ETC NE5500479A

DATA SHEET
SILICON POWER MOS FET
NE5500479A
3.5 V OPERATION SILICON RF POWER LD-MOS FET
FOR 900 MHz 1 W TRANSMISSION AMPLIFIERS
DESCRIPTION
The NE5500479A is an N-channel silicon power MOS FET specially designed as the transmission power amplifier
for cellular handsets. Dies are manufactured using our NEWMOS technology (our 0.6 µm WSi gate lateral-diffusion
MOS FET) and housed in a surface mount package. The device can deliver 31.5 dBm output power with 62% power
added efficiency at 900 MHz as AMPS final output stage amplifier under the 3.5 V supply voltage. It also can deliver
35 dBm output power with 62% power added efficiency at 4.8 V, as GSM 900 class 4 final stage amplifiers.
FEATURES
• High output power
: Pout = 31.5 dBm TYP. (VDS = 3.5 V, IDset = 300 mA, f = 900 MHz, Pin = 20 dBm)
• High power added efficiency : ηadd = 62% TYP. (VDS = 3.5 V, IDset = 300 mA, f = 900 MHz, Pin = 20 dBm)
• High linear gain
• Surface mount package
: GL = 15.0 dB TYP. (VDS = 3.5 V, IDset = 300 mA, f = 900 MHz, Pin = 10 dBm)
: 5.7 × 5.7 × 1.1 mm MAX.
• Single supply
: VDS = 3.0 to 6.0 V
APPLICATIONS
• Analog cellular phones
: 3.5 V AMPS handsets
• Digital cellular phones
: 4.8 V GSM 900 class 4 handsets
• Others
: General purpose amplifiers for 800 to 1 000 MHz TDMA applications
ORDERING INFORMATION
Part Number
NE5500479A-T1
Package
Marking
79A
R4
Supplying Form
• 12 mm wide embossed taping
• Gate pin face the perforation side of the tape
• Qty 1 kpcs/reel
Remark To order evaluation samples, consult your NEC sales representative.
Part number for sample order: NE5500479A
Caution Observe precautions when handling because these devices are sensitive to electrostatic discharge.
The information in this document is subject to change without notice. Before using this document, please confirm that
this is the latest version.
Not all devices/types available in every country. Please check with local NEC Compound Semiconductor Devices
representative for availability and additional information.
Document No. PU10119EJ02V0DS (2nd edition)
Date Published September 2002 CP(K)
Printed in Japan
The mark ! shows major revised points.
 NEC Corporation 1999
 NEC Compound Semiconductor Devices 2002
NE5500479A
ABSOLUTE MAXIMUM RATINGS (TA = +25°C)
Parameter
Symbol
Ratings
Unit
Drain to Source Voltage
VDS
20.0
V
Gate to Source Voltage
VGS
5.0
V
Drain Current
IDS
1.0
A
IDS Note
2.0
A
Total Power Dissipation
Ptot
10
W
Channel Temperature
Tch
125
°C
Storage Temperature
Tstg
−65 to +125
°C
Drain Current (Pulse Test)
Note Duty Cycle ≤ 50%, Ton ≤ 1 s
RECOMMENDED OPERATING CONDITIONS
Parameter
Symbol
Test Conditions
MIN.
TYP.
MAX.
Unit
Drain to Source Voltage
VDS
3.0
3.5
6.0
V
Gate to Source Voltage
VGS
0
2.0
3.5
V
Drain Current
IDS
−
600
700
mA
Input Power
Pin
18
20
22
dBm
MIN.
TYP.
MAX.
Unit
f = 900 MHz, VDS = 3.5 V
ELECTRICAL CHARACTERISTICS (TA = +25°C)
Parameter
Symbol
Test Conditions
Gate to Source Leak Current
IGSS
VGSS = 5.0 V
−
−
100
nA
Saturated Drain Current
(Zero Gate Voltage Drain Current)
IDSS
VDSS = 8.5 V
−
−
100
nA
Gate Threshold Voltage
Vth
VDS = 4.8 V, IDS = 1 mA
1.0
1.35
2.0
V
Transconductance
gm
VDS = 4.8 V, IDS = 600 mA
−
1.43
−
S
IDSS = 10 µA
20
24
−
V
Drain to Source Breakdown Voltage
BVDSS
Thermal Resistance
Rth
Channel to Case
−
10
−
°C/W
Linear Gain
GL
f = 900 MHz, Pin = 10 dBm,
VDS = 3.5 V, IDset = 300 mA, Note
−
15.0
−
dB
Output Power
Pout
f = 900 MHz, Pin = 20 dBm,
30.5
31.5
−
dBm
Operating Current
Iop
VDS = 3.5 V, IDset = 300 mA, Note
−
600
−
mA
55
62
−
%
Power Added Efficiency
ηadd
Note DC performance is 100% testing. RF performance is testing several samples per wafer.
Wafer rejection criteria for standard devices is 1 reject for several samples.
2
Data Sheet PU10119EJ02V0DS
NE5500479A
TYPICAL CHARACTERISTICS (TA = +25°C)
SET DRAIN CURRENT vs.
GATE TO SOURCE VOLTAGE
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
Set Drain Current IDset (mA)
VDS = 3.5 V
10.0
8.0
6.0
4.0
2.0
2
0
8
10
12
14
10
1
1.0
16
1.5
2.0
2.5
3.0
Gate to Source Voltage VGS (V)
OUTPUT POWER, DRAIN CURRENT
vs. INPUT POWER
DRAIN EFFICIENCY, POWER ADDED
EFFICIENCY vs. INPUT POWER
Pout
1 000
750
25
IDS
20
500
250
15
10
0
5
10
15
20
25
Drain Current IDS (mA)
30
100
1 250
VDS = 3.5 V
IDset = 300 mA
f = 900 MHz
0
30
VDS = 3.5 V
IDset = 300 mA
f = 900 MHz
ηd
η add
50
0
5
10
15
20
25
30
Input Power Pin (dBm)
Input Power Pin (dBm)
OUTPUT POWER, DRAIN CURRENT
vs. GATE TO SOURCE VOLTAGE
DRAIN EFFICIENCY, POWER ADDED
EFFICIENCY vs. GATE TO SOURCE VOLTAGE
32
31
VDS = 3.5 V
f = 900 MHz
Pin = 20 dBm
1 000
750
30
29
500
IDS
250
28
27
0.0
1.0
100
1 250
Pout
2.0
3.0
0
4.0
Drain Current IDS (mA)
Output Power Pout (dBm)
6
100
Drain to Source Voltage VDS (V)
35
Output Power Pout (dBm)
4
1 000
Drain Efficiency η d (%)
Power Added Efficiency η add (%)
Drain Current IDS (A)
12.0
10 000
VGS = 10 V MAX.
Step = 1.0 V
Drain Efficiency η d (%)
Power Added Efficiency η add (%)
14.0
VDS = 3.5 V
f = 900 MHz
Pin = 20 dBm
ηd
η add
50
0
Gate to Source Voltage VGS (V)
1.0
2.0
3.0
4.0
Gate to Source Voltage VGS (V)
Data Sheet PU10119EJ02V0DS
3
NE5500479A
DRAIN EFFICIENCY, POWER ADDED
EFFICIENCY vs. INPUT POWER
OUTPUT POWER, DRAIN CURRENT
vs. INPUT POWER
750
20
500
IDS
250
15
5
10
15
20
25
Drain Efficiency η d (%)
Power Added Efficiency η add (%)
1 000
25
10
0
0
30
VDS = 3.0 V
IDset = 300 mA
f = 900 MHz
ηd
0
5
10
15
20
25
30
Input Power Pin (dBm)
OUTPUT POWER, DRAIN CURRENT
vs. GATE TO SOURCE VOLTAGE
DRAIN EFFICIENCY, POWER ADDED
EFFICIENCY vs. GATE TO SOURCE VOLTAGE
VDS = 3.0 V
f = 900 MHz
Pin = 20 dBm
Pout
1 000
750
29
28
500
IDS
250
27
1.0
100
1 250
2.0
3.0
0
4.0
Drain Efficiency η d (%)
Power Added Efficiency η add (%)
30
26
0.0
VDS = 3.0 V
f = 900 MHz
Pin = 20 dBm
ηd
η add
50
0
Gate to Source Voltage VGS (V)
1.0
2.0
3.0
Gate to Source Voltage VGS (V)
Remark The graphs indicate nominal characteristics.
4
η add
50
Input Power Pin (dBm)
31
Output Power Pout (dBm)
Pout
Drain Current IDS (mA)
30
100
1 250
VDS = 3.0 V
IDset = 300 mA
f = 900 MHz
Drain Current IDS (mA)
Output Power Pout (dBm)
35
Data Sheet PU10119EJ02V0DS
4.0
NE5500479A
S-PARAMETERS
Test Conditions: VDS = 3.5 V, IDset = 400 mA
S11
Frequency
GHz
MAG.
ANG.
dB
S21
MAG.
ANG.
9.13
4.65
3.05
2.24
1.79
1.44
1.23
1.04
0.92
0.81
S22
MAG Note MSG Note
dB
dB
dB
S12
MAG.
ANG.
MAG.
ANG.
98.9
87.0
81.5
75.8
71.2
67.3
63.2
59.8
55.8
52.9
−33.2
−33.2
−32.8
−33.6
−33.6
−34.0
−34.4
−35.4
−35.9
−35.9
0.022
0.022
0.023
0.021
0.021
0.020
0.019
0.017
0.016
0.016
11.2
0.7
−3.5
−8.4
−12.0
−14.6
−13.6
−16.5
−19.3
−19.2
0.850
0.858
0.871
0.869
0.883
0.884
0.891
0.895
0.908
0.924
−172.8
−177.0
−178.4
−179.5
174.0
172.1
171.2
169.9
169.2
167.6
166.8
164.6
163.4
162.0
13.3
11.7
10.6
9.3
7.5
8.4
6.8
7.1
0.17
0.59
1.33
1.77
1.98
2.89
4.24
3.75
5.76
4.48
160.2
158.4
156.3
154.4
152.8
150.7
148.4
146.4
145.0
143.2
5.1
4.7
3.8
4.9
2.8
3.4
0.6
2.7
1.0
1.1
14.50
10.94
9.72
5.56
11.15
8.02
9.33
6.13
6.33
5.81
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
0.873
0.859
0.859
0.857
0.858
0.864
0.870
0.886
0.890
0.903
−151.3
−166.3
−171.8
−174.6
−176.5
−178.2
−179.3
179.2
178.1
176.3
19.2
13.3
9.7
7.0
5.1
3.2
1.8
0.3
−0.7
−1.8
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1.9
2.0
0.915
0.911
0.905
0.902
0.902
0.905
0.904
0.914
0.905
0.910
174.0
172.0
170.6
169.2
167.8
166.3
164.4
162.8
160.4
158.7
−2.7
−3.9
−4.9
−5.7
−6.6
−7.3
−8.4
−8.9
−9.6
−9.9
0.73
0.64
0.57
0.52
0.47
0.43
0.38
0.36
0.33
0.32
48.2
45.9
41.3
39.6
36.0
35.0
32.1
29.4
26.6
24.9
−37.1
−37.1
−38.4
−39.2
−39.2
−40.9
−41.9
−43.1
−44.4
−43.1
0.014
0.014
0.012
0.011
0.011
0.009
0.008
0.007
0.006
0.007
−27.6
−19.3
−22.5
−21.5
−24.3
−25.7
−18.7
−9.0
−15.5
0.1
0.934
0.922
0.915
0.917
0.919
0.917
0.912
0.927
0.925
0.928
2.1
2.2
2.3
2.4
2.5
2.6
2.7
2.8
2.9
3.0
0.910
0.910
0.912
0.909
0.911
0.916
0.909
0.911
0.917
0.917
155.6
154.2
152.2
149.7
147.5
145.3
143.2
141.1
138.9
137.1
−11.1
−11.7
−12.8
−12.4
−13.6
−13.6
−15.4
−14.9
−15.9
−16.5
0.28
0.26
0.23
0.24
0.21
0.21
0.17
0.18
0.16
0.15
22.8
21.1
17.5
16.4
14.4
13.7
12.5
8.5
8.9
8.3
−50.5
−48.0
−46.0
−43.1
−46.0
−44.4
−41.9
−41.9
−40.0
−40.0
0.003
0.004
0.005
0.007
0.005
0.006
0.008
0.008
0.010
0.010
11.1
12.7
39.4
37.7
48.9
43.4
73.4
68.2
76.4
68.2
0.922
0.926
0.925
0.936
0.923
0.928
0.917
0.939
0.925
0.935
Note When K ≥ 1, the MAG (Maximum Available Gain) is used.
When K < 1, the MSG (Maximum Stable Gain) is used.
K
26.2
23.3
21.2
20.3
19.3
18.6
18.1
17.9
17.6
17.0
179.5
179.0
178.4
177.6
177.0
175.4
0.03
0.21
0.31
0.43
0.44
0.21
17.2
16.6
MAG = S21
S12
(K – √ (K – 1) )
MSG = S21
S12
,K=
2
1+∆ −S11 −S22
,
2 ⋅S12⋅S21
2
2
2
∆ = S11 ⋅ S22 − S21 ⋅ S12
LARGE SIGNAL IMPEDANCE (VDS = 3.5 V, IDset = 300 mA, Pin = 20 dBm)
f (MHz)
Zin (Ω)
ZOL (Ω) Note
900
TBD
TBD
Note ZOL is the conjugate of optimum load impedance at given voltage, idling current, input power and frequency.
Data Sheet PU10119EJ02V0DS
5
NE5500479A
PACKAGE DIMENSIONS
79A (UNIT: mm)
Gate
Drain
0.4±0.15
0.8 MAX.
5.7 MAX.
0.9±0.2
0.2±0.1
3.6±0.2
79A PACKAGE RECOMMENDED P.C.B. LAYOUT (UNIT: mm)
4.0
1.7
Source
Stop up the hole with a rosin or
something to avoid solder flow.
Drain
1.2
0.5
1.0
5.9
Gate
Through Hole: φ 0.2 × 33
0.5 0.5
6.1
6
Data Sheet PU10119EJ02V0DS
1.2 MAX.
1.0 MAX.
0.8±0.15
Drain
4.4 MAX.
Source
2
Source
9
1.5±0.2
4
4.2 MAX.
R
Gate
0.6±0.15
5.7 MAX.
(Bottom View)
NE5500479A
RECOMMENDED SOLDERING CONDITIONS
This product should be soldered and mounted under the following recommended conditions.
For soldering
methods and conditions other than those recommended below, contact your nearby sales office.
Soldering Method
Infrared Reflow
VPS
Wave Soldering
Soldering Conditions
Condition Symbol
Peak temperature (package surface temperature)
: 260°C or below
Time at peak temperature
Time at temperature of 220°C or higher
Preheating time at 120 to 180°C
: 10 seconds or less
: 60 seconds or less
: 120±30 seconds
Maximum number of reflow processes
Maximum chlorine content of rosin flux (% mass)
: 3 times
: 0.2%(Wt.) or below
Peak temperature (package surface temperature)
Time at temperature of 200°C or higher
Preheating time at 120 to 150°C
: 215°C or below
: 25 to 40 seconds
: 30 to 60 seconds
Maximum number of reflow processes
Maximum chlorine content of rosin flux (% mass)
: 3 times
: 0.2%(Wt.) or below
Peak temperature (molten solder temperature)
: 260°C or below
IR260
VP215
WS260
Time at peak temperature
: 10 seconds or less
Preheating temperature (package surface temperature) : 120°C or below
Partial Heating
Maximum number of flow processes
Maximum chlorine content of rosin flux (% mass)
: 1 time
: 0.2%(Wt.) or below
Peak temperature (pin temperature)
: 350°C or below
Soldering time (per pin of device)
Maximum chlorine content of rosin flux (% mass)
: 3 seconds or less
: 0.2%(Wt.) or below
HS350-P3
Caution Do not use different soldering methods together (except for partial heating).
Data Sheet PU10119EJ02V0DS
7
NE5500479A
• The information in this document is current as of September, 2002. The information is subject to
change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or
data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all
products and/or types are available in every country. Please check with an NEC sales representative
for availability and additional information.
• No part of this document may be copied or reproduced in any form or by any means without prior
written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.
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agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize
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redundancy, fire-containment, and anti-failure features.
• NEC semiconductor products are classified into the following three quality grades:
"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products
developed based on a customer-designated "quality assurance program" for a specific application. The
recommended applications of a semiconductor product depend on its quality grade, as indicated below.
Customers must check the quality grade of each semiconductor product before using it in a particular
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"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
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The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's
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(Note)
(1) "NEC" as used in this statement means NEC Corporation, NEC Compound Semiconductor Devices, Ltd.
and also includes its majority-owned subsidiaries.
(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for
NEC (as defined above).
M8E 00. 4 - 0110
8
Data Sheet PU10119EJ02V0DS
NE5500479A
Business issue
NEC Compound Semiconductor Devices, Ltd.
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Technical issue
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E-mail: [email protected] FAX: +81-44-435-1918
0209