356V25 CY7C1354V25 CY7C1356V25 PRELIMINARY 256Kx36/512Kx18 Pipelined SRAM with NoBL™ Architecture Features • Pin compatible and functionally equivalent to ZBT™ • Supports 200-MHz bus operations with zero wait states — Data is transferred on every clock • Internally self-timed output buffer control to eliminate the need to use asynchronous OE • Fully Registered (inputs and outputs) for pipelined operation • Byte Write capability • Common I/O architecture • Single 2.5V power supply • Fast clock-to-output times — 3.2 ns (for 200-MHz device) — 3.5 ns (for 166-MHz device) — 4.2 ns (for 133-MHz device) • • • • spectively. They are designed specifically to support unlimited true back-to-back Read/Write operations without the insertion of wait states. The CY7C1354V25/CY7C1356V25 is equipped with the advanced No Bus Latency™ (NoBL™) logic required to enable consecutive Read/Write operations with data being transferred on every clock cycle. This feature dramatically improves the throughput of data through the SRAM, especially in systems that require frequent Write/Read transitions. The CY7C1354V25/CY7C1356V25 is pin compatible and functionally equivalent to ZBT devices. All synchronous inputs pass through input registers controlled by the rising edge of the clock. All data outputs pass through output registers controlled by the rising edge of the clock. The clock input is qualified by the Clock Enable (CEN) signal, which when deasserted suspends operation and extends the previous clock cycle. Maximum access delay from the clock rise is 3.2 ns (200-MHz device). Write operations are controlled by the Byte Write Selects (BWSa–BWSd for CY7C1354V25 and BWSa–BWSb for CY7C1356V25) and a Write Enable (WE) input. All writes are conducted with on-chip synchronous self-timed write circuitry. — 5.0 ns (for 100-MHz device) Clock Enable (CEN) pin to suspend operation Synchronous self-timed writes Available in 100 TQFP & 119 BGA Packages Burst Capability—linear or interleaved burst order Three synchronous Chip Enables (CE1, CE2, CE3) and an asynchronous Output Enable (OE) provide for easy bank selection and output three-state control. In order to avoid bus contention, the output drivers are synchronously three-stated during the data portion of a write sequence. Functional Description The CY7C1354V25 and CY7C1356V25 are 2.5V, 256K by 36 and 512K by 18 Synchronous-Pipelined Burst SRAMs, re- Logic Block Diagram CLK CE D Data-In REG. Q OUTOUT REGISTERS and LOGIC ADV/LD Ax CY7C1354 CY7C1356 CEN CE1 CE2 CE3 WE BWSx AX X = 17:0 X = 18:0 Mode DQX X = a, b, c, d X = a, b DPX BWSX X = a, b, c, d X = a, b X = a, b, c, d X = a, b CONTROL and WRITE LOGIC 256KX36/ 512KX18 MEMORY ARRAY DQx DPx OE . Selection Guide 7C1354V25-200 7C1354V25-166 7C1354V25-133 7C1354V25-100 7C1356V25-200 7C1356V25-166 7C1356V25-133 7C1356V25-100 Maximum Access Time (ns) 3.2 3.5 4.0 5.0 Com’l 475 450 370 300 Maximum CMOS Standby Current (mA) Com’l 10 10 10 10 Maximum Operating Current (mA) Shaded areas contain advance information. No Bus Latency and NoBL are trademarks of Cypress Semiconductor Corporation. ZBT is a trademark of Integrated Device Technology. Cypress Semiconductor Corporation Document #: 38-05263 Rev. ** • 3901 North First Street • San Jose • CA 95134 • 408-943-2600 Revised March 6, 2002 CY7C1354V25 CY7C1356V25 PRELIMINARY Pin Configurations 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 DPb DQb DQb VDDQ VSS VDDQ VSS NC NC DQb DQb VSS VDDQ DQb DQb SN VDD VDD VSS DQb DQb VDDQ VSS DQb DQb DPb NC VSS VDDQ NC NC NC 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 CY7C1356V25 (512K x 18) 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 Document #: 38-05263 Rev. ** A NC NC VDDQ VSS NC DPa DQa DQa VSS VDDQ DQa DQa VSS VDD VDD NC DQa DQa VDDQ VSS DQa DQa NC NC VSS VDDQ NC NC NC DNU DNU A A A A A A A 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 DQb DQb DQb DQb VSS VDDQ DQb DQb VSS VDD VDD NC DQa DQa VDDQ VSS DQa DQa DQa DQa VSS VDDQ DQa DQa DPa NC NC NC MODE A A A A A1 A0 DNU DNU VSS VDD CY7C1354V25 (256K x 36) DNU DNU A A A A A A A DQc DQc SN VDD VDD VSS DQd DQd VDDQ VSS DQd DQd DQd DQd VSS VDDQ DQd DQd DPd 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 51 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 VSS DQc DQc DQc DQc VSS VDDQ 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 MODE A A A A A1 A0 DNU DNU VSS VDD DPc DQc DQc VDDQ A A A A CE1 CE2 NC NC BWSb BWSa CE3 VDD VSS CLK WE CEN OE ADV/LD NC A A A 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 A A CE1 CE2 BWSd BWSc BWSb BWSa CE3 VDD VSS CLK WE CEN OE ADV/LD NC A 100-Pin TQFP Packages Page 2 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Pin Configurations (continued) 119-Ball Bump BGA CY7C1354 (256K x 36) - 7 x 17 BGA 1 2 3 4 5 6 7 A VDDQ A A 16M A A VDDQ B C D E F G H J K L M N P NC NC CE2 A A A ADV/LD VDD A A CE3 A NC NC DQc DPc VSS NC VSS DPb DQb DQc DQc VSS CE1 VSS DQb DQb VDDQ DQc VSS OE VSS DQb VDDQ R T U DQc DQc BWSc A BWSb DQb DQb DQc VDDQ DQc VDD VSS VDD(1) WE VDD VSS VDD(1) DQb VDD DQb VDDQ DQd DQd DQd DQd VSS BWSd CLK NC VSS BWSa DQa DQa DQa DQa VDDQ DQd VSS CEN VSS DQa VDDQ DQd DQd VSS A1 VSS DQa DQa DQd DPd VSS A0 VSS DPa DQa NC NC A MODE VDD SN A 64M NC A A A 32M NC VDDQ TMS TDI TCK TDO DNU VDDQ CY7C1356(512K x 18) - 7 x 17 BGA A B C D E F G H J K L M N P R T U Document #: 38-05263 Rev. ** 1 2 3 4 5 6 7 VDDQ A A 16M A A VDDQ NC CE2 A ADV/LD A CE3 NC NC A A VDD A A NC DQb NC VSS NC VSS DPa NC NC DQb VSS CE1 VSS NC DQa VDDQ NC VSS OE VSS DQa VDDQ NC DQb VDDQ DQb NC VDD BWSb VSS VDD(1) A WE VDD VSS VSS VDD(1) NC DQa VDD DQa NC VDDQ NC DQb VSS CLK VSS NC DQa DQb NC VSS NC BWSa DQa NC VDDQ DQb VSS CEN VSS NC VDDQ DQb NC VSS A1 VSS DQa NC NC DPb VSS A0 VSS NC DQa NC NC A MODE VDD SN A 64M A A 32M A A NC VDDQ TMS TDI TCK TDO DNU VDDQ Page 3 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Pin Definitions (100-Pin TQFP) x18 Pin Location x36 Pin Location Name I/O Type Description 37, 36, 32–35, 44–50, 80–83, 99, 100 37, 36, 32–35, 44–50, 81-83, 99, 100 A0 A1 A InputSynchronous Address Inputs used to select one of the 266,144 address locations. Sampled at the rising edge of the CLK. 93, 94 93, 94, 95, 96 BWSa BWSb BWSc BWSd InputSynchronous Byte Write Select Inputs, active LOW. Qualified with WE to conduct writes to the SRAM. Sampled on the rising edge of CLK. BWSa controls DQa and DPa, BWSb controls DQb and DPb, BWSc controls DQc and DPc, BWSd controls DQd and DPd. 88 88 WE InputSynchronous Write Enable Input, active LOW. Sampled on the rising edge of CLK if CEN is active LOW. This signal must be asserted LOW to initiate a write sequence. 85 85 ADV/LD InputSynchronous Advance/Load Input used to advance the on-chip address counter or load a new address. When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a new address can be loaded into the device for an access. After being deselected, ADV/LD should be driven LOW in order to load a new address. 89 89 CLK Input-Clock Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN. CLK is only recognized if CEN is active LOW. 98 98 CE1 InputSynchronous Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 and CE3 to select/deselect the device. 97 97 CE2 InputSynchronous Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE3 to select/deselect the device. 92 92 CE3 InputSynchronous Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE2 to select/deselect the device. 86 86 OE InputOutput Enable, active LOW. Combined with the synchroAsynchronous nous logic block inside the device to control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs. When deasserted HIGH, I/O pins are three-stated, and act as input data pins. OE is masked during the data portion of a write sequence, during the first clock when emerging from a deselected state and when the device has been deselected. 87 87 CEN InputSynchronous Clock Enable Input, active LOW. When asserted LOW the clock signal is recognized by the SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN does not deselect the device, CEN can be used to extend the previous cycle when required. (a)58, 59, 62, 63, 68, 69, 72–74 (b)8, 9, 12, 13, 18, 19, 22–24 (a)52, 53, 56–59, 62, 63, (b)68, 69, 72–75, 78, 79 (c)2, 3, 6–9, 12, 13, (d)18, 19, 22–25, 28, 29 DQa DQb DQc DQd I/OSynchronous Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A[17:0] during the previous clock rise of the read cycle. The direction of the pins is controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave as outputs. When HIGH, DQa–DQd are placed in a three-state condition. The outputs are automatically three-stated during the data portion of a write sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of OE. Document #: 38-05263 Rev. ** Page 4 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Pin Definitions (100-Pin TQFP) (continued) x18 Pin Location x36 Pin Location Name I/O Type Description 74, 24 51, 80, 1, 30 DPa DPb DPc DPd I/OSynchronous Bidirectional Data Parity I/O lines. Functionally, these signals are identical to DQ[31:0]. During write sequences, DPa is controlled by BWSa, DPb is controlled by BWSb, DPc is controlled by BWSc, and DPd is controlled by BWSd. 31 31 MODE Input Strap Pin Mode Input. Selects the burst order of the device. Tied HIGH selects the interleaved burst order. Pulled LOW selects the linear burst order. MODE should not change states during operation. When left floating MODE will default HIGH, to an interleaved burst order. 14 14 SN InputThis is a reserved pin. Tie it to VDD for normal operation. Asynchronous 15, 16, 41, 65, 66, 91 15, 16, 41, 65, 66, 91 VDD Power Supply Power supply inputs to the core of the device. 4, 11, 20, 27, 54, 61, 70, 77 4, 11, 20, 27, 54, 61, 70, 77 VDDQ I/O Power Supply Power supply for the I/O circuitry. 5, 10, 17, 21, 26, 40, 55, 60, 67, 71, 76, 90 5, 10, 17, 21, 26, 40, 55, 60, 67, 71, 76, 90 VSS Ground Ground for the device. Should be connected to ground of the system. NC - No connects. Reserved for address expansion to 512K depths. DNU - Do Not Use pins. These pins should be left floating. 38, 39, 42, 43 38, 39, 42, 43 Pin Definitions (119 BGA) x18 Pin Location x36 Pin Location P4, N4, A2, A3, A5, A6, B3, B5, C2, C3, C5, C6, G4, R2, R6, T2, T3, T5, T6 P4, N4, A2, A3, A5, A6, B3, B5, C2, C3, C5, C6, R2, R6, G4, T3, T4, T5 A0 A1 A InputSynchronous Address Inputs used to select one of the 266,144 address locations. Sampled at the rising edge of the CLK. L5, G3 L5, G5, G3, L3 BWSa BWSb BWSc BWSd InputSynchronous Byte Write Select Inputs, active LOW. Qualified with WE to conduct writes to the SRAM. Sampled on the rising edge of CLK. BWSa controls DQa and DPa, BWSb controls DQb and DPb, BWSc controls DQc and DPc, BWSd controls DQd and DPd. H4 H4 WE InputSynchronous Write Enable Input, active LOW. Sampled on the rising edge of CLK if CEN is active LOW. This signal must be asserted LOW to initiate a write sequence. B4 B4 ADV/LD InputSynchronous Advance/Load Input used to advance the on-chip address counter or load a new address. When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a new address can be loaded into the device for an access. After being deselected, ADV/LD should be driven LOW in order to load a new address. K4 K4 CLK Input-Clock Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with CEN. CLK is only recognized if CEN is active LOW. E4 E4 CE1 InputSynchronous Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE2 and CE3 to select/deselect the device. B2 B2 CE2 InputSynchronous Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE3 to select/deselect the device. Document #: 38-05263 Rev. ** Name I/O Type Description Page 5 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Pin Definitions (119 BGA) (continued) x18 Pin Location x36 Pin Location Name I/O Type Description B6 B6 CE3 InputSynchronous Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with CE1 and CE2 to select/deselect the device. F4 F4 OE InputAsynchronous Output Enable, active LOW. Combined with the synchronous logic block inside the device to control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs. When deasserted HIGH, I/O pins are three-stated, and act as input data pins. OE is masked during the data portion of a write sequence , during the first clock when emerging from a deselected state and when the device has been deselected. M4 M4 CEN InputSynchronous Clock Enable Input, active LOW. When asserted LOW the clock signal is recognized by the SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN does not deselect the device, CEN can be used to extend the previous cycle when required. (a)P7, N6, L6, K7, H6, G7, F6, E7 (b)N1, M2, L1, K2, H1, G2, E2, D1 (a)P7, N7, N6, M6, L7, L6, K7, K6 (b)D7, E7, E6, F6, G7, G6, H7, H6 (c)D1, E1, E2, F2, G1, G2, H1, H2 (d)P1, N1, N2, M2, L1, L2, K1, K2 DQa DQb DQc DQd I/OSynchronous Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified by A[17:0] during the previous clock rise of the read cycle. The direction of the pins is controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave as outputs. When HIGH, DQa–DQd are placed in a three-state condition. The outputs are automatically three-stated during the data portion of a write sequence, during the first clock when emerging from a deselected state, and when the device is deselected, regardless of the state of OE. D6, P2 P6, D6, D2, P2 DPa DPb DPc DPd I/OSynchronous Bidirectional Data Parity I/O lines. Functionally, these signals are identical to DQ[31:0]. During write sequences, DPa is controlled by BWSa, DPb is controlled by BWSb, DPc is controlled by BWSc, and DPd is controlled by BWSd. R3 R3 MODE Input Strap pin Mode Input. Selects the burst order of the device. Tied HIGH selects the interleaved burst order. Pulled LOW selects the linear burst order. MODE should not change states during operation. When left floating MODE will default HIGH, to an interleaved burst order. C4, J2, J4, J6, R4 C4, J2, J4, J6, R4 VDD Power Supply Power supply inputs to the core of the device. A1, A7, F1, F7, J1, A1, A7, F1, F7, J1, J7, M1, M7, U1, U7 J7, M1, M7, U1, U7 VDDQ I/O Power Supply Power supply for the I/O circuitry. D3, D5, E3, E5, F3, F5, H3, H5, K3, K5, M3, M5, N3, N5, P3, P5, R5 D3, D5, E3, E5, F3, F5, H3, H5, K3, K5, M3, M5, N3, N5, P3, P5, R5 VSS Ground Ground for the device. Should be connected to ground of the system. T7 T7 ZZ - R5 R5 SN InputAsynchronous This is a reserved pin. Tie it to VDD for normal operation. J3, J5 J3, J5 Vdd(1) InputAsynchronous These pins have to be tied to a voltage level > Vih. They need not be tied to Vdd. Document #: 38-05263 Rev. ** Page 6 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Pin Definitions (119 BGA) (continued) x18 Pin Location x36 Pin Location Name I/O Type Description U5 U5 TDO JTAG serial output Synchronous Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK. U3 U3 TDI JTAG serial input Synchronous Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK. U2 U2 TMS Test Mode Select Synchronous This pin controls the Test Access Port state machine. Sampled on the rising edge of TCK. U4 U4 TCK JTAG-Clock Clock input to the JTAG circuitry. A4, T6, T2 A4, T4, T1 16M, 32M, 64M - No connects. Reserved for address expansion. B1, B7, C1, C7, D2, D4, D7, E1, E6, F2, G1, G5, G6, H2, H7, K1, K6, L2, L3, L4, M6, N2, N7, P1, P6, R1, R7 B7, C7, D4, L4, R1, R7, T1 NC - No connects. U6 U6 DNU - Do not use pins. Document #: 38-05263 Rev. ** Page 7 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Introduction Functional Overview The CY7C1354V25/1356V25 are synchronous-pipelined Burst NoBL SRAMs designed specifically to eliminate wait states during Write/Read transitions. All synchronous inputs pass through input registers controlled by the rising edge of the clock. The clock signal is qualified with the Clock Enable input signal (CEN). If CEN is HIGH, the clock signal is not recognized and all internal states are maintained. All synchronous operations are qualified with CEN. All data outputs pass through output registers controlled by the rising edge of the clock. Maximum access delay from the clock rise (tCO) is 3.2 ns (200-MHz device). Accesses can be initiated by asserting all three Chip Enables (CE1, CE2, CE3) active at the rising edge of the clock. If Clock Enable (CEN) is active LOW and ADV/LD is asserted LOW, the address presented to the device will be latched. The access can either be a read or write operation, depending on the status of the Write Enable (WE). BWS[d:a] can be used to conduct byte write operations. Write operations are qualified by the Write Enable (WE). All writes are simplified with on-chip synchronous self-timed write circuitry. Three synchronous Chip Enables (CE1, CE2, CE3) and an asynchronous Output Enable (OE) simplify depth expansion. All operations (Reads, Writes, and Deselects) are pipelined. ADV/LD should be driven LOW once the device has been deselected in order to load a new address for the next operation. Single Read Accesses A read access is initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are ALL asserted active, (3) the Write Enable input signal WE is deasserted HIGH, and (4) ADV/LD is asserted LOW. The address presented to the address inputs is latched into the Address Register and presented to the memory core and control logic. The control logic determines that a read access is in progress and allows the requested data to propagate to the input of the output register. At the rising edge of the next clock the requested data is allowed to propagate through the output register and onto the data bus within 3.2 ns (200-MHz device) provided OE is active LOW. After the first clock of the read access the output buffers are controlled by OE and the internal control logic. OE must be driven LOW in order for the device to drive out the requested data. During the second clock, a subsequent operation (Read/Write/Deselect) can be initiated. Deselecting the device is also pipelined. Therefore, when the SRAM is deselected at clock rise by one of the chip enable signals, its output will three-state following the next clock rise. Burst Read Accesses The CY7C1354V25/1356V25 have an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four Reads without reasserting the address inputs. ADV/LD must be driven LOW in order to load a new address into the SRAM, as described in the Single Read Access section above. The sequence of the burst counter is determined by the MODE input signal. A LOW input on MODE selects a linear burst mode, a HIGH selects an interleaved burst sequence. Both burst counters use A0 and A1 in the burst Document #: 38-05263 Rev. ** sequence, and will wrap-around when incremented sufficiently. A HIGH input on ADV/LD will increment the internal burst counter regardless of the state of chip enables inputs or WE. WE is latched at the beginning of a burst cycle. Therefore, the type of access (Read or Write) is maintained throughout the burst sequence. Single Write Accesses Write access are initiated when the following conditions are satisfied at clock rise: (1) CEN is asserted LOW, (2) CE1, CE2, and CE3 are ALL asserted active, and (3) the write signal WE is asserted LOW. The address presented to A0–A16 is loaded into the Address Register. The write signals are latched into the Control Logic block. On the subsequent clock rise the data lines are automatically three-stated regardless of the state of the OE input signal. This allows the external logic to present the data on DQ and DQP (DQa,b,c,d/DPa,b for CY7C1354V25 and DQa,b/DPa,b for CY7C1356V25). In addition, the address for the subsequent access (Read/Write/Deselect) is latched into the Address Register (provided the appropriate control signals are asserted). On the next clock rise the data presented to DQ and DP (DQa,b,c,d/DPa,b for CY7C1354V25 & DQa,b/DPa,b for CY7C1356V25) (or a subset for byte write operations, see Write Cycle Description table for details) inputs is latched into the device and the write is complete. The data written during the Write operation is controlled by BWS (BWSa,b,c,d for CY7C1354V25 & BWSa,b for CY7C1356V25) signals. The CY7C1354V25/56V25 provides byte write capability that is described in the Write Cycle Description table. Asserting the Write Enable input (WE) with the selected Byte Write Select (BWS) input will selectively write to only the desired bytes. Bytes not selected during a byte write operation will remain unaltered. A Synchronous self-timed write mechanism has been provided to simplify the write operations. Byte write capability has been included in order to greatly simplify Read/Modify/Write sequences, which can be reduced to simple byte write operations. Because the CY7C1354V25/56V25 is a common I/O device, data should not be driven into the device while the outputs are active. The Output Enable (OE) can be deasserted HIGH before presenting data to the DQ and DP (DQa,b,c,d/DPa,b for CY7C1354V25 & DQa,b/DPa,b for CY7C1356V25) inputs. Doing so will three-state the output drivers. As a safety precaution, DQ and DP (DQa,b,c,d/DPa,b for CY7C1354V25 & DQa,b/DPa,b for CY7C1356V25) are automatically threestated during the data portion of a write cycle, regardless of the state of OE. Burst Write Accesses The CY7C1354V25/56V25 has an on-chip burst counter that allows the user the ability to supply a single address and conduct up to four WRITE operations without reasserting the address inputs. ADV/LD must be driven LOW in order to load the initial address, as described in the Single Write Access section above. When ADV/LD is driven HIGH on the subsequent clock rise, the chip enables (CE1, CE2, and CE3) and WE inputs are ignored and the burst counter is incremented. The correct BWS (BWSa,b,c,d for CY7C1354V25 & BWSa,b for CY7C1356V25) inputs must be driven in each cycle of the burst write in order to write the correct bytes of data. Page 8 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Cycle Description Truth Table[1, 2, 3, 4, 5, 6] Address Used Operation CE CEN ADV/ LD/ WE BWSx Deselected External 1 0 L X X L-H I/Os three-state following next recognized clock. Suspend - X 1 X X X L-H Clock ignored, all operations suspended. Begin Read External 0 0 0 1 X L-H Address latched. Begin Write External 0 0 0 0 Valid L-H Address latched, data presented two valid clocks later. Burst Read Operation Internal X 0 1 X X L-H Burst Read operation. Previous access was a Read operation. Addresses incremented internally in conjunction with the state of Mode. Burst Write Operation Internal X 0 1 X Valid L-H Burst Write operation. Previous access was a Write operation. Addresses incremented internally in conjunction with the state of MODE. Bytes written are determined by BWS[d:a]. Interleaved Burst Sequence First Address Second Address Third Address CLK Comments Linear Burst Sequence Fourth Address First Address Second Address Third Address Fourth Address A[1:0] A[1:0] A[1:0] A[1:0] A[1:0] A[1:0] A[1:0] A[1:0] 00 01 10 11 00 01 10 11 01 00 11 10 01 10 11 00 10 11 00 01 10 11 00 01 11 10 01 00 11 00 01 10 Notes: 1. X = ”don't care,” 1 = Logic HIGH, 0 = Logic LOW, CE stands for ALL Chip Enables active. BWSx = 0 signifies at least one Byte Write Select is active, BWSx = Valid signifies that the desired byte write selects are asserted, see Write Cycle Description table for details. 2. Write is defined by WE and BWSx. See Write Cycle Description table for details. 3. The DQ and DP pins are controlled by the current cycle and the OE signal. 4. CEN = 1 inserts wait states. 5. Device will power-up deselected and the I/Os in a three-state condition, regardless of OE. 6. OE assumed LOW. Document #: 38-05263 Rev. ** Page 9 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Write Cycle Description[1] Function (CY7C1354V25) WE BWSd BWSc BWSb BWSa Read 1 X X X X Write - No bytes written 0 1 1 1 1 Write Byte 0 - (DQa and DPa) 0 1 1 1 0 Write Byte 1 - (DQb and DPb) 0 1 1 0 1 Write Bytes 1, 0 0 1 1 0 0 Write Byte 2 - (DQc and DPc) 0 1 0 1 1 Write Bytes 2, 0 0 1 0 1 0 Write Bytes 2, 1 0 1 0 0 1 Write Bytes 2, 1, 0 0 1 0 0 0 Write Byte 3 - (DQd and DPd) 0 0 1 1 1 Write Bytes 3, 0 0 0 1 1 0 Write Bytes 3, 1 0 0 1 0 1 Write Bytes 3, 1, 0 0 0 1 0 0 Write Bytes 3, 2 0 0 0 1 1 Write Bytes 3, 2, 0 0 0 0 1 0 Write Bytes 3, 2, 1 0 0 0 0 1 Write All Bytes 0 0 0 0 0 WE BWSb BWSa Read 1 x x Write - No Bytes Written 0 1 1 Write Byte 0 - (DQa and DPa) 0 1 0 Write Byte 1 - (DQb and DPb) 0 0 1 Write Both Bytes 0 0 0 Function (CY7C1356V25) Document #: 38-05263 Rev. ** Page 10 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY IEEE 1149.1 Serial Boundary Scan (JTAG) The CY7C1354V25/56V25 incorporates a serial boundary scan Test Access Port (TAP) in the BGA package only. The TQFP package does not offer this functionality. This port operates in accordance with IEEE Standard 1149.1-1900, but does not have the set of functions required for full 1149.1 compliance. These functions from the IEEE specification are excluded because their inclusion places an added delay in the critical speed path of the SRAM. Note that the TAP controller functions in a manner that does not conflict with the operation of other devices using 1149.1 fully compliant TAPs. The TAP operates using JEDEC standard 2.5V I/O logic levels. Disabling the JTAG Feature It is possible to operate the SRAM without using the JTAG feature. To disable the TAP controller, TCK must be tied LOW (VSS) to prevent clocking of the device. TDI and TMS are internally pulled up and may be unconnected. They may alternately be connected to VDD through a pull-up resistor. TDO should be left unconnected. Upon power-up, the device will come up in a reset state which will not interfere with the operation of the device. Test Access Port (TAP) - Test Clock The test clock is used only with the TAP controller. All inputs are captured on the rising edge of TCK. All outputs are driven from the falling edge of TCK. Test Mode Select The TMS input is used to give commands to the TAP controller and is sampled on the rising edge of TCK. It is allowable to leave this pin unconnected if the TAP is not used. The pin is pulled up internally, resulting in a logic HIGH level. Test Data-In (TDI) The TDI pin is used to serially input information into the registers and can be connected to the input of any of the registers. The register between TDI and TDO is chosen by the instruction that is loaded into the TAP instruction register. For information on loading the instruction register, see the TAP Controller State Diagram. TDI is internally pulled up and can be unconnected if the TAP is unused in an application. TDI is connected to the Most Significant Bit (MSB) on any register. instruction registers. Data is serially loaded into the TDI pin on the rising edge of TCK. Data is output on the TDO pin on the falling edge of TCK. Instruction Register Three-bit instructions can be serially loaded into the instruction register. This register is loaded when it is placed between the TDI and TDO pins as shown in the TAP Controller Block Diagram. Upon power-up, the instruction register is loaded with the IDCODE instruction. It is also loaded with the IDCODE instruction if the controller is placed in a reset state as described in the previous section. When the TAP controller is in the CaptureIR state, the two least significant bits are loaded with a binary “01” pattern to allow for fault isolation of the board level serial test path. Bypass Register To save time when serially shifting data through registers, it is sometimes advantageous to skip certain states. The bypass register is a single-bit register that can be placed between TDI and TDO pins. This allows data to be shifted through the SRAM with minimal delay. The bypass register is set LOW (VSS) when the BYPASS instruction is executed. Boundary Scan Register The boundary scan register is connected to all the input and output pins on the SRAM. Several no connect (NC) pins are also included in the scan register to reserve pins for higher density devices. The x36 configuration has a xx-bit-long register, and the x18 configuration has a yy-bit-long register. The boundary scan register is loaded with the contents of the RAM Input and Output ring when the TAP controller is in the Capture-DR state and is then placed between the TDI and TDO pins when the controller is moved to the Shift-DR state. The EXTEST, SAMPLE/PRELOAD and SAMPLE Z instructions can be used to capture the contents of the Input and Output ring. The Boundary Scan Order tables show the order in which the bits are connected. Each bit corresponds to one of the bumps on the SRAM package. The MSB of the register is connected to TDI, and the LSB is connected to TDO. Identification (ID) Register The TDO output pin is used to serially clock data-out from the registers. The output is active depending upon the current state of the TAP state machine (see TAP Controller State Diagram). The output changes on the falling edge of TCK. TDO is connected to the Least Significant Bit (LSB) of any register. The ID register is loaded with a vendor-specific, 32-bit code during the Capture-DR state when the IDCODE command is loaded in the instruction register. The IDCODE is hardwired into the SRAM and can be shifted out when the TAP controller is in the Shift-DR state. The ID register has a vendor code and other information described in the Identification Register Definitions table. Performing a TAP Reset TAP Instruction Set A Reset is performed by forcing TMS HIGH (VDD) for five rising edges of TCK. This RESET does not affect the operation of the SRAM and may be performed while the SRAM is operating. At power-up, the TAP is reset internally to ensure that TDO comes up in a High-Z state. Eight different instructions are possible with the three-bit instruction register. All combinations are listed in the Instruction Code table. Three of these instructions are listed as RESERVED and should not be used. The other five instructions are described in detail below. TAP Registers The TAP controller used in this SRAM is not fully compliant to the 1149.1 convention because some of the mandatory 1149.1 instructions are not fully implemented. The TAP controller cannot be used to load address, data, or control signals into the SRAM and cannot preload the Input or Output buffers. The Test Data Out (TDO) Registers are connected between the TDI and TDO pins and allow data to be scanned into and out of the SRAM test circuitry. Only one register can be selected at a time through the Document #: 38-05263 Rev. ** Page 11 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY SRAM does not implement the 1149.1 commands EXTEST or INTEST or the PRELOAD portion of SAMPLE / PRELOAD; rather it performs a capture of the Inputs and Output ring when these instructions are executed. When the SAMPLE / PRELOAD instructions are loaded into the instruction register and the TAP controller is in the CaptureDR state, a snapshot of data on the inputs and output pins is captured in the boundary scan register. Instructions are loaded into the TAP controller during the ShiftIR state when the instruction register is placed between TDI and TDO. During this state, instructions are shifted through the instruction register through the TDI and TDO pins. To execute the instruction once it is shifted in, the TAP controller needs to be moved into the Update-IR state. The user must be aware that the TAP controller clock can only operate at a frequency up to 10 MHz, while the SRAM clock operates more than an order of magnitude faster. Because there is a large difference in the clock frequencies, it is possible that during the Capture-DR state, an input or output will undergo a transition. The TAP may then try to capture a signal while in transition (metastable state). This will not harm the device, but there is no guarantee as to the value that will be captured. Repeatable results may not be possible. EXTEST EXTEST is a mandatory 1149.1 instruction which is to be executed whenever the instruction register is loaded with all 0s. EXTEST is not implemented in the TAP controller, and therefore this device is not compliant to the 1149.1 standard. The TAP controller does recognize an all-0 instruction. When an EXTEST instruction is loaded into the instruction register, the SRAM responds as if a SAMPLE / PRELOAD instruction has been loaded. There is one difference between the two instructions. Unlike the SAMPLE / PRELOAD instruction, EXTEST places the SRAM outputs in a High-Z state. IDCODE The IDCODE instruction causes a vendor-specific, 32-bit code to be loaded into the instruction register. It also places the instruction register between the TDI and TDO pins and allows the IDCODE to be shifted out of the device when the TAP controller enters the Shift-DR state. The IDCODE instruction is loaded into the instruction register upon power-up or whenever the TAP controller is given a test logic reset state. To guarantee that the boundary scan register will capture the correct value of a signal, the SRAM signal must be stabilized long enough to meet the TAP controller’s capture set-up plus hold times (tCS and tCH). The SRAM clock input might not be captured correctly if there is no way in a design to stop (or slow) the clock during a SAMPLE / PRELOAD instruction. If this is an issue, it is still possible to capture all other signals and simply ignore the value of the CK and CK# captured in the boundary scan register. Once the data is captured, it is possible to shift out the data by putting the TAP into the Shift-DR state. This places the boundary scan register between the TDI and TDO pins. Note that since the PRELOAD part of the command is not implemented, putting the TAP into the Update to the UpdateDR state while performing a SAMPLE / PRELOAD instruction will have the same effect as the Pause-DR command. Bypass The SAMPLE Z instruction causes the boundary scan register to be connected between the TDI and TDO pins when the TAP controller is in a Shift-DR state. It also places all SRAM outputs into a High-Z state. When the BYPASS instruction is loaded in the instruction register and the TAP is placed in a Shift-DR state, the bypass register is placed between the TDI and TDO pins. The advantage of the BYPASS instruction is that it shortens the boundary scan path when multiple devices are connected together on a board. SAMPLE / PRELOAD Reserved SAMPLE / PRELOAD is a 1149.1 mandatory instruction. The PRELOAD portion of this instruction is not implemented, so the TAP controller is not fully 1149.1 compliant. These instructions are not implemented but are reserved for future use. Do not use these instructions. SAMPLE Z Document #: 38-05263 Rev. ** Page 12 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY TAP Controller State Diagram 1 TEST-LOGIC RESET 0 TEST-LOGIC/ IDLE 1 1 1 SELECT DR-SCAN SELECT IR-SCAN 0 0 1 1 CAPTURE-DR CAPTURE-DR 0 0 0 SHIFT-DR 0 SHIFT-IR 1 1 1 EXIT1-DR 1 EXIT1-IR 0 0 PAUSE-DR 0 0 PAUSE-IR 1 1 0 0 EXIT2-DR EXIT2-IR 1 1 UPDATE-DR 1 0 UPDATE-IR 1 0 Note: The 0/1 next to each state represents the value at TMS at the rising edge of TCK. Document #: 38-05263 Rev. ** Page 13 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY TAP Controller Block Diagram 0 Bypass Register Selection Circuitry 2 TDI 1 0 1 0 1 0 Selection Circuitry TDO Instruction Register 31 30 29 . . 2 Identification Register x . . . . 2 Boundary Scan Register TCK TAP Controller TMS TAP Electrical Characteristics Over the Operating Range[7, 8] Parameter Description Test Conditions Min. Max. Unit VOH1 Output HIGH Voltage IOH = −2.0 mA 1.7 V VOH2 Output HIGH Voltage IOH = −100 µA 2.1 V VOL1 Output LOW Voltage IOL = 2.0 mA 0.7 V VOL2 Output LOW Voltage IOL = 100 µA 0.2 V VIH Input HIGH Voltage 1.7 VDD+0.3 V VIL Input LOW Voltage −0.3 0.7 V IX Input Load Current −5 5 µA GND ≤ VI ≤ VDDQ Notes: 7. All Voltage referenced to Ground 8. Overshoot: VIH(AC)<VDD+1.5V for t<tTCYC/2, Undershoot: VIL(AC)<0.5V for t<tTCYC/2, Power-up: VIH<2.6V and VDD<2.4V and VDDQ<1.4V for t<200 ms. Document #: 38-05263 Rev. ** Page 14 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY TAP AC Switching Characteristics Over the Operating Range[9, 10] Parameter Description Min. Max Unit 10 MHz tTCYC TCK Clock Cycle Time tTF TCK Clock Frequency 100 ns tTH TCK Clock HIGH 40 ns tTL TCK Clock LOW 40 ns Set-up Times tTMSS TMS Set-up to TCK Clock Rise 10 ns tTDIS TDI Set-up to TCK Clock Rise 10 ns tCS Capture Set-up to TCK Rise 10 ns tTMSH TMS Hold after TCK Clock Rise 10 ns tTDIH TDI Hold after Clock Rise 10 ns tCH Capture Hold after clock rise 10 ns Hold Times Output Times tTDOV TCK Clock LOW to TDO Valid tTDOX TCK Clock LOW to TDO Invalid 20 0 ns ns Notes: 9. tCS and tCH refer to the set-up and hold time requirements of latching data from the boundary scan register. 10. Test conditions are specified using the load in TAP AC test conditions. tR/tF = 1 ns. Document #: 38-05263 Rev. ** Page 15 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY TAP Timing and Test Conditions 1.25V 50Ω ALL INPUT PULSES TDO 2.5V Z0 =50Ω 1.25V CL =20 pF 0V GND (a) tTH tTL Test Clock TCK tTCYC tTMSS tTMSH Test Mode Select TMS tTDIS tTDIH Test Data-In TDI Test Data-Out TDO tTDOX Document #: 38-05263 Rev. ** tTDOV Page 16 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Identification Register Definitions Instruction Field Value Description Revision Number (31:28) TBD Reserved for version number. Device Depth (27:23) TBD Defines depth of SRAM. Device Width (22:18) TBD Defines with of the SRAM. Cypress Device ID (17:12) TBD Reserved for future use. Cypress JEDEC ID (11:1) TBD Allows unique identification of SRAM vendor. ID Register Presence (0) TBD Indicate the presence of an ID register. Scan Register sizes Register Name Bit Size Instruction 3 Bypass 1 ID 32 Boundary Scan TBD Identification Codes Instruction Code Description EXTEST 000 Captures the Input/Output ring contents. Places the boundary scan register between the TDI and TDO. Forces all SRAM outputs to High-Z state. This instruction is not 1149.1 compliant. IDCODE 001 Loads the ID register with the vendor ID code and places the register between TDI and TDO. This operation does not affect SRAM operation. SAMPLE Z 010 Captures the Input/Output contents. Places the boundary scan register between TDI and TDO. Forces all SRAM output drivers to a High-Z state. RESERVED 011 Do Not Use: This instruction is reserved for future use. SAMPLE/PRELOAD 100 Captures the Input/Output ring contents. Places the boundary scan register between TDI and TDO. Does not affect the SRAM operation. This instruction does not implement 1149.1 preload function and is therefore not 1149.1 compliant. RESERVED 101 Do Not Use: This instruction is reserved for future use. RESERVED 110 Do Not Use: This instruction is reserved for future use. BYPASS 111 Places the bypass register between TDI and TDO. This operation does not affect SRAM operation. Document #: 38-05263 Rev. ** Page 17 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Boundary Scan Order Bit # Signal Name Boundary Scan Order Bump ID Bit # Signal Name Bump ID Bit # Signal Name Bump ID Bit # Signal Name Bump ID 1 TBD TBD 36 TBD TBD 71 TBD TBD TBD TBD 2 TBD TBD 37 TBD TBD 72 TBD TBD TBD TBD 3 TBD TBD 38 TBD TBD 73 TBD TBD TBD TBD 4 TBD TBD 39 TBD TBD 74 TBD TBD TBD TBD 5 TBD TBD 40 TBD TBD 75 TBD TBD TBD TBD 6 TBD TBD 41 TBD TBD 76 TBD TBD TBD TBD 7 TBD TBD 42 TBD TBD 77 TBD TBD TBD TBD 8 TBD TBD 43 TBD TBD 78 TBD TBD TBD TBD 9 TBD TBD 44 TBD TBD 79 TBD TBD TBD TBD 10 TBD TBD 45 TBD TBD 80 TBD TBD TBD TBD 11 TBD TBD 46 TBD TBD 81 TBD TBD TBD TBD 12 TBD TBD 47 TBD TBD 82 TBD TBD TBD TBD 13 TBD TBD 48 TBD TBD 83 TBD TBD TBD TBD 14 TBD TBD 49 TBD TBD 84 TBD TBD TBD TBD 15 TBD TBD 50 TBD TBD 85 TBD TBD TBD TBD 16 TBD TBD 51 TBD TBD 86 TBD TBD TBD TBD 17 TBD TBD 52 TBD TBD 87 TBD TBD TBD TBD 18 TBD TBD 53 TBD TBD 88 TBD TBD TBD TBD 19 TBD TBD 54 TBD TBD 89 TBD TBD TBD TBD 20 TBD TBD 55 TBD TBD 90 TBD TBD TBD TBD 21 TBD TBD 56 TBD TBD 91 TBD TBD TBD TBD 22 TBD TBD 57 TBD TBD 92 TBD TBD TBD TBD 23 TBD TBD 58 TBD TBD 93 TBD TBD TBD TBD 24 TBD TBD 59 TBD TBD 94 TBD TBD TBD TBD 25 TBD TBD 60 TBD TBD 95 TBD TBD TBD TBD 26 TBD TBD 61 TBD TBD 96 TBD TBD TBD TBD 27 TBD TBD 62 TBD TBD 97 TBD TBD TBD TBD 28 TBD TBD 63 TBD TBD 98 TBD TBD TBD TBD 29 TBD TBD 64 TBD TBD 99 TBD TBD TBD TBD 30 TBD TBD 65 TBD TBD 31 TBD TBD 66 TBD TBD 32 TBD TBD 67 TBD TBD 33 TBD TBD 68 TBD TBD 34 TBD TBD 69 TBD TBD 35 TBD TBD 70 TBD TBD Document #: 38-05263 Rev. ** Page 18 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Maximum Ratings Current into Outputs (LOW) ........................................ 20 mA (Above which the useful life may be impaired. For user guidelines, not tested.) Static Discharge Voltage .......................................... >2001V (per MIL-STD-883, Method 3015) Storage Temperature ..................................... −65°C to +150°C Latch-Up Current.................................................... >200 mA Ambient Temperature with Power Applied.................................................. −55°C to +125°C Operating Range Supply Voltage on VDD Relative to GND.........−0.5V to +3.6V Range DC Voltage Applied to Outputs in High Z State[12] ....................................−0.5V to VDDQ + 0.5V Com’l Ambient Temperature[11] VDD/VDDQ 0°C to +70°C 2.5V ± 5% DC Input Voltage[12] ................................−0.5V to VDDQ + 0.5V Electrical Characteristics Over the Operating Range Parameter Description Test Conditions Min. Max. Unit VDD Power Supply Voltage 2.375 2.625 V VDDQ I/O Supply Voltage 2.375 2.625 V VOH Output HIGH Voltage VOL Output LOW Voltage VIH Input HIGH Voltage VIL Input LOW Voltage[12] IX Input Load Current [13] VDD = Min., IOH = –1.0 mA 2.0 [13] VDD = Min., IOL = 1.0 mA GND ≤ VI ≤ VDDQ Output Leakage Current GND ≤ VI ≤ VDDQ, Output Disabled IDD VDD Operating Supply VDD = Max., IOUT = 0 mA, f = fMAX = 1/tCYC ISB1 Automatic CE Power-Down Current—TTL Inputs Max. VDD, Device Deselected, VIN ≥ VIH or VIN ≤ VIL f = fMAX = 1/tCYC 0.2 V 1.7 VDD + 0.3V V −0.3 0.7 V −5 5 µA −30 30 µA −5 5 µA 5-ns cycle, 200 MHz 475 mA 6-ns cycle, 166 MHz 450 mA 7.5-ns cycle, 133 MHz 320 mA 10-ns cycle, 100 MHz 300 mA 5-ns cycle, 200 MHz 90 mA 6-ns cycle, 166 MHz 80 mA 7.5-ns cycle, 133 MHz 70 mA Input Current of MODE IOZ V 10-ns cycle, 100 MHz 65 mA ISB2 Automatic CE Power-Down Current—CMOS Inputs Max. VDD, Device Deselected, VIN ≤ 0.3V or VIN > VDDQ − 0.3V, f=0 All speed grades 10 mA ISB3 Automatic CE Power-Down Current—CMOS Inputs Max. VDD, Device Deselected, or VIN ≤ 0.3V or VIN > VDDQ − 0.3V f = fMAX = 1/tCYC 5-ns cycle, 200 MHz 45 mA 6-ns cycle, 166 MHz 40 mA 7.5-ns cycle, 133 MHz 35 mA 10-ns cycle, 100 MHz 30 mA All speed grades 25 mA ISB4 Automatic CE Power-Down Current—TTL Inputs Max. VDD, Device Deselected, VIN ≥ VIH or VIN ≤ VIL, f = 0 Shaded areas contain advance information. Notes: 11. TA is the case temperature. 12. Minimum voltage equals −2.0V for pulse durations of less than 20 ns. 13. The load used for VOH and VOL testing is shown in figure (b) of the A/C test conditions. Document #: 38-05263 Rev. ** Page 19 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Capacitance[15] Parameter Description Test Conditions CIN Input Capacitance TA = 25°C, f = 1 MHz, VDD = VDDQ = 2.5V CCLK Clock Input Capacitance CI/O Input/Output Capacitance Max. Unit 4 pF 4 pF 4 pF AC Test Loads and Waveforms R=1667Ω 2.5V OUTPUT ALL INPUT PULSES OUTPUT Z0 =50Ω RL =50Ω VL = 1.25V (a) 2.5V 10% 5 pF INCLUDING JIG AND SCOPE R=1538Ω [14] 90% 10% 90% GND < 2.0 ns < 2.0 ns (c) (b) Thermal Resistance Description Thermal Resistance (Junction to Ambient) Test Conditions Symbol TQFP Typ. Units Notes Still Air, soldered on a 4.25 x 1.125 inch, 4layer printed circuit board QJA TBD °C/W 15 QJC TBD °C/W 15 Thermal Resistance (Junction to Case) Notes: 14. Input waveform should have a slew rate of > 1 V/ns. 15. Tested initially and after any design or process change that may affect these parameters. Document #: 38-05263 Rev. ** Page 20 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Switching Characteristics Over the Operating Range[16] -200 Parameter Description Min. -166 Max. Min. -133 Max. Min. -100 Max. Min. Max. Unit Clock tCYC Clock Cycle Time 5 6 FMAX Maximum Operating Frequency tCH Clock HIGH 1.4 1.7 2.0 4.0 ns tCL Clock LOW 1.4 1.7 2.0 4.0 ns 200 7.5 166 10.0 133 ns 100 MHz Output Times tCO Data Output Valid After CLK Rise tEOV OE LOW to Output Valid tDOH Data Output Hold After CLK Rise tCHZ tCLZ 1.5 [15, 16, 17, 18, 19] 1.5 [16, 17, 19] tEOHZ OE HIGH to Output High-Z tEOLZ OE LOW to Output Low-Z[16, 17, 19] 3.5 3.2 1.5 [15, 16, 17, 18, 19] Clock to High-Z Clock to Low-Z 3.2 [15, 17, 19] 3.5 1.5 3.2 4.2 1.5 3.5 1.5 3.0 4.2 1.5 1.5 ns 5.0 ns 1.5 3.5 1.5 3.3 5.0 1.5 ns 3.5 1.5 4.0 ns ns 4.8 ns 0 0 0 0 ns Set-Up Times tAS Address Set-Up Before CLK Rise 1.5 1.5 2.0 2.0 ns tDS Data Input Set-Up Before CLK Rise 1.5 1.5 2.0 2.0 ns tCENS CEN Set-Up Before CLK Rise 1.5 1.5 2.0 2.0 ns tWES WE, BWSx Set-Up Before CLK Rise 1.5 1.5 2.0 2.0 ns tALS ADV/LD Set-Up Before CLK Rise 1.5 1.5 2.0 2.0 ns tCES Chip Select Set-Up 1.5 1.5 2.0 2.0 ns tAH Address Hold After CLK Rise 0.5 0.5 0.5 0.5 ns tDH Data Input Hold After CLK Rise 0.5 0.5 0.5 0.5 ns tCENH CEN Hold After CLK Rise 0.5 0.5 0.5 0.5 ns tWEH WE, BWx Hold After CLK Rise 0.5 0.5 0.5 0.5 ns tALH ADV/LD Hold after CLK Rise 0.5 0.5 0.5 0.5 ns tCEH Chip Select Hold After CLK Rise 0.5 0.5 0.5 0.5 ns Hold Times Shaded areas contain advance information. Notes: 16. Unless otherwise noted, test conditions assume signal transition time of 2.5 ns or less, timing reference levels of 1.25V, input pulse levels of 0 to 2.5V, and output loading of the specified IOL/IOH and load capacitance. Shown in (a), (b) and (c) of AC test loads. 17. tCHZ, tCLZ, tOEV, tEOLZ, and tEOHZ are specified with AC test conditions shown in part (a) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage. 18. At any given voltage and temperature, tEOHZ is less than tEOLZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve High-Z prior to Low-Z under the same system conditions. 19. This parameter is sampled and not 100% tested. Document #: 38-05263 Rev. ** Page 21 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Switching Waveforms DESELECT DESELECT SUSPEND READ READ WRITE READ DESELECT READ READ WRITE READ/WRITE/DESELECT Sequence CLK tCH tCL tCENS tCYC tCENH CEN tAS tAH ADDRESS WE & BWSx CEN HIGH blocks all synchronous inputs WA2 RA1 RA3 RA4 WA5 RA6 RA7 tWS tWH tCES tCEH CE tCLZ tDOH DataIn/Out Q1 Out Device originally deselected tDS tDH tCHZ tCHZ tDOH D2 In Q3 Out Q4 Out D5 In Q6 Out Q7 Out tCO The combination of WE & BWSx (x = a, b, c, d for CY7C1354V25 & x = a, b for CY7C1356V25) define a write cycle (see Write Cycle Description table) CE is the combination of CE1, CE2, and CE3. All chip enables need to be active in order to select the device. Any chip enable can deselect the device. RAx stands for Read Address X, WAx Write Address X, Dx stands for Data-in for location X, Qx stands for Data-out for location X. ADV/LD held LOW. OE held LOW. = DON’T CARE Document #: 38-05263 Rev. ** = UNDEFINED Page 22 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Burst Read Burst Read Begin Read Burst Write Burst Write Burst Write Begin Write Burst Read Burst Read Burst Read Burst Sequences Begin Read Switching Waveforms (continued) CLK tALH tALS tCH tCL tCYC ADV/LD tAS tAH ADDRESS RA1 WA2 RA3 WE tWS tWH tWS tWH BWSx tCES tCEH CE DataIn/Out tCHZ tDOH tCLZ Q1 Out Device originally deselected tCO Q1+1 Out Q1+2 Out tCO tCLZ tDH Q1+3 Out D2 In D2+1 In D2+2 In Q3 Out D2+3 In tDS The combination of WE & BWSx(x = a, b c, d) define a write cycle (see Write Cycle Description table). CE is the combination of CE1, CE2, and CE3. All chip enables need to be active in order to select the device. Any chip enable can deselect the device. RAx stands for Read Address X, WA stands for Write Address X, Dx stands for Data-in for location X, Qx stands for Data-out for location X. CEN held LOW. During burst writes, byte writes can be conducted by asserting the appropriate BWSx input signals. Burst order determined by the state of the MODE input. CEN held LOW. OE held LOW. = DON’T CARE Document #: 38-05263 Rev. ** = UNDEFINED Page 23 of 27 CY7C1354V25 CY7C1356V25 PRELIMINARY Switching Waveforms (continued) OE Timing OE tEOV tEOHZ Three-State I/Os tEOLZ Ordering Information Speed (MHz) 200 Ordering Code CY7C1354V25-200AC/ CY7C1356V25-200AC CY7C1354V25-200BGC/ CY7C1356V25-200BGC 166 CY7C1354V25-166AC/ CY7C1356V25-166AC CY7C1354V25-166BGC/ CY7C1356V25-166BGC 133 CY7C1354V25-133AC/ CY7C1356V25-133AC CY7C1354V25-133BGC/ CY7C1356V25-133BGC 100 CY7C1354V25-100AC/ CY7C1356V25-100AC CY7C1354V25-100BGC/ CY7C1356V25-100BGC Package Name Package Type Operating Range A101 100-Lead 14 x 20 x 1.4 mm Thin Quad Flat Pack Commercial BG119 A101 BG119 A101 BG119 A101 BG119 119-Lead FBGA (14 x 22 x 2.4 mm) 100-Lead 14 x 20 x 1.4 mm Thin Quad Flat Pack 119-Lead FBGA (14 x 22 x 2.4 mm) 100-Lead 14 x 20 x 1.4 mm Thin Quad Flat Pack 119-Lead FBGA (14 x 22 x 2.4 mm) 100-Lead 14 x 20 x 1.4 mm Thin Quad Flat Pack 119-Lead FBGA (14 x 22 x 2.4 mm) Shaded areas contain advance information. Document #: 38-05263 Rev. ** Page 24 of 27 PRELIMINARY CY7C1354V25 CY7C1356V25 Package Diagram 100-Pin Thin Plastic Quad Flatpack (14 x 20 x 1.4 mm) A101 51-85050-A Document #: 38-05263 Rev. ** Page 25 of 27 PRELIMINARY CY7C1354V25 CY7C1356V25 Package Diagram 119-Lead PBGA (14 x 22 x 2.4 mm) BG119 51-85115-*A Document #: 38-05263 Rev. ** Page 26 of 27 © Cypress Semiconductor Corporation, 2002. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress Semiconductor product. Nor does it convey or imply any license under patent or other rights. Cypress Semiconductor does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress Semiconductor products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress Semiconductor against all charges. CY7C1354V25 CY7C1356V25 PRELIMINARY Document Title: CY7C1354V25 CY7C1356V25 256K x 36/512K x 18 Pipelined SRAM with NoBL™ Architecture Document Number: 38-05263 REV. ECN NO. Issue Date Orig. of Change ** 113924 3/8/02 DSG Document #: 38-05263 Rev. ** Description of Change Change from Spec number: 38-00762 to 38-05263 Page 27 of 27