100304 Low Power Quint AND/NAND Gate General Description The 100304 is monolithic quint AND/NAND gate. The Function output is the wire-NOR of all five AND gate outputs. All inputs have 50 kΩ pull-down resistors. n n n n n Features 2000V ESD protection Pin/function compatible with 100104 Voltage compensated operating range = −4.2V to −5.7V Available to industrial grade temperature range Available to Standard Microcircuit Drawing (SMD) 5962-9153701 n Low Power Operation Logic Symbol DS100304-1 Logic Equation F = (D1a • D2a) + (D1b • D2b) + D1c • D2c) + (D1d • D2d) + (D1e • D2e). Pin Names Description Dna–Dne Data Inputs F Function Output Oa–Oe Data Outputs Oa–Oe Complementary Data Outputs © 1998 National Semiconductor Corporation DS100304 www.national.com 100304 Low Power Quint AND/NAND Gate August 1998 Connection Diagrams 24-Pin DIP 24-Pin Quad Cerpak DS100304-3 DS100304-2 www.national.com 2 Absolute Maximum Ratings (Note 1) ≥2000V ESD (Note 2) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Recommended Operating Conditions Above which the useful life may be impaired −65˚C to +150˚C Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic +175˚C −7.0V to +0.5V VEE Pin Potential to Ground Pin Input Voltage (DC) VEE to +0.5V Output Current (DC Output HIGH) −50 mA Case Temperature (TC) Military Supply Voltage (VEE) −55˚C to +125˚C −5.7V to −4.2V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Military Version DC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C Symbol VOH Conditions Parameter Min Max Units TC Output HIGH Voltage −1025 −870 mV 0˚C to −1085 −870 mV −55˚C VIN = VIH (Max) Loading with −1830 −1620 mV 0˚C to or VIL (Min) 50Ω0 to −2.0V −1830 −1555 mV −55˚C −1035 mV 0˚C to −1085 mV −55˚C VIN = VIH (Min) Loading with −1610 mV 0˚C to or VIL (Max) 50Ω to −2.0V −1555 mV −870 mV Notes +125˚C VOL Output LOW Voltage (Notes 3, 4, 5) +125˚C VOHC Output HIGH Voltage +125˚C VOLC Output LOW Voltage (Notes 3, 4, 5) +125˚C VIH VIL Input HIGH Voltage Input LOW Voltage −1165 −1830 −1475 mV −55˚C −55˚C Guaranteed HIGH Signal +125˚C for All Inputs −55˚C to +125˚C IIL Input LOW Current 0.50 µA −55˚C to +125˚C Guaranteed LOW Signal for All Inputs VEE = −4.2V (Notes 3, 4, 5, 6) (Notes 3, 4, 5, 6) (Notes 3, 4, 5) VIN = VIL (Min) Input High Current D2a–D2e 250 D1a–D1e 350 D2a–D2e 350 D1a–D1e 500 µA 0˚C to +125˚C IIH IEE Power Supply Current −75 −25 µA −55˚C mA −55˚C to VEE = −5.7V VIN = VIH (Max) (Notes 3, 4, 5) Inputs Open (Notes 3, 4, 5) +125˚C Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups, 1, 2 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing VOH/VOL. 3 www.national.com AC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND Symbol TC = −55˚C TC = +25˚C TC = +125˚C Min Max Min Max Min Max 0.30 1.90 0.40 1.80 0.30 2.30 ns 0.80 2.90 0.90 2.80 0.90 3.40 ns 0.20 1.80 0.30 1.60 0.20 2.00 ns Parameter tPLH Propagation Delay tPHL Dna–Dne to O, O tPLH Propagation Delay tPHL Data to F tTLH Transition Time tTHL 20% to 80%, 80% to 20% Units Conditions Notes (Notes 7, 8, 9) Figures 1, 2 (Note 10) Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each mfg. lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11. Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data). Test Circuitry DS100304-5 Notes: VCC, VCCA = +2V, VEE = −2.5V L1 and L2 = equal length 50Ω impedance lines RT = 50Ω terminator internal to scope Decoupling 0.1 µF from GND to VCC and VEE All unused outputs are loaded with 50Ω to GND CL = Fixture and stray capacitance ≤ 3 pF FIGURE 1. AC Test Circuit www.national.com 4 Switching Waveforms DS100304-6 FIGURE 2. Propagation Delay and Transition Times 5 www.national.com 6 Physical Dimensions inches (millimeters) unless otherwise noted 24-Pin Ceramic Dual-In-Line Package (D) NS Package Number J24E 24-Pin Quad Cerpak (F) NS Package Number W24B 7 www.national.com 100304 Low Power Quint AND/NAND Gate LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation Americas Tel: 1-800-272-9959 Fax: 1-800-737-7018 Email: [email protected] www.national.com National Semiconductor Europe Fax: +49 (0) 1 80-530 85 86 Email: [email protected] Deutsch Tel: +49 (0) 1 80-530 85 85 English Tel: +49 (0) 1 80-532 78 32 Français Tel: +49 (0) 1 80-532 93 58 Italiano Tel: +49 (0) 1 80-534 16 80 National Semiconductor Asia Pacific Customer Response Group Tel: 65-2544466 Fax: 65-2504466 Email: [email protected] National Semiconductor Japan Ltd. Tel: 81-3-5620-6175 Fax: 81-3-5620-6179 National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.