NEC UPD720100AGM-8ED

DATA SHEET
MOS INTEGRATED CIRCUIT
µPD720100A
USB2.0 HOST CONTROLLER
The µPD720100A complies with the Universal Serial Bus Specification Revision 2.0 and Open Host Controller
Interface Specification for full-/low-speed signaling and Intel's Enhanced Host Controller Interface Specification for
high-speed signaling and works up to 480 Mbps. The µPD720100A is integrated three host controller cores with PCI
interface and USB2.0 transceivers into a single chip.
Detailed function descriptions are provided in the following user’s manual. Be sure to read the manual before designing.
µPD720100A User’s Manual: S15534E
FEATURES
• Compliant with Universal Serial Bus Specification Revision 2.0 (Data Rate 1.5/12/480 Mbps)
• Compliant with Open Host Controller Interface Specification for USB Rev 1.0a
• Compliant with Enhanced Host Controller Interface Specification for USB Rev 0.95
• PCI multi-function device consists of two OHCI host controller cores for full-/low-speed signaling and one EHCI
host controller core for high-speed signaling.
• Root hub with five (max.) downstream facing ports which are shared by OHCI and EHCI host controller core
• All downstream facing ports can handle high-speed (480 Mbps), full-speed (12 Mbps), and low-speed (1.5 Mbps)
transaction.
• Configurable number of downstream facing ports (2 to 5)
• 32-bit 33 MHz host interface compliant to PCI Specification release 2.2.
• Supports PCI Mobile Design Guide Revision 1.1.
• Supports PCI-Bus Power Management Interface Specification release 1.1.
• PCI Bus bus-master access
• System clock is generated by 30 MHz X’tal or 48 MHz clock input.
• Operational registers direct-mapped to PCI memory space
• Legacy support for all downstream facing ports. Legacy support features allow easy migration for motherboard
implementation.
• 3.3 V power supply, PCI signal pins have 5 V tolerant circuit.
ORDERING INFORMATION
Part Number
Package
µPD720100AGM-8ED
160-pin plastic LQFP (Fine pitch) (24 × 24)
µPD720100AGM-8EY
160-pin plastic LQFP (Fine pitch) (24 × 24)
µPD720100AS1-2C
176-pin plastic FBGA (15 × 15)
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. S15535EJ2V0DS00 (2nd edition)
Date Published October 2002 NS CP (K)
Printed in Japan
The mark
shows major revised points.
©
2001
µPD720100A
BLOCK DIAGRAM
PCI Bus
PME0
INTA0
INTB0
INTC0
PCI Bus Interface
WakeUp_Event
WakeUp_Event
WakeUp_Event
Arbiter
OHCI
Host
Controller
#1
OHCI
Host
Controller
#2
EHCI
Host
Controller
SMI0
Root Hub
PHY
Port 1
Port 2
Port 3
USB Bus
2
Data Sheet S15535EJ2V0DS
Port 4
Port 5
µPD720100A
PCI Bus Interface
:handles 32-bits 33 MHz PCI Bus master and target function which comply with PCI
specification release 2.2. The number of enabled ports are set by bit in configuration
space.
Arbiter
:arbitrates among two OHCI Host controller cores and one EHCI Host controller core.
OHCI Host Controller #1
:handles full- (12 Mbps)/low-speed (1.5 Mbps) signaling at port 1, 3, and 5.
OHCI Host Controller #2
:handles full- (12 Mbps)/low-speed (1.5 Mbps) signaling at port 2 and 4.
EHCI Host Controller
:handles high- (480 Mbps) signaling at port 1, 2, 3, 4, and 5.
Root Hub
:handles USB hub function in Host controller and controls connection (routing)
PHY
:consists of high-speed transceiver, full-/low-speed transceiver, serializer, deserializer,
INTA0
:is the PCI interrupt signal for OHCI Host Controller #1.
between Host controller core and port.
etc
INTB0
:is the PCI interrupt signal for OHCI Host Controller #2.
INTC0
:is the PCI interrupt signal for EHCI Host Controller.
SMI0
:is the interrupt signal which is specified by Open Host Controller Interface
Specification for USB Rev 1.0a. The SMI signal of each OHCI Host Controller
appears at this signal.
PME0
:is the interrupt signal which is specified by PCI-Bus Power Management Interface
Specification release 1.1. Wakeup signal of each host controller core appears at this
signal.
Data Sheet S15535EJ2V0DS
3
µPD720100A
PIN CONFIGURATION
• 160-pin plastic LQFP (Fine pitch) (24 × 24)
µPD720100AGM-8ED
µPD720100AGM-8EY
121
125
130
135
140
145
150
155
1
120
5
115
10
110
15
105
20
100
25
95
30
90
35
85
40
80
75
70
65
60
55
50
45
41
81
VSS
VSS
AD23
SMC
SIN/TIN
SOT/TOUT
AD22
AD21
AD20
AD19
VDD
AD18
AD17
AD16
CBE20
FRAME0
IRDY0
TRDY0
DEVSEL0
VDD_PCI
STOP0
PERR0
SERR0
PAR
CBE10
VSS
AD15
AD14
AD13
VDD
AD12
AD11
AD10
AD9
AD8
CBE00
AD7
AD6
VSS
VSS
VDD
NTEST1
NTEST2
TEST
XT1/SCLK
XT2
LEGC
VDD
VSS
VCCRST0
SMI0
IRI1
IRI2
IRO1
IRO2
A20S
PME0
PCLK
VBBRST0
VDD
VSS
VDD_PCI
INTA0
INTB0
INTC0
PIN_EN
GNT0
REQ0
AD31
AD30
VSS
AD29
AD28
AD27
AD26
AD25
AD24
CBE30
IDSEL
VDD
160
VSS
VSS
RSDP4
DP4
VDD
DM4
RSDM4
VSS
RSDP3
DP3
VDD
DM3
RSDM3
VSS
VDD
AVSS
RREF
AVSS(R)
AVDD
N.C.
PC1
AVSS
PC2
AVDD
AVSS
VDD
VSS
RSDP2
DP2
VDD
DM2
RSDM2
VSS
RSDP1
DP1
VDD
DM1
RSDM1
VSS
VSS
Top View
4
Data Sheet S15535EJ2V0DS
VDD
SELCLK
N.C.
SELDAT
VSS
RSDP5
DP5
VDD
DM5
RSDM5
VSS
CLKSEL
VSS
PPON5
TEB
PPON4
SCK/TCLK
PPON3
PPON2
VSS
VDD
OCI3
AMC
OCI4
OCI2
OCI5
PPON1
OCI1
SRMOD
SRCLK
SRDTA
VDD_PCI
CRUN0
AD0
AD1
AD2
AD3
AD4
AD5
VDD
µPD720100A
Pin No.
Pin Name
Pin No.
Pin Name
Pin No.
Pin Name
Pin No.
Pin Name
1
VDD
41
VSS
81
VDD
121
VSS
2
NTEST1
42
VSS
82
AD5
122
VSS
3
NTEST2
43
AD23
83
AD4
123
RSDM1
4
TEST
44
SMC
84
AD3
124
DM1
5
XT1/SCLK
45
SIN/TIN
85
AD2
125
VDD
6
XT2
46
SOT/TOUT
86
AD1
126
DP1
7
LEGC
47
AD22
87
AD0
127
RSDP1
8
VDD
48
AD21
88
CRUN0
128
VSS
9
VSS
49
AD20
89
VDD_PCI
129
RSDM2
10
VCCRST0
50
AD19
90
SRDTA
130
DM2
11
SMI0
51
VDD
91
SRCLK
131
VDD
12
IRI1
52
AD18
92
SRMOD
132
DP2
13
IRI2
53
AD17
93
OCI1
133
RSDP2
14
IRO1
54
AD16
94
PPON1
134
VSS
15
IRO2
55
CBE20
95
OCI5
135
VDD
16
A20S
56
FRAME0
96
OCI2
136
AVSS
17
PME0
57
IRDY0
97
OCI4
137
AVDD
18
PCLK
58
TRDY0
98
AMC
138
PC2
19
VBBRST0
59
DEVSEL0
99
OCI3
139
AVSS
20
VDD
60
VDD_PCI
100
VDD
140
PC1
21
VSS
61
STOP0
101
VSS
141
N.C.
22
VDD_PCI
62
PERR0
102
PPON2
142
AVDD
23
INTA0
63
SERR0
103
PPON3
143
AVSS (R)
24
INTB0
64
PAR
104
SCK/TCLK
144
RREF
25
INTC0
65
CBE10
105
PPON4
145
AVSS
26
PIN_EN
66
VSS
106
TEB
146
VDD
27
GNT0
67
AD15
107
PPON5
147
VSS
28
REQ0
68
AD14
108
VSS
148
RSDM3
29
AD31
69
AD13
109
CLKSEL
149
DM3
30
AD30
70
VDD
110
VSS
150
VDD
31
VSS
71
AD12
111
RSDM5
151
DP3
32
AD29
72
AD11
112
DM5
152
RSDP3
33
AD28
73
AD10
113
VDD
153
VSS
34
AD27
74
AD9
114
DP5
154
RSDM4
35
AD26
75
AD8
115
RSDP5
155
DM4
36
AD25
76
CBE00
116
VSS
156
VDD
37
AD24
77
AD7
117
SELDAT
157
DP4
38
CBE30
78
AD6
118
N.C.
158
RSDP4
39
IDSEL
79
VSS
119
SELCLK
159
VSS
40
VDD
80
VSS
120
VDD
160
VSS
Remark AVSS (R) should be used to connect RREF through 1 % precision reference resistor of 9.1 kΩ.
Data Sheet S15535EJ2V0DS
5
µPD720100A
• 176-pin plastic FBGA (15 × 15)
µPD720100AS1-2C
Bottom View
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
30
89
90
91
92
93
94
95
96
97
98
99
100
101
102
103
46
16
29
88
141
142
143
144
145
146
147
148
149
150
151
152
153
104
47
15
28
87
140
171
172
173
154
105
48
14
27
86
139
155
106
49
13
26
85
138
156
107
50
12
25
84
137
157
108
51
11
24
83
136
170
174
158
109
52
10
23
82
135
169
175
159
110
53
9
22
81
134
168
176
160
111
54
8
21
80
133
161
112
55
7
20
79
132
162
113
56
6
19
78
131
163
114
57
5
18
77
130
164
115
58
4
17
76
129
128
127
126
16
75
74
73
72
15
14
13
T
R
P
U
6
17
167
166
165
125
124
123
122
121
120
119
118
117
116
59
3
71
70
69
68
67
66
65
64
63
62
61
60
2
12
11
10
9
8
7
6
5
4
3
2
1
N
M
L
K
J
H
G
F
E
D
C
B
Data Sheet S15535EJ2V0DS
1
A
µPD720100A
Pin No.
Pin Name
Pin No.
Pin Name
Pin No.
Pin Name
Pin No.
Pin Name
1
VSS
45
VDD
89
SELCLK
133
PPON1
2
VSS
46
NTEST1
90
VSS
134
OCI4
3
SMC
47
NANDTEST
91
RSDM1
135
VSS
4
AD20
48
TEST
92
RSDP1
136
SCK/TCLK
5
AD18
49
VSS
93
DM2
137
PPON5
6
CBE20
50
IRI1
94
RSDP2
138
VSS
7
DEVSEL0
51
IRO2
95
AVSS
139
VDD
8
VDD_PCI
52
VBBRST0
96
PC2
140
RSDP5
9
SERR0
53
VDD
97
AVSS
141
VDD
10
VSS
54
INTA0
98
DM3
142
DP1
11
AD14
55
PIN_EN
99
DP3
143
VSS
12
AD11
56
REQ0
100
RSDM4
144
VDD
13
CBE00
57
AD29
101
DP4
145
VSS
14
AD6
58
AD25
102
VSS
146
AVDD
15
VSS
59
CBE30
103
VSS
147
N.C.
16
AD5
60
N.C.
104
VDD
148
RREF
17
N.C.
61
IDSEL
105
NTEST2
149
VSS
18
AD3
62
VSS
106
LEGC
150
VDD
19
VDD_PCI
63
AD23
107
VCCRST0
151
VSS
20
SRMOD
64
AD22
108
IRI2
152
DM4
21
OCI5
65
AD19
109
A20S
153
XT1/SCLK
22
OCI3
66
AD17
110
PCLK
154
XT2
23
VDD
67
FRAME0
111
INTC0
155
VDD
24
PPON3
68
TRDY0
112
AD31
156
SMI0
25
TEB
69
CBE10
113
VSS
157
IRO1
26
VSS
70
AD13
114
AD27
158
PME0
27
DM5
71
AD12
115
AD24
159
VSS
28
VSS
72
AD9
116
VDD
160
INTB0
29
N.C.
73
AD7
117
SIN/TIN
161
GNT0
30
N.C.
74
VSS
118
SOT/TOUT
162
AD30
31
VSS
75
VSS
119
AD21
163
AD28
32
N.C.
76
VDD
120
VDD
164
AD26
33
DM1
77
AD4
121
AD16
165
VSS
34
RSDM2
78
AD0
122
IRDY0
166
VDD
35
DP2
79
SRDTA
123
STOP0
167
PERR0
36
VDD
80
OCI1
124
PAR
168
VSS
37
AVSS
81
OCI2
125
AD15
169
VSS
38
PC1
82
AMC
126
VDD
170
PPON2
39
AVSS (R)
83
PPON4
127
AD10
171
VSS
40
VDD
84
CLKSEL
128
AD8
172
VSS
41
RSDM3
85
RSDM5
129
AD2
173
AVDD
42
RSDP3
86
DP5
130
AD1
174
VSS
43
N.C.(VDD)
87
SELDAT
131
CRUN0
175
VDD
44
RSDP4
88
VDD
132
SRCLK
176
VDD_PCI
Remarks 1. Pin 43 can be opened. But this signal is connected to pin 45 in the package. Should not be
connected to GND.
2. AVSS (R) should be used to connect RREF through 1 % precision reference resistor of 9.1 kΩ.
Data Sheet S15535EJ2V0DS
7
µPD720100A
1.
PIN INFORMATION
(1/2)
Pin Name
I/O
Buffer Type
Active
Function
Level
8
AD (31 : 0)
I/O
5 V PCI I/O
PCI “AD [31 : 0]” signal
CBE (3 : 0)0
I/O
5 V PCI I/O
PCI “C/BE [3 : 0]” signal
PAR
I/O
5 V PCI I/O
PCI “PAR” signal
FRAME0
I/O
5 V PCI I/O
PCI “FRAME#” signal
IRDY0
I/O
5 V PCI I/O
PCI “IRDY#” signal
TRDY0
I/O
5 V PCI I/O
PCI “TRDY#” signal
STOP0
I/O
5 V PCI I/O
PCI “STOP#” signal
IDSEL
I
5 V PCI Input
PCI “IDSEL” signal
DEVSEL0
I/O
5 V PCI I/O
PCI “DEVSEL#” signal
REQ0
O
5 V PCI Output
PCI “REQ#” signal
GNT0
I
5 V PCI Input
PCI “GNT#” signal
PERR0
I/O
5 V PCI I/O
PCI “PERR#” signal
SERR0
O
5 V PCI N-ch Open Drain
PCI “SERR#” signal
INTA0
O
5 V PCI N-ch Open Drain
Low
PCI “INTA#” signal
INTB0
O
5 V PCI N-ch Open Drain
Low
PCI “INTB#” signal
INTC0
O
5 V PCI N-ch Open Drain
Low
PCI “INTC#” signal
PCLK
I
5 V PCI Input
VBBRST0
I
5 V PCI Input
PCI “CLK” signal
Low
Hardware Reset for Chip
CRUN0
I/O
5 V PCI I/O
PCI “CLKRUN#” signal
PME0
O
5 V PCI N-ch Open Drain
Low
PCI “PME#” signal
VCCRST0
I
5 V tolerant Input
Low
RESET for Power Management
SMI0
O
5 V tolerant N-ch Open Drain
Low
System management interrupt output
PIN_EN
I
5 V tolerant Input
High
PCI Interface enable
XT1/SCLK
I
Input
System clock input or Oscillator In
XT2
O
Output
Oscillator Out
DP (5 : 1)
I/O
USB high speed D+I/O
USB’s high speed D+ signal
DM (5 : 1)
I/O
USB high speed D−I/O
USB’s high speed D− signal
RSDP (5 : 1)
O
USB full speed D+ O
USB’s full speed D+ signal
RSDM (5 : 1)
O
USB full speed D− O
USB’s full speed D− signal
OCI (5 : 1)
I (I/O)
5 V tolerant Input
Low
USB Root Hub Port’s overcurrent status input
PPON (5 : 1)
O (I/O)
5 V tolerant Output
High
USB Root Hub Port’s power supply control output
LEGC
I (I/O)
Input
High
Legacy support switch
IRI1
I (I/O)
5 V tolerant Input
High
INT input from keyboard
IRI2
I (I/O)
5 V tolerant Input
High
INT input from mouse
IRO1
O
5 V tolerant Output
High
INT output from keyboard
IRO2
O
5 V tolerant Output
High
INT output from mouse
A20S
O
5 V tolerant 3-state Output
Data Sheet S15535EJ2V0DS
GateA20 State output
µPD720100A
(2/2)
Pin Name
I/O
Buffer Type
Active
Function
Level
RREF
A
Analog
Reference resistor
PC1
A
Analog
Capacitor for PLL
PC2
A
Analog
Capacitor for PLL
NTEST(2:1)
I
Input with 12 kΩ Pull down R
High
Test pin
SMC
I
Input with 50 kΩ Pull down R
High
Scan mode control
SIN/TIN
I
Input with 50 kΩ Pull down R
Scan input or RAM BIST input
SOT/TOUT
O
Output
Scan output or RAM BIST output
TEB
I
Input with 50 kΩ Pull down R
High
BIST enable
AMC
I
Input with 50 kΩ Pull down R
High
ATG mode control
SCK/TCLK
I
Input with 50 kΩ Pull down R
Scan clock or RAM BIST clock
CLKSEL
I
Input with 50 kΩ Pull down R
Clock select signal
TEST
I
Input with 50 kΩ Pull down R
High
Test Control
NANDTEST
I
Input with 50 kΩ Pull down R
High
NAND Tree Test enable
SELDAT
O
Output
Test signal
SELCLK
O
Output
Test signal
SRCLK
O
Output
Serial ROM Clock Out
SRDTA
I/O
I/O
Serial ROM Data
SRMOD
I
Input with 50 kΩ Pull down R
High
Serial ROM Input Enable
AVDD
VDD for Analog circuit
VDD
VDD
VDD_PCI
5 V (5 V PCI) or 3.3 V (3.3 V PCI)
AVSS
VSS for Analog circuit
VSS
VSS
N.C.
Not connect
Remarks 1. “5 V tolerant“ means that the buffer is 3 V buffer with 5 V tolerant circuit.
2. “5 V PCI” indicates a PCI buffer, which complies with the 3 V PCI standard, has a 5 V tolerant circuit.
It does not indicate a buffer that fully complies with 5 V PCI standard. However, this function can be
used for evaluating the operation of a device on a 5V add-in card.
3. The signal marked as “(I/O)” in the above table operates as I/O signals during testing. However, they
do not need to be considered in normal use.
Data Sheet S15535EJ2V0DS
9
µPD720100A
2.
ELECTRICAL SPECIFICATIONS
2.1
Buffer List
•
3 V input buffer with Pull down resister
•
3 V output buffer
•
3 V bi-directional buffer
•
3 V Oscillator interface
•
5 V input buffer
•
5 V IOL = 12 mA N-ch Open Drain buffer
•
5 V IOL = 6 mA 3-state Output buffer
•
5 V IOL = 12 mA 3-state Output buffer
•
5 V PCI Input buffer with enable (OR type)
•
5 V PCI IOL = 12 mA 3-state Output buffer
•
5 V PCI IOL = 12 mA bi-directional buffer with input enable (OR-type)
NTEST1, NTEST2, TEST, SMC, SIN/TIN, SRMOD, AMC, SCK/TCLK, CLKSEL, TEB
SOT/TOUT (IOL = 9 mA), SRCLK (IOL = 3 mA)
LEGC (IOL = 9 mA), SRDTA (IOL = 3 mA)
XT1/SCLK, XT2
VCCRST0, PIN_EN
SMI0, PME0, INTA0, INTB0, INTC0, SERR0
A20S
IRO1, IRO2
PCLK, VBBRST0, GNT0, IDSEL
REQ0
AD(31:0), CBE(3:0)0, PAR, FRAME0, IRDY0, TRDY0, STOP0, DEVSEL0, PERR0, CRUN0, IRI(1:2),
PPON(1:5), OCI(1:5)
•
USB interface
DP(1:5), DM(1:5), RSDP(1:5), RSDM(1:5), PC1, PC2, RREF, SELDAT, SELCLK
Above, “5 V” refers to a 3-V buffer with 5-V tolerant circuit. Therefore, it is possible to have a 5-V connection for an
external bus, but the output level will be only up to 3 V, which is the VDD voltage. Similarly, “5 V PCI” above refers to a
PCI buffer that has a 5-V tolerant circuit, which meets the 3-V PCI standard; it does not refer to a PCI buffer that
meets the 5-V PCI standard.
10
Data Sheet S15535EJ2V0DS
µPD720100A
2.2
Terminology
Terms Used in Absolute Maximum Ratings
Parameter
Power supply voltage
Symbol
VDD
Meaning
Indicates voltage range within which damage or reduced reliability will not
result when power is applied to a VDD pin.
Input voltage
VI
Indicates voltage range within which damage or reduced reliability will not
result when power is applied to an input pin.
Output voltage
VO
Indicates voltage range within which damage or reduced reliability will not
result when power is applied to an output pin.
Operating temperature
TA
Indicates the ambient temperature range for normal logic operations.
Storage temperature
Tstg
Indicates the element temperature range within which damage or reduced
reliability will not result while no voltage or current are applied to the device.
Terms Used in Recommended Operating Range
Parameter
Symbol
Meaning
Power supply voltage
VDD
Indicates the voltage range for normal logic operations occur when VSS = 0V.
High-level input voltage
VIH
Indicates the voltage, which is applied to the input pins of the device, is the
voltage indicates that the high level states for normal operation of the input
buffer.
* If a voltage that is equal to or greater than the “MIN.” value is applied, the
input voltage is guaranteed as high level voltage.
Low-level input voltage
VIL
Indicates the voltage, which is applied to the input pins of the device, is the
voltage indicates that the low level states for normal operation of the input
buffer.
* If a voltage that is equal to or lesser than the “MAX.” value is applied, the
input voltage is guaranteed as low level voltage.
Terms Used in DC Characteristics
Parameter
Off-state output leakage current
Symbol
IOZ
Meaning
Indicates the current that flows from the power supply pins when the rated
power supply voltage is applied when a 3-state output has high impedance.
Output short circuit current
IOS
Indicates the current that flows when the output pin is shorted (to GND pins)
when output is at high-level.
Input leakage current
II
Indicates the current that flows when the input voltage is supplied to the
input pin.
Low-level output current
IOL
Indicates the current that flows to the output pins when the rated low-level
output voltage is being applied.
High-level output current
IOH
Indicates the current that flows from the output pins when the rated highlevel output voltage is being applied.
Data Sheet S15535EJ2V0DS
11
µPD720100A
2.3
Electrical Specifications
Absolute Maximum Ratings
Parameter
Symbol
Power supply voltage
VDD
Input voltage, 5 V buffer
VI
Condition
3.0 V ≤ VDD ≤ 3.6 V
Rating
Unit
−0.5 to +4.6
V
−0.5 to +6.6
V
−0.5 to +4.6
V
−0.5 to +6.6
V
−0.5 to +4.6
V
VI < VDD + 3.0 V
Input voltage, 3.3 V buffer
3.0 V ≤ VDD ≤ 3.6 V
VI
VI < VDD + 0.5 V
Output voltage, 5 V buffer
3.0 V ≤ VDD ≤ 3.6 V
VO
VO < VDD + 3.0 V
Output voltage, 3.3 V buffer
3.0 V ≤ VDD ≤ 3.6 V
VO
VO < VDD + 0.5 V
Operating temperature
TA
0 to +70
°C
Storage temperature
Tstg
−65 to +150
°C
Caution Product quality may suffer if the absolute maximum rating is exceeded even momentarily for any
parameters. That is, the absolute maximum ratings are rated values at which the product is on the
verge of suffering physical damage, and therefore the product must be used under conditions
that ensure that the absolute maximum ratings are not exceeded.
The ratings and conditions indicated for DC characteristics and AC characteristics represent the
quality assurance range during normal operation.
Recommended Operating Ranges
Parameter
Symbol
Operating voltage
VDD
High-level input voltage
VIH
MIN.
TYP.
MAX.
Unit
3.0
3.3
3.6
V
3.3 V High-level input voltage
2.0
VDD
V
5.0 V High-level input voltage
2.0
5.5
V
3.3 V Low-level input voltage
0
0.8
V
5.0 V Low-level input voltage
0
0.8
V
Low-level input voltage
12
Condition
VIL
Data Sheet S15535EJ2V0DS
µPD720100A
DC Characteristics (VDD = 3.0 to 3.6 V, TA = 0 to +70°°C)
Control Pin Block
Parameter
Off-state output current
Symbol
IOZ
Output short circuit current
IOS
Low-level output current
IOL
Condition
MIN.
VO = VDD or VSS
Note
MAX.
Unit
±10
µA
−250
mA
3.3 V Low-level output current
VOL = 0.4 V
9.0
mA
3.3 V Low-level output current
VOL = 0.4 V
3.0
mA
5.0 V Low-level output current
VOL = 0.4 V
12.0
mA
5.0 V Low-level output current
VOL = 0.4 V
6.0
mA
3.3 V High-level output current
VOH = 2.4 V
−9.0
mA
3.3 V High-level output current
VOH = 2.4 V
−3.0
mA
5.0 V High-level output current
VOH = 2.4 V
−2.0
mA
5.0 V High-level output current
VOH = 2.4 V
−2.0
mA
High-level output current
Input leakage current
IOH
II
3.3 V buffer
VI = VDD or VSS
±10
µA
3.3 V buffer with 50 kΩ PD
VI = VDD
191
µA
5.0 V buffer
VI = VDD or VSS
±10
µA
MIN.
MAX.
Unit
Note The output short circuit time is one second or less and is only for one pin on the LSI.
PCI Interface Block
Parameter
Symbol
Condition
High-level input voltage
Vih
2.0
5.25
V
Low-level input voltage
Vil
0
0.8
V
Low-level output current
IOL
VOL = 0.4 V
12.0
mA
High-level output current
IOH
VOH = 2.4 V
−2.0
mA
Input high leakage current
Iih
Vin = 2.7
70
µA
Input low leakage current
Iil
Vin = 0.5
−70
µA
PME0 leakage current
Ioff
VO < 3.6 V
1
µA
VCC off or floating
Data Sheet S15535EJ2V0DS
13
µPD720100A
USB Interface Block
Parameter
Serial Resistor between DP (DM) and
Symbol
Conditions
RS
MIN
MAX
Unit
35.64
36.36
Ω
40.5
49.5
Ω
RSDP (RSDM).
Output pin impedance
ZHSDRV
Includes RS resistor
Input Levels for Low-/full-speed:
High-level input voltage (drive)
VIH
2.0
V
High-level input voltage (floating)
VIHZ
2.7
Low-level input voltage
VIL
Differential input sensitivity
VDI
(D+) − (D−)
0.2
Differential Common mode Range
VCM
Includes VDI range
0.8
2.5
V
High-level output voltage
VOH
RL of 14.25 kΩ to GND
2.8
3.6
V
Low-level output voltage
VOL
RL of 1.425 kΩ to 3.6 V
0.0
0.3
V
SE1
VOSE1
0.8
Output signal crossover point voltage
VCRS
1.3
2.0
V
VHSSQ
100
150
mV
VHSDSC
525
625
mV
VHSCM
−50
+500
mV
3.6
0.8
V
V
Output Levels for Low-/full-speed:
V
Input Levels for High-speed:
High-speed squelch detection threshold
(differential signal)
High-speed disconnect detection
threshold (differential signal)
High-speed data signaling common
mode voltage range
High-speed differential input signaling
See Figure 2-4.
level
Output Levels for High-speed:
High-speed idle state
VHSOI
−10.0
+10
mV
High-speed data signaling high
VHSOH
360
440
mV
High-speed data signaling low
VHSOL
−10.0
+10
mV
Chirp J level (different signal)
VCHIRPJ
700
1100
mV
Chirp K level (different signal)
VCHIRPK
−900
−500
mV
14
Data Sheet S15535EJ2V0DS
µPD720100A
Figure 2-1. Differential Input Sensitivity Range for Low-/full-speed
Differential Input Voltage Range
Differential Output
Crossover
Voltage Range
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
2.2
2.4
2.6
2.8
3.0
3.2
4.6
Input Voltage Range (Volts)
Figure 2-2. Full-speed Buffer VOH/IOH Characteristics for High-speed Capable Transceiver
VDD-3.3
VDD-2.8
VDD-2.3
VDD-1.8
VDD-1.3
VDD-0.8
VDD-0.3 VDD
0
Iout (mA)
-20
-40
Min.
-60
Max.
-80
Vout (V)
Figure 2-3. Full-speed Buffer VOL/IOL Characteristics for High-speed Capable Transceiver
80
Max.
60
Iout (mA)
-1.0
Min.
40
20
0
0
0.5
1
1.5
2
2.5
3
Vout (V)
Data Sheet S15535EJ2V0DS
15
µPD720100A
Figure 2-4. Receiver Sensitivity for Transceiver at DP/DM
Level 1
+400 mV
Differential
Point 3
Point 4
Point 1
0V
Differential
Point 2
Point 5
Point 6
−400 mV
Differential
Level 2
Unit Interval
0%
100%
Figure 2-5. Receiver Measurement Fixtures
Test Supply Voltage
15.8 Ω
USB
Connector
Nearest
Device
Vbus
D+
DGnd
50 Ω
Coax
15.8 Ω
143 Ω
50 Ω
Coax
+
To 50 Ω Inputs of a
High Speed Differential
Oscilloscope, or 50 Ω
Outputs of a High Speed
Differential Data Generator
−
143 Ω
Pin Capacitance
Parameter
Symbol
Condition
MIN.
MAX.
Unit
Input capacitance
CI
VDD = 0 V, TA = 25°C
6
8
pF
Output capacitance
CO
fC = 1 MHz
10
12
pF
I/O capacitance
CIO
Unmeasured pins
10
12
pF
8
pF
8
pF
8
pF
PCI input pin capacitance
Cin
PCI clock input pin capacitance
Cclk
PCI IDSEL input pin capacitance
CIDSEL
16
returned to 0 V
6
Data Sheet S15535EJ2V0DS
µPD720100A
Power Consumption
Parameter
Symbol
Power Consumption
PWD0-0
Condition
TYP.
Unit
168.0
mA
EHCI host controller is inactive.
186.2
mA
EHCI host controller is active.
301.6
mA
EHCI host controller is inactive.
195.3
mA
EHCI host controller is active.
368.4
mA
EHCI host controller is inactive.
204.4
mA
EHCI host controller is active.
435.2
mA
EHCI host controller is inactive.
213.5
mA
EHCI host controller is active.
502.0
mA
136.2
mA
113.0
mA
The power consumption under the state without suspend.
Device state = D0, All the ports does not connect to any
Note 1
function.
PWD0-2
The power consumption under the state without suspend.
Device state = D0, The number of active ports is 2.
PWD0-3
PWD0-4
The power consumption under the state without suspend.
Note 2
Device state = D0, The number of active ports is 3.
The power consumption under the state without suspend.
Device state = D0, The number of active ports is 4.
PWD0-5
PWD0_S
Note 2
The power consumption under the state without suspend.
Note 2
Device state = D0, The number of active ports is 5.
The power consumption under suspend state.
Device state = D0, The internal clock is stopped.
PWD0_C
Note 2
Note 3
The power consumption under suspend state during PCI clock
is stopped by CRUN0. Device state = D0,
Note 3
The internal clock is stopped.
PWD1
PWD2
PWD3H
Device state = D1, Analog PLL output is stopped.
Note 3, 4
24.7
mA
Device state = D2, Analog PLL output is stopped.
Note 3, 4
10.9
mA
10.9
mA
650
µA
Device state = D3hot, PIN_EN = High
Analog PLL output is stopped.
PWD3C
Notes
Note 3, 4
Device state = D3cold , PIN_EN = Low
Note 3, 4, 5
Oscillator output is stopped.
1. When any device is not connected to all the ports of HC, the power consumption for HC does not
depend on the number of active ports.
2. The number of active ports is set by the value of Port No field in PCI configuration space EXT
register.
3. For the condition of clock stop, see µPD720100A User’s Manual 7.3 Control for System Clock
Operation.
4. When the device state = D1, PCI clock is defined as it is running. When the device state = D2 or D3,
PCI clock is defined as it is stopped.
5. If 48 MHz oscillator clock-in is used, power consumption for oscillator block + HC chip will be more
than 15 mA.
Data Sheet S15535EJ2V0DS
17
µPD720100A
System Clock Ratings
Parameter
Clock frequency
Symbol
fCLK
Condition
X’tal
MIN.
TYP.
MAX.
Unit
−500
30
+500
MHz
ppm
Oscillator block
−500
ppm
48
ppm
Clock Duty cycle
tDUTY
40
+500
MHz
ppm
50
60
%
Remarks 1. Recommended accuracy of clock frequency is ± 100 ppm.
2. Required accuracy of X’tal or Oscillator block is including initial frequency accuracy, the spread of
X’tal capacitor loading, supply voltage, temperature, and aging, etc.
18
Data Sheet S15535EJ2V0DS
µPD720100A
AC Characteristics (VDD = 3.0 to 3.6 V, TA = 0 to +70°°C)
PCI Interface Block
Parameter
Symbol
Conditions
MIN.
MAX.
Unit
PCI clock cycle time
tcyc
30
ns
PCI clock pulse, high-level width
thigh
11
ns
PCI clock pulse, low-level width
tlow
11
ns
PCI clock, rise slew rate
Scr
0.2 VDD to 0.6 VDD
1
4
V/ns
PCI clock, fall slew rate
Scf
0.2 VDD to 0.6 VDD
1
4
V/ns
PCI reset active time
trst
1
ms
100
µs
(vs. power supply stability)
PCI reset active time (vs. CLK Start)
trst-clk
Output float delay time (vs. RST0↓)
trst-off
PCI reset rise slew rate
Srr
50
PCI bus signal output time (vs. PCLK↑)
tval
2
11
ns
PCI point-to-point signal output time
tval (ptp)
2
12
ns
40
REQ0
ns
mV/ns
(vs. PCLK↑)
Output delay time (vs. PCLK↑)
ton
2
Output float delay time (vs. PCLK↑)
toff
Input setup time (vs. PCLK↑)
tsu
Point-to-point input setup time (vs. PCLK↑)
tsu (ptp)
Input hold time
th
ns
28
GNT0
Data Sheet S15535EJ2V0DS
ns
7
ns
10
ns
0
ns
19
µPD720100A
USB Interface Block
(1/2)
Parameter
Symbol
Conditions
MIN.
MAX.
Unit
75
300
ns
75
300
ns
80
125
%
1.49925
1.50075
Mbps
Low Source Electrical Characteristics
Rise time (10% - 90%)
tLR
CL = 50 pF – 150 pF,
RS = 36 Ω
Fall time (90% - 10%)
tLF
CL = 50 pF – 150 pF,
RS = 36 Ω
Differential Rise and Fall Time matching
tLRFM
(tLR/tLF)
Low-speed Data Rate
tLDRATHS
Average bit rate
Source Jitter Total (including frequency
tolerance):
To Next Transition
tDDJ1
−25
+25
ns
For Paired Transitions
tDDJ2
−14
+14
ns
tLDEOP
-40
+100
ns
To Next Transition
tUJR1
−152
+152
ns
For Paired Transitions
tUJR2
−200
+200
ns
Source SE0 interval of EOP
tLEOPT
1.25
1.50
µs
Receiver SE0 interval of EOP
tLEOPR
670
Width of SE0 interval during differential
tFST
Source Jitter for Differential Transition to
SE0 transition
Receiver Jitter:
ns
210
ns
4
20
ns
4
20
ns
90
111.11
%
11.9940
12.0060
Mbps
0.9995
1.0005
ms
42
ns
transition
Full-speed Source Electrical Characteristics
Rise time (10% - 90%)
tFR
CL = 50 pF,
RS = 36 Ω
Fall time (90% - 10%)
tFF
CL = 50 pF,
RS = 36 Ω
Differential Rise and Fall Time matching
tFRFM
(tFR/tFF)
Full-speed Data Rate
tFDRATHS
Average bit rate
Frame Interval
tFRAME
Consecutive Frame Interval Jitter
tRFI
No clock adjustment
Source Jitter Total (including frequency
tolerance):
To Next Transition
tDJ1
−3.5
+3.5
ns
For Paired Transitions
tDJ2
−4.0
+4.0
ns
−2
+5
ns
Source Jitter for Differential Transition to
tFDEOP
SE0 transition
Receiver Jitter:
To Next Transition
tJR1
−18.5
+18.5
ns
For Paired Transitions
tJR2
−9
+9
ns
Source SE0 interval of EOP
tFEOPT
160
175
ns
Receiver SE0 interval of EOP
tFEOPR
82
Width of SE0 interval during differential
tFST
14
transition
20
ns
Data Sheet S15535EJ2V0DS
ns
µPD720100A
(2/2)
Parameter
Symbol
Conditions
MIN.
MAX.
Unit
High-speed Source Electrical Characteristics
Rise time (10% - 90%)
tHSR
500
ps
Fall time (90% - 10%)
tHSF
500
ps
Driver waveform
See Figure 2-6.
High-speed Data Rate
tHSDRAT
479.760
480.240
Mbps
Microframe Interval
tHSFRAM
124.9375
125.0625
µs
Consecutive Microframe Interval Difference
tHSRFI
Data source jitter
See Figure 2-6.
Receiver jitter tolerance
See Figure 2-4.
4 high-
Bit
speed
times
Hub event Timings
Time to detect a downstream facing port
tDCNN
2.5
2000
µs
tDDIS
2.0
2.5
µs
connect event
Time to detect a disconnect event at a
downstream facing port:
Duration of driving resume to a
tDRSMDN
Nominal
20
ms
downstream port
Time from detecting downstream resume
1.0
tURSM
ms
to rebroadcast.
Inter-packet Delay for packets traveling in
tHSIPDSD
Bit
88
times
same direction for high-speed
Inter-packet Delay for packets traveling in
tHSIPDOD
8
Bit
opposite direction for high-speed
Inter-packet delay for root hub response for
times
tHSRSPIPD1
192
high-speed
Time for which a Chirp J or Chirp K must
Bit
times
µs
2.5
tFILT
be continuously detected during Reset
handshake
Time after end of device Chirp K by which
tWTDCH
100
µs
hub must start driving first Chirp K
Time for which each individual
tDCHBIT
40
60
µs
tDCHSE0
100
500
µs
Chirp J or Chirp K in the chirp sequence is
driven downstream during reset
Time before end of reset by which a hub
must end its downstream chirp sequence
Data Sheet S15535EJ2V0DS
21
µPD720100A
Figure 2-6. Transmit Waveform for Transceiver at DP/DM
Level 1
+400 mV
Differential
Point 3
Point 4
Point 1
0V
Differential
Point 2
Point 5
Point 6
−400 mV
Differential
Level 2
Unit Interval
0%
100%
Figure 2-7. Transmitter Measurement Fixtures
Test Supply Voltage
15.8 Ω
USB
Connector
Nearest
Device
Vbus
D+
DGnd
15.8 Ω
143 Ω
22
50 Ω
Coax
50 Ω
Coax
143 Ω
Data Sheet S15535EJ2V0DS
+
To 50 Ω Inputs of a
High Speed Differential
Oscilloscope, or 50 Ω
Outputs of a High Speed
Differential Data Generator
−
µPD720100A
Timing Diagram
PCI Clock
tcyc
thigh
tlow
0.6VDD
0.5VDD
0.4VDD
0.3VDD
0.2VDD
0.4VDD(ptp:min)
PCI Reset
PCLK
100 ms (typ.)
PWR_GOOD
trst-clk
trst
VBBRST0
trst-off
PCI Signals
Valid
PCI Output Timing Measurement Condition
0.6VDD
PCLK
0.4VDD
0.2VDD
tval , tval(ptp)
0.615VDD (for falling edge)
output
delay
output
0.285VDD (for falling edge)
ton
toff
Data Sheet S15535EJ2V0DS
23
µPD720100A
PCI Input Timing Measurement Condition
0.6VDD
0.4VDD
PCLK
0.2VDD
tsu, tsu(ptp)
th
0.6VDD
input
0.4VDD
0.2VDD
USB Differential Data Jitter for Low-/full-speed
tPERIOD
Differential
Data Lines
Crossover
Points
Consecutive
Transitions
N × tPERIOD + tDJ1, tDDJ1
Paired
Transitions
N × tPERIOD + tDJ2, tDDJ2
USB Differential-to-EOP Transition Skew and EOP Width for Low-/full-speed
tPERIOD
Differential
Data Lines
Crossover
Point Extended
Crossover
Point
Diff. Data-toSE0 Skew
N × tPERIOD + tFDEOP, tLDEOP
Source EOP Width: tFEOPT
tLEOPT
Receiver EOP Width: tFEOPR
tLEOPR
24
Data Sheet S15535EJ2V0DS
µPD720100A
USB Receiver Jitter Tolerance for Low-/full-speed
tPERIOD
Differential
Data Lines
tJR, tUJR
tJR1, tUJR1
tJR2, tUJR2
Consecutive
Transitions
N × tPERIOD + tJR1, tUJR1
Paired
Transitions
N × tPERIOD + tJR2, tUJR2
Low-/full-speed Disconnect Detection
D+/DVIZH (min)
VIL
D-/D+
VSS
tDDIS
Device
Disconnected
Disconnect
Detected
Full-/high-speed Device Connect Detection
D+
VIH
DVSS
tDCNN
Device
Connected
Connect
Detected
Data Sheet S15535EJ2V0DS
25
µPD720100A
Low-speed Device Connect Detection
DVIH
D+
VSS
tDCNN
Device
Connected
26
Connect
Detected
Data Sheet S15535EJ2V0DS
µPD720100A
3.
PACKAGE DRAWING
160-PIN PLASTIC LQFP (FINE PITCH) (24x24)
A
B
81
80
120
121
detail of lead end
S
C
D
R
Q
41
40
160
1
F
G
H
I
J
M
P
K
N
S
S
L
M
NOTE
ITEM
Each lead centerline is located within 0.10 mm of
its true position (T.P.) at maximum material condition.
MILLIMETERS
A
26.0±0.2
B
24.0±0.2
C
24.0±0.2
D
26.0±0.2
F
2.25
G
2.25
H
0.22 +0.05
−0.04
I
J
0.10
0.5 (T.P.)
K
1.0±0.2
L
0.5±0.2
M
0.145+0.055
−0.045
N
0.10
P
1.4±0.1
Q
0.125±0.075
R
3° +7°
−3°
S
1.7 MAX.
S160GM-50-8ED-3
Data Sheet S15535EJ2V0DS
27
µPD720100A
160-PIN PLASTIC LQFP (FINE PITCH) (24x24)
A
B
120
121
81
80
detail of lead end
S
P
C
D
T
R
L
Q
U
41
40
160
1
F
G
H
I
J
M
K
S
ITEM
MILLIMETERS
A
B
26.0±0.2
24.0±0.2
NOTE
C
D
24.0±0.2
26.0±0.2
Each lead centerline is located within 0.08 mm of
its true position (T.P.) at maximum material condition.
F
2.25
G
2.25
H
0.22 +0.05
−0.04
N
S
M
I
0.08
J
K
0.5 (T.P.)
1.0±0.2
L
0.5
M
0.17 +0.03
−0.07
N
0.08
P
Q
1.4±0.05
0.10±0.05
R
3° +4°
−3°
S
1.6 MAX.
T
U
0.25 (T.P.)
0.16±0.15
P160GM-50-8EY
28
Data Sheet S15535EJ2V0DS
µPD720100A
176-PIN PLASTIC FBGA (15x15)
A
W
S B
B
B
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
A
C D
U T RP NM L K J H G F E D C B A
P
Index mark
Q
W
S A
J
I
Y1
S
H
R
ITEM
S
K
F
S
L
E
φM
M
G
S A B
MILLIMETERS
A
15.00±0.10
B
14.40
C
14.40
D
15.00±0.10
E
1.10
F
G
0.8 (T.P.)
0.35±0.1
H
0.36
I
1.16
J
1.51±0.15
K
0.10
L
φ 0.50+0.05
−0.10
M
P
0.08
C1.0
Q
R0.3
R
W
25°
0.20
Y1
0.20
S176S1-80-2C-1
Data Sheet S15535EJ2V0DS
29
µPD720100A
4.
RECOMMENDED SOLDERING CONDITIONS
The µPD720100A should be soldered and mounted under the following recommended conditions.
For the details of the recommended soldering conditions, refer to the document Semiconductor Device
Mounting Technology Manual (C10535E).
For soldering methods and conditions other than those recommended below, contact your NEC sales
representative.
µPD720100AGM-8ED: 160-pin plastic LQFP (Fine pitch) (24 × 24)
µPD720100AGM-8EY: 160-pin plastic LQFP (Fine pitch) (24 × 24)
Soldering Method
Infrared reflow
Soldering Conditions
Package peak temperature: 235°C, Time: 30 seconds max. (at 210°C or higher),
Symbol
IR35-103-3
Count: Three times or less
Exposure limit: 3 days
Partial heating
Note
(after that, prebake at 125°C for 10 hours)
Pin temperature: 300°C max., Time: 3 seconds max. (per pin row)
–
Note After opening the dry pack, store it at 25°C or less and 65% RH or less for the allowable storage period.
µPD720100AS1-2C:
176-pin plastic FBGA (15 × 15)
Soldering Method
Infrared reflow
Soldering Conditions
Package peak temperature: 235°C, Time: 30 seconds max. (at 210°C or higher),
Symbol
IR35-107-3
Count: Three times or less
Exposure limit: 7 days
Partial heating
Note
(after that, prebake at 125°C for 10 hours)
Pin temperature: 300°C max., Time: 3 seconds max. (per pin row)
–
Note After opening the dry pack, store it at 25°C or less and 65% RH or less for the allowable storage period.
30
Data Sheet S15535EJ2V0DS
µPD720100A
NOTES FOR CMOS DEVICES
1
PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note:
Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and
ultimately degrade the device operation. Steps must be taken to stop generation of static electricity
as much as possible, and quickly dissipate it once, when it has occurred. Environmental control
must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using
insulators that easily build static electricity. Semiconductor devices must be stored and transported
in an anti-static container, static shielding bag or conductive material. All test and measurement
tools including work bench and floor should be grounded. The operator should be grounded using
wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need
to be taken for PW boards with semiconductor devices on it.
2
HANDLING OF UNUSED INPUT PINS FOR CMOS
Note:
No connection for CMOS device inputs can be cause of malfunction. If no connection is provided
to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence
causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels
of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to V DD or GND with a resistor, if it is considered to have a possibility of
being an output pin. All handling related to the unused pins must be judged device by device and
related specifications governing the devices.
3
STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note:
Power-on does not necessarily define initial status of MOS device. Production process of MOS
does not define the initial operation status of the device. Immediately after the power source is
turned ON, the devices with reset function have not yet been initialized. Hence, power-on does
not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after power-on for devices
having reset function.
Purchase of NEC l2C components conveys a license under the Philips l2C Patent Rights to use
these components in an l2C system, provided that the system conforms to the l 2C Standard
Specification as defined by Philips.
Data Sheet S15535EJ2V0DS
31
µPD720100A
USB logo is a trademark of USB Implementers Forum, Inc.
• The information in this document is current as of October, 2002. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all
products and/or types are available in every country. Please check with an NEC sales representative
for availability and additional information.
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(Note)
(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
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M8E 00. 4