AOSMD AOZ8000HI

AOS Semiconductor
Product Reliability Report
AOZ8000HI, rev 1
Plastic Encapsulated Device
ALPHA & OMEGA Semiconductor, Inc
495 Mercury Drive
Sunnyvale, CA 94085
U.S.
Tel: (408) 830-9742
www.aosmd.com
Mar 26, 2007
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This AOS product reliability report summarizes the qualification result for AOZ8000HI.
Review of the electrical test results confirm that AOZ8000HI pass AOS quality and reliability
requirements for product release. The continuous qualification testing and reliability monitoring
program ensure that all outgoing products will continue to meet AOS quality and reliability standards.
Table of Contents:
I.
II.
III.
IV.
V.
Product Description
Package and Die information
Qualification Test Requirements
Qualification Tests Result
Quality Assurance Information
I. Product Description:
The AOZ8000HI is a transient voltage suppressor array designed to protect high speed data lines from ESD and
lightning. The product comes in RoHS compliant, SC70 package and is rated over a -40°C to +85°C ambient
temperature range.
.
Absolute Maximum Ratings
Parameter
VP-VN
6V
Peak Pulse Current (Ipp), tp=8/20uS
5A
Peak Power Dissipation (8x20mS@ 25°C)
SOT-23
50W
Storage Temperature (TS)
ESD Rating per IEC61000-4-2, contact (1)
ESD Rating per IEC61000-4-2, air (2)
ESD Rating per Human Body Model (2)
Junction Temperature (Tj)
-65°C to +150°C
±12kV
±15kV
±15kV
-40°C to +125°C
Notes:
(1) IEC-61000-4-2 discharge with CDischarge=150pF, RDischarge=330Ω
(2) Human Body Discharge per MIL-STD-883, Method 3015 CDischarge=100pF, RDischarge=1.5kΩ
II. Package and Die Information:
Product ID
Process
Package Type
Die
L/F material
Die attach material
Die bond wire
Mold Material
Plating Material
AOZ8000HI
UMC 0.5um 5/18V 2P3M process
SC70
UE003A3 (size: 716 x 616 um)
AgCu
Ablebond 8006NS
Au, 1mil
CEL9220HF13
Pure Tin
III. Qualification Tests Requirments
2
•
•
•
2 lots of AOZ8000HI up to 168 hrs of B/I for New Product release.
2 additional lots of AOZ8000HI up to 168 hrs of B/I for New UH_EPI process release.
2 lots of package qual testing (PCT, 250 cycles TC) for SC70 for package release to manufacturing.
IV. Qualification Tests Result
Test Item
Test Condition
Sample Size
Result
PreConditioning
Per JESD 22-A113
0
85 C /85%RH, 3 cyc
0
[email protected] C
2 lot (82 /lot)
pass
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 82 units, passed pre-conditioning.
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 82 units, passed pre-conditioning.
HTOL
(pkg qual
burn-in )
Per JESD 22-A108_B
Vdd=6V
0
Temp = 125 C
2 lot (80 /lot)
pass
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 80 units, passed 500 hrs .
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 80 units, passed 500 hrs .
HTOL
(old UE003A
process)
Per JESD 22-A108_B
Vdd=6V
Temp = 125 0C
2 lot (80 /lot)
pass
Lot 1 (wafer lot# F9AN1.51-8, marking:
ABR11), 80 units, passed 1000 hrs .
Lot 2 (wafer lot# F9AN1.51-10, marking:
CBU11), 80 units, passed 500 hrs .
HTOL
(new UH_EPI
process)
Per JESD 22-A108_B
Vdd=6V
0
Temp = 125 C
2 lot (80 /lot)
pass
Qual by extension using AOZ8000C
(same die in SOT23 pkg.)
HAST
'130 +/- 2 0C, 85%RH, 33.3 2 lot (60 /lot)
psi, at VCC min power
dissapation
pass
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 60 units, passed HAST 100 hrs .
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 60 units, passed HAST 100 hrs .
Temperature
Cycle
'-65 0C to +150 0C, air to
air (2cyc/hr)
2 lot (82 /lot)
pass
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 82 units, passed TC 500 cycles.
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 82 units, passed TC 500 cycles.
Pressure Pot
121C, 15+/-1 PSIG,
RH= 100%
2 lot (82 /lot)
pass
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 82 units, passed PCT 96 hrs.
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 82 units, passed PCT 96 hrs.
ESD Rating
Per IEC-61000-4-2,
contact
3 units
pass
Lot 1 (wafer lot# FAYY3.02-3, marking:
AB008), 3 units passed ±12kV
ESD Rating
Per IEC-61000-4-2, air
3 units
pass
Lot 1 (wafer lot# FAYY3.02-3, marking:
AB008), 3 units passed ±15kV
Latch-up
Per JESD78A
3 units
pass
Lot 1 (wafer lot# FAYY3.02-3, marking:
AB008), 3 units passed Latch-up.
Comment
Lot 1 (wafer lot# FNG88, marking:
AC001), 80 units, passed 500 hrs .
Lot 2 (wafer lot# FAYY3.02-3 marking:
AB008), 80 units, passed 500 hrs .
The qualification test results confirm that AOZ8000HI pass AOS quality and reliability
requirements for product release.
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V. Quality Assurance Information
Acceptable Quality Level for outgoing inspection: 0.1% for electrical and visual. Guaranteed
Outgoing Defect Rate: < 50 ppm
Quality Sample Plan: conform to Mil-Std -105D
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