ETC 74LVQ573QSCX

Revised June 2001
74LVQ573
Low Voltage Octal Latch with 3-STATE Outputs
General Description
Features
The LVQ573 is a high-speed octal latch with buffered common Latch Enable (LE) and buffered common Output
Enable (OE) inputs. The LVQ573 is functionally identical to
the LVQ373 but with inputs and outputs on opposite sides
of the package.
■ Ideal for low power/low noise 3.3V applications
■ Implements patented EMI reduction circuitry
■ Available in SOIC JEDEC, SOIC EIAJ, and QSOP
packages
■ Guaranteed simultaneous switching noise level
and dynamic threshold performance
■ Improved latch-up immunity
■ Guaranteed incident wave switching into 75Ω
■ 4 kV minimum ESD immunity
Ordering Code:
Order Number
74LVQ573SC
74LVQ573SJ
74LVQ573QSC
Package Number
M20B
Package Description
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
M20D
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
MQA20
20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150" Wide
Devices also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering code.
Logic Symbols
Connection Diagram
IEEE/IEC
Truth Table
Inputs
Pin Descriptions
Pin Names
D0–D7
Description
Data Inputs
LE
Latch Enable Input
OE
3-STATE Output Enable Input
O0–O7
3-STATE Latch Outputs
© 2001 Fairchild Semiconductor Corporation
DS011361
Outputs
OE
LE
D
On
L
H
H
H
L
H
L
L
L
L
X
O0
H
X
X
Z
H = HIGH Voltage
L = LOW Voltage
Z = High Impedance
X = Immaterial
O0 = Previous O0 before HIGH-to-LOW transition of Latch Enable
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74LVQ573 Low Voltage Octal Latch with 3-STATE Outputs
February 1992
74LVQ573
Functional Description
D-type inputs a setup time preceding the HIGH-to-LOW
transition of LE. The 3-STATE buffers are controlled by the
Output Enable (OE) input. When OE is LOW, the buffers
are enabled. When OE is HIGH the buffers are in the high
impedance mode but this does not interfere with entering
new data into the latches.
The LVQ573 contains eight D-type latches with 3-STATE
output buffers. When the Latch Enable (LE) input is HIGH,
data on the Dn inputs enters the latches. In this condition
the latches are transparent, i.e., a latch output will change
state each time its D-type input changes. When LE is LOW
the latches store the information that was present on the
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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2
Supply Voltage (VCC)
Recommended Operating
Conditions (Note 2)
−0.5V to +7.0V
DC Input Diode Current (IIK)
Supply Voltage (VCC)
VI = −0.5V
−20 mA
Input Voltage (VI)
VI = VCC + 0.5V
+20 mA
Output Voltage (VO)
DC Input Voltage (VI)
−0.5V to VCC + 0.5V
0V to VCC
−40°C to +85°C
Minimum Input Edge Rate (∆V/∆t)
VO = −0.5V
−20 mA
VIN from 0.8V to 2.0V
VO = VCC + 0.5V
+20 mA
VCC @ 3.0V
125 mV/ns
−0.5V to VCC + 0.5V
DC Output Source
Note 1: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum ratings.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
±50 mA
or Sink Current (IO)
DC VCC or Ground
±400 mA
Current (ICC or IGND)
Storage Temperature (TSTG)
0V to VCC
Operating Temperature (TA)
DC Output Diode Current (IOK)
DC Output Voltage (VO)
2.0V to 3.6V
−65°C to +150°C
Note 2: Unused inputs must be held HIGH or LOW. They may not float.
DC Latch-Up Source or
±300 mA
Sink Current
DC Electrical Characteristics
Symbol
VIH
Parameter
Minimum High Level
Input Voltage
VIL
Maximum Low Level
Input Voltage
VOH
Minimum High Level
Output Voltage
VOL
Maximum Low Level
Output Voltage
TA = +25°C
VCC
TA = −40°C to +85°C
Units
(V)
Typ
3.0
1.5
2.0
2.0
V
3.0
1.5
0.8
0.8
V
3.0
2.99
2.9
2.9
V
3.0
3.0
2.58
2.48
V
0.1
0.1
V
0.002
IOUT = −50 µA
VIN = VIL or VIH (Note 3)
IOH = −12 mA
IOUT = 50 µA
VIN = VIL or VIH (Note 3)
0.44
V
±0.1
±1.0
µA
VI = VCC, GND
VOLD = 0.8 VMax (Note 5)
3.6
IOLD
Minimum Dynamic
3.6
36
mA
IOHD
Output Current (Note 4)
3.6
−25
mA
ICC
Maximum Quiescent
3.6
4.0
40.0
µA
3.6
±0.25
±2.5
µA
IOL = 12 mA
VOHD = 2.0V VMin (Note 5)
VIN = VCC
or GND
VI (OE) = V IL, VIH
3-STATE
Leakage Current
VOUT = 0.1V
or VCC − 0.1V
0.36
Maximum Input Leakage Current
IOZ
VOUT = 0.1V
or VCC − 0.1V
3.0
IIN
Supply Current
Conditions
Guaranteed Limits
VI = VCC, GND
VO = VCC, GND
VOLP
Quiet Output
Maximum Dynamic VOL
3.3
0.4
0.8
V
(Note 6)(Note 7)
VOLV
Quiet Output
Minimum Dynamic VOL
3.3
−0.4
−0.8
V
(Note 6)(Note 7)
VIHD
Maximum High Level
Dynamic Input Voltage
3.3
1.6
2.0
V
(Note 6)(Note 8)
VILD
Maximum Low Level
Dynamic Input Voltage
3.3
1.6
0.8
V
(Note 6)(Note 8)
Note 3: All outputs loaded; thresholds on input associated with output under test.
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.
Note 5: Incident wave switching on transmission lines with impedances as low as 75Ω for commercial temperature range is guaranteed for.
Note 6: Worst case package.
Note 7: Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V; one output at GND.
Note 8: Max number of Data Inputs (n) switching. (n − 1) inputs switching 0V to 3.3V. Input-under-test switching: 3.3V to threshold (VILD), 0V to threshold
(VIHD), f = 1 MHz.
3
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74LVQ573
Absolute Maximum Ratings(Note 1)
74LVQ573
AC Electrical Characteristics
TA = +25°C
Symbol
Parameter
tPHL
Propagation Delay
tPLH
Dn to On
tPLH
Propagation Delay
tPHL
LE to On
tPZL
Output Enable Time
tPZH
tPHZ
Output Disable Time
tPLZ
tOSHL
Output to Output Skew (Note 9)
tOSLH
Dn to On
TA = −40°C to +85°C
CL = 50 pF
VCC
CL = 50 pF
(V)
Min
Typ
Max
Min
Max
2.7
2.5
10.2
14.8
2.5
16.0
3.3 ± 0.3
2.5
8.5
10.5
2.5
11.0
2.7
2.5
10.2
16.9
2.5
18.0
3.3 ± 0.3
2.5
8.5
12.0
2.5
12.5
2.7
2.5
10.2
18.3
2.5
19.0
3.3 ± 0.3
2.5
8.5
13.0
2.5
13.5
2.7
1.0
10.8
20.4
1.0
21.0
3.3 ± 0.3
1.0
9.0
14.5
1.0
15.0
2.7
1.0
1.5
1.5
3.3 ± 0.3
1.0
1.5
1.5
Units
ns
ns
ns
ns
ns
Note 9: Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The
specification applies to any outputs switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design.
AC Operating Requirements
TA = +25°C
Symbol
Parameter
(V)
tS
Setup Time, HIGH or LOW
Dn to LE
tH
Hold Time, HIGH or LOW
Dn to LE
tW
LE Pulse Width, HIGH
TA = −40°C to +85°C
CL = 50 pF
VCC
Typ
CL = 50 pF
2.7
0
4.0
4.5
3.3 ± 0.3
0
3.0
3.0
2.7
0
1.5
1.5
3.3 ± 0.3
0
1.5
1.5
2.7
2.4
5.0
6.0
3.3 ± 0.3
2.0
4.0
4.0
Capacitance
Symbol
Parameter
Typ
Units
CIN
Input Capacitance
4.5
pF
VCC = Open
CPD (Note 10)
Power Dissipation Capacitance
37
pF
VCC = 3.3V
Note 10: CPD is measured at 10 MHz.
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4
Units
Guaranteed Minimum
Conditions
ns
ns
ns
74LVQ573
Physical Dimensions inches (millimeters) unless otherwise noted
20-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300" Wide
Package Number M20B
5
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74LVQ573
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M20D
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6
74LVQ573 Low Voltage Octal Latch with 3-STATE Outputs
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
20-Lead Quarter Size Outline Package (QSOP), JEDEC MO-137, 0.150" Wide
Package Number MQA20
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
body, or (b) support or sustain life, and (c) whose failure
to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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