ETC NE4211M01

DATA SHEET
HETERO JUNCTION FIELD EFFECT TRANSISTOR
NE4211M01
C to Ku BAND SUPER LOW NOISE AMPLIFIER
N-CHANNEL HJ-FET
FEATURES
• Super low noise figure & associated gain:
NF = 0.75 TYP., Ga = 12 dB TYP. @ f = 12 GHz
NF = 0.4 TYP., Ga = 16 dB TYP. @ f = 4 GHz
• 6-pin super minimold package
• Gate width: Wg = 160 µm
ORDERING INFORMATION
Part Number
NE4211M01-T1
Package
Marking
6-pin super minimold
V74
Supplying Form
• 8 mm wide embossed taping
• Pin 1, 2, 3 face the perforation side of the tape
• Qty 3 kpcs/reel
Remark To order evaluation samples, contact your nearby sales office.
Part number for sample order: NE4211M01
ABSOLUTE MAXIMUM RATINGS (TA = +25°°C)
Parameter
Symbol
Ratings
Unit
Drain to Source Voltage
VDS
4.0
V
Gate to Source Voltage
VGS
−3.0
V
Drain Current
ID
IDSS
mA
Gate Current
IG
80
µA
Total Power Dissipation
Ptot
125
mW
Channel Temperature
Tch
+125
°C
Storage Temperature
Tstg
−65 to +125
°C
Caution Observe precautions when handling because these devices are sensitive to electrostatic discharge.
The information in this document is subject to change without notice. Before using this document, please confirm that
this is the latest version.
Not all devices/types available in every country. Please check with local NEC Compound Semiconductor Devices
representative for availability and additional information.
Document No. PG10325EJ01V0DS (1st edition)
Date Published January 2003 CP(K)
Printed in Japan
 NEC Compound Semiconductor Devices 2002, 2003
NE4211M01
PIN CONNECTIONS
(Top View)
V74
3
2
(Bottom View)
4
4
3
5
5
2
6
6
1
Pin No.
Pin Name
1
Gate
2
Source
3
Source
4
Drain
5
Source
6
Source
1
RECOMMENDED OPERATING RANGE (TA = +25°°C)
Parameter
Symbol
MIN.
TYP.
MAX.
Unit
VDS
1
2
3
V
Drain Current
ID
5
10
15
mA
Input Power
Pin
−
−
0
dBm
Drain to Source Voltage
ELECTRICAL CHARACTERISTICS (TA = +25°°C, unless otherwise specified)
Parameter
Symbol
Test Conditions
MIN.
TYP.
MAX.
Unit
Gate to Source Leak Current
IGSO
VGS = −3 V
−
0.5
10
µA
Saturated Drain Current
IDSS
VDS = 2 V, VGS = 0 V
15
40
70
mA
VGS(off)
VDS = 2 V, ID = 100 µA
−0.2
−0.7
−2.0
V
Trans Conductance
gm
VDS = 2 V, ID = 10 mA
40
55
−
mS
Noise Figure
NF
VDS = 2 V, ID = 10 mA, f = 12 GHz
−
0.75
1.1
dB
Associated Gain
Ga
10
12
−
dB
Noise Figure
NF
−
0.4
−
dB
Associated Gain
Ga
−
16
−
dB
Gate to Source Cutoff Voltage
2
VDS = 2 V, ID = 10 mA, f = 4 GHz
Data Sheet PG10325EJ01V0DS
NE4211M01
TYPICAL CHARACTERISTICS (TA = +25°°C, unless otherwise specified)
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
250
250
200
80
Drain Current ID (mA)
Total Power Dissipation Ptot (mW)
TOTAL POWER DISSIPATION vs.
AMBIENT TEMPERATURE
150
100
50
60
VGS = 0 V
40
–0.2 V
20
–0.4 V
–0.6 V
0
50
100
150
200
250
0
1.0
2.0
Drain to Source Voltage VDS (V)
Ambient Temperature TA (˚C)
DRAIN CURRENT vs.
GATE TO SOUCE VOLTAGE
Drain Current ID (mA)
VDS = 2 V
60
40
20
0
–2.0
–1.0
0
Gate to Source Voltage VGS (V)
Remark The graphs indicate nominal characteristics.
Data Sheet PG10325EJ01V0DS
3
NE4211M01
S-PARAMETERS
S-parameters/Noise parameters are provided on the NEC Compound Semiconductor Devices Web site in a form
(S2P) that enables direct import to a microwave circuit simulator without keyboard input.
Click here to download S-parameters.
[RF and Microwave] → [Device Parameters]
URL http://www.csd-nec.com/
4
Data Sheet PG10325EJ01V0DS
NE4211M01
PACKAGE DIMENSIONS
6-PIN SUPER MINIMOLD (UNIT: mm)
2.1±0.1
0.2+0.1
–0.05
0.65
0.65
1.3
Data Sheet PG10325EJ01V0DS
0.15+0.1
–0.05
0 to 0.1
0.7
0.1 MIN.
0.9±0.1
2.0±0.2
1.25±0.1
5
NE4211M01
PRECAUTION
(1) Because this device is a HJ-FET with a Schottky barrier gate structure, it is necessary that sufficient care be
taken regarding static electricity and strong electric fields.
Take measures against static electricity and make sure the body is earthed when mounting the device.
(2) Follow the procedure below when operating the device by a gate-and-drain-independent dual power supply.
Directly ground both the source pins.
Fix VGS to approximately –2 V.
Increase VDS to a predetermined voltage level (within the recommended operation range of VDS).
Adjust VGS in line with a predetermined ID.
(3) It is recommended that the bias application circuit be able to have a fixed voltage and current.
(4) Adjust the I/O matching circuit after turning the bias OFF.
RECOMMENDED SOLDERING CONDITIONS
This product should be soldered and mounted under the following recommended conditions.
For soldering
methods and conditions other than those recommended below, contact your nearby sales office.
Soldering Method
Soldering Conditions
Condition Symbol
Infrared Reflow
Peak temperature (package surface temperature)
Time at peak temperature
Time at temperature of 220°C or higher
Preheating time at 120 to 180°C
Maximum number of reflow processes
Maximum chlorine content of rosin flux (% mass)
: 260°C or below
: 10 seconds or less
: 60 seconds or less
: 120±30 seconds
: 3 times
: 0.2%(Wt.) or below
IR260
VPS
Peak temperature (package surface temperature)
Time at temperature of 200°C or higher
Preheating time at 120 to 150°C
Maximum number of reflow processes
Maximum chlorine content of rosin flux (% mass)
: 215°C or below
: 25 to 40 seconds
: 30 to 60 seconds
: 3 times
: 0.2%(Wt.) or below
VP215
Wave Soldering
Peak temperature (molten solder temperature)
Time at peak temperature
Preheating temperature (package surface temperature)
Maximum number of flow processes
Maximum chlorine content of rosin flux (% mass)
: 260°C or below
: 10 seconds or less
: 120°C or below
: 1 time
: 0.2%(Wt.) or below
WS260
Partial Heating
Peak temperature (pin temperature)
Soldering time (per side of device)
Maximum chlorine content of rosin flux (% mass)
: 350°C or below
: 3 seconds or less
: 0.2%(Wt.) or below
HS350
Caution Do not use different soldering methods together (except for partial heating).
6
Data Sheet PG10325EJ01V0DS
NE4211M01
• The information in this document is current as of January, 2003. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all
products and/or types are available in every country. Please check with an NEC sales representative
for availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
• NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of
third parties by or arising from the use of NEC semiconductor products listed in this document or any other
liability arising from the use of such products. No license, express, implied or otherwise, is granted under any
patents, copyrights or other intellectual property rights of NEC or others.
• Descriptions of circuits, software and other related information in this document are provided for illustrative
purposes in semiconductor product operation and application examples. The incorporation of these
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responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third
parties arising from the use of these circuits, software and information.
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agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
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semiconductor products, customers must incorporate sufficient safety measures in their design, such as
redundancy, fire-containment, and anti-failure features.
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The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
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(Note)
(1) "NEC" as used in this statement means NEC Corporation, NEC Compound Semiconductor Devices, Ltd.
and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4 - 0110
Data Sheet PG10325EJ01V0DS
7
NE4211M01
SAFETY INFORMATION ON THIS PRODUCT
Caution
GaAs Products
The product contains gallium arsenide, GaAs.
GaAs vapor and powder are hazardous to human health if inhaled or ingested.
• Do not destroy or burn the product.
• Do not cut or cleave off any part of the product.
• Do not crush or chemically dissolve the product.
• Do not put the product in the mouth.
Follow related laws and ordinances for disposal. The product should be excluded from general
industrial waste or household garbage.
Business issue
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Hong Kong Head Office
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Technical issue
NEC Compound Semiconductor Devices, Ltd.
http://www.csd-nec.com/
Sales Engineering Group, Sales Division
E-mail: [email protected] FAX: +81-44-435-1918
0209