ETC 5962-9961601HXA

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
REV
SHEET
REV
SHEET
REV STATUS
REV
OF SHEETS
SHEET
PMIC N/A
PREPARED BY
Gary Zahn
STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
1
2
3
4
5
7
8
9
10
11
DEFENSE SUPPLY CENTER COLUMBUS
POST OFFICE BOX 3990
COLUMBUS, OHIO 43216-5000
http://www.dscc.dla.mil
CHECKED BY
Michael C. Jones
APPROVED BY
Raymond Monnin
6
MICROCIRCUIT, HYBRID, DIGITAL-LINEAR,
14-BIT, DUAL CHANNEL, ANALOG TO
DIGITAL CONVERTER
DRAWING APPROVAL DATE
01-02-02
REVISION LEVEL
SIZE
A
CAGE CODE
5962-99616
67268
SHEET
DSCC FORM 2233
APR 97
DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.
1 OF
11
5962-E033-01
1. SCOPE
1.1 Scope. This drawing documents five product assurance classes, class D (lowest reliability), class E, (exceptions), class
G (lowered high reliability), class H (high reliability), and class K, (highest reliability) and a choice of case outlines and lead
finishes which are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of radiation
hardness assurance levels are reflected in the PIN.
1.2 PIN. The PIN shall be as shown in the following example:
5962
-
99616
Federal
stock class
designator
\
01
RHA
designator
(see 1.2.1)
Device
type
(see 1.2.2)
/
H
X
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
X
Lead
finish
(see 1.2.5)
\/
Drawing number
1.2.1 Radiation hardness assurance (RHA) designator. RHA marked devices shall meet the MIL-PRF-38534 specified RHA
levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device type(s). The device type(s) identify the circuit function as follows:
Device type
01
Generic number
Circuit function
AD10465BZ
Dual channel, 14-bit, 65 MSPS, MCM, analog to digital converter
1.2.3 Device class designator. This device class designator shall be a single letter identifying the product assurance level as
follows:
Device class
Device performance documentation
D, E, G, H, or K
Certification and qualification to MIL-PRF-38534
1.2.4 Case outline(s). The case outline(s) are as designated in MIL-STD-1835 and as follows:
Outline letter
Descriptive designator
X
Terminals
See figure 1
68
Package style
Leaded ceramic chip carrier
1.2.5 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Positive supply voltage (AVCC) .................................................
Digital positive supply voltage (DVCC) ......................................
Negative supply voltage (AVEE)................................................
Analog input voltage ..................................................................
Analog input current...................................................................
Digital input voltage (ENCODE).................................................
ENCODE, ENCODE differential voltage ...................................
Digital output current..................................................................
Gain and offset adjust voltage range .........................................
Digital input voltage range .........................................................
Power dissipation (PD) ..............................................................
Thermal resistance junction-to-case (JC) ................................
Thermal resistance junction-to-ambient (JA) ...........................
Junction temperature (TJ)..........................................................
Storage temperature..................................................................
Lead temperature (soldering, 10 seconds) ................................
1/
0 V dc to +7.0 V dc
0 V dc to +7.0 V dc
0 V dc to -7.0 V dc
-7.0 V dc to +7.0 V dc
-10 mA to +10 mA
0 V dc to +7.0 V dc
4 V dc
-10 mA to +10 mA
-V EE to +VCC
+0.5 V to -V EE
3.8 W
2.22C/W
24.3C/W
+175C
-65C to +150C
+300C
Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
2
1.4 Recommended operating conditions.
Positive supply voltage (AVCC) .................................................
Digital positive supply voltage (DVCC) ......................................
Negative supply voltage (AVEE)................................................
Case operating temperature range (T C)....................................
+4.85 V dc to +5.25 V dc
+3.14 V dc to +3.47 V dc
-5.25 V dc to -4.75 V dc
-40C to +85C
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a
part of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those listed in
the issue of the Department of Defense Index of Specifications and Standards (DoDISS) and supplement thereto, cited in the
solicitation.
SPECIFICATION
DEPARTMENT OF DEFENSE
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
STANDARDS
DEPARTMENT OF DEFENSE
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard Electronic Component Case Outlines.
HANDBOOKS
DEPARTMENT OF DEFENSE
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Unless otherwise indicated, copies of the specification, standards, and handbooks are available from the Standardization
Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device classes D, E, G, H, and K shall be in
accordance with MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as
designated in the device manufacturer's Quality Management (QM) plan or as designated for the applicable device class.
Therefore, the tests and inspections herein may not be performed for the applicable device class (see MIL-PRF-38534).
Furthermore, the manufacturer may take exceptions or use alternate methods to the tests and inspections herein and not
perform them. However, the performance requirements as defined in MIL-PRF-38534 shall be met for the applicable device
class.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
3
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 2.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked
with the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked in MIL-HDBK-103 and
QML-38534.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot
sample, for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for
those which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer
and be made available to the preparing activity (DSCC-VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DSCC-VA shall affirm that the manufacturer's product meets
the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
b.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1015 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1015 of MIL-STD-883.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
4
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-40C < TC < +85C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Min
Unit
Max
Offset error
OFFERROR
1,2,3
01
-2.2
+2.2
%FS
Offset error channel match
OFF ECM
1,2,3
01
-1.0
+1.0
%FS
Gain error
AVERROR
1
01
-3
+1
%FS
-5
+5
-1.5
+1.5
2
-3.0
+3.0
3
-5.0
+5.0
2/
2,3
Gain error channel match
Analog input resistance
AV ECM
ARIN1
1
99
101
ARIN2
198
202
ARIN3
396
404
ENCODE input
(differential input
voltage)
VIN
Supply currents
ICCTOTAL
Digital output voltage
(logic "1" voltage)
VOH
Digital output voltage
(logic "0" voltage)
3/
1,2,3
01
3/ 4/
01
%FS
1,2,3
01
0.4
Vp-p
1,2,3
01
DVCC = +3.3 V 5/
1,2,3
01
VOL
DVCC = +3.3 V 5/
1,2,3
01
0.5
V
Input capacitance
CIN
TA = +25C 3/ 6/
4
01
7.0
pF
ENCODE pulse width
high
ENCHI
3/
4,5,6
01
6.2
9.2
ns
ENCODE pulse width
low
ENCLO
3/
4,5,6
01
6.2
9.2
ns
Aperture delay matching
t ADM
TA = +25C 3/
4
01
Maximum conversion
rate
CNVMAX
7/
4,5,6
01
403
mA
2.5
V
500
ps
65
MSPS
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
5
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-40C < TC < +85C
unless otherwise specified
Group A
subgroups
Device
type
Limits
Min
Spurious free dynamic
range 8/
SFDR
Analog input at 9.9 MHz
4
Analog input at 19.5 MHz
Analog input at 32.1 MHz
Signal-to-noise ratio 9/
SNR
Analog input at 9.9 MHz
Two tone intermodulation
distortion rejection
11/
SINAD
IMD
70
4
72
5,6
70
4
62
5,6
60
01
68
4
68
5,6
67
Analog input at 32.1 MHz
4,5,6
67
Analog input at 9.9 MHz
4,5,6
Analog input at 19.5 MHz
4,5,6
65
Analog input at 32.1 MHz
4
60
5,6
58
fIN = 10 MHz and 11 MHz,
f1 and f2 are -7 dB
4
fIN = 31 MHz and 32 MHz,
f1 and f2 are -7 dB
01
dBFS
69
5,6
01
Max
73
5,6
4
Analog input at 19.5 MHz
Signal-to-noise and
distortion 10/
01
Unit
dBFS
67.5
dB
78
5,6
78
4
68
5,6
60
dBFS
See footnotes at end of table.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
6
TABLE I. Electrical performance characteristics - Continued.
Test
Symbol
Conditions 1/
-40C < TC < +85
unless otherwise specified
Group A
subgroups
Device
type
Limits
Min
Channel to channel
isolation 3/ 12/
ISO
TA = +25C
4
01
Unit
Max
90
dB
1/ AVCC(analog) = +5 V dc, AVEE(analog) = -5 V dc, and DVCC(digital) = +3.3 V dc, unless otherwise specified. AVCC may
be varied from +4.85 V to +5.25 V. However, rated AC (harmonics) performance is valid only over the range;
AVCC = 5.0 V to 5.25 V.
2/ Gain tests are preformed on AIN1 input voltage range.
3/ Parameter shall be tested as part of device initial characterization and after design and process changes. Parameter
shall be guaranteed to the limits specified in table I for all lots not specifically tested.
4/ All AC specifications tested by driving ENCODE and ENCODE differentially.
5/ Digital output logic levels: VCC(digital) = +3.3 V dc, CLOAD = 10 pF. Capacitive loads > 10 pF will degrade performance.
6/ Input capacitance combines die and package capacitance.
7/ Maximum conversion rate allows for variation in ENCODE DUTY CYCLE of 50%, 5%.
8/ Analog input signal equals -1 dBFS; SFDR is the ratio of converter full scale to worst spur.
9/ Analog input signal power at -1 dBFS; signal-to-noise ratio (SNR) is the ratio of signal level to total noise
(first 5 harmonics removed). ENCODE = 65 MSPS. SNR is reported in dBFS, related back to converter full scale.
10/ Analog input signal power at -1 dBFS; signal-to-noise and distortion (SINAD) is the ratio of signal level to total noise
plus harmonics. ENCODE = 65 MSPS.
11/ Two tone intermodulation distortion rejection is the ratio of the rms value of either input tone to the rms value of the worst
third order intermodulation product; reported in dBFS.
12/ Channel to channel isolation tested with A channel grounded and a full scale signal applied to B channel.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
7
Case outline X.
Millimeters
Symbol
Min
A
Inches
Max
Min
5.97
A1
Max
0.235
4.45
0.175
A2
0.18
1.02
0.040
0.060
b
0.36
0.51
0.014
0.020
c
0.18
0.25
0.007
0.010
e
1.14
1.40
0.045
0.055
D/E
29.72
30.23
1.170
1.190
D1/E1
27.18
D2/E2
23.88
24.38
0.940
D3/E3
1.070
20.32 BSC
0.960
0.800 BSC
NOTES:
1.
The U.S. preferred system of measurement is the metric SI. This item was designed using inch-pound units of
measurement. In case of problems involving conflicts between the metric and inch-pound units, the inch-pound
units shall rule.
2.
Pin 1 dot and pin numbers are for reference only.
FIGURE 1. Case outline(s).
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
8
Device
type
01
Device
type
01
Device
type
01
Case
outline
X
Case
outline
X
Case
outline
X
Terminal
number
Terminal symbol
Terminal
number
Terminal symbol
Terminal
number
Terminal symbol
1
Shield
24
D9A
47
D11B
2
Channel A analog ground
25
D10A
48
D12B
3
VREF_ A
26
Channel A digital ground
49
D13B (MSB)
4
Channel A analog ground
27
Channel A digital ground
50
DVCC
5
Channel A analog ground
28
51
Encode B
Encode A
6
Analog input A1
29
Encode A
52
Encode B
7
Analog input A2
30
DVCC
53
Channel B analog ground
8
Analog input A3
31
D11A
54
Channel B analog ground
9
Channel A analog ground
32
D12A
55
Data ready B output
10
Channel A analog ground
33
D13A (MSB)
56
VREF_B
11
Channel A analog ground
34
D0B (LSB)
57
Channel B analog ground
12
Data ready A output
35
D1B
58
Channel B analog ground
13
AVEE
36
D2B
59
Channel B analog ground
14
AVCC
37
D3B
60
Channel B analog ground
15
DOA (LSB)
38
D4B
61
Channel B analog ground
16
D1A
39
D5B
62
Analog input B1
17
D2A
40
D6B
63
Analog input B2
18
D3A
41
D7B
64
Analog input B3
19
D4A
42
D8B
65
Channel B analog ground
20
D5A
43
Channel B digital ground
66
AVCC
21
D6A
44
Channel B digital ground
67
AVEE
22
D7A
45
D9B
68
Channel B analog ground
23
D8A
46
D10B
FIGURE 2. Terminal connections.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
9
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A
test table)
Interim electrical parameters
1
Final electrical parameters
1*,2,3,4,5,6,7,8
Group A test requirements
1,2,3,4,5,6,7,8
Group C end-point electrical
parameters
1
Not applicable
End-point electrical parameters
for radiation hardness assurance
(RHA) devices
* PDA applies to subgroup 1.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in accordance
with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 9, 10, and 11 shall be omitted.
4.3.2 Group B inspection (PI). Group B inspection shall be in accordance with MIL-PRF-38534.
4.3.3 Group C inspection (PI). Group C inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.
End-point electrical parameters shall be as specified in table II herein.
b.
Steady-state life test, method 1005 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1005 of MIL-STD-883.
(2)
TA as specified in accordance with table I of method 1005 of MIL-STD-883.
(3)
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
4.3.4 Group D inspection (PI). Group D inspection shall be in accordance with MIL-PRF-38534.
4.3.5 Radiation Hardness Assurance (RHA) inspection. RHA inspection is not currently applicable to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
10
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38534.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractorprepared specification or drawing.
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished in accordance with MIL-PRF-38534.
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus when a system application
requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used for
coordination and distribution of changes to the drawings. Users of drawings covering microelectronic devices (FSC 5962)
should contact DSCC-VA, telephone (614) 692-0544.
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Post Office Box 3990, Columbus, Ohio 432165000, or telephone (614) 692-0512.
6.6 Sources of supply. Sources of supply are listed in MIL-HDBK-103 and QML-38534. The vendors listed in MIL-HDBK103 and QML-38534 have submitted a certificate of compliance (see 3.7 herein) to DSCC-VA and have agreed to this drawing.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
5962-99616
A
REVISION LEVEL
SHEET
11
STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 01-02-02
Approved sources of supply for SMD 5962-99616 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38534 during the next revisions. MIL-HDBK-103 and QML-38534 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DSCC-VA. This bulletin is superseded by the next
dated revisions of MIL-HDBK-103 and QML-38534.
1/
2/
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-9961601HXA
34031
AD10465BZ/QMLH
The lead finish shown for each PIN representing a hermetic package is the most readily available from the
manufacturer listed for that part. If the desired lead finish is not listed contact the Vendor to determine its
availability.
Caution. Do not use this number for item acquisition. Items acquired to this number may not satisfy the
performance requirements of this drawing.
Vendor CAGE
number
34031
Vendor name
and address
Analog Devices Incorporated
7910 Triad Center Drive
Greensboro, NC 27409-9605
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.