IXYS IXFR200N10P

Advanced Technical Information
PolarTM HiPerFET
Power MOSFET
IXFR 200N10P
VDSS
ID25
RDS(on)
Electrically Isolated Tab
= 100 V
= 133 A
Ω
= 8 mΩ
N-Channel Enhancement Mode
Fast Recovery Diode, Avavanche Rated
Symbol
Test Conditions
Maximum Ratings
VDSS
TJ = 25°C to 175°C
100
V
VDGR
TJ = 25°C to 175°C; RGS = 1 MΩ
100
V
VGS
±20
V
VGSM
±30
V
133
A
75
A
400
A
ID25
TC = 25°C
ID(RMS)
External lead current limit
IDM
TC = 25°C, pulse width limited by TJM
IAR
TC = 25°C
60
A
EAR
TC = 25°C
100
mJ
EAS
TC = 25°C
4
J
dv/dt
IS ≤ IDM, di/dt ≤ 100 A/µs, VDD ≤ VDSS,
TJ ≤ 150°C, RG = 4 Ω
10
V/ns
PD
TJ
TJM
Tstg
50/60 Hz, RMS, 1 minute
FC
Mounting Force
350
W
-55 ... +175
175
-55 ... +150
°C
°C
°C
2500
V~
20..120/4.6..20
Nm/lb
5
g
Weight
Symbol
Test Conditions
(TJ = 25°C, unless otherwise specified)
Characteristic Values
Min. Typ.
Max.
VDSS
VGS = 0 V, ID = 250 µA
100
VGS(th)
VDS = VGS, ID = 500µA
3.0
IGSS
VGS = ±30 VDC, VDS = 0
IDSS
VDS = VDSS
VGS = 0 V
VGS = 0 V
RDS(on)
VGS = 10 V, ID = 0.5 ID25
VGS = 15 V, ID = 400A
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
© 2005 IXYS All rights reserved
G
G = Gate
S = Source
V
TJ = 150°C
TJ = 175°C
5.5
5.0
V
±100
nA
25
250
1000
µA
µA
µA
8
mΩ
mΩ
D
ISOLATED TAB
S
D = Drain
Features
z
Silicon chip on Direct-Copper-Bond
substrate
- High power dissipation
- Isolated mounting surface
- 2500V electrical isolation
z
Low drain to tab capacitance(<30pF)
z
TC = 25°C
VISOL
ISOPLUS247 (IXFR)
E153432
Fast recovery intrinsic diode
Applications
z
DC-DC converters
z
Battery chargers
z
Switched-mode and resonant-mode
power supplies
DC choppers
z
z
AC motor control
Advantages
z
Easy assembly
z
Space savings
z
High power density
DS99239(06/05)
IXFR 200N10P
Symbol
Test Conditions
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Min.
Typ.
Max.
gfs
VDS= 10 V; ID = 0.5 ID25, pulse test
60
Ciss
Coss
VGS = 0 V, VDS = 25 V, f = 1 MHz
C rss
td(on)
tr
VGS = 10 V, VDS = 0.5 VDSS, ID = 60 A
td(off)
RG = 3.3 Ω (External)
tf
Qg(on)
Qgs
VGS= 10 V, VDS = 0.5 VDSS, ID = 0.5 ID25
Qgd
97
S
7600
pF
2900
pF
860
pF
30
ns
35
ns
150
ns
90
ns
240
nC
50
nC
135
nC
RthJC
ISOPLUS247 Outline
0.42 K/W
RthCK
0.15
Source-Drain Diode
K/W
Characteristic Values
(TJ = 25°C, unless otherwise specified)
Min.
typ.
Max.
Symbol
Test Conditions
IS
VGS = 0 V
200
A
ISM
Repetitive
400
A
VSD
IF = IS, VGS = 0 V,
Pulse test, t ≤ 300 µs, duty cycle d ≤ 2 %
1.5
V
t rr
IF = 25 A, dI/dt = 100 A/µs
QRM
VR = 100 V
100
140 ns
0.4
µC
6
A
IRM
IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETs and IGBTs are covered by
one or moreof the following U.S. patents:
4,835,592
4,850,072
4,881,106
4,931,844
5,017,508
5,034,796
5,049,961
5,063,307
5,187,117
5,237,481
5,381,025
5,486,715
6,162,665
6,259,123 B1
6,306,728 B1
6,404,065 B1
6,534,343
6,583,505
6,683,344
6,710,405B2
6,710,463
6,727,585
IXFR 200N10P
Fig. 1. Output Characteristics
@ 25ºC
Fig. 2. Extended Output Characteristics
@ 25ºC
350
200
VGS = 10V
9V
175
VGS = 10V
300
9V
250
I D - Amperes
I D - Amperes
150
8V
125
100
75
7V
200
8V
150
7V
100
50
6V
25
50
0
6V
0
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
0
0.5
1
1.5
V D S - Volts
Fig. 3. Output Characteristics
@ 150ºC
3
3.5
4
4.5
5
2.4
VGS = 10V
9V
VGS = 10V
2.2
150
R D S ( o n ) - Normalized
175
I D - Amperes
2.5
Fig. 4. RDS(on) Norm alize d to 0.5 ID25
Value vs. Junction Te m perature
200
8V
125
100
7V
75
6V
50
25
2
1.8
I D = 200A
1.6
1.4
I D = 100A
1.2
1
0.8
5V
0
0.6
0
0.5
1
1.5
2
V D S - Volts
2.5
3
3.5
-50
-25
0
25
50
75
100
125
150
175
TJ - Degrees Centigrade
Fig. 5. RDS(on) Norm alized to 0.5 ID25
Value vs . Drain Curre nt
Fig. 6. Drain Curre nt vs . Cas e
Tem pe rature
80
2.4
2.2
70
TJ = 175ºC
2
60
1.8
1.6
I D - Amperes
R D S ( o n ) - Normalized
2
V D S - Volts
VGS = 10V
1.4
VGS = 15V
1.2
50
40
30
20
1
0.8
10
TJ = 25ºC
0
0.6
0
50
100
150
200
I D - Amperes
© 2005 IXYS All rights reserved
250
300
350
-50
-25
0
25
50
75
100
125
TC - Degrees Centigrade
150
175
IXFR 200N10P
Fig. 8. Transconductance
300
140
250
120
100
200
g f s - Siemens
I D - Amperes
Fig. 7. Input Adm ittance
150
TJ = -40ºC
100
25ºC
150ºC
50
TJ = -40ºC
25ºC
80
150ºC
60
40
20
0
0
4
4.5
5
5.5
6
6.5
7
7.5
8
8.5
0
9
50
100
V G S - Volts
Fig. 9. Source Current vs.
Source-To-Drain Voltage
250
300
350
Fig. 10. Gate Charge
VDS = 50V
9
300
I D = 100A
8
250
I G = 10mA
7
VG S - Volts
I S - Amperes
200
10
350
200
150
100
6
5
4
3
TJ = 150ºC
2
50
TJ = 25ºC
1
0
0
0.4
0.6
0.8
1
V S D - Volts
1.2
1.4
1.6
0
25
50
75
100 125 150 175 200 225 250
Q G - nanoCoulombs
Fig.
Fig . 12.
12. Forw
Fo r ward-Bias
ar d -Bias
Safe
Safe Operating
Op e r atin g Area
Ar e a
Fig. 11. Capacitance
100,000
1000
100
0
f = 1MHz
ºCºC
TJT ==175
1 75
J
º
TT
ºC
C ==25
25C
R
Limit
R DS(on)
D S (o n ) Lim it
C iss
10,000
I DI D- -Amperes
Amperes
Capacitance - picoFarads
150
I D - Amperes
C oss
C rss
1,000
C
100µs
10 0µs
100
1 00
1ms
1m s
10ms
10 m s
DC
100
0
5
10
15
20
25
30
35
40
V DS - Volts
IXYS reserves the right to change limits, test conditions, and dimensions.
10
10
DC
1
1
10
10 V
100
- Volts 100
VDD SS - V olts
1000
10 00
IXFR 200N10P
Fig. 13. Maximum Transient Thermal Resistance
R( t h ) J C - ºC / W
1.00
0.10
0.01
0.00
0.1
1
10
Pulse Width - milliseconds
© 2005 IXYS All rights reserved
100
1000