NSC CGS700TV

CGS700V
Commercial Low Skew PLL 1 to 9 CMOS Clock Driver
Y
General Description
CGS700 is an off the shelf clock driver specifically designed
for today’s high speed processors. It provides low skew outputs which are produced at different frequencies from three
fixed input references. The XTALIN input pin is designed to
be driven from three distinct crystal oscillators running at
25 MHz, 33 MHz or 40 MHz.
The PLL, using a charge pump and an internal loop filter,
multiplies this input frequency to create a maximum output
frequency of four times the input.
The device includes a TRI-STATEÉ control pin to disable
the outputs while the PLL is still in lock. This function allows
for testing the board without having to wait to acquire the
lock once the testing is complete.
(continued)
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Features
Y
Y
Guaranteed and tested:
Ð 500 ps pin-to-pin skew (tOSHL and tOSLH) on 1X
outputs
Y
Y
Guaranteed:
Ð 400 ps pin-to-pin skew (tOSHL and tOSLH) on
1Xoutputs
PentiumTM and PowerPCTM compatible
Output buffer of nine drivers for large fanout
25 MHz – 160 MHz output frequency range
Outputs operating at 4X, 2X, 1X of the reference
frequency for multi-frequency bus applications
Selectable output frequency
TRI-STATE output control with the PLL is in the lock
state
Internal loop filter to reduce noise and jitter
Separate analog and digital VCC and Ground pins
Low frequency test mode by disabling the PLL
Implemented on National’s Core CMOS process
Symmetric output current drive:
a 30 mA/ b 30 mA IOL/IOH
28-pin PCC for optimum skew performance
Guaranteed 2k ESD protection
Pin Description
PLCC Package
Connection Diagram
Pin
Pin Assignment for PLCC
TL/F/11955 – 1
See NS Package Number V28A
TRI-STATEÉ is a registered trademark of National Semiconductor Corporation.
PowerPCTM is a trademark of IBM.
PentiumTM is a trademark of Intel Corporation.
C1996 National Semiconductor Corporation
TL/F/11955
Name
Description
1
VCC
Digital VCC
2
SKWSEL
Skew Test Selector Pin
3
CLK4
4X Clock Output
4
VCC
Digital VCC
5
XTALIN
Crystal Oscillator Input
6
GND
Digital Ground
7
CLK1Ð0
1X Clock Output
8
VCC
Digital VCC
9
CLK1Ð1
1X Clock Output
10
GND
Digital Ground
11
CLK1Ð2
1X Clock Output
12
TRI-STATE
Output TRI-STATE Control
13
SKWTST
Skew Testing Pin
14
CLK1Ð3
1X Clock Output
15
GND
Digital Ground
16
CLK1Ð4
1X Clock Output
17
VCC
Digital VCC
18
EXTCLK
External Test Clock
19
GNDA
Analog Ground
20
VCCA
Analog VCC
21
EXTSEL
External Clock Mux Selector
22
GND
Digital Ground
23
CLK1Ð5
1X Clock Output
24
VCC
Digital VCC
25
CLK1Ð6
1X Clock Output
26
CLK1SEL
CLK1 Multiplier Selector
27
GND
Digital Ground
28
CLK2
2X Clock Output
RRD-B30M66/Printed in U. S. A.
CGS700V Commercial Low Skew PLL 1 to 9 CMOS Clock Driver
September 1995
General Description (Continued)
as SKWTST input frequency, while CLK2 is (/2 and CLK1
frequencies are (/4 respectively (refer to the truth table). In
addition CLK1SEL functionality is also true under this test
condition.
Also included, are two EXTSEL and EXTCLK pins to allow
testing the chip via an external source. The EXTSEL pin,
once set to high, causes the External-ClockÐMux to
change its input from the output of the VCO and Counter to
the external clock signal provided via EXTCLK input pin.
CLK1SEL pin changes the output frequency of the
CLK1Ð0, CLK1Ð6 outputs. During normal operation, when
CLK1SEL pin is high, these outputs are at the same frequency as the input crystal oscillator, while CLK2 and CLK4
outputs are at twice and four times the input frequency respectively.
Once CLK1SEL pin is set to a low logic level, the CLK1
outputs will be at twice the input frequency, the same as the
CLK2 output, with CLK4 output still being at four times the
input frequency.
In addition two other pins are added for increasing the test
capability. SKWSEL and SKWTST pins allow testing of the
counter’s output and skew of the output drivers by bypassing the VCO. In this test mode CLK4 frequency is the same
Typical Application
TL/F/11955 – 3
Block Diagram
CGS700
TL/F/11955 – 2
Truth Table
Input
Output
CLK1
SEL
EXT
SEL
EXT
CLK
SKW
SEL
SKW
TST
TRI-STATE
CLK4
CLK2
*H
L
X
L
X
H
4 c fIN
2 c fIN
fIN
*L
L
X
L
X
H
4 c fIN
2 c fIN
2 c fIN
X
H
É
X
X
H
É
É
É
H
L
X
H
É
H
1 c ftst
(/2 c ftst
(/4 c ftst
L
L
X
H
É
H
1 c ftst
(/2 c ftst
(/2 c ftst
X
X
X
X
X
L
Z
Z
Z
*Steady State phase, frequency lock.
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CLK1
2
CGS700
Absolute Maximum Ratings (Note A)
Note B: Power dissipation is calculated using 49§ /W as the thermal coefficient for the PCC package at 225 LFM airflow. The input frequency
is assumed @ 33 MHz with CLK4 at 132 MHz and CLK2 and CLK1’s
being at 66 MHz. In addition the ambient temperature is assumed
with power supply at 5.0V.
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
b 0.5V to a 7.0V
Supply Voltage (VCC)
DC Input Voltage Diode Current (IIK)
b 20 mA
V e b0.5V
a 20 mA
V e VCC a 0.5V
b 0.5V to VCC a 0.5V
DC Input Voltage (VI)
DC Output Diode Current (IO)
b 20 mA
V e b0.5V
a 20 mA
V e VCC a 0.5V
b 0.5V to VCC a 0.5V
DC Output Voltage (VO)
g 60 mA
DC Output Source or Sink Current (IO)
DC VCC or Ground Current
g 60 mA
per Output Pin (ICC or IGND)
b 65§ C to a 150§ C
Storage Temperature (TSTG)
Junction Temperature
150§ C
Power Dissipation (Static and Dynamic) (Note B) 1400 mW
Recommended Operating
Conditions
Supply Voltage (VCC)
Input Voltage (VI)
Output Voltage (VO)
4.5V to 5.5V
0V to VCC
0V to VCC
Input Crystal Frequency
25 MHz to 40 MHz
Operating Temperature (TA)
0§ C to a 70§ C
External Clock Frequency (EXTCLK Pin) 1 MHz to 10 MHz
XTALIN Duty Cycle Range
25/75 (75/25)%
Input Rise and Fall Times (0.8V to 2.0V)
Crystal Input
5 ns max
All Other Inputs
10 ns max
Typical iJA
0 LFM
54 § C/W
225 LFM
45 § C/W
500 LFM
38 § C/W
900 LFM
34 § C/W
Note A: The Absolute Maximum Ratings are those values beyond which the
safety of the device cannot be guaranteed. The device should not
be operated at these limits. The parametric values defined in the
DC and AC Electrical Characteristics tables are not guaranteed at
the absolute maximum ratings. The Recommended Operating Conditions will define the conditions for actual device operation.
DC Electrical Characteristics
Over recommended operating free air temperature range. All typical values are measured at VCC e 5V, TA e 25§ C
Symbol
Parameter
Conditions
VCC e 4.5V – 5.5V
TA e 0§ C–70§ C
Min
VIH
Minimum Input High Level Voltage
VIL
Maximum Input Low Level Voltage
VOH
Minimum Output High Level Voltage
VOL
Maximum Output Low Level Voltage
Typ
Units
Max
2.0
V
0.8
IOUT e b50 mA
VCC b 0.1
IOH e b30 mA
VCC b 0.6
V
V
IOUT e 50 mA
0.1
IOL e 30 mA
0.6
V
IOHD
High Level Output Current
VOH e VCC b 1.0V
50
110
170
mA
IOLD
Low Level Output Current
VOL e 1.0V
50
110
170
mA
IIN
Leakage Current
VIN e 0.4V or 4.6V
50
mA
IOZL/H
Output Leakage Current
CIN
Input Capacitance
10.0
pF
ICC
Quiescent Digital a Analog Current (No Load)
ICCT
ICC per TTL Input
VIN e VCC, GND
VIN e VCC b 2.1, GND
3
b 50
3.0
5.0
mA
2.5
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CGS700 (Continued)
AC Electrical Characteristics
Over recommended operating free air temperature range. All typical values are measured at VCC e 5V, TA e 25§ C
Symbol
VCC e 4.5V – 5.5V
FIN e 25 MHz – 40 MHz
TA e 0§ C–70§ C
CL e Circuit 1 and 2
RL e Circuit 1 and 2
Parameter
Min
trise
Output Rise
CLK4
CLK2
CLK1
ALL
tfall
Output Fall
CLK4
CLK2
CLK1
ALL
tskew
Maximum Edgeto-Edge Output
Skew
a to a Edges
a to a Edges
a to a Edges
Typ
Units
Notes
ns
(Notes 1, 5)
ns
(Notes 1, 5)
400
1000
1000
ps
(Notes 2, 5)
100
ms
51
51
65
%
(Notes 3, 5)
(Notes 4, 5)
Max
0.8V – 2.6V
1.0V – VCC b 1.0V
1.0V – VCC b 1.0V
2.0
0.8V – 2.0V
1.5
2.6V – 0.8V
VCC b 1.0V – 1.0V
VCC b 1.0V – 1.0V
2.0
2.0V – 0.8V
1.5
CLK1ÐCLK1
CLK1ÐCLK4
CLK2ÐCLK4
tlock
Time to Lock the Output to the Synch Input
tcycle
Output Duty Cycle
CLK1 Outputs
CLK2 Output
CLK4 Output
49
49
35
JLT
Output Jitter (Long Term)
0.3
ns
FMIN
Minimum XTALIN Frequency
15
MHz
FMAX
Maximum XTALIN Frequency
43
MHz
Circuit 1. Test Circuit for CLK1 and CLK2
TL/F/11955 – 4
Circuit 2. Test Circuit for CLK4
TL/F/11955 – 9
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4
CGS700 (Continued)
Note 1: trise and tfall parameters are measured at the pin of the device.
Note 2: Skew is measured at 50% of VCC for CLK1 and CLK2 while it is measured @ 1.4V for CLK4. Limits are guaranteed by design.
Note 3: Output duty cycle is measured at VDD/2 for CLK1 and CLK2 while it is measured @ 1.4V for CLK4. Limits are guaranteed by design.
Note 4: Jitter parameter is characterized and is guaranteed by design only. It measures the uncertainty of either the positive or the negative edge over 1000
cycles. It is also measured at output levels of VCC/2. Refer to Figure 2 for further explanation.
Note 5: The GNDA pins of the 700 must be as free of noise as possible for minimum jitter. Separate analog ground plane is recommended for the PCB.
Also the VCCA pin requires extra filtering to further reduce noise. Ferrite beads for filtering and bypass capacitors are suggested for VCCA pin.
TL/F/11955 – 5
TL/F/11955 – 6
TL/F/11955 – 7
FIGURE 1. Waveforms
TL/F/11955 – 8
Jitter e l Period(1) b Period(n a 1) l e 300 ps for either the rising or falling edge, where n is 1 to 1000 cycles.
FIGURE 2. Jitter
Application References and Bibliography
Information relating to EMI as well as general application issues are in the following application notes:
AN-988ÐEMI App Note
AN-640
AN-991
5
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CGS700V Commercial Low Skew PLL 1 to 9 CMOS Clock Driver
Ordering Information (Contact NSC Marketing for specific date of availability)
CGS
700
T
V
Family
Clock Generation and Support
Packaging
V e PCC
Device Type
700
Operating Temperature Range
Blank e Commercial
T e Industrial
Physical Dimensions inches (millimeters) unless otherwise noted
28-Lead Plastic Leaded Chip Carrier
NS Package Number V28A
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