ETC 2SK3697-01

DATE
CHECKED May.-20-'03
CHECKED May.-20-'03
NAME
DWG.NO.
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
SPECIFICATION
Device Name
:
Power MOSFET
Type Name
:
2SK3697-01
Spec. No.
:
MS5F5476
Date
:
May.-20-2003
Fuji Electric Co.,Ltd.
Matsumoto Factory
APPROVED
DRAWN May.-20-'03
Fuji Electric Co.,Ltd.
MS5F5476
1 / 19
H04-004-05
Date
Classification
May.-20
2003
enactment
Index
Fuji Electric Co.,Ltd.
DWG.NO.
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
Revised Records
Content
Drawn Checked Checked Approved
MS5F5476
2 / 19
H04-004-03
1.Scope
This specifies Fuji Power MOSFET 2SK3697-01
2.Construction
N-Channel enhancement mode power MOSFET
3.Applications
for Switching
4.Outview
TO-247
Outview See to 8/19 page
5.Absolute Maximum Ratings at Tc=25°C (unless otherwise specified)
Description
Symbol
Drain-Source Voltage
Unit
VDS
600
V
VDSX
600
V
ID
± 42
A
± 2.7
A
Remarks
VGS=-30V
Ta=25°C
Pulsed Drain Current
IDP
± 168
A
Gate-Source Voltage
Non-Repetitive
Maximum Avalanche Current
Repetitive
Maximum Avalanche Current
Non-Repetitive
Maximum Avalanche Energy
Maximum Drain-Source dV/dt
VGS
± 30
V
IAS
42
A
IAR
21
A
EAS
828
mJ
dVDS/dt
20
kV/µs
VDS<=600V
Peak Diode Recovery dV/dt
dV/dt
5
kV/µs
*3
Peak Diode Recovery -di/dt
-di/dt
A/µs
*4
Maximum Power Dissipation
PD
100
2.50
Operating and Storage
Tch
W
600
Tch=25°C
*1
Tch<=150°C
*1
*2
Ta=25°C
Tc=25°C
°C
150
Tstg
-55 to +150
Temperature range
°C
*1 See to Avalanche Current Graph (Page 17/19)
*2 L=861µH,Vcc=60V,Starting Tch=25°C, See to Avalanche Energy Graph (Page 18/19)
*3 IF≤-ID,-di/dt=100A/µs,Vcc≤BVDSS,Tch≤150°C *4 IF≤-ID,dV/dt=5kV/µs,Vcc≤BVDSS,Tch≤150°C
6.Electrical Characteristics at Tc=25°C (unless otherwise specified)
Static Ratings
Description
Symbol
Conditions
min.
typ.
max.
Unit
600
-
-
V
3.0
-
5.0
V
-
10
25
µA
-
1.0
2.0
mA
-
10
100
nA
-
0.14
0.17
Ω
ID=250µA
Drain-Source
Breakdown Voltage BVDSS
Gate Threshold
Voltage VGS(th)
Zero Gate Voltage
Drain Current IDSS
Gate-Source
Leakage Current IGSS
Drain-Source
On-State Resistance RDS(on)
VGS=0V
ID=250µA
VDS=VGS
VDS=600V
Tch=25°C
VGS=0V
VDS=480V
Tch=125°C
VGS=0V
VGS= ± 30V
VDS=0V
ID=21A
VGS=10V
Fuji Electric Co.,Ltd.
DWG.NO.
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
Continuous Drain Current
Characteristics
MS5F5476
3 / 19
H04-004-03
Dynamic Ratings
Description
Symbol
Conditions
min.
typ.
max.
Unit
VDS=25V
20
40
-
S
ID=21A
Forward
Transconductance gfs
Input Capacitance
Ciss
VDS=25V
-
5100
7650
Output Capacitance
Coss
VGS=0V
-
700
1050
f=1MHz
-
48
72
td(on)
Vcc=300V
-
60
90
tr
VGS=10V
-
90
135
td(off)
ID=21A
-
180
270
Turn-Off Time
tf
RGS=10Ω
-
30
45
Total Gate Charge
QG
Vcc=300V
-
105
160
Gate-Source Charge
QGS
ID=42A
-
44
65
Gate-Drain Charge
QGD
VGS=10V
-
30
45
min.
typ.
max.
Unit
42
-
-
A
-
1.20
1.80
V
-
160
250
ns
-
1.00
2.5
µC
min.
typ.
max.
Unit
Reverse Transfer
pF
Capacitance Crss
ns
nC
Reverse Diode
Description
Symbol
Avalanche Capability
Conditions
L=861µH
IAV
Tch=25°C
See Fig.1 and Fig.2
IF=42A
Diode Forward
On-Voltage VSD
VGS=0V
Tch=25°C
IF=42A
Reverse Recovery
Time trr
Reverse Recovery
VGS=0V
-di/dt=100A/µ s
Charge Qrr
Tch=25°C
7.Thermal Resistance
Description
Symbol
Channel to Case
Rth(ch-c)
0.208
°C/W
Channel to Ambient
Rth(ch-a)
50.0
°C/W
Fuji Electric Co.,Ltd.
DWG.NO.
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
Turn-On Time
MS5F5476
4 / 19
H04-004-03
50Ω
Fuji Electric Co.,Ltd.
DWG.NO.
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
Fig.1 Test circuit
L
D.U.T
L=861µH
Vcc=60V
Single Pulse Test
MS5F5476
Vcc
Fig.2 Operating waveforms
+10V
VGS
-15V
IDP
BVDSS
0
VDS
ID
5 / 19
H04-004-03
8.Reliability test items
All guaranteed values are under the categories of reliability per non-assembled(only MOSFETs).
Each categories under the guaranteed reliability conform to EIAJ ED4701 B101A standards.
Test items required without fail : Test Method B-121,B-122,B-123,B-131,B-141
Humidification treatment (85±2°C,65±5%RH,168±24hr)
Heat treatment of soldering (Solder Dipping,260±5°C(265°Cmax.),10±1sec,2 times)
Test
Items
1 Terminal
Strength
(Tensile)
Mechanical test methods
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
2 Terminal
Strength
(Bending)
3 Mounting
Strength
4 Vibration
5 Shock
6 Solderability
Testing methods and Conditions
Reference
Standard
EIAJ ED4701
Pull force
TO-220,TO-220F : 10N
TO-3P,TO-3PF,TO-247 : 25N
TO-3PL : 45N
T-Pack,K-Pack : 10N
Force maintaining duration :30±5sec
Load force
TO-220,TO-220F : 5N
TO-3P,TO-3PF,TO-247 : 10N
TO-3PL : 15N
T-Pack,K-Pack : 5N
Number of times :2times(90deg./time)
Screwing torque value: (M3)
TO-220,TO-220F : 40±10Ncm
TO-3P,TO-3PF,TO-247 : 50±10Ncm
TO-3PL : 70±10Ncm
frequency : 100Hz to 2kHz
Acceleration : 100m/s 2
Sweeping time : 20min./1 cycle
6times for each X,Y&Z directions.
Peak amplitude: 15km/s 2
Duration time : 0.5ms
3times for each X,Y&Z directions.
Each terminal shall be immersed in
the solder bath within 1 to 1.5mm from
the body.
7 Resistance to
Soldering Heat
Solder temp. : 260±5°C
Immersion time : 10±1sec
Number of times : 2times
Fuji Electric Co.,Ltd.
Sampling
number
Acceptance
number
A-111A
method 1
15
A-111A
method 3
15
A-112
method 2
15
A-121
test code C
15
(0:1)
Solder temp. : 235±5°C
Immersion time : 5±0.5sec
DWG.NO.
Test
No.
A-122
test code D
15
A-131A
test code A
15
A-132
15
MS5F5476
6 / 19
H04-004-03
Test
Items
Testing methods and Conditions
1 High Temp.
Storage
2 Low Temp.
Storage
3 Temperature
Humidity
Storage
4 Temperature
Humidity
BIAS
Temperature : 150+0/-5°C
Test duration : 1000hr
Temperature : -55+5/-0°C
Test duration : 1000hr
Temperature : 85±2°C
Relative humidity : 85±5%
Test duration : 1000hr
Temperature : 85±2°C
Relative humidity : 85±5%
Bias Voltage : VDS(max) * 0.8
5 Unsaturated
Pressurized
Vapor
Test duration : 1000hr
Temperature : 130±2°C
Relative humidity : 85±5%
Vapor pressure : 230kPa
Test duration : 48hr
6 Temperature
Cycle
Test for FET
7 Thermal Shock
1 Intermittent
Operating
Life
2 HTRB
(Gate-source)
3 HTRB
(Drain-Source)
Reference
Standard
EIAJ ED4701
B-111A
Sampling
number
Acceptance
number
22
B-112A
22
B-121A
test code C
22
B-122A
test code C
22
(0:1)
High temp.side : 150±5°C
Low temp.side : -55±5°C
Duration time : HT 30min,LT 30min
Number of cycles : 100cycles
Fluid : pure water(running water)
High temp.side : 100+0/-5°C
Low temp.side : 0+5/-0°C
Duration time : HT 5min,LT 5min
Number of cycles : 100cycles
Ta=25±5°C
∆Tc=90degree
Tch≤Tch(max.)
Test duration : 3000 cycle
Temperature : Tch=150+0/-5°C
Bias Voltage : VGS(max)
Test duration : 1000hr
Temperature : Tch=150+0/-5°C
Bias Voltage : VDS(max) * 0.8
Test duration : 1000hr
B-123A
test code C
22
B-131A
test code A
22
B-141A
test code A
22
D-322
22
D-323
22
D-323
22
(0:1)
Failure Criteria
Symbols
Failure Criteria
Lower Limit
Upper Limit
Breakdown Voltage
BVDSS
Zero gate Voltage Drain-Source Current
Unit
LSL * 1.0
-----
V
IDSS
-----
USL * 2
A
Gate-Source Leakage Current
IGSS
-----
USL * 2
A
Gate Threshold Voltage
VGS(th)
LSL * 0.8
USL * 1.2
V
Drain-Source on-state Resistance
RDS(on)
-----
USL * 1.2
Ω
Forward Transconductance
gfs
LSL * 0.8
-----
S
Diode forward on-Voltage
VSD
-----
USL * 1.2
V
Marking
Soldering
-----
With eyes or Microscope
-----
and other damages
* LSL : Lower Specification Limit
* USL : Upper Specification Limit
* Before any of electrical characteristics measure, all testing related to the humidity
have conducted after drying the package surface for more than an hour at 150°C.
Fuji Electric Co.,Ltd.
DWG.NO.
Electrical
Characteristics
Item
Outview
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
Climatic test methods
Test
No.
MS5F5476
7 / 19
H04-004-03
DWG.NO.
Fuji Electric Co.,Ltd.
MS5F5476
8 / 19
H04-004-03
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
9. Cautions
Although Fuji Electric is continually improving product quality and reliability, a small percentage of semiconductor products may become faulty. When using Fuji Electric semiconductor products in your equipment,
you are requested to take adequate safety measures to prevent the equipment from causing physical injury,
fire, or other problem in case any of the products fail. It is recommended to make your design fail-safe, flame
retardant, and free of malfunction.
The products described in this Specification are intended for use in the following electronic and electrical
equipment which has normal reliability requirements.
Computers
Machine tools
OA equipment
AV equipment
Communications equipment(Terminal devices)
Measurement equipment
Personal equipment
Industrial robots
Electrical home appliances etc.
The products described in this Specification are not designed or manufactured to be used in equipment or
listed below, first check the system construction and required reliability, and take adequate safety measures
such as a backup system to prevent the equipment from malfunctioning.
Backbone network equipment
Transportation equipment (automobiles, trains, ships, etc.)
Traffic-signal control equipment
Submarine repeater equipment
Gas alarms, leakage gas auto breakers
Burglar alarms, fire alarms, emergency equipment
Medical equipment
Nuclear control equipment etc.
Do not use the products in this Specification for equipment requiring strict reliability such as(but not limited to):
Aerospace equipment
Aeronautical equipment
10. Warnings
The MOSFETs should be used in products within their absolute maximum rating(voltage, current, temperature, etc.).
The MOSFETs may be destroyed if used beyond the rating.
We only guarantee the non-repetitive and repetitive Avalanche capability and not for the continuous Avalanche capability which can be assumed as abnormal condition .Please note the device may be destructed
from the Avalanche over the specified maximum rating.
The equipment containing MOSFETs should have adequate fuses or circuit breakers to prevent the equipment from causing secondary destruction.
Use the MOSFETs within their reliability and lifetime under certain environments or conditions. The
MOSFETs may fail before the target lifetime of your products if used under certain reliability conditions.
You must careful handling of MOSFETs for ESD damage is an important consideration.
When handling MOSFETs, hold them by the case (package) and don’t touch the leads and terminals.
It is recommended that any handling of MOSFETs is done while used electrically conductive floor and
tablemats that are grounded.
Fuji Electric Co.,Ltd.
DWG.NO.
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
systems used under life-threatening situations. If you are considering using these products in the equipment
MS5F5476
9 / 19
H04-004-03
Before touching a MOSFETs terminal, discharge any static electricity from your body and clothes by grounding out through a high impedance resistor (about 1MΩ)
When soldering, in order to protect the MOSFETs from static electricity, ground the soldering iron or soldering bath through a low impedance resistor.
You must design the MOSFETs to be operated within the specified maximum ratings(voltage, current,
temperature, etc.) to prevent possible failure or destruction of devices.
Consider the possible temperature rise not only for the channel and case, but also for the outer leads.
Do not directly touch the leads or package of the MOSFETs while power is supplied or during operation ,to
avoid electric shock and burns.
The MOSFETs are made of incombustible material. However, if a MOSFET fails, it may emit smoke of
flame. Also, operating the MOSFETs near any flammable place or material may cause the MOSFETs to
emit smoke or flame in case the MOSFETs become even hotter during operation. Design the arrangement
to prevent the spread of fire.
The MOSFETs should not used in an environment in the presence of acid, organic matter, or corrosive
Installation
Soldering involves temperatures which exceed the device storage temperature rating. To avoid device
damage and to ensure reliability, observe the following guidelines from the quality assurance standard.
Solder temperature and duration (through-hole package)
Solder temperature
260±5 °C
350±10 °C
Duration
10±1 seconds
3.5±0.5 seconds
The immersion depth of the lead should basically be up to the lead stopper and the distance should be a
maximum of 1.5mm from the device.
When flow-soldering, take care to avoid immersing the package in the solder bath.
Refer to the following torque reference When mounting the device on a heat sink. Excess torque applied to the
mounting screw causes damage to the device and weak torque will increase the thermal resistance, both of
which conditions may destroy the device.
Table 1: Recommended tightening torques.
Package style
TO-220
TO-220F
TO-3P
TO-3PF
TO-247
TO-3PL
Screw
Tightening torques
M3
30 – 50 Ncm
M3
40 – 60 Ncm
M3
60 –80 Ncm
Fuji Electric Co.,Ltd.
DWG.NO.
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
gas(hydrogen sulfide, sulfurous acid gas etc.)
The MOSFETs should not used in an irradiated field since they are not radiation-proof.
Note
flatness : < ±30µm
roughness : <10µm
Plane off the edges :
C<1.0mm
MS5F5476
10 / 19
H04-004-03
The heat sink should have a flatness within±30µm and roughness within 10µm. Also, keep the tightening
torque within the limits of this specification.
Improper handling may cause isolation breakdown leading to a critical accident.
ex.) Over plane off the edges of screw hole. (We recommend plane off the edge is C<1.0mm)
We recommend the use of thermal compound to optimize the efficiency of heat radiation. It is important to
evenly apply the compound and to eliminate any air voids.
Storage
The MOSFETs must be stored at a standard temperature of 5 to 35°C and relative humidity of 45 to 75%.
If the storage area is very dry, a humidifier may be required. In such a case, use only deionized water or boiled
water, since the chlorine in tap water may corrode the leads.
The MOSFETs should not be subjected to rapid changes in temperature to avoid condensation on the surface
of the MOSFETs. Therefore store the MOSFETs in a place where the temperature is steady.
The MOSFETs should not be stored on top of each other, since this may cause excessive external force on the
case.
The MOSFETs should be stored with the lead terminals remaining unprocessed. Rust may cause presoldered
The MOSFETs should be stored in antistatic containers or shipping bags.
11.Appendix
These products do not contain PBBs (Polybrominated Biphenyl) or PBDEs (Polybrominated Diphenyl Ether ).
These products do not contain Class-I ODS and Class-II ODS of ‘Clean Air Act of US’.
・ If you have any questions about any part of this Specification, please contact Fuji
Electric or its sales agent before using the product.
・ Neither Fuji nor its agents shall be held liable for any injury caused by using the products
not in accordance with the instructions.
・ The application examples described in this specification are merely typical uses of Fuji
Electric products.
・ This specification does not confer any industrial property rights or other rights, nor
constitute a license for such rights.
Fuji Electric Co.,Ltd.
DWG.NO.
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
connections to go fail during later processing.
MS5F5476
11 / 19
H04-004-03
0
0
25
4
50
8
Fuji Electric Co.,Ltd.
DWG.NO.
ID [A]
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
PD [W]
Allowable Power Dissipation
PD=f(Tc)
800
700
600
500
400
300
200
100
0
75
100
90
80
40
10
12
VDS [V]
16
125
20
150
Tc [°C]
Typical Output Characteristics
ID=f(VDS):80 µs pulse test,Tch=25 °C
120
110
100
20V
10V
8V
7.0V
70
60
50
6.5V
30
20
VGS=6.0V
0
24
MS5F5476
12 / 19
H04-004-03
0
0.1
1
2
3
4
Fuji Electric Co.,Ltd.
DWG.NO.
gfs [S]
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
ID[A]
Typical Transfer Characteristic
ID=f(VGS):80 µs pulse test,VDS=25V,Tch=25 °C
100
10
1
0.1
5
VGS[V]
6
1
7
10
8
9
10
Typical Transconductance
gfs=f(ID):80 µs pulse test,VDS=25V,Tch=25 °C
100
10
1
0.1
100
ID [A]
MS5F5476
13 / 19
H04-004-03
RDS(on) [ Ω ]
VGS=6V
0
-50
20
-25
0
Fuji Electric Co.,Ltd.
25
DWG.NO.
RDS(on) [ Ω ]
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
0.4
Typical Drain-Source on-state Resistance
RDS(on)=f(ID):80 µs pulse test,Tch=25 °C
6.5V
0.3
7.0V
0.2
8V
10V
20V
0.1
0.0
40
60
50
Tch [°C]
80
0.2
75
100
100
ID [A]
Drain-Source On-state Resistance
RDS(on)=f(Tch):ID=21A,VGS=10V
0.5
0.4
0.3
max.
typ.
0.1
0.0
125
150
MS5F5476
14 / 19
H04-004-03
VGS(th) [V]
5.0
3.0
-50
0
-25
20
0
40
25
10
60
Fuji Electric Co.,Ltd.
80
DWG.NO.
VGS [V]
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
Gate Threshold Voltage vs. Tch
VGS(th)=f(Tch):VDS=VGS,ID=250µA
7.0
6.5
6.0
5.5
max.
4.5
4.0
3.5
min.
2.5
2.0
1.5
1.0
0.5
0.0
50
75
Tch [°C]
100
120
100
140
125
160
150
Typical Gate Charge Characteristics
VGS=f(Qg):ID=42A,Tch=25 °C
14
12
Vcc= 120V
300V
8
480V
6
4
2
0
180
Qg [nC]
MS5F5476
15 / 19
H04-004-03
10
0
0.1
0.00
0.25
0.50
0.75
Fuji Electric Co.,Ltd.
1.00
DWG.NO.
IF [A]
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
C [pF]
Typical Capacitance
C=f(VDS):VGS=0V,f=1MHz
10
5
10
4
Ciss
10
3
Coss
10
2
Crss
10
1
10
1
10
2
1.25
1.50
10
3
VDS [V]
Typical Forward Characteristics of Reverse Diode
IF=f(VSD):80 µs pulse test,Tch=25 °C
100
10
1
1.75
2.00
VSD [V]
MS5F5476
16 / 19
H04-004-03
Typical Switching Characteristics vs. ID
t=f(ID):Vcc=300V,VGS=10V,RG=10 Ω
3
10
td(off)
2
10
t [ns]
td(on)
tf
tr
1
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
10
0
1
10
2
10
10
ID [A]
Maximum Avalanche Energy vs. starting Tch
I(AV)=f(starting Tch):Vcc=60V
60
50
IAV [A]
40
Non-Repetitive
(Single Pulse)
30
20
Repetitive
10
0
0
25
50
75
100
125
150
175
200
Fuji Electric Co.,Ltd.
DWG.NO.
starting Tch [°C]
MS5F5476
17 / 19
H04-004-03
Maximum Avalanche Energy vs. starting Tch
E(AV)=f(starting Tch):Vcc=60V,I(AV)<=42A
2500
IAS=17A
2000
EAV [mJ]
1500
IAS=26A
1000
IAS=42A
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
500
0
0
25
50
75
100
125
150
starting Tch [°C]
2
10
Maximum Avalanche Current Pulsewidth
IAV=f(tAV):starting Tch=25°C,Vcc=60V
1
10
0
10
-1
10
-2
10
10-8
10-7
10-6
10-5
10-4
10-3
10-2
tAV [sec]
Fuji Electric Co.,Ltd.
DWG.NO.
Avalanche Current I AV [A]
Single Pulse
MS5F5476
18 / 19
H04-004-03
10
-6
10
-5
10
-4
Fuji Electric Co.,Ltd.
DWG.NO.
This material and the information herein is the property of
Fuji Electric Co.,Ltd. They shall be neither reproduced, copied,
lent, or disclosed in any way whatsoever for the use of any
third party nor used for the manufacturing purposes without
the express written consent of Fuji Electric Co.,Ltd.
Zth(ch-c) [°C/W]
Maximum Transient Thermal Impedance
Zth(ch-c)=f(t):D=0
10
1
10
0
10
-1
10
-2
10
-3
10
-3
10
-2
10
-1
MS5F5476
10
0
t [sec]
19 / 19
H04-004-03