ETC STB80NF55-08T4

STB80NF55-08
N-CHANNEL 55V - 0.0065Ω - 80A D2PAK
STripFET POWER MOSFET
TYPE
STB80NF55-08
■
VDSS
RDS(on)
ID
55 V
<0.008Ω
80 A
TYPICAL RDS(on) = 0.0065Ω
3
1
DESCRIPTION
This Power Mosfet is the latest development of
STMicroelectronics unique “Single Feature
Size ” strip-based process. The resulting transistor shows extremely high packing density for
low on-resistance, rugged avalance characteristics and less critical alignment steps therefore a remarkable manufacturing reproducibility.
D2PAK
INTERNAL SCHEMATIC DIAGRAM
APPLICATIONS
■ SOLENOID AND RELAY DRIVERS
■ MOTOR CONTROL, AUDIO AMPLIFIERS
■ DC-DC CONVERTERS
■ AUTOMOTIVE ENVIRONMENT
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
VDGR
VGS
Value
Unit
Drain-source Voltage (VGS = 0)
Parameter
55
V
Drain-gate Voltage (RGS = 20 kΩ)
55
V
Gate- source Voltage
±20
V
ID (**)
Drain Current (continuos) at TC = 25°C
80
A
ID
Drain Current (continuos) at TC = 100°C
57
A
IDM (●)
Drain Current (pulsed)
320
A
PTOT
Total Dissipation at TC = 25°C
300
W
2
W/°C
EAS(1)
Single Pulse Avalanche Energy
Derating Factor
870
mJ
Tj
Tstg
Operating Junction Temperature
Storage Temperature
-55 to 175
-65 to 175°C
°C
°C
( ●) Pulse width limi ted by safe operating area
May 2001
(1) Starting Tj=25°C, ID=40A, VDD=30V
(**) Current Limited Package
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STB80NF55-08
THERMAL DATA
Rthj-case
Thermal Resistance Junction-case Max
0.5
°C/W
Rthj-amb
Thermal Resistance Junction-ambient Max
62.5
°C/W
Maximum Lead Temperature For Soldering Purpose
300
°C
Tl
ELECTRICAL CHARACTERISTICS (TCASE = 25 °C UNLESS OTHERWISE SPECIFIED)
OFF
Symbol
V(BR)DSS
IDSS
IGSS
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
Drain-source
Breakdown Voltage
ID = 250 µA, VGS = 0
Zero Gate Voltage
Drain Current (V GS = 0)
VDS = Max Rating
1
µA
VDS = Max Rating, TC = 125 °C
10
µA
Gate-body Leakage
Current (VDS = 0)
VGS = ±20V
±100
nA
55
V
ON (1)
Symbol
Parameter
Test Conditions
VGS(th)
Gate Threshold Voltage
VDS = VGS, ID = 250µA
R DS(on)
Static Drain-source On
Resistance
VGS = 10 V, I D = 40 A
Min.
Typ.
Max.
Unit
2
3
4
V
0.0065
0.008
Ω
Typ.
Max.
Unit
DYNAMIC
Symbol
gfs (1)
2/9
Parameter
Test Conditions
Forward Transconductance
VDS = 15V, ID = 18 A
C iss
Input Capacitance
VDS = 25V, f = 1 MHz, VGS = 0
Coss
Crss
Min.
40
S
3850
pF
Output Capacitance
800
pF
Reverse Transfer
Capacitance
250
pF
STB80NF55-08
ELECTRICAL CHARACTERISTICS (CONTINUED)
SWITCHING ON
Symbol
td(on)
tr
Qg
Qgs
Q gd
Parameter
Turn-on Delay Time
Rise Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Test Conditions
Min.
Typ.
Max.
Unit
VDD = 27 V, I D = 40A
RG = 4.7Ω VGS = 10V
(see test circuit, Figure 3)
25
ns
85
ns
VDD = 44V, ID = 80A,
VGS = 10V
113
24
46
152
nC
nC
nC
Typ.
Max.
Unit
SWITCHING OFF
Symbol
Parameter
Test Condit ions
Min.
td(off)
tf
Turn-off-Delay Time
Fall Time
VDD = 27V, ID = 40A,
R G = 4.7Ω, VGS = 10V
(see test circuit, Figure 3)
70
25
ns
ns
td(off)
tf
tc
Off-voltage Rise Time
Fall Time
Cross-over Time
Vclamp =44V, I D =80A
R G = 4.7Ω, VGS = 10V
(see test circuit, Figure 5)
85
75
105
ns
ns
ns
SOURCE DRAIN DIODE
Symbol
Max.
Unit
Source-drain Current
80
A
ISDM (1)
Source-drain Current (pulsed)
320
A
VSD (2)
Forward On Voltage
ISD = 80A, VGS = 0
1.5
V
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
ISD = 80A, di/dt = 100A/µs,
VDD = 25V, Tj = 150°C
(see test circuit, Figure 5)
ISD
trr
Qrr
IRRM
Parameter
Test Conditions
Min.
Typ.
80
245
6.4
ns
nC
A
Note: 1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.
2. Pulse width limited by safe operating area.
Safe Operating Area
Thermal Impedance
3/9
STB80NF55-08
Output Characteristics
Tranfer Characteristics
Tranconductance
Static Drain-Source On Resistance
Gate Charge vs Gate-source Voltage
Capacitance Variations
4/9
STB80NF55-08
Normalized Gate Thereshold Voltage vs Temp.
Normalized On Resistance vs Temperature
Source-drain Diode Forward Characteristics
Normalized BreakdownVoltagevs Temperature
5/9
STB80NF55-08
Fig. 1: Unclamped Inductive Load Test Circuit
Fig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuit For
Resistive Load
Fig. 4: Gate Charge test Circuit
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
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STB80NF55-08
D2PAK MECHANICAL DATA
mm.
inch
DIM.
MIN.
TYP
MAX.
MIN.
TYP.
MAX.
A
4.4
4.6
0.173
0.181
A1
2.49
2.69
0.098
0.106
A2
0.03
0.23
0.001
0.009
B
0.7
0.93
0.027
0.036
B2
1.14
1.7
0.044
0.067
C
0.45
0.6
0.017
0.023
C2
1.23
1.36
0.048
0.053
D
8.95
9.35
0.352
0.368
D1
E
8
0.315
10
E1
10.4
0.393
8.5
0.334
G
4.88
5.28
0.192
0.208
L
15
15.85
0.590
0.625
L2
1.27
1.4
0.050
0.055
L3
1.4
1.75
0.055
0.068
M
2.4
3.2
0.094
0.126
R
0.015
0º
8º
3
V2
0.4
7/9
1
STB80NF55-08
D2PAK FOOTPRINT
TUBE SHIPMENT (no suffix)*
TAPE AND REEL SHIPMENT (suffix ”T4”)*
REEL MECHANICAL DATA
DIM.
mm
MIN. MAX.
A
B
1.5
C
12.8
D
20.2
G
N
24.4
100
330
T
TAPE MECHANICAL DATA
DIM.
mm
inch
MIN.
MAX.
MIN.
A0
10.5
10.7
0.413 0.421
B0
D
15.7
1.5
15.9
1.6
0.618 0.626
0.059 0.063
D1
E
1.59
1.65
1.61
1.85
0.062 0.063
0.065 0.073
F
11.4
11.6
0.449 0.456
K0
4.8
5.0
0.189 0.197
P0
P1
3.9
11.9
4.1
12.1
0.153 0.161
0.468 0.476
P2
R
1.9
50
2.1
0.075 0.082
1.574
T
0.25
0.35 0.0098 0.0137
W
23.7
24.3
8/9
* on sales type
MAX.
0.933 0.956
inch
MIN. MAX.
BASE QTY
1000
12.992
0.059
13.2
0.504 0.520
0795
26.4
0.960 1.039
3.937
30.4
1.197
BULK QTY
1000
STB80NF55-08
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is
granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specification mentioned in this publication are
subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products
are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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 2001 STMicroelectronics – Printed in Italy – All Rights Reserved
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