100371 Low Power Triple 4-Input Multiplexer with Enable General Description The 100371 contains three 4-input multiplexers which share a common decoder (inputs S0 and S1). Output buffer gates provide true and complement outputs. A HIGH on the Enable input (E) forces all true outputs LOW (see Truth Table). All inputs have 50 kΩ pull-down resistors. n n n n 2000V ESD protection Pin/function compatible with 100171 Voltage compensated operating range = −4.2V to −5.7V Available to MIL-STD-883 Features n 35% power reduction of the 100171 Logic Symbol Pin Names Description I0x–I3x Data Inputs S0, S1 Select Inputs E Enable Input (Active LOW) Za–Zc Data Outputs Za–Zc Complementary Data Outputs DS100975-1 © 1998 National Semiconductor Corporation DS100975 www.national.com 100371 Low Power Triple 4-Input Multiplexer with Enable September 1998 Connection Diagrams 24-Pin DIP DS100975-2 24-Pin Quad Cerpak DS100975-3 Logic Diagram DS100975-5 www.national.com 2 Truth Table Inputs Outputs E S0 S1 Zn L L L I0x L H L I1x L L H I2x L H H I3x H X X L H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care 3 www.national.com Absolute Maximum Ratings (Note 1) Recommended Operating Conditions If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications. Storage Temperature (TSTG) Maximum Junction Temperature (TJ) Ceramic VEE Pin Potential to Ground Pin Input Voltage (DC) Output current (DC Output HIGH) ESD (Note 2) Case Temperature (TC) Military Supply Voltage (VEE) −65˚C to +150˚C −55˚C to +125˚C −5.7V to −4.2V Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. +175˚C −7.0V to +0.5V VEE to +0.5V −50 mA ≥2000V Note 2: ESD testing conforms to MIL-STD-883, Method 3015. Military Version DC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = −55˚C to +125˚C Symbol VOH Parameter Output HIGH Voltage Conditions Min Max Units TC −1025 −870 mV 0˚C to −1085 −870 mV −55˚C VIN = V (Max) Loading with −1830 −1620 mV 0˚C to or VIL (Min) 50Ω to −2.0V −1830 −1555 mV −55˚C −1035 mV 0˚C to −1085 mV −55˚C VIN = VIH (Min) Loading with −1610 mV 0˚C to or VIL (Max) 50Ω to −2.0V −1555 mV −55˚C −870 mV −55˚C to Notes +125˚C VOL Output LOW Voltage (Notes 3, 4, 5) +125˚C VOHC Output HIGH Voltage +125˚C VOLC Output LOW Voltage (Notes 3, 4, 5) +125˚C VIH Input HIGH Voltage −1165 +125˚C VIL Input LOW Voltage −1830 −1475 mV −55˚C to +125˚C IIL Input LOW Current 0.50 µA −55˚C to +125˚C IIH IEE Guaranteed HIGH Signal for All Inputs Guaranteed LOW Signal for All Inputs VEE = −4.2V VIN = VIL (Min) (Notes 3, 4, 5, 6) (Notes 3, 4, 5, 6) (Notes 3, 4, 5) Input HIGH Current I0X–I3X 340 S0, S1, E 300 I0X–I3X 490 S0, S1, E 450 Power Supply Current −80 −30 µA 0˚C to +125˚C µA −55˚C mA −55˚C to VEE = −5.7V VIN = VIH (Max) Inputs Open +125˚C (Notes 3, 4, 5) (Notes 3, 4, 5) Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately without allowing for the junction temperature to stabilize due to heat dissapation after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 4: Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8. Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8. Note 6: Guaranteed by applying specified input condition and testing VOH/VOL. www.national.com 4 Military Version AC Electrical Characteristics VEE = −4.2V to −5.7V, VCC = VCCA = GND Symbol Parameter tPLH Propagation Delay tPHL I0x–I3x to Output tPLH Propagation Delay tPHL S0, S1to Output tPLH Propagation Delay tPHL E to Output tTLH Transition Time tTHL 20% to 80%, 80% to 20% TC = −55˚C TC = +25˚C TC = +125˚C Min Max Min Max Min Max 0.10 1.90 0.20 1.70 0.20 2.00 ns 0.40 2.70 0.60 2.40 0.50 2.90 ns Units Conditions Figures 1, 2 0.50 2.70 0.60 2.40 0.50 2.90 ns 0.20 1.60 0.30 1.50 0.20 1.60 ns Notes (Notes 7, 8, 9, 11) (Note 10) Note 7: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures. Note 8: Screen tested 100% on each device at +25˚C temperature only, Subgroup A9. Note 9: Sample tested (Method 5005, Table I) on each mfg. lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C temperatures, Subgroups A10 and A11. Note 10: Not tested at +25˚C, +125˚C and −55˚C temperature (design characterization data). Note 11: The propagation delay specified is for single output switching. Delays may vary up to 300 ps with multiple outputs switching. Test Circuitry DS100975-6 Notes: VCC, VCCA = +2V, VEE = −2.5V L1 and L2 = equal length 50Ω impedance lines RT = 50Ω terminator internal to scope Decoupling 0.1 µF from GND to VCC and VEE All unused outputs are loaded with 50Ω to GND CL = Fixture and stray capacitance ≤ 3 pF Pin numbers shown are for flatpak; for DIP see logic symbol FIGURE 1. AC Test Circuit 5 www.national.com Switching Waveforms DS100975-7 FIGURE 2. Propagation Delay and Transition Times www.national.com 6 Physical Dimensions inches (millimeters) unless otherwise noted 24-Lead Ceramic Dual-In-Line Package (D) Package Number J24E 24-Lead Ceramic Flatpak (F) Package Number W24B 7 www.national.com 100371 Low Power Triple 4-Input Multiplexer with Enable LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component in any component of a life support 1. Life support devices or systems are devices or sysdevice or system whose failure to perform can be reatems which, (a) are intended for surgical implant into sonably expected to cause the failure of the life support the body, or (b) support or sustain life, and whose faildevice or system, or to affect its safety or effectiveness. ure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. National Semiconductor Corporation Americas Tel: 1-800-272-9959 Fax: 1-800-737-7018 Email: firstname.lastname@example.org www.national.com National Semiconductor Europe Fax: +49 (0) 1 80-530 85 86 Email: email@example.com Deutsch Tel: +49 (0) 1 80-530 85 85 English Tel: +49 (0) 1 80-532 78 32 Français Tel: +49 (0) 1 80-532 93 58 Italiano Tel: +49 (0) 1 80-534 16 80 National Semiconductor Asia Pacific Customer Response Group Tel: 65-2544466 Fax: 65-2504466 Email: firstname.lastname@example.org National Semiconductor Japan Ltd. Tel: 81-3-5620-6175 Fax: 81-3-5620-6179 National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.