ML145170 Phase–Frequency Detector PLL Frequency Synthesizer with Serial Interface Legacy Device: Motorola/Freescale MC145170-2 The Lansdale ML145170 is a single–chip synthesizer capable of direct usage in the MF, HF and VHF bands. A special architecture makes this PLL easy to program. Either a bit– or byte–oriented format may be used. Due to the patented BitGrabber™ registers, no address/steering bits are required for random access of the three registers. Thus, tuning can be accomplished via a 2–byte serial transfer to the 16-bit N register. The device features fully programmable R and N counters, an amplifier at the f in pin, on–chip support of an external crystal, a programmable reference output, and both single and double–ended phase detectors with linear transfer functions (no dead zones). A configuration (C) register allows the part to be configured to meet various applications. A patented feature allows the C register to shut off unused outputs, thereby minimizing noise and interference. In order to reduce lock times and prevent erroneous data from being loaded into the counters, a patented jam load feature is included. Whenever a new divide ratio is loaded into the N register, both the N and R counters are jam–loaded with their respective values and begin counting down together. The phase detectors are also initialized during the jam load. • Operating Voltage Range: 2.7 to 5.5 V • Operating Temperature Range: TA = –40º to +85º C • Maximum Operating Frequency: 185 MHz @ Vin = 500 mVpp, 4.5 V Minimum Supply 100 MHz @ Vin = 500 mVpp, 3.0 V Minimum Supply • Operating Supply Current: 0.6 mA @ 3.0 V, 30 MHz 1.5 mA @ 3.0 V, 100 MHz 3.0 mA @ 5.0 V, 50 MHz 5.8 mA @ 5.0 V, 185 MHz • R Counter Division Range: 1 and 5 to 32,767 • N Counter Division Range: 40 to 65,535 • Direct Interface to Motorola SPI Serial Data Port • See Application Notes AN1207/D and AN1671/D • See web site www.lansdale.com for ML145170 control software 16 1 P DIP 16 = EP PLASTIC PACKAGE CASE 648 16 16 1 1 SO 16 = -5P PLASTIC PACKAGE CASE 751B TSSOP 16 = -7P PLASTIC PACKAGE CASE 948C CROSS REFERENCE/ORDERING INFORMATION PACKAGE MOTOROLA LANSDALE P DIP 16 MC145170P2 ML145170EP SO 16 MC145170D2 ML145170-5P TSSOP 16 MC145170DT2 ML145170-7P Note: Lansdale lead free (Pb) product, as it becomes available, will be identified by a part number prefix change from ML to MLE. PIN CONNECTIONS φ φ BitGrabber™ is a trademark of Motorola/Freescale Page 1 of 26 www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 ML145170 BLOCK DIAGRAM φ φ This device contains 4,800 active transistors. MAXIMUM RATINGS (Voltages Referenced to VSS) Parameter Symbol Value Unit DC Supply Voltage VDD –0.5 to 5.5 V DC Input Voltage Vin –0.5 to VDD + 0.5 V DC Output Voltage Vout –0.5 to VDD + 0.5 V DC Input Current, per Pin Iin ±10 mA DC Output Current, per Pin Iout ±20 mA DC Supply Current VDD and VSS Pins IDD ±30 mA Power Dissipation, per Package PD 300 mW Storage Temperature Tstg –65 to 150 °C Lead Temperature, 1 mm from Case for 10 seconds TL 260 °C This device contains protection circuitry to guard against damage due to high static voltages or electric fields. However, precautions must be taken to avoid applications of any voltage higher than maximum rated voltages to this high–impedance circuit. For proper operation, Vin and Vout should be constrained to the range VSS ≤ (Vin or Vout) ≤VDD. Unused inputs must always be tied to an appropriate logic voltage level (e.g. either VSS or VDD). Unused outputs must be left open. NOTES: 1. Maximum Ratings are those values beyond which damage to the device may occur. Functional operation should be restricted to the limits in teh Electrical Characteristics tables or Pin Descriptions section. Page 2 of 26 www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 ELECTRICAL CHARACTERISTICS (Voltages Referenced to VSS. TA = –40° to 85°C) Parameter Test Condition Power Supply Voltage Range Symbol VDD V Guaranteed Limit Unti VDD – 2.7 to 5.5 V Maximum Low-Level Input Voltage [Note 1] (Din, CLK, ENB, fin) DC Coupling to fin VIL 2.7 4.5 5.5 0.54 1.35 1.65 V Minimum High-Level Input Voltage [Note 1] (Din, CLK, ENB, fin) DC Coupling to fin VIH 2.7 4.5 5.5 2.16 3.15 3.85 v VHys 2.7 5.5 0.15 0.20 v Minimum Hysteresis Voltage (CLK, ENB) Maximum Low-Level Output Voltage (Any Output) Iout = 20 µA VOL 2.7 5.5 0.1 0.1 v Minimum high-Level Output Voltage (Any Output) Iout = –20 µA VOH 2.7 5.5 2.6 5.4 v Minimum Low-Level output Current (PDout, REFout, fR, fV, LD, φR, φV) Vout = 0.3 V Vout = 0.4 V Vout = 0.5 V IOL 2.7 4.5 5.5 0.12 0.36 0.36 mA Minimum High-Level Output Current (PDout, REFout, fR, fV, LD, φR, φV) Vout = 2.4 V Vout = 4.1 V Vout = 5.0 V IOH 2.7 4.5 5.5 -0.12 -0.36 -0.36 mA Minimum Low-Level Output Current (Dout) Vout = 0.4 V IOL 4.5 1.6 mA Maximum High-Level Output Current (Dout) Vout = 4.1 V IOH 4.5 -1.6 mA Maximum Input Leakage Current (Din, CLK, ENB, OSCin) Vin = VDD or VSS Iin 5.5 ±1.0 µA Maximum Input Current (fin) Vin = VDD or VSS Iin 5.5 ±150 µA Vin = VDD or VSS. Output in High-Impedance State IOZ 5.5 ±100 nA 5.5 ±5.0 µA Maximum Quieschent Supply Current Vin = VDD or VSS: Outputs Open; Excluding fin Amp Input Current Component IDD 5.5 100 µA Maximum Operating Supply Current fin = 500 mVpp; OSCin = 1.0 MHz @ 1.0 Vpp; LD, fR, fV, REFout = Inactive and No Connect; OSCout, φV, φR, PDout = No Connect; Din, ENB, CLK = VDD or VSS Idd – [Note 2] mA Maximum Output Leakage Current (PDout) (Dout) NOTES: 1. When DC coupling to the OSCin pin is used, the pin must be driven rail–to–rail, In this case, OSCout should be floated. 2. The nominal values at 3.0 V are 0.6 mA @ 30 MHz, and 1.5 mA @ 100 MHz. The nominal values at 5.0 V are 3.0 mA @ 50 MHz, and 5.8 mA @ 185 MHz. These are not guaranteed limits. Page 3 of 26 www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 AC INTERFACE CHARACTERISTICS ( TA = –40° to 85°C, CL= 50 pF, Input tr = tr = 10 ns, unless otherwise noted.) Symbol Figure No. VDD V Guaranteed Limit fclk 1 2.7 4.5 5.5 dc to 3.0 dc to 4.0 dc to 4.0 MHz Maximum Propagation Delay, CLK to Dout tPLH, tPHL 1, 5 2.7 4.5 5.5 150 85 85 ns Maximum Disable Time, Dout Active to High Impedance tPLZ, tPHZ 2, 6 2.7 4.5 5.5 300 200 200 ns Access Time, Dout High Impedance to Active tPZL tPZH 2, 6 2.7 4.5 5.5 0 to 200 0 to 100 0 to 100 ns tTLH, tTHL 1, 5 2.7 4.5 5.5 150 50 50 ns 1, 5 2.7 4.5 5.5 900 150 150 ns Parameter Serial Data Clock Frequency (Note: Refer to Clock t w Below) Maximum Output Transition Time, D out CL = 50 pF CL = 200 pF Unit Maximum Input Capacitance – Din, ENB, CLK Cin – 10 pF Maximum Output Capacitance – Dout Cout – 10 pF Unit TIMING REQUIREMENTS ( TA = –40° to 85°C, Input tr = t = 10 ns, unless otherwise noted.) f Parameter Minimum Setup and Hold Times, Din vs CLK Minimum Setup, Hold, and Recovery Times, ENB vs CLK Minimum Inactive–High Pulse Width, ENB Minimum Pulse Width, CLK Maximum Input Rise and Fall Times, CLK Page 4 of 26 Symbol Figure No. VDD V Guaranteed Limit tsu, th 3 2.7 4.5 5.5 55 40 40 ns tsu, th, trec 4 2.7 4.5 5.5 135 100 100 ns tw(H) 4 2.7 4.5 5.5 400 300 300 ns tw 1 2.7 4.5 5.5 166 125 125 ns tr, tf 1 2.7 4.5 5.5 100 100 100 µs www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 SWITCHING WAVEFORMS Figure 1. Figure 2. Figure 3. Figure 4. Figure 5. Test Circuit Figure 6. Test Circuit Ω *Includes all probe and fixtures capacitance. Page 5 of 26 *Includes all probe and fixtures capacitance. www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 LOOP SPECIFICATION ( TA = –40° to 85°C) Guaranteed Range Symbol Figure No. VDD Test Condition V Min Max Unit Vin ≥ 500 mVpp Sine Wave N Counter Set to Divide Ratio Such that f ≤ 2.0 MHz f 7 2.7 3.0 4.5 5.5 5.0 5.0 25 45 80 100 185 185 MHz Input Frequency, OSCin Externally Driven with AC–coupled Signal Vin ≥ 1.0 VPP Sine Wave OSCout = No Connect R Counter Set to Divide Ratio Such that fR ≤ 2 MHz f 8a 2.7 3.0 4.5 5.5 1.0* 1.0* 1.0* 1.0* 22 25 30 35 MHz Crystal Frequency, OSCin and OSCout C1 ≤ 30 pF C2 ≤ 30pF Includes Stray Capacitance fXTAL 9 2.7 3.0 4.5 5.5 2.0 2.0 2.0 2.0 12 12 15 15 MHz Output Frequency REFout CL = 30 pF fout 10, 12 2.7 4.5 5.5 DC DC DC – 10 10 MHz 2.7 4.5 5.5 DC DC DC – 20 20 MHz Parameter Input Frequency, fin [Note] v Operating Frequency of the Phase Detectors f Output Pulse Width, φR, φV, and LD fR in Phase with fV CL = 50 pF Output Transition Times, φR, φV, LD, fR, and fV CL = 50pF Input Capacitance fin OSCin tw 11, 12 2.7 4.5 5.5 – 20 16 – 100 90 ns tTLH, tTHL 11, 12 2.7 4.5 5.5 – – – – 65 60 ns Cin – – – – – – 7.0 7.0 pF * IF lower frequency is desired, use wave shaping or higher amplitude sinusoidal signal in AC–coupled case. Also, see Figure 22 for DC coupling Page 6 of 26 www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 Figure 7. Test Circuit fin Ω *Characteristic Impedance Figure 8. Figure 8a. Test Circuit, OSC Circuit Externally Driven [Note] Figure 8b. Circuit to Eliminate Self–Oscillation, OSC Circuit Externally Driven [Note] µ µ Ω Ω Ω Ω Ω Figure 9. Test Circuit, OSC Circuit with Crystal Figure 10. Switching Waveform Figure 11. Switching Waveform Figure 12. Test Load Circuit *Includes all probe and fixture capacitance. NOTE: Page 7 of 26 Use the circuit of Figure 8b to eliminate self–oscillation of the OSC in pin when the ML145170 has power applied with no external signal. applied at Vin. (Self–oscillation is not harmful to the ML145170 and does not damage the IC.) www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 PIN DESCRIPTIONS DIGITAL INTERFACE PINS Din Serial Data Input (Pin 5) The bit stream begins with the most significant bit (MSB) and is shifted in on the low–to–high transition of CLK. The bit pattern is 1 byte (8 bits) long to access the C or configuration register, 2 bytes (16 bits) to access the N register, or 3 bytes (24 bits) to access the R register. Additionally, the R register can be accessed with a 15–bit transfer (see Table 1). An optional pattern which resets the device is shown in Figure 13. The values in the C, N, and R registers do not change during shifting because the transfer of data to the registers is controlled by ENB. The bit stream needs neither address nor steering bits due to the innovative BitGrabber registers. Therefore, all bits in the stream are available to be data for the three registers. Random access of any register is provided (i.e., the registers may be accessed in any sequence). Data is retained in the registers over a supply range of 2.7 to 5.5 V. The formats are shown in Figures 13, 14, 15, and 16. Din typically switches near 50% of VDD to maximize noise immunity. This input can be directly interfaced to CMOS devices with outputs guaranteed to switch near rail–to–rail. When interfacing to NMOS or TTL devices, either a level shifter (MC74HC14A, MC14504B) or pull–up resistor of 1 to 10 kΩ must be used. Parameters to consider when sizing the resistor are worst–case IOL of the driving device, maximum tolerable power consumption, and maximum data rate. Table 1. Register Access (MSBs are shifted in first, C0, N0, and R0 are the LSBs) Number of Clocks Accessed Register 9 to 13 8 16 15 or 24 Other Values ≤ 32 Values > 32 See Figure 13 C Register N Register R Register None See Figures 24 – 31 Bit Nomenclature (Reset) C7, C6, C5,…, C0 N15, N14, N13,…, N0 R14, R13, R12,…, R0 CLK Serial Data Clock Input (Pin 7) Low–to–high transistion on Clock shift bits available at Din, while high–to–low transitions shift bits from D out. The chip’s 16–1/2–stage shift register is static, allowing clock rates down to DC in a continuous or intermittent mode. Four to eight clock cycles followed by five clock cycles are needed to reset the device; this is optional. Eight clock cycles are required to access the C register. Sixteen clock cycles are needed for the N register. Either 15 or 24 cycles can be used to access the R register (see Table 1 and Figures 13, 14, 15, and 16). For cascaded devices, see Figures 24 to 31. CLK typically switches near 50% of VDD and has a Schmitt–triggered input buffer. Slow CLK rise and fall times are allowed. See the last paragraph of Din for more information. Page 8 of 26 NOTE To guarantee proper operation of the power–on reset (POR) circuit, the CLK pin must be held at the potential of either the VSS or VDD pin during power up. That is, the CLK input should not be floated or toggled while the VDD pin is ramping from 0 to at least 2.7 V. If control of the CLK pin is not practical during power up, the initialization sequence shown in Figure 13 must be used. ENB Active–Low Enable Input (Pin 6) This pin is used to activate the serial interface to allow the transfer of data to/from the device. When ENB is in an inactive high state, shifting is inhibited, Dout is forced to the high–impedance state, and the port is held in the initialized state. To transfer data to the device, ENB (which must start inactive high) is taken low, a serial transfer is made via Din and CLK, and ENB is taken back high. The low–to–high transition on ENB transfers data to the C, N, or R register depending on the data stream length per Table 1. Note Transitions on ENB must not be attempted while CLK is high. This puts the device out of synchronization with the microcontroller. Resynchronization occurs when ENB is high and CLK is low. This input is also Schmitt–triggered and switches near 50% of VDD, thereby minimizing the chance of loading erroneous data into the registers. See the last paragraph of Din for more information. Dout Three–State Serial Data Output (Pin 8) Data is transferred out of the 16–1/2–stage shift register through Dout on the high–to–low transition of CLK. This output is a No Connect, unless used in one of the manners discussed below. Dout could be fed back to an MCU/MPU to perform a wrap–around test of serial data. This could be part of a system check conducted at power up to test the integrity of the system’s processor, PC board traces, solder joints, etc. Finally, Dout facilitates trouble shooting a system and permits cascading devices. REFERENCE PINS OSCin/OSCout Reference Oscillator Input/Output (Pins 1, 2) These pins form a reference oscillator when connected to terminals of an external parallel–resonant crystal. Frequency setting capacitors of appropriate values as recommended by the crystal supplier are connected from each pin to ground (up to a maximum of 30 pF each, including stray capacitance). An external feedback resistor of 1.0 to 5.0 MΩ is connected directly across the pins to ensure linear operation of the amplifier. The required connections for the components are shown in Figure 9. If desired, an external clock source can be AC coupled to OSCin. A 0.01 µF coupling capacitor is used for measurement purposes and is the minimum size recommended for www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 applications. An external feedback resistor of approximately 5 MΩ is required across the OSCin and OSCout pins in the AC–coupled case (see Figure 8a or alternate circuit 8b). OSCout is an internal node on the device and should not be used to drive any loads (i.e. OSCout is unbuffered). However, the buffered REFout is available to drive external loads. The external signal level must be at least 1 V p–p; the maximum frequencies are given in the Loop Specifications table. These maximum frequencies apply for R Counter divide ratios as indicated in the table. For very small ratios, the maximum frequency is limited to the divide ratio times 2 MHz. (Reason: the phase/frequency detectors are limited to a maximum input frequency of 2 MHz.) If an external source is available which swings virtually rail–to–rail (VDD to VSS), then DC coupling can be used. In the DC–coupled case, no external feedback resistor is needed. OSCout must be a No Connect to avoid loading an internal node on the device, as noted above. For frequencies below 1 MHz, DC coupling must be used. The R counter is a static counter and may be operated down to DC. However, wave shaping by a CMOS buffer may be required to ensure fast rise and fall times into the OSCin pin. See Figure 22. Each rising edge on the OSCin pin causes the R counter to decrement by one. REFout Reference Frequency Output (Pin 3) This output is the buffered output of the crystal–generated reference frequency or externally provided reference source. This output may be enabled, disabled, or scaled via bits in the C register (see Figure 14). REFout can be used to drive a microprocessor clock input, thereby saving a crystal. Upon power up, the on–chip power–on–initialize circuit forces REFout to the OSCin divided–by–8 mode. REFout is capable of operation to 10 MHz; see the Loop Specifications table. Therefore, divide values for the reference divider are restricted to two or higher for OSCin frequencies above 10 MHz. If unused, the pin should be floated and should be disabled via the C register to minimize dynamic power consumption and electromagnetic interference (EMI). COUNTER OUTPUT PINS fR R Counter Output (Pin 9) This signal is the buffered output of the 15–stage R counter. fR can be enabled or disabled via the C register (patented). The output is disabled (static low logic level) upon power up. If unused, the output should be left disabled and unconnected to minimize interference with external circuitry. The fR signal can be used to verify the R counter’s divide ratio. This ratio extends from 5 to 32,767 and is determined by the binary value loaded into the R register. Also, direct access to the phase detector via the OSCin pin is allowed by choosing a divide value of 1 (see Figure 15). The maximum frequency which the phase detectors operate is 2 MHz. Therefore, the frequency of fR must not exceed 2 MHz. When activated, the f R signal appears as normally low and pulses high. The pulse width is 4.5 cycles of the OSCin pin sigPage 9 of 26 nal, except when a divide ration of 1 is selected. When 1 is selected, the OSCin signal is buffered and appears at the fR pin. fV N Counter Output (Pin 10) This signal is the buffered output of the 16–stage N counter. fV can be enabled or disabled via the C register (patented). The output is disabled (static low logic level) upon power up. If unused, the output should be left disabled and unconnected to minimize interference with external circuitry. The fV signal can be used to verify the N counter’s divide ratio. This ratio extends from 40 to 65,535 and is determined by the binary value loaded into the N register. The maximum frequency which the phase detectors operate is 2 MHz. Therefore, the frequency of fV must not exceed 2 MHz. When activated, the fV signal appears as normally low and pulses high. LOOP PINS f in Frequency Input (Pin 4) This pin is a frequency input from the VCO. This pin feeds the on–chip amplifier which drives the N counter. This signal is normally sourced from an external voltage–controlled oscillator (VCO), and is AC–coupled into f in. A 100 pF coupling capacitor is used for measurement purposes and is the minimum size recommended for applications (see Figure 7). The frequency capability of this input is dependent on the supply voltage as listed in the Loop Specifications table. For small divide ratios, the maximum frequency is limited to the divide ratio times 2 MHz. (Reason: the phase/frequency detectors are limited to a maximum frequency of 2 MHz.) For signals which swing from at least the VIL to VIH levels listed in the Electrical Characteristics table, DC coupling may be used. Also, for low frequency signals, (less than the minimum frequencies shown in the Loop Specifications table), DC coupling is a requirement. The N counter is a static counter and may be operated down to DC. However, wave shaping by a CMOS buffer may be required to ensure fast rise and fall times into the f in pin. See Figure 22. Each rising edge on the f in pin causes the N counter to decrement by 1. PDout Single–Ended Phase/Frequency Detector Output (Pin 13) This is a three–state output for use as a loop error signal when combined with an external low–pass filter. The detector’s dead zone has been eliminated. Therefore, the phase/frequency detector is characterized by a linear transfer function. The operation of the phase/frequency detector is described below and is shown in Figure 17. POL bit (C7) in the C register = low (see Figure 14) Frequency of fV > fR or Phase of fV Leading fR: negative pulses from high impedance Frequency of fV < fR or Phase of fV Lagging fR: positive pulses from high impedance Frequency and Phase of fV = fR; essentially high–impedance state; voltage at pin determined by loop filter POL bit (C7) = high www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 Frequency of fV > fR or Phase of fV Leading fR: positive pulses from high impedance Frequency of fV < fR or Phase of fV Lagging fR: negative pulses from high impedance Frequency and Phase of fV = fR: essentially high–impedance state; voltage at pin determined by loop filter This output can be enabled, disabled, and inverted via the C register. If desired, PDout can be forced to the high–impedance state by utilization of the disable feature in the C register (patented). φR and φV Double–Ended Phase/Frequency Detector Outputs (Pins 14, 15) These outputs can be combined externally to generate a loop error signal. Through use of a Motorola patented technique, the detector’s dead zone has been eliminated. Therefore, the phase/frequency detector is characterized by a linear transfer function. The operation of the phase/frequency detector is described below and is shown in Figure 17. POL bit (C7) in the C register = low (see Figure 14) Frequency of fV > fR or Phase of fV Leading fR: φV = negative pulses, φR = essentially high Frequency of fV < fR or Phase of fV Lagging fR: φV = essentially high, φR = negative pulses Frequency and Phase of fV = fR: φV and φR remain essentially high, except for a small minimum time period when both pulse low in phase POL bit (C7) = high Frequency of fV > fR or Phase of fV Leading fR: φR = negative pulses, φV = essentially high Frequency of fV < fR or Phase of fV Lagging fR: φR = essen- tially high, φV = negative pulses Frequency and Phase of fV = fR: φV and φR remain essentially high, except for a small minimum time period when both pulse low in phase These outputs can be enabled, disabled, and interchanged via the C register (patented) LD Lock Detector Output (Pin 11) This output is essentially at a high level with narrow low–going pulses when the loop is locked (fR and fV of the same phase and frequency). The output pulses low when fV and fR are out of phase or different frequencies (See Figure 17). This output can be enabled and disabled via the C register (patented). Upon power up, on–chip initialization circuitry disables LD to a static low logic level to prevent a false “lock” signal. If unused, LD should be disabled and left open. POWER SUPPLY VDD Most Positive Supply Potential (Pin 16) This pin may range from 2.7 to 5.5 V with respect to VSS. For optimum performance, VDD should be bypassed to VSS using low–inductance capacitor(s) mounted very close to the device. Lead lengths on the capacitor(s) should be minimized. (The very fast switching speed of the device causes current spikes on the power leads.) VSS Most Negative Supply Potential (Pin 12) This pin is usually ground. For measurement purposes, the VSS pin is tied to a ground plane. Figure 13. Reset Sequence NOTE: Page 10 of 26 This initialization sequence is usually not necessary because the on–chip power–on reset circuit performs the initialization function. However, this initialization sequence must be used immediately after power up if control of the CLK pin is not possible. That is, if CLK (Pin 7) toggles or floats upon power up, use the above sequence to reset the device. Also, use this sequence if power is momentarily interrupted such thh h at the supply voltage to the device is reduced to below 2.7 V, but not down to at least 1 V (for example, the supply drops down to 2 V). This is necessary because the on–chip power–on reset is only activated when the supply ramps up from a voltage below approximately 1.0 V. www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 Figure 14. C Register Access and Format (8 Clock Cycles are Used) *At this point, the new byte is transferred to the C register and stored. No other registers are affected. C7–POL: C6–PDA/B: C5–LDE: C4–C2, OSC2–OSC0: Page 11 of 26 Selects the output polarity of the phase/frequency detectors. When set high, this bit inverts PDout and interchanges the φR funtion with φV as depicted in Figure 17. Also see the phase detector output pin description for more information. This bit is cleared low at power up. Selects which phase/frequency detector is to be used. When set high, enables the output of phase/frequency detector A (PDout) and disables phase/frequency detector B by forcing φR and φV to the static high state. When cleared low, phase/frequency detector B is enabled (φ R and φV) and phase/frequency detector A is disabled with PDout forced to the high–impedance state. This bit is cleared low at power up. Enables the lock detector output when set high. When the bit is cleared low, the LD output is forced to a static low level. This bit is cleared low at power up. Reference output controls which determine the REFout characteristics as shown below. Upon power up, the bits are initialized such that OSCin/8 is selected. C4 C3 C2 0 0 0 DC (Static Low) 0 0 1 OSCin 0 1 0 OSCin /2 0 1 1 OSCin /4 1 0 0 OSCin /8 (POR Default) 1 0 1 OSCin /16 1 1 0 OSCin /8 1 1 1 OSCin /16 REFout Frequency C1–fVE: Enables the fV output when set high. When cleared low, the fV output is forced to a static low level. The bit is cleared low upon power up. C0–fRE: Enables the fR output when set high. When cleared low, the fR output is forced to a static low level. The bit is cleared low upon power up. www.lansdale.com Issue A Page 12 of 26 www.lansdale.com *At this point, the new data is transferred to the R register and stored. No other registers are affected. ÷ ÷ ÷ ÷ ÷ ÷ Figure 15. R Register Access and Formats (Either 24 or 15 Clock Cycles Can Be Used) ML145170 LANSDALE Semiconductor, Inc. ?????? ??? Issue A LANSDALE Semiconductor, Inc. ML145170 Figure 16. N Register Access and Format (16 Clock Cycles Are Used) ⋅⋅ ⋅ ⋅⋅ ⋅ ⋅⋅ ⋅ ⋅⋅ ⋅ ⋅⋅ ⋅ ⋅⋅ ⋅ ⋅⋅ ⋅ ⋅⋅ ⋅ ÷ ÷ ÷ ÷ ÷ ÷ *At this point, the two new bytes are transferred to the N register and stored. No other registers are affected. In addition, the N and R counters are jam–loaded and begin counting down together. Figure 17. Phase/Frequency Detectors and Lock Detector Output Waveform ÷ ÷ φ φ NOTE: Page 13 of 26 The PDout generates error pulses during out–of–lock conditions. When locked in phase and frequency, the output is high impedance and the voltage at that pin is determined by the low–pass filter capacitor. PDout, φR and φV are shown with the polarity bit (POL) - low; see Figure 14 for POL. www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 CRYSTAL OSCILLATOR CONSIDERATIONS The following options may be considered to provide a reference frequency to Lansdale’s/Motorola’s CMOS frequency synthesizers. Use of a Hybrid Crystal Oscillator Commercially available temperature–compensated crystal oscillators (TCXOs) or crystal–controlled data clock oscillators provide very stable reference frequencies. An oscillator capable of CMOS logic levels at the output may be direct or DC coupled to OSCin. If the oscillator does not have CMOS logic levels on the outputs, capacitive or AC coupling to OSCin may be used (see Figures 8a and 8b). For additional information about TCXOs, visit freescale.com on the world wide web. Use of the On–Chip Oscillator Circuitry The on–chip amplifier (a digital inverter) along with an appropriate crystal may be used to provide a reference source frequency. A fundamental mode crystal, parallel resonant at the desired operating frequency, should be connected as shown in Figure 18. The crystal should be specified for a loading capacitance (CL) which does not exceed 20 pF when used at the highest operating frequencies listed in the Loop Specifications table. Larger CL values are possible for lower frequencies. Assuming R1 = 0 Ω, the shunt load capacitance (CL) presented across the C L C C out in C C out in Ca C stray C1 C1 use of R1 is not necessary in most cases. To verify that the maximum DC supply voltage does not cause the crystal to be overdriven, monitor the output frequency at the REFout pin (OSCout is not used because loading impacts the oscillator). The frequency should increase very slightly as the DC supply voltage is increased. An overdriven crystal decreases in frequency or becomes unstable with an increase in supply voltage. The operating supply voltage must be reduced or R1 must be increased in value if the overdriven condition exists. The user should note that the oscillator start–up time is proportional to the value of R1. Through the process of supplying crystals for use with CMOS inverters, many crystal manufacturers have developed expertise in CMOS oscillator design with crystals. Discussions with such manufacturers can prove very helpful (see Table 2). Figure 18. Pierce Crystal Oscillator Circuit C2 C2 *May be needed in certain cases. See text. where Cin = Cout = Ca = C1 and C2 = Cstray = 5.0 pF (see Figure 19) 6.0 pF (see Figure 19) 1.0 pF (see Figure 19) external capacitors (see Figure 18) the total equivalent external circuit stray capacitance appearing across the crystal terminals crystal can be estimated to be: The oscillator can be “trimmed” on–frequency by making a portion or all of C1 variable. The crystal and associated components must be located as close as possible to the OSCin and OSCout pins to minimize distortion, stray capacitance, stray inductance, and startup stabilization time. Circuit stray capacitance can also be handled by adding the appropriate stray value to the values for Cin and Cout. For this approach, the term Cstray becomes 0 in the above expression for CL. A good design practice is to pick a small value for C1 such as 5 o 10 pF. Next, C2 is calculated. C1 < C2 results in a more robust circuit for start–up and is more tolerant of crystal parameter variations. Power is dissipated in the effective series resistance of the crystal Re, in Figure 20. The maximum drive level specified by the crystal manufacturer represents the maximum stress that the crystal can withstand without damage or excessive shift in operating frequency. R1 in Figure 18 limits the drive level. The Page 14 of 26 www.lansdale.com Figure 19. Parasitic Capacitances of the Amplifier and Cstray Figure 20. Equivalent Crystal Networks NOTE: Values are supplied by crystal manufacturer (parallel resonant crystal). Issue A LANSDALE Semiconductor, Inc. ML145170 Technical Note TN–24, Statek Corp. Technical Note TN–7, Statek Corp. E. Hafner, “The Piezoelectric Crystal Unit–Definitions and Method of Measurement”, Proc. IEEE, Vol 57, No. 2, Feb. 1969 D. Kemper, L Rosine, “Quartz Crystals for Frequency Control”, Electro–Technology, June 1969 P.J. Ottowitz, “A Guide to Crystal Selection”, Electronic Design, May 1966 D. Babin, “Designing Crystal Oscillators”, Machine Design, March 7, 1985 D. Babin, “Guidelines for Crystal Oscillator Design”, Machine Design, April 25, 1985 See web site Lansdale.com for ML145170 software. Table 2. Partial List of Crystal Manufacturers CTS Corp. United States Crystal Corp. Crystek Crystal Statek Corp. Fox Electronics NOTE: Page 15 of 26 Lansdale cannot recommend one supplier over another and in no way suggests that this is a complete listing of crystal manufactuers. www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 PHASE–LOCKED LOOP—LOW PASS FILTER DESIGN (A) φ ω ω ζ (B) φ φ ω ζ ω (C) ω φ φ φ = ζ= φ ω NOTES: 1. For (C), R1 is frequently split into two series resistors; each resistor is equal to R1 divided by 2. A capacitor C C is then placed from the midpoint to ground to further filter the error pulses. The value of CC should be such that the corner frequency of this network does not significantly affect ωn. 2. The φR and φV outputs swing rail–to–rail. Therefore, the user should be careful not to exceed the common mode input range of the op amp. 3. For the latest information on MC33077 or equivalent, contact ON Semiconductor. DEFINITIONS: N = Total Division Ratio in Feedback Loop Kφ (Phase Detector Gain) = VDD / 4π volts per radian for PDout Kφ (Phase Detector Gain) = VDD / 2π volts per radian for φV and φR KVCO (VCO Gain) = 2π∆fVCO ∆VVCO For a nominal design starting point, the user might consider a damping factor ζ ≈ 0.7 anda natural loop frequency ωn ≈ (2πfR/50) where fR is the frequency at the phase detector input. Larger ωn values result in faster loop lock times and, for similar sideband filtering,higher fR–related VCO sidebands. RECOMMENDED READING: Gardner, Floyd M., Phaselock Techniques (second edition). New York, Wiley–Interscience, 1979. Manassewitsch, Vadim, Frequency Synthesizers: Theory and Design (second edition). New York, Wiley–Interscience, 1980. Blanchard, Alain, Phase–Locked Loops: Application to Coherent Receiver Design, New York, Wiley–Interscience, 1976. Egan, William F., Frequency Synthesis by Phase Lock, New York, Wiley–Interscience, 1981 Rohde, Ulrich, L., Digital PLL Frequency Synthesizers Theory and Design, Englewood Cliffs, NJ, Prentice–Hall 1983. Berlin, Howard M., Design of Phase–Locked Loop Circuits with Experiments, Indianapolis, Howard W. Sams and Co. 1978. Kinley, Harold., The PLL Synthesizer Cookbook, Blue Ridge Summit, PA, Tab Books, 1980. Seidman, Arthur H., Integrated Circuits Applications Handbook, Chapter 17, pp. 538-586. New York, John Wiley & Sons. Fadrhons, Jan, “Design and Analyze PLLs on a Programmable Calculator,” EDN. March 5, 1980. AN535, Phase–Locked Loop Design Fundamentals, Motorola Semiconductor Products, Inc. AR254, Phase–Locked Loop Design Articles, Motorola Semiconductor Products, Inc., Reprinted with permission from Electronic Design, 1987. AN1207, The MC145170 in Basic HF and VHF Oscillators, Motorola Semiconductor Products, Inc., 1992. AN1671, MC145170 PSpice Modeling Kit, Motorola Semiconductor Products, Inc., 1998. Page 16 of 26 www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 Figure 21. Example Application φ ML145170 φ NOTES: 1. The φR and φV outputs are fed to an external combiner/loop filter. See the Phase–Locked Loop—Low–Pass Filter Design page for additional information. The φR and φV outputs swing rail–to–rail. Therefore, the user should be careful not to exceed the common mode input range of the op amp used in the combiner/loop filter. 2. For optimum performance, bypass the VDD pin to VSS (GND) with one or more low–inductance capacitors. 3. The R counter is programmed for a divide value = OSCin/fR. Typically, fR is the tuning resolution required for the VCO. Also, the VCO frequency divided by fR = N, where N is the divide value of the N counter. 4. May be an R–C low–pass filter. 5. May be a bipolar transistor. Page 17 of 26 www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 Figure 22. Low Frequency Operation Using DC Coupling ML145170 NOTE: The signals at Points A and B may be low–frequency sinusoidal or square waves with slow edge rates or noisy signal edges. At Points C and D, the signals are cleaned up, have sharp edge rates, and rail–to–rail signal swings. With signals as described at Points C and D, the ML145170 is guaranteed to operate down to a frequency as low as DC. Refer to the MC74HC14A data sheet for input switching levels and hysteresis voltage range. Page 18 of 26 www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 Figure 23. Input Impedance at fin — Series Format (R + jX) (5.0 MHz to 185 MHz) Ω Ω Figure 24. Cascading Two ML145170 Devices ML145170 ML145170 Ω NOTES: 1. The 33 kΩ resistor is needed to prevent the Din pin from floating. (The Dout pin is a three–state output.) 2. See related Figures 25, 26, and 27. Page 19 of 26 www.lansdale.com Issue A Page 20 of 26 ?????? ??? www.lansdale.com NOTE: At this point, the new data is transferred to the R reigisters of both devices and stored. No other registers are affected. Figure 26. Accessing the R Registers of Two Cascading ML145170 Devices NOTE: At this point, the new data is transferred to the C registers of both devices and stored. No other registers are affected. Figure 25. Accessing the C Registers of Two Cascading ML145170 Devices ML145170 LANSDALE Semiconductor, Inc. ?????? ??? Issue A Page 21 of 26 NOTE: At this point, the new data is transferred to the N registers of both devices and stored. No other registers are affected. Figure 27. Accessing the N Registers of Two Cascaded ML145170 Devices ML145170 LANSDALE Semiconductor, Inc. www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 Figure 28. Cascading Two Different Device Types ML145170 Ω NOTES: 1. The 33 kΩ resistor is needed to prevent the D in pin from floating (The Dout pin is a three–state output.) 2. This PLL Frequency Synthesizer may be a ML12210, ML12202, etc.,… 3. See related Figures 29, 30, and 31. Page 22 of 26 www.lansdale.com Issue A Page 23 of 26 ?????? ??? www.lansdale.com NOTE: At this point, the new data is transferred to the A register of Device #2 and R register of Device #1 and stored. No other registers are affected Figure 30. Accessing the A and R Registers of Two Different Device Types NOTE: At this point, the new data is transferred to the C registers of both devices and stored. No other registers are affected. Figure 29. Accessing the C Registers of Two Different Device Types ML145170 LANSDALE Semiconductor, Inc. ?????? ??? Issue A Page 24 of 26 NOTE: At this point, the new data is transferred to the R register of Device #2 and N register of Device #1 and stored. No other registers are affected. Figure 31. Accessing the R and N Registers of Two Different Device Types ML145170 LANSDALE Semiconductor, Inc. ?????? ??? www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 OUTLINE DIMENSIONS TSSOP 16 = -7P PLASTIC PACKAGE CASE 948C-03 (ML145170-7P) ISSUE B A -P- 16 16x K REF 9 B L PIN 1 IDENTIFICATION 1 8 -U- C D -T- H G A K J1 K1 M ° ° ° ° J A SECTION A–A Page 25 of 26 F www.lansdale.com Issue A LANSDALE Semiconductor, Inc. ML145170 OUTLINE DIMENSIONS P DIP 16 = EP PLASTIC PACKAGE CASE 648-08 (ML145170EP) ISSUE R -A- B F C L S -TK H G D M J 16 PL SO 16 = -5P PLASTIC PACKAGE CASE 751B-05 (ML145170-5P) (SOG-16) ISSUE J -A- -B- P 8 PL G R K F X 45 C -TM D J 16 PL Lansdale Semiconductor reserves the right to make changes without further notice to any products herein to improve reliability, function or design. Lansdale does not assume any liability arising out of the application or use of any product or circuit described herein; neither does it convey any license under its patent rights nor the rights of others. T Ò ypical ” parameters which may be provided in Lansdale data sheets and/or specifications can vary in different applications, and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by the customer’s technical experts. Lansdale Semiconductor is a registered trademark of Lansdale Semiconductor, Inc. Page 26 of 26 www.lansdale.com Issue A