ICS ICS85454AK-01

ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
GENERAL DESCRIPTION
FEATURES
The ICS85454-01 is a 2:1/1:2 Multiplexer and
a member of the HiPerClockSTM family of high
HiPerClockS™
performance clock solutions from ICS. The 2:1
Multiplexer allows one of 2 inputs to be selected onto one output pin and the 1:2 MUX
switches one input to both of two outputs. This device
may be useful for multiplexing multi-rate Ethernet PHYs
which have 100Mbit and 1000Mbit transmit/receive
pairs onto an optical SFP module which has a single
transmit/receive pair. Another mode allows loop back
testing and allows the output of a PHY transmit pair to be
routed to the PHY input pair. For examples, please refer to
the Application Information section of the data sheet.
• Dual 2:1/1:2 MUX
The ICS85454-01 is optimized for applications requiring
very high performance and has a maximum operating
frequency in 2.5GHz. The device is packaged in a small,
3mm x 3mm VFQFN package, making it ideal for use on
space-constrained boards.
• 2.5V operating supply
ICS
• Three LVDS outputs
• Three differential inputs
• Differential inputs can accept the following differential
levels: LVPECL, LVDS, CML
• Loopback test mode available
• Maximum output frequency: 2.5GHz
• Part-to-part skew: 250ps (maximum)
• Additive phase jitter, RMS: 0.05ps (typical)
• Propagation delay: 550ps (maximum)
• -40°C to 85°C ambient operating temperature
• Available in both standard and lead-free RoHS compliant
packages
BLOCK DIAGRAM
PIN ASSIGNMENT
INA0
nQA0
0
1
VDD
SELA
11
nINA0
QA1 3
10
INA1
nQA1 4
9
5
6
7
INA0
nINA1
8
GND
QA0
nQA0 2
nINB
0
16 15 14 13
12
SELB
LOOP0
INB
nINB
QA0 1
INB
nINA0
nQB
QB
SELB
QB
nQB
1
INA1
ICS85454-01
nINA1
16-Lead VFQFN
3mm x 3mm x 0.95 package body
K Package
Top View
LOOP1
QA1
nQA1
SELA
85454AK-01
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1
REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
TABLE 1. PIN DESCRIPTIONS
Number
Name
Type
Description
1, 2
QA0, nQA0
Output
Differential output pair. LVDS interface levels.
3, 4
QA1, nQA1
Output
Differential output pair. LVDS interface levels.
5
INB
Input
6
nINB
Input
7
SEL B
Input
8
GND
Power
9
nINA1
Input
10
INA1
Input
11
nINA0
Input
12
INA0
Input
13
VDD
Power
Pulldown Non-inver ting differential clock input.
Pullup/
Inver ting differential clock input. VDD/2 default when left floating.
Pulldown
Select pin for QAx outputs. When HIGH, selects same inputs used for
Pulldown QB output. When LOW, selects INB input.
LVCMOS/LVTTL interface levels.
Power supply ground.
Pullup/
Inver ting differential clock input. VDD/2 default when left floating.
Pulldown
Pulldown Non-inver ting differential clock input.
Pullup/
Inver ting differential clock input. VDD/2 default when left floating.
Pulldown
Pulldown Non-inver ting differential clock input.
Positive supply pin.
Select pin for QB outputs. When HIGH, selects INA1 input.
14
SELA
Input
Pulldown
When LOW, selects INA0 input. LVCMOS/LVTTL interface levels.
15, 16
nQB, QB
Output
Differential output pair. LVDS interface levels.
NOTE: Pulldown and Pullup refer to internal input resistors. See Table 2, Pin Characteristics, for typical values.
TABLE 2. PIN CHARACTERISTICS
Symbol
Parameter
RPULLDOWN
Input Pulldown Resistor
Test Conditions
Minimum
Typical
37.5
Maximum
Units
kΩ
RPULLUP
Input Pullup Resistor
37.5
kΩ
TABLE 3. INPUT CONTROL FUNCTION TABLE
Control Inputs
SELA
SELB
0
0
Mode
LOOP0 selected
1
0
LOOP1 selected
0
1
Loopback mode: LOOP0
1
1
Loopback mode: LOOP1
85454AK-01
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REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
ABSOLUTE MAXIMUM RATINGS
NOTE: Stresses beyond those listed under Absolute
Supply Voltage, VDD
4.6V
Inputs, VI
-0.5V to VDD + 0.5V
Outputs, IO
Continuous Current
Surge Current
Maximum Ratings may cause permanent damage
t o the device. These ratings are stress specifi-
10mA
15mA
cations only. Functional operation of product at
these conditions or any conditions beyond those
Operating Temperature Range, TA -40°C to +85°C
Storage Temperature, TSTG
-65°C to 150°C
Package Thermal Impedance, θJA
51.5°C/W (0 lfpm)
listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for extended periods may
affect product reliability.
(Junction-to-Ambient)
TABLE 4A. POWER SUPPLY DC CHARACTERISTICS, VDD = 2.5V ± 5%
Symbol
Parameter
VDD
Positive Supply Voltage
Test Conditions
IDD
Power Supply Current
Minimum
Typical
Maximum
Units
2.375
2.5
2.625
V
90
mA
TABLE 4B. LVCMOS / LVTTL DC CHARACTERISTICS, VDD = 2.5V ± 5%
Symbol
Parameter
Maximum
Units
VIH
Input High Voltage
Test Conditions
Minimum
1.7
VDD + 0.3
V
VIL
Input Low Voltage
0
0.7
V
IIH
Input High Current
SELA, SELB
VDD = VIN = 2.625V
IIL
Input Low Current
SELA, SELB
VDD = 2.625V, VIN = 0V
Typical
150
-150
µA
µA
TABLE 4C. DIFFERENTIAL DC CHARACTERISTICS, VDD = 2.5V ± 5%
Symbol
Parameter
Min
-40°C
Typ
Max
Min
25°C
Typ
Max
Min
85°C
Typ
Max
INAx, INB
150
150
150
nINAx, nINB
INAx, INB
IIL
Input Low Current
-150
-150
-150
nINAx, nINB
VPP
Peak-to-Peak Input Voltage
0.15
1.2
0.15
1.2
0.15
1.2
Commond Mode Input Voltage;
VCMR
1.2
VDD
1.2
VDD
1.2
VDD
NOTE 1, 2
NOTE 1: Common mode input voltage is defined as VIH.
NOTE 2: For single ended applications, the maximum input voltage for INAx, nINAx and INB, nINB is VDD + 0.3V.
IIH
85454AK-01
Input High Current
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3
Units
µA
µA
V
V
REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
TABLE 4D. LVDS DC CHARACTERISTICS, VDD = 2.5V ± 5%
Symbol
Parameter
VOD
Differential Output Voltage
∆ VOD
VOD Magnitude Change
VOS
Offset Voltage
∆ VOS
VOS Magnitude Change
-40°C
25°C
85°C
Units
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
25 0
350
450
250
350
450
250
350
450
mV
30
mV
30
0.93
1.18
1.43
30
0.97
1.22
10
1.47
1.02
1.27
10
1.52
V
10
mV
NOTE 1: Refer to Parameter Measurement Information, "2.5V Output Load Test Circuit" diagram.
TABLE 5. AC CHARACTERISTICS, VDD = 2.375V TO 2.625V
Symbol
Parameter
fMAX
Output Frequency
tPD
Propagation Delay; NOTE 1
tsk(pp)
M U X ISOLATION
Par t-to-Par t Skew; NOTE 2, 3
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter section
MUX Isolation
tR/tF
Output Rise/Fall Time
tjit
Conditions
Minimum
INAx to QB or INB to QAx
250
INAx to QAx
300
ƒ = 622.08MHz,
12kHz - 20MHz
@ 500MHz output
20% to 80%
Typical
Maximum
Units
2.5
GHz
550
ps
650
ps
250
ps
0.05
ps
55
50
dB
250
ps
All parameters are measured ≤ 1.7GHz unless otherwise noted.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltages
and with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at the differential cross points.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
85454AK-01
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REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
ADDITIVE PHASE JITTER
ratio of the power in the 1Hz band to the power in the fundamental. When the required offset is specified, the phase noise
is called a dBc value, which simply means dBm at a specified
offset from the fundamental. By investigating jitter in the frequency domain, we get a better understanding of its effects
on the desired application over the entire time record of the
signal. It is mathematically possible to calculate an expected
bit error rate given a phase noise plot.
The spectral purity in a band at a specific offset from the
fundamental compared to the power of the fundamental is
called the dBc Phase Noise. This value is normally expressed
using a Phase noise plot and is most often the specified plot
in many applications. Phase noise is defined as the ratio of
the noise power present in a 1Hz band at a specified offset
from the fundamental frequency to the power value of the
fundamental. This ratio is expressed in decibels (dBm) or a
0
-10
Additive Phase Jitter at
622.08MHz (12kHz - 20MHz)
= 0.05ps (typical)
-20
-30
-40
SSB PHASE NOISE dBc/HZ
-50
-60
-70
-80
-90
-100
-110
-120
-130
-140
-150
-160
-170
-180
-190
10
100
1k
10k
100k
1M
10M
100M
OFFSET FROM CARRIER FREQUENCY (HZ)
above. The device meets the noise floor of what is shown, but
can actually be lower. The phase noise is dependant on the
input source and measurement equipment.
As with most timing specifications, phase noise measurements have issues. The primary issue relates to the limitations of the equipment. Often the noise floor of the equipment
is higher than the noise floor of the device. This is illustrated
85454AK-01
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REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
PARAMETER MEASUREMENT INFORMATION
VDD
Qx
nINA0, nINA1
nINB
SCOPE
V
2.5V±5%
POWER SUPPLY
V
Cross Points
PP
LVDS
+ Float GND -
CMR
INA0, INA1
INB
nQx
GND
OUTPUT LOAD AC TEST CIRCUIT
DIFFERENTIAL INPUT LEVEL
nINA0,
nINA1
nINB
nQx
PART 1
Qx
INA0,
INA1
INB
nQA0,
nQA1,
nQB
QA0,
QA1,
QB
nQy
PART 2
Qy
t sk(pp)
tPD
PROPAGATION DELAY
PART-TO-PART SKEW
VDD
➤
80%
LVDS
100
VOD/∆ VOD
20%
20%
tR
out
tF
OUTPUT RISE/FALL TIME
➤
DC Input
VSW I N G
Clock
Outputs
➤
out
80%
DIFFERENTIAL OUTPUT VOLTAGE
VDD
out
LVDS
➤
DC Input
➤
out
VOS/∆ VOS
➤
OFFSET VOLTAGE SETUP
85454AK-01
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REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
APPLICATION INFORMATION
WIRING THE DIFFERENTIAL INPUT TO ACCEPT SINGLE ENDED LEVELS
Figure 1 shows how the differential input can be wired to accept
single ended levels. The reference voltage V_REF = VDD/2 is
generated by the bias resistors R1, R2 and C1. This bias circuit
should be located as close as possible to the input pin. The
ratio of R1 and R2 might need to be adjusted to position the
V_REF in the center of the input voltage swing.
VDD
R1
1K
Single Ended Clock Input
IN
V_REF
nIN
C1
0.1u
R2
1K
FIGURE 1. SINGLE ENDED SIGNAL DRIVING DIFFERENTIAL INPUT
RECOMMENDATIONS FOR UNUSED INPUT AND OUTPUT PINS
INPUTS:
OUTPUTS:
IN/nIN INPUT:
For applications not requiring the use of the differential input,
both IN and nIN can be left floating. Though not required, but
for additional protection, a 1kΩ resistor can be tied from IN to
ground.
LVDS
All unused LVDS output pairs can be either left floating or
terminated with 100Ω across. If they are left floating, we
recommend that there is no trace attached.
LVCMOS CONTROL PINS:
All control pins have internal pull-ups or pull-downs; additional
resistance is not required but can be added for additional
protection. A 1kΩ resistor can be used.
85454AK-01
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7
REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
DIFFERENTIAL CLOCK INPUT INTERFACE
are examples only. If the driver is from another vendor, use
their termination recommendation. Please consult with the
vendor of the driver component to confirm the driver termination requirements.
The IN/nIN accepts LVPECL, CML, SSTL and other differential signals. Both VSWING and VOH must meet the VPP and VCMR
input requirements. Figures 2A to 2D show interface examples for the HiPerClockS IN/nIN input driven by the most
common driver types. The input interfaces suggested here
3.3V
3.3V
3.3V
3.3V
3.3V
R1
50
CML
Zo = 50 Ohm
R2
50
Zo = 50 Ohm
IN
IN
R1
100
Zo = 50 Ohm
nIN
FIGURE 2B. HIPERCLOCKS IN/nIN INPUT DRIVEN BY A
BUILT-IN PULLUP CML DRIVER
3.3V
3.3V
3.3V
Zo = 50 Ohm
Zo = 50 Ohm
IN
IN
R1
100
Zo = 50 Ohm
LVDS
R1
100
nIN
Zo = 50 Ohm
nIN
HiPerClockS
LVDS
HiPerClockS
FIGURE 2C. HIPERCLOCKS IN/nIN INPUT DRIVEN BY A
3.3V LVPECL DRIVER
85454AK-01
HiPerClockS
CML Built-In Pull-Up
FIGURE 2A. HIPERCLOCKS IN/nIN INPUT DRIVEN BY AN
OPEN COLLECTOR CML DRIVER
3.3V
nIN
Zo = 50 Ohm
HiPerClockS
FIGURE 2D. HIPERCLOCKS IN/nIN INPUT DRIVEN BY A
3.3V LVDS DRIVER
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8
REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
TYPICAL APPLICATION DIAGRAM FOR HOST BUS ADAPTER BOARDS FOR ROUTING BETWEEN INTERNAL
AND EXTERNAL CONNECTORS
Internal
Connector
Host Adapter Board
SELB
INA0
INB
0
nINB
Protocol
Controller
SerDes
QA0
nQA0
0
QB
nQB
1
INA1
1
External
Connector
nINA0
nINA1
QA1
nQA1
SELA
PCI Bus
85454AK-01
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REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
TYPICAL APPLICATION DIAGRAM FOR HOT-SWAPPABLE LINKS TO REDUNDANT SWITCH FABRIC CARDS
LOOP 0
SELB
INA0
nINA0
TX
SerDes
INB
nINB
0
QB
0
QA0
1
nQA0
nQB
Switch
Fabric
INA1
1
nINA1
RX
QA1
nQA1
#0
SELA
LOOP 1
#1
Redundant
Switch Card
Linecard
Backplane
2.5V LVDS DRIVER TERMINATION
transmission line environment. For buffer with multiple LDVS
driver, it is recommended to terminate the unused outputs.
Figure 3 shows a typical termination for LVDS driver in
characteristic impedance of 100Ω differential (50Ω single)
2.5V
2.5V
LVDS_Driv er
+
R1
100
-
100 Ohm
Line
ΩDifferential
100Ω
Differential Transmission
Transmission Line
FIGURE 3. TYPICAL LVDS DRIVER TERMINATION
85454AK-01
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10
REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
POWER CONSIDERATIONS
This section provides information on power dissipation and junction temperature for the ICS85454-01.
Equations and example calculations are also provided.
1. Power Dissipation.
The total power dissipation for the ICS85454-01 is the sum of the core power plus the power dissipated in the load(s).
The following is the power dissipation for VDD = 2.5V + 5% = 2.625V, which gives worst case results.
·
Power_MAX = VDD_MAX * IDD_MAX = 2.625V * 90mA = 236.3mW
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad and directly affects the reliability of
the device. The maximum recommended junction temperature for HiPerClockSTM devices is 125°C.
The equation for Tj is as follows: Tj = θJA * Pd_total + TA
Tj = Junction Temperature
θJA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance θJA must be used. Assuming
no air flow of and a multi-layer board, the appropriate value is 51.5°C/W per Table 6 below.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 0.236W * 51.5°C/W = 97.2°C. This is well below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air
flow, and the type of board (single layer or multi-layer).
TABLE 6. THERMAL RESISTANCE θ JA FOR 16-PIN VFQFN, FORCED CONVECTION
θJA vs. 0 Air Flow (Linear Feet per Minute)
0
Multi-Layer PCB, JEDEC Standard Test Boards
85454AK-01
51.5°C/W
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REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
RELIABILITY INFORMATION
TABLE 7. θJAVS. AIR FLOW TABLE FOR 16 LEAD VFQFN
θJA vs. 0 Air Flow (Linear Feet per Minute)
0
Multi-Layer PCB, JEDEC Standard Test Boards
51.5°C/W
TRANSISTOR COUNT
The transistor count for ICS85454-01 is: 171
85454AK-01
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REV. B JUNE 16, 2006
ICS85454-01
Integrated
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Systems, Inc.
PACKAGE OUTLINE - K SUFFIX
FOR
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
16 LEAD VFQFN
TABLE 8. PACKAGE DIMENSIONS
JEDEC VARIATION
ALL DIMENSIONS IN MILLIMETERS
SYMBOL
MINIMUM
MAXIMUM
16
N
A
0.80
1.0
A1
0
0.05
0.25 Reference
A3
b
0.18
0.30
e
0.50 BASIC
ND
4
NE
4
3.0
D
D2
1.0
1.8
3.0
E
E2
1.0
1.8
L
0.30
0.50
Reference Document: JEDEC Publication 95, MO-220
85454AK-01
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REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
TABLE 9. ORDERING INFORMATION
Part/Order Number
Marking
Package
Shipping Packaging
Temperature
ICS85454AK-01
5A01
16 Lead VFQFN
Tube
-40°C to 85°C
ICS85454AK-01T
5A01
16 Lead VFQFN
2500 Tape & Reel
-40°C to 85°C
ICS85454AK-01LF
A01L
16 Lead "Lead-Free" VFQFN
Tube
-40°C to 85°C
ICS85454AK-01LFT
A01L
16 Lead "Lead-Free" VFQFN
2500 Tape & Reel
-40°C to 85°C
NOTE: Par ts that are ordered with an "LF" suffix to the par t number are the Pb-Free configuration and are RoHS compliant.
The aforementioned trademark, HiPerClockS is a trademark of Integrated Circuit Systems, Inc. or its subsidiaries in the United States and/or other countries.
While the information presented herein has been checked for both accuracy and reliability, Integrated Circuit Systems, Incorporated (ICS) assumes no responsibility for either its use
or for infringement of any patents or other rights of third parties, which would result from its use. No other circuits, patents, or licenses are implied. This product is intended for use
in normal commercial and industrial applications. Any other applications such as those requiring high reliability or other extraordinary environmental requirements are not
recommended without additional processing by ICS. ICS reserves the right to change any circuitry or specifications without notice. ICS does not authorize or warrant any ICS product
for use in life support devices or critical medical instruments.
85454AK-01
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14
REV. B JUNE 16, 2006
ICS85454-01
Integrated
Circuit
Systems, Inc.
DUAL 2:1/1:2
DIFFERENTIAL-TO-LVDS MULTIPLEXER
REVISION HISTORY SHEET
Rev
Table
T4D
Page
4
T9
14
T8
13
B
B
85454AK-01
Description of Change
LVDS DC Characteristics - changed VOD parameters. Changed ∆ VOD/VOS
parameters from typical to maximum.
Ordering Information - corrected Shipping Packaging from Tray to Tube.
Package Dimension Table - corrected D2/E2 from 0.25min/1.25max. to
1.0min./1.8max.
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15
Date
3/14/06
6/16/06
REV. B JUNE 16, 2006