DATA SHEET MOS INTEGRATED CIRCUIT µ PD23C128040L 128M-BIT MASK-PROGRAMMABLE ROM 16M-WORD BY 8-BIT (BYTE MODE) / 8M-WORD BY 16-BIT (WORD MODE) PAGE ACCESS MODE Description The µPD23C128040L is a 134,217,728 bits mask-programmable ROM. The word organization is selectable (BYTE mode : 16,777,216 words by 8 bits, WORD mode : 8,388,608 words by 16 bits). The active levels of OE (Output Enable Input) can be selected with mask-option. The µPD23C128040L is packed in 48-pin plastic TSOP(I). Features • Word organization 16,777,216 words by 8 bits (BYTE mode) 8,388,608 words by 16 bits (WORD mode) • Page access mode BYTE mode : 8 byte random page access WORD mode : 4 word random page access • Operating supply voltage : VCC = 3.3 V ± 0.3 V Operating supply voltage Access time / Page access time Power supply current (Active mode) Standby current (CMOS level input) VCC ns (MAX.) mA (MAX.) µA (MAX.) 3.3 V ± 0.3 V 100 / 30 70 30 Ordering Information Part Number Package µPD23C128040LGY-xxx-MJH 48-pin Plastic TSOP(I) (12 x 18) (Normal bent) µPD23C128040LGY-xxx-MKH 48-pin Plastic TSOP(I) (12 x 18) (Reverse bent) (xxx : ROM code suffix No.) The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. Not all devices/types available in every country. Please check with local NEC representative for availability and additional information. Document No. M13643EJ4V0DSJ1 (4th edition) Date Published December 2000 NS CP (K) Printed in Japan The mark • shows major revised points. © 1998 µPD23C128040L • Pin Configurations (Marking Side) /xxx indicates active low signal. 48-pin plastic TSOP(I) (12 x 18) (Normal bent) [ µPD23C128040LGY-xxx-MJH ] WORD, /BYTE 1 48 GND A16 2 47 GND A15 3 46 O15, A–1 A14 4 45 O7 A13 5 44 O14 A12 6 43 O6 A11 7 42 O13 A10 8 41 O5 A9 9 40 O12 A8 10 39 O4 A19 11 38 VCC A21 12 37 VCC A20 13 36 A22 A18 14 35 O11 A17 15 34 O3 A7 16 33 O10 A6 17 32 O2 A5 18 31 O9 A4 19 30 O1 A3 20 29 O8 A2 21 28 O0 A1 22 27 /OE, OE, DC A0 23 26 GND /CE 24 25 GND A0 - A22 : Address inputs O0 - O7, O8 - O14 : Data outputs O15, A–1 : Data output 15 (WORD mode), LSB Address input (BYTE mode) WORD, /BYTE : Mode select /CE : Chip Enable /OE, OE : Output Enable VCC : Supply voltage GND : Ground DC : Don’t Care Remark Refer to Package Drawings for the 1-pin index mark. 2 Data Sheet M13643EJ4V0DS µPD23C128040L 48-pin plastic TSOP(I) (12 x 18) (Reverse bent) [ µPD23C128040LGY-xxx-MKH ] GND 48 1 WORD, /BYTE GND 47 2 A16 O15, A–1 46 3 A15 O7 45 4 A14 O14 44 5 A13 O6 43 6 A12 O13 42 7 A11 O5 41 8 A10 O12 40 9 A9 O4 39 10 A8 VCC 38 11 A19 VCC 37 12 A21 A22 36 13 A20 O11 35 14 A18 O3 34 15 A17 O10 33 16 A7 O2 32 17 A6 O9 31 18 A5 O1 30 19 A4 O8 29 20 A3 O0 28 21 A2 /OE, OE, DC 27 22 A1 GND 26 23 A0 GND 25 24 /CE A0 - A22 : Address inputs O0 - O7, O8 - O14 : Data outputs O15, A–1 : Data output 15 (WORD mode), LSB Address input (BYTE mode) WORD, /BYTE : Mode select /CE : Chip Enable /OE, OE : Output Enable VCC : Supply voltage GND : Ground DC : Don’t Care Remark Refer to Package Drawings for the 1-pin index mark. Data Sheet M13643EJ4V0DS 3 µPD23C128040L Input / Output Pin Functions Pin name WORD, /BYTE Input / Output Input Function The pin for switching WORD mode and BYTE mode. High level : WORD mode (8M-word by 16-bit) Low level : BYTE mode (16M-word by 8-bit) A0 to A22 Input (Address inputs) Address input pins. A0 to A22 are used differently in the WORD mode and the BYTE mode. WORD mode (8M-word by 16-bit) A0 to A22 are used as 23 bits address signals. BYTE mode (16M-word by 8-bit) A0 to A22 are used as the upper 23 bits of total 24 bits of address signal. (The least significant bit (A−1) is combined to O15.) O0 to O7, O8 to O14 Output (Data outputs) Data output pins. O0 to O7, O8 to O14 are used differently in the WORD mode and the BYTE mode. WORD mode (8M-word by 16-bit) The lower 15 bits of 16 bits data outputs to O0 to O14. (The most significant bit (O15) combined to A−1.) BYTE mode (16M-word by 8-bit) 8 bits data outputs to O0 to O7 and also O8 to O14 are high impedance. O15, A−1 Output, Input O15, A−1 are used differently in the WORD mode and the BYTE mode. (Data output 15, WORD mode (8M-word by 16-bit) LSB Address input) The most significant output data bus (O15). BYTE mode (16M-word by 8-bit) The least significant address bus (A−1). /CE Input (Chip Enable) Chip activating signal. When the OE is active, output states are following. High level : High impedance Low level : Data out /OE, OE, DC Input (Output Enable, Don’t Care) Output enable signal. The active level of OE is mask option. The active level of OE can be selected from high active, low active and Don’t care at order. VCC − Supply voltage GND − Ground 4 Data Sheet M13643EJ4V0DS µPD23C128040L Block Diagram O9 O8 O0 A0 O1 O10 O2 O11 O3 O13 O12 O4 O5 O6 O14 O15, A–1 O7 A2 A3 Y-Selector A4 Logic/Input Y-Decoder Output Buffer A1 WORD, /BYTE /OE, OE, DC A5 A6 A11 A12 A13 A14 Memory Cell Matrix 8,388,608 words by 16 bits / 16,777,216 words by 8 bits A15 Input Buffer A9 A10 X-Decoder A8 Address Input Buffer A7 /CE A16 A17 A18 A19 A20 A21 A22 Data Sheet M13643EJ4V0DS 5 µPD23C128040L Mask Option The active levels of output enable pin (/OE, OE, DC) are mask programmable and optional, and can be selected from among " 0 " " 1 " " x " shown in the table below. Option /OE, OE, DC OE active level 0 /OE L 1 OE H x DC Don’t care Operation modes for each option are shown in the tables below. Operation mode (Option : 0) /CE /OE Mode Output state L L Active Data out H H H or L High impedance Standby High impedance Operation mode (Option : 1) /CE OE Mode Output state L L Active High impedance H H H or L Data out Standby High impedance Operation mode (Option : x) /CE DC Mode Output state L H or L Active Data out H H or L Standby High impedance Remark L : Low level input H : High level input 6 Data Sheet M13643EJ4V0DS µPD23C128040L Electrical Specifications Absolute Maximum Ratings Parameter Rating Unit VCC –0.3 to +4.6 V Input voltage VI –0.3 to VCC+0.3 V Output voltage VO –0.3 to VCC+0.3 V Operating ambient temperature TA –10 to +70 °C Storage temperature Tstg –65 to +150 °C Supply voltage Symbol Condition Caution Exposing the device to stress above those listed in Absolute Maximum Ratings could cause permanent damage. The device is not meant to be operated under conditions outside the limits described in the operational section of this specification. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Capacitance (TA = 25°C) Parameter Symbol Input capacitance CI Output capacitance CO Test condition MIN. TYP. f = 1 MHz MAX. Unit 10 pF 12 pF MAX. Unit DC Characteristics (TA = –10 to +70°C, VCC = 3.3 V ± 0.3 V) Parameter Symbol Test conditions MIN. TYP. High level input voltage VIH 2.2 VCC + 0.3 V Low level input voltage VIL –0.3 +0.8 V High level output voltage VOH IOH = –100 µA Low level output voltage VOL IOL = 2.1 mA 2.4 V 0.4 V Input leakage current ILI VI = 0 V to VCC –10 +10 µA Output leakage current ILO VO = 0 V to VCC, Chip deselected –10 +10 µA Power supply current ICC1 /CE = VIL (Active mode), IO = 0 mA 70 mA Standby current ICC3 /CE = VCC – 0.2 V (Standby mode) 30 µA Data Sheet M13643EJ4V0DS 7 µPD23C128040L AC Characteristics (TA = –10 to +70°C, VCC = 3.3 V ± 0.3 V) Parameter Symbol Test condition MIN. TYP. MAX. Unit Address access time tACC 100 ns Page access time tPAC 30 ns Chip enable access time tCE 100 ns Output enable access time tOE 30 ns Output hold time tOH 0 Output disable time tDF 0 WORD, /BYTE access time tWB Remark tDF is the time from inactivation of /CE or /OE, OE to high-impedance state output. AC Test Conditions Input waveform (Rise / Fall time ≤ 5 ns) 1.4 V Test points 1.4 V 1.4 V Test points 1.4 V Output waveform Output load 1TTL + 100 pF 8 Data Sheet M13643EJ4V0DS ns 25 ns 100 ns µPD23C128040L Read Cycle Timing Chart 1 A0 to A22, (Input) A–1Note 1 tACC /CE (Input) tDFNote 2 tCE /OE, OE (Input) tOE O0 to O7, (Output) O8 to O15Note 3 High impedance tOH Data Out Notes 1. During WORD mode, A–1 is O15. 2. tDF is specified when one of /CE, /OE, OE is inactivated. 3. During BYTE mode, O8 to O14 are high impedance and O15 is A–1. Data Sheet M13643EJ4V0DS 9 µPD23C128040L • Read Cycle Timing Chart 2 (Page Access Mode) A2 to A22 (Input) tACC /CE (Input) tCE /OE, OE (Input) tOE A–1,Note 1 A0, A1 (Input) tPAC Note 4 tPAC Note 4 tOH tOH O0 to O7, (Output) O8 to O15Note 3 tDF Note 2 tOH High impedance High impedance Data Out Data Out Data Out Notes 1. During WORD mode, A–1 is O15. 2. tDF is specified when one of /CE, /OE, OE is inactivated. 3. During BYTE mode, O8 to O14 are high impedance and O15 is A–1. 4. The definition of page access time is as follows. Page access time Upper address (A2 to A22) /CE input condition /OE, OE input condition Before tCE – tPAC Before stabilizing of page inputs condition tPAC Before tACC – tPAC address (A–1, A0, A1) 10 Data Sheet M13643EJ4V0DS µPD23C128040L WORD, /BYTE Switch Timing Chart A–1 (Input) High impedance High impedance WORD, /BYTE (Input) tOH O0 to O7 (Output) Data Out tACC tOH Data Out tWB Data Out tDF O8 to O15 (Output) Data Out High impedance Data Out Remark /OE, OE and /CE : Active. Data Sheet M13643EJ4V0DS 11 µPD23C128040L • Package Drawings 48-PIN PLASTIC TSOP(I) (12x18) 1 detail of lead end 48 F G R Q 24 L 25 S E P I A J C S D K N B M M S NOTES ITEM MILLIMETERS 1. Each lead centerline is located within 0.10 mm of its true position (T.P.) at maximum material condition. A 12.0±0.1 B 0.45 MAX. 2. "A" excludes mold flash. (Includes mold flash : 12.4 mm MAX.) C 0.5 (T.P.) D 0.22±0.05 E 0.1±0.05 F 1.2 MAX. G 1.0±0.05 I 16.4±0.1 J 0.8±0.2 K 0.145±0.05 L 0.5 M 0.10 N 0.10 P 18.0±0.2 Q +5° 3° −3° R S 0.25 0.60±0.15 S48GY-50-MJH1-1 12 Data Sheet M13643EJ4V0DS µPD23C128040L 48-PIN PLASTIC TSOP(I) (12x18) detail of lead end 1 48 E S L Q R 24 G 25 F K N S D S I J M M B C A P NOTES 1. Each lead centerline is located within 0.10 mm of its true position (T.P.) at maximum material condition. 2. "A" excludes mold flash. (Includes mold flash : 12.4 mm MAX.) ITEM A MILLIMETERS 12.0±0.1 B 0.45 MAX. C 0.5 (T.P.) D 0.22±0.05 E 0.1±0.05 F 1.2 MAX. G 1.0±0.05 I 16.4±0.1 J 0.8±0.2 K 0.145±0.05 L 0.5 M 0.10 N 0.10 P 18.0±0.2 Q 3° +5° −3° R 0.25 S 0.60±0.15 S48GY-50-MKH1-1 Data Sheet M13643EJ4V0DS 13 µPD23C128040L Recommended Soldering Conditions Please consult with our sales offices for soldering conditions of the µPD23C128040L. Types of Surface Mount Device µPD23C128040LGY-MJH : 48-pin plastic TSOP(I) (12 x 18) (Normal bent) µPD23C128040LGY-MKH : 48-pin plastic TSOP(I) (12 x 18) (Reverse bent) 14 Data Sheet M13643EJ4V0DS µPD23C128040L NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor devices on it. 2 HANDLING OF UNUSED INPUT PINS FOR CMOS Note: No connection for CMOS device inputs can be cause of malfunction. If no connection is provided to the input pins, it is possible that an internal input level may be generated due to noise, etc., hence causing malfunction. CMOS devices behave differently than Bipolar or NMOS devices. Input levels of CMOS devices must be fixed high or low by using a pull-up or pull-down circuitry. Each unused pin should be connected to V DD or GND with a resistor, if it is considered to have a possibility of being an output pin. All handling related to the unused pins must be judged device by device and related specifications governing the devices. 3 STATUS BEFORE INITIALIZATION OF MOS DEVICES Note: Power-on does not necessarily define initial status of MOS device. Production process of MOS does not define the initial operation status of the device. Immediately after the power source is turned ON, the devices with reset function have not yet been initialized. Hence, power-on does not guarantee out-pin levels, I/O settings or contents of registers. Device is not initialized until the reset signal is received. Reset operation must be executed immediately after power-on for devices having reset function. Data Sheet M13643EJ4V0DS 15 µPD23C128040L The export of this product from Japan is regulated by the Japanese government. To export this product may be prohibited without governmental license, the need for which must be judged by the customer. The export or re-export of this product from a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales representative. • The information in this document is current as of December, 2000. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information. • No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document. • NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others. • Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. • While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features. • NEC semiconductor products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below. Customers must check the quality grade of each semiconductor product before using it in a particular application. "Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots "Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) "Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc. The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application. (Note) (1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries. (2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for NEC (as defined above). M8E 00. 4