White Electronic Designs WEDPN16M64V-XBX 16Mx64 Synchronous DRAM FEATURES GENERAL DESCRIPTION ! High Frequency = 100, 125MHz The 128MByte (1Gb) SDRAM is a high-speed CMOS, dynamic random-access, memory using 4 chips containing 268,435,456 bits. Each chip is internally configured as a quad-bank DRAM with a synchronous interface. Each of the chip’s 67,108,864-bit banks is organized as 8,192 rows by 512 columns by 16 bits. ! Package: • 219 Plastic Ball Grid Array (PBGA), 25 x 25mm ! Single 3.3V ±0.3V power supply ! Fully Synchronous; all signals registered on positive edge of system clock cycle Read and write accesses to the SDRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmedsequence. Accesses begin with the registration of an ACTIVE command, which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed (BA0, BA1 select the bank; A0-12 select the row). The address bits registered coincident with the READ or WRITE command are used to select the starting column location for the burst access. ! Internal pipelined operation; column address can be changed every clock cycle ! Internal banks for hiding row access/precharge ! Programmable Burst length 1,2,4,8 or full page ! 8192 refresh cycles ! Commercial, Industrial and Military Temperature Ranges ! Organized as 16M x 64 • User configurable as 2 x 16M x 32 and 4 x 16M x 16 The SDRAM provides for programmable READ or WRITE burst lengths of 1, 2, 4 or 8 locations, or the full page, with a burst terminate option. An AUTO PRECHARGE function may be enabled to provide a self-timed row precharge that is initiated at the end of the burst sequence. ! Weight: WEDPN16M64V-XBX - 2.5 grams typical BENEFITS ! 41% SPACE SAVINGS The 1Gb SDRAM uses an internal pipelined architecture to achieve high-speed operation. This architecture is compatible with the 2 n rule of prefetch architectures, but it also allows the column address to be changed on every clock cycle to achieve a high-speed, fully random access. Precharging one bank while accessing one of the other three banks will hide the precharge cycles and provide seamless, high-speed, random-access operation. ! Reduced part count ! Reduced trace lengths for lower parasitic capacitance ! Suitable for hi-reliability applications ! Laminate interposer for optimum TCE match ! Upgradeable to 32M x 64 density (contact factory for information) * This data sheet describes a product that is subject to change without notice. November 2003 Rev. 6 1 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com White Electronic Designs FIG. 1 PIN CONFIGURATION TOP VIEW NOTE: DNU = Do Not Use; to be left unconnected for future upgrades. NC = Not Connected Internally. White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520 2 WEDPN16M64V-XBX WEDPN16M64V-XBX White Electronic Designs FIG. 2 FUNCTIONAL BLOCK DIAGRAM WE0 RAS 0 CAS 0 WE RAS CAS A0-12 DQ0 BA0-1 ¥ A0-12 BA0-1 CLK0 CKE0 CS0 DQML0 DQMH0 CLK CKE CS DQML DQMH U0 DQ0 ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ DQ15 DQ15 WE1 RAS 1 CAS 1 WE RAS CAS A0-12 DQ0 BA0-1 ¥ CLK1 CKE1 CS1 DQML1 DQMH1 CLK CKE CS DQML DQMH U1 DQ16 ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ DQ15 DQ31 WE2 RAS 2 CAS 2 WE RAS CAS A0-12 DQ0 BA0-1 ¥ CLK2 CKE2 CS2 DQML2 DQMH2 CLK CKE CS DQML DQMH U2 DQ32 ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ DQ15 DQ47 WE3 RAS 3 CAS 3 WE RAS CAS A0-12 DQ0 BA0-1 ¥ CLK3 CKE3 CS3 DQML3 DQMH3 CLK CKE CS DQML DQMH U3 DQ48 ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ ¥ DQ15 DQ63 WEDPN16M64BD.eps 3 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com White Electronic Designs REGISTER DEFINITION MODE REGISTER The 1Gb SDRAM is designed to operate in 3.3V, low-power memory systems. An auto refresh mode is provided, along with a power-saving, power-down mode. The Mode Register is used to define the specific mode of operation of the SDRAM. This definition includes the selec-tion of a burst length, a burst type, a CAS latency, an operating mode and a write burst mode, as shown in Figure 3. The Mode Register is programmed via the LOAD MODE REGISTER command and will retain the stored information until it is programmed again or the device loses power. All inputs and outputs are LVTTL compatible. SDRAMs offer substantial advances in DRAM operating performance, including the ability to synchronously burst data at a high data rate with automatic column-address generation, the ability to interleave between internal banks in order to hide precharge time and the capability to randomly change column addresses on each clock cycle during a burst access. Mode register bits M0-M2 specify the burst length, M3 specifies the type of burst (sequential or interleaved), M4-M6 specify the CAS latency, M7 and M8 specify the operating mode, M9 specifies the WRITE burst mode, and M10 and M11 are reserved for future use. Address A12 (M12) is undefined but should be driven LOW during loading of the mode register. FUNCTIONAL DESCRIPTION Read and write accesses to the SDRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an ACTIVE command which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed (BA0 and BA1 select the bank, A0-12 select the row). The address bits (A0-8) registered coincident with the READ or WRITE command are used to select the starting column location for the burst access. The Mode Register must be loaded when all banks are idle, and the controller must wait the specified time before initiating the subsequent operation. Violating either of these requirements will result in unspecified operation. BURST LENGTH Read and write accesses to the SDRAM are burst oriented, with the burst length being programmable, as shown in Figure 3. The burst length determines the maximum number of column locations that can be accessed for a given READ or WRITE command. Burst lengths of 1, 2, 4 or 8 locations are available for both the sequential and the interleaved burst types, and a full-page burst is available for the sequential type. The full-page burst is used in conjunction with the BURST TERMINATE command to generate arbitrary burst lengths. Prior to normal operation, the SDRAM must be initialized. The following sections provide detailed information covering device initialization, register definition, command descriptions and device operation. INITIALIZATION SDRAMs must be powered up and initialized in a predefined manner. Operational procedures other than those specified may result in undefined operation. Once power is applied to VDD and VDDQ (simultaneously) and the clock is stable (stable clock is defined as a signal cycling within timing constraints specified for the clock pin), the SDRAM requires a 100µs delay prior to issuing any command other than a COMMAND INHIBIT or a NOP. Starting at some point during this 100µs period and continuing at least through the end of this period, COMMAND INHIBIT or NOP commands should be applied. Reserved states should not be used, as unknown operation or incompatibility with future versions may result. When a READ or WRITE command is issued, a block of columns equal to the burst length is effectively selected. All accesses for that burst take place within this block, meaning that the burst will wrap within the block if a boundary is reached. The block is uniquely selected by A1-8 when the burst length is set to two; by A2-8 when the burst length is set to four; and by A3-8 when the burst length is set to eight. The remaining (least significant) address bit(s) is (are) used to select the starting location within the block. Full-page bursts wrap within the page if the boundary is reached. Once the 100µs delay has been satisfied with at least one COMMAND INHIBIT or NOP command having been applied, a PRECHARGE command should be applied. All banks must be precharged, thereby placing the device in the all banks idle state. BURST TYPE Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst type and is selected via bit M3. Once in the idle state, two AUTO REFRESH cycles must be performed. After the AUTO REFRESH cycles are complete, the SDRAM is ready for Mode Register programming. Because the Mode Register will power up in an unknown state, it should be loaded prior to applying any operational command. White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520 WEDPN16M64V-XBX The ordering of accesses within a burst is determined by the burst length, the burst type and the starting column address, as shown in Table 1. 4 White Electronic Designs FIG. 3 MODE REGISTER DEFINITION TABLE 1 - BURST DEFINITION Burst Length A12 A11 A10 A9 A8 A6 A7 A5 A3 A4 A2 A1 A0 Address Bus 2 Mode Register (Mx) Unused Reserved* WB Op Mode CAS Latency BT Burst Length 4 *Should program M12, M11, M10 = 0, 0, 0 to ensure compatibility with future devices. Burst Length M2 M1 M0 M3 = 0 M3 = 1 0 0 0 1 1 0 0 1 2 2 0 1 0 4 4 0 1 1 8 8 1 0 0 Reserved Reserved 1 0 1 Reserved Reserved 1 1 0 Reserved Reserved 1 1 1 Full Page Reserved 8 Burst Type M3 0 Sequential 1 Interleaved M6 M5 M4 0 0 Reserved 0 0 1 Reserved 0 1 0 2 0 1 1 3 1 0 0 Reserved 1 0 1 Reserved 1 1 0 Reserved 1 1 1 Reserved M8 M7 M6-M0 Operating Mode 0 0 Defined Standard Operation - - - Write Burst Mode 0 Programmed Burst Length 1 Single Location Access Full Page (y) CAS Latency 0 M9 WEDPN16M64V-XBX Starting Column Address A0 0 1 A1 A0 0 0 0 1 1 0 1 1 A2 A1 A0 0 0 0 0 0 1 0 1 0 0 1 1 1 0 0 1 0 1 1 1 0 1 1 1 n = A0-9/8/7 (location 0-y) Order of Accesses Within a Burst Type = Sequential Type = Interleaved 0-1 1-0 0-1 1-0 0-1-2-3 1-2-3-0 2-3-0-1 3-0-1-2 0-1-2-3 1-0-3-2 2-3-0-1 3-2-1-0 0-1-2-3-4-5-6-7 1-2-3-4-5-6-7-0 2-3-4-5-6-7-0-1 3-4-5-6-7-0-1-2 4-5-6-7-0-1-2-3 5-6-7-0-1-2-3-4 6-7-0-1-2-3-4-5 7-0-1-2-3-4-5-6 Cn, Cn + 1, Cn + 2 Cn + 3, Cn + 4... …Cn - 1, Cn… 0-1-2-3-4-5-6-7 1-0-3-2-5-4-7-6 2-3-0-1-6-7-4-5 3-2-1-0-7-6-5-4 4-5-6-7-0-1-2-3 5-4-7-6-1-0-3-2 6-7-4-5-2-3-0-1 7-6-5-4-3-2-1-0 Not Supported NOTES: 1. For full-page accesses: y = 512. 2. For a burst length of two, A1-8 select the block-of-two burst; A0 selects the starting column within the block. 3. For a burst length of four, A2-8 select the block-of-four burst; A0-1 select the starting column within the block. 4. For a burst length of eight, A3-8 select the block-of-eight burst; A0-2 select the starting column within the block. 5. For a full-page burst, the full row is selected and A0-8 select the starting column. 6. Whenever a boundary of the block is reached within a given sequence above, the following access wraps within the block. 7. For a burst length of one, A0-8 select the unique column to be accessed, and Mode Register bit M3 is ignored. All other states reserved WEDPN16M72MRD.eps 5 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com White Electronic Designs WEDPN16M64V-XBX FIG. 4 CAS LATENCY CAS LATENCY M8 to zero; the other combinations of values for M7 and M8 are reserved for future use and/or test modes. The programmed burst length applies to both READ and WRITE bursts. The CAS latency is the delay, in clock cycles, between the registration of a READ command and the availability of the first piece of output data. The latency can be set to two or three clocks. Test modes and reserved states should not be used because unknown operation or incompatibility with future versions may result. If a READ command is registered at clock edge n, and the latency is m clocks, the data will be available by clock edge n+m. The I/Os will start driving as a result of the clock edge one cycle earlier (n + m - 1), and provided that the relevant access times are met, the data will be valid by clock edge n + m. For example, assuming that the clock cycle time is such that all relevant access times are met, if a READ command is registered at T0 and the latency is programmed to two clocks, the I/Os will start driving after T1 and the data will be valid by T2. Table 2 below indicates the operating frequencies at which each CAS latency setting can be used. TABLE 2 - CAS LATENCY SPEED ALLOWABLE OPERATING FREQUENCY (MHZ) CAS CAS LATENCY = 2 LATENCY = 3 -100 - 75 - 100 -125 - 100 - 125 Reserved states should not be used as unknown operation or incompatibility with future versions may result. WRITE BURST MODE OPERATING MODE When M9 = 0, the burst length programmed via M0-M2 applies to both READ and WRITE bursts; when M9 = 1, the programmed burst length applies to READ bursts, but write accesses are single-location (nonburst) accesses. The normal operating mode is selected by setting M7and White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520 6 WEDPN16M64V-XBX White Electronic Designs TRUTH TABLE - COMMANDS AND DQM OPERATION (NOTE 1) NAME (FUNCTION) CS RAS CAS WE DQM ADDR I/Os COMMAND INHIBIT (NOP) H X X X X X X NO OPERATION (NOP) L H H H X X X ACTIVE (Select bank and activate row) ( 3) L L H H X Bank/Row X READ (Select bank and column, and start READ burst) (4) L H L H L/H 8 Bank/Col X WRITE (Select bank and column, and start WRITE burst) (4) L H L L L/H 8 Bank/Col Valid BURST TERMINATE L H H L X X Active PRECHARGE (Deactivate row in bank or banks) ( 5) L L H L X Code X AUTO REFRESH or SELF REFRESH (Enter self refresh mode) (6, 7) L L L H X X X LOAD MODE REGISTER (2) L L L L X Op-Code X Write Enable/Output Enable (8) – – – – L – Active Write Inhibit/Output High-Z (8) – – – – H – High-Z NOTES: 1. CKE is HIGH for all commands shown except SELF REFRESH. 2. A0-11 define the op-code written to the Mode Register. 3. A0-12 provide row address, and BA0, BA1 determine which bank is made active. 4. A0-8 provide column address; A10 HIGH enables the auto precharge feature (nonpersistent), while A10 LOW disables the auto precharge feature; BA0, BA1 determine which bank is being read from or written to. 5. A10 LOW: BA0, BA1 determine the bank being precharged. A10 HIGH: All banks precharged and BA0, BA1 are “Don’t Care.” 6. This command is AUTO REFRESH if CKE is HIGH; SELF REFRESH if CKE is LOW. 7. Internal refresh counter controls row addressing; all inputs and I/Os are “Don’t Care” except for CKE. 8. Activates or deactivates the I/Os during WRITEs (zero-clock delay) and READs (two-clock delay). COMMANDS banks are idle, and a subsequent executable command cannot be issued until tMRD is met. The Truth Table provides a quick reference of available commands. This is followed by a written description of each command. Three additional Truth Tables appear following the Operation section; these tables provide current state/ next state information. ACTIVE The ACTIVE command is used to open (or activate) a row in a particular bank for a subsequent access. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0-A12 selects the row. This row remains active (or open) for accesses until a PRECHARGE command is issued to that bank. A PRECHARGE command must be issued before opening a different row in the same bank. COMMAND INHIBIT The COMMAND INHIBIT function prevents new commands from being executed by the SDRAM, regardless of whether the CLK signal is enabled. The SDRAM is effectively deselected. Operations already in progress are not affected. READ NO OPERATION (NOP) The READ command is used to initiate a burst read access to an active row. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0-8 selects the starting column location. The value on input A10 determines whether or not AUTO PRECHARGE is used. If AUTO PRECHARGE is selected, the row being accessed will be precharged at the end of the READ burst; if AUTO PRECHARGE is not selected, the row will remain open for subsequent accesses. Read data appears on the I/Os subject to the logic level on the DQM inputs two clocks earlier. If a given DQM signal was registered HIGH, the corresponding I/Os will be High-Z two clocks later; if the DQM signal was registered LOW, the I/Os will provide valid data. The NO OPERATION (NOP) command is used to perform a NOP to an SDRAM which is selected (CS is LOW). This prevents unwanted commands from being registered during idle or wait states. Operations already in progress are not affected. LOAD MODE REGISTER The Mode Register is loaded via inputs A0-11. See Mode Register heading in the Register Definition section. The LOAD MODE REGISTER command can only be issued when all 7 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com White Electronic Designs WRITE WEDPN16M64V-XBX fixed-length or full-page bursts. The most recently registered READ or WRITE command prior to the BURST TERMINATE command will be truncated. The WRITE command is used to initiate a burst write access to an active row. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0-8 selects the starting column location. The value on input A10 determines whether or not AUTO PRECHARGE is used. If AUTO PRECHARGE is selected, the row being accessed will be precharged at the end of the WRITE burst; if AUTO PRECHARGE is not selected, the row will remain open for AUTO REFRESH AUTO REFRESH is used during normal operation of the SDRAM and is analagous to CAS-BEFORE-RAS (CBR) REFRESH in conventional DRAMs. This command is nonpersistent, so it must be issued each time a refresh is required. The addressing is generated by the internal refresh controller. This makes the address bits “Don’t Care” during an AUTO REFRESH command. Each 256Mb SDRAM requires 8,192 AUTO REFRESH cycles every refresh period (tREF). Providing a distributed AUTO REFRESH command will meet the refresh requirement and ensure that each row is refreshed. Alternatively, 8,192 AUTO REFRESH commands can be issued in a burst at the minimum cycle rate (tRC), once every refresh period (tREF). PRECHARGE The PRECHARGE command is used to deactivate the open row in a particular bank or the open row in all banks. The bank(s) will be available for a subsequent row access a specified time (tRP) after the PRECHARGE command is issued. Input A10 determines whether one or all banks are to be precharged, and in the case where only one bank is to be precharged, inputs BA0, BA1 select the bank. Otherwise BA0, BA1 are treated as “Don’t Care.” Once a bank has been precharged, it is in the idle state and must be activated prior to any READ or WRITE commands being issued to that bank. SELF REFRESH* The SELF REFRESH command can be used to retain data in the SDRAM, even if the rest of the system is powered down. When in the self refresh mode, the SDRAM retains data without external clocking. The SELF REFRESH command is initiated like an AUTO REFRESH command except CKE is disabled (LOW). Once the SELF REFRESH command is registered, all the inputs to the SDRAM become “Don’t Care,” with the exception of CKE, which must remain LOW. AUTO PRECHARGE AUTO PRECHARGE is a feature which performs the same individual-bank PRECHARGE function described above, without requiring an explicit command. This is accomplished by using A10 to enable AUTO PRECHARGE in conjunction with a specific READ or WRITE command. A precharge of the bank/row that is addressed with the READ or WRITE command is automatically performed upon completion of the READ or WRITE burst, except in the full-page burst mode, where AUTO PRECHARGE does not apply. AUTO PRECHARGE is nonpersistent in that it is either enabled or disabled for each individual READ or WRITE command. Once self refresh mode is engaged, the SDRAM provides its own internal clocking, causing it to perform its own AUTO REFRESH cycles. The SDRAM must remain in self refresh mode for a minimum period equal to tRAS and may remain in self refresh mode for an indefinite period beyond that. The procedure for exiting self refresh requires a sequence of commands. First, CLK must be stable (stable clock is defined as a signal cycling within timing constraints specified for the clock pin) prior to CKE going back HIGH. Once CKE is HIGH, the SDRAM must have NOP commands issued (a minimum of two clocks) for tXSR, because time is required for the completion of any internal refresh in progress. AUTO PRECHARGE ensures that the precharge is initiated at the earliest valid stage within a burst. The user must not issue another command to the same bank until the precharge time (tRP) is completed. This is determined as if an explicit PRECHARGE command was issued at the earliest possible time. BURST TERMINATE Upon exiting the self refresh mode, AUTO REFRESH commands must be issued as both SELF REFRESH and AUTO REFRESH utilize the row refresh counter. The BURST TERMINATE command is used to truncate either * Self refresh available in commercial and industrial temperatures only. White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520 8 WEDPN16M64V-XBX White Electronic Designs ABSOLUTE MAXIMUM RATINGS Parameter Voltage on VDD, VDDQ Supply relative to Vss Voltage on NC or I/O pins relative to Vss Operating Temperature TA (Mil) Operating Temperature TA (Ind) Storage Temperature, Plastic -1 to 4.6 -1 to 4.6 -55 to +125 -40 to +85 -55 to +150 CAPACITANCE (NOTE 2) Parameter Unit V V °C °C °C Symbol Max Unit Input Capacitance: CLK CI1 10 pF Addresses, BA0-1 Input Capacitance CA 30 pF Input Capacitance: All other input-only pins CI2 10 pF Input/Output Capacitance: I/Os CIO 12 pF BGA THERMAL RESISTANCE NOTE: Stress greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions greater than those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Description Symbol Max Unit Junction to Ambient (No Airflow) Theta JA 14.2 C/W Notes 1 Junction to Ball Theta JB 9.6 C/W 1 Junction to Case (Top) Theta JC 4.8 C/W 1 Note: Refer to AN #0001 at www.whiteedc.com in the application notes section for modeling conditions. DC ELECTRICAL CHARACTERISTICS AND OPERATING CONDITIONS (NOTES 1, 6) (VCC = +3.3V ±0.3V; TA = -55°C TO +125°C) Parameter/Condition Symbol Units Supply Voltage VCC Min 3 Input High Voltage: Logic 1; All inputs (21) VIH 2 VCC + 0.3 Input Low Voltage: Logic 0; All inputs (21) VIL -0.3 0.8 V II -4 4 µA InputLeakageCurrent:Anyinput0V-VIN-VCC(Allotherpinsnotundertest=0V) Input Leakage Address Current (All other pins not under test = 0V) Max 3.6 V V II -20 20 µA Output Leakage Current: I/Os are disabled; 0V - VOUT - VCC IOZ -5 5 µA Output Levels: Output High Voltage (IOUT = -4mA) VOH 2.4 – V Output Low Voltage (IOUT = 4mA) VOL – 0.4 V ICC SPECIFICATIONS AND CONDITIONS (NOTES 1,6,11,13) (VCC = +3.3V ±0.3V; TA = -55°C TO +125°C) Symbol Max Units Operating Current: Active Mode; Burst = 2; Read or Write; tRC = t RC (min); CAS latency = 3 (3, 18, 19) Parameter/Condition I CC1 700 mA Standby Current: Active Mode; CKE = HIGH; CS = HIGH; All banks active after tRCD met; No accesses in progress (3, 12, 19) I CC3 240 mA Operating Current: Burst Mode; Continuous burst; Read or Write; All banks active; CAS latency = 3 (3, 18, 19) I CC4 700 mA Self Refresh Current: CKE - 0.2V (Commercial Temperature: 0°C to + 70°C) (27) I CC7 16 mA Self Refresh Current: CKE - 0.2V (Industrial Temperature: (-40°C to + 85°C) (27) I CC7 20 mA 9 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com WEDPN16M64V-XBX White Electronic Designs ELECTRICAL CHARACTERISTICS AND RECOMMENDED AC OPERATING CHARACTERISTICS (NOTES 5, 6, 8, 9, 11) Parameter Symbol -100 Min Access time from CLK (pos. edge) -125 Max Min Unit Max CL = 3 tAC 7 6 ns CL = 2 tAC 7 6 ns Address hold time tAH 1 1 ns Address setup time tAS 2 2 ns CLK high-level width tCH 3 3 ns CLK low-level width tCL 3 3 ns CL = 3 tCK 10 8 ns CL = 2 tCK 13 10 ns CKE hold time tCKH 1 1 ns CKE setup time tCKS 2 2 ns CS, RAS, CAS, WE, DQM hold time tCMH 1 1 ns CS, RAS, CAS, WE, DQM setup time tCMS 2 2 ns Data-in hold time tDH 1 1 ns Data-in setup time tDS 2 2 Clock cycle time (22) Data-out high-impedance time CL = 3 (10) tHZ CL = 2 (10) tHZ 7 7 ns 6 ns 6 ns Data-out low-impedance time tLZ 1 1 ns Data-out hold time (load) tOH 3 3 ns Data-out hold time (no load) (26) tOHN 1.8 1.8 ACTIVE to PRECHARGE command tRAS 50 ACTIVE to ACTIVE command period tRC 70 68 ACTIVE to READ or WRITE delay tRCD 20 20 Refresh period (8,192 rows) – Commercial, Industrial tREF 120,000 50 64 ns ns ns 64 ms 16 ms Refresh period (8,192 rows) – Military tREF AUTO REFRESH period tRFC 70 70 ns PRECHARGE command period tRP 20 20 ns ACTIVE bank A to ACTIVE bank B command tRRD 20 20 tT 0.3 Transition time (7) WRITE recovery time (23) (24) Exit SELF REFRESH to ACTIVE command White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520 16 ns 120,000 1 CLK + 7ns tWR tXSR 10 1.2 0.3 1 CLK + 7ns ns 1.2 ns — 15 15 ns 80 80 ns WEDPN16M64V-XBX White Electronic Designs AC FUNCTIONAL CHARACTERISTICS (NOTES 5,6,7,8,9,11) Parameter/Condition Symbol -100 -125 Units READ/WRITE command to READ/WRITE command (17) tCCD 1 1 tCK CKE to clock disable or power-down entry mode (14) tCKED 1 1 tCK CKE to clock enable or power-down exit setup mode (14) tPED 1 1 tCK DQM to input data delay (17) tDQD 0 0 tCK DQM to data mask during WRITEs tDQM 0 0 tCK DQM to data high-impedance during READs tDQZ 2 2 tCK WRITE command to input data delay (17) tDWD 0 0 tCK Data-in to ACTIVE command (15) tDAL 4 5 tCK Data-in to PRECHARGE command (16) tDPL 2 2 tCK Last data-in to burst STOP command (17) tBDL 1 1 tCK Last data-in to new READ/WRITE command (17) tCDL 1 1 tCK Last data-in to PRECHARGE command (16) tRDL 2 2 tCK LOAD MODE REGISTER command to ACTIVE or REFRESH command (25) tMRD 2 2 tCK CL = 3 tROH 3 3 tCK CL = 2 tROH 2 — tCK Data-out to high-impedance from PRECHARGE command (17) NOTES: 14. Timing actually specified by tCKS ; clock(s) specified as a reference only at minimum cycle rate. 15. Timing actually specified by tWR plus tRP; clock(s) specified as a reference only at minimum cycle rate. 1. All voltages referenced to V SS. 2. This parameter is not tested but guaranteed by design. f = 1 MHz, TA = 25°C. 3. I DD is dependent on output loading and cycle rates. Specified values are obtained with minimum cycle time and the outputs open. 4. Enables on-chip refresh and address counters. 5. The minimum specifications are used only to indicate cycle time at which proper operation over the full temperature range is ensured. 6. An initial pause of 100µs is required after power-up, followed by two AUTO REFRESH commands, before proper device operation is ensured. (VCC must be powered up simultaneously.) The two AUTO REFRESH command wakeups should be repeated any time the tREF refresh requirement is exceeded. 7. AC characteristics assume tT = 1ns. 8. In addition to meeting the transition rate specification, the clock and CKE must transit between V IH and V IL (or between VIL and VIH ) in a monotonic manner. 9. Outputs measured at 1.5V with equivalent load: 16. Timing actually specified by tWR. 17. Required clocks are specified by JEDEC functionality and are not dependent on any timing parameter. 18. The ICC current will decrease as the CAS latency is reduced. This is due to the fact that the maximum cycle rate is slower as the CAS latency is reduced. 19. Address transitions average one transition every two clocks. 20. CLK must be toggled a minimum of two times during this period. 21. VIH overshoot: V IH (MAX) = VCC + 2V for a pulse width - 3ns, and the pulse width cannot be greater than one third of the cycle rate. VIL undershoot: VIL (MIN) = -2V for a pulse width - 3ns. 22. The clock frequency must remain constant (stable clock is defined as a signal cycling within timing constraints specified for the clock pin) during access or precharge states (READ, WRITE, including tWR, and PRECHARGE commands). CKE may be used to reduce the data rate. 23. Auto precharge mode only. The precharge timing budget (tRP) begins 7.5ns/ 7ns after the first clock delay, after the last WRITE is executed. 24. Precharge mode only. 25. JEDEC and PC100 specify three clocks. 26. Parameter guaranteed by design. 27. Self refresh available in commercial and industrial temperatures only. 10. tHZ defines the time at which the output achieves the open circuit condition; it is not a reference to V OH or VOL . The last valid data element will meet t OH before going High-Z. 11. AC timing and I DD tests have VIL = 0V and VIH = 3V, with timing referenced to 1.5V crossover point. 12. Other input signals are allowed to transition no more than once every two clocks and are otherwise at valid VIH or V IL levels. 13. ICC specifications are tested after the device is properly initialized. 11 White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com WEDPN16M64V-XBX White Electronic Designs PACKAGE DIMENSION: 219 PLASTIC BALL GRID ARRAY (PBGA) BOTTOM VIEW 25.10 (0.988) sq. MAX 19.05 (0.750) NOM 1.27 (0.050) NOM BOTTOM VIEW 1.27 (0.050) NOM 219 x 0.762 (0.030) NOM 19.05 (0.750) NOM 0.61 (0.024) NOM 2.03 (0.080) MAX ALL LINEAR DIMENSIONS ARE MILLIMETERS AND PARENTHETICALLY IN INCHES ORDERING INFORMATION WED P N 16M 64 V - XXX B X DEVICE GRADE: M = Military -55°C to +125°C I = Industrial -40°C to +85°C C = Commercial 0°C to +70°C PACKAGE: B = 219 Plastic Ball Grid Array (PBGA) FREQUENCY (MHz) 100 = 100MHz 125 = 125MHz 3.3V Power Supply CONFIGURATION, 16M x 64 SDRAM PLASTIC WHITE ELECTRONIC DESIGNS CORP. White Electronic Designs Corporation • Phoenix AZ • (602) 437-1520 12