THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 features applications D D D D D D D D D D D D D D D D D 60 MSPS Maximum Sample Rate 10-Bit Resolution No Missing Codes On-Chip Sample and Hold 73 dB Spurious Free Dynamic Range at fin = 15.5 MHz 5 V Analog and Digital Supply 3 V and 5 V CMOS Compatible Digital Output 9.5 Bit ENOB at fIN = 31 MHz 60 dB SNR at fIN = 31 MHz 82 MHz Bandwidth Internal or External Reference Buffered 900 Ω Differential Analog Input Wireless Local Loop Wireless Internet Access Cable Modem Receivers Medical Ultrasound Magnetic Resonant Imaging description The THS1060 is a high speed low noise 10-bit CMOS pipelined analog-to-digital converter. A differential sample and hold minimizes even order harmonics and allows for a high degree of common mode rejection at the analog input. A buffered analog input allows for operation with a constant analog input impedance, and prevents transient voltage spikes from feeding backward to the analog input source. Full temperature DNL performance allows for industrial application with the assurance of no missing codes. The THS1060 can operate with either internal or external references. Internal reference usage selection is accomplished simply by externally connecting reference output terminals to reference input terminals. Packaged in a small 48-pin quad flat-pack, the THS1060 makes use of Texas Instruments PowerPAD technology. The die of the THS1060 is bonded directly to a copper alloy plate which is exposed on the bottom of the package. When soldered to a ground land, the PowerPAD provides superior heat dissipation and thermal performance ideal for industrial applications in high temperature environments. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PowerPAD is a trademark of Texas Instruments. Copyright 2000, Texas Instruments Incorporated PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 AVSS AVDD AVSS AVDD AVSS AVSS DRVSS DRVSS DRVDD DRVDD VCM AVDD 48 PHP PACKAGE (TOP VIEW) 48 47 46 45 44 43 42 41 40 39 38 37 AVSS AVDD VIN+ VIN– AVDD 1 36 2 35 3 34 4 33 5 32 VREFOUT– VREFIN– VREFIN+ VREFOUT+ VBG AVSS AVDD 6 31 7 30 8 29 9 28 10 27 11 26 12 25 NC NC D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 DV SS CLK+ CLK– DV DD DV SS DV SS DV DD DV SS DV DD DRVSS DRVDD AV SS 13 14 15 16 17 18 19 20 21 22 23 24 AVAILABLE OPTIONS PACKAGE TA 48-TQFP (PHP) – 40°C to 85°C THS1060I 0°C to 70°C THS1060C functional block diagram AVDD DVDD DRVDD VIN+ Stage 1 Buffer S/H 900 Ω Σ VIN– A/D VREFIN+ VREFOUT+ VREFOUT– VREFIN– Stage 10 Stages 2 – 9 Σ D/A A/D 1 1 3.0 V Reference AVDD/2 2.0 V D/A Digital Error Correction VCM CLK+ Timing CLK– AVSS 2 DVSS DRVSS D9 D8 POST OFFICE BOX 655303 D7 D6 D5 D4 • DALLAS, TEXAS 75265 D3 D2 D1 D0 A/D 1 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 Terminal Functions TERMINAL NAME NO. I/O DESCRIPTION AVDD 2, 5, 12 43, 45, 47 I Analog power supply AVSS 1, 11, 13, 41, 42, 44, 46 I Analog ground return for internal analog circuitry CLK+ 15 I Clock input CLK– 16 I Complementary clock input D9–D0 25–34 O Digital data output bits; LSB= D0, MSB = D9 (2s complement output format) DRVDD DRVSS 24, 37, 38 I Digital output driver supply 23, 39, 40 I Digital output driver ground return DVDD 17, 20, 22 I Positive digital supply DVSS 18, 19, 21 I Digital ground return VBG VCM 10 O Band gap reference. Bypass to ground with a 1 µF and a 0.01 µF chip capacitor. 48 O Common mode voltage output. Bypass to ground with a 0.1 µF and a 0.01 µF chip device capacitor. VIN+ VIN– 3 I Analog signal input 4 I Complementary analog signal input VREFIN – VREFIN+ 7 I External reference input low 8 I External reference input high VREFOUT+ VREFOUT – 9 O Internal reference output. Compensate with a 1 µF and a 0.01 µF chip capacitor. 6 O Internal reference output. Compensate with a 1 µF and a 0.01 µF chip capacitor. detailed description The THS1060 uses a differential pipeline architecture and assures no missing codes over the full operating temperature range. The device uses a 1 bit per stage architecture in order to achieve the highest possible bandwidth. The differential analog inputs are terminated with a 900 Ω resistor. The inputs are then fed to a unity gain buffer followed by the S/H (sample and hold) stage. This S/H stage is a switched capacitor op-amp based circuit, see Figure 3. The pipeline is a typical 1 bit per stage pipeline as shown in the functional block diagram. The digital output of the 10 stages and the last 1 bit flash are sent to a digital correction logic block which then outputs the final 10 bits. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 3 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 absolute maximum ratings over operating free-air temperature (unless otherwise noted)† Supply voltage range: AVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 7 V DVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 7 V DRVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 7 V Voltage between AVSS and DVSS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to 0.5 V Voltage between DRVDD and DVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 5 V Voltage between AVDD and DVDD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.5 V to 5 V Digital data output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 0.3 V to DVDD + 0.3 V CLK peak input current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA Peak total input current (all inputs) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 30 mA Operating free-air temperature range, TA: THS1060C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C THS1060I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 40°C to 85°C Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . – 65°C to 150°C Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. recommended operating conditions PARAMETER MIN Sample rate NOM MAX UNIT 60 MSPS 1 Analog supply voltage, AVDD 4.75 5 5.25 V Digital supply voltage, DVDD 4.75 5 5.25 V Digital output driver supply voltage, DRVDD 3 3.3 5.25 V CLK + high level input voltage, VIH 4 5 5.5 V 0 1 V 5 5.5 V 0 1 V CLK + low-level input voltage, VIL CLK – high-level input voltage, VIH 4 CLK – low-level input voltage, VIL CLK pulse-width high, tp(H) 7.5 8.3 CLK pulse-width low, tp(L) 7.5 8.3 Operating free-air temperature range, TA THS1060C Operating free-air temperature range, TA THS1060I ns ns 0 70 °C – 40 85 °C electrical characteristics, over recommended operating free-air temperature range, AVDD = DVDD = 5 V, DRVDD = 3.3 V, internal references, CLK = 60 MHz, (unless otherwise noted)‡ dc accuracy PARAMETER DNL TEST CONDITIONS Differential nonlinearity (see Note 1) No missing codes (see Note 2) INL TYP MAX UNIT ± 0.4 ±1 LSB ± 0.9 ±3 LSB 15 31 –7 – 10 Assured Integral nonlinearity (see Note 1) EO Offset error EG Gain error ‡ All typical values are at TA = 25°C. NOTES: 1. Tested without over ranging 2. Tested with over ranging 4 MIN POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 mV %FSR THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 electrical characteristics, over recommended operating free-air temperature range, AVDD = DVDD = 5 V, DRVDD = 3.3 V, internal references, CLK = 60 MHz, (unless otherwise noted)† power supply PARAMETER I(AVDD) I(DVDD) TEST CONDITIONS Analog supply current Digital supply current I(DRVDD) Output driver supply current PD Power dissipation † All typical values are at TA = 25°C. MIN TYP MAX UNIT V(VIN) = V(VCM) V(VIN) = V(VCM) 120 150 mA 2 5 mA V(VIN) = V(VCM) V(VIN) = V(VCM) 2 6 mA 0.6 W reference MIN TYP MAX UNIT VREFOUT – VREFOUT+ Negative reference output voltage PARAMETER TEST CONDITIONS 1.95 2 2.05 V Positive reference output voltage 2.95 3 3.05 V VREFIN – VREFIN+ External reference supplied V(VCM) Common mode output voltage External reference supplied I(VCM) Common mode output current † All typical values are at TA = 25°C. 2 V 3 V AVDD/2 V 10 µA analog input PARAMETER RI Differential input resistance CI Differential input capacitance VI VID Analog input common mode range TEST CONDITIONS MIN TYP MAX Ω 4 pF VCM ± 0.05 2 Differential input voltage range BW Analog input bandwidth (large signal) † All typical values are at TA = 25°C. –3 dB UNIT 900 V V p-p 82 MHz digital outputs PARAMETER VOH VOL TEST CONDITIONS IOH = – 50 µA IOL = 50 µA High-level output voltage Low-level output voltage CL Output load capacitance † All typical values are at TA = 25°C. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 MIN TYP MAX 0.8DRVDD UNIT V 0.2DRVDD VDD 15 pF 5 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 ac specifications, over recommended operating free-air temperature range, AVDD = DVDD = 5 V, DRVDD = 3.3 V, internal references, CLK = 60 MHz, analog input at –2 dBFS(unless otherwise noted)† PARAMETER SNR Signal to noise ratio TEST CONDITIONS fIN = 2.2 MHz fIN =15.5 MHz MIN Signal to noise and distortion 56 60 59 fIN =15.5 MHz fIN =31 MHz 53 fIN =15.5 MHz fIN =15.5 MHz 8.5 57 59 Effective number of bits Total harmonic distortion SFDR Spurious-free dynamic range fIN =15.5 MHz fIN = 2.2 MHz d Harmonic 2nd Distortion fIN =15.5 MHz fIN = 31 MHz – 77 fIN = 2.2 MHz fIN =15.5 MHz fIN = 31 MHz – 68 9.6 – 72 bits – 54 73 dBc – 80 – 57 dBc – 60 dBc – 79 – 79 – 68 F1 = 14.9 MHz, F2 = 15.6 MHz, Analog inputs at – 8 dBFS each Two tone SFDR dBFS 59.6 THD Distortion UNIT dBFS 60 ENOB d Harmonic 3rd MAX 60 fIN =31 MHz fIN = 2.2 MHz SINAD TYP 70 dBc † All typical values are at TA = 25°C. operating characteristics over recommended operating conditions, AVDD = DVDD = 5 V, DRVDD = 3.3 V switching specifications PARAMETER TEST CONDITIONS Aperture delay, td(A) MAX After falling edge of CLK+ POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 ps RMS 13 6.5 UNIT ps 1 Pipeline delay td(PIPE) 6 TYP 120 Aperture jitter Output delay td(O) MIN ns CLK Cycle THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 definitions of specifications analog bandwidth The analog input frequency at which the spectral power of the fundamental frequency of a large input signal is reduced by 3 dB. aperture delay The delay between the 50% point of the rising edge of the clock and the instant at which the analog input is sampled. aperture uncertainity (jitter) The sample-to-sample variation in aperture delay differential nonlinearity The average deviation of any output code from the ideal width of 1 LSB. clock pulse width/duty cycle Pulse width high is the minimum amount of time that the clock pulse should be left in logic 1 state to achieve rated performance; pulse width low is the minimum time clock pulse should be left in low state. At a given clock rate, these specs define acceptable clock duty cycles. offset error The difference between the analog input voltage at which the analog-to-digital converter output changes from negative full scale, to one LSB above negative full scale, and the ideal voltage at which this transition should occur. gain error The maximum error in LSBs between a digitized ideal full scale low frequency offset corrected triangle wave analog input, from the ideal digitized full scale triangle wave, divided by the full scale range, in this case 1024. harmonic distortion The ratio of the power of the fundamental to a given harmonic component reported in dBc. integral nonlinearity The deviation of the transfer function from an end-point adjusted reference line measured in fractions of 1 LSB. Also the integral of the DNL curve. output delay The delay between the 50% point of the falling edge of the clock and signal and the time when all output data bits are within valid logic levels (not including pipeline delay). signal-to-noise-and distortion (SINAD) When tested with a single tone, the ratio of the signal power to the sum of the power of all other spectral components, excluding dc, referenced to full scale. signal-to-noise ratio (SNR) When tested with a single tone, the ratio of the signal power to the sum of the power of all other power spectral components, excluding dc and the first 9 harmonics, referenced to full scale. effective number of bits (ENOB) For a sine wave, SINAD can be expressed in terms of the number of bits, using the following formula, ENOB + (SINAD6.02* 1.76) spurious-free dynamic range (SFDR) The ratio of the signal power to the power of the worst spur, excluding dc. The worst spurious component may or may not be a harmonic. The ratio is reported in dBc (that is, degrades as signal levels are lowered). POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 7 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 Sample N AIN td(A) td(Pipe) tp(H) tP(L) CLK+ tc Digital Output (D0 – D9) td(O) Data N–7 Data N–6 Data N–5 Data N–4 Data N–3 Data N–2 Data N–1 Data N Data N+1 Data N+2 Figure 1. Timing Diagram equivalent circuits φ2 R2 BAND GAP VCM R1 VREFOUT+ VREFOUT– R1 VIN+ R2 φ1′ φ1 900 Ω AVDD VIN– φ1 φ1′ R1 VCM VCM R2 φ2 Figure 3. Analog Input Stage AVSS Figure 2. References DVDD VDD CLK+ 10 Ω DVSS DVDD D0–D11 Timing CLK– VSS Figure 5. Digital Outputs DVSS Figure 4. Clock Inputs 8 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 TYPICAL CHARACTERISTICS† Power – dBFS OUTPUT POWER SPECTRUM vs FREQUENCY 0 –10 –20 –30 –40 –50 –60 –70 –80 –90 –100 –110 Fs = 60 MSPS fIN = 2.2 MHz, VIN @ –2 dBFS 8K Point Discrete Fourier Transform 0 5 10 15 20 25 30 f – Frequency – MHz Figure 6 Power – dBFS OUTPUT POWER SPECTRUM vs FREQUENCY 0 –10 –20 –30 –40 –50 –60 –70 –80 –90 –100 –110 Fs = 60 MSPS fIN = 15.5 MHz, VIN @ –2 dBFS 8K Point Discrete Fourier Transform 0 5 10 15 20 25 30 f – Frequency – MHz Figure 7 † AVDD = 5 V, DVDD = 5 V, DRVDD = 3.3 V, TA = 25°C (unless otherwise noted) POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 9 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 TYPICAL CHARACTERISTICS OUTPUT POWER SPECTRUM vs FREQUENCY 0.00 –10.00 –20.00 –30.00 –40.00 –50.00 –60.00 –70.00 –80.00 –90.00 –100.00 –110.00 Power – dBFS Fs = 60 MSPS fIN = 31 MHz, VIN @ –2 dBFS 8K Point Discrete Fourier Transform 0 5 10 15 20 25 30 f – Frequency – MHz Figure 8 Power – dBFS OUTPUT POWER SPECTRUM vs FREQUENCY 0 –10 –20 –30 –40 –50 –60 –70 –80 –90 –100 –110 Fs = 60 MSPS fIN = 69 MHz, VIN @ –2 dBFS 8K Point Discrete Fourier Transform 0 5 10 15 20 f – Frequency – MHz Figure 9 10 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 25 30 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 TYPICAL CHARACTERISTICS Power – dB NOISE AND DISTORTION vs ANALOG INPUT FREQUENCY 100 90 80 70 60 50 40 30 20 10 0 Fs = 60 MSPS VIN @ –2 dBFS 2nd Harmonic (dBc) 0 SFDR (dBc) 3rd Harmonic (dBc) 10 20 SINAD (dBFS) 30 40 50 60 SNR (dBFS) 70 80 90 100 f – Analog Input Frequency – MHz Figure 10 Power – dBFS TWO-TONE OUTPUT POWER SPECTRUM vs FREQUENCY 0 –10 –20 –30 –40 –50 –60 –70 –80 –90 –100 –110 Fs=60 MSPS, F1=14.9 MHz, F2 = 15.6 MHz each @ –8 dBFS 8K Point Discrete Fourier Transform 0 5 10 15 20 25 30 f – Frequency – MHz Figure 11 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 11 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 TYPICAL CHARACTERISTICS Power – dB NOISE AND DISTORTION vs ANALOG INPUT POWER LEVEL 100 90 Fs = 60 MSPS fIN = 15.5 MHz 80 70 60 50 40 30 20 10 0 –50 –45 –40 SFDR(dBc) SNR(dBFS) SINAD(dBFS) –35 –30 –25 –20 –15 –10 –5 0 Input Power – dBFS Figure 12 Power – dB NOISE AND DISTORTION vs CLOCK FREQUENCY 100 90 80 70 60 50 40 30 20 10 0 SNR(dBFS) SFDR(dBc) SINAD(dBFS) fIN = 15.5 MHz, VIN @ –2 dBFS 5 10 15 20 25 30 35 40 45 50 55 Clock Frequency – MHz Figure 13 12 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 60 65 70 75 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 TYPICAL CHARACTERISTICS Power – dB NOISE AND DISTORTION vs DUTY CYCLE 100 90 80 70 60 50 40 30 20 10 0 SNR (dBFS) SFDR (dBc) SINAD (dBFS) Fs = 60 MSPS fIN = 15.5 MHz, VIN @ –2 dBFS PowerPAD not connected, T = 25°C 40 45 50 55 60 768 1024 1023 Duty Cycle – % Figure 14 DIFFERENTIAL NONLINEARITY vs OUTPUT CODE 1 DNL – (LSBs) Fs = 60 MSPS fIN = 15.5 MHz 0 –1 0 256 512 Output Code Figure 15 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 13 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 TYPICAL CHARACTERISTICS INTEGRAL NONLINEARITY vs OUTPUT CODE 2 Fs = 60 MSPS fIN = 15.5 MHz INL – LSBs 1 0 –1 –2 0 256 512 Output Code – LSBs 768 1023 Figure 16 LARGE SIGNAL ANALOG INPUT BANDWIDTH Power – dBFS 0 –10 –20 Fs = 60 MSPS –3 dB Point @ 82 MHz –30 0 20 40 60 80 100 f – Analog Input Frequency – MHz Figure 17 ENOB – bits PERFORMANCE vs DUTY CYCLE WITH PowerPAD 10 9 8 7 6 5 4 3 2 1 0 ENOB (25°C) ENOB (85°C) Fs = 60 MSPS fIN = 15.5 MHz, VIN @ –2 dBFS 35 40 45 50 55 Duty Cycle – % Figure 18 14 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 60 65 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 APPLICATION INFORMATION using the THS1060 references The option of internal or external reference is provided by allowing for an external connection of the internal reference to the reference inputs. This type of reference selection offers the lowest noise possible by not relying on any active switch to make the selection. Compensating each reference output with a 1-µF and 0.01 µF microwave chip capacitor is required as shown in Figure 19. The differential analog input range is equal to 2 (VREFOUT+ – VREFOUT–). When using external references, it is best to decouple the reference inputs with a 0.1 µF and 0.01 µF chip capacitor as shown in Figure 20. VREFIN+ VREFOUT+ 0.01 µF VREFIN+ External Reference + 0.01 µF 1 µF 0.1 µF VREFIN– VREFOUT– 0.01 µF 0.01 µF 1 µF Figure 19. Internal Reference Usage VREFIN– External Reference – 0.1 µF Figure 20. External Reference Usage using the THS1060 clock input The THS1060 is a high performance A/D converter. In order to obtain the best possible performance, care should be taken to ensure that the device is clocked appropriately. The optimal clock to the device is a low jitter square wave with sharp rise times (< 2ns) at 50% duty cycle. The two clock inputs (CLK+ and CLK–), should be driven with complimentary signals that have minimal skew, and nominally swing between 0 V and 5 V. The device will still operate with a peak to peak swing of 3 V on each clock channel (around the 2.5 V midpoint), but it could become more duty cycle sensitive under such conditions. Use of a transformer coupled clock input ensures minimal skew between the CLK+ and CLK– signals. If the available clock signal swing is not adequate, a step-up transformer can be used in order to deliver the required levels to the converter’s inputs, see Figure 21. For example if a 3.3 V standard CMOS logic is used for clock generation, a minicircuits T4 –1H transformer can be used for 2x voltage step-up. This provides greater than 6 V differential swing at the secondary of the transformer, which provides greater than 3 V swings to both CLK+ and CLK– terminals of THS1060. The center tap of the transformer secondary is connected to the VCM terminal of the THS1060 for proper dc biasing. Both the transformer and the clock source should be placed close to THS1060 to avoid transmission line effects. 3.3 V TTL logic is not recommended with T4 –1H transformer due to TTLs tendency to have lower output swings. If the input to the transformer is a square wave (such as one generated by a digital driver), care must be taken to ensure that the transformer’s bandwidth does not limit the signal’s rise time and effectively alter its shape and duty cycle characteristics. For a 60 MSPS rate, the transformer’s bandwidth should be at least 300 MHz. A low phase noise sinewave can also be used to effectively drive the THS1060. In this case, the bandwidth of the transformer becomes less critical, as long as it can accommodate the frequency of interest (for example, 60 MHz). The turns ratio should be chosen to ensure appropriate levels at the device’s input. If the clock signal is fed through a transmission line of characteristic impedance Zo , then the secondary of the transformer should be terminated with a resistor of nZo , where n is the transformer’s impedance ratio (1:n) as shown in Figure 21. Alternatively a series termination can be used at the clock source. POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 15 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 APPLICATION INFORMATION 0.1 µF 3 V – 5 V p-p Impedance Ratio = 1:4 Zo CLK+ 4 Zo T4-1H THS1060 CLK– VCM 0.01 µF 0.1 µF Figure 21. Coaxial Clock Source The clock signals, CLK+ and CLK– should be well matched and must both be driven. A transformer ensures minimal skew between the two complementary channels. However, skew levels of up to 500 ps between CLK+ and CLK– can be tolerated with some performance degradation. The clock input can also be driven differentially with a 5 V TTL signal by using an RF transformer to convert the TTL signal to a differential signal. The TTL signal is ac coupled to the positive primary terminal with a high pass circuit. The negative terminal of the transformer is connected to ground (see Figure 22). The transformer secondary is connected to the CLK inputs. Impedance Ratio = 1:4 0.1 µF 5 V TTL CLK CLK+ THS1060 T4 - 1H CLK– VCM 0.01 µF Figure 22. TTL Clock Input 16 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 0.1 µF THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 APPLICATION INFORMATION using the analog input The THS1060 obtains optimum performance when the analog signal inputs are driven differentially. The circuit below shows the optimum configuration, see Figure 23. The signal is fed to the primary of an RF transformer. Since the input signal must be biased around the common mode voltage of the internal circuitry, the common mode (VCM) reference from the THS1060 is connected to the center-tap of the secondary. To ensure a steady low noise VCM reference the best performance is obtained when the VCM output is connected to ground with a 0.1 µF and 0.01 µF low inductance capacitor. 50 Ω ac Signal 1:1 VIN+ R 50 Ω THS1060 VIN– VCM T1-1T 0.01 µF 0.1 µF Figure 23. THS1060 With Coaxial Feed When it is necessary to buffer or apply a gain to the incoming analog signal, it is also possible to combine a single-ended amplifier with an RF transformer as shown in Figure 24. For this application, a wide-band current mode feedback amplifier such as the THS3001 is best. The single ended output allows the use of standard passive filters between the amplifier output and the primary. In this case, the SFDR of the op amp is not as critical as that of the A/D converter. While harmonics generated from within the A/D converter fold back into the first Nyquist zone, harmonics generated externally in the op amps can be filtered out with passive filters. 1 kΩ 1 kΩ Impedance Ratio = 1:n 10 Ω _ RT VIN+ BPF + IF Input THS3001 THS1060 VIN– VCM 0.1 µF 0.01 µF Figure 24. IF Input Buffered with THS3001 Op Amp POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 17 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 APPLICATION INFORMATION digital outputs The digital outputs can drive either TTL or 5-V CMOS inputs when DRVDD = 5 V. To reduce capacitive loading, each digital output of the THS1060 should drive only one digital input. The CMOS output drivers are capable of handling up to a 15 pF load. For better SNR performance, use 3.3 V for DRVDD. Resistors of 200-Ω in series with the digital output can be used for optimizing SNR performance. power supplies Best performance is obtained when AVDD is kept separate from DVDD. Regulated or linear supplies, as opposed to switched power supplies, must be used to minimize supply noise. It is also recommended to partition the analog and digital components on the board in such a way that the analog supply plane does not overlap with the digital supply plane in order to limit dielectric coupling between the different supplies. using the TI PowerPAD While it is not necessary to use the Texas Instruments PowerPAD to meet the minimum and maximum specs indicated in this spec sheet, proper use of the PowerPAD will improve the performance of the THS1060 especially at TA = 85°C. For high speed sampling applications (around 60 MSPS), significant performance enhancement above the specified values can be achieved by properly applying the PowerPAD. This will maintain the junction temperature of the device at significantly lower levels and render the device even more insensitive to duty cycle variations on the clock, as shown in Figure 18. The THS1060 package makes use of the Texas Instruments PowerPAD which, when soldered to a thermal land, creates a highly efficient path for heat energy and ground noise currents from the circuit die to the PCB ground plane. The silicon die in a PowerPAD package is bonded to a copper alloy plate with a thin layer of thermally and electrically conductive epoxy. The copper alloy plate or PowerPAD is exposed on the bottom of the device package for a direct solder attachment to a PCB land or conductive pad. The land dimensions should have minimum dimensions equal to the package dimensions minus 2 mm, see Figure 25. For a multilayer circuit board, a second land having dimensions equal to or greater than the land to which the device is soldered should be placed on the back of the circuit board (see Figure 26). A total of 9 thermal vias or plated through-holes should be used to connect the two lands to a ground plane (buried or otherwise) having a minimum total area of 3 inches square in 1 oz. copper. For the THS1060 package, the thermal via centers should be spaced at a minimum of 1 mm. The ground plane need not be directly under or centered around the device footprint if a wide ground plane thermal run having a width on the order of the device is used to channel the heat from the vias to the larger portion of the ground plane. The THS1060 package has a standoff of 0.19 mm or 7.5 mils. In order to apply the proper amount of solder paste to the land. a solder paste stencil with a 6 mils thickness is recommended for this device. Too thin a stencil may lead to an inadequate connection to the land. Too thick a stencil may lead to beading of solder in the vicinity of the pins which may lead to shorts. For more information, refer to Texas Instruments literature number SLMA002 PowerPAD Thermally Enhanced Package. 18 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 APPLICATION INFORMATION using the TI PowerPAD (continued) 1.25 mm 2 x 1.25 mm 1.25 mm 5 mm 2 x 1.25 mm 0.33 mm Diameter Plated Through Hole 5 mm Figure 25. Thermal Land (top view) PHP (S-PQFP-G48) Thermal Land ÏÏÏÏ ÎÎÎÎÎÎ ÌÌÌ ÌÌ ÎÎ ÌÌÌÌ ÎÎ ÎÎÎÎÎ ÏÏÏÏ ÎÎÎÎÎÎ ÎÎ ÎÎ ÎÎÎÎÎ ÎÎÎÎÎÎ ÎÎ ÎÎÎÎÎÎÎ ÎÎÎÎÎÎ ÎÎ ÎÎ ÎÎÎÎÎ ÎÎÎÎÎÎ ÎÎ ÎÎ ÎÎÎÎÎ ÌÌÌ ÌÌ ÌÌÎÎÎÎÎ ÌÌ ÎÎÎÎÎÎ ÎÎ ÎÎ Plated Through Hole PWB Figure 26. Top and Bottom Thermal Lands With Plated Through Holes (side view) POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 19 THS1060 10-BIT 60 MSPS IF SAMPLING COMMUNICATIONS ANALOG-TO-DIGITAL CONVERTER SLAS212 – MARCH 2000 MECHANICAL DATA PHP (S-PQFP-G48) PowerPAD PLASTIC QUAD FLATPACK 0,27 0,17 0,50 36 0,08 M 25 37 24 Thermal Pad (see Note D) 48 13 0,13 NOM 1 12 5,50 TYP Gage Plane 7,20 SQ 6,80 9,20 SQ 8,80 0,25 0,15 0,05 1,05 0,95 0°– 7° 0,75 0,45 Seating Plane 0,08 1,20 MAX 4146927/A 01/98 NOTES: A. B. C. D. All linear dimensions are in millimeters. This drawing is subject to change without notice. Body dimensions do not include mold flash or protrusions. The package thermal performance may be enhanced by bonding the thermal pad to an external thermal plane. This pad is electrically and thermally connected to the backside of the die and possibly selected leads. E. Falls within JEDEC MO-153 20 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgment, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. Customers are responsible for their applications using TI components. In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof. Copyright 2000, Texas Instruments Incorporated