54ABT541 Octal Buffer/Line Driver with TRI-STATE ® Outputs General Description The ’ABT541 is an octal buffer and line driver with TRI-STATE outputs designed to be employed as a memory and address driver, clock driver, or bus-oriented transmitter/ receiver. The ’ABT541 is similar to the ’ABT244 with broadside pinout. Features n Guaranteed latchup protection n High impedance glitch free bus loading during entire power up and power down cycle n Nondestructive hot insertion capability n Flow-through pinout for ease of PC board layout n Disable time less than enable time to avoid bus contention n Standard Microcircuit Drawing (SMD) 5962-9471801 n Non-inverting buffers n Output sink capability of 48 mA, source capability of 24 mA Ordering Code Military Package Package Description Number 54ABT541J-QML J20A 20-Lead Ceramic Dual-In-Line 54ABT541W-QML W20A 20-Lead Cerpack 54ABT541E-QML E20A 20-Lead Ceramic Leadless Chip Carrier, Type C Connection Diagram Pin Names Pin Assignment DIP and Cerpack Description OE1, OE2 Output Enable Input (Active Low) I0–I7 Inputs O0–O7 Outputs Truth Table Inputs DS100217-1 Pin Assignment LCC Outputs OE1 OE2 I ABT541 L L H H H X X Z X H X Z L L L L H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial Z = High Impedance DS100217-30 TRI-STATE ® is a registered trademark of National Semiconductor Corporation. © 1998 National Semiconductor Corporation DS100217 www.national.com 54ABT541 Octal Buffer/Line Driver with TRI-STATE Outputs August 1998 Absolute Maximum Ratings (Note 1) Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias Ceramic VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Any Output in the Disabled or Power-Off State in the HIGH State Current Applied to Output in LOW State (Max) DC Latchup Source Current Over Voltage Latchup (I/O) −65˚C to +150˚C −55˚C to +125˚C twice the rated IOL (mA) −500 mA 10V Recommended Operating Conditions −55˚C to +175˚C −0.5V to +7.0V −0.5V to +7.0V −30 mA to +5.0 mA Free Air Ambient Temperature Military Supply Voltage Military Minimum Input Edge Rate Data Input Enable Input −0.5V to 5.5V −0.5V to VCC −55˚C to +125˚C +4.5V to +5.5V (∆V/∆t) 50 mV/ns 20 mV/ns DC Electrical Characteristics Symbol Parameter ABT541 Min VIH Input HIGH Voltage VIL Input LOW Voltage VCD Input Clamp Diode Voltage VOH Output HIGH Voltage VOL Output LOW Voltage IIH Input HIGH Current Typ Units VCC 2.0 V 0.8 V −1.2 V Recognized HIGH Signal Min Recognized LOW Signal IIN = −18 mA IOH = −3 mA 54ABT 2.5 V Min 54ABT 2.0 V Min 0.55 V Min 5 µA Max 7 µA Max −5 µA Max VIN = 0.5V (Note 4) V 0.0 VIN = 0.0V IID = 1.9 µA µA 0 − 5.5V 54ABT 5 IBVI Conditions Max Input HIGH Current IOH = −24 mA IOL = 48 mA VIN = 2.7V (Note 4) VIN = VCC VIN = 7.0V Breakdown Test IIL Input LOW Current −5 VID Input Leakage Test IOZH Output Leakage Current IOZL Output Leakage Current IOS Output Short-Circuit Current ICEX IZZ 4.75 50 All Other Pins Grounded VOUT = 2.7V; OEn = 2.0V −50 µA 0 − 5.5V −275 mA Max Output High Leakage Current 50 µA Max Bus Drainage Test 100 µA 0.0 VOUT = 0.5V; OEn = 2.0V VOUT = 0.0V VOUT = VCC VOUT = 5.5V; All Others GND ICCH Power Supply Current 50 µA Max All Outputs HIGH ICCL Power Supply Current 30 mA Max ICCZ Power Supply Current 50 µA Max All Outputs LOW OEn = VCC; ICCT Additional ICC/Input Outputs Enabled 2.5 mA Outputs TRI-STATE 2.5 mA Outputs TRI-STATE 50 µA ICCD Dynamic ICC −100 No Load mA/ (Note 4) 0.1 MHz All Others at VCC or Ground VI = VCC − 2.1V Max Max Enable Input VI = VCC − 2.1V Data Input VI = VCC − 2.1V; All Others at VCC or Ground Outputs Open, OEn = GND, One Bit Toggling (Note 3), 50% Duty Cycle Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Note 3: For 8 bits toggling, ICCD < 0.8 mA/MHz. Note 4: Guaranteed, but not tested. www.national.com 2 DC Electrical Characteristics Symbol Parameter Min Max Units VCC VOLP Quiet Output Maximum Dynamic VOL 1.0 V 5.0 VOLV Quiet Output Minimum Dynamic VOL -1.45 V 5.0 Conditions CL = 50 pF, RL = 500Ω TA = 25˚C (Note 5) TA = 25˚C (Note 5) Note 5: Max number of outputs defined as (n). n − 1 data inputs are driven 0V to 3V. One output at LOW. Guaranteed, but not tested. AC Electrical Characteristics Symbol 54ABT TA = −55˚C to +125˚C VCC = 4.5V–5.5V Parameter Units CL = 50 pF Min Max tPLH Propagation Delay 1.0 5.0 tPHL Data to Outputs 1.0 5.3 tPZH Output Enable Time tPZL tPHZ Output Disable Time tPLZ 1.1 7.2 1.5 7.9 1.5 7.5 1.5 7.9 ns ns ns Capacitance Symbol Parameter Typ Units Conditions TA = 25˚C VCC = 0.0V VCC = 5.0V CIN Input Capacitance 5.0 pF COUT (Note 6) Output Capacitance 9.0 pF Note 6: COUT is measured at frequency of f = 1 MHz, per MIL-STD-883B, Method 3012. 3 www.national.com Capacitance (Continued) tPLH vs Temperature (TA) CL = 50 pF, 1 Output Switching tPHL vs Temperature (TA) CL = 50 pF, 1 Output Switching DS100217-11 tPLH vs Load Capacitance 1 Output Switching, TA = 25˚C DS100217-12 tPHL vs Load Capacitance 1 Output Switching, TA = 25˚C DS100217-13 tPLH vs Load Capacitance 8 Outputs Switching, TA = 25˚C DS100217-14 tPHL vs Load Capacitance 8 Outputs Switching, TA = 25˚C DS100217-15 DS100217-16 Dashed lines represent design characteristics; for specified guarantees refer to AC Characteristics Table. www.national.com 4 Capacitance (Continued) tPZL vs Temperature (TA) CL = 50 pF, 1 Output Switching tPLZ vs Temperature (TA) CL = 50 pF, 1 Output Switching DS100217-17 tPZL vs Temperature (TA) CL = 50 pF, 8 Outputs Switching DS100217-18 tPLZ vs Temperature (TA) CL = 50 pF, 8 Outputs Switching DS100217-19 tPZH vs Temperature (TA) CL = 50 pF, 1 Output Switching DS100217-20 tPHZ vs Temperature (TA) CL = 50 pF, 1 Output Switching DS100217-21 DS100217-22 Dashed lines represent design characteristics; for specified guarantees refer to AC Characteristics Table. 5 www.national.com Capacitance (Continued) tPZH vs Temperature (TA) CL = 50 pF, 8 Outputs Switching tPHZ vs Temperature (TA) CL = 50 pF, 8 Outputs Switching DS100217-23 tPZH vs Load Capacitance 8 Outputs Switching, TA = 25˚C DS100217-24 tPZL vs Load Capacitance 8 Outputs Switching, TA = 25˚C DS100217-25 tPLH and tPHL vs Number Outputs Switching VCC = 5.0V, TA = 25˚C, CL = 50 pF DS100217-26 ICC vs Frequency, Average, TA = 25˚C, All Outputs Unloaded/Unterminated DS100217-27 DS100217-28 Dashed lines represent design characteristics; for specified guarantees refer to AC Characteristics Table. www.national.com 6 AC Loading DS100217-3 DS100217-4 FIGURE 2. Test Input Signal Levels *Includes jig and probe capacitance FIGURE 1. Standard AC Test Load Amplitude Rep. Rate tw tr tf 3.0V 1 MHz 500 ns 2.5 ns 2.5 ns FIGURE 3. Test Input Signal Requirements AC Waveforms DS100217-5 DS100217-7 FIGURE 4. Propagation Delay Waveforms for Inverting and Non-Inverting Functions FIGURE 5. TRI-STATE Output HIGH and LOW Enable and Disable Time 7 www.national.com 8 Physical Dimensions inches (millimeters) unless otherwise noted 20-Terminal Ceramic Chip Carrier NS Package Number E20A 20-Lead Ceramic Dual-In-Line Package NS Package Number J20A 9 www.national.com 54ABT541 Octal Buffer/Line Driver with TRI-STATE Outputs Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 20-Lead Ceramic Flatpack NS Package Number W20A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 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