ICS ICS83940DYI-T

ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
GENERAL DESCRIPTION
FEATURES
The ICS83940DI is a low skew, 1-to-18 LVPECLto-LVCMOS/LVTTL Fanout Buffer and a member
HiPerClockS™ of the HiPerClockS™ family of High Performance
Clock Solutions from ICS. The ICS83940DI has
two selectable clock inputs. The PCLK, nPCLK
pair can accept LVPECL, CML, or SSTL input levels. The
LVCMOS_CLK can accept LVCMOS or LVTTL input levels.
The low impedance LVCMOS/LVTTL outputs are designed to
drive 50Ω series or parallel terminated transmission lines.
• 18 LVCMOS/LVTTL outputs
The ICS83940DI is characterized at 3.3V, 2.5V or mixed
3.3V core, 2.5V output operating supply modes. Guaranteed
output and part-to-part skew characteristics make the
ICS83940DI ideal for those clock distribution applications
demanding well defined performance and repeatability.
• Output skew: 150ps (maximum)
,&6
• Selectable LVCMOS_CLK or LVPECL clock inputs
• PCLK, nPCLK supports the following input types:
LVPECL, CML, SSTL
• LVCMOS_CLK accepts the following input levels:
LVCMOS or LVTTL
• Maximum output frequency: 250MHz
• Part to part skew: 750ps (maximum)
• 3.3V, 2.5V or mixed 3.3V core, 2.5V output supply modes
• -40°C to 85°C ambient operating temperature
• Pin compatible with the MPC940L
BLOCK DIAGRAM
PIN ASSIGNMENT
GND
Q5
Q4
Q3
VDDO
32 31 30 29 28 27 26 25
0
18
Q0:Q17
LVCMOS_CLK
Q2
PCLK
nPCLK
Q1
Q0
CLK_SEL
1
GND
1
24
Q6
GND
2
23
Q7
LVCMOS_CLK
3
22
Q8
CLK_SEL
4
21
VDD
PCLK
5
20
Q9
nPCLK
6
19
Q10
VDD
7
18
Q11
VDDO
8
17
GND
ICS83940DI
9 10 11 12 13 14 15 16
VDDO
Q12
Q13
Q14
GND
Q15
Q16
Q17
32-Lead LQFP
7mm x 7mm x 1.4mm package body
Y Pacakge
Top View
83940DYI
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1
REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
TABLE 1. PIN DESCRIPTIONS
Number
Name
1, 2, 12, 17, 25
GND
Power
Type
Description
3
LVCMOS_CLK
Input
4
CLK_SEL
Input
5
PCLK
Input
6
nPCLK
Input
Inver ting differential LVPECL clock input.
VDD/2 default when left floating.
7, 21
VDD
Power
Core supply pins.
8, 16, 29
9, 10, 11, 13, 14,
15, 18, 19, 20, 22,
23, 24, 26, 27, 28,
30, 31, 32
VDDO
Q17, Q16, Q15, Q14, Q13,
Q12, Q11, Q10, Q9, Q8,
Q7, Q6, Q5, Q4, Q3,
Q2, Q1, Q0
Power
Output supply pins.
Output
Clock outputs. LVCMOS / LVTTL interface levels.
Power supply ground.
Pulldown Clock input. LVCMOS / LVTTL interface levels.
Clock select input. Selects LVCMOS / LVTTL clock
Pulldown input when HIGH. Selects PCLK, nPCLK inputs
when LOW. LVCMOS / LVTTL interface levels.
Pulldown Non-inver ting differential LVPECL clock input.
NOTE: Pulldown refers to internal input resistors. See Table 2, Pin Characteristics, for typical values.
TABLE 2. PIN CHARACTERISTICS
Symbol
Parameter
CIN
RPULLDOWN
Input Capacitance
Power Dissipation Capacitance
(per output)
Input Pulldown Resistor
ROUT
Output Impedance
CPD
Test Conditions
Minimum
Typical
Maximum
Units
4
pF
6
pF
51
KΩ
18
28
Ω
TABLE 3A. CLOCK SELECT FUNCTION TABLE
Control Input
Clock
CLK_SEL
PCLK, nPCLK
LVCMOS_CLK
0
Selected
De-selected
1
De-selected
Selected
TABLE 3B. CLOCK INPUT FUNCTION TABLE
Inputs
Outputs
Input to Output Mode
Polarity
LOW
Differential to Single Ended
Non Inver ting
HIGH
Differential to Single Ended
Non Inver ting
LOW
Single Ended to Single Ended
Non Inver ting
HIGH
Single Ended to Single Ended
Non Inver ting
HIGH
Single Ended to Single Ended
Inver ting
LOW
Single Ended to Single Ended
Inver ting
CLK_SEL
LVCMOS_CLK
PCLK
nPCLK
Q0:Q17
0
—
0
1
0
—
1
0
—
0
0
—
1
0
—
Biased; NOTE 1
0
Biased;
NOTE 1
Biased;
NOTE 1
0
0
—
Biased; NOTE 1
1
1
0
—
—
LOW
Single Ended to Single Ended
Non Inver ting
1
1
—
—
HIGH
Single Ended to Single Ended
Non Inver ting
NOTE 1: Please refer to the Application Information section, "Wiring the Differential Input to Accept Single Ended Levels".
83940DYI
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2
REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
ABSOLUTE MAXIMUM RATINGS
Supply Voltage, VDD
3.6V
Inputs, VI
-0.3V to VDD + 0.3V
Outputs, VO
-0.3V to VDDO + 0.3V
Input Current, IIN
±20mA
Storage Temperature, TSTG
-40°C to 125°C
83940DYI
NOTE: Stresses beyond those listed under Absolute
Maximum Ratings may cause permanent damage to the
device. These ratings are stress specifications only. Functional
operation of product at these conditions or any conditions beyond those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect product reliability.
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3
REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
TABLE 4A. DC CHARACTERISTICS, VDD = VDDO = 3.3V ± 5%, TA = -40° TO 85°
Symbol Parameter
Test Conditions
Minimum
Typical
Maximum
Units
2.4
VDD
V
VIH
Input High Voltage
VIL
Input Low Voltage
LVCMOS_CLK
0.8
V
VPP
PCLK, nPCLK
500
1000
mV
PCLK, nPCLK
VDD - 1.4
VDD - 0.6
V
IIN
Peak-to-Peak Input Voltage
Input Common Mode Voltage;
NOTE 1, 2
Input Current
±200
µA
VOH
Output High Voltage
IOH = -20mA
VOL
Output Low Voltage
IOL = 20mA
VCMR
LVCMOS_CLK
2.4
V
IDD
Core Supply Current
NOTE 1: For single ended applications, the maximum input voltage for PCLK, nPCLK is VDD + 0.3V.
NOTE 2: Common mode voltage is defined as VIH.
0.5
V
25
mA
TABLE 5A. AC CHARACTERISTICS, VDD = VDDO = 3.3V ± 5%, TA = -40° TO 85°
Symbol
Parameter
fMAX
Output Frequency
tpLH
tpLH
Propagation Delay
Propagation Delay
Test Conditions
PCLK, nPCLK;
NOTE 1, 5
LVCMOS_CLK;
NOTE 2, 5
PCLK, nPCLK;
NOTE 1, 5
LVCMOS_CLK;
NOTE 2, 5
PCLK, nPCLK
Minimum Typical
Maximum
Units
250
MHz
f ≤ 150MHz
1.6
3.0
ns
f ≤ 150MHz
1.8
3.0
ns
f > 150MHz
1.6
3.3
ns
f > 150MHz
1.8
3.2
ns
150
ps
LVCMOS_CLK
Measured on
rising edge @VDDO/2
150
ps
Par t-to-Par t Skew;
NOTE 6
PCLK, nPCLK
f ≤ 150MHz
1.4
ns
LVCMOS_CLK
f ≤ 150MHz
1.2
ns
Par t-to-Par t Skew;
NOTE 6
PCLK, nPCLK
f > 150MHz
1.7
ns
LVCMOS_CLK
f > 150MHz
1.4
ns
tsk(pp)
Par t-to-Par t Skew;
NOTE 4, 5
PCLK, nPCLK
LVCMOS_CLK
Measured on
rising edge @VDDO/2
tR
tF
Output Rise Time
Output Fall Time
850
750
1.1
1.1
ps
ps
ns
ns
odc
Output Duty Cycle
55
%
tsk(o)
tsk(pp)
tsk(pp)
Output Skew;
NOTE 3, 5
0.5 to 2.4V
0.5 to 2.4V
0.3
0.3
f < 134MHz
45
50
134MHz ≤ f ≤ 250MHz
40
50
60
%
All parameters measured at 200MHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output VDDO/2.
NOTE 2: Measured from VDD/2 to VDDO/2.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDO/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltages, same temperature,
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
NOTE 5: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 6: Defined as skew between outputs on different devices, across temperature and voltage ranges, and with equal
load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
83940DYI
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REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
TABLE 4B. DC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 2.5V ± 5%, TA = -40° TO 85°
Symbol Parameter
Test Conditions
Minimum
Typical
Maximum
Units
VDD
V
0.8
V
VIH
Input High Voltage
LVCMOS_CLK
VIL
Input Low Voltage
LVCMOS_CLK
VPP
PCLK, nPCLK
300
1000
mV
PCLK, nPCLK
VDD - 1.4
VDD - 0.6
V
IIN
Peak-to-Peak Input Voltage
Input Common Mode Voltage;
NOTE 1, 2
Input Current
±200
µA
VOH
Output High Voltage
IOH = -20mA
VOL
Output Low Voltage
IOL = 20mA
VCMR
2.4
1.8
V
IDD
Core Supply Current
NOTE 1: For single ended applications, the maximum input voltage for PCLK, nPCLK is VDD + 0.3V.
NOTE 2: Common mode voltage is defined as VIH.
0.5
V
25
mA
Maximum
Units
250
MH z
TABLE 5B. AC CHARACTERISTICS, VDD = 3.3V ± 5%, VDDO = 2.5V ± 5%, TA = -40° TO 85°
Symbol Parameter
fMAX
tpLH
tpLH
Test Conditions
Minimum
Output Frequency
Propagation Delay
Propagation Delay
PCLK, nPCLK;
NOTE 1, 5
LVCMOS_CLK;
NOTE 2, 5
PCLK, nPCLK;
NOTE 1, 5
LVCMOS_CLK;
NOTE 2, 5
PCLK, nPCLK
Typical
f ≤ 150MHz
1.7
3.2
ns
f ≤ 150MHz
1.7
3.0
ns
f > 150MHz
1.6
3.4
ns
f > 150MHz
1.8
3.3
ns
Measured on
rising edge @VDDO/2
150
ps
LVCMOS_CLK
150
ps
Par t-to-Par t Skew;
NOTE 6
PCLK, nPCLK
f ≤ 150MHz
1.5
ns
LVCMOS_CLK
f ≤ 150MHz
1.3
ns
Par t-to-Par t Skew;
NOTE 6
PCLK, nPCLK
f > 150MHz
1.8
ns
LVCMOS_CLK
f > 150MHz
1.5
ns
tsk(pp)
Par t-to-Par t Skew;
NOTE 4, 5
PCLK, nPCLK
LVCMOS_CLK
Measured on
rising edge @VDDO/2
tR
tF
Output Rise Time
Output Fall Time
850
750
1.2
1.2
ps
ps
ns
ns
tsk(o)
Output Skew;
NOTE 3, 5
tsk(pp)
tsk(pp)
0.5 to 1.8V
0.5 to 1.8V
0.3
0.3
odc
Output Duty Cycle
f < 134MHz
45
50
55
%
All parameters measured at 200MHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output VDDO/2.
NOTE 2: Measured from VDD/2 to VDDO/2.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDO/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltages, same temperature,
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
NOTE 5: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 6: Defined as skew between outputs on different devices, across temperature and voltage ranges, and with equal
load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
83940DYI
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5
REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
TABLE 4C. DC CHARACTERISTICS, VDD = VDDO = 2.5V±5%, TA = -40° TO 85°
Symbol Parameter
Test Conditions
VIH
Input High Voltage
LVCMOS_CLK
VIL
LVCMOS_CLK
IIN
Input Low Voltage
Peak-to-Peak
Input Voltage
Input Common Mode Voltage;
NOTE 1, 2
Input Current
VOH
Output High Voltage
IOH = -12mA
VOL
Output Low Voltage
IOL = 12mA
VPP
VCMR
Minimum
Typical
2
Maximum
Units
VDD
V
0.8
V
PCLK, nPCLK
300
1000
mV
PCLK, nPCLK
VDD - 1.4
VDD - 0.6
V
±200
µA
1.8
V
IDD
Core Supply Current
NOTE 1: For single ended applications, the maximum input voltage for PCLK, nPCLK is VDD + 0.3V.
NOTE 2: Common mode voltage is defined as VIH.
0.5
V
25
mA
Maximum
200
Units
MH z
TABLE 5C. AC CHARACTERISTICS, VDD = VDDO = 2.5V±5%, TA = -40° TO 85°
Symbol Parameter
fMAX
Output Frequency
tpLH
tpLH
Propagation Delay;
Propagation Delay;
PCLK, nPCLK;
NOTE 1, 5
LVCMOS_CLK;
NOTE 2, 5
PCLK, nPCLK;
NOTE 1, 5
LVCMOS_CLK;
NOTE 2, 5
PCLK, nPCLK
Test Conditions
Minimum
Typical
f ≤ 150MHz
1.2
3.8
ns
f ≤ 150MHz
1.5
3.2
ns
f > 150MHz
1.5
3.7
ns
f > 150MHz
2
3.6
ns
Measured on
rising edge @VDDO/2
200
ps
LVCMOS_CLK
200
ps
Par t-to-Par t Skew;
NOTE 6
PCLK, nPCLK
f ≤ 150MHz
2.6
ns
LVCMOS_CLK
f ≤ 150MHz
1.7
ns
tsk(pp)
Par t-to-Par t Skew;
NOTE 6
PCLK, nPCLK
f > 150MHz
2.2
ns
LVCMOS_CLK
f > 150MHz
1.7
ns
tsk(pp)
Par t-to-Par t Skew;
NOTE 4, 5
PCLK, nPCLK
LVCMOS_CLK
Measured on
rising edge @VDDO/2
tR
tF
Output Rise Time
Output Fall Time
1.2
1.0
1.2
1.2
ns
ns
ns
ns
tsk(o)
Output Skew;
NOTE 3, 5
tsk(pp)
0.5 to 1.8V
0.5 to 1.8V
0.3
0.3
odc
Output Duty Cycle
f < 134MHz
45
55
%
All parameters measured at 200MHz unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the output VDDO/2.
NOTE 2: Measured from VDD/2 to VDDO/2.
NOTE 3: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at VDDO/2.
NOTE 4: Defined as skew between outputs on different devices operating at the same supply voltages, same temperature,
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
NOTE 5: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 6: Defined as skew between outputs on different devices, across temperature and voltage ranges,
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured at VDDO/2.
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REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
PARAMETER MEASUREMENT INFORMATION
1.65V±5%
2.05V±5% 1.25V±5%
SCOPE
VDD,
VDDO
SCOPE
VDD
VDDO
Qx
LVCMOS
Qx
LVCMOS
GND
GND
-1.65V±5%
-1.25V±5%
3.3V/2.5V OUTPUT LOAD AC TEST CIRCUIT
3.3V OUTPUT LOAD AC TEST CIRCUIT
1.25V±5%
VDD
SCOPE
VDD,
VDDO
nPCLK
V
Cross Points
PP
Qx
LVCMOS
V
CMR
PCLK
GND
GND
-1.25V±5%
2.5V OUTPUT LOAD AC TEST CIRCUIT
DIFFERENTIAL INPUT LEVEL
PART 1
V
V
DDO
DDO
Qx
Qx
2
2
PART 2
V
V
DDO
DDO
Qy
Qy
2
tsk(o)
tsk(pp)
PART-TO-PART SKEW
83940DYI
2
OUTPUT SKEW
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REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
V
DD
2
LVCMOS_CLK
nPCLK
PCLK
2.4V
2.4V
V
DDO
0.5V
0.5V
2
Q0:Q17
Clock Outputs
t
t
PD
R
t
F
➤
➤
PROPAGATION DELAY
3.3V OUTPUT RISE/FALL TIME
1.8V
1.8V
0.5V
0.5V
Clock Outputs
t
R
t
F
2.5V OUTPUT RISE/FALL TIME
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REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
APPLICATION INFORMATION
WIRING
THE
DIFFERENTIAL INPUT TO ACCEPT SINGLE ENDED LEVELS
Figure 1 shows how the differential input can be wired to accept
single ended levels. The reference voltage V_REF = VDD/2 is
generated by the bias resistors R1, R2 and C1. This bias circuit
should be located as close as possible to the input pin. The ratio
of R1 and R2 might need to be adjusted to position the V_REF in
the center of the input voltage swing. For example, if the input
clock swing is only 2.5V and VDD = 3.3V, V_REF should be 1.25V
and R2/R1 = 0.609.
VDD
R1
1K
CLK_IN
+
V_REF
C1
0.1uF
R2
1K
FIGURE 1. SINGLE ENDED SIGNAL DRIVING DIFFERENTIAL INPUT
83940DYI
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REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
RELIABILITY INFORMATION
TABLE 6. θJAVS. AIR FLOW TABLE
qJA by Velocity (Linear Feet per Minute)
Single-Layer PCB, JEDEC Standard Test Boards
Multi-Layer PCB, JEDEC Standard Test Boards
0
200
500
67.8°C/W
47.9°C/W
55.9°C/W
42.1°C/W
50.1°C/W
39.4°C/W
NOTE: Most modern PCB designs use multi-layered boards. The data in the second row pertains to most designs.
TRANSISTOR COUNT
The transistor count for ICS83940DI is: 820
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REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
PACKAGE OUTLINE - Y SUFFIX
TABLE 7. PACKAGE DIMENSIONS
JEDEC VARIATION
ALL DIMENSIONS IN MILLIMETERS
BBA
SYMBOL
MINIMUM
NOMINAL
MAXIMUM
32
N
A
--
--
1.60
A1
0.05
--
0.15
A2
1.35
1.40
1.45
b
0.30
0.37
0.45
c
0.09
--
0.20
D
9.00 BASIC
D1
7.00 BASIC
D2
5.60 Ref.
E
9.00 BASIC
E1
7.00 BASIC
E2
5.60 Ref.
0.80 BASIC
e
L
0.45
0.60
0.75
q
0°
--
7°
ccc
--
--
0.10
Reference Document: JEDEC Publication 95, MS-026
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REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
TABLE 8. ORDERING INFORMATION
Part/Order Number
Marking
Package
Count
Temperature
ICS83940DYI
ICS83940DYI-T
ICS83940DYI
32 Lead LQFP
250 per tray
-40°C to 85°C
ICS83940DYI
32 Lead LQFP on Tape and Reel
1000
-40°C to 85°C
While the information presented herein has been checked for both accuracy and reliability, Integrated Circuit Systems, Incorporated (ICS) assumes no responsibility for either its use or
for infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use in normal
commercial and industrial applications. Any other applications such as those requiring high reliability, or other extraordinary environmental requirements are not recommended without
additional processing by ICS. ICS reserves the right to change any circuitry or specifications without notice. ICS does not authorize or warrant any ICS product for use in life support devices
or critical medical instruments.
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REV. A DECEMBER 12, 2002
ICS83940DI
Integrated
Circuit
Systems, Inc.
LOW SKEW, 1-TO-18
LVPECL-TO-LVCMOS / LVTTL FANOUT BUFFER
REVISION HISTORY SHEET
Rev
A
Table
T2
Page
2
7
Description of Change
Pin Characteristics table - changed ROUT 25Ω maximum to 28Ω maximum.
Delete RPULLUP row.
Date
3.3V Output Load AC Test Circuit diagram - corrected GND equation to read
-1.65V... from -1.165V...
12/12/02
Added LVTTL to title.
Updated format.
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REV. A DECEMBER 12, 2002