NSC LP2994MX

LP2994
DDR Termination Regulator
General Description
Features
The LP2994 regulator is designed to provide a linear solution
to meet the JEDEC SSTL-2 and SSTL-3 specifications (Series Stub Termination Logic) for active termination of DDRSDRAM. The device utilizes an internal operational amplifier
to provide linear regulation of VTT without the need for
expensive external components. The output stage prevents
shoot through while delivering 1.5A continuous current and
maintaining excellent load regulation. The LP2994 also incorporates an active low shutdown pin to tri-state the output
during Suspend To Ram (STR) states.
Patents Pending
n
n
n
n
n
n
n
Source and sink current
Low external component count
Independent analog and power rails
Linear topology
Small package SO-8
Low cost and easy to use
Shutdown pin
Applications
n
n
n
n
SSTL-2
SSTL-3
DDR-SDRAM Termination
DDR-II Termination
Typical Application Circuit
20045904
FIGURE 1. SSTL-2 VTT Termination
© 2002 National Semiconductor Corporation
DS200459
www.national.com
LP2994 DDR Termination Regulator
May 2002
LP2994
Connection Diagram
SO-8 (M08A) Package
20045902
Top View
Pin Description
SO-8 Pin
Name
1
NC
Function
2
GND
3
VSENSE
4
SD
5
VDDQ
Input for internal reference equal to VDDQ/2
6
AVIN
Analog input pin
7
PVIN
Power input pin
8
VTT
Output voltage for connection to termination resistors
No internal connection
Ground
Feedback pin for regulating VTT
Active low shutdown pin
Ordering Information
Order Number
Package Type
NSC Package
Drawing
LP2994M
SO-8
M08A
95 Units per Rail
LP2994MX
SO-8
M08A
2500 Units Tape and Reel
www.national.com
2
Supplied As
Operating Range
(Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
PVIN, AVIN, VTT, VDDQ, SD to GND
Junction Temp. Range (Note 3)
−0.3V to +6V
Storage Temp. Range
−65˚C to +150˚C
Junction Temperature
150˚C
Lead Temperature (Soldering, 10 sec)
260˚C
ESD Rating (Note 2)
0˚C to +125˚C
AVIN Supply Voltage
2.2V to 5.5V
PVIN Supply Voltage
-0.3V to (AVIN +
0.3V)
SD Input Voltage
-0.3V to (AVIN +
0.3V)
VTT Output Voltage
-0.3V to (PVIN +
0.3V)
2kV
SO-8 Thermal Resistance (θJA)
151˚C/W
Electrical Characteristics
Specifications with standard typeface are for TJ = 25˚C and limits in boldface
type apply over the full Operating Temperature Range (TJ = 0˚C to +125˚C). Unless otherwise specified,
AVIN = PVIN = 2.5V, VDDQ = 2.5V (Note 4).
Symbol
VTT
Parameter
VTT Output Voltage
IOUT = 0A (Note 5)
Iq
Quiescent Current
ZVDDQ
VDDQ Input Impedance
IQSD
Quiescent current in
shutdown
ISD
Shutdown Leakage
Current
VIH
Minimum Shutdown High
Level
VIL
Maximum Shutdown Low
Level
∆VTT/VTT
Load Regulation
(Note 7)
ISENSE
Conditions
VIN=VDDQ = 2.3V
Min
Typ
Max
1.108
1.138
1.168
VIN=VDDQ = 2.5V
1.210
1.236
1.260
VIN=VDDQ = 2.7V
1.305
1.334
1.360
272
400
IOUT = 0A
(Note 6)
86
SD = 0V
SD = 2.5V
100
V
µA
kΩ
21
45
µA
2
2
5
µA
nA
1.9
V
0.8
IOUT = 0 to 1.5A
-0.4
IOUT = 0 to −1.5A
+0.4
SENSE Input Current
Units
100
V
%
pA
Note 1: Absolute maximum ratings indicate limits beyond which damage to the device may occur. Operating range indicates conditions for which the device is
intended to be functional, but does not guarantee specific performance limits. For guaranteed specifications and test conditions see Electrical Characteristics. The
guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed
test conditions.
Note 2: The human body model is a 100pF capacitor discharged through a 1.5kΩ resistor into each pin.
Note 3: At elevated temperatures, devices must be derated based on thermal resistance. The device in the SO-8 package must be derated at θJA = 151.2˚ C/W
junction to ambient with no heat sink.
Note 4: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control
(SQC) methods. The limits are used to calculate National’s Average Outgoing Quality Level (AOQL).
Note 5: VIN is defined as the VIN = AVIN = PVIN
Note 6: Quiescent current defined as the current flow into AVIN.
Note 7: Load regulation is tested by using a 10ms current pulse and measuring VTT.
3
www.national.com
LP2994
Absolute Maximum Ratings
LP2994
Typical Performance Characteristics
Iq vs VIN (25˚C)
Iq vs VIN (0, 25, and 125˚C)
20045914
20045915
Iq vs Temperature ( VIN = 2.5V)
ISD vs VIN (25˚C)
20045916
20045917
ISD vs VIN (0, 25, and 125˚C)
ISD vs Temperature ( VIN = 2.5V)
20045919
20045918
www.national.com
4
LP2994
Typical Performance Characteristics
(Continued)
Maximum Sourcing Current vs AVIN
(VDDQ = 2.5V, PVIN = 1.8V)
VIL and VIHvs AVIN (25˚C)
20045920
20045921
Maximum Sourcing Current vs AVIN
(VDDQ = 2.5V, PVIN = 2.5V)
Maximum Sourcing Current vs AVIN
(VDDQ = 2.5V, PVIN = 3.3V)
20045922
20045923
Maximum Sinking Current vs AVIN
(VDDQ = 2.5V)
Maximum Sourcing Current vs AVIN
(VDDQ = 1.8V, PVIN = 1.8V)
20045924
20045925
5
www.national.com
LP2994
Typical Performance Characteristics
(Continued)
Maximum Sinking Current vs AVIN
(VDDQ = 1.8V)
Maximum Sourcing Current vs AVIN
(VDDQ = 1.8V, PVIN = 3.3V)
20045926
20045927
VTT vs IOUT (0, 25, 85, and 125˚C)
VTT vs IOUT
20045929
www.national.com
20045930
6
LP2994
Block Diagram
20045903
the memory and one RT termination resistor. Typical values
for RS and RT are 25 Ohms, although these can be changed
to scale the current requirements from the LP2994. This
implementation can be seen below in Figure 2.
Description
The LP2994 is a linear bus termination regulator designed to
meet the JEDEC requirements of SSTL-2 and SSTL-3. The
output, VTT is capable of sinking and sourcing current while
regulating the output voltage equal to VDDQ / 2. The output
stage has been designed to maintain excellent load regulation while preventing shoot through. The LP2994 also incorporates two distinct power rails which separates the analog
circuitry from the power output stage. This allows a split rail
approach to be utilized to decrease internal power dissipation. It also permits the LP2994 to provide a termination
solution for the next generation of DDR-SDRAM memory
(DDRII).
Series Stub Termination Logic (SSTL) was created to improve signal integrity of the data transmission across the
memory bus. This termination scheme is essential to prevent
data error from signal reflections while transmitting at high
frequencies encountered with DDR-SDRAM. The most common form of termination is Class II single parallel termination. This involves one RS series resistor from the chipset to
20045931
FIGURE 2. SSTL Termination Scheme
7
www.national.com
LP2994
regulating the output precisely to VDDQ / 2. The LP2994 is
designed to handle peak transient currents of up to +/- 3A
with excellent load regulation. The maximum continuous
current is a function of AVIN and PVIN and several curves
can be seen in the Typical Performance Characteristics section. If a transient is expected to last above the maximum
continuous current rating for a significant amount of time,
then the bulk output capacitor should be sized large enough
to prevent an excessive voltage drop. Despite the fact that
the LP2994 is designed to handle large transient output
currents it is not capable of handling these for long durations
under all conditions. The reason for this is that the SO-8
package is not able to thermally dissipate an infinite amount
of heat as a result of internal power loss. If large currents are
required for longer durations, then care should be taken to
ensure that the maximum junction temperature is not exceeded. Proper thermal de-rating should always be used
(Please refer to the Thermal Dissipation section).
Pin Descriptions
AVIN and PVIN
AVIN and PVIN are the input supply pins for the LP2994.
AVIN is used to supply all the internal control circuitry. PVIN,
however, is used exclusively to provide the rail voltage for
the output stage used to create VTT. These pins have the
capability to work off separate supplies depending on the
application. Higher voltages on PVIN will increase the maximum continuous output current because of output RDSON
limitations at voltages close to VTT. The disadvantage of high
values of PVIN is that the internal power loss will also
increase, thermally limiting the design. For SSTL-2 applications, a good compromise would be to connect the AVIN and
PVIN directly together at 2.5V. This eliminates the need for
bypassing the two supply pins separately. The only limitation
on input voltage selection is that PVIN must be equal to or
lower than AVIN.
VDDQ
Component Selection
VDDQ is the input used to create the internal reference
voltage for regulating VTT. The reference voltage is generated from a resistor divider of two internal 50kΩ resistors.
This guarantees that VTT will track VDDQ / 2 precisely. The
optimal implementation of VDDQ is as a remote sense. This
can be achieved by connecting VDDQ directly to the 2.5V rail
at the DIMM instead of AVIN and PVIN. This ensures that the
reference voltage tracks the DDR memory rails precisely
without a large voltage drop from the power lines. For
SSTL-2 applications VDDQ will be a 2.5V signal, which will
create a 1.25V termination voltage at VTT (See Electrical
Characteristics Table for exact values of VTT over temperature).
VSENSE
Input Capacitor
The LP2994 does not require a capacitor for input stability,
but it is recommended for improved performance during
large load transients to prevent the input rail from dropping.
The input capacitor should be located as close as possible to
the PVIN pin. Several recommendations exist dependent on
the application required. A typical value recommended for AL
electrolytic capacitors is 47uF. Ceramic capacitors can also
be used, a value in the range of 10uF with X5R dielectric or
better would be an ideal choice. The input capacitance can
be reduced if the LP2994 is placed close to the bulk capacitance from the output of the 2.5V DC-DC converter. If the two
supply rails (AVIN and PVIN) are separated then the 47uF
capacitor should be placed as close to possible to the PVIN
rail. An additional 0.1uF ceramic capacitor can be placed on
the AVIN rail to prevent excessive noise from coupling into
the device.
The purpose of the sense pin is to provide improved remote
load regulation. In most motherboard applications the termination resistors will connect to VTT in a long plane. If the
output voltage was regulated only at the output of the
LP2994 then the long trace will cause a significant IR drop
resulting in a termination voltage lower at one end of the bus
than the other. The VSENSE pin can be used to improve this
performance, by connecting it to the middle of the bus. This
will provide a better distribution across the entire termination
bus. If remote load regulation is not used then the VSENSE
pin must still be connected to VTT. Care should be taken
when a long VSENSE trace is implemented in close proximity
to the memory. Noise pickup in the VSENSE trace can cause
problems with precise regulation of VTT. A small 0.1uF ceramic capacitor placed next to the VSENSE pin can help filter
any high frequency signals and preventing errors.
Shutdown
The LP2994 contains an active low shutdown pin that can be
used to tri-state VTT. During shutdown VTT should not be
exposed to voltages that exceed PVIN. With the shutdown
pin asserted low the quiescent current of the LP2994 will
drop, however, VDDQ will always maintain its constant impedance of 100kΩ for generating the internal reference.
Therefore to calculate the total power loss in shutdown both
currents need to be considered. For more information refer
to the Thermal Dissipation section. The shutdown pin also
has an internal pull-up current, therefore to turn the part on
the shutdown pin can either be connected to AVIN or left
open.
VTT
Output Capacitor
The LP2994 has been designed to be insensitive of output
capacitor size or ESR (Equivalent Series Resistance). This
allows the flexibility to use any capacitor desired. The choice
for output capacitor will be determined solely on the application and the requirements for load transient response of VTT.
As a general recommendation, the output capacitor should
be sized above 100uF with a low ESR for SSTL applications
with DDR-SDRAM. The value of ESR should be determined
by the maximum current spikes expected and the extent at
which the output voltage is allowed to droop. Several capacitor options are available on the market and a few of these
are highlighted below:
AL - It should be noted that many aluminum electrolytics only
specify impedance at a frequency of 120Hz, which indicates
they have poor high frequency performance. Only aluminum
electrolytics that have an impedance specified at a higher
frequency (approximately 100kHz) should be used for the
LP2994. To improve the ESR several AL electrolytics can be
combined in parallel for an overall reduction. An important
note to be aware of is the extent at which the ESR will
change over temperature. Aluminum electrolytic capacitors
can have their ESR rapidly increase at cold temperatures.
Ceramic - Ceramic capacitors typically have a low capacitance, in the range of 10 to 100uF range, but they have
excellent AC performance for bypassing noise because of
very low ESR (typically less than 10mOhm). However, some
VTT is the regulated output that is used to terminate the bus
resistors. It is capable of sinking and sourcing current while
www.national.com
8
LP2994
Component Selection
(Continued)
dielectric types have poor capacitance characteristics as a
function of voltage and temperature. Because of the typically
low value of capacitance it is recommended to use ceramic
capacitors in parallel with another capacitor such as an
aluminum electrolytic. A dielectric of X5R or better is recommended for all ceramic capacitors.
Hybrid - Several hybrid capacitors such as OS-CON and SP
are available from several manufacturers. These offer a
large capacitance while maintaining a low ESR. These are
the best solution when size and performance are critical,
although their cost is typically higher than other capacitors.
Thermal Dissipation
Since the LP2994 is a linear regulator any current flow from
VTT will result in internal power dissipation generating heat.
To prevent damaging the part from exceeding the maximum
allowable junction temperature, care should be taken to
derate the part dependent on the maximum expected ambient temperature and power dissipation. The maximum allowable internal temperature rise (TRmax) can be calculated
given the maximum ambient temperature (TAmax) of the
application and the maximum allowable junction temperature
(TJmax).
TRmax = TJmax − TAmax
20045928
FIGURE 3. θJA vs Airflow
Additional improvements can be made by the judicious use
of vias to connect the part and dissipate heat to an internal
ground plane. Using larger traces and more copper on the
top side of the board can also help. With careful layout, it is
possible to reduce the θJA further than the nominal values
shown in Figure 3.
Optimizing the θJA and placing the LP2994 in a section of a
board exposed to lower ambient temperature allows the part
to operate with higher power dissipation. The internal power
dissipation can be calculated by summing the three main
sources of loss: output current at VTT, either sinking or
sourcing, and quiescent current at AVIN and VDDQ. During
the active state (when Shutdown is not held low) the total
internal power dissipation can be calculated from the following equations:
PD = PAVIN + PVDDQ + PVTT
From this equation, the maximum power dissipation (PD) of
the part can be calculated:
PDmax = TRmax / θJA
The θJA of the LP2994 will be dependent on several variables: the package used; the thickness of copper; the number of vias and the airflow. For instance, the θJA of the SO-8
is 163˚C/W with the package mounted to a standard 8x4
2-layer board with 1oz. copper, no airflow, and 0.5W dissipation at room temperature. This value can be reduced to
151.2˚C/W by changing to a 3x4 board with 2 oz. copper that
is the JEDEC standard. Figure 3 shows how the θJA varies
with airflow for the two boards mentioned.
where,
PAVIN = IAVIN x VAVIN
PVDDQ = VVDDQ x IVDDQ = VVDDQ2 x RVDDQ
To calculate the maximum power dissipation at VTT, both
sinking and sourcing current conditions at VTT need to be
examined. Although only one equation will add into the total,
VTT cannot source and sink current simultaneously.
PVTT = VVTT x ILOAD (Sinking)
or
PVTT = ( VPVIN - VVTT) x ILOAD (Sourcing)
The power dissipation of the LP2994 can also be calculated
during the shutdown state. During this condition the output
VTT will tri-state, therefore that term in the power equation
will disappear as it cannot sink or source any current (leakage is negligible). The only losses during shutdown will be
the reduced quiescent current at AVIN and the constant
impedance that is seen at the VDDQ pin.
PD = PAVIN + PVDDQ
Where,
PAVIN = IAVIN x VAVIN
PVDDQ = VVDDQ x IVDDQ = VVDDQ2 x RVDDQ
9
www.national.com
LP2994
Typical Application Circuits
SSTL-2 Applications
Several different application circuits have been shown in
Figure 4 through Figure 13 to illustrate some of the options
that are possible in configuring the LP2994. Graphs of the
individual circuit performance can be found in the Typical
Performance Characteristics section in the beginning of the
datasheet. These curves illustrate how the maximum output
current is affected by changes in AVIN and PVIN.
For the majority of applications that implement the SSTL-2
termination scheme, it is recommended to connect all the
input rails to the 2.5V rail. This provides an optimal trade-off
between power dissipation and component count and selection. An example of this circuit can be seen in Figure 4.
20045904
FIGURE 4. Recommended SSTL-2 Implementation
VTT. The disadvantage of this circuit is that the maximum
continuous current is reduced because of the lower rail
voltage, although it is adequate for all motherboard SSTL-2
applications. Increasing the output capacitance can also
help if periods of large load transients will be encountered.
If power dissipation or efficiency is a major concern then the
LP2994 has the ability to operate on split power rails. The
output stage (PVIN) can be operated on a lower rail such as
1.8V and the analog circuitry (AVIN) can be connected to a
higher rail such as 2.5V, 3.3V or 5V. This allows the internal
power dissipation to be lowered when sourcing current from
20045905
FIGURE 5. Lower Power Dissipation SSTL-2 Implementation
the downside of higher thermal dissipation. Care should be
taken to prevent the LP2994 from experiencing large current
levels which cause the junction temperature to exceed the
maximum. Because of this risk it is not recommended to
supply the output stage with a voltage higher than a nominal
3.3V rail.
The third option for SSTL-2 applications in the situation that
a 1.8V rail is not available and it is not desirable to use 2.5V,
is to connect the LP2994 power rail to 3.3V. In this situation
AVIN will be limited to operation on the 3.3V or 5V rail as
PVIN can never exceed AVIN. This configuration has the
ability to provide the maximum continuous output current at
www.national.com
10
LP2994
Typical Application Circuits
(Continued)
20045906
FIGURE 6. SSTL-2 Implementation with higher voltage rails
in the Typical Performance Characteristics. Figure 7 shows
the recommended circuit configuration for DDR-II applications. The output stage is connected to the 1.8V rail and the
AVIN pin can be connected to either a 3.3V or 5V rail.
DDR-II Applications
With the separate VDDQ pin and an internal resistor divider it
is possible to use the LP2994 in applications utilizing DDR-II
memory. Figure 7 and Figure 8 show several implementations of recommended circuits with output curves displayed
20045907
FIGURE 7. Recommended DDR-II Termination
If it is not desirable to use the 1.8V rail it is possible to
connect the output stage to a 3.3V rail. Care should be taken
to not exceed the maximum junction temperature as the
thermal dissipation increases with lower VTT output voltages.
For this reason, it is not recommended to power PVIN off a
rail higher than the nominal 3.3V. The advantage of this
configuration is that it has the ability to source and sink a
higher maximum continuous current.
20045908
FIGURE 8. DDR-II Termination with higher voltage rails
If standards other than SSTL-2 are required, such as
SSTL-3, it may be necessary to use a different scaling factor
than 0.5 times VDDQ for regulating the output voltage. Several options are available to scale the output to any voltage
required. One method is to level shift the output by using
feedback resistors from VTT to the VSENSE pin. This has
been illustrated in Figure 9 and Figure 10. Figure 9 shows
11
www.national.com
LP2994
Typical Application Circuits
VTT = (VDDQ/2) x ( 1 + R1/R2)
(Continued)
how to use two resistors to level shift VTT above the internal
reference voltage of VDDQ/2. To calculate the exact voltage
at VTT the following equation can be used.
20045909
FIGURE 9. Increasing VTT by Level Shifting
Conversely, the R2 resistor can be placed between VSENSE
and VDDQ to shift the VTT output lower than the internal
reference voltage of VDDQ/2. The equations relating VTT and
the resistors can be seen below:
VTT = (VDDQ/2) x ( 1 - R1/R2)
20045910
FIGURE 10. Decreasing VTT by Level Shifting
Reference Voltage
DDR-SDRAM and the motherboard chipsets usually require
a reference voltage which tracks VTT. To implement this
feature in most applications it is advisable to use two equal
resistors as a resistor divider. This prevents long VREF traces
from running across the motherboard picking up noise which
can interfere with performance. However, in a few applications it may be desirable to use the VTT output on the
www.national.com
LP2994 to generate the VREF signal. The can be accomplished by using an RC filter on the output of VTT to create a
VREF signal. Typically, the reference voltage required by
chipsets and memory is well under 1µA combined, therefore,
a fairly large resistor such as 1kΩ or larger can be used. A
recommended capacitor would be a 1uF X7R ceramic
capacitor.
12
LP2994
Typical Application Circuits
(Continued)
20045911
FIGURE 11. Creating a Reference Voltage for Memory and Chipsets
Output Capacitor Selection
For applications utilizing the LP2994 to terminate SSTL-2 I/O
signals the typical application circuit shown in Figure 12 can
be implemented.
20045912
FIGURE 12. Typical SSTL-2 Application Circuit
addition to high frequency decoupling. Figure 13 shown
below depicts an example circuit where 2 bulk output capacitors could be situated at both ends of the VTT plane for
optimal placement. Large aluminum electrolytic capacitors
are used for their low ESR and low cost.
This circuit permits termination in a minimum amount of
board space and component count. Capacitor selection can
be varied depending on the number of lines terminated and
the maximum load transient. However, with motherboards
and other applications where VTT is distributed across a long
plane it is advisable to use multiple bulk capacitors and
20045913
FIGURE 13. Typical SSTL-2 Application Circuit for Motherboards
In most PC applications an extensive amount of decoupling
is required because of the long interconnects encountered
13
www.national.com
LP2994
Typical Application Circuits
4.
For improved thermal performance excessive top side
copper should be used to dissipate heat from the package. Numerous vias from the ground connection to the
internal ground plane will help. Additionally these can be
located underneath the package if manufacturing standards permit.
5.
Care should be taken when routing the VSENSE trace to
avoid noise pickup from switching I/O signals. A 0.1uF
ceramic capacitor located close to the VSENSE can also
be used to filter any unwanted high frequency signal.
This can be an issue especially if long VSENSE traces are
used.
(Continued)
with the DDR-SDRAM DIMMs mounted on modules. As a
result bulk aluminum electrolytic capacitors in the range of
1000uF are typically used.
PCB Layout Considerations
1.
The input capacitor for the power rail should be placed
as close as possible to the PVIN pin.
2. VSENSE should be connected to the VTT termination bus
at the point where regulation is required. For motherboard applications an ideal location would be at the
center of the termination bus.
3. VDDQ can be connected remotely to the VDDQ rail input
at either the DIMM or the Chipset. This provides the
most accurate point for creating the reference voltage.
www.national.com
14
LP2994 DDR Termination Regulator
Physical Dimensions
inches (millimeters)
unless otherwise noted
8-Lead Small Outline Package (M8)
NS Package Number M08
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and
whose failure to perform when properly used in
accordance with instructions for use provided in the
labeling, can be reasonably expected to result in a
significant injury to the user.
National Semiconductor
Corporation
Americas
Email: [email protected]
www.national.com
National Semiconductor
Europe
Fax: +49 (0) 180-530 85 86
Email: [email protected]
Deutsch Tel: +49 (0) 69 9508 6208
English Tel: +44 (0) 870 24 0 2171
Français Tel: +33 (0) 1 41 91 8790
2. A critical component is any component of a life
support device or system whose failure to perform
can be reasonably expected to cause the failure of
the life support device or system, or to affect its
safety or effectiveness.
National Semiconductor
Asia Pacific Customer
Response Group
Tel: 65-2544466
Fax: 65-2504466
Email: [email protected]
National Semiconductor
Japan Ltd.
Tel: 81-3-5639-7560
Fax: 81-3-5639-7507
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.