AOS Semiconductor Product Reliability Report AOTF7T60, rev A Plastic Encapsulated Device ALPHA & OMEGA Semiconductor, Inc www.aosmd.com 1 This AOS product reliability report summarizes the qualification result for AOTF7T60. Accelerated environmental tests are performed on a specific sample size, and then followed by electrical test at end point. Review of final electrical test result confirms that AOTF7T60 passes AOS quality and reliability requirements. Table of Contents: I. II. III. IV. V. Product Description Package and Die information Environmental Stress Test Summary and Result Reliability Evaluation Appendix: Test data I. Product Description: The AOTF7T60 is fabricated using an advanced high voltage MOSFET process that is designed to deliver high levels of performance and robustness in popular AC-DC applications. By providing low RDS(on), Ciss and Crss along with guaranteed avalanche capability this parts can be adopted quickly into new and existing offline power supply designs. For Halogen Free add "L" suffix to part number: AOTF7T60L Details refer to the datasheet. II. Die / Package Information: AOTF7T60 Standard sub-micron 600V N-Channel MOSFET Package Type TO220F Lead Frame Bare Cu Die Attach Soft solder Bonding Al wire Mold Material Epoxy resin with silica filler Moisture Level Up to Level 1 * Note * based on info provided by assembler and mold compound supplier Process 2 III. Result of Reliability Stress for AOTF7T60 Test Item Test Condition Time Point MSL Precondition 168hr 85°c /85%RH +3 cycle reflow@250°c Temp = 150°c , Vgs=100% of Vgsmax - 21 lots 4158pcs 0 JESD22A113 168hrs 500 hrs 1000 hrs 2 lots 3 lots 6 lots 847pcs 0 JESD22A108 Temp = 150°c , Vds=80% of Vdsmax 168hrs 500 hrs 1000 hrs 2 lots 3 lots 6 lots 847pcs 0 JESD22A108 HAST 130°c , 85%RH, 33.3 psi, Vgs = 100% of Vgs max 96 hrs 15 lots 1155pcs 0 JESD22A110 Pressure Pot 121°c , 29.7psi, RH=100% 96 hrs (Note A*) 18 lots 77 pcs / lot 1386pcs 0 JESD22A102 (Note A*) 77 pcs / lot 0 JESD22A104 HTGB HTRB Temperature Cycle -65°c to 150°c , air to air, 250 / 500 cycles Lot Attribution 21 lots (Note A*) Total Sample size Number of Failures Reference Standard 77 pcs / lot 77 pcs / lot 1617pcs 77 pcs / lot IV. Reliability Evaluation FIT rate (per billion): 2.92 MTTF = 39075 years The presentation of FIT rate for the individual product reliability is restricted by the actual burn-in sample size of the selected product (AOTF7T60). Failure Rate Determination is based on JEDEC Standard JESD 85. FIT means one failure per billion hours. 2 9 Failure Rate (FIT) = Chi x 10 / [2 (N) (H) (Af)] 9 = 1.83 x 10 / [2x (4x77x168 +6x77x500 +12x77x1000) x259] = 2.92 9 8 MTTF = 10 / FIT = 3.42 x 10 hrs = 39075 years Chi²= Chi Squared Distribution, determined by the number of failures and confidence interval N = Total Number of units from HTRB and HTGB tests H = Duration of HTRB/HTGB testing Af = Acceleration Factor from Test to Use Conditions (Ea = 0.7eV and Tuse = 55°C) Acceleration Factor [Af] = Exp [Ea / k (1/Tj u – 1/Tj s)] Acceleration Factor ratio list: 55 deg C 70 deg C 85 deg C 100 deg C 115 deg C Af 259 87 32 13 5.64 Tj s = Stressed junction temperature in degree (Kelvin), K = C+273.16 Tj u =The use junction temperature in degree (Kelvin), K = C+273.16 k = Boltzmann’s constant, 8.617164 x 10-5eV / K 130 deg C 150 deg C 2.59 1 3