NSC 100363F

100363
Low Power Dual 8-Input Multiplexer
General Description
The 100363 is a dual 8-input multiplexer. The Data Select
(Sn) inputs determine which bit (An and Bn) will be presented
at the outputs (Za and Zb respectively). The same bit (0–7)
will be selected for both the Za and Z b output. All inputs have
50 kΩ pulldown resistors.
n
n
n
n
2000V ESD protection
Pin/function compatible with 100163
Voltage compensated operating range = −4.2V to −5.7V
Standard Microcircuit Drawing
(SMD) 5962-9165501
Features
n 50% power reduction of the 100163
Logic Symbol
Pin Names
Description
S0–S2
Data Select Inputs
A0–A7
A Data Inputs
B0–B7
B Data Inputs
Za, Zb
Data Outputs
DS100310-1
Connection Diagrams
24-Pin Quad Cerpak
24-Pin DIP
DS100310-3
DS100310-2
© 1998 National Semiconductor Corporation
DS100310
www.national.com
100363 Low Power Dual 8-Input Multiplexer
August 1998
Logic Diagram
DS100310-5
www.national.com
2
Truth Table
Inputs
Outputs
Select
S2
S1
Data
S0
A7
A6
A5
A4
A3
A2
A1
A0
Za
B7
B6
B5
B4
B3
B2
B1
B0
Zb
L
L
L
L
L
L
L
L
H
H
L
L
H
L
L
L
L
H
H
H
L
H
L
L
L
L
H
L
H
H
L
H
H
L
L
L
H
H
H
H
H
L
L
L
L
H
L
L
H
H
H
L
H
L
L
H
L
H
H
H
H
H
L
L
L
H
H
L
H
H
H
H
H
L
L
H
H
H
H
H
H = HIGH Voltage Level
L = LOW Voltage Level
Blank = X = Don’t Care
3
www.national.com
Absolute Maximum Ratings (Note 1)
≥2000V
ESD (Note 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Recommended Operating
Conditions
Above which the useful life may be impared
Storage Temperature (TSTG)
Maximum Junction Temperature (TJ)
Ceramic
VEE Pin Potential to Ground Pin
Input Voltage (DC)
Output Current (DC Output HIGH)
Case Temperature (TC)
Military
Supply Voltage (VEE)
−65˚C to +150˚C
+175˚C
−7.0V to +0.5V
VEE to + 0.5V
−50 mA
−55˚C to +125˚C
−5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND, T
Symbol
VOH
Parameter
Min
C
= −55˚C to +125˚C
Conditions
Max
Units
TC
Output HIGH Voltage −1025
−870
mV
0˚C to
−1085
−870
mV
−55˚C
VIN = VIH (Max)
Loading with
−1830 −1620
mV
0˚C to
or VIL (Min)
50Ω to −2.0V
−1830 −1555
mV
−55˚C
Output HIGH Voltage −1035
mV
0˚C to
−1085
mV
−55˚C
VIN = VIH (Min)
Loading with
−1610
mV
0˚C to
or VIL (Max)
50Ω to −2.0V
−1555
mV
Note
+125˚C
VOL
Output LOW Voltage
(Notes 3, 4, 5)
+125˚C
VOHC
+125˚C
VOLC
Output LOW Voltage
(Notes 3, 4, 5)
+125˚C
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
−1165
−870
mV
−1830 −1475
mV
−55˚C
−55˚C to
Guaranteed HIGH Signal for All
Inputs
(Notes 3, 4, 5, 6)
Guaranteed LOW Signal for All Inputs
(Notes 3, 4, 5, 6)
VEE = −4.2V
VIN = VIL (Min)
(Notes 3, 4, 5)
VEE = −5.7V
VIN = VIH (Max)
(Notes 3, 4, 5)
+125˚C
−55˚C to
+125˚C
IIL
Input LOW Current
0.50
µA
−55˚C to
+125˚C
IIH
IEE
Input HIGH Current
Power Supply
Current
Sn
265
An, Bn
340
Sn
385
An, Bn
490
−87
−30
µA
0˚C to
+125˚C
µA
mA
−55˚C
−55˚C to
Inputs Open
(Notes 3, 4, 5)
+125˚C
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing VOH/VOL.
www.national.com
4
AC Electrical Characteristics
VEE = −4.2V to −5.7V, VCC = VCCA = GND
Symbol
Parameter
tPLH
Propagation Delay
tPHL
A0–A7, B0–B7 to Output
tPLH
Propagation Delay
tPHL
S0–S2 to Output
tTLH
Transition Time
tTHL
20% to 80%, 80% to 20%
TC = −55˚C
TC = +25˚C
TC =
+125˚C
Units
Min
Max
Min
Max
Min
Max
0.50
2.40
0.60
2.30
0.70
3.00
ns
0.80
3.00
0.90
2.80
0.80
3.40
ns
0.30
1.90
0.30
1.80
0.30
2.10
ns
Conditions
Notes
(Notes 7, 8, 9)
Figure 1 and
Figure 2
(Note 10)
Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.
Note 9: Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C, temperatures, Subgroups A10 and A11.
Note 10: Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).
Test Circuitry
DS100310-6
Notes:
VCC, VCCA = +2V, VEE = −2.5V
L1 and L2 = equal length 50Ω impedance lines
RT = 50Ω terminator internal to scope
Decoupling 0.1 µF from GND to VCC and V EE
All unused outputs are loaded with 50Ω to GND
CL = Fixture and stray capacitance ≤ 3 pF
Pin numbers shown are for flatpak; for DIP see logic symbol
FIGURE 1. AC Test Circuit
5
www.national.com
Switching Waveforms
DS100310-7
FIGURE 2. Propagation Delay and Transition Times
www.national.com
6
Physical Dimensions
inches (millimeters) unless otherwise noted
24-Pin Ceramic Dual-In-Line Package (D)
NS Package Number J24E
24-Pin Quad Cerpak (F)
NS Package Number W24B
7
www.national.com
100363 Low Power Dual 8-Input Multiplexer
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into
sonably expected to cause the failure of the life support
the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness.
ure to perform when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
National Semiconductor
Corporation
Americas
Tel: 1-800-272-9959
Fax: 1-800-737-7018
Email: support@nsc.com
www.national.com
National Semiconductor
Europe
Fax: +49 (0) 1 80-530 85 86
Email: europe.support@nsc.com
Deutsch Tel: +49 (0) 1 80-530 85 85
English Tel: +49 (0) 1 80-532 78 32
Français Tel: +49 (0) 1 80-532 93 58
Italiano Tel: +49 (0) 1 80-534 16 80
National Semiconductor
Asia Pacific Customer
Response Group
Tel: 65-2544466
Fax: 65-2504466
Email: sea.support@nsc.com
National Semiconductor
Japan Ltd.
Tel: 81-3-5620-6175
Fax: 81-3-5620-6179
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.