ETC ADCRM

Freescale Semiconductor, Inc.
Modular Microcontroller Family
ADC
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ANALOG-TO-DIGITAL CONVERTER
Reference Manual
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TABLE OF CONTENTS
Paragraph
Title
Page
SECTION 1FUNCTIONAL OVERVIEW
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1.1
1.2
1.3
1.4
1.5
1.6
Analog Subsystem .................................................................................... 1-1
Digital Control Subsystem ......................................................................... 1-1
General-Purpose I/O ................................................................................. 1-2
Module Configuration ................................................................................ 1-2
Bus Organization ....................................................................................... 1-3
Memory Map ............................................................................................. 1-3
SECTION 2 SIGNAL DESCRIPTIONS
2.1
2.2
2.3
2.4
Analog/Digital Input Pins (AN[7:0]/PADA[7:0]) .......................................... 2-1
Digital Output Pins (PADB[7:0]) ................................................................ 2-1
Analog Reference Pins .............................................................................. 2-1
Analog Supply Pins ................................................................................... 2-2
SECTION 3CONFIGURATION AND CONTROL
3.1
3.2
3.2.1
3.2.2
3.2.3
3.2.4
3.3
3.4
3.5
ADC Bus Interface Unit ............................................................................. 3-1
Module Configuration ................................................................................ 3-1
Low-Power Stop Operation ............................................................... 3-1
Freeze Mode Operation .................................................................... 3-2
Privilege Levels ................................................................................. 3-2
ADC Module Configuration Register (ADCMCR) .............................. 3-3
General-Purpose I/O ................................................................................. 3-3
ADC Test Register (ADCTEST) ................................................................ 3-4
Initialization Checklist ................................................................................ 3-4
SECTION 4 ANALOG SUBSYSTEM
4.1
4.2
4.3
4.4
4.5
Multiplexer ................................................................................................. 4-1
Sample Buffer Amplifier ............................................................................. 4-1
RC DAC Array ........................................................................................... 4-2
Comparator ............................................................................................... 4-2
Successive Approximation Register (SAR) ............................................... 4-2
SECTION 5 DIGITAL CONTROL SUBSYSTEM
5.1
5.2
5.3
5.4
5.5
Conversion Timing .................................................................................... 5-1
Clock and Prescaler Control ...................................................................... 5-3
Final Sample Time .................................................................................... 5-3
Resolution ................................................................................................. 5-4
Conversion Mode ...................................................................................... 5-4
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TABLE OF CONTENTS
Paragraph
5.6
5.7
5.7.1
5.7.2
5.7.3
5.8
(Continued)
Title
Page
Channel Selection ..................................................................................... 5-6
Control and Status Registers .................................................................... 5-7
ADC Control Register 0 (ADCTL0) .................................................... 5-7
ADC Control Register 1 (ADCTL1) .................................................... 5-8
ADC Status Register (ADSTAT) ........................................................ 5-9
Result Registers (RSLT0–RSLT7) ............................................................ 5-9
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SECTION 6 PIN CONNECTION CONSIDERATIONS
6.1
6.2
6.3
6.3.1
6.3.2
Analog Reference Pins .............................................................................. 6-1
Analog Power Pins .................................................................................... 6-1
Analog Input Pins ...................................................................................... 6-2
Settling Time for the External Circuit ................................................. 6-4
Error Resulting from Leakage ........................................................... 6-4
APPENDIX A ELECTRICAL CHARACTERISTICS
APPENDIX B MEMORY MAP AND REGISTERS
B.1
B.2
Memory Map ............................................................................................ B-1
Registers .................................................................................................. B-2
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LIST OF ILLUSTRATIONS
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Figure
1-1
5-1
5-2
5-3
6-1
6-2
6-3
A-1
A-2
Title
Page
ADC Block Diagram ....................................................................................... 1-2
8-Bit Conversion Timing ................................................................................. 5-2
10-Bit Conversion Timing ............................................................................... 5-2
ADC Clock and Prescaler Control .................................................................. 5-3
Analog Input Circuitry ..................................................................................... 6-1
Errors Resulting from Clipping ....................................................................... 6-2
Electrical Model of an A/D Input Pin ............................................................... 6-3
Circuit and Quantization Error in 8-Bit Conversions ....................................... A-4
Circuit and Quantization Error in 10-Bit Conversions ..................................... A-5
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LIST OF ILLUSTRATIONS
(Continued)
Title
Page
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Figure
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LIST OF TABLES
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Table
1-1
3-1
5-1
5-2
5-3
5-4
5-5
5-6
6-1
6-2
A-1
A-2
A-3
A-4
Title
Page
ADC Module Memory Map .................................................................................... 1-4
FRZ Field Selection ............................................................................................... 3-2
Prescaler Output.................................................................................................... 5-3
STS Field Selection ............................................................................................... 5-4
Conversion Mode Bits............................................................................................ 5-4
ADC Conversion Modes ........................................................................................ 5-4
Single-Channel Conversions ................................................................................. 5-6
Multiple-Channel Conversions............................................................................... 5-7
External Circuit Settling Time (10-Bit Conversions)............................................... 6-4
Error Resulting from Input Leakage (IOFF)............................................................. 6-5
Maximum Ratings.................................................................................................. A-1
ADC DC Electrical Characteristics (Operating) ..................................................... A-2
ADC AC Characteristics (Operating)..................................................................... A-2
Analog Converter Characteristics (Operating) ...................................................... A-3
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LIST OF TABLES
(Continued)
Title
Page
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Table
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SECTION 1FUNCTIONAL OVERVIEW
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The analog-to-digital converter (ADC), a module in Motorola's family of modular microcontrollers, is a unipolar, successive-approximation converter with eight modes of operation and selectable 8- or 10-bit resolution. Monotonicity is guaranteed for both 8and 10-bit conversions. With a 16.78-MHz system clock, the ADC can perform an 8bit single conversion in 8 microseconds or a 10-bit single conversion in 9 microseconds.
The ADC contains an analog and a digital subsystem. Figure 1-1 is a functional block
diagram of the ADC module.
1.1 Analog Subsystem
The analog subsystem consists of a multiplexer, an input sample amplifier, a resistorcapacitor digital-to-analog converter (RC DAC) array, and a high-gain comparator.
The multiplexer selects one of eight internal or eight external signal sources for conversion. The sample amplifier buffers external high-impedance sources from the internal circuitry. The RC DAC array performs two functions: it acts as a sample-and-hold
circuit, and it provides the digital-to-analog comparison output necessary for successive approximation conversion. The comparator indicates whether each successive
output of the RC DAC array is higher or lower than the sampled input. SECTION 4 ANALOG SUBSYSTEM describes this subsystem in greater detail.
1.2 Digital Control Subsystem
The digital control subsystem contains registers and logic to control the conversion
process. Control registers and associated logic select the conversion resolution (eight
or ten bits), multiplexer input, conversion sequencing mode, sample time, and ADC
clock cycle. As each input is converted, the digital control subsystem stores the result,
one bit at a time, in the successive approximation register (SAR) and then transfers
the result to one of eight result registers. Each result is available in three formats (rightjustified unsigned, left-justified signed, and left-justified unsigned), depending on the
address from which it is read. SECTION 5 DIGITAL CONTROL SUBSYSTEM describes the digital control functions in detail.
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VDDA
VSSA SUPPLY
RC DAC ARRAY
AND
COMPARATOR
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SAR
MODE
AND
TIMING
CONTROL
RESULT 0
RESULT 1
RESULT 2
RESULT 3
VRH
VRL
ANALOG
MUX
AND SAMPLE
BUFFER AMP
RESERVED
RESERVED
RESERVED
RESERVED
V RH
V RL
(V RH–VRL )/2
RESERVED
RESULT 6
AN7/PADA7
AN6/PADA6
AN5/PADA5
AN4/PADA4
AN3/PADA3
AN2/PADA2
AN1/PADA1
AN0/PADA0
INTERNAL
CONNECTIONS
PORT ADA DATA
REGISTER
RESULT 4
RESULT 5
REFERENCE
PORT ADB
DATA
REGISTER
RESULT 7
PADB7
PADB6
PADB5
PADB4
PADB3
PADB2
PADB1
PADB0
CLK SELECT/
PRESCALE
ADC BUS
INTERFACE UNIT
INTERMODULE BUS (IMB)
Figure 1-1 ADC Block Diagram
1.3 General-Purpose I/O
In addition to use as multiplexer inputs, the eight analog inputs can be used as a general-purpose digital input port (port ADA), provided signals are within logic level specification. Port ADB is a dedicated output port. A port data register (PDR) is used to
access data from these ports. Refer to SECTION 2 SIGNAL DESCRIPTIONS and 3.3
General-Purpose I/O for more information on ports ADA and ADB.
1.4 Module Configuration
The ADC module configuration register (ADCMCR) controls the interaction between
the ADC and other modules. Low-power stop mode and freeze mode are ADC operating modes associated with assertion of IMB signals by other microcontroller modules
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or by external sources. The ADCMCR also determines the privilege level at which
most ADC registers operate. Refer to 3.2 Module Configuration for additional information.
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1.5 Bus Organization
The ADC bus interface unit (ABIU) serves as an interface between the ADC and the
intermodule bus (IMB). The IMB handles communication between the ADC and other
microcontroller modules and supplies timing signals to the ADC. For additional information on the ABIU, refer to 3.1 ADC Bus Interface Unit.
1.6 Memory Map
The ADC module is mapped into 32 words of address space (see Table 1-1). Five
words are control and status registers, one word is digital port data, and 24 words provide access to the results of A/D conversion (eight addresses for each type of converted data). Two words are reserved for expansion. The addresses provided in Table 11 and elsewhere in this manual are offsets from the ADC base address. For the precise locations of these registers, consult the user's manual for the specific microcontroller unit (MCU). The column labeled “Access” in Table 1-1 specifies which registers
are supervisor only and which can be programmed to operate at either access level.
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Table 1-1 ADC Module Memory Map
Address
$XXXX00
$XXXX02
$XXXX04
$XXXX06
$XXXX08
$XXXX0A
$XXXX0C
$XXXX0E
Address
$XXXX10
$XXXX12
$XXXX14
$XXXX16
$XXXX18
$XXXX1A
$XXXX1C
$XXXX1E
Address
$XXXX20
$XXXX22
$XXXX24
$XXXX26
$XXXX28
$XXXX2A
$XXXX2C
$XXXX2E
Address
$XXXX30
$XXXX32
$XXXX34
$XXXX36
$XXXX38
$XXXX3A
$XXXX3C
$XXXX3E
Access
S
S
S
S/U
S/U
S/U
S/U
S/U
Access
S/U
S/U
S/U
S/U
S/U
S/U
S/U
S/U
Access
S/U
S/U
S/U
S/U
S/U
S/U
S/U
S/U
Access
S/U
S/U
S/U
S/U
S/U
S/U
S/U
S/U
Control Registers
Module Configuration Register (ADCMCR)
ADC Test Register (ADCTEST)
(Reserved)
Port Data Register (PDR)
(Reserved)
ADC Control Register 0 (ADCTL0)
ADC Control Register 1 (ADCTL1)
ADC Status Register (ADSTAT)
Right-Justified Unsigned Result Registers
ADC Result Register 0 (RSLT0)
ADC Result Register 1 (RSLT1)
ADC Result Register 2 (RSLT2)
ADC Result Register 3 (RSLT3)
ADC Result Register 4 (RSLT4)
ADC Result Register 5 (RSLT5)
ADC Result Register 6 (RSLT6)
ADC Result Register 7 (RSLT7)
Left-Justified Signed Result Registers
ADC Result Register 0 (RSLT0)
ADC Result Register 1 (RSLT1)
ADC Result Register 2 (RSLT2)
ADC Result Register 3 (RSLT3)
ADC Result Register 4 (RSLT4)
ADC Result Register 5 (RSLT5)
ADC Result Register 6 (RSLT6)
ADC Result Register 7 (RSLT7)
Left-Justified Unsigned Result Registers
ADC Result Register 0 (RSLT0)
ADC Result Register 1 (RSLT1)
ADC Result Register 2 (RSLT2)
ADC Result Register 3 (RSLT3)
ADC Result Register 4 (RSLT4)
ADC Result Register 5 (RSLT5)
ADC Result Register 6 (RSLT6)
ADC Result Register 7 (RSLT7)
S = Supervisor-accessible only
S/U = Supervisor- or user-accessible depending on state of the SUPV bit in the ADCMCR
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SECTION 2 SIGNAL DESCRIPTIONS
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The ADC uses up to 20 pins. Up to eight pins are analog inputs (which can also be
used as digital inputs), two pins are analog reference connections, and two pins are
analog supply connections. In addition, eight pins serve as digital output pins in certain
microcontroller systems. In systems not requiring these pins, they are not implemented, and the outputs from the module are not connected. Refer to the appropriate microcontroller user's manual for specific information.
2.1 Analog/Digital Input Pins (AN[7:0]/PADA[7:0])
Each of the eight analog input pins (AN[7:0]) is connected to a multiplexer in the ADC.
The multiplexer selects an analog input to convert to digital data. Input voltages to the
multiplexer must be between VRH and VRL. Refer to SECTION 6 PIN CONNECTION
CONSIDERATIONS for recommendations on filtering the analog inputs.
The analog input pins can also be read as digital inputs, provided the applied voltage
is within the limits specified in APPENDIX A ELECTRICAL CHARACTERISTICS.
When used as digital inputs, the pins are organized into an 8-bit port, port ADA. Data
for port A is latched in the lower half of the 16-bit port data register (PDR). The digital
inputs are then referred to as PADA[7:0]. When used for digital input, each of these
pins is conditioned by a synchronizer with an enable feature. The synchronizer is not
enabled until the actual IMB bus cycle addressing the PDR begins. This minimizes the
high-current effect of mid-level signals on the inputs. This is particularly important
when some of the inputs are being used as digital inputs and some as analog inputs.
Refer to 3.3 General-Purpose I/O for more information on port ADA.
2.2 Digital Output Pins (PADB[7:0])
The eight digital output pins (PADB[7:0]) make up port ADB, an output-only port. Data
for port ADB is latched in the upper half of the PDR. On some MCUs, these pins are
left unconnected and port ADB is not implemented.
A read of the upper byte of the port data register returns the digital value in the output
register of port ADB. Refer to 3.3 General-Purpose I/O for more information on this
output port.
2.3 Analog Reference Pins
Separate high (VRH) and low (VRL) analog reference voltages are connected to the
analog reference pins. Because they are separated from the analog power supply pins
(VDDA and VSSA), the reference pins can be connected to regulated and filtered supplies that allow the ADC to achieve its highest degree of accuracy. Refer to SECTION
6 PIN CONNECTION CONSIDERATIONS for recommendations on filtering and conditioning the analog reference inputs.
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The required reference voltage levels are provided in APPENDIX A ELECTRICAL
CHARACTERISTICS.
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2.4 Analog Supply Pins
Pins VDDA and VSSA supply power to the analog circuitry associated with the sample
amplifier and RC DAC array. Other circuitry in the ADC is powered from the digital
power bus (pins VDDI and VSSI). Dedicated power for the RC DAC array is necessary
to isolate sensitive analog circuitry from noise on the digital power bus. Refer to APPENDIX A ELECTRICAL CHARACTERISTICS for precise electrical specifications.
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SIGNAL DESCRIPTIONS
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SECTION 3CONFIGURATION AND CONTROL
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Other microcontroller modules communicate with the ADC module via the intermodule
bus (IMB). The ADC bus interface unit (ABIU) coordinates IMB activity with internal
ADC bus activity. The first part of this section explains the operation of the ABIU. The
second part of this section describes the ADC module configuration register (ADCMCR), which contains bits used to configure the ADC module. The final parts of this section discuss the general-purpose I/O functions of the ADC module and provide a
checklist for initializing the ADC.
3.1 ADC Bus Interface Unit
The ABIU is designed to act as a slave device on the IMB. The IMB handles communication between the ADC and other microcontroller modules and supplies timing signals to the ADC. The ABIU provides IMB bus cycle termination and synchronizes
internal ADC signals with IMB signals. The ABIU also manages data bus routing to accommodate the three conversion data formats and controls the interface to the ADC
internal bus.
ADC registers are updated immediately when written to. However, if a conversion is in
progress when a control bit is written, conversion halts and must be restarted before
the new control parameter can take effect.
Communication between the IMB and the ADC is interleaved with internal ADC communication. ADC register accesses by the host system require bus cycles of three
MCU clocks, so that each bus cycle contains six clock edges. Internal I/O (SAR to result registers) and I/O from the IMB occur during pre-assigned, non-conflicting times.
This ensures that the ADC can access the SAR and result registers at all times.
3.2 Module Configuration
The ADCMCR contains bits that control the interaction of the ADC module with other
MCU modules. These bits place the ADC in low-power or normal operation, determine
the reaction of the ADC module to assertion of the CPU FREEZE command, and determine the privilege level required to access most ADC registers.
3.2.1 Low-Power Stop Operation
When the STOP bit in the ADCMCR is set, the IMB clock signal internal to the ADC is
disabled. This places the module in an idle state and minimizes power consumption.
The bus interface unit does not shut down and ADC registers are still accessible. Any
conversion in progress when STOP is set is aborted.
Software can write to the ADCMCR to set the STOP bit. In addition, system reset (either internally or externally generated) sets this bit. Following either of these conditions, the STOP bit must be cleared before the ADC can be used. Because analog
circuit bias currents are turned off when STOP is set, the ADC requires recovery time
after the STOP bit is cleared.
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Execution of the CPU LPSTOP command can place the entire modular microcontroller, including the ADC, in low-power stop mode by turning off the system clock. This
command does not set the STOP bit in the ADCMCR. Before issuing the LPSTOP
command, the user should assert the STOP bit in the ADCMCR so that the module
stops in a known state.
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3.2.2 Freeze Mode Operation
When the CPU enters background debugging mode, the FREEZE signal is asserted.
The ADC can respond to internal assertion of FREEZE in three ways: it can ignore
FREEZE assertion, finish the current conversion and then freeze, or freeze immediately. The type of response is determined by the value of the FRZ[1:0] field in the ADCMCR (see Table 3-1).
Table 3-1 FRZ Field Selection
FRZ
00
01
10
11
Response
Ignore FREEZE
Reserved
Finish conversion, then freeze
Freeze immediately
When the ADC freezes, the ADC clock stops and all sequential activity ceases. Contents of control and status registers remain valid while frozen. When the FREEZE signal is negated, ADC activity resumes.
If the ADC freezes during a conversion, activity resumes with the next step in the conversion sequence. However, capacitors in the analog conversion circuitry may discharge while the ADC is frozen, and conversion results may be inaccurate.
3.2.3 Privilege Levels
To protect system resources, the processor in certain MCUs can operate at either of
two privilege levels: user or supervisor. In systems that support privilege levels, accesses of the ADCMCR and ADCTEST registers are permissible only when the CPU
is operating at the supervisor privilege level. The remaining ADC registers are programmable to permit supervisor access only or to permit access when the CPU is operating at either privilege level.
If the SUPV bit in the ADCMCR is set, access to ADC registers is permitted only when
the CPU is operating at the supervisor level. If SUPV is clear, then both user and supervisor accesses of all registers other than the ADCMCR and ADCTEST register are
permitted.
The ADC does not respond to a read or write of a supervisor-access register when the
CPU is operating at the user privilege level. Attempting such a read or write results in
the bus access being transferred externally. Refer to the SIM or SCIM section of the
appropriate MCU user's manual for details on external bus cycles to unimplemented
locations.
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MCUs that do not support privilege levels always operate at the supervisor level, so
that ADC registers are always accessible.
3.2.4 ADC Module Configuration Register (ADCMCR)
The ADCMCR contains fields and bits that control freeze and stop modes and determine the privilege level required to access most ADC registers.
ADCMCR — ADC Module Configuration Register
15
14
STOP
13
12
FRZ
8
NOT USED
7
$XXXX00
6
SUPV
0
NOT USED
RESET:
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1
0
0
0
STOP — STOP Mode
0 = Normal operation
1 = Low-power operation
FRZ[1:0] — Freeze
The FRZ field determines ADC response to assertion of the FREEZE signal by the
CPU.
00 = Ignore FREEZE
01 = Reserved
10 = Finish conversion, then freeze
11 = Freeze immediately
SUPV — Supervisor/User
0 = User access permitted to registers controlled by the SUPV bit
1 = Supervisor access only permitted to ADC registers
3.3 General-Purpose I/O
Two digital ports are associated with the ADC. These ports are accessed through the
16-bit port data register (PDR). Port ADA, an input-only port, uses the eight analog input pins. (Certain MCUs may provide fewer than eight analog input pins. Refer to the
appropriate MCU user's manual for details.) Data for port ADA is accessed in the lower
half of the PDR. The digital level of an input port pin may be read at any time. A read
of the PDR does not affect an A/D conversion in progress. Use of any port A pin for
digital input does not preclude the use of any other port A pin for analog input.
If the signal on the input pin is not within VIH and VIL specification (i.e., if the signal is
in the dead band region), a read of the PDR returns an undetermined value.
Port ADB, an output-only port, uses pins PADB[7:0]. Data for Port ADB is latched in
the upper half of the PDR. On some MCUs, port ADB is not implemented. On these
MCUs, reads of the upper half of the PDR return whatever value was last written to the
upper half of the register.
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PDR — Port Data Register
$XXXX02
15
8
7
Port ADB Output Data
0
Port ADA Input Data
RESET:
0
0
0
0
0
0
0
0
State of input pins
3.4 ADC Test Register (ADCTEST)
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ADCTEST — ADC Test Register
ADCTEST is used only during factory testing of the MCU.
$XXXX06
3.5 Initialization Checklist
To initialize the ADC submodule and begin a conversion sequence, follow these steps:
1. Write to the ADCMCR to ensure the STOP and FREEZE bits are cleared and
assign the desired value to the SUPV bit.
2. Write to ADCTL0 to select the sample time, ADC clock prescaler, and 8- or 10bit resolution.
3. Write to ADCTL1 to select the conversion mode (SCAN, MULT, and S8CM bits)
and conversion channel or channels (CD:CA) and to begin a conversion sequence.
Once a conversion sequence has begun, the type of conversion mode selected determines the programming sequence. Refer to SECTION 5 DIGITAL CONTROL SUBSYSTEM for additional information on conversion modes and the ADC control and
status registers.
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SECTION 4 ANALOG SUBSYSTEM
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This section describes the operation of the analog subsystem. Understanding this subsystem is helpful in designing ADC applications and in using the digital control functions that regulate A/D conversion. Refer to SECTION 6 PIN CONNECTION
CONSIDERATIONS for ADC design considerations and SECTION 5 DIGITAL CONTROL SUBSYSTEM for details concerning digital control functions.
The analog subsystem consists of a multiplexer, sample capacitors, a buffer amplifier,
an RC DAC array, and a high-gain comparator. Comparator output is used to sequence the successive approximation register (SAR). Since the SAR, like the rest of
the analog subsystem, is not directly accessible to user software, its description is included in this section.
4.1 Multiplexer
The multiplexer selects one of eight external or eight internal sources for conversion.
The eight internal sources include VRH, VRL, (VRH – VRL) / 2, and five reserved channels. Multiplexer operation is controlled by channel selection field [CD:CA] in ADCTL1.
Refer to 5.6 Channel Selection for details on selecting a conversion channel.
The multiplexer contains positive clamping and negative stress protection circuitry.
This circuitry prevents voltages (within certain limits) on other input channels from affecting the current conversion.
4.2 Sample Buffer Amplifier
Each of the eight external input channels is associated with a sample capacitor and
share a single sample buffer amplifier. After a conversion is initiated, the multiplexer
output is connected to the sample capacitor at the input of the sample buffer amplifier
for the first two ADC clock cycles of the sampling period. The sample amplifier buffers
the input channel from the relatively large capacitance of the RC DAC array. The input
channel sees only the small sample capacitors during this period.
During the second two ADC clock cycles of the sampling period, the sample capacitor
is disconnected from the multiplexer, and the stored level in the sample capacitor is
transferred to the RC DAC array via the sample buffer amplifier.
During the third part of the sampling period, the sample capacitor and amplifier are bypassed, and the multiplexer input charges the RC DAC array directly. Charging the RC
DAC array directly once the stored voltage level approaches the input voltage allows
the ADC to achieve a high degree of accuracy. Moreover, since the voltage on the RC
DAC array is nearly equal to the external voltage by the start of this third period, this
RC DAC voltage presents very little loading to the external circuitry. This results in
higher allowable input impedance and virtually no charge-sharing between channels.
The length of this third period is determined by the value in the STS field of ADCTL0.
Refer to 5.1 Conversion Timing for additional information on ADC conversion timing.
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4.3 RC DAC Array
The RC DAC array consists of binary-weighted capacitors and a resistor-divider chain.
The array performs two functions: it acts as a sample-and-hold circuit during conversion and provides each successive digital-to-analog comparison voltage to the comparator. Conversion begins with MSB comparison and ends with LSB comparison.
Array switching is controlled by the digital subsystem.
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4.4 Comparator
The comparator indicates whether each approximation output from the RC DAC array
during resolution is higher or lower than the sampled input voltage. Comparator output
is fed to the digital control logic, which sets or clears each bit in the successive approximation register in sequence, MSB first.
4.5 Successive Approximation Register (SAR)
The SAR accumulates the result of each conversion one bit at a time, starting with the
most significant bit. At the start of the resolution period, the MSB of the SAR is set, and
all less significant bits are cleared. Depending on the result of the first comparison, the
MSB is either left set or cleared. Each successive bit is set or left cleared in descending order until all eight or ten bits have been resolved.
When conversion is complete, the content of the SAR is transferred to the appropriate
result register, where it can be read by software. The SAR itself is not accessible to
user software.
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SECTION 5 DIGITAL CONTROL SUBSYSTEM
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The digital control subsystem includes control and status registers, clock and prescaler control logic, channel and reference select logic, conversion sequence control logic,
and eight result registers. The successive approximation register, which holds each
conversion result before it is transferred to the appropriate result register, is discussed
in SECTION 4 ANALOG SUBSYSTEM.
ADCTL0 and ADCTL1 (ADC control registers 0 and 1) and associated logic select the
conversion resolution (8 or 10 bits), input channel, conversion mode, sample time, and
ADC clock cycle. ADSTAT (the ADC status register) contains flags indicating the completion of A/D conversions. Writing to ADCTL1 initiates a conversion.
Conversion results are stored, one bit at a time, in the SAR. Results are discrete values between 0 and 255 (28 – 1) for 8-bit conversions and between 0 and 1023 (210 –
1) for 10-bit conversions. One binary unit = (VRH – VRL) / 2n, where n = 8 or 10. Each
converted result is transferred from the SAR to bits [7:0] (for 8-bit conversion) or [9:0]
(for 10-bit conversion) of the appropriate result register. Each result is available in
three formats (right-justified unsigned, left-justified signed, and left-justified unsigned),
depending on the address from which it is read.
The following subsections discuss control functions involving the control and status
registers. Register diagrams are provided later in this section. (They are also provided
in APPENDIX B MEMORY MAP AND REGISTERS.)
5.1 Conversion Timing
Total conversion time is made up of initial sample time, transfer time, final sample time,
and resolution time. Initial sample time refers to the time during which the selected input channel is connected to the sample capacitor at the input of the sample buffer amplifier. During the transfer period, the sample capacitor is disconnected from the
multiplexer, and the stored voltage is buffered and transferred to the RC DAC array.
During the final sampling period, the sample capacitor and amplifier are bypassed,
and the multiplexer input charges the RC DAC array directly. During the resolution period, the voltage in the RC DAC array is converted to a digital value and stored in the
SAR.
Initial sample time and transfer time are fixed at 2 ADC clock cycles each. Final sample
time can be 2, 4, 8, or 16 ADC clock cycles, depending on the value of the STS field
in ADCTL0. (Refer to 5.3 Final Sample Time.) Resolution time is 10 cycles for 8-bit
conversion and 12 cycles for 10-bit conversion.
Transfer and resolution therefore require a minimum of 16 ADC clocks (8 µs with a 2.1MHz ADC clock) for 8-bit resolution or 18 ADC clocks (9 µs with a 2.1-MHz ADC clock)
for 10-bit resolution. If the user selects the maximum final sample time period of 16
ADC clocks, the total conversion time is 15 µs for an 8-bit conversion or 16 µs for a
10-bit conversion (with a 2.1-MHz ADC clock).
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Figure 5-1 and Figure 5-2 illustrate the timing for 8- and 10-bit conversions, respectively. These diagrams assume a final sampling period of two ADC clocks.
INITIAL
SAMPLE
TIME
TRANSFER
TIME
TRANSFER CONVERSION TO
RESULT REGISTER AND SET CCF
FINAL
SAMPLE
TIME
RESOLUTION TIME
1
16
2
CYCLES
SAR7
6 CYCLES
SUCCESSIVE APPROXIMATION
SEQUENCE
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SAMPLE AND TRANSFER
PERIOD
CH 1
CH 2
1
1
1
1
1
1
1
1
CYCLE CYCLE CYCLE CYCLE CYCLE CYCLE CYCLE CYCLE
SAR6 SAR5 SAR4 SAR3 SAR2 SAR1 SAR0 EOC
CH 3
CH 4
CH 5
CH 6
SCF FLAG SET HERE AND SEQUENCE
ENDS IF IN THE 4 CHANNEL MODE
END
CH 7
CH 8
SCF FLAG SET HERE AND SEQUENCE
ENDS IF IN THE 8 CHANNEL MODE
Figure 5-1 8-Bit Conversion Timing
INITIAL
SAMPLE
TIME
TRANSFER
TIME
TRANSFER CONVERSION TO
RESULT REGISTER AND SET CCF
FINAL
SAMPLE
TIME
RESOLUTION TIME
1
16
2
CYCLES
SAR9
6 CYCLES
1
1
1
1
1
1
1
1
1
1
CYCLE CYCLE CYCLE CYCLE CYCLE CYCLE CYCLE CYCLE CYCLE CYCLE
SAR8 SAR7 SAR6 SAR5 SAR4 SAR3 SAR2 SAR1 SAR0 EOC
SUCCESSIVE APPROXIMATION
SEQUENCE
SAMPLE AND TRANSFER
PERIOD
CH 1
CH 2
CH 3
CH 4
CH 5
CH 6
SCF FLAG SET HERE AND SEQUENCE
ENDS IF IN THE 4-CHANNEL MODE
END
CH 7
CH 8
SCF FLAG SET HERE AND SEQUENCE
ENDS IF IN THE 8-CHANNEL MODE
Figure 5-2 10-Bit Conversion Timing
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5.2 Clock and Prescaler Control
The ADC clock is derived from the system clock by a programmable prescaler. The
prescaler has two stages. The first stage is a 5-bit modulus counter contained in the
PRS field in ADCTL0. The system clock is divided by this value + 1 and then fed to the
second stage, a divide-by-two circuit, to generate the ADC clock. Figure 5–3 illustrates
the relationship of ADC clock to system clock.
PR[4:0]
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SYSTEM CLOCK
MODULUS COUNTER
DIVIDE
BY 2
ADC CLOCK
Figure 5-3 ADC Clock and Prescaler Control
ADC clock frequency must be between 0.5 and 2.1 MHz. The reset value of the PRS
field is %00011, which divides a nominal 16.78 MHz system clock by eight, yielding
maximum ADC clock frequency. The clock generation circuitry ensures that the ADC
clock can never be faster than one fourth the system clock speed. Thus there are a
minimum of four full IMB clock cycles for each ADC clock cycle.
Table 5-1 shows prescaler output values and associated minimum and maximum system clock speeds.
Table 5-1 Prescaler Output
PRS[4:0]
ADC Clock
%00000
%00001
%00010
%00011
...
%11101
%11110
%11111
Reserved
System Clock/4
System Clock/6
System Clock/8
...
System Clock/60
System Clock/62
System Clock/64
Minimum
System Clock
–
2.0 MHz
3.0 MHz
4.0 MHz
...
30.0 MHz
31.0 MHz
32.0 MHz
Maximum
System Clock
–
8.4 MHz
12.6 MHz
16.8 MHz
...
—
—
—
5.3 Final Sample Time
During the final sample period, the selected channel is connected directly to the RC
DAC array for the specified sample time. The value of the STS (sample time select)
field in ADCTL0 determines final sample time in ADC clock cycles. The sample period
is thus determined by both the PRS field (which controls the ADC clock period) and
the STS field. Final sample time can be 2, 4, 8, or 16 ADC clocks (see Table 5-2).
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Table 5-2 STS Field Selection
STS[1:0]
00
01
10
11
Sample Time
2 A/D Clock Periods
4 A/D Clock Periods
8 A/D Clock Periods
16 A/D Clock Periods
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5.4 Resolution
ADC resolution can be either eight or ten bits. Resolution is determined by the state of
the RES10 bit in ADCTL0 (0 = 8-bit resolution, 1 = 10-bit resolution). Both 8-bit and
10-bit conversion results are automatically aligned in the result registers. Refer to 5.1
Conversion Timing for the time required for 8- and 10-bit conversions.
5.5 Conversion Mode
Conversion mode is controlled by three bits in ADCTL1. Table 5-3 shows the meaning
of these bits.
Table 5-3 Conversion Mode Bits
Bit
SCAN
(Scan mode selection)
MULT
(Multichannel conversions)
S8CM
(Select 8-conversion
sequence mode)
Meaning
Conversion can be limited to a single sequence or performed
continuously
0 = Single sequence
1 = Continuous conversions
Conversion can be run on a single channel or on a block of four or
eight channels (depending on S8CM)
0 = Single channel
1 = Multiple channels
Length of a conversion sequence
0 = 4 conversions
1 = 8 conversions
The combination of these bits determines the conversion mode, as shown in Table 54 and explained in the following paragraphs. Conversion begins with the multiplexer
input specified by the value in the CD:CA field of ADCTL1.
Table 5-4 ADC Conversion Modes
SCAN
0
0
0
0
1
1
1
1
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MULT
0
0
1
1
0
0
1
1
S8CM
0
1
0
1
0
1
0
1
Mode
0
1
2
3
4
5
6
7
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Mode 0 — A single 4-conversion sequence is performed on a single input channel
specified by the value in CD:CA. Each result is stored in a separate result register
(RSLT0 to RSLT3). The appropriate CCF bit in ADSTAT is set as each register
is filled. The SCF bit in ADSTAT is set when the conversion sequence is complete.
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Mode 1 — A single 8-conversion sequence is performed on a single input channel
specified by the value in CD:CA. Each result is stored in a separate result register
(RSLT0 to RSLT7). The appropriate CCF bit in ADSTAT is set as each register
is filled. The SCF bit in ADSTAT is set when the conversion sequence is complete.
Mode 2 — A single conversion is performed on each of four sequential input channels, starting with the channel specified by the value in CD:CC. Each result is
stored in a separate result register (RSLT0 to RSLT3). The appropriate CCF bit
in ADSTAT is set as each register is filled. The SCF bit in ADSTAT is set when
the last conversion is complete.
Mode 3 — A single conversion is performed on each of eight sequential input channels, starting with the channel specified by the value in CD. Each result is stored
in a separate result register (RSLT0 to RSLT7). The appropriate CCF bit in ADSTAT is set as each register is filled. The SCF bit in ADSTAT is set when the last
conversion is complete.
Mode 4 — Continuous 4-conversion sequences are performed on a single input
channel specified by the value in CD:CA. Each result is stored in a separate result register (RSLT0 to RSLT3). Previous results are overwritten when a sequence repeats. The appropriate CCF bit in ADSTAT is set as each register is
filled. The SCF bit in ADSTAT is set when the first 4-conversion sequence is
complete.
Mode 5 — Continuous 8-conversion sequences are performed on a single input
channel specified by the value in CD:CA. Each result is stored in a separate result register (RSLT0 to RSLT7). Previous results are overwritten when a sequence repeats. The appropriate CCF bit in ADSTAT is set as each register is
filled. The SCF bit in ADSTAT is set when the first 8-conversion sequence is
complete.
Mode 6 — Continuous conversions are performed on each of four sequential input
channels, starting with the channel specified by the value in CD:CC. Each result
is stored in a separate result register (RSLT0 to RSLT3). The appropriate CCF
bit in ADSTAT is set as each register is filled. The SCF bit in ADSTAT is set when
the first 4-conversion sequence is complete.
Mode 7 — Continuous conversions are performed on each of eight sequential input
channels, starting with the channel specified by the value in CD. Each result is
stored in a separate result register (RSLT0 to RSLT7). The appropriate CCF bit
in ADSTAT is set as each register is filled. The SCF bit in ADSTAT is set when
the first 8-conversion sequence is complete.
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5.6 Channel Selection
The value of the channel selection field (CD:CA) in ADCTL1 determines which multiplexer input or inputs are used in a conversion sequence. There are 16 possible inputs. Eight inputs are external pins (AN[7:0]), and eight are internal.
Table 5-5 summarizes ADC operation when MULT is cleared (single-channel modes).
Table 5-6 summarizes ADC operation when MULT is set (multichannel modes). The
SCAN bit determines whether single or continuous conversion sequences are performed. Channel numbers are given in order of conversion.
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Table 5-5 Single-Channel Conversions
MOTOROLA
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S8CM
0
0
0
0
0
0
0
0
0
0
0
0
0
CD
0
0
0
0
0
0
0
0
1
1
1
1
1
CC
0
0
0
0
1
1
1
1
0
0
0
0
1
CB
0
0
1
1
0
0
1
1
0
0
1
1
0
CA
0
1
0
1
0
1
0
1
0
1
0
1
0
Input
AN0
AN1
AN2
AN3
AN4
AN5
AN6
AN7
Reserved
Reserved
Reserved
Reserved
VRH
Result Register
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
RSLT0 – RSLT3
0
1
1
0
0
1
1
1
1
VRL
RSLT0 – RSLT3
0
(VRH – VRL) / 2
RSLT0 – RSLT3
0
1
1
1
1
1
1
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
1
1
1
1
1
1
0
0
0
0
1
1
1
1
0
0
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
Test/Reserved
AN0
AN1
AN2
AN3
AN4
AN5
AN6
AN7
Reserved
Reserved
Reserved
Reserved
VRH
RSLT0 – RSLT3
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
RSLT0 – RSLT7
1
1
1
1
1
0
1
VRL
RSLT0 – RSLT7
1
1
0
(VRH – VRL) / 2
RSLT0 – RSLT7
1
1
1
1
1
Test/Reserved
RSLT0 – RSLT7
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Table 5-6 Multiple-Channel Conversions
S8CM
0
CD
0
CC
0
CB
X
CA
X
0
0
1
X
X
0
1
0
X
X
0
1
1
X
X
1
0
X
X
X
1
1
X
X
X
Input
AN0
AN1
AN2
AN3
AN4
AN5
AN6
AN7
Reserved
Reserved
Reserved
Reserved
VRH
Result Register
RSLT0
RSLT1
RSLT2
RSLT3
RSLT0
RSLT1
RSLT2
RSLT3
RSLT0
RSLT1
RSLT2
RSLT3
RSLT0
VRL
RSLT1
(VRH – VRL) / 2
RSLT2
Test/Reserved
AN0
AN1
AN2
AN3
AN4
AN5
AN6
AN7
Reserved
Reserved
Reserved
Reserved
VRH
RSLT3
RSLT0
RSLT1
RSLT2
RSLT3
RSLT4
RSLT5
RSLT6
RSLT7
RSLT0
RSLT1
RSLT2
RSLT3
RSLT4
VRL
RSLT5
(VRH – VRL) / 2
RSLT6
Test/Reserved
RSLT7
5.7 Control and Status Registers
There are two control registers and one status register. Writes to ADCTL1 initiate a
conversion. If a conversion sequence is already in progress, a write to either control
register aborts it and resets the SCF and CCF flags in ADSTAT.
5.7.1 ADC Control Register 0 (ADCTL0)
ADCTL0 is used to select the conversion resolution (8 or 10 bits), the sample time, and
the clock/prescaler value. Writing to this register aborts any conversion in progress,
and ADC activity halts until a write to ADCTL1 occurs.
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ADCTL0 — ADC Control Register 0
$XXXX0A
15
8
7
NOT USED
6
RES10
5
4
3
STS
2
1
0
1
1
PRS
RESET:
0
0
0
0
0
0
0
0
0
0
0
0
0
0
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RES10 — 10-Bit Resolution
0 = 8-bit conversion
1 = 10-bit conversion
STS[1:0] — Sample Time Select
00 = 2 A/D Clock Periods
01 = 4 A/D Clock Periods
10 = 8 A/D Clock Periods
11 = 16 A/D Clock Periods
The STS field selects the final sample time, after the buffered sample transfer has occurred. Refer to 5.1 Conversion Timing and 5.3 Final Sample Time for additional information.
PRS[4:0] — Prescaler Rate Selection
%00000 = System Clock/4
%00001 = System Clock/4
%00010 = System Clock/6
%00011 = System Clock/8
.. .. . .
%11101 = System Clock/60
%11110 = System Clock/62
%11111 = System Clock/64
The system clock is divided by the PRS value plus one, then divided by two, to determine the ADC clock. (Assigning a value of zero to this field, however, has the same
effect as assigning a value of one.) Refer to 5.2 Clock and Prescaler Control for
more information.
5.7.2 ADC Control Register 1 (ADCTL1)
ADCTL1 is used to select the conversion mode and the channel or channels to be converted. Writing to this register aborts any conversion in progress and initiates a new
conversion. Refer to 5.5 Conversion Mode and 5.6 Channel Selection for additional
information on these fields.
ADCTL1 — ADC Control Register 1
$XXXX0C
15
8
7
NOT USED
6
5
4
3
2
1
0
SCAN
MULT
S8CM
CD
CC
CB
CA
0
0
0
0
0
0
0
RESET:
0
0
0
0
0
0
0
0
0
SCAN — Scan Mode Selection
0 = Single conversion sequence
1 = Continuous conversion
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MULT — Multichannel Conversion
0 = Conversion sequence(s) run on a channel selected by CD:CA.
1 = Sequential conversion of four or eight channels selected by CD:CA.
S8CM — Select Eight-Conversion Sequence Mode
0 = Four-conversion sequence
1 = Eight-conversion sequence
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CD:CA — Channel Selection
The bits in this field are used to select an input or block of inputs for A/D conversion.
Table 5-5 and Table 5-6 explain the operation of these fields.
5.7.3 ADC Status Register (ADSTAT)
ADSTAT is a read-only register that contains the sequence complete flag (SCF), conversion counter (CCTR), and one channel converted flag (CCF) for each of the eight
channels.
ADSTAT — ADC Status Register
15
14
SCF
11
$XXXX0E
10
NOT USED
8
7
0
CCTR
CCF
RESET:
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
SCF — Sequence Complete Flag
This bit is set at the end of the conversion sequence when SCAN = 0 in ADCTL1 and
set at the end of the first conversion sequence when SCAN = 1.
0 = Sequence not complete
1 = Sequence complete
CCTR[2:0] — Conversion Counter
This field shows the content of the conversion counter pointer during a conversion sequence. The value is the number of the next result register to be written to (i.e., the
channel currently being converted).
CCF[7:0] — Conversion Complete Flags
Each bit in this field corresponds to an A/D result register (CCF7 corresponds to
RSLT7, etc.). A bit is set when conversion of the corresponding input is complete and
is cleared when the result register containing the converted value is read.
5.8 Result Registers (RSLT0–RSLT7)
The eight read-only result registers store data after conversion is complete. Each register can be read from three different addresses in the register block. Data format depends on the address from which it is read. The result registers reside on the internal
differential data bus.
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Unsigned Right-Justified Format
15
14
13
12
11
10
Not Used
$XXXX10–$XXXX1F
9
8
7
6
5
10-Bit Result
4
3
2
1
0
8/10-Bit Result
The conversion result is unsigned right-justified data. Bits [9:0] are used for 10-bit resolution, bits [7:0] are used for 8-bit resolution (bits [9:8] are zero). Bits [15:10] always
return zero when read.
Signed Left-Justified Format
15
14
13
12
11
10
$XXXX20–$XXXX2F
9
8
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8/10-Bit Result
7
6
5
4
10-Bit Result
3
2
1
0
Not Used
The conversion result is signed left-justified data. Bits [15:6] are used for 10-bit resolution, bits [15:8] are used for 8-bit resolution (bits [7:6] are zero).
Although the ADC is a unipolar converter, this data format is provided by assuming
that the zero reference point is (VRH + VRL) / 2. When the register is read, bit 15 returns zero for a positive number and one for a negative number. For a negative number, the value read is in twos complement form. Bits [5:0] return zeros when read. For
eight-bit conversions, the table below summarizes the results of a read of the upper
byte of this register.
Input Voltage
+ Full scale (VRH)
Digital Result
$7F
Bipolar zero ((VRH - VRH)/2)
$00
Zero - 1 count
– Full scale (VRL)
$FF
$80
Unsigned Left-Justified Format
15
14
13
12
11
8/10-Bit Result
10
$XXXX30–$XXXX3F
9
8
7
6
5
4
10-Bit Result
3
2
1
0
Not Used
The conversion result is unsigned left-justified data. Bits [15:6] are used for 10-bit resolution, bits [15:8] are used for 8-bit resolution (bits [7:6] are zero). Bits [5:0] always
return zero when read.
MOTOROLA
5-10
DIGITAL CONTROL SUBSYSTEM
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SECTION 6 PIN CONNECTION CONSIDERATIONS
Freescale Semiconductor, Inc...
The ADC requires accurate, noise-free input signals for proper operation. This section
discusses the design of external circuitry to maximize ADC performance.
6.1 Analog Reference Pins
No A/D converter can be more accurate than its analog reference. Any noise in the
reference can result in at least that much error in a conversion. The reference for the
ADC, supplied by pins VRH and VRL, should be low-pass filtered from its source to obtain a noise-free, clean signal. In many cases, simple capacitive bypassing may suffice. In extreme cases, inductors or ferrite beads may be necessary if noise or RF
energy is present. Series resistance is not advisable since there is an effective DC current requirement from the reference voltage by the internal resistor string in the RC
DAC array. External resistance may introduce error in this architecture under certain
conditions. Any series devices in the filter network should contain a minimum amount
of DC resistance.
For accurate conversion results, the analog reference voltages must be within the limits defined by VDDA and VSSA, as explained in the following subsection.
6.2 Analog Power Pins
The analog supply pins (VDDA and VSSA) define the limits of the analog reference voltages (VRH and VRL) and of the analog multiplexer inputs. Figure 6-1 is a diagram of
the analog input circuitry.
VDDA
VRH
SAMPLE
AMP
COMPARATOR
8 CHANNELS TOTAL
RC DAC
ARRAY
REF 1
VSSA
VRL
REF 2
Figure 6-1 Analog Input Circuitry
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Freescale Semiconductor, Inc.
Since the sample amplifier is powered by VDDA and VSSA, it can accurately transfer
input signal levels up to but not exceeding VDDA and down to but not below VSSA. If
the input signal is outside of this range, the output from the sample amplifier is clipped.
Figure 6-2 shows the results of reference voltages outside the range defined by VDDA
and VSSA. At the top of the input signal range, VDDA is 10 mV lower than VRH. This
results in a maximum obtainable 10-bit conversion value of 3FE. At the bottom of the
signal range, VSSA is 15 mV higher than VRL, resulting in a minimum obtainable 10bit conversion value of 3.
3FF
3FE
3FD
3FC
3FB
10-BIT RESULT
Freescale Semiconductor, Inc...
In addition, VRH and VRL must be within the range defined by VDDA and VSSA. As
long as VRH is less than or equal to VDDA and VRL is greater than or equal to VSSA
and the sample amplifier has accurately transferred the input signal, resolution is ratiometric within the limits defined by VRL and VRH. If VRH is greater than VDDA, the
sample amplifier can never transfer a full-scale value. If VRL is less than VSSA, the
sample amplifier can never transfer a zero value.
3FA
8
7
6
5
4
3
2
1
0
0
.010
.020
.030
5.100
5.110
5.120
5.130
5.140
INPUT IN VOLTS (VRH = 5.120 V, VRL = 0 V)
Figure 6-2 Errors Resulting from Clipping
6.3 Analog Input Pins
Analog inputs should have low AC impedance at the pins. Low AC impedance can be
realized by placing a capacitor with good high frequency characteristics at the input
pin of the part. Ideally, that capacitor should be as large as possible (within the practiMOTOROLA
6-2
PIN CONNECTION CONSIDERATIONS
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cal range of capacitors that still have good high frequency characteristics). This capacitor has two effects. First, it helps attenuate any noise that may exist on the input.
Second, it sources charge during the sample period when the analog signal source is
a high-impedance source.
Freescale Semiconductor, Inc...
Series resistance can be used with the capacitor on an input pin to implement a simple
RC filter. The maximum level of filtering at the input pins is application dependent and
is based on the bandpass characteristics required to accurately track the dynamic
characteristics of an input. Simple RC filtering at the pin may be limited by the source
impedance of the transducer or circuit supplying the analog signal to be measured.
(Refer to 6.3.2 Error Resulting from Leakage.) In some cases, the size of the capacitor at the pin may be very small.
Figure 6-3 is a simplified model of an input channel. Refer to this model in the following discussion of the interaction between the user's external circuitry and the circuitry
inside the ADC.
EXTERNAL CIRCUIT
INTERNAL CIRCUIT MODEL
S1
S2
S3
S4
RF
AMP
CF
VSRC
CS
CDAC
VI
VSRC= Source voltage
RF = Filter impedance (source impedance included)
CF = Filter capacitor
CS = Internal capacitance (for a bypassed channel, this is the CDAC capacitance)
CDAC= DAC capacitor array
VI = Internal voltage source for precharge (VDD/2)
Figure 6-3 Electrical Model of an A/D Input Pin
In Figure 6-3, RF and CF comprise the user's external filter circuit. CS is the internal
sample capacitor. The value for this capacitor is 2 pF. Each channel has its own capacitor. The 2-pF capacitor is never precharged: it retains the value of the last sample.
VI is an internal voltage source used to precharge the DAC capacitor array (CDAC) before each sample. The value of this supply is VDD/2, or 2.5 volts for 5-volt operation.
The following paragraphs provide a simplified description of the interaction between
the ADC and the user's external circuitry. This circuitry is assumed to be a simple RC
low-pass filter passing a signal from a source to the ADC input pin. The following simplifying assumptions are made:
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• The source impedance is included with the series resistor of the RC filter.
• The external capacitor is perfect (no leakage, no significant dielectric absorption
characteristics, etc.)
• All parasitic capacitance associated with the input pin is included in the value of
the external capacitor.
• Inductance is ignored.
• The “on” resistance of the internal switches is zero ohms and the “off” resistance
is infinite.
6.3.1 Settling Time for the External Circuit
The values for RF and CF in the user's external circuitry determine the length of time
required to charge CF to the source voltage level (VSRC). At time t = 0, S1 in Figure
6-3 closes. S2 is open, disconnecting the internal circuitry from the external circuitry.
Assume that the initial voltage across CF is 0. As CF charges, the voltage across it is
determined by the following equation, where t is the total charge time:
VCF = VSRC(1–e–t/RFCF)
When t = 0, the voltage across CF = 0. As t approaches infinity, VCF will equal VSRC.
(This assumes no internal leakage.) With 10-bit resolution, 1/2 of a count is equal to
1/2048 full-scale value. Assuming worst case (VSRC = full scale), Table 6-1 shows the
required time for CF to charge to within 1/2 of a count of the actual source voltage during 10-bit conversions. Note that these times are completely independent of the A/D
converter architecture (assuming the ADC is not affecting the charging).
Table 6-1 External Circuit Settling Time (10-Bit Conversions)
Filter
Capacitor
1 µF
.1 µF
.01 µF
.001 µF
100 pF
100 Ω
760 µs
76 µs
7.6 µs
760 ns
76 ns
Source Resistance
1 kΩ
10 kΩ
7.6 ms
76 ms
760 µs
7.6 ms
76 µs
760 µs
7.6 µs
76 µs
760 ns
7.6 µs
100 kΩ
760 ms
76 ms
7.6 ms
760 µs
76 µs
The external circuit described in Table 6-1 is a low-pass filter. A user interested in
measuring an AC component of the external signal must take the characteristics of this
filter into account.
6.3.2 Error Resulting from Leakage
A series resistor can limit the current to a pin, but input leakage acting through a large
source impedance can degrade A/D accuracy. The maximum input leakage current is
specified in APPENDIX A ELECTRICAL CHARACTERISTICS. Input leakage is
greatest at high operating temperatures and as a general rule decreased by one half
for each 10° C decrease in temperature.
When VRH – VRL = 5.12 V, 1 count (assuming 10-bit resolution) corresponds to 5 mV
of input voltage. A typical input leakage of 50 nA acting through 100 kΩ of external seMOTOROLA
6-4
PIN CONNECTION CONSIDERATIONS
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ries resistance results in an error of less than 1 count (5.0 mV). If the source impedance is 1 MΩ and a typical leakage of 50 nA is present, an error of 10 counts (50 mV)
is introduced.
In addition to internal junction leakage, external leakage (e.g., if external clamping diodes are used) and charge sharing effects with internal capacitors also contribute to
the total leakage current. Table 6-2 illustrates the effect of different levels of total leakage on accuracy for different values of source impedance. The error is listed in terms
of 10-bit counts. Notice that leakage from the part of 10 nA is obtainable only within a
limited temperature range.
Freescale Semiconductor, Inc...
Table 6-2 Error Resulting from Input Leakage (IOFF)
Source
Impedance
1 kΩ
10 kΩ
100 kΩ
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REFERENCE MANUAL
10 nA
—
—
0.2 counts
Leakage Value (10-bit Conversions)
50 nA
100 nA
1000 nA
—
—
0.2 counts
0.1 counts
0.2 counts
2 counts
1 count
2 counts
20 counts
PIN CONNECTION CONSIDERATIONS
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6-5
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MOTOROLA
6-6
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APPENDIX A ELECTRICAL CHARACTERISTICS
The following ratings define the conditions under which the ADC can operate without
damage.
Freescale Semiconductor, Inc...
Table A-1 Maximum Ratings
Num
1
2
3
4
5
6
7
8
Parameter
Analog Supply
Internal Digital Supply
Reference Supply
VSS Differential Voltage
VDD Differential Voltage
VREF Differential Voltage
VREF to VDDA Differential Voltage
Disruptive Input Current1,2
Symbol
VDDA
VDDI
VRH, VRL
VSSI – VSSA
VDDI – VDDA
VRH – VRL
VRH – VDDA
INA
Min
– 0.3
– 0.3
– 0.3
– 0.1
– 6.5
– 6.5
– 6.5
– 15
Max
6.5
6.5
6.5
0.1
6.5
6.5
6.5
15
Unit
V
V
V
V
V
V
V
µA
NOTES:
1. Below disruptive current conditions, the channel being stressed will have conversion values of $3FF
for analog inputs greater than VRH and $000 for values less than VRL. This assumes that VRH ≤ VDDA
and VRL ≥ VSSA due to the presence of the sample amplifier. Other channels are not affected by nondisruptive conditions
2. Input signals with large slew rates or high frequency noise components cannot be converted accurately. These signals also interfere with conversion of other channels.
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Table A-2 ADC DC Electrical Characteristics (Operating)
Freescale Semiconductor, Inc...
(VSS = 0 Vdc, ADCLK = 2.1 MHz, TA within operating temperature range)
Num
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
17
18
19
20
Parameter
Analog Supply1
Internal Digital Supply1
VSS Differential Voltage
VDD Differential Voltage
Reference Voltage Low2
Reference Voltage High2
VREF Differential Voltage
Input Voltage2
Input High, Digital Port
Input Low, Digital Port
CMOS Output High, Digital Port
IOH = – 10.0 µA
Output Low, Digital Port
IOL = 10.0 µA
Output High, Digital Port
IOH = – 0.8 mA
Output Low, Digital Port
IOL = 1.6 mA
Analog Supply Current3
Reference Supply Current
Input Current, Off Channel4
Total Input Capacitance, Not Sampling
Total Input Capacitance, Sampling
Symbol
VDDA
VDDI
VSSI – VSSA
VDDI – VDDA
VRL
VRH
VRH – VRL
VINDC
VIH
VIL
VOH
Min
4.5
4.5
– 1.0
– 1.0
VSSA
VDDA / 2
4.5
VSSA
0.7 (VDDA )
VSSA – 0.3
VDDA– 0.2
Max
5.5
5.5
1.0
1.0
VDDA / 2
VDDA
5.5
VDDA
VDDA + 0.3
0.2 (VDDA )
—
Unit
V
V
mV
V
V
V
V
V
V
V
V
VOL
—
0.2
V
VOH
VDDA– 0.8
—
V
VOL
—
0.4
V
IDDA
IREF
IOFF
CINN
CINS
—
—
—
—
—
1.0
250
100
10
15
mA
µA
nA
pF
pF
NOTES:
1. Refers to operation over full temperature and frequency range.
2. To obtain full-scale, full-range results, VSSA ≤ VRL ≤ VINDC ≤ VRH ≤ VDDA.
3. Current measured at maximum system clock frequency with all modules active.
4. Maximum leakage occurs at maximum operating temperature. As a general rule, current decreases by half for
each 10° C below maximum temperature
Table A-3 ADC AC Characteristics (Operating)
(VDD and VDDA = 5.0 Vdc ± 10%, VSS = 0 Vdc, TA within operating temperature range)
Num
1
2
3
4
5
Parameter
IMB Clock Frequency
ADC Clock Frequency
8-bit Conversion Time (16 ADC Clocks)1
10-bit Conversion Time (18 ADC Clocks)1
Stop Recovery Time
Symbol
FICLK
FADCLK
TCONV
TCONV
TSR
Min
2.0
0.5
7.62
8.58
—
Max
16.78
2.1
—
—
10
Unit
MHz
MHz
µs
µs
µs
NOTES:
1. Assumes 2.1 MHz ADC clock and selection of minimum sample time (2 ADC clocks)
MOTOROLA
A-2
ELECTRICAL CHARACTERISTICS
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Table A-4 Analog Converter Characteristics (Operating)
(VDD and VDDA = 5.0 Vdc ± 10%, VSS = 0 Vdc, TA = TL to TH, ADCLK = 2.1 MHz)
Freescale Semiconductor, Inc...
Num
1
2
3
4
5
6
7
8
9
Parameter
8-bit Resolution1
8-bit Differential Nonlinearity2
8-bit Integral Nonlinearity2
8-bit Absolute Error2,3
10-bit Resolution1
10-bit Differential Nonlinearity2
10-bit Integral Nonlinearity2
10-bit Absolute Error2,4
Source Impedance at Input5
Symbol
1 Count
DNL
INL
AE
1 Count
DNL
INL
AE
RS
Min
—
–0.5
–1
–1
—
–0.5
–2
–2.5
—
Typ
20
—
—
—
5
—
—
—
20
Max
—
0.5
1
1
—
0.5
2
2.5
See Note 5
Unit
mV
Counts
Counts
Counts
mV
Counts
Counts
Counts
kΩ
NOTES:
1. VRH – VRL≥ 5.12 V; VDDA - VSSA = 5.12 V
2. At VREF = 5.12 V, one 10-bit count = 5 mV and one 8-bit count = 20 mV.
3. 8-bit absolute error of 1 count (20 mV) includes 1/2 count (10 mV) inherent quantization error and 1/2 count (10
mV) circuit (differential, integral, and offset) error.
4. 10-bit absolute error of 2.5 counts (12.5 mV) includes 1/2 count (2.5 mV) inherent quantization error and 2 counts
(10 mV) circuit (differential, integral, and offset) error.
5. Maximum source impedance is application-dependent. Error resulting from pin leakage depends on junction
leakage into the pin and on charge-sharing effects with internal capacitors. Error from junction leakage is a function of source impedance and input leakage current:
Verr = RS •IOFF
where IOFF is a function of operating temperature. (See note 4 in Table A–2.) Charge-sharing effects with internal
capacitors are a function of ADC clock speed, the number of channels being scanned, and source impedance.
For 10-bit conversions, charge pump leakage is computed as follows:
Verr10 = .25 pF • VDDA •RS • ADCLK/(9 • number of channels)
For 8-bit conversions, charge pump leakage is computed as follows:
Verr8 = .25 pF • VDDA • RS • ADCLK/(8 • number of channels)
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A-3
BO
UN
DA
RY
Freescale Semiconductor, Inc.
ER
RO
R
IDEAL TRANSFER CURVE
AB
DIGITAL OUTPUT
SO
LU
TE
8-BIT TRANSFER CURVE
(NO CIRCUIT ERROR)
BO
UN
DA
RY
C
+2
0m
V
8BI
T
A
AB
T
8BI
V
0m
–2
Freescale Semiconductor, Inc...
SO
LU
TE
ER
RO
R
B
0
20
40
INPUT IN mV, VRH – VRL = 5.120 V
60
80
A – +1/2-count (10 mV) inherent quantization error
B – Circuit-contributed +10 mV error
C – +20 mV absolute error (one 8-bit count)
Figure A-1 Circuit and Quantization Error in 8-Bit Conversions
MOTOROLA
A-4
ELECTRICAL CHARACTERISTICS
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ER
RO
R
BO
UN
DA
RY
Freescale Semiconductor, Inc.
IDEAL TRANSFER CURVE
10-BIT TRANSFER CURVE
(NO CIRCUIT ERROR)
BO
UN
DA
RY
A
-B
I
10
mV
2.5
–1
Freescale Semiconductor, Inc...
T
AB
+1
SO
LU
TE
2 .5
mV
10
B
ER
RO
R
-B
I
T
AB
DIGITAL OUTPUT
SO
LU
TE
C
0
20
40
INPUT IN mV, VRH – VRL = 5.120 V
60
80
A – +1/2-count (2.5 mV) inherent quantization error
B – Circuit-contributed +10 mV error
C – +12.5 mV absolute error (2-1/2 10-bit counts)
Figure A-2 Circuit and Quantization Error in 10-Bit Conversions
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A-5
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MOTOROLA
A-6
ELECTRICAL CHARACTERISTICS
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APPENDIX B MEMORY MAP AND REGISTERS
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B.1 Memory Map
Address
$XXXX00
$XXXX02
$XXXX04
$XXXX06
$XXXX08
$XXXX0A
$XXXX0C
$XXXX0E
Address
$XXXX10
$XXXX12
$XXXX14
$XXXX16
$XXXX18
$XXXX1A
$XXXX1C
$XXXX1E
Address
$XXXX20
$XXXX22
$XXXX24
$XXXX26
$XXXX28
$XXXX2A
$XXXX2C
$XXXX2E
Address
$XXXX30
$XXXX32
$XXXX34
$XXXX36
$XXXX38
$XXXX3A
$XXXX3C
$XXXX3E
Access
S
S
S
S/U
S/U
S/U
S/U
S/U
Access
S/U
S/U
S/U
S/U
S/U
S/U
S/U
S/U
Access
S/U
S/U
S/U
S/U
S/U
S/U
S/U
S/U
Access
S/U
S/U
S/U
S/U
S/U
S/U
S/U
S/U
Control Registers
Module Configuration Register (ADCMCR)
ADC Test Register (ADCTEST)
(Reserved)
Port Data Register (PDR)
(Reserved)
ADC Control Register 0 (ADCTL0)
ADC Control Register 1 (ADCTL1)
ADC Status Register (ADSTAT)
Right-Justified Unsigned Result Registers
ADC Result Register 0 (RSLT0)
ADC Result Register 1 (RSLT1)
ADC Result Register 2 (RSLT2)
ADC Result Register 3 (RSLT3)
ADC Result Register 4 (RSLT4)
ADC Result Register 5 (RSLT5)
ADC Result Register 6 (RSLT6)
ADC Result Register 7 (RSLT7)
Left-Justified Signed Result Registers
ADC Result Register 0 (RSLT0)
ADC Result Register 1 (RSLT1)
ADC Result Register 2 (RSLT2)
ADC Result Register 3 (RSLT3)
ADC Result Register 4 (RSLT4)
ADC Result Register 5 (RSLT5)
ADC Result Register 6 (RSLT6)
ADC Result Register 7 (RSLT7)
Left-Justified Unsigned Result Registers
ADC Result Register 0 (RSLT0)
ADC Result Register 1 (RSLT1)
ADC Result Register 2 (RSLT2)
ADC Result Register 3 (RSLT3)
ADC Result Register 4 (RSLT4)
ADC Result Register 5 (RSLT5)
ADC Result Register 6 (RSLT6)
ADC Result Register 7 (RSLT7)
S = Supervisor-accessible only
S/U = Supervisor- or user-accessible depending on state of the SUPV bit in the ADCMCR
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B.2 Registers
ADCMCR — ADC Module Configuration Register
15
14
STOP
13
12
8
FRZ
NOT USED
7
$XXXX00
6
0
SUPV
NOT USED
RESET:
1
0
0
0
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STOP — STOP Mode
0 = Normal operation
1 = Low-power operation
FRZ[1:0] — Freeze
The FRZ field determines ADC response to assertion of the FREEZE signal by the
CPU.
00 = Ignore FREEZE
01 = Reserved
10 = Finish conversion, then freeze
11 = Freeze immediately
SUPV — Supervisor/Unrestricted
0 = Unrestricted access to registers controlled by the SUPV bit
1 = Supervisor access only
PDR — Port Data Register
$XXXX06
15
8
7
0
Port ADB Output Data
Port ADA Input Data
RESET:
0
0
0
0
0
0
0
0
State of input pins
ADCTL0 — ADC Control Register 0
15
$XXXX0A
8
NOT USED
7
6
RES10
5
4
3
STS
2
1
0
1
1
PRS
RESET:
0
0
0
0
0
0
0
0
0
0
0
0
0
0
RES10 — 10-Bit Resolution
0 = 8-bit conversion
1 = 10-bit conversion
STS[1:0] — Sample Time Select Field
The STS field selects the initial sample time.
00 = 2 A/D clock periods
01 = 4 A/D clock periods
10 = 8 A/D clock periods
11 = 16 A/D clock periods
Refer to 5.1 Conversion Timing and 5.3 Final Sample Time for additional information.
MOTOROLA
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PRS[4:0] — Prescaler Rate Selection Field
%00000 = System Clock/4
%00001 = System Clock/4
%00010 = System Clock/6
%00011 = System Clock/8
. . .. . .
%11101 = System Clock/60
%11110 = System Clock/62
%11111 = System Clock/64
The system clock is divided by the PRS value plus one, then divided by two, to determine the ADC clock. (Assigning a value of zero to this field, however, has the same
effect as assigning a value of one.) Refer to 5.2 Clock and Prescaler Control for
more information.
ADCTL1 — ADC Control Register 1
$XXXX0C
15
8
7
NOT USED
6
5
4
3
2
1
0
SCAN
MULT
S8CM
CD
CC
CB
CA
0
0
0
0
0
0
0
RESET:
0
0
0
0
0
0
0
0
0
SCAN — Scan Mode Selection Bit
0 = Single conversion sequence
1 = Continuous conversion
MULT — Multichannel Conversion Bit
0 = Conversion sequence(s) run on a channel selected by [CD:CA].
1 = Sequential conversion of four or eight channels selected by [CD:CA].
S8CM — Select Eight-Conversion Sequence Mode
0 = Four-conversion sequence
1 = Eight-conversion sequence
CD:CA — Channel Selection
The bits in this field are used to select an input or block of inputs for A/D conversion.
Table 5-5 and Table 5-6 explain the operation of these fields.
ADSTAT — ADC Status Register
15
14
SCF
11
$XXXX0E
10
NOT USED
8
7
0
CCTR
CCF
RESET:
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
SCF — Sequence Complete Flag
This bit is set at the end of the conversion sequence when SCAN = 0 in ADCTL1 and
set at the end of the first conversion sequence when SCAN = 1.
0 = Sequence not complete
1 = Sequence complete
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Freescale Semiconductor, Inc.
CCTR[2:0] — Conversion Counter
This field shows the content of the conversion counter pointer during a conversion sequence. The value is the number of the next result register to be written to (i.e., the
channel currently being converted).
CCF[7:0] — Conversion Complete
Each bit in this field corresponds to an A/D result register (CCF7 corresponds to
RSLT7, etc.). A bit is set when conversion of the corresponding input is complete and
is cleared when the result register containing the converted value is read.
RSLT0–RSLT7 — Result Registers (Right-Justified)
15
14
13
12
11
10
Freescale Semiconductor, Inc...
Not Used
9
8
7
$XXXX10–$XXXX1F
6
5
10-bit Result
4
3
2
1
0
8/10-bit Result
The conversion result is unsigned right-justified data. Bits [9:0] are used for 10-bit resolution, bits [7:0] are used for 8-bit conversion (bits [9:8] are zero). Bits [15:10] always
return zero when read.
RSLT0–RSLT7 — Result Registers (Signed Left-Justified)
15
14
13
12
11
10
9
8
8/10-bit Result
7
6
5
$XXXX20–$XXXX2F
4
10-bit Result
3
2
1
0
Not Used
The conversion result is signed left-justified data. Bits [15:6] are used for 10-bit resolution, bits [15:8] are used for 8-bit conversion (bits [7:6] are zero). Although the ADC
is a unipolar converter, this data format is provided by assuming that the zero reference point is (VRH − VRL) / 2. A read of bit 15 returns the inverse of the stored value
and indicates the sign of the result. The value read from this register is thus an offset
binary twos complement number. Bits [5:0] return zero when read.
RSLT0–RSLT7 — Result Registers (Unsigned Left-Justified)
15
14
13
12
11
8/10-bit Result
10
9
8
7
6
5
$XXXX30–$XXXX3F
4
10-bit Result
3
2
1
0
Not Used
The conversion result is unsigned left-justified data. Bits [15:6] are used for 10-bit resolution, bits [15:8] are used for 8-bit conversion (bits [7:6] are zero). Bits [5:0] always
return zero when read.
MOTOROLA
B-4
MEMORY MAP AND REGISTERS
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ADC
REFERENCE MANUAL