ETC ULN2804AN

ULN2804A
DARLINGTON TRANSISTOR ARRAY
SLLS311 – JUNE 1998
HIGH-VOLTAGE, HIGH-CURRENT DARLINGTON TRANSISTOR ARRAY
D
D
D
D
D
D
500-mA-Rated Collector Current (Single
Output)
High-Voltage Outputs . . . 50 V
Output Clamp Diodes
Inputs Compatible With Various Types of
Logic
Relay Driver Applications
Compatible With ULN2800A-Series
N DUAL-IN-LINE PACKAGE
(TOP VIEW)
1C
18
2C
17
3C
16
4C
15
5C
14
6C
13
7C
12
8C COM
11 10
1
2
3
4
5
6
7
8
1B
2B
3B
4B
5B
6B
7B
8B GND
9
description
The ULN2804A is a monolithic high-voltage, high-current Darlington transistor array, comprising eight npn
Darlington pairs. All units feature high-voltage outputs with common-cathode clamp diodes for switching
inductive loads. The collector-current rating of each Darlington pair is 500 mA. Outputs and inputs can each be
paralleled for higher current capability.
Applications include relay drivers, hammer drivers, lamp drivers, display drivers (LED and gas discharge), line
drivers, and logic buffers.
The ULN2804A has an approximate 10.5-kΩ series input resistor to allow its operation directly from CMOS or
PMOS, utilizing supply voltages of 6 to 15 volts.
The ULN2804A is characterized for operation from –20°C to 85°C.
schematic (each Darlington pair)
COM
10.5k
Output C
Input B
7.2k
3k
E
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright  1998, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
1
ULN2804A
DARLINGTON TRANSISTOR ARRAY
SLLS311 – JUNE 1998
absolute maximum ratings at 25°C free-air temperature (unless otherwise noted)
Collector-emitter voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 V
Input voltage (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 V
Continuous collector current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500 mA
Output clamp diode current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500 mA
Total substrate-terminal current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –2.5 A
Continuous dissipation (total package) at (or below) 25°C free air temperature (see Note 2) . . . . . 1150 mW
Operating free-air temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –20°C to 85°C
Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
Lead temperature 1/16 inch from case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C
NOTES: 1. All voltages values, unless otherwise noted, are with respect to the emitter/substrate terminal E.
2. For operation above 25°C free-air temperature, refer to the Dissipation Derating Curves in the Thermal Information section.
electrical characteristics at 25°C free-air temperature (unless otherwise noted)
PARAMETER
TEST
FIGURE
1
ICEX
Collector cutoff current
II(off)
Off-state input current
II(ON)
(
)
Input current
2
3
4
TEST CONDITIONS
VCE = 50 V,
TA = 70°C, VI = 1 V,
VCE = 50 V
VCE(sat)
( )
On state input voltage
On-state
Collector-emitter
C
ll t
itt saturation
t ti
voltage
6
IR
VF
Clamp-diode reverse current
7
Clamp-diode forward voltage
8
Ci
Input capacitance
TYP
500
50
VCE = 2 V,
VCE = 2 V,
II = 350 µA,
II = 500 µA,
µA
0.35
0.5
1.0
1.45
mA
5
6
IC = 250 mA
IC = 275 mA
7
IC = 300 mA
IC = 350 mA
8
IC = 100 mA
IC = 200 mA
0.9
1.1
1.0
1.3
IC = 350 mA
1.3
1.6
VR = 50 V
IF = 350 mA
50
VI = 0 V,
UNIT
µA
65
IC = 125 mA
IC = 200 mA
VCE = 2 V,
VCE = 2 V,
MAX
50
VI = 3.85 V
VI = 5 V
VCE = 2 V,
II = 250 µA,
5
MIN
II = 0
VCE = 50 V, IC = 500 µA,
TA = 70°C
VI = 12 V
VCE = 2 V,
VI(
I(on))
ULN2804A
f = 1 MHz
V
V
µA
1.7
2
V
15
25
pF
TYP
MAX
0.25
1
µs
0.25
1
µs
switching characteristics at 25°C free-air temperature
PARAMETER
2
TEST CONDITIONS
tPLH
tPHL
Propagation delay time, low- to high-level output
VOH
High-level output voltage after switching
Propagation delay time, high- to low-level output
MIN
See Figure 9
VS = 50 V, IO = 300 mA, See Figure 10
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• DALLAS, TEXAS 75265
VS – 20
UNIT
mV
ULN2804A
DARLINGTON TRANSISTOR ARRAY
SLLS311 – JUNE 1998
PARAMETER MEASUREMENT INFORMATION
Open VCE
Open VCE
ICEX
ICEX
Open
VI
Figure 1. ICEX
Figure 2. ICEX
Open VCE
Open
IC
II(off)
II
VI
Figure 3. II(off)
Figure 4. II(on)
Open
h FE
II
Open
+ II
Open
C
I
IC
IC
VI
VCE
VCE
Figure 5. hFE, VCE(sat)
Figure 6. VI(on)
VR
IR
Open
IF
VF
Open
Figure 7. IR
Figure 8. VF
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
3
ULN2804A
DARLINGTON TRANSISTOR ARRAY
SLLS311 – JUNE 1998
PARAMETER MEASUREMENT INFORMATION
Input
Open
VS = 50 V
RL = 163 Ω
Pulse
Generator
(see Note A)
Output
CL = 15 pF
(see Note B)
TEST CIRCUITS
Input
50%
50%
tPHL
Output
50%
VOLTAGE WAVEFORMS
NOTES: A. The pulse generator has the following characteristics: PRR = 12.5 KHz, ZO = 50 Ω.
B. CL includes probe and jig capacitance.
Figure 9. Propagation Delay Times
4
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
tPLH
50%
ULN2804A
DARLINGTON TRANSISTOR ARRAY
SLLS311 – JUNE 1998
PARAMETER MEASUREMENT INFORMATION
VS
2 mH
Input
200 Ω
Pulse
Generator
(See Note A)
Output
2804A
CL = 15 pF
(see Note B)
< 5 ns
Input
10%
90%
1.5 V
< 10 ns
90%
1.5 V
VIH
(see Note C)
10%
0V
40 µs
VOH
Output
VOLTAGE WAVEFORMS
NOTES: A. The pulse generator has the following characteristics: PRR = 12.5 kHz, Zout = 50 Ω.
B. CL includes probe and jig capacitance.
C. VIH = 8 V
Figure 10. Latch-Up Test
POST OFFICE BOX 655303
• DALLAS, TEXAS 75265
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accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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Copyright  1998, Texas Instruments Incorporated