REVISIONS LTR A DESCRIPTION DATE (YR-MO-DA) APPROVED 96-11-07 R. MONNIN Add device types 04, 05, and 06. Add case outlines D and H. Make changes to 1.3, table I, and figure 1. THE ORIGINAL FIRST SHEET OF THIS DRAWING HAS BEEN REPLACED. REV SHEET REV SHEET REV STATUS OF SHEETS PMIC N/A STANDARD MICROCIRCUIT DRAWING THIS DRAWING IS AVAILABLE FOR USE BY ALL DEPARTMENTS AND AGENCIES OF THE DEPARTMENT OF DEFENSE AMSC N/A REV A A A A A A A A A A A A A SHEET 1 2 3 4 5 6 7 8 9 10 11 12 13 PREPARED BY RICK OFFICER DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216 CHECKED BY RAJESH PITHADIA APPROVED BY RAYMOND MONNIN MICROCIRCUIT, LINEAR, JFET-INPUT SINGLE/DUAL/QUAD OPERATIONAL AMPLIFIER, MONOLITHIC SILICON DRAWING APPROVAL DATE 94-04-14 SIZE REVISION LEVEL A A SHEET DESC FORM 193 JUL 94 DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited. CAGE CODE 5962-94602 67268 1 OF 13 5962-E021-97 1. SCOPE 1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. 1.2 PIN. The PIN is as shown in the following example: 5962 - 94602 Federal stock class designator \ RHA designator (see 1.2.1) 01 Q C X Device type (see 1.2.2) Device class designator (see 1.2.3) / Case outline (see 1.2.4) Lead finish (see 1.2.5) \/ Drawing number 1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are marked with the appropriate RHA designator. Device class M RHA marked devices meet the MIL-PRF-38535, appendix A specified RHA levels and are marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device. 1.2.2 Device type(s). The device type(s) identify the circuit function as follows: Device type 01 02 03 04 05 06 Generic number Circuit function TLE2071M TLE2072M TLE2074M TLE2071AM TLE2072AM TLE2074AM JFET-input operational amplifier JFET-input dual operational amplifier JFET-input quad operational amplifier JFET-input operational amplifier JFET-input dual operational amplifier JFET-input quad operational amplifier 1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as follows: Device class M Q or V Device requirements documentation Vendor self-certification to the requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A Certification and qualification to MIL-PRF-38535 1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows: Outline letter Descriptive designator C D H P 2 GDIP1-T14 or CDIP2-T14 GDFP1-F14 or CDFP2-F14 GDFP1-F10 or CDFP2-F10 GDIP1-T8 or CDIP2-T8 CQCC1-N20 Terminals Package style 14 14 10 8 20 Dual-in-line Flat pack Flat pack Dual-in-line Square leadless chip carrier 1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 2 1.3 Absolute maximum ratings. 1/ 2/ Supply volatge (+VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Supply volatge (-VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Differential input voltage 3/ . . . . . . . . . . . . . . . . . . . . . . . . . . . Input voltage range (VI) (any input) . . . . . . . . . . . . . . . . . . . . . Input current (II) (each input) . . . . . . . . . . . . . . . . . . . . . . . . . Output current (IO) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Total current into +VCC terminal . . . . . . . . . . . . . . . . . . . . . . . Total current into -VCC terminal . . . . . . . . . . . . . . . . . . . . . . . Duration of short circuit current at ( or below) +25(C 4/ . . . . Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . Junction temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Power dissipation (PD) Case C 5/ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Case D 5/ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Case H 5/ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Case P 5/ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Case 2 5/ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Thermal resistance, junction-to-case (JC) . . . . . . . . . . . . . . +19 V dc -19 V dc +VCC to -VCC +VCC to -VCC ±1 mA ±80 mA 160 mA -160 mA Unlimited -65(C to +150(C +150(C 1375 mW 680 mW 675 mW 1050 mW 1375 mW See MIL-STD-1835 1.4 Recommended operating conditions. Supply voltage (±VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Common-mode input voltage (VIC) (±VCC = ±5 V) . . . . . . . . Common-mode input voltage (VIC) (±VCC = ±15 V) . . . . . . . Ambient operating free-air temperature (TA) . . . . . . . . . . . . . Source resistance from ground to input terminals (RS) . . . . . ±2.25 V dc minimum, ±19 V dc maximum -0.8 V dc minimum, 5 V dc maximum -10.8 V dc minimum, 15 V dc maximum -55(C to +125(C 50 6 2. APPLICABLE DOCUMENTS 2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the solicitation. SPECIFICATION MILITARY MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for. 1/ 2/ 3/ 4/ 5/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the maximum levels may degrade performance and affect reliability. All voltage values, except differential voltages, are with respect to the midpoint between +VCC and -VCC. Differential voltages are at the noninverting input with respect to the inverting input. The output may be shorted to either supply. Temperature and supply voltage must be limited to ensure that the maximum dissipation rating is not exceeded. Above TA = +25(C derate at a factor of 11 mW/(C for cases C and 2, 8 mW/(C for case D, 5.4 mW/(C for case H, and 8.4 mW/(C for case P. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 3 STANDARDS MILITARY MIL-STD-883 MIL-STD-973 MIL-STD-1835 - Test Methods and Procedures for Microelectronics. Configuration Management. Microcircuit Case Outlines. HANDBOOKS MILITARY MIL-HDBK-103 MIL-HDBK-780 - List of Standard Microcircuit Drawings (SMD's). Standard Microcircuit Drawings. (Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) 2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. The individual item requirements for device class M shall be in accordance with MIL-PRF-38535, appendix A for non-JAN class level B devices and as specified herein. 3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein for device classes Q and V or MIL-PRF-38535, appendix A and herein for device class M. 3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein. 3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1. 3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full ambient operating temperature range. 3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table Il. The electrical tests for each subgroup are defined in table I. 3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-HDBK-103. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535. Marking for device class M shall be in accordance with MIL-PRF-38535, appendix A. 3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 4 TABLE I. Electrical performance characteristics. Test Input offset voltage Symbol VIO Conditions -55°C TA +125°C unless otherwise specified Group A subgroups VCC = ±5 V, VIC = 0 V, RS = 50 6 1 Device type 01 2,3 1 02 2,3 1 03 2,3 1 04 2,3 1 05 2,3 1 06 2,3 VCC = ±15 V, VIC = 0 V, RS = 50 6 1 01 2,3 1 02 2,3 1 03 2,3 1 04 2,3 1 05 2,3 1 2,3 06 Unit Limits 1/ Min Max -4 4 -9.2 9.2 -6 6 -10.5 10.5 -5 5 -10.5 10.5 -2 2 -7.2 7.2 -3.5 3.5 -8 8 -3 3 -8.5 8.5 -4 4 -9.2 9.2 -6 6 -10.5 10.5 -5 5 -10.5 10.5 -2 2 -7.2 7.2 -3.5 3.5 -8 8 -3 3 -8.5 8.5 mV mV See footnotes at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 5 TABLE I. Electrical performance characteristics - Continued. Test Input offset current Input bias current Common-mode input voltage range Symbol IIO IIB VICR Conditions -55°C TA +125°C unless otherwise specified Group A subgroups VCC = ±5 V, VIC = 0 V, RS = 50 6, TA = -55(C, +125(C 2,3 VCC = ±15 V, VIC = 0 V, RS = 50 6, TA = -55(C, +125(C 2,3 VCC = ±5 V, VIC = 0 V, RS = 50 6, TA = -55(C, +125(C 2,3 VCC = ±15 V, VIC = 0 V, RS = 50 6, TA = -55(C, +125(C 2,3 VCC = ±5 V 1 Device type All All All 2,3 VCC = ±15 V 1 01,04 +VOM VCC = ±5 V, IOUT = -200 µA 1 VCC = ±5 V, IOUT = -2 mA VCC = ±5 V, IOUT = -20 mA VCC = ±15 V, IOUT = - 200 µA Max -20 20 -20 20 -60 60 -60 60 -1 to 5 nA nA V -11 to 15 V -10.9 to 15 02,03, 05,06 2,3 Maximum positive peak output voltage swing Min -0.8 to 5 2,3 1 Unit Limits 1/ -11 to 15 -10.8 to 15 All 3.8 2,3 3.6 1 3.5 2,3 3.3 1 1.5 2,3 1.4 1 13.8 2,3 13.6 V See footnote at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 6 TABLE I. Electrical performance characteristics - Continued. Test Maximum positive peak output voltage swing Symbol +VOM Conditions -55°C TA +125°C unless otherwise specified Group A subgroups VCC = ±15 V, IOUT = -2 mA 1 -VOM VCC = ±5 V, IOUT = 200 µA VCC = ±5 V, IOUT = 20 mA VCC = ±15 V, IOUT = 200 µA VCC = ±15 V, IOUT = 2 mA VCC = ±15 V, IOUT = 20 mA Large signal differential voltage amplification AVD 13.3 1 11.5 2,3 11.4 VCC = ±5 V, VO = ±2.3 V, RL = 600 6 -3.6 1 -3.5 2,3 -3.3 1 -1.5 2,3 -1.4 1 -13.8 2,3 -13.6 1 -13.5 2,3 -13.3 1 -11.5 2,3 -11.4 VCC = ±5 V, RL = 10 k6, VO = ±2.3 V VCC = ±15 V, RL = 600 6, VO = ±10 V VCC = ±15 V, RL = 2 k6, VO = ±10 V VCC = ±15 V, RL = 10 k6, VO = ±10 V All V -3.8 2,3 1 VCC = ±5 V, RL = 2 k6, VO = ±2.3 V All Max 13.5 2,3 1 VCC = ±5 V, IOUT = 2 mA All Unit Limits 1/ Min VCC = ±15 V, IOUT = -20 mA Maximum negative peak output voltage swing Device type V 80 2,3 78 1 90 2,3 88 1 95 2,3 93 1 80 2,3 78 1 90 2,3 88 1 95 2,3 93 dB See footnotes at end of table. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 7 TABLE I. Electrical performance characteristics - Continued. Test Common-mode rejection ratio Symbol CMRR Conditions -55°C TA +125°C unless otherwise specified Group A subgroups VCC = ±5 V, RS = 50 6, VIC = VICR minimum 1 kSVR Supply current ICC VCC = ±5 V or ±15 V, RS = 50 6 All 68 1 80 2,3 78 All 2,3 VCC = ±5 V, VO = 0 V, no load 1 01,04 1.35 1 02,05 2.7 03,06 5.2 01,04 1.35 +SR VCC = ±15 V, RL = 2 k6, CL = 100 pF, AV = -1, VO(PP) = 10 V 4 02,05 03,06 2.7 01,04 5.2 -SR VCC = ±15 V, RL = 2 k6, CL = 100 pF, AV = -1, VO(PP) = 10 V 4 02,05 5,6 30 V/µs 28 20 03,06 25 20 01,04 5,6 4 7.5 22 5,6 Negative slew rate 3.6 7.5 5,6 4 2.2 3.6 5,6 4 7.5 2.2 2,3 Positive slew rate 3.6 7.5 2,3 1 mA 3.6 2,3 1 2.2 2.2 2,3 VCC = ±15 V, VO = 0 V, no load dB 80 2,3 1 dB 82 2,3 1 Max 70 2,3 1 Unit Limits 1/ Min VCC = ±15 V, RS = 50 6, VIC = VICR minimum Supply-voltage rejection ratio (±VCC/ VIO) Device type 30 V/µs 22 02,03, 05,06 30 20 1/ The algebraic convention, whereby the most negative value is a minimum and the most positive is a maximum, is used in this table. Negative current shall be defined as conventional current flow out of a device terminal. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 8 Device types Case outlines 01 and 04 H P Terminal number 02 and 05 2 H P 2 Terminal symbol 1 NC OFFSET N1 NC NC OUTPUT 1 NC 2 OFFSET N1 -INPUT OFFSET N1 OUTPUT 1 -INPUT 1 OUTPUT 1 3 -INPUT +INPUT NC -INPUT 1 +INPUT 1 NC 4 +INPUT -VCC NC +INPUT 1 -VCC NC 5 -VCC OFFSET N2 -INPUT -VCC +INPUT 2 -INPUT 1 6 OFFSET N2 OUTPUT NC +INPUT 2 -INPUT 2 NC 7 OUTPUT +VCC +INPUT -INPUT 2 OUTPUT 2 +INPUT 1 8 +VCC NC NC OUTPUT 2 +VCC NC 9 NC --- NC +VCC --- NC 10 NC --- -VCC NC --- -VCC 11 --- --- NC --- --- NC 12 --- ---- OFFSET N2 --- --- +INPUT 2 13 --- --- NC --- 14 --- --- NC NC 15 --- --- OUTPUT -INPUT 2 16 --- --- NC NC 17 --- --- +VCC OUTPUT 2 18 --- --- NC NC 19 --- --- NC NC 20 --- --- NC +VCC NC NC = No connection FIGURE 1. Terminal connections. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 9 Device types Case outlines 03 and 06 C and D Terminal number 2 Terminal symbol 1 OUTPUT 1 NC 2 -INPUT 1 OUTPUT 1 3 +INPUT 1 -INPUT 1 4 +VCC +INPUT 1 5 +INPUT 2 NC 6 -INPUT 2 +VCC 7 OUTPUT 2 NC 8 OUTPUT 3 +INPUT 2 9 -INPUT 3 -INPUT 2 10 +INPUT 3 OUTPUT 2 11 -VCC NC 12 +INPUT 4 OUTPUT 3 13 -INPUT 4 -INPUT 3 14 OUTPUT 4 +INPUT 3 15 --- NC 16 --- -VCC 17 --- NC 18 --- +INPUT 4 19 --- -INPUT 4 20 --- OUTPUT 4 NC = No connection FIGURE 1. Terminal connections - Continued. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 10 3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535 listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see 6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein. 3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing. 3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2 herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973. 3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the reviewer. 3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in microcircuit group number 61 (see MIL-PRF-38535, appendix A). 4. QUALITY ASSURANCE PROVISIONS 4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with MILPRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be in accordance with MIL-PRF-38535, appendix A. 4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection. 4.2.1 Additional criteria for device class M. a. Burn-in test, method 1015 of MIL-STD-883. (1) Test condition B or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015. (2) TA = +125(C, minimum. b. Interim and final electrical test parameters shall be as specified in table II herein. 4.2.2 Additional criteria for device classes Q and V. a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MILSTD-883. b. Interim and final electrical test parameters shall be as specified in table II herein. c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF38535, appendix B. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 11 TABLE II. Electrical test requirements. Test requirements Subgroups (in accordance with MIL-STD-883, method 5005, table I) Interim electrical parameters (see 4.2) Subgroups (in accordance with MIL-PRF-38535, table III) Device class M Device class Q Device class V --- --- --- Final electrical parameters (see 4.2) 1,2,3,4 1/ 1,2,3,4 1/ 1,2,3,4 1/ Group A test requirements (see 4.4) 1,2,3,4,5,6 1,2,3,4,5,6 1,2,3,4,5,6 Group C end-point electrical parameters (see 4.4) 1 1 1 Group D end-point electrical parameters (see 4.4) 1 1 1 Group E end-point electrical parameters (see 4.4) 1,4 1,4 1,4 1/ PDA applies to subgroup 1 with exception of input offset voltage (VIO). 4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with MIL-PRF38535 including groups A, B, C, D, and E inspections and as specified herein except where option 2 of MIL-PRF-38535 permits alternate in-line control testing. Quality conformance inspection for device class M shall be in accordance with MIL-PRF-38535, appendix A and as specified herein. Inspections to be performed for device class M shall be those specified in method 5005 of MIL-STD-883 and herein for groups A, B, C, D, and E inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. a. Tests shall be as specified in table II herein. b. Subgroups 7, 8, 9, 10, and 11 in table I, method 5005 of MIL-STD-883 shall be omitted. 4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein. 4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883: a. Test condition B or D. The test circuit shall be maintained by the manufacturer under document revision level control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. b. TA = +125(C, minimum. c. Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 12 4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with MIL-PRF38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. 4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein. 4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured (see 3.5 herein). a. End-point electrical parameters shall be as specified in table II herein. b. For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device classes must meet the postirradiation end-point electrical parameter limits as defined in table I at TA = +25(C ±5(C, after exposure, to the subgroups specified in table II herein. c. When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied. 5. PACKAGING 5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes Q and V or MIL-PRF-38535, appendix A for device class M. 6. NOTES 6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. 6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared specification or drawing. 6.1.2 Substitutability. Device class Q devices will replace device class M devices. 6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the individual documents. This coordination will be accomplished in accordance with MIL-STD-973 using DD Form 1692, Engineering Change Proposal. 6.3 Record of users. Military and industrial users should inform Defense Supply Center Columbus when a system application requires configuration control and which SMD's are applicable to that system. DSCC will maintain a record of users and this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962) should contact DSCC-VA, telephone (614) 692-0525. 6.4 Comments. Comments on this drawing should be directed to DSCC-VA , Columbus, Ohio 43216-5000, or telephone (614) 692-0674. 6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF38535 and MIL-HDBK-1331. 6.6 Sources of supply. 6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in QML-38535. The vendors listed in QML-38535 have submitted a certificate of compliance (see 3.6 herein) to DSCC-VA and have agreed to this drawing. 6.6.2 Approved sources of supply for device class M. Approved sources of supply for class M are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-VA. SIZE STANDARD MICROCIRCUIT DRAWING DEFENSE SUPPLY CENTER COLUMBUS COLUMBUS, OHIO 43216-5000 DESC FORM 193A JUL 94 5962-94602 A REVISION LEVEL A SHEET 13 STANDARD MICROCIRCUIT DRAWING BULLETIN DATE: 96-11-07 Approved sources of supply for SMD 5962-94602 are listed below for immediate acquisition information only and shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-9460201QHA 01295 TLE2071MUB 5962-9460201QPA 01295 TLE2071MJGB 5962-9460201Q2A 01295 TLE2071MFKB 5962-9460202QHA 01295 TLE2072MUB 5962-9460202QPA 01295 TLE2072MJGB 5962-9460202Q2A 01295 TLE2072MFKB 5962-9460203QCA 01295 TLE2074MJB 5962-9460203QDA 01295 TLE2074MWB 5962-9460203Q2A 01295 TLE2074MFKB 5962-9460204QPA 01295 TLE2071AMJGB 5962-9460204QHA 01295 TLE2071AMUB 5962-9460204Q2A 01295 TLE2071AMFKB 5962-9460205QPA 01295 TLE2072AMJGB 5962-9460205QHA 01295 TLE2072AMUB 5962-9460205Q2A 01295 TLE2072AMFKB 1 OF 2 STANDARD MICROCIRCUIT DRAWING BULLETIN Standard microcircuit drawing PIN 1/ Vendor CAGE number Vendor similar PIN 2/ 5962-9460206QCA 01295 TLE2074AMJB 5962-9460206QDA 01295 TLE2074AMWB 5962-9460206Q2A 01295 TLE2074AMFKB 1/ The lead finish shown for each PIN representing a hermetic package is the most readily available from the manufacturer listed for that part. The device manufacturers listed herein are authorized to supply alternate lead finishes "A", "B", or "C" at their discretion. Contact the listed approved source of supply for further information. 2/ Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the performance requirements of this drawing. Vendor CAGE number Vendor name and address 01295 Texas Instruments, Incorporation 13500 N. Central Expressway P.O. Box 655303 Dallas, TX 75265 Point of contact: I-20 at FM 1788 Midland, TX 79711-0448 2 of 2 The information contained herein is disseminated for convenience only and the Government assumes no liability whatsoever for any inaccuracies in the information bulletin.