AOSMD AON6554

AOS Semiconductor
Product Reliability Report
AON6554,
rev A
Plastic Encapsulated Device
ALPHA & OMEGA Semiconductor, Inc
www.aosmd.com
This AOS product reliability report summarizes the qualification result for AON6554.
Accelerated environmental tests are performed on a specific sample size, and then followed
by electrical test at end point. Review of final electrical test result confirms that AON6554
passes AOS quality and reliability requirements.
Table of Contents:
I.
II.
III.
IV.
Product Description
Package and Die information
Environmental Stress Test Summary and Result
Reliability Evaluation
I. Product Description:
General Description:
• Latest Trench Power AlphaMOS (αMOS LV) technology
• Very Low RDS(ON) at 4.5V VGS
• Low Gate Charge
• High Current Capability
• RoHS and Halogen-Free Compliant
Application:
• DC/DC Converters in Computing, Servers, and POL
• Isolated DC/DC Converters in Telecom and Industrial
Detailed information refers to datasheet.
II. Die / Package Information:
AON6554
Standard sub-micron
30V N-Channel AlphaMOS
Package Type
DFN 5x6
Lead Frame
Cu
Die Attach
Solder Paste
Bonding
Clip
Mold Material
Epoxy resin with silica filler
MSL (moisture sensitive level) Level 1 based on J-STD-020
Process
Note * based on information provided by assembler and mold compound supplier
III. Result of Reliability Stress for AON6554
Test Item
Test Condition
Time
Point
MSL
Precondition
168hr 85°c
/85%RH +3 cycle
[email protected]°c
-
HTGB
Temp = 150 c,
Vgs=100% of
Vgsmax
168hrs
500 hrs
1000 hrs
Temp = 150 c,
Vds=80% of
Vdsmax
168hrs
500 hrs
1000 hrs
HAST
130 c, 85%RH,
33.3 psi, Vgs =
100% of Vgs max
100 hrs
Pressure Pot
121c, 29.7psi,
RH=100%
96 hrs
Temperature
Cycle
-65c to 150c,
air to air
250 / 500
cycles
HTRB
Lot
Attribution
Total
Sample
size
Number
of
Failures
Standard
11 lots
2299pcs
0
JESD22A113
1 lot
308pcs
0
JESD22A108
77pcs / lot
308pcs
0
JESD22A108
(Note A*)
11 lots
77pcs / lot
605pcs
0
JESD22A110
(Note A*)
11 lots
55pcs / lot
847pcs
0
JESD22A102
(Note A*)
11 lots
77pcs / lot
847pcs
0
JESD22A104
(Note A*)
77pcs / lot
3 lots
(Note A*)
1 lot
3 lots
Note A: The reliability data presents total of available generic data up to the published date.
IV. Reliability Evaluation
FIT rate (per billion): 7
MTTF = 15704 years
The presentation of FIT rate for the individual product reliability is restricted by the actual
burn-in sample size of the selected product (AON6554). Failure Rate Determination is based
on JEDEC Standard JESD 85. FIT means one failure per billion hours.
2
9
Failure Rate = Chi x 10 / [2 (N) (H) (Af)]
9
= 1.83 x 10 / [2x (2x77x168+6x77x1000) x258] = 7
9
8
MTTF = 10 / FIT = 1.38 x 10 hrs = 15704 years
Chi²= Chi Squared Distribution, determined by the number of failures and confidence interval
N = Total Number of units from HTRB and HTGB tests
H = Duration of HTRB/HTGB testing
Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C)
Acceleration Factor [Af] = Exp [Ea / k (1/Tj u – 1/Tj s)]
Acceleration Factor ratio list:
55 deg C
70 deg C
85 deg C
100 deg C
115 deg C
Af
258
87
32
13
5.64
Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16
Tj u = The use junction temperature in degree (Kelvin), K = C+273.16
-5
K = Boltzmann’s constant, 8.617164 X 10 eV / K
130 deg C
150 deg C
2.59
1