ETC TRU2500-C

The TRU-2500 is the latest addition to Vectron International s family of high performance timing recovery
units. It extends the highly respected TRU-600 circuit
topology to 2.5 Gb/s data rates with performance optimized to exceed the most stringent SONET/SDH transmission standards.
VI s TRU-2500 regenerates clean clock and data signals from an incoming 2.488 Gb/s non-return to zero
(NRZ) data stream. The device utilizes SAW filter clock
recovery technology for superior jitter tolerance, jitter
transfer and jitter generation performance, independent
of the data pattern transition density. Output clock jitter
is exceptionally low at typically less than 2.0 ps RMS.
The clock is extracted from the NRZ data stream by
first passing it through a frequency doubler to generate
spectral energy at 2.488 GHz. A precision narrow-band
SAW filter extracts the clock and eliminates unwanted
jitter. The resulting clock is then precisely aligned at the
decision circuit to retime the input data.
The TRU2500 combines Vectron s SAW filter expertise with custom GaAs ASIC technology for high performance timing recovery applications. The circuit is
assembled on a precision ceramic hybrid and packaged in a hermetic SMD package with industry common footprint and pinout. Precision SAW filter technology assures full Bellcore compliance over all operating
conditions and eliminates the need for external tuning
or compensation.
High bit-rate SAW filter clock recovery was developed
for and has been proven in high reliability undersea links.
The timing recovery circuit must extract a clean clock
signal from an input NRZ data stream and then reclock
the data with the clock. A simplified block diagram of a
basic timing recovery circuit is shown in Fig 1.The data
retiming aspect of the design is somewhat straightforward. Recovering a clock compliant with jitter standards
and maintaining acceptable clock to data alignment at
the decision circuit are the most difficult aspect of the
design. It is this aspect of the design which VI has mastered through many years of experience.
The clock recovery process can be viewed as a bandpass filter operation, accomplished either through a
SAW filter or through the composite effect of a closed
loop system (PLL). Most clock recovery devices
employ a phase lock loop architecture, which employs
a phase detector and loop amplifier to lock a free running VCO to the input signal. At lower data rates PLL
designs provide acceptable performance, but as data
rate increase, the ability to control critical loop gain
parameters over environmental extremes becomes
exceedingly difficult.
The accuracy and stability of the bandpass characteristic determines how effectively the process will comply with stringent SONET/SDH jitter requirements.
The TRU2500 offers superior jitter transfer, jitter tolerance and jitter generation performance because its
bandpass characteristic is prescribed by a precision
quartz SAW filter which can be precisely controlled
and accurately reproduced in volume production.
The circuit architecture of the clock recovery path is
shown in Figure 2. Figure 3. illustrates the time
domain waveform and its associated frequency
domain spectrum at various points in the path. Since
the input NRZ data stream (A) has a null at the clock
frequency, non-linear processing of the signal is
required to generate spectral content at the clock rate.
The circuit uses a microstrip line to delay the data 1/2
of a bit period. The data and delayed data are then fed
through an exclusive or-gate to produce a pulse at
each data transition. This signal then has a strong
spectral peak at the desired clock rate (B) and can be
viewed in the time domain as a clock signal with missing pulses. The pulse train is then filtered and shaped
prior to the SAW filter to provide optimum performance. The SAW filters this signal to provide a continuous sine wave (C) with compliant jitter characteristics.
This signal is amplified and becomes both the output
clock and the retiming signal for the decision circuit.
Due to careful attention to pre-filtering and shaping,
SAW filter bandpass characteristics, and the elimination of feedback loop clock to data alignment control,
the TRU2500 is able to offer output jitter performance
as low as 2psRMS, a level not achieved by phase
locked loop designs.
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2
Frequency Doubler
Data In
B
C
A
Precision SAW Filter
Time
Delay
0 1
0
1
1
1
0
1
0
0
1
A
B
C
Accurate alignment of the clock within the data eye is
required for error free data retiming in the presence of
noise. The TRU-2500 uses a programmed delay line
to achieve exceptional clock to data alignment. The
delay is set at the factory to ensure generous margin
0
t
Fclk
f
Fclk
f
Fclk
f
t
t
for system specifications over a wide power supply
and temperature range for the lifetime of the product.
The decision circuit also includes CML clock and data
output buffers with 50 Ohm internal matching for easy
interface.
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Absolute maximum ratings are worst case and short duration exposure conditions. Exposure to conditions more
severe may result in permanent damage. Exposure for extended periods may also affect device performance or
reliability. Functional operation of the device is not implied at these conditions.
Supply Voltage Range
Loss of Signal Bias Voltage
VSS
-7
+0.5
V
VDD
-
7
V
-
2
W
VSS
+0.5
V
Power Dissipation
Data Output Voltage
Operating Temperature Range
TOP
-40
85
C
Storage Temperature Range
TS
-40
125
C
Maximum and minimum values are testing requirements. Typical values are characteristics of the device and are
result of engineering evaluations. Typical values are for information purposes only and are not part of the testing
requirements.
Supply Voltage
Supply Current
VSS
-4.75
-
-5.25
ISS
-
-
475
mA
DATAIN
100
-
900
mVpp
Data Output Voltage
DATAOUT
625
800
-
mVpp
Clock Output Voltage
CLKOUT
625
800
-
mVpp
TR/F
-
70
-
ps
LOS Output Signal, Low
VLOSL
-1
-
0.5
V
LOS Output Signal, High
VLOSH
VDD-0.5
-
VDD
V
Compliant with SONET/SDH Requirements
UI
Data Input Sensitivity (Differential)
Clock/Data Output Rise/Fall Time (20/80%)
V
Jitter Tolerance
JTOL
Jitter Transfer Break Point
JBW
-
-
2
MHz
Jitter Generation
JGEN
-
2
3
ps
45
50
55
%
Output Clock Duty Cycle
D
Acquisition Time
TAQ
-
350
500
ns
Clock to Data Alignment (Figure 4)
TCDA
-
40
-
ps
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Data Out
Clock Out
TCDA = 40ps Typical
SONET/ SDH standards specify jitter generation, jitter
tolerance, and jitter transfer requirements for receiver
and clock recovery elements. Jitter generation (see
figure 5.) is minimized through careful design of the
clock recovery path to minimize pattern dependent
noise on the output clock. Jitter transfer and tolerance
performance result from optimization of the SAW filter
Ch. 2
Timebase
Window 1
# Samples
= 157.0 mVolts/div
= 20.0 ps/div
= -441.56 mVolts
= 1024
bandpass characteristics. The SAW filter in the TRU2500 was specifically designed for clock recovery. It
exhibits excellent control of the passband response
and eliminates inband ripple. The filter is individually
housed in a ceramic package and is measured for
insertion loss, phase, and bandwidth. A typical
response is shown in Fig 6.
Offset
Delta Window
Delta T
Sigma
= -411.3 mVolts
= 9.8125 mVolts
= 2.0 ps
= 1.0 ps
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5
S21
(5dB/DIV)
2488.32
Frequency (MHz) 10 MHz/Div.
Optimized jitter transfer and tolerance performance is
dependent upon precise control of the filter bandwidth. The jitter transfer function is a baseband measurement of the SAW filter, or the loop filter bandwidth
for a PLL device. The specifications form a jitter mask
which limits inband jitter peaking to less than 0.01 UI
and at 2MHz. The mask then rolls off at 20 dB/dec.
Figure 7 shows the jitter transfer function for the TRU2500 at 25 C, -40 C, and +85 C.The responses show
a complete absence of jitter peaking and virtually optimum bandwidth with negligible temperature variation.
The jitter tolerance mask and the TRU2500 test
results are shown in figure 8. At the high frequency
portion of the mask, the device must run essentially
error free with 0.15 UI additional sinusoidal modulation on the input data. As the modulation frequency is
decreased approaching the filter bandwidth, jitter tolerance rises as the recovered clock starts to track the
modulation. The breakpoint frequency for this rise in
tolerance is approximately 1 MHz, this places a lower
limit on the clock recovery filter bandwidth. The combined jitter tolerance and jitter transfer requirements
restrict the filter bandwidth to the 1 to 2 MHz range,
over all conditions. The TRU2500 typically maintains
better than 0.5UI tolerance at high frequencies, due to
the SAW filter response. This is virtually impossible
for a PLL to meet at high data rates.
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6
5dB/DIV
100K
1M
10M
Jitter (UI p-p)
10
25C
-40
85C
1
0.1
100000
1000000
10000000
100000000
Fmod (Hz)
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Several parameters may be measured on a clock
recovery device to characterize its response to initial
start up and transient input data bursts. In conventional Phase Locked Loop designs an internal VCO functions as a clock source which must be synchronized
by the loop to the input data rate. The time needed to
synchronize the internal clock and provide error free
data retiming after a long period without input data
transitions is the acquisition time. The response time
to shorter time intervals with no data transitions is
sometimes referred to input blanking. A third measure
of the retiming function is the maximum run length of
ones or zeros with no errors.
Passive filter based clock recovery depends on the
selectivity or Q of the filter along with the gain of
associated amplifiers to build up a clock signal
derived directly from the input data. Evaluation of the
TRU-2500 shows that the clock signal reaches full
amplitude in about 350ns with a random data input.
Further evaluation shows that error free data is available at the output after a 250ns interval, less than
1000 data transitions. This interval may be shortened
through the use of a preamble. This acquisition time
is three orders of magnitude shorter than a comparable PLL based design. A plot comparing the recovery
time for input blanking is shown in figure 9.
A clock recovery device will provide error free performance up to a specified maximum number of consecutive ones or zeros. In a PLL design, synchronization
is lost briefly and errors occur for a short interval until
synchronization is reestablished. As the run length
increases the PLL drifts further from lock and the
error interval becomes longer. Eventually a limit is
reached where the device is starting from a maximum
frequency offset and the recovery time is the acquisition time. A PLL will output a frequency with considerable error with no data input.
The SAW filter based TRU-2500 also provides a stable output clock for a comparable time period of at
least 250ns after input data is stopped. 250ns correspond to 625 bit intervals at 2.5Gbit/s. Evaluation
shows the typical TRU-2500 can run error free with
up to 650 zeros or ones imbedded in a 2e13 random
data pattern.
Recovery Time (us)
1000
100
10
TRU-2500
1
0.1
0
200
400
600
800
1000
1200
Input Blanking (us)
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Pinout Information
The Pinout for the TRU2500 is shown in figure 10
52
NC
GND
GND
VFB
GND
GND
GND
GND
DATAIN
GND
GND
GND
GND
DATAINB
GND
GND
GND
68
NC
GND
GND
NC
GND
GND
VREF
GND
NC
GND
NC
GND
GND
LOS
GND
GND
NC
17
VI
TRU-2500
51
VTH
GND
GND
VFBN
GND
GND
GND
GND
DATAOUT
GND
GND
GND
GND
DATAOUTB
GND
GND
VSS
V108
NC
GND
GND
GND
GND
GND
GND
GND
CLKOUTB
GND
GND
GND
GND
CLKOUT
GND
GND
GND
1
35
34
18
Figure 10. Pin Diagram
Table 3. Pin Description
Pin
Symbol
7
VREF
Name/Function
Reference Voltage (Nominally-3.2V)
14
LOS
26
CLKOUT
Loss of Signal
31
CLKOUT
35
VSS
38
DATAOUT
Regenerated Data Out (-) Terminate into 50V to GND
43
DATAOUT
Regenerated Data Out (+) Terminate into 50V to GND
Recovered Clock Out (-). Terminate into 50V to GND
Recovered Clock Out (+). Terminate into 50V to GND
Supply Voltage (-5.0 V) Nominal
48
VFB
DC Feedback Voltage (-), Not Used
51
VTH
Input Threshold Voltage, (Not Typically Used)
55
DATAIN
Data Input (-) Internally AC coupled
60
DATAIN
Data Input (+) Internally AC coupled
65
VFB
DC Feedback Voltage (+), Use to Adjust Decision Threshold (Not Typically Used)
1,4,9,11,
17,18,68
NC
No Internal Connection
2,3,5,6,8
10,12,13,15
16,19,20,21
22,23,24,25,
27,28,29,30,
32,33,34,36,
37,39,40,41,
42,44,45,46,
47,49,50,52,
53,54,56,57,
58,59,61,62,
63,64,66,67,
Case
GND
Case Ground
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9
P
The TRU-2500 is designed for optimum performance
with a -5 Volt supply. Good high speed grounding and
layout practice should be employed to assure acceptable performance at this high a data rate. The device
temperature rating is specified as the case temperature. Consequently good thermal grounding will
increase the useful ambient temperature capability of
the device.
Data inputs are differential with internal AC coupling
to a 50 Ohm termination. This allows a simple interface to a variety of drive circuits, including single
ended inputs.
The TRU2500 design makes use of GaAs HBT technology to realize lower input offset levels than is
achievable with other FET designs. The extremely low
offset allows the device to operate without bias feedback and results in typical input sensitivities as low as
60 mV. Since feedback is not used, it is not necessary
VTH
to connect VTH to VFB. Since VFB has no internal
connection, VTH and VFB may be connected with no ill
effect.
The bias point for each input is accessible through the
VTH and VFB pins through 1kV resistors. Input offset
levels can be adjusted by applying a 0V to -1V bias, to
either or both of the VFB and VTH pins. This could be
accomplished by individually tying the either or both of
the inputs to -5 V through large variable (100kV) resistors. This could be used to optimize the switching
threshold for a particular system or application.
The differential outputs for clock and data are 50V
CML, as shown in Figure 12. This design has true
50V output impedance for optimum reflection coefficient and reduced sensitivity to variation in interconnect and downstream terminations. The CML output
can interface directly to devices with CML inputs, 50
Ohm to ground, or may be AC coupled to interface
with ECL, PECL.
Vss
DATAOUT DATAOUT
VFB
NC*
1k
50
Programable
Delay
D
D
DATAIN
C
DATAIN
C
50
CLKOUT
Clock
Recovery
1k
CLKOUT
VFB
Voltage
Reference
Vref
Transition
Detector
10K
LOS
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10
50
50
Out
Out
In
In
lb
VSS
Although protection circuitry has been designed into
this device, proper precautions should be taken to
avoid exposure to electrostatic discharge (ESD) during
handling and mounting. VI employs a human-body
model (HBM) and a charged-device model (CDM) for
ESD-susceptibility testing and protection design evaluation. ESD voltage thresholds are dependent on the
circuit parameters used to define the mode.
Although no industry-wide standard has been adopted
for the CDM, a standard HBM (resistance = 1500V,
capacitance = 100pF) is widely used and therefore
can be used for comparison purposes. The HBM ESD
threshold presented here was obtained by using
these circuit parameters.
Human-Body (HBM)
500*
V min.
Charged-Device
200
V min.
* Mil-STD-883D, Method 3015, Class 1
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11
68 Pin surface mount package
Dimmensions are in inches
1.180
.590
68
52
51
1
.050
35
17
.015
34
18
1.370
1/12
.010
0.190 max
T
Vectron International reserves the right to make changes to the product(s) and/or information contained herein without notice.
No liability is assumed as a result of their use or application. No rights under any patent accompany the sale of any such product(s) or information.
Printed in USA 1/99.