NSC LF13006

LF13006/LF13007 Digital Gain Set
General Description
The LF13006 and LF13007 are precision digital gain sets
used for accurately setting non-inverting op amp gains.
Gains are set with a 3-bit digital word which can be latched
in with WR and CS pins. All digital inputs are TTL and CMOS
compatible.
The LF13006 shown below will set binary scaled gains of 1,
2, 4, 8, 16, 32, 64, and 128. The LF13007 will set gains of 1,
2, 5, 10, 20, 50, and 100 (a common attenuator sequence).
In addition, both versions have several taps and two uncommitted matching resistors that allow customization of the
gain.
The gains are set with precision thin film resistors. The low
temperature coefficient of the thin film resistors and their
excellent tracking result in gain ratios which are virtually independent of temperature.
The LF13006, LF13007 used in conjunction with an amplifier not only satisfies the need for a digitally programmable
amplifier in microprocessor based systems, but is also useful for discrete applications, eliminating the need to find
0.5% resistors in the ratio of 100 to 1 which track each
other over temperature.
Features
Y
Y
Y
Y
Y
Y
TTL and CMOS compatible logic levels
Microprocessor compatible
Gain error 0.5% max
Binary or scope knob gains
Wide supply range a 5V to g 18V
Packaged in 16-pin DIP
Block Diagram and Typical Application (LF13006)
TL/H/5114 – 1
Note: R j 15 kX
Order Number LF13006N or LF13007N
See NS Package Number N16A
C1995 National Semiconductor Corporation
TL/H/5114
RRD-B30M115/Printed in U. S. A.
LF13006/LF13007 Digital Gain Set
February 1995
Absolute Maximum Ratings
Operating Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Operating Temperature Range
Lead Temp. (Soldering, 10 seconds)
Supply Voltage,
Va
to
Vb
Supply Voltage, V a to GND
Voltage at Any Digital Input
Analog Voltage
Va
b 40§ C to a 85§ C
260§ C
36V
25V
V a to GND
to (Vb a 2V)
Electrical Characteristics (Note 2)
Parameter
Conditions
Typ
(Note 3)
Tested
Limit
(Note 4)
Design
Limit
(Note 5)
Units
0.5
0.5
%(max)
Gain Error
AOUT e g 10V
ANA GND e 0V
IINPUTk10 nA
0.3
Gain Temperature Coefficient
AOUT e g 10V
ANA GND e 0V
0.001
Digital Input Voltage
Low
High
%/§ C
1.4
1.6
0.8
2.0
0.8
2.0
V(max)
V(min)
b 38
0.0001
b 100
b 100
1
1
mA(max)
mA(max)
Digital Input Current
Low
High
VIL e 0V
VIH e 5V
Positive Power Supply Current
All Logic Inputs Low
2
5
5
mA(max)
Negative Power Supply Current
All Logic Inputs Low
b 1.7
b5
b5
mA(max)
Write Pulse Width, tW
VIL e 0V, VIH e 5V
150
ns(min)
Chip Select Set-Up Time, tCS
VIL e 0V, VIH e 5V
250
ns(min)
Chip Select Hold Time, tCH
VIL e 0V, VIH e 5V
0
ns(min)
DIG IN Set-Up Time, tDS
VIL e 0V, VIH e 5V
150
ns(min)
DIG IN Hold Time, tDH
VIL e 0V, VIH e 5V
60
Switching Time for Gain Change
(Note 4)
ns(min)
200
ns(max)
Switch On Resistance
3
Unit Resistance, R
15
12 – 18
R1 and R2 Mismatch
0.3
0.5
R1/R2 Temperature Coefficient
0.001
kX
kX
0.5
%(max)
%/§ C
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating
the device beyond its specified operating conditions.
Note 2: Parameters are specified at V a e 15V and Vb e b 15V. Min V a to ground voltage is 5V. Min V a to Vb voltage is 5V. Boldface numbers apply over full
operating temperature ranges. All other numbers apply at TA e Tj e 25§ C.
Note 3: Typicals are at 25§ C and represent most likely parametric norm.
Note 4: Guaranteed and 100% production tested.
Note 5: Guaranteed (but not 100% production tested) over the operating temperature. These limits are not used to calculate outgoing quality levels.
Note 6: Settling time for gain change is the switching time for gain change plus settling time (see section on Settling Time).
Note 7: WR minimum high threshold voltage increases to 2.4V under the extreme conditions when all three digital inputs are simultaneously taken from 0V to 5V at
a slew rate of greater than 500V/mS.
Connection Diagram
GAIN TABLE
Dual-In-Line Package
Gain
Digital Input
LF13006
LF13007
DIG in 3
DIG in 2
DIG in 1
AOUT
BOUT
AOUT
BOUT
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
1
2
4
8
16
32
64
128
1
1.25
2.5
5
10
20
40
80
1
1.25
2
5
10
20
50
100
1
1
1.6
4
8
16
40
80
2
TL/H/5114 – 2
Switching Waveforms
TL/H/5114 – 3
Block Diagram and Typical Application (Continued) (LF13007)
TL/H/5114 – 4
Note: R j 15 kX
3
Typical Performance Characteristics
Positive Power Supply
Current vs Temperature
Negative Power Supply
Current vs Temperature
Digital Input Threshold vs
Temperature
Logical 0 Input Bias Current
vs Temperature
Digital Input Threshold vs
Supply Voltage
Write Width, tw
Data Set-Up Time, tDS
Chip Select Set-Up Time, tcs
TL/H/5114–5
4
Application Information
use of a lead capacitor from the inverting input to the output
of the amplifier. A lead capacitor is effective whenever the
feedback around an amplifier is resistive, whether with discrete resistors or with the LF13006/7. It compensates for
the feedback pole created by the parallel resistance and
capacitance from the inverting input of the op amp to AC
ground.
Settling Time Test Circuit
FLOW-THROUGH OPERATION
THE LF13006, LF13007 can be operated with control lines
CS and WR grounded. In this mode new data on the digital
inputs will immediately set the new gain value. Input data
cannot be latched in this mode.
INPUT CURRENT
Current flowing through the input (pin 2) due to bias current
of the op amp will result in a gain error due to switch impedance. Normally this error is very small. For example, 10 nA
of bias current flowing through 3 kX of switch resistance will
result in an error of 30 mV at the summing node. However,
applications that have significant current flowing through the
input must take this effect into account.
SETTLING TIME
Settling time is a function of the particular op amp used with
the LF13006/7 and the gain that is selected. It can be optimized and stability problems can be prevented through the
TL/H/5114 – 6
Typical Settling Time Curves
TL/H/5114 – 7
* Unstable at CL less than 2 pF
Typical Applications
Variable Capacitance Multiplier
Variable Time Constant Filter
Ceffective e C1(gain set Ý)
Time constant e
Note: Output swing at input op amp
R
C1
N
N e setting of LF13006
is multiplied by set gain. Signal
range may be limited.
(range e
1
to 1)
128
TL/H/5114 – 9
TL/H/5114 – 8
5
Typical Applications
(Continued)
Switchable Gain of g 1
Programmable Current Source
TL/H/5114 – 11
Note: Digital code e 000, VOUT e VIN;
Digital code e 001, VOUT eb VIN
Programmable Differential Amp
TL/H/5114–10
1OUT e
Ð
1.2V
1
120X gain set Ý
(
Inverting Gains
TL/H/5114–12
Inverting gain with high input impedance can be obtained with the
LF13006, LF13007 by using the two
TL/H/5114 – 13
on-board resistors and a dual op
amp as shown.
Note 1: Actual gain e set gain b 1
since LF13006s are in
‘‘inverting mode’’.
Note 2: Set gain must be
same on both LF13006s.
6
Typical Applications
Altered Gain Range
(Continued)
One Octave per Bit Function Generator
Variable Gains of Almost 1
TL/H/5114–14
TL/H/5114–16
TL/H/5114–15
GAINS
AOUT
1
1.8
3
4.5
6
7.2
8
8.47
GAINS
9
1.8
1.29
1.125
1.059
1.029
1.014
1.007
BOUT
1
1.2
2
3
4
4.8
5.33
5.65
Programmable Instrumentation Amp
Attenuator (0 dB to b42 dB in 6 dB steps)
TL/H/5114 – 17
Note 1: VOUT e N (A b B), N e set gain.
TL/H/5114 – 18
Note 2: All 10k resistors 0.1% matched.
7
LF13006/LF13007 Digital Gain Set
Physical Dimensions inches (millimeters)
Molded Dual-In-Line Package (N)
Order Number LF13006N or LF13007N
NS Package Number N16A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and whose
failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
National Semiconductor
Corporation
1111 West Bardin Road
Arlington, TX 76017
Tel: 1(800) 272-9959
Fax: 1(800) 737-7018
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
National Semiconductor
Europe
Fax: (a49) 0-180-530 85 86
Email: cnjwge @ tevm2.nsc.com
Deutsch Tel: (a49) 0-180-530 85 85
English Tel: (a49) 0-180-532 78 32
Fran3ais Tel: (a49) 0-180-532 93 58
Italiano Tel: (a49) 0-180-534 16 80
National Semiconductor
Hong Kong Ltd.
13th Floor, Straight Block,
Ocean Centre, 5 Canton Rd.
Tsimshatsui, Kowloon
Hong Kong
Tel: (852) 2737-1600
Fax: (852) 2736-9960
National Semiconductor
Japan Ltd.
Tel: 81-043-299-2309
Fax: 81-043-299-2408
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.