SCAN921023 and SCAN921224 20-66 MHz 10 Bit Bus LVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST General Description The SCAN921023 transforms a 10-bit wide parallel LVCMOS/LVTTL data bus into a single high speed Bus LVDS serial data stream with embedded clock. The SCAN921224 receives the Bus LVDS serial data stream and transforms it back into a 10-bit wide parallel data bus and recovers parallel clock. Both devices are compliant with IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture with the incorporation of the defined boundary-scan test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), Test Clock (TCK), and the optional Test Reset (TRST). IEEE 1149.1 features provide the designer or test engineer access to the backplane or cable interconnects and the ability to verify differential signal integrity to enhance their system test strategy. The pair of devices also features an at-speed BIST mode which allows the interconnects between the Serializer and Deserializer to be verified at-speed. The SCAN921023 transmits data over backplanes or cable. The single differential pair data path makes PCB design easier. In addition, the reduced cable, PCB trace count, and connector size tremendously reduce cost. Since one output transmits clock and data bits serially, it eliminates clock-todata and data-to-data skew. The powerdown pin saves power by reducing supply current when not using either device. Upon power up of the Serializer, you can choose to activate synchronization mode or allow the Deserializer to use the synchronization-to-random-data feature. By using the synchronization mode, the Deserializer will establish lock to a signal within specified lock times. In addition, the embedded clock guarantees a transition on the bus every 12-bit cycle. This eliminates transmission errors due to charged cable conditions. Furthermore, you may put the SCAN921023 output pins into TRI-STATE to achieve a high impedance state. The PLL can lock to frequencies between 20 MHz and 66 MHz. Features n IEEE 1149.1 (JTAG) Compliant and At-Speed BIST test mode. n Clock recovery from PLL lock to random data patterns. n Guaranteed transition every data transfer cycle n Chipset (Tx + Rx) power consumption < 500 mW (typ) @ 66 MHz n Single differential pair eliminates multi-channel skew n Flow-through pinout for easy PCB layout n 660 Mbps serial Bus LVDS data rate (at 66 MHz clock) n 10-bit parallel interface for 1 byte data plus 2 control bits n Synchronization mode and LOCK indicator n Programmable edge trigger on clock n High impedance on receiver inputs when power is off n Bus LVDS serial output rated for 27Ω load n Small 49-lead BGA package Block Diagrams DS200001-1 © 2001 National Semiconductor Corporation DS200001 www.national.com SCAN921023/SCAN921224 20-66 MHz 10 Bit BLVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST April 2001 SCAN921023/SCAN921224 Block Diagrams (Continued) Application DS200001-2 The user’s application determines control of the SYNC1 and SYNC 2 pins. One recommendation is a direct feedback loop from the LOCK pin. Under all circumstances, the Serializer stops sending SYNC patterns after both SYNC inputs return low. When the Deserializer detects edge transitions at the Bus LVDS input, it will attempt to lock to the embedded clock information. When the Deserializer locks to the Bus LVDS clock, the LOCK output will go low. When LOCK is low, the Deserializer outputs represent incoming Bus LVDS data. Functional Description The SCAN921023 and SCAN921224 are a 10-bit Serializer and Deserializer chipset designed to transmit data over differential backplanes at clock speeds from 20 to 66 MHz. The chipset is also capable of driving data over Unshielded Twisted Pair (UTP) cable. The chipset has three active states of operation: Initialization, Data Transfer, and Resynchronization; and two passive states: Powerdown and TRI-STATE. In addition to the active and passive states, there are also test modes for JTAG access and at-speed BIST. The following sections describe each operation and passive state and the test modes. Data Transfer After initialization, the Serializer will accept data from inputs DIN0–DIN9. The Serializer uses the TCLK input to latch incoming Data. The TCLK_R/F pin selects which edge the Serializer uses to strobe incoming data. TCLK_R/F high selects the rising edge for clocking data and low selects the falling edge. If either of the SYNC inputs is high for 5*TCLK cycles, the data at DIN0-DIN9 is ignored regardless of clock edge. After determining which clock edge to use, a start and stop bit, appended internally, frame the data bits in the register. The start bit is always high and the stop bit is always low. The start and stop bits function as the embedded clock bits in the serial stream. The Serializer transmits serialized data and clock bits (10+2 bits) from the serial data output (DO ± ) at 12 times the TCLK frequency. For example, if TCLK is 66 MHz, the serial rate is 66 x 12 = 792 Mega-bits-per-second. Since only 10 bits are from input data, the serial “payload” rate is 10 times the TCLK frequency. For instance, if TCLK = 66 MHz, the payload data rate is 66 x 10 = 660 Mbps. The data source provides TCLK and must be in the range of 20 MHz to 66 MHz nominal. The Serializer outputs (DO ± ) can drive a point-to-point connection or in limited multi-point or multi-drop backplanes. The outputs transmit data when the enable pin (DEN) is high, PWRDN = high, and SYNC1 and SYNC2 are low. When DEN is driven low, the Serializer output pins will enter TRI-STATE. When the Deserializer synchronizes to the Serializer, the LOCK pin is low. The Deserializer locks to the embedded Initialization Initialization of both devices must occur before data transmission begins. Initialization refers to synchronization of the Serializer and Deserializer PLL’s to local clocks, which may be the same or separate. Afterwards, synchronization of the Deserializer to Serializer occurs. Step 1: When you apply VCC to both Serializer and/or Deserializer, the respective outputs enter TRI-STATE, and on-chip power-on circuitry disables internal circuitry. When VCC reaches VCCOK (2.5V) the PLL in each device begins locking to a local clock. For the Serializer, the local clock is the transmit clock (TCLK) provided by the source ASIC or other device. For the Deserializer, you must apply a local clock to the REFCLK pin. The Serializer outputs remain in TRI-STATE while the PLL locks to the TCLK. After locking to TCLK, the Serializer is now ready to send data or SYNC patterns, depending on the levels of the SYNC1 and SYNC2 inputs or a data stream. The SYNC pattern sent by the Serializer consists of six ones and six zeros switching at the input clock rate. Note that the Deserializer LOCK output will remain high while its PLL locks to the incoming data or to SYNC patterns on the input. Step 2: The Deserializer PLL must synchronize to the Serializer to complete initialization. The Deserializer will lock to non-repetitive data patterns. However, the transmission of SYNC patterns enables the Deserializer to lock to the Serializer signal within a specified time. See Figure 9. www.national.com 2 the serial data stream. Graphical representations of RMT are shown in Figure 1. Please note that RMT only applies to bits DIN0-DIN8. (Continued) clock and uses it to recover the serialized data. ROUT data is valid when LOCK is low. Otherwise ROUT0–ROUT9 is invalid. Powerdown The ROUT0-ROUT9 pins use the RCLK pin as the reference to data. The polarity of the RCLK edge is controlled by the RCLK_R/F input. See Figure 13. When no data transfer occurs, you can use the Powerdown state. The Serializer and Deserializer use the Powerdown state, a low power sleep mode, to reduce power consumption. The Deserializer enters Powerdown when you drive PWRDN and REN low. The Serializer enters Powerdown when you drive PWRDN low. In Powerdown, the PLL stops and the outputs enterTRI-STATE, which disables load current and reduces supply current to the milliampere range. To exit Powerdown, you must drive the PWRDN pin high. ROUT(0-9), LOCK and RCLK outputs will drive a maximum of three CMOS input gates (15 pF load) with a 66 MHz clock. Resynchronization When the Deserializer PLL locks to the embedded clock edge, the Deserializer LOCK pin asserts a low. If the Deserializer loses lock, the LOCK pin output will go high and the outputs (including RCLK) will enter TRI-STATE. The user’s system monitors the LOCK pin to detect a loss of synchronization. Upon detection, the system can arrange to pulse the Serializer SYNC1 or SYNC2 pin to resynchronize. Multiple resynchronization approaches are possible. One recommendation is to provide a feedback loop using the LOCK pin itself to control the sync request of the Serializer (SYNC1 or SYNC2). Dual SYNC pins are provided for multiple control in a multi-drop application. Sending sync patterns for resynchronization is desirable when lock times within a specific time are critical. However, the Deserializer can lock to random data, which is discussed in the next section. Before valid data exchanges between the Serializer and Deserializer, you must reinitialize and resynchronize the devices to each other. Initialization of the Serializer takes 510 TCLK cycles. The Deserializer will initialize and assert LOCK high until lock to the Bus LVDS clock occurs. TRI-STATE The Serializer enters TRI-STATE when the DEN pin is driven low. This puts both driver output pins (DO+ and DO−) into TRI-STATE. When you drive DEN high, the Serializer returns to the previous state, as long as all other control pins remain static (SYNC1, SYNC2, PWRDN, TCLK_R/F). When you drive the REN pin low, the Deserializer enters TRI-STATE. Consequently, the receiver output pins (ROUT0–ROUT9) and RCLK will enter TRI-STATE. The LOCK output remains active, reflecting the state of the PLL. Random Lock Initialization and Resynchronization TABLE 1. The initialization and resynchronization methods described in their respective sections are the fastest ways to establish the link between the Serializer and Deserializer. However, the SCAN921224 can attain lock to a data stream without requiring the Serializer to send special SYNC patterns. This allows the SCAN921224 to operate in “open-loop” applications. Equally important is the Deserializer’s ability to support hot insertion into a running backplane. In the open loop or hot insertion case, we assume the data stream is essentially random. Therefore, because lock time varies due to data stream characteristics, we cannot possibly predict exact lock time. However, please see Table 1 for some general random lock times under specific conditions. The primary constraint on the “random” lock time is the initial phase relation between the incoming data and the REFCLK when the Deserializer powers up. As described in the next paragraph, the data contained in the data stream can also affect lock time. If a specific pattern is repetitive, the Deserializer could enter “false lock” - falsely recognizing the data pattern as the clocking bits. We refer to such a pattern as a repetitive multi-transition, RMT. This occurs when more than one Low-High transition takes place in a clock cycle over multiple cycles. This occurs when any bit, except DIN 9, is held at a low state and the adjacent bit is held high, creating a 0-1 transition. In the worst case, the Deserializer could become locked to the data pattern rather than the clock. Circuitry within the SCAN921224 can detect that the possibility of “false lock” exists. The circuitry accomplishes this by detecting more than one potential position for clocking bits. Upon detection, the circuitry will prevent the LOCK output from becoming active until the potential “false lock” pattern changes. The false lock detect circuitry expects the data will eventually change, causing the Deserializer to lose lock to the data pattern and then continue searching for clock bits in Random Lock Times for the SCAN921224 66 MHz Units Maximum 18 µS Mean 3.0 µS Minimum 0.43 µS Conditions: 15 PRBS 2 , VCC = 3.3V 1) Difference in lock times are due to different starting points in the data pattern with multiple parts. Test Modes In addition to the IEEE 1149.1 test access to the digital TTL pins, the SCAN921023 and SCAN921224 have two instructions to test the LVDS interconnects. The first is EXTEST. This is implemented at LVDS levels and is only intended as a go no-go test (e.g. missing cables). The second method is the RUNBIST instruction. It is an ″at-system-speed″ interconnect test. It is executed in approximately 33mS with a system clock speed of 66MHz. There are two bits in the RX BIST data register for notification of PASS/FAIL and TEST_COMPLETE. Pass indicates that the BER (Bit-ErrorRate) is better than 10-7. An important detail is that once both devices have the RUNBIST instruction loaded into their respective instruction registers, both devices must move into the RTI state within 4K system clocks (At a SCLK of 66Mhz and TCK of 1MHz this allows for 66 TCK cycles). This is not a concern when both devices are on the same scan chain or LSP, however, it can be a problem with some multi-drop devices. This test mode has been simulated and verified using National’s SCANSTA111. 3 www.national.com SCAN921023/SCAN921224 Data Transfer SCAN921023/SCAN921224 Ordering Information NSID Function Package SCAN921023SLC Serializer SLC49a SCAN921224SLC Deserializer SLC49a DS200001-24 DIN0 Held Low-DIN1 Held High Creates an RMT Pattern DS200001-25 DIN4 Held Low-DIN5 Held High Creates an RMT Pattern DS200001-26 DIN8 Held Low-DIN9 Held High Creates an RMT Pattern FIGURE 1. RMT Patterns Seen on the Bus LVDS Serial Output www.national.com 4 Package Derating: If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. 11.8 mW/˚C above +25˚C 85˚C/W 49L BGA θja ESD Rating HBM MM Supply Voltage (VCC) −0.3V to +4V LVCMOS/LVTTL Input Voltage −0.3V to (VCC +0.3V) LVCMOS/LVTTL Output Voltage −0.3V to (VCC +0.3V) Bus LVDS Receiver Input Voltage −0.3V to +3.9V Bus LVDS Driver Output Voltage −0.3V to +3.9V Bus LVDS Output Short Circuit Duration 10mS Junction Temperature +150˚C Storage Temperature −65˚C to +150˚C Lead Temperature (Soldering, 4 seconds) +260˚C Maximum Package Power Dissipation Capacity @ 25˚C Package: 49L BGA 1.47 W > 2kV 250V Recommended Operating Conditions Min Nom Max Units Supply Voltage (VCC) 3.0 3.3 3.6 V Operating Free Air Temperature (TA) −40 +25 +85 ˚C 2.4 V Receiver Input Range 0 Supply Noise Voltage (VCC) 100 mVP-P Electrical Characteristics Over recommended operating supply and temperature ranges unless otherwise specified. Symbol Parameter Conditions Min Typ Max Units SERIALIZER LVCMOS/LVTTL DC SPECIFICATIONS (apply to DIN0-9, TCLK, PWRDN, TCLK_R/F, SYNC1, SYNC2, DEN) VIH High Level Input Voltage 2.0 VCC V VIL Low Level Input Voltage GND 0.8 V VCL Input Clamp Voltage ICL = −18 mA IIN Input Current VIN = 0V or 3.6V −10 -0.86 −1.5 V ±1 +10 µA DESERIALIZER LVCMOS/LVTTL DC SPECIFICATIONS (apply to pins PWRDN, RCLK_R/ F, REN, REFCLK = inputs; apply to pins ROUT, RCLK, LOCK = outputs) VIH High Level Input Voltage 2.0 VCC V 0.8 V VIL Low Level Input Voltage VCL Input Clamp Voltage ICL = −18 mA IIN Input Current VIN = 0V or 3.6V IILR Input Current, TMS, TDI, TRST inputs VIN = 0V or 3.6V VOH High Level Output Voltage IOH = −9 mA 2.2 3.0 VCC V VOL Low Level Output Voltage IOL = 9 mA GND 0.25 0.5 V VOUT = 0V −15 −47 −85 mA -15 -70 -100 mA −10 ± 0.1 +10 µA 200 290 IOS Output Short Circuit Current IOS Output Short Circuit Current, TDO output IOZ TRI-STATE Output Current GND PWRDN or REN = 0.8V, VOUT = 0V or VCC −0.62 −1.5 V −10 ±1 +15 µA -20 -10 µA SERIALIZER Bus LVDS DC SPECIFICATIONS (apply to pins DO+ and DO−) RL = 27Ω, Figure 18 VOD Output Differential Voltage (DO+)–(DO−) ∆VOD Output Differential Voltage Unbalance VOS Offset Voltage ∆VOS Offset Voltage Unbalance IOS Output Short Circuit Current D0 = 0V, DIN = High,PWRDN and DEN = 2.4V IOZ TRI-STATE Output Current PWRDN or DEN = 0.8V, DO = 0V or VCC −10 IOX Power-Off Output Current VCC = 0V, DO=0V or 3.6V −20 1.05 5 1.1 mV 35 mV 1.3 V 4.8 35 mV −56 −90 mA ±1 ±1 +10 µA +25 µA www.national.com SCAN921023/SCAN921224 Absolute Maximum Ratings (Note 1) SCAN921023/SCAN921224 Electrical Characteristics (Continued) Over recommended operating supply and temperature ranges unless otherwise specified. Symbol Parameter Conditions Min Typ Max Units +6 +50 mV DESERIALIZER Bus LVDS DC SPECIFICATIONS (apply to pins RI+ and RI−) VTH Differential Threshold High Voltage VTL Differential Threshold Low Voltage IIN Input Current VCM = +1.1V −50 −12 mV VIN = +2.4V, VCC = 3.6V or 0V −10 ±1 +15 µA VIN = 0V, VCC = 3.6V or 0V −10 ± 0.05 +10 µA SERIALIZER SUPPLY CURRENT (apply to pins DVCC and AVCC) ICCD ICCXD Serializer Supply Current RL = 27Ω f = 20 MHz 47 60 mA Worst Case Figure 2 f = 66 MHz 75 90 mA Serializer Supply Current Powerdown PWRDN = 0.8V 47 500 µA DESERIALIZER SUPPLY CURRENT (apply to pins DVCC and AVCC) ICCR Deserializer Supply Current ICCXR CL = 15 pF f = 20 MHz 58 75 mA Worst Case Figure 3 f = 66 MHz 110 130 mA Deserializer Supply Current Powerdown PWRDN = 0.8V, REN = 0.8V 0.36 1.0 mA Serializer Timing Requirements for TCLK Over recommended operating supply and temperature ranges unless otherwise specified. Symbol Parameter Conditions Min Typ Max Units tTCP Transmit Clock Period 15.15 T 50.0 nS tTCIH Transmit Clock High Time 0.4T 0.5T 0.6T nS tTCIL Transmit Clock Low Time 0.4T 0.5T 0.6T nS tCLKT TCLK Input Transition Time tJIT TCLK Input Jitter 3 Figure 17 6 nS 150 pS (RMS) Serializer Switching Characteristics Over recommended operating supply and temperature ranges unless otherwise specified. Symbol Parameter tLLHT Bus LVDS Low-to-High Transition Time tLHLT Bus LVDS High-to-Low Transition Time tDIS DIN (0-9) Setup to TCLK tDIH DIN (0-9) Hold from TCLK tHZD DO ± HIGH to TRI-STATE Delay tLZD DO ± LOW to TRI-STATE Delay tZHD Conditions Min RL = 27Ω CL=10pF to GND Figure 4 (Note 4) RL = 27Ω, CL=10pF to GND Figure 7 Typ Max Units 0.2 0.4 nS 0.25 0.4 nS 0 nS 4.0 nS RL = 27Ω, CL=10pF to GND Figure 8 (Note 5) 3 10 nS 3 10 nS DO ± TRI-STATE to HIGH Delay 5 10 nS tZLD DO ± TRI-STATE to LOW Delay 6.5 10 nS tSPW SYNC Pulse Width tPLD Serializer PLL Lock Time RL = 27Ω Figure 10 510*tTCP tSD Serializer Delay RL = 27Ω, Figure 11 tTCP+ 1.0 www.national.com 5*tTCP 6 nS tTCP+ 2.5 513*tTCP nS tTCP+ 3.5 nS (Continued) Over recommended operating supply and temperature ranges unless otherwise specified. Symbol tDJIT Parameter Conditions Deterministic Jitter tRJIT RL = 27Ω, CL=10pF to GND, (Note 6) Random Jitter Min Typ Max Units 20 MHz -300 -135 35 pS 66 MHz -245 -40 160 pS 19 25 pS (RMS) RL = 27Ω, CL=10pF to GND Deserializer Timing Requirements for REFCLK Over recommended operating supply and temperature ranges unless otherwise specified. Symbol Parameter Min Typ Max Units 15.15 T 50 nS REFCLK Duty Cycle 30 50 70 % tRFCP / tTCP Ratio of REFCLK to TCLK 95 1 105 tRFTT REFCLK Transition Time 3 6 tRFCP REFCLK Period tRFDC Conditions nS Deserializer Switching Characteristics Over recommended operating supply and temperature ranges unless otherwise specified. Symbol Parameter Conditions tRCP Receiver out Clock Period tRCP = tTCP Figure 11 tCLH CMOS/TTL Low-to-High Transition Time CL = 15 pF Figure 5 tCHL CMOS/TTL High-to-Low Transition Time tDD Deserializer Delay Figure 12 tROS ROUT Data Valid before Pin/Freq. Min RCLK 15.15 Rout(0-9), LOCK, RCLK ROUT Data valid after Max Units 50 nS 1.2 4 nS 1.1 4 nS All Temp./ All Freq. 1.75*tRCP+1.25 1.75*tRCP+5.0 1.75*tRCP+7.5 nS Room Temp./3.3V/20MHz 1.75*tRCP+2.25 1.75*tRCP+5.0 1.75*tRCP+6.5 nS Room Temp./3.3V/66MHz 1.75*tRCP+2.25 1.75*tRCP+5.0 1.75*tRCP+6.5 nS Figure 13 RCLK tROH Typ Figure 13 RCLK tRDC RCLK Duty Cycle tHZR HIGH to TRI-STATE Delay Figure 14 RCLK 20MHz 0.4*tRCP 0.5*tRCP nS RCLK 66MHz 0.38*tRCP 0.5*tRCP nS 20MHz −0.4*tRCP −0.5*tRCP nS 66MHz −0.38*tRCP −0.5*tRCP nS 45 Rout(0-9) 50 55 % 2.8 10 nS tLZR LOW to TRI-STATE Delay 2.8 10 nS tZHR TRI-STATE to HIGH Delay 4.2 10 nS tZLR TRI-STATE to LOW Delay 4.2 10 nS tDSR1 Deserializer PLL Lock Time from PWRDWN (with SYNCPAT) 20MHz 2.6 4 µS 66MHz 0.84 3 µS tDSR2 tZHLK Figure 15 Figure 16 (Note 7) Deserializer PLL Lock time from SYNCPAT TRI-STATE to HIGH Delay (power-up) 7 20MHz 1 2 µS 66MHz 0.29 0.8 µS LOCK 3.7 12 nS www.national.com SCAN921023/SCAN921224 Serializer Switching Characteristics SCAN921023/SCAN921224 Deserializer Switching Characteristics (Continued) Over recommended operating supply and temperature ranges unless otherwise specified. Symbol tRNM Parameter Deserializer Noise Margin Conditions Figure 17 (Note 8) Pin/Freq. Min Typ 20 MHz 1.0 1.6 Max Units nS 66 MHz 250 400 pS SCAN Circuitry Timing Requirements Symbol Parameter fMAX Maximum TCK Clock Frequency Conditions Min Typ RL = 500Ω, CL = 35 pF 25.0 50.0 Max Units MHz tS TDI to TCK, H or L 1.0 ns tH TDI to TCK, H or L 2.0 ns tS TMS to TCK, H or L 2.5 ns tH TMS to TCK, H or L 1.5 ns tW TCK Pulse Width, H or L 10.0 ns tW TRST Pulse Width, L 2.5 ns tREC Recovery Time, TRST to TCK 2.0 ns Note 1: “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. They are not meant to imply that the devices should be operated at these limits. The table of “Electrical Characteristics” specifies conditions of device operation. Note 2: Typical values are given for VCC = 3.3V and TA = +25˚C. Note 3: Current into device pins is defined as positive. Current out of device pins is defined as negative. Voltages are referenced to ground except VOD, ∆VOD, VTH and VTL which are differential voltages. Note 4: tLLHT and tLHLT specifications are Guaranteed By Design (GBD) using statistical analysis. Note 5: Because the Serializer is in TRI-STATE mode, the Deserializer will lose PLL lock and have to resynchronize before data transfer. Note 6: tDJIT specifications are Guaranteed By Design using statistical analysis. Note 7: For the purpose of specifying deserializer PLL performance, tDSR1 and tDSR2 are specified with the REFCLK running and stable, and with specific conditions for the incoming data stream (SYNCPATs). It is recommended that the derserializer be initialized using either tDSR1 timing or tDSR2 timing. tDSR1 is the time required for the deserializer to indicate lock upon power-up or when leaving the power-down mode. Synchronization patterns should be sent to the device before initiating either condition. tDSR2 is the time required to indicate lock for the powered-up and enabled deserializer when the input (RI+ and RI-) conditions change from not receiving data to receiving synchronization patterns (SYNCPATs). Note 8: tRNM is a measure of how much phase noise (jitter) the deserializer can tolerate in the incoming data stream before bit errors occur. The Deserializer Noise Margin is Guaranteed By Design (GBD) using statistical analysis. AC Timing Diagrams and Test Circuits DS200001-3 FIGURE 2. “Worst Case” Serializer ICC Test Pattern www.national.com 8 SCAN921023/SCAN921224 AC Timing Diagrams and Test Circuits (Continued) DS200001-4 FIGURE 3. “Worst Case” Deserializer ICC Test Pattern DS200001-5 FIGURE 4. Serializer Bus LVDS Output Load and Transition Times DS200001-6 FIGURE 5. Deserializer CMOS/TTL Output Load and Transition Times DS200001-7 FIGURE 6. Serializer Input Clock Transition Time DS200001-8 Timing shown for TCLK_R/F = LOW FIGURE 7. Serializer Setup/Hold Times 9 www.national.com SCAN921023/SCAN921224 AC Timing Diagrams and Test Circuits (Continued) DS200001-9 FIGURE 8. Serializer TRI-STATE Test Circuit and Timing DS200001-10 FIGURE 9. Serializer PLL Lock Time, and PWRDN TRI-STATE Delays www.national.com 10 SCAN921023/SCAN921224 AC Timing Diagrams and Test Circuits (Continued) DS200001-23 FIGURE 10. SYNC Timing Delays DS200001-11 FIGURE 11. Serializer Delay DS200001-12 FIGURE 12. Deserializer Delay 11 www.national.com SCAN921023/SCAN921224 AC Timing Diagrams and Test Circuits (Continued) DS200001-13 Timing shown for RCLK_R/F = LOW Duty Cycle (tRDC) = FIGURE 13. Deserializer Data Valid Out Times DS200001-14 FIGURE 14. Deserializer TRI-STATE Test Circuit and Timing www.national.com 12 SCAN921023/SCAN921224 AC Timing Diagrams and Test Circuits (Continued) DS200001-15 FIGURE 15. Deserializer PLL Lock Times and PWRDN TRI-STATE Delays DS200001-22 FIGURE 16. Deserializer PLL Lock Time from SyncPAT 13 www.national.com SCAN921023/SCAN921224 AC Timing Diagrams and Test Circuits (Continued) DS200001-21 SW - Setup and Hold Time (Internal Data Sampling Window) tDJIT - Serializer Output Bit Position Jitter that results from Jitter on TCLK tRNM = Receiver Noise Margin Time FIGURE 17. Receiver Bus LVDS Input Skew Margin DS200001-16 VOD = (DO+)–(DO−). Differential output signal is shown as (DO+)–(DO−), device in Data Transfer mode. FIGURE 18. VOD Diagram www.national.com 14 Using the SCAN921023 and SCAN921224 The Serializer and Deserializer chipset is an easy to use transmitter and receiver pair that sends 10 bits of parallel LVTTL data over a serial Bus LVDS link up to 660 Mbps. An on-board PLL serializes the input data and embeds two clock bits within the data stream. The Deserializer uses a separate reference clock (REFCLK) and an onboard PLL to extract the clock information from the incoming data stream and then deserialize the data. The Deserializer monitors the incoming clock information, determines lock status, and asserts the LOCK output high when loss of lock occurs. The Deserializer can relock to the incoming data stream by making the Serializer resend SYNC patterns, as described above, or by random locking, which can take more time, depending on the data patterns being received. Hot Insertion All the BLVDS devices are hot pluggable if you follow a few rules. When inserting, ensure the Ground pin(s) makes contact first, then the VCC pin(s), and then the I/O pins. When removing, the I/O pins should be unplugged first, then the VCC, then the Ground. Random lock hot insertion is illustrated in Figure 21. PCB Considerations The Bus LVDS Serializer and Deserializer should be placed as close to the edge connector as possible. In multiple Deserializer applications, the distance from the Deserializer to the slot connector appears as a stub to the Serializer driving the backplane traces. Longer stubs lower the impedance of the bus, increase the load on the Serializer, and lower the threshold margin at the Deserializers. Deserializer devices should be placed much less than one inch from slot connectors. Because transition times are very fast on the Serializer Bus LVDS outputs, reducing stub lengths as much as possible is the best method to ensure signal integrity. Transmission Media The Serializer and Deserializer can also be used in point-to-point configuration of a backplane, through a PCB trace, or through twisted pair cable. In point-to-point configuration, the transmission media need only be terminated at the receiver end. Please note that in point-to-point configuration, the potential of offsetting the ground levels of the Serializer vs. the Deserializer must be considered. Also, Bus LVDS provides a +/− 1.2V common mode range at the receiver inputs. Failsafe Biasing for the SCAN921224 The SCAN921224 has an improved input threshold sensitivity of +/− 50mV versus +/− 100mV for the DS92LV1210 or DS92LV1212. This allows for greater differential noise margin in the SCAN921224. However, in cases where the receiver input is not being actively driven, the increased sensitivity of the SCAN921224 can pickup noise as a signal and cause unintentional locking. For example, this can occur when the input cable is disconnected. External resistors can be added to the receiver circuit board to prevent noise pick-up. Typically, the non-inverting receiver input is pulled up and the inverting receiver input is pulled down by high value resistors. the pull-up and pull-down resistors (R1 and R2) provide a current path through the termination resistor (RL) which biases the receiver inputs when they are not connected to an active driver. The value of the pull-up and pull-down resistors should be chosen so that enough current is drawn to provide a +15mV drop across the termination resistor. Please see Figure 19 for the Failsafe Biasing Setup. Using tDJIT and tRNM to Validate Signal Quality Power Considerations An all CMOS design of the Serializer and Deserializer makes them inherently low power devices. In addition, the constant current source nature of the Bus LVDS outputs minimizes the slope of the speed vs. ICC curve of conventional CMOS designs. Powering Up the Deserializer The SCAN921224 can be powered up at any time by following the proper sequence. The REFCLK input can be running before the Deserializer powers up, and it must be running in order for the Deserializer to lock to incoming data. The Deserializer outputs will remain in TRI-STATE until the Deserializer detects data transmission at its inputs and locks to the incoming data stream. Transmitting Data Once you power up the Serializer and Deserializer, they must be phase locked to each other to transmit data. Phase locking occurs when the Deserializer locks to incoming data or when the Serializer sends patterns. The Serializer sends SYNC patterns whenever the SYNC1 or SYNC2 inputs are high. The LOCK output of the Deserializer remains high until it has locked to the incoming data stream. Connecting the LOCK output of the Deserializer to one of the SYNC inputs of the Serializer will guarantee that enough SYNC patterns are sent to achieve Deserializer lock. The Deserializer can also lock to incoming data by simply powering up the device and allowing the “random lock” circuitry to find and lock to the data stream. While the Deserializer LOCK output is low, data at the Deserializer outputs (ROUT0-9) is valid, except for the specific case of loss of lock during transmission which is further discussed in the ’Recovering from LOCK Loss’ section below. Noise Margin The Deserializer noise margin is the amount of input jitter (phase noise) that the Deserializer can tolerate and still reliably receive data. Various environmental and systematic factors include: Serializer: TCLK jitter, VCC noise (noise bandwidth and out-of-band noise) Media: ISI, Large VCM shifts Deserializer: VCC noise Recovering from LOCK Loss In the case where the Deserializer loses lock during data transmission, up to 3 cycles of data that were previously received can be invalid. This is due to the delay in the lock detection circuit. The lock detect circuit requires that invalid clock information be received 4 times in a row to indicate loss of lock. Since clock information has been lost, it is possible that data was also lost during these cycles. There- The parameters tDJIT and tRNM can be used to generate an eye pattern mask to validate signal quality in an actual application or in simulation. The parameter tDJIT measures the transmitter’s ability to place data bits in the ideal position to be sampled by the receiver. The typical tDJIT parameter of −80pS indicates that the crossing point of the Tx data is 80pS ahead of the ideal 15 www.national.com SCAN921023/SCAN921224 fore, after the Deserializer relocks to the incoming data stream and the Deserializer LOCK pin goes low, at least three previous data cycles should be suspect for bit errors. Application Information SCAN921023/SCAN921224 Application Information ideal bit that is available for external sources of noise is called tRNM. It is the offset from tDJIT(min or max) for the test mask within the eye opening. (Continued) crossing point. The tDJIT(min) and tDJIT(max) parameters specify the earliest and latest, repectively, time that a crossing will occur relative to the ideal position. The vertical limits of the mask are determined by the SCAN921224 receiver input threshold of +/− 50mV. The parameter tRNM is calculated by first measuring how much of the ideal bit the receiver needs to ensure correct sampling. After determining this amount, what remains of the Please refer to the eye mask pattern of Figure 20 for a graphic representation of tDJIT and tRNM. DS200001-27 FIGURE 19. Failsafe Biasing Setup DS200001-28 FIGURE 20. Using tDJIT and tRNM to Generate an Eye Pattern Mask and Validate Signal Quality DS200001-17 FIGURE 21. Random Lock Hot Insertion www.national.com 16 SCAN921023/SCAN921224 Pin Diagrams SCAN921023SLC - Serializer (Top View) DS200001-30 SCAN921224SLC - Deserializer (Top View) DS200001-31 17 www.national.com SCAN921023/SCAN921224 Serializer Pin Description I/O Ball Id. DIN Pin Name I A3, B1, C1, D1, D2, D3, E1, E2, F2, F4 Data Input. LVTTL levels inputs. Data on these pins are loaded into a 10-bit input register. TCLKR/F I G3 Transmit Clock Rising/Falling strobe select. LVTTL level input. Selects TCLK active edge for strobing of DIN data. High selects rising edge. Low selects falling edge. DO+ O D7 + Serial Data Output. Non-inverting Bus LVDS differential output. DO− O D5 − Serial Data Output. Inverting Bus LVDS differential output. DEN I D6 Serial Data Output Enable. LVTTL level input. A low puts the Bus LVDS outputs in TRI-STATE. PWRDN I C7 Powerdown. LVTTL level input. PWRDN driven low shuts down the PLL and TRI-STATEs outputs putting the device into a low power sleep mode. TCLK I E4 Transmit Clock. LVTTL level input. Input for 20 MHz–66 MHz system clock. SYNC I A4, B3 DVCC I C3, C4, E5 Digital Circuit power supply. DGND I A1, C2, F5, E6, G4 Digital Circuit ground. AVCC I A5, A6, B4, B7, G5 Analog power supply (PLL and Analog Circuits). AGND I B5, B6, C6, E7, F7 Analog ground (PLL and Analog Circuits). TDI I F1 Test Data Input to support IEEE 1149.1 TDO O G1 Test Data Output to support IEEE 1149.1 TMS I E3 Test Mode Select Input to support IEEE 1149.1 TCK I F3 Test Clock Input to support IEEE 1149.1 TRST N/C I G2 N/A A2, A7, B2, C5, D4, F6, G6, G7 Description Assertion of SYNC (high) for at least 1024 synchronization symbols to be transmitted on the Bus LVDS serial output. Synchronization symbols continue to be sent if SYNC continues to be asserted. TTL level input. The two SYNC pins are ORed. Test Reset Input to support IEEE 1149.1 Leave open circuit, do not connect Deserializer Pin Description I/O Ball Id. ROUT Pin Name O A5, B4, B6, C4, C7, D6, F5, F7, G4, G5 RCLKR/F I B3 Recovered Clock Rising/Falling strobe select. TTL level input. Selects RCLK active edge for strobing of ROUT data. High selects rising edge. Low selects falling edge. RI+ I D2 + Serial Data Input. Non-inverting Bus LVDS differential input. RI− I C1 − Serial Data Input. Inverting Bus LVDS differential input. PWRDN I D3 Powerdown. TTL level input. PWRDN driven low shuts down the PLL and TRI-STATEs outputs putting the device into a low power sleep mode. www.national.com Description Data Output. ± 9 mA CMOS level outputs. 18 Pin Name (Continued) I/O Ball Id. LOCK O E1 LOCK goes low when the Deserializer PLL locks onto the embedded clock edge. CMOS level output. Totem pole output structure, does not directly support wired OR connections. Description RCLK O E2 Recovered Clock. Parallel data rate clock recovered from embedded clock. Used to strobe ROUT, CMOS level output. REN I D1 Output Enable. TTL level input. When driven low, TRI-STATEs ROUT0–ROUT9 and RCLK. DVCC I A7, B7, C5, C6, D5 Digital Circuit power supply. DGND I A1, A6, B5, D7, E4, E7, G3 Digital Circuit ground. AVCC I B1, C2, F1, F2, G1 Analog power supply (PLL and Analog Circuits). AGND I A4, B2, F3, F4, G2 Analog ground (PLL and Analog Circuits). REFCLK I A3 Use this pin to supply a REFCLK signal for the internal PLL frequency. TDI I F6 Test Data Input to support IEEE 1149.1 TDO O G6 Test Data Output to support IEEE 1149.1 TMS I G7 Test Mode Select Input to support IEEE 1149.1 TCK I E5 Test Clock Input to support IEEE 1149.1 TRST I E6 Test Reset Input to support IEEE 1149.1 N/A A2, C3, D4, E3 N/C Leave open circuit, do not connect Deserializer Truth Table INPUTS 1) 2) 3) 4) OUTPUTS PWRDN REN ROUT [0:9] LOCK RCLK H (4) H Z H Z H H Active L Active L X Z Z Z H L Z Active Z LOCK Active indicates the LOCK output will reflect the state of the Deserializer with regard to the selected data stream. RCLK Active indicates the RCLK will be running if the Deserializer is locked. The Timing of RCLK with respect to ROUT is determined by RCLK_R/F. ROUT and RCLK are TRI-STATED when LOCK is asserted High. During Power-up. 19 www.national.com SCAN921023/SCAN921224 Deserializer Pin Description SCAN921023/SCAN921224 20-66 MHz 10 Bit BLVDS Serializer and Deserializer with IEEE 1149.1 (JTAG) and at-speed BIST Physical Dimensions inches (millimeters) unless otherwise noted Order Number SCAN921023SLC or SCAN921224SLC NS Package Number SLC49A LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 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