = VDE0884 Option.
500 = Tape and Reel Packaging Option.
Package Outline Drawing
HCPL-0708 (Small Outline SO-8 Package)
8
7
6
5
5.842 ± 0.203
(0.236 ± 0.008)
XXX
YWW
3.937 ± 0.127
(0.155 ± 0.005)
TYPE NUMBER (LAST 3 DIGITS)
PIN 1
ONE
2
3
0.381 ± 0.076
(0.016 ± 0.003)
DATE CODE
4
1.270 BSG
(0.050)
5.080 ± 0.005
(0.200 ± 0.005)
3.175 ± 0.127
(0.125 ± 0.005)
7°
45° X 0.432
(0.017)
0.228 ± 0.025
(0.009 ± 0.001)
1.524
(0.060)
0.152 ± 0.051
(0.006 ± 0.002)
0.305
MIN.
(0.012)
DIMENSIONS IN MILLIMETERS AND (INCHES).
LEAD COPLANARITY = 0.10 mm (0.004 INCHES).
*OPTION 500 NOT MARKED.
2
Solder Reflow Thermal Profile
300
TEMPERATURE (°C)
PREHEATING RATE 3°C + 1°C/–0.5°C/SEC.
REFLOW HEATING RATE 2.5°C ± 0.5°C/SEC.
PEAK
TEMP.
245°C
PEAK
TEMP.
240°C
PEAK
TEMP.
230°C
200
2.5°C ± 0.5°C/SEC.
30
SEC.
160°C
150°C
140°C
SOLDERING
TIME
200°C
30
SEC.
3°C + 1°C/–0.5°C
100
PREHEATING TIME
150°C, 90 + 30 SEC.
50 SEC.
TIGHT
TYPICAL
LOOSE
ROOM
TEMPERATURE
0
0
50
100
150
200
250
TIME (SECONDS)
Regulatory Information
The HCPL-0708 has been
approved by the following
organizations:
CSA
Approved under CSA Component
Acceptance Notice #5, File
CA88324.
UL
Recognized under UL 1577,
component recognition program,
File E55361.
VDE
Approved according to
VDE 0884/06.92,
File 6591-23-4880-1005.
Insulation and Safety Related Specifications
Parameter
Symbol
Minimum External Air
L(I01)
Gap (Clearance)
Minimum External
L(I02)
Tracking (Creepage)
Minimum Internal Plastic
Gap (Internal Clearance)
Tracking Resistance
(Comparative Tracking Index)
CTI
Isolation Group
All Agilent data sheets report the
creepage and clearance inherent
to the optocoupler component
itself. These dimensions are
needed as a starting point for the
equipment designer when
determining the circuit insulation
requirements. However, once
mounted on a printed circuit
3
Value
4.9
Units
mm
4.8
mm
0.08
mm
≥175
Volts
IIIa
TUV
Approved according to
VDE 0884/06.92, Certificate
R9650938.
Conditions
Measured from input terminals to output
terminals, shortest distance through air.
Measured from input terminals to output
terminals, shortest distance path along body.
Insulation thickness between emitter and
detector; also known as distance through
insulation.
DIN IEC 112/VDE 0303 Part 1
Material Group (DIN VDE 0110, 1/89, Table 1)
board, minimum creepage and
clearance requirements must be
met as specified for individual
equipment standards. For
creepage, the shortest distance
path along the surface of a
printed circuit board between the
solder fillets of the input and
output leads must be considered.
There are recommended
techniques such as grooves and
ribs which may be used on a
printed circuit board to achieve
desired creepage and clearances.
Creepage and clearance distances
will also change depending on
factors such as pollution degree
and insulation level.
VDE 0884 Insulation Related Characteristics (Option 060)
Description
Installation classification per DIN VDE 0110/1.89, Table 1
for rated mains voltage ≤150 V rms
for rated mains voltage ≤300 V rms
for rated mains voltage ≤450 V rms
Climatic Classification
Pollution Degree (DIN VDE 0110/1.89)
Maximum Working Insulation Voltage
Input to Output Test Voltage, Method b†
VIORM x 1.875 = VPR, 100% Production
Test with tm = 1 sec, Partial Discharge < 5 pC
Input to Output Test Voltage, Method a†
VIORM x 1.5 = VPR, Type and Sample Test,
tm = 60 sec, Partial Discharge < 5 pC
Highest Allowable Overvoltage†
(Transient Overvoltage, tini = 10 sec)
Safety Limiting Values
(Maximum values allowed in the event of a failure,
also see Thermal Derating curve, Figure 11.)
Case Temperature
Input Current
Output Power
Insulation Resistance at TS, V10 = 500 V
Symbol
HCPL-0708 Option 060
Units
I-IV
I-III
VIORM
VPR
55/85/21
2
560
1050
V peak
V peak
VPR
840
V peak
VIOTM
4000
V peak
TS
IS,INPUT
PS,OUTPUT
RIO
150
150
600
≥109
°C
mA
mW
Ω
†Refer to the front of the optocoupler section of the Isolation and Control Component Designer’s Catalog, under Product Safety Regulations section
(VDE 0884), for a detailed description.
Note: These optocouplers are suitable for “safe electrical isolation” only within the safety limit data. Maintenance of the safety data shall be
ensured by means of protective circuits.
Note: The surface mount classification is Class A in accordance with CECC 00802.
Absolute Maximum Ratings
Parameter
Storage Temperature
Ambient Operating Temperature[1]
Supply Voltages
Output Voltage
Average Output Current
Average Forward Input Current
Lead Solder Temperature
Solder Reflow Temperature Profile
Recommended Operating Conditions
Parameter
Ambient Operating Temperature
Supply Voltages
Input Current (ON)
4
Symbol
TS
TA
VDD
VO
IO
IF
Symbol
TA
VDD
IF
Min.
–55
–40
0
–0.5
Max.
Units
125
°C
+100
°C
6
Volts
VDD2 +0.5
Volts
2
mA
20
mA
260°C for 10 sec., 1.6 mm below seating plane
See Solder Reflow Temperature Profile Section
Min.
–40
4.5
10
Max.
+100
5.5
16
Units
°C
V
mA
Figure
Figure
1, 2
Electrical Specifications
Over recommended temperature (T A = –40°C to +100°C) and 4.5 V ≤ VDD ≤ 5.5 V.
All typical specifications are at TA = 25°C, VDD = +5 V.
Parameter
Input Forward Voltage
Input Reverse
Breakdown Voltage
Logic High Output
Voltage
Logic Low Output
Voltage
Input Threshold Current
Logic Low Output
Supply Current
Logic High Output
Supply Current
Symbol
VF
BVR
Min.
1.3
5
Typ.
1.5
VOH
4.0
4.8
Max.
1.8
Units
V
V
Test Conditions
IF = 12 mA
IR = 10 µA
V
IF = 0, IO = –20 µA
Fig.
1
0.01
0.1
V
IF = 12 mA, IO = 20 µA
ITH
IDDL
6.0
8.2
14.0
mA
mA
IOL = 20 µA
IF = 12 mA
2
4
IDDH
4.5
11.0
mA
IF = 0
3
VOL
Notes
Switching Specifications
Over recommended temperature (TA = –40°C to +100°C) and 4.5 V ≤ VDD ≤ 5.5 V.
All typical specifications are at TA = 25°C, VDD = +5 V.
Parameter
Propagation Delay Time
to Logic Low Output
Propagation Delay Time
to Logic High Output
Pulse Width
5
Symbol
tPHL
Min.
20
Typ.
35
Max.
60
Units
ns
tPLH
13
21
60
ns
Pulse Width Distortion
PW
|PWD|
100
0
30
ns
ns
Propagation Delay Skew
tPSK
40
ns
Output Rise Time
(10 - 90%)
Output Fall Time
(90 - 10%)
Common Mode
Transient Immunity at
Logic High Output
Common Mode
Transient Immunity at
Logic Low Output
tR
20
ns
tF
25
ns
14
|CMH|
10
15
kV/µs
|CML |
10
15
kV/µs
Test Conditions
IF = 12 mA, CL = 15 pF
CMOS Signal Levels
IF = 12 mA, CL = 15 pF
CMOS Signal Levels
Fig.
5
Notes
1
5
1
IF = 12 mA, CL = 15 pF
CMOS Signal Levels
IF = 12 mA, CL = 15 pF
CMOS Signal Levels
IF = 12 mA, CL = 15 pF
CMOS Signal Levels
IF = 12 mA, CL = 15 pF
CMOS Signal Levels
VCM = 1000 V, TA = 25°C,
IF = 0 mA
2
2
3
3
4
4
VCM = 1000 V, TA = 25°C,
IF = 12 mA
5
5
Package Characteristics
All Typicals at TA = 25°C.
Parameter
Input-Output Insulation
Symbol
II-O
Min.
Input-Output Momentary
Withstand Voltage
Input-Output Resistance
Input-Output Capacitance
VISO
2500
RI-O
CI-O
Typ.
Max.
1
Units
µA
Vrms
1012
0.6
Ω
pF
Test Conditions
45% RH, t = 5 s
VI-O = 3 kV dc,
TA = 25°C
RH ≤ 50%, t = 1 min.,
TA = 25°C
VI-O = 500 V dc
f = 1 MHz, TA = 25°C
Notes:
1. tPHL propagation delay is measured from the 50% level on the risiing edge of the input pulse to the 2.5 V level of the falling edge
of the VO signal. t PLH propagation delay is measured from the 50% level on the falling edge of the input pulse to the 2.5 V level of
the rising edge of the VO signal.
2. PWD is defined as |tPHL - tPLH|.
3. tPSK is equal to the magnitude of the worst case difference in tPHL and/or tPLH that will be seen between units at any given
temperature within the recommended operating conditions.
4. CM H is the maximum tolerable rate of rise of the common mode voltage to assure that the output will remain in a high logic state.
5. CM L is the maximum tolerable rate of fall of the common mode voltage to assure that the output will remain in a low logic state.
6
IF
TA = 25°C
+
VF
–
10
1.0
0.1
0.01
0.001
1.1
1.2
1.3
1.5
1.4
1.6
8
VDD = 5.0 V
IOL = 20 µA
7
6
5
4
3
2
tp – PROPAGATION DELAY – ns
Iddl – LOGIC LOW OUTPUT SUPPLY CURRENT – mA
100
50
VDD = 5.0 V
7.0
6.5
6.0
5.5
5.0
4.5
4.0
85
Figure 2. Typical input threshold current vs.
temperature.
8.0
7.5
25
TA – TEMPERATURE – °C
VF – FORWARD VOLTAGE – V
Figure 1. Typical input diode forward
characteristic.
0
-40
-40
0
25
85
100
VDD = 5.0 V
TA = 25 °C
45
40
Tphl
35
30
25
Tplh
20
15
PWD
10
5
0
5
6
7
8
9 10 11 12 13 14
TA – TEMPERATURE – °C
IF – PULSE INPUT CURRENT – mA
Figure 4. Typical logic low O/P supply
current vs. temperature.
Figure 5. Typical switching speed vs. pulse
input current.
7
Iddh – LOGIC HIGH OUTPUT SUPPLY CURRENT – mA
100
Ith – INPUT THRESHOLD CURRENT – mA
IF – FORWARD CURRENT – mA
1000
6.0
5.5
VDD = 5.0 V
5.0
4.5
4.0
3.5
3.0
2.5
2.0
-40
0
25
85
TA – TEMPERATURE – °C
Figure 3. Typical logic high O/P supply
current vs. temperature.
100
Application Information
Bypassing and PC Board Layout
to be connected directly to the
inputs and outputs.
The HCPL-0708 optocoupler is
extremely easy to use. No
external interface circuitry is
required because the HCPL-0708
uses high-speed CMOS IC
technology allowing CMOS logic
As shown in Figure 6, the only
external component required for
proper operation is the bypass
capacitor. Capacitor values
should be between 0.01 µF and
VDD
8
1
0.1 µF. For each capacitor, the
total lead length between both
ends of the capacitor and the
power-supply pins should not
exceed 20 mm. Figure 7
illustrates the recommended
printed circuit board layout for
the HPCL-0708.
C
VI
XXX
YWW
2
3
7 NC
6
5
4
VO
GND
C1, C2 = 0.01 µF TO 0.1 µF
Figure 6. Recommended printed circuit board layout.
VDD
XXX
YWW
VI
C2
VO
GND
C1, C2 = 0.01 µF TO 0.1 µF
Figure 7. Recommended printed circuit board layout.
Propagation Delay, Pulse-Width
Distortion and Propagation Delay
Skew
Propagation Delay is a figure of
merit which describes how
quickly a logic signal propagates
through a system. The propaga-
tion delay from low to high (tPLH)
is the amount of time required for
an input signal to propagate to
the output, causing the output to
change from low to high.
Similarly, the propagation delay
from high to low (tPHL) is the
INPUT
VI
50%
5 V CMOS
0V
tPLH
OUTPUT
VO
Figure 8.
8
90%
10%
tPHL
90%
10%
VOH
2.5 V CMOS
VOL
amount of time required for the
input signal to propagate to the
output, causing the output to
change from high to low. See
Figure 8.
Pulse-width distortion (PWD) is
the difference between tPHL and
tPLH and often determines the
maximum data rate capability of
a transmission system. PWD can
be expressed in percent by
dividing the PWD (in ns) by the
minimum pulse width (in ns)
being transmitted. Typically,
PWD on the order of 20 - 30% of
the minimum pulse width is
tolerable; the exact figure
depends on the particular
application.
Propagation delay skew, tPSK, is
an important parameter to consider in parallel data applications
where synchronization of signals
on parallel data lines is a
concern. If the parallel data is
VI
being sent through a group of
optocouplers, differences in
propagation delays will cause the
data to arrive at the outputs of
the optocouplers at different
times. If this difference in
propagation delay is large enough
it will determine the maximum
rate at which parallel data can be
sent through the optocouplers.
Propagation delay skew is defined
as the difference between the
minimum and maximum propagation delays, either tPLH or tPHL ,
for any given group of optocouplers which are operating under
the same conditions (i.e., the
same drive current, supply voltage, output load, and operating
temperature). As illustrated in
Figure 9, if the inputs of a group
of optocouplers are switched
either ON or OFF at the same
time, tPSK is the difference
between the shortest propagation
delay, either tPLH or t PHL, and the
longest propagation delay, either
tPLH or tPHL.
As mentioned earlier, tPSK can
determine the maximum parallel
data transmission rate. Figure 10
is the timing diagram of a typical
parallel data application with
both the clock and data lines
being sent through the
optocouplers. The figure shows
data and clock signals at the
inputs and outputs of the
optocouplers. In this case the
data is assumed to be clocked off
of the rising edge of the clock.
50%
DATA
VO
INPUTS
2.5 V,
CMOS
CLOCK
tPSK
VI
50%
DATA
OUTPUTS
VO
2.5 V,
CMOS
tPSK
CLOCK
tPSK
Figure 9. Propagation delay skew waveform.
Propagation delay skew represents the uncertainty of where an
edge might be after being sent
through an optocoupler.
Figure 10 shows that there will be
uncertainty in both the data and
clock lines. It is important that
these two areas of uncertainty not
overlap, otherwise the clock
signal might arrive before all of
the data outputs have settled, or
some of the data outputs may
9
Figure 10. Parallel data transmission example.
start to change before the clock
signal has arrived. From these
considerations, the absolute
minimum pulse width that can be
sent through optocouplers in a
parallel application is twice tPSK.
A cautious design should use a
slightly longer pulse width to
ensure that any additional
uncertainty in the rest of the
circuit does not cause a problem.
The HCPL-0708 optocouplers
offer the advantage of guaranteed
specifications for propagation
delays, pulse-width distortion, and
propagation delay skew over the
recommended temperature and
power supply ranges.
www.agilent.com/semiconductors
For product information and a complete list of
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Data subject to change.
Copyright © 2002 Agilent Technologies, Inc.
Obsoletes 5988-3611EN
April 30, 2002
5988-6492EN