ETC CY74FCT2827T

CY74FCT2827T
10-BIT BUFFER
WITH 3-STATE OUTPUTS
SCCS045A – MAY 1994 – REVISED SEPTEMBER 2001
D
D
D
D
D
D
D
D
D
D
Q PACKAGE
(TOP VIEW)
Function and Pinout Compatible With FCT,
F, and AM29827 Logic
25-Ω Output Series Resistors Reduce
Transmission-Line Reflection Noise
Reduced VOH (Typically = 3.3 V) Versions
of Equivalent FCT Functions
Edge-Rate Control Circuitry for
Significantly Improved Noise
Characteristics
Ioff Supports Partial-Power-Down Mode
Operation
ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
Matched Rise and Fall Times
Fully Compatible With TTL Input and
Output Logic Levels
12-mA Output Sink Current
15-mA Output Source Current
3-State Outputs
OE1
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
GND
1
24
2
23
3
22
4
21
5
20
6
19
7
18
8
17
9
16
10
15
11
14
12
13
VCC
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
Y9
OE2
description
The CY74FCT2827T 10-bit buffer provides high-performance bus-interface buffering for wide data/address
paths or buses carrying parity. This 10-bit buffer has NANDed output-enable (OE) inputs for maximum control
flexibility. The CY74FCT2827T is designed for high-capacitance-load drive capability, while providing
low-capacitance bus loading at both inputs and outputs. All inputs have clamp diodes and all outputs are
designed for low-capacitance bus loading in the high-impedance state. On-chip termination resistors at the
outputs reduce system noise caused by reflections. The CY74FCT2827T can replace the CY74FCT827T to
reduce noise in an existing design.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
ORDERING INFORMATION
TA
–40°C
40°C to 85°C
PACKAGE†
SPEED
(ns)
ORDERABLE
PART NUMBER
QSOP – Q
Tape and reel
4.4
CY74FCT2827CTQCT
QSOP – Q
Tape and reel
8
CY74FCT2827ATQCT
TOP-SIDE
MARKING
FCT2827C
FCT2827A
† Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines
are available at www.ti.com/sc/package.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright  2001, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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1
CY74FCT2827T
10-BIT BUFFER
WITH 3-STATE OUTPUTS
SCCS045A – MAY 1994 – REVISED SEPTEMBER 2001
FUNCTION TABLE
INPUTS
D
OUTPUT
Y
OE1
OE2
L
L
L
L
L
L
H
H
H
X
X
Z
X
H
X
Z
FUNCTION
Transparent
3 State
3-State
H = High logic level, L = Low logic level, X = Don’t care,
Z = High-impedance state
logic diagram (positive logic)
OE1
OE2
D0
1
13
2
23
Y0
To Nine Other Channels
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)†
Supply voltage range to ground potential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
DC input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
DC output voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
DC output current (maximum sink current/pin) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120 mA
Package thermal impedance, θJA (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61°C/W
Ambient temperature range with power applied, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 135°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
† Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied.
Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The package thermal impedance is calculated in accordance with JESD 51-7.
recommended operating conditions (see Note 2)
NOM
MAX
UNIT
4.75
5
5.25
V
VCC
VIH
Supply voltage
VIL
IOH
Low-level input voltage
0.8
V
High-level output current
–15
mA
IOL
TA
Low-level output current
12
mA
85
°C
High-level input voltage
2
Operating free-air temperature
–40
NOTE 2: All unused inputs of the device must be held at VCC or GND to ensure proper device operation.
2
MIN
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V
CY74FCT2827T
10-BIT BUFFER
WITH 3-STATE OUTPUTS
SCCS045A – MAY 1994 – REVISED SEPTEMBER 2001
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VIK
VOH
VCC = 4.75,
VCC = 4.75,
IIN = –18 mA
IOH = –15 mA
VOL
Rout
VCC = 4.75,
VCC = 4.75,
IOL = 12 mA
IOL = 12 mA
Vhys
II
All inputs
IIH
IIL
IOS‡
Ioff
IOZH
IOZL
ICC
∆ICC
ICCD¶
IC#
MIN
2.4
20
TYP†
MAX
UNIT
–0.7
–1.2
V
3.3
V
0.3
0.55
V
25
40
Ω
5
µA
±1
µA
0.2
VCC = 5.25 V,
VCC = 5.25 V,
VIN = VCC
VIN = 2.7 V
VCC = 5.25 V,
VCC = 5.25 V,
VIN = 0.5 V
VOUT = 0 V
VCC = 0 V,
VCC = 5.25 V,
VOUT = 4.5 V
VOUT = 2.7 V
–60
VCC = 5.25 V,
VCC = 5.25 V,
–120
V
±1
µA
–225
mA
±1
µA
10
µA
–10
µA
VOUT = 0.5 V
VIN ≤ 0.2 V,
VIN ≥ VCC – 0.2 V
VCC = 5.25 V, VIN = 3.4 V§, f1 = 0, Outputs open
0.1
0.2
mA
0.5
2
mA
VCC = 5.25 V, One input switching at 50% duty cycle, Outputs open,
OE1 or OE2 = GND, VIN ≤ 0.2 V or VIN ≥ VCC – 0.2 V,
0.06
0.12
mA/
MHz
0.7
1.4
1
2.4
1.6
3.2||
4.1
13.2||
5
10
VCC = 5.25 V,
Outputs open,
open
OE1 or OE2 = GND
One bit switching
at f1 = 10 MHz
at 50% duty cycle
Ten bits switching
at f1 = 2.5 MHz
at 50% duty cycle
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
VIN = 3.4 V or GND
VIN ≤ 0.2 V or
VIN ≥ VCC – 0.2 V
VIN = 3.4 V or GND
Ci
mA
pF
Co
9
12
pF
† Typical values are at VCC = 5 V, TA = 25°C.
‡ Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or
sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise, prolonged
shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In any sequence
of parameter tests, IOS tests should be performed last.
§ Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
¶ This parameter is derived for use in total power-supply calculations.
# IC
= ICC + ∆ICC × DH × NT + ICCD (f0/2 + f1 × N1)
Where:
IC
= Total supply current
ICC = Power-supply current with CMOS input levels
∆ICC = Power-supply current for a TTL high input (VIN = 3.4 V)
DH
= Duty cycle for TTL inputs high
NT
= Number of TTL inputs at DH
ICCD = Dynamic current caused by an input transition pair (HLH or LHL)
f0
= Clock frequency for registered devices, otherwise zero
f1
= Input signal frequency
N1
= Number of inputs changing at f1
All currents are in milliamperes and all frequencies are in megahertz.
|| Values for these conditions are examples of the ICC formula.
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3
CY74FCT2827T
10-BIT BUFFER
WITH 3-STATE OUTPUTS
SCCS045A – MAY 1994 – REVISED SEPTEMBER 2001
switching characteristics over operating free-air temperature range (see Figure 1)
4
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
TEST LOAD
tPLH
tPHL
D
Y
tPLH
tPHL
D
tPZH
tPZL
CY74FCT2827AT
CY74FCT2827CT
MIN
MAX
MIN
MAX
CL = 50 pF,,
RL = 500 Ω
1.5
8
1.5
4.4
1.5
8
1.5
4.4
Y
CL = 300 pF,,
RL = 500 Ω
1.5
15
1.5
10
1.5
15
1.5
10
OE
Y
CL = 50 pF,,
RL = 500 Ω
1.5
12
1.5
7
1.5
12
1.5
7
tPZH
tPZL
OE
Y
CL = 300 pF,,
RL = 500 Ω
1.5
23
1.5
14
1.5
23
1.5
14
tPHZ
tPLZ
OE
Y
CL = 5 pF,,
RL = 500 Ω
1.5
9
1.5
5.7
1.5
9
1.5
5.7
tPHZ
tPLZ
OE
Y
CL = 50 pF,
RL = 500 Ω
1.5
9
1.5
6
1.5
9
1.5
6
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• DALLAS, TEXAS 75265
UNIT
ns
ns
ns
ns
ns
ns
CY74FCT2827T
10-BIT BUFFER
WITH 3-STATE OUTPUTS
SCCS045A – MAY 1994 – REVISED SEPTEMBER 2001
PARAMETER MEASUREMENT INFORMATION
7V
From Output
Under Test
From Output
Under Test
Test
Point
CL = 50 pF
(see Note A)
Open
TEST
GND
CL = 50 pF
(see Note A)
500 Ω
S1
500 Ω
S1
Open
7V
Open
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
500 Ω
LOAD CIRCUIT FOR
3-STATE OUTPUTS
LOAD CIRCUIT FOR
TOTEM-POLE OUTPUTS
3V
1.5 V
Timing Input
0V
tw
tsu
3V
1.5 V
Input
1.5 V
th
3V
1.5 V
Data Input
1.5 V
0V
0V
VOLTAGE WAVEFORMS
PULSE DURATION
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
3V
1.5 V
Input
1.5 V
0V
tPLH
tPHL
1.5 V
1.5 V
VOL
tPHL
Out-of-Phase
Output
tPLZ
≈3.5 V
1.5 V
tPZH
VOH
1.5 V
VOL
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
1.5 V
0V
Output
Waveform 1
(see Note B)
tPLH
1.5 V
1.5 V
tPZL
VOH
In-Phase
Output
3V
Output
Control
Output
Waveform 2
(see Note B)
VOL + 0.3 V
VOL
tPHZ
1.5 V
VOH – 0.3 V
VOH
≈0 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
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Copyright  2001, Texas Instruments Incorporated