100322 Low Power 9-Bit Buffer General Description The 100322 is a monolithic 9-bit buffer. The device contains nine non-inverting buffer gates with single input and output. All inputs have 50 kΩ pull-down resistors and all outputs are buffered. n n n n 2000V ESD protection Pin/function compatible with 100122 Voltage compensated operating range = −4.2V to −5.7V Available to MIL-STD-883 Features n 30% power reduction of the 100122 Logic Symbol Pin Names Description D1, D9 Data Inputs O1, O9 Data Outputs DS100308-1 © 1998 National Semiconductor Corporation DS100308 www.national.com 100322 Low Power 9-Bit Buffer August 1998 Connection Diagrams 24-Pin DIP 24-Pin Quad Cerpak DS100308-3 DS100308-2 www.national.com 2 Absolute Maximum Ratings (Note 1) ≥2000V ESD (Note 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Recommended Operating Conditions Above which the useful life may be impaired. Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic VEE Pin Potential to Ground Pin Input Voltage (DC) Output Current (DC Output HIGH) Case Temperature (TC) Military Supply Voltage (VEE) −65˚C to +150˚C +175˚C −7.0V to +0.5V VEE to +0.5V −50 mA −55˚C to +125˚C −5.7V to −4.2V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Military Version DC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C Symbol Max Units TC Output HIGH Voltage −1025 −870 mV 0˚C to +125˚C −1085 VOL Output LOW Voltage VOHC VOLC VIH Parameter Conditions Min VOH −870 mV −55˚C −1830 −1620 mV 0˚C to +125˚C −1830 −1555 mV −55˚C Output HIGH Voltage −1035 mV 0˚C to +125˚C −1085 mV −55˚C Output LOW Voltage Input HIGH Voltage −1610 mV 0˚C to +125˚C −1555 mV −55˚C −870 mV −55˚C to +125˚C −1165 VIN = VIH (Max) Loading with or VIL (Min) 50Ω to −2.0V VIN = VIH (Max) Loading with or VIL (Min) 50Ω to −2.0V (Notes 3, 4, 5) Guaranteed HIGH Signal for All Inputs VIL IIL IIH IEE Input HIGH Voltage Input LOW Current −1830 −1475 0.50 Input HIGH Current Power Supply Current mV −70 −55˚C to +125˚C µA Guaranteed LOW Signal −55˚C to +125˚ for All Inputs VEE = −4.2V VIN = VIL (Min) VEE = −5.7V 240 µA 0˚C to +125˚C 340 µA −55˚C −25 mA −55˚C to +125˚C Notes (Notes 3, 4, 5) VIN = VIH (Notes 3, 4, 5, 6) (Notes 3, 4, 5, 6) (Notes 3, 4, 5) (Notes 3, 4, 5) (Max) Inputs Open (Notes 3, 4, 5) Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing VOH/VOL. AC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND Symbol Parameter tPLH Propagation Delay tPHL Data to Output tTLH Transition Time tTHL 20% to 80%, 80% to 20% TC = −55˚C TC = +25˚C TC = +125˚C Min Max Min Max Min Max 0.30 1.80 0.40 1.60 0.40 1.80 Units Conditions ns Figures 1, 2 0.30 1.20 0.30 1.20 0.30 1.20 ns Notes (Notes 7, 8, 9, 11) (Note 10) Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25˚C, only Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11. 3 www.national.com AC Electrical Characteristics (Continued) Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data). Note 11: The propagation delay specified is for single output switching. Delays may vary up to 200 ps with multiple outputs switching. Test Circuit DS100308-5 Notes: VCC, VCCA = +2V, VEE = −2.5V L1 and L2 = equal length 50Ω impedance lines RT = 50Ω terminator internal to scope Decoupling 0.1 µF from GND to VCC and VEE All unused outputs are loaded with 50Ω to GND CL = Fixture and stray capacitance ≤ 3 pF FIGURE 1. AC Test Circuit Switching Waveforms DS100308-6 FIGURE 2. Propagation Delay and Transition Times www.national.com 4 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Ceramic Dual-In-Line Package (0.400" Wide) (D) NS Package Number J24E 24-Lead Ceramic Flatpak (F) NS Package Number W24B 5 www.national.com 100322 Low Power 9-Bit Buffer LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 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